Thickness measuring device and its calibration method, pole piece thickness measuring system

Abstract

The application relates to a thickness measuring device and a verification method thereof and a pole piece thickness measuring system. In the verification process, a thickness measuring device is used to obtain the thickness of a detection position on a measured piece, which is recorded as a first thickness. A first driver is used to drive the detection piece to contact the detection position, so that the thickness of the detection position is obtained in a contact detection mode, which is recorded as a second thickness. Finally, whether the thickness measuring device is in a qualified state is judged by comparing the first thickness and the second thickness. In this way, in the verification process, the first driver is used to realize self-driving of the detection piece, so that the detection piece can quickly and automatically complete thickness detection, the test efficiency is improved, and the downtime is shortened. Meanwhile, the detection piece can be directly driven by the first driver, and manual participation is not needed, so that the detection of the detection piece can be completed on line, so that the verification process does not need to cut samples on the measured piece, and the waste of materials is effectively reduced.

Description

Technical Field

[0001] This application relates to the field of thickness measuring equipment technology, and in particular to thickness measuring devices and their calibration methods, and electrode thickness measuring systems. Background Technology

[0002] During electrode fabrication, it is necessary to obtain the electrode thickness in real time to determine whether the produced electrode thickness meets the required specifications. Simultaneously, to ensure the reliability and validity of the test data, the thickness measuring equipment needs to be calibrated periodically or during the production of the first piece. Traditional calibration methods for thickness measuring equipment typically involve manual measurement using tools. However, this method is not only inefficient and requires prolonged downtime, but also necessitates cutting and sampling from the electrode, resulting in electrode waste. Summary of the Invention

[0003] Therefore, it is necessary to provide a thickness measuring device and its calibration method, as well as an electrode thickness measuring system, which eliminates the need for cutting and sampling, thus saving materials; at the same time, it improves testing efficiency and shortens downtime.

[0004] In a first aspect, this application provides a thickness measuring device, comprising: a thickness gauge for acquiring the thickness at a detection position of a workpiece to be measured; and a verification mechanism for verifying the thickness data acquired by the thickness gauge; wherein the verification mechanism includes a first driver and a detection element, the first driver for driving the detection element to move to contact the detection position of the workpiece to be measured, and the detection element for acquiring the thickness at the detection position.

[0005] The aforementioned thickness measuring device, during the calibration process, uses a thickness gauge to acquire the thickness at the detection position on the workpiece, recorded as the first thickness; a first driver drives the workpiece to contact the detection position, acquiring the thickness at that position through contact detection, recorded as the second thickness; finally, by comparing the first and second thicknesses, it is determined whether the thickness gauge is in a qualified state. Thus, in the calibration process of this application, the first driver enables the workpiece to be self-driven, facilitating rapid and automatic thickness detection, improving testing efficiency, and shortening downtime. Simultaneously, the workpiece can be directly driven by the first driver without manual intervention; therefore, the detection can be completed online, eliminating the need for cutting and sampling on the workpiece during the calibration process, effectively reducing material waste.

[0006] In some embodiments, the calibration mechanism further includes a reference base. When the reference base is attached to the side of the test piece facing away from the detection position, the detection piece obtains the thickness at the detection position based on the position information of the side of the reference base facing the test piece. Thus, by using the reference base, the detection piece can obtain the position information of the side of the test piece facing away from the detection position, thereby accurately obtaining the thickness of the test piece.

[0007] In some embodiments, when the reference base is attached to the side of the test piece facing away from the detection position, at least one end of the reference base extends beyond the test piece along a preset direction, wherein the preset direction intersects the transport direction of the test piece. This extension of at least one end of the reference base beyond the test piece facilitates contact between the detection piece and the test piece, enabling better acquisition of the thickness at the detection position.

[0008] In some embodiments, the calibration mechanism further includes a second driver for driving a reference base to adhere to the side of the test piece facing away from the detection position. Thus, the second driver facilitates the easy attachment of the reference base to the test piece, making the calibration process more convenient.

[0009] In some embodiments, the calibration mechanism further includes a limiting member, which engages with the reference base when it is in contact with the side of the test piece facing away from the detection position. Thus, by providing the limiting member, the movement of the reference base is effectively restricted, ensuring that the reference base remains in contact with the test piece while preventing excessive movement that could lift the test piece.

[0010] In some embodiments, the thickness measuring device further includes a driving mechanism for driving the measuring element to move along a preset direction, wherein the preset direction intersects with the conveying direction of the measuring element. Thus, by using the driving mechanism to drive the measuring element to move along the preset direction, the number of lateral measuring points on the measuring element is increased, thereby improving the calibration accuracy of the measuring element.

[0011] In some embodiments, the drive mechanism includes a third driver, a base, and a bracket slidably disposed on the base. The detection element is disposed on the bracket, and the third driver is used to drive the bracket to move in a preset direction. Thus, by designing the drive mechanism as a slidingly fitted base and bracket, the movement of the detection element in the preset direction becomes smoother.

[0012] In some embodiments, the calibration mechanism further includes a calibration component for calibrating the thickness gauge. Thus, the calibration component is used to calibrate the accuracy of the thickness gauge itself, ensuring that the thickness gauge's structure remains in a qualified state.

[0013] In some embodiments, the first driver and the detection element are configured as a displacement sensor. Thus, using a displacement sensor facilitates the acquisition of position information at the detection position on the device under test, which helps improve calibration efficiency.

[0014] Secondly, this application provides a calibration method for a thickness measuring device, which is applied to any of the thickness measuring devices mentioned above, and includes the following steps: using a thickness gauge to obtain the thickness at the detection position on the workpiece to be measured, and recording it as the first thickness; using a first driver to drive the workpiece to obtain the thickness at the detection position in a contact measurement manner, and recording it as the second thickness; judging whether the thickness gauge is qualified based on whether the difference between the first thickness and the second thickness meets the preset range.

[0015] In some embodiments, using a first driver, the thickness at the detection position is obtained by contact measurement using a first driver, denoted as the second thickness. This includes: controlling a reference base to move to fit against the side of the test piece facing away from the detection position; taking a first point and a second point on the side of the reference base facing the test piece, with the first and second points located on opposite sides of the test piece along a preset direction, wherein the preset direction intersects the transport direction of the test piece; constructing a coordinate system with the first point as the origin, the horizontal direction as the X-axis, and the vertical direction as the Y-axis; obtaining the position coordinates of the second point using the detection component, establishing a functional relationship Y between the first and second points, Y = KX; obtaining the position coordinates (X0, Y0) of the detection position using the detection component, and calculating Y0 - KX0 based on the functional relationship Y, denoted as the second thickness. Thus, by utilizing the constructed functional relationship, the influence of installation errors is eliminated, improving the reliability of the inspection.

[0016] Thirdly, this application provides an electrode thickness measurement system, comprising: an electrode, wherein the part to be measured is an electrode; and a thickness measuring device as described above, wherein the thickness gauge is used to obtain the thickness of the electrode.

[0017] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description

[0018] Various other advantages and benefits will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiments below. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this application. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0019] Figure 1 This is a partial front view of the electrode thickness measurement system described in some embodiments of this application;

[0020] Figure 2 This is a top view of a partial structure of the electrode thickness measurement system described in some embodiments of this application;

[0021] Figure 3 This is a schematic diagram illustrating the establishment of a coordinate system on a reference base as described in some embodiments of this application;

[0022] Figure 4 This is a partial structural side view of the electrode thickness measurement system described in some embodiments of this application;

[0023] Figure 5 for Figure 4 Enlarged schematic diagram of the C-shaped structure in the middle circle;

[0024] Figure 6 This is a schematic diagram of the calibration process for the thickness measuring device described in some embodiments of this application. Figure 1 ;

[0025] Figure 7 This is a schematic diagram of the calibration process for the thickness measuring device described in some embodiments of this application. Figure 2 .

[0026] 10. Thickness measuring device; 1. Thickness gauge; 11. First laser head; 12. Second laser head; 2. Calibration mechanism; 21. First driver; 22. Detection piece; 221. Displacement sensor; 23. Reference base; 24. Second driver; 25. Limiting piece; 3. Drive mechanism; 31. Third driver; 32. Base; 33. Bracket; 34. Slide rail; 35. Slider; 20. Electrode; 30. Calibration piece; 40. Overhead roller; 50. Detection piece; 51. Detection position; A. First point; B. Second point; S. Conveying direction; T. Preset direction. Detailed Implementation

[0027] The embodiments of the technical solution of this application will now be described in detail with reference to the accompanying drawings. These embodiments are only used to more clearly illustrate the technical solution of this application and are therefore merely examples, and should not be used to limit the scope of protection of this application.

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms “comprising” and “having”, and any variations thereof, in the specification, claims, and foregoing description of the drawings are intended to cover non-exclusive inclusion.

[0029] In the description of the embodiments of this application, technical terms such as "first" and "second" are used only to distinguish different objects and should not be construed as indicating or implying relative importance or implicitly specifying the number, specific order, or primary and secondary relationship of the indicated technical features. In the description of the embodiments of this application, "multiple" means two or more, unless otherwise explicitly defined.

[0030] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0031] In the description of the embodiments in this application, the term "and / or" is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. Additionally, the character " / " in this document generally indicates that the preceding and following related objects have an "or" relationship.

[0032] In the description of the embodiments of this application, the term "multiple" refers to two or more (including two), similarly, "multiple sets" refers to two or more (including two sets), and "multiple pieces" refers to two or more (including two pieces).

[0033] In the description of the embodiments of this application, the technical terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this application and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application.

[0034] In the description of the embodiments of this application, unless otherwise expressly specified and limited, technical terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. For those skilled in the art, the specific meaning of the above terms in the embodiments of this application can be understood according to the specific circumstances.

[0035] To ensure that the manufactured products meet the required specifications, thickness measuring equipment is typically installed on the production line to obtain real-time thickness data and monitor the production status. For ease of understanding, the electrode fabrication process will be used as an example. It should be noted that the following is for illustrative purposes only and should not be construed as limiting the scope of this application.

[0036] The applicant noted that during the electrode fabrication process, the thickness of the electrode is typically acquired online in real time using non-contact devices such as laser thickness gauges. Since the electrode surface is a non-metallic composite material, the absorption and reflectivity of the light spot from the laser thickness gauge and other devices differ between the two material surfaces, affecting the angle of light reception. This results in differences in surface linearity measurement, causing the laser thickness gauge to fail to accurately reflect changes in electrode thickness.

[0037] Meanwhile, if the electrode surface is not taut and is arched, it will also cause errors in the reflection angle of the laser thickness gauge, ultimately leading to errors in the measured thickness. Therefore, during the manufacturing process, it is necessary to periodically calibrate equipment such as the laser thickness gauge or during the production of the first piece to ensure that the test results are reliable and effective.

[0038] Traditional calibration processes typically involve manual measurement, such as cutting a sample from the electrode sheet and then manually measuring its thickness using tools like micrometers and calipers. The result is then compared to the thickness value obtained from a laser thickness gauge to determine if the gauge is up to standard. However, this calibration method is inefficient, leading to prolonged downtime for the electrode manufacturing line. Furthermore, the manual cutting process results in electrode waste.

[0039] Based on this, in order to solve the problems of long-term equipment downtime and electrode waste during the calibration process, the applicant has conducted in-depth research and designed a thickness measuring device. The device includes a calibration mechanism for the thickness gauge and uses a first driver to drive the test piece to the test position so that the test piece can obtain the thickness at the test position through contact.

[0040] During the calibration process, a thickness gauge is used to obtain the thickness at the detection position on the workpiece, which is recorded as the first thickness. A first driver then moves the workpiece to contact the detection position, and the thickness at that position is obtained through contact detection, recorded as the second thickness. Finally, by comparing the first and second thicknesses, it is determined whether the thickness gauge is in a qualified state. Thus, in the calibration process of this application, the first driver enables the workpiece to be self-driven, facilitating rapid and automatic thickness detection, improving testing efficiency, and reducing downtime. Simultaneously, the workpiece can be directly driven by the first driver without manual intervention; therefore, the detection can be completed online, eliminating the need for cutting and sampling on the workpiece during the calibration process, effectively reducing material waste.

[0041] In addition, during the calibration process, obtaining the thickness at the test position using a contact testing method can avoid the difference in absorptivity and reflectivity between the two materials on the electrode surface, which could affect the accuracy of the test results. At the same time, the contact testing method can apply downward pressure to the electrode, which can reduce test errors caused by phenomena such as the electrode surface not being taut or arching.

[0042] Please refer to some embodiments of this application. Figure 1 This application provides a thickness measuring device 10, which includes a thickness gauge 1 and a calibration mechanism 2. The thickness gauge 1 is used to acquire the thickness at a detection position 51 of the workpiece 50 to be measured, and the calibration mechanism 2 is used to verify the thickness data acquired by the thickness gauge 1. The calibration mechanism 2 includes a first driver 21 and a detection element 22. The first driver 21 is used to drive the detection element 22 to move to contact the detection position 51, and the detection element 22 is used to acquire the thickness at the detection position 51.

[0043] Thickness gauge 1 refers to a device capable of acquiring the thickness of the workpiece 50 online, such as, but not limited to, a laser thickness gauge or an eddy current thickness gauge. The workpiece 50 can be determined based on the application scenario of the thickness measuring device 10; for example, in the preparation of electrode 20, the workpiece 50 can be electrode 20, etc. It should be noted that during the calibration process, the thickness gauge 1 and the workpiece 22 should measure and compare the thickness at the same detection position 51.

[0044] The detection component 22 refers to a device capable of acquiring the thickness at the detection position 51 through contact. This can be, for example, but is not limited to, a length gauge or a displacement sensor 221. When acquiring the thickness at the detection position 51, the detection component 22 can be zeroed beforehand. For example, before testing, the detection component 22 can be moved to the position of the side of the test piece 50 facing away from the detection position 51, and the data at that position can be zeroed. Alternatively, zeroing can be performed during testing. For example, a reference base 23 or similar structure can be installed below the test piece 50, and during testing, the detection component 22 can be moved to contact the base station platform.

[0045] There are various ways to position the detection element 22 and the thickness gauge 1. For example, in the conveying direction S of the part to be measured 50, the detection element 22 is located upstream of the part to be measured 50 relative to the thickness gauge 1. During the verification process, the detection element 22 obtains the thickness at the detection position 51 before the thickness gauge 1. Alternatively, the detection element 22 is located downstream of the part to be measured 50 relative to the thickness gauge 1.

[0046] Detection point 51 refers to a detection point on the side of the workpiece 50 facing the calibration mechanism 2. This detection point can be set according to the calibration requirements, for example, a detection point 51 can be set on the workpiece 22 directly below the calibration workpiece 22. The number of detection points 51 can be one or more. When there are multiple detection points 51, all detection points 51 can be distributed at intervals along a direction perpendicular to the conveying direction S of the workpiece 50.

[0047] The first driver 21 refers to the component that drives the detection element 22 to the detection position 51. For example, it can be a cylinder, electric cylinder, hydraulic cylinder, or a combination structure of a motor and a lead screw mechanism.

[0048] Thus, the first driver 21 enables the self-driving of the test piece 22, facilitating the rapid and automatic completion of thickness detection, improving testing efficiency, and reducing downtime. Simultaneously, the test piece 22 can be directly driven by the first driver 21 without manual intervention. Therefore, the detection of the test piece 22 can be completed online, eliminating the need for cutting and sampling on the test piece 50 during the verification process, effectively reducing material waste.

[0049] According to some embodiments of this application, optionally, please refer to Figure 1 The calibration mechanism 2 also includes a reference base 23. When the reference base 23 is attached to the side of the test piece 50 facing away from the detection position 51, the detection piece 22 obtains the thickness at the detection position 51 based on the position information of the side of the reference base 23 facing the test piece 50.

[0050] The reference base 23 refers to the structure that provides a reference for the testing of the test piece 22. For example, when the reference base 23 is attached to the side of the test piece 50 facing away from the detection position 51, the test piece 22 can contact the side of the reference base 23 facing the test piece 50 under the action of the first driver 21 to obtain the position information of that side. The position information obtained at this time is equivalent to the position information of the side of the test piece 50 facing away from the detection position 51. Then, the test piece 22 contacts the detection position 51 under the action of the first driver 21 to obtain the position information of the detection position 51. The difference between the position information obtained before and after is the thickness of the test piece 50 at the detection position 51.

[0051] The reference base 23 can be in a fixed state or a movable state in the thickness measuring device 10. When the reference base 23 is in a fixed state, it should always be in contact with the side of the workpiece 50 facing away from the detection position 51. When the reference base 23 is in a movable state, after the calibration is completed, the reference base 23 can be moved away from the workpiece 50 to avoid wear on the workpiece 50 due to mutual contact.

[0052] By using the reference base 23, the detection component 22 can obtain the position information of the side of the test component 50 facing away from the detection position 51, so as to accurately obtain the thickness of the test component 50.

[0053] According to some embodiments of this application, optionally, please refer to Figure 2 When the reference base 23 is attached to one side of the test piece 50 facing away from the detection position 51, at least one end of the reference base 23 extends out of the test piece 50 along a preset direction T, wherein the preset direction T intersects with the conveying direction S of the test piece 50.

[0054] At least one end of the reference base 23 can extend beyond the test piece 50, the purpose of which is to facilitate the contact of the detection piece 22 with the reference base 23. Of course, there are many ways in which the detection piece 22 contacts the reference base 23, such as: the detection piece 22 can move along a preset direction T, so that the detection piece 22 can be moved out of the test piece 50; or, the detection piece 22 can be designed as a swingable structure, using a swinging method to swing the detection piece 22 out of the test piece 50, etc.

[0055] When both ends of the reference base 23 extend beyond the part under test 50, installation error lines can be constructed using the positional information of both ends of the reference base 23. For example: Please refer to Figure 3A coordinate system is constructed with one end of the reference base 23 as the origin, the horizontal direction as the X-axis, and the vertical direction as the Y-axis. The position information of the other end of the reference base 23 is obtained using the detection component 22, and an installation error line Y = KX is established. In this formula, (X, Y) are the position coordinates of the side of the reference base 23 facing the test component 50, and K is the slope of the side of the reference base 23 relative to the horizontal direction. When K is zero, it indicates that the reference base 23 is horizontally installed, and no installation error is introduced. When K is not zero, it indicates that the reference base 23 is installed with a certain angle, which will introduce installation error.

[0056] Therefore, when obtaining the thickness of the test piece 50, the position information at the detection position 51 can be subtracted from the corresponding installation error. For example, in the above coordinate system, the position information of the test piece 22 at the detection position 51 is (X0, Y0), and the installation error corresponding to X0 is KX0. At this time, the calculated thickness is Y0-KX0.

[0057] At least one end of the reference base 23 extends beyond the test piece 50 so that the detection piece 22 can contact the test piece 50 to better obtain the thickness at the detection position 51.

[0058] According to some embodiments of this application, optionally, please refer to Figure 4 and Figure 5 The calibration mechanism 2 also includes a second driver 24. The second driver 24 is used to drive the reference base 23 to fit against the side of the test piece 50 facing away from the detection position 51.

[0059] The second actuator 24 refers to a component that can drive the reference base 23 toward or away from the workpiece 50 under test. For example, it can be a cylinder, electric cylinder, hydraulic cylinder, etc.; it can also be a motor or a combination of a motor and a transmission mechanism. When the second actuator 24 is a cylinder, electric cylinder, hydraulic cylinder, or a combination of a motor and a lead screw mechanism, the movement mode of the reference base 23 is linear movement; when the second actuator 24 is a motor or a motor and a swing arm mechanism, the movement mode of the reference base 23 is swinging. For example, under the action of the second actuator 24, the reference base 23 swings from outside the workpiece 50 to a side surface that is in contact with the workpiece 50.

[0060] When driving the reference base 23 to fit against the workpiece 50, a sensing device can be set on the reference base 23, such as attaching a sensing sheet to the surface of the reference base 23, to avoid the reference base 23 moving too far and lifting the workpiece 50.

[0061] The second driver 24 allows the reference base 23 to be easily attached to the test piece 50, making the calibration process more convenient.

[0062] According to some embodiments of this application, optionally, please refer to Figure 5The calibration mechanism 2 also includes a limiting member 25. When the reference base 23 is in contact with the side of the test piece 50 facing away from the detection position 51, the limiting member 25 and the reference base 23 engage in abutment.

[0063] The limiting member 25 refers to a structure that can restrict the reference base 23 from continuing to move. For example, when the reference base 23 is attached to the side of the test piece 50 facing away from the detection position 51, the limiting member 25 abuts against the reference base 23, restricting the reference base 23 from continuing to move and lifting the test piece 50.

[0064] The number of limiting components 25 can be one or more. When the number of limiting components 25 is multiple, please refer to [the relevant documentation]. Figure 2 At least two limiting members 25 can respectively abut against both ends of the reference seat 23 along the preset direction T, so as to balance the force on the reference seat 23 and prevent the reference seat 23 from tilting due to the limiting at one end. The preset direction T intersects the conveying direction S.

[0065] The limiting component 25 can effectively limit the movement stroke of the reference base 23, ensuring that the reference base 23 is in contact with the test piece 50 while preventing the reference base 23 from moving excessively and lifting the test piece 50.

[0066] According to some embodiments of this application, optionally, please refer to Figure 1 The thickness measuring device 10 also includes a drive mechanism 3. The drive mechanism 3 is used to drive the measuring piece 22 to move along a preset direction T, wherein the preset direction T intersects with the conveying direction S of the measuring piece 50.

[0067] The driving mechanism 3 refers to the component that drives the detection element 22 to move in a direction intersecting with the conveying direction S. Of course, for ease of verification, the preset direction T can be set perpendicular to the conveying direction S. For example, for ease of understanding, taking the electrode 20 as an example, the driving mechanism 3 drives the detection element 22 to move in a direction perpendicular to the conveying direction S. Of course, it can also be understood that the driving mechanism 3 drives the detection element 22 to move in the width direction of the electrode 20, etc.

[0068] When the drive mechanism 3 drives the detection element 22 to move along the preset direction T, the detection element 22 can test any detection position 51 on the test piece 50 along the preset direction T. This increases the number of detection points of the detection element 22 on the test piece 50, thereby increasing the amount of comparable data between the detection element 22 and the thickness gauge 1.

[0069] Alternatively, the thickness gauge 1 can also be mounted on the drive mechanism 3 so that the thickness gauge 1 can also move along a preset direction T. Specifically, in some embodiments, the thickness gauge 1 includes a first laser head 11 and a second laser head 12, which are spaced apart on the drive mechanism 3 and located on opposite sides of the workpiece 50 to be measured along its own thickness direction.

[0070] The driving mechanism 3 drives the detection component 22 to move along a preset direction T, increasing the lateral detection points of the detection component 22 in order to improve the verification accuracy of the detection component 22.

[0071] According to some embodiments of this application, optionally, please refer to Figure 4 The drive mechanism 3 includes a third driver 31, a base 32, and a bracket 33 slidably mounted on the base 32. The detection element 22 is mounted on the bracket 33, and the third driver 31 is used to drive the bracket 33 to move along a preset direction T.

[0072] The third actuator 31 refers to the component that drives the bracket 33 to move along a preset direction T on the base 32. For example, it can be a cylinder, electric cylinder, hydraulic cylinder, or a combination structure of a motor and a lead screw mechanism.

[0073] The bracket 33 is slidably mounted on the base 32. This can be achieved in various ways, such as by providing a guide rail structure between the bracket 33 and the base 32; or by providing a guide groove structure between the bracket 33 and the base 32; or by providing a combination of rollers and slide rails between the bracket 33 and the base 32. Specifically, in some embodiments, the base 32 is provided with a slide rail 34, and the bracket 33 is provided with a slider 35, which slidably mounts on the slide rail 34.

[0074] The detection element 22 is mounted on the bracket 33, allowing it to move under the influence of the bracket 33. Since the detection element 22 can move towards the detection position 51 under the action of the first driver 21, its mounting on the bracket 33 cannot be fixed. For example, the detection element 22 can be mounted indirectly by fixing the first driver 21 to the bracket 33 and then fixing the detection element 22 to the output end of the first driver 21. The fixing method of the first driver 21 on the bracket 33 can be, but is not limited to, bolt connection, snap-fit, riveting, welding, etc.

[0075] The drive mechanism 3 is designed as a sliding fit base 32 and bracket 33, which makes the movement of the detection piece 22 along the preset direction T more stable.

[0076] According to some embodiments of this application, optionally, please refer to Figure 2 The calibration mechanism 2 also includes a calibration component 30. The calibration component 30 is used to calibrate the thickness gauge 1.

[0077] The calibration component 30 refers to the structure used to calibrate the accuracy of the thickness gauge 1 itself. The calibration component 30 can be, but is not limited to, tungsten steel sheets. Taking a laser thickness gauge as an example, during the calibration process, tungsten steel sheets of different thicknesses are placed on the calibration frame; thickness values ​​at multiple different locations for each tungsten steel sheet are collected, and the average thickness of each tungsten steel sheet is obtained; the correlation index R² of linear regression is calculated based on the actual thickness value and the average thickness of the tungsten steel sheet; and the calibration of the laser thickness gauge is determined based on the R² value.

[0078] It is important to note the difference between calibration component 30 and testing component 22. Calibration component 30 focuses on adjusting the accuracy of the thickness gauge 1 itself, and the reasons for this adjustment are mostly due to malfunctions in the thickness gauge 1's own structure, which can be simply understood as equipment error. On the other hand, testing component 22 adjusts the thickness gauge 1 for testing errors caused by differences in the composition, structure, and other elements of the part under test 50. That is, the thickness gauge 1 itself is not structurally faulty, but testing errors occur due to differences in the type or material of the part under test 50.

[0079] For ease of understanding, taking the preparation process of electrode 20 as an example, when the absorption rate and reflectivity of the laser thickness gauge calibrated by the calibration part 30 are different when the light spot irradiates the surfaces of the two materials, it may affect the light angle, causing differences in surface linear measurement, resulting in the laser thickness gauge being unable to accurately reflect the thickness change of electrode 20.

[0080] The thickness gauge 1 is calibrated using calibration component 30 to ensure that its structure remains in a qualified state.

[0081] According to some embodiments of this application, optionally, please refer to Figure 1 The first actuator 21, together with the detection element 22, is configured as a displacement sensor 221.

[0082] The displacement sensor 221, also known as a linear sensor, is a linear device that uses metal induction. The function of the sensor is to convert various measured physical quantities into electrical quantities.

[0083] This design, utilizing displacement sensor 221, facilitates the acquisition of position information on detection position 51 on the test piece 50, which helps improve verification efficiency.

[0084] Please refer to some embodiments of this application. Figure 6 This application provides a calibration method for a thickness measuring device 10, applicable to the thickness measuring device 10 in any of the above schemes, comprising the following steps:

[0085] S100. Using thickness gauge 1, obtain the thickness at detection position 51 on the part to be measured 50, and record it as the first thickness.

[0086] S200. Using the first driver 21, the detection element 22 is driven to obtain the thickness at the detection position 51 by contact measurement, which is recorded as the second thickness.

[0087] S300. Determine whether the thickness gauge 1 is qualified based on whether the difference between the first thickness and the second thickness meets the preset range.

[0088] The execution order of steps S100 and S200 is not limited. For example, step S100 can be executed first, followed by step S200; or step S200 can be executed first, followed by step S100, etc.

[0089] In step S300, the preset range refers to the range that the thickness gauge 1 can be judged to be qualified when the difference between the first thickness and the second thickness is within a certain range. The specific range value can be determined according to the actual production requirements.

[0090] The calibration method of the thickness measuring device 10 described above involves the following steps: During calibration, the thickness gauge 1 acquires the thickness at the detection position 51 on the workpiece 50 to be tested, and records it as the first thickness; the first driver 21 drives the detection element 22 to contact the detection position 51, and the thickness at the detection position 51 is acquired through contact detection, recorded as the second thickness; finally, by comparing the first thickness and the second thickness, it is determined whether the thickness gauge 1 is in a qualified state. Thus, in the calibration process of this application, the first driver 21 enables the detection element 22 to be self-driven, facilitating the rapid and automatic completion of thickness detection, improving testing efficiency, and shortening downtime. Simultaneously, the detection element 22 can be directly driven by the first driver 21 without manual intervention. Therefore, the detection of the detection element 22 can be completed online, eliminating the need for cutting and sampling on the workpiece 50 during the calibration process, effectively reducing material waste.

[0091] According to some embodiments of this application, optionally, please refer to Figure 3 and Figure 7 S200, using the first driver 21, the detection element 22 is driven to obtain the thickness at the detection position 51 by contact measurement, denoted as the second thickness, including:

[0092] S210, control the reference base 23 to move until it fits against the side of the test piece 50 facing away from the detection position 51;

[0093] S220. Take a first point A and a second point B on the side of the reference base 23 facing the test piece 50, and the first point A and the second point B are respectively located on opposite sides of the test piece 50 along the preset direction T, wherein the preset direction T intersects with the conveying direction S of the test piece 50.

[0094] S230. Construct a coordinate system with the first point A as the origin, the horizontal direction as the X-axis, and the vertical direction as the Y-axis. Use the detection component 22 to obtain the position coordinates of the second point B, and establish the functional relationship Y between the first point A and the second point B, Y = KX.

[0095] S240. Use the detection element 22 to obtain the position coordinates (X0, Y0) of the detection position 51, and calculate Y0-KX0 according to the function relationship Y, which is recorded as the second thickness.

[0096] In step S220, the first point A and the second point B are located on opposite sides of the test piece 50 along the preset direction T. The purpose is to make the line connecting the first point A and the second point B cross the bottom of the test piece 22, so that any test position 51 on the test piece 50 can correspond to the installation error value on the established function line.

[0097] In this way, by utilizing the constructed functional relationship, the influence of installation errors can be eliminated, thereby improving the reliability of the inspection.

[0098] Please refer to some embodiments of this application. Figure 1 This application provides an electrode thickness measurement system, including: an electrode 20 and a thickness measuring device 10 as described above. The part to be measured 50 is the electrode 20, and the thickness measuring device 10 is used to obtain the thickness of the electrode 20.

[0099] During the conveying process, the electrode 20 can be conveyed through the roller 40 structure. For example, the electrode thickness measurement system also includes several spaced rollers 40, and the electrode 20 is wound around the rollers 40 in sequence.

[0100] The thickness measurement system described above uses the thickness measurement device 10, which enables the self-driving of the detection piece 22 via the first driver 21. This facilitates the rapid and automatic completion of thickness measurement by the detection piece 22, improving testing efficiency and reducing downtime. Furthermore, the detection piece 22 can be directly driven by the first driver 21 without manual intervention. Therefore, the detection of the detection piece 22 can be completed online, eliminating the need for cutting and sampling on the test piece 50 during the verification process, effectively reducing material waste.

[0101] Please refer to some embodiments of this application. Figures 1 to 7This application provides an electrode thickness measurement system, in which a calibration mechanism 2, such as a displacement sensor 221, is integrated on the thickness gauge 1. The automatic testing of the electrode 20 by the calibration mechanism 2 is used to realize the automatic calibration of the thickness gauge 1. The specific verification process is as follows: When the first piece is installed, the electrode 20 stops being conveyed, and the displacement sensor 221 and the reference base 23 are in the standby retracted position; the drive mechanism 3 drives the thickness gauge 1 to scan the electrode 20 back and forth to measure the thickness; the second driver 24 automatically pushes the reference base 23 up until it reaches the limit position and is close to the lower surface of the electrode 20; the drive mechanism 3 automatically moves to one end of the reference base 23, the displacement sensor 221 extends and contacts the electrode 20 to measure the thickness of the first point A, and then retracts back to the original position; the drive mechanism 3 automatically moves to the other end of the reference base 23, the displacement sensor 221 extends and contacts the electrode 20 to measure the thickness of the second point B, and then retracts back to the original position; the position data of the two ends of the reference base 23 are automatically fitted to form a baseline to eliminate installation errors; the sampling points and number are set in advance, the displacement sensor 221 moves and extends, and the thickness of the electrode 20 is measured; after the sampling points are completed, the measured data is compared with the data measured by the thickness gauge 1 to complete the verification.

[0102] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application, and they should all be covered within the scope of the claims and specification of this application. In particular, as long as there is no structural conflict, the various technical features mentioned in the embodiments can be combined in any way. This application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A thickness measuring device (10), characterized in that, include: Thickness gauge (1) is used to obtain the thickness at the detection position (51) of the part to be measured (50); Verification mechanism (2) is used to verify the thickness data obtained by the thickness gauge (1); The verification mechanism (2) includes a first driver (21) and a detection element (22). The first driver (21) is used to drive the detection element (22) to move to contact the detection position (51). The detection element (22) is used to obtain the thickness at the detection position (51). The calibration mechanism (2) further includes a reference base (23) separate from the detection component (22). When the reference base (23) is attached to one side of the test piece (50) facing away from the detection position (51), the detection component (22) obtains the thickness at the detection position (51) based on the position information of the side of the reference base (23) facing the test piece (50). When the reference base (23) is attached to one side of the test piece (50) facing away from the detection position (51), both ends of the reference base (23) extend out of the test piece (50) along a preset direction (T), wherein the preset direction (T) intersects with the conveying direction (S) of the test piece (50).

2. The thickness measuring device (10) according to claim 1, characterized in that, The calibration mechanism (2) further includes a second driver (24) for driving the reference base (23) to fit against the side of the test piece (50) facing away from the detection position (51).

3. The thickness measuring device (10) according to claim 1, characterized in that, The verification mechanism (2) also includes a limiting member (25). When the reference base (23) is attached to one side of the test piece (50) facing away from the detection position (51), the limiting member (25) and the reference base (23) are mutually limiting and cooperating.

4. The thickness measuring device (10) according to any one of claims 1-3, characterized in that, The thickness measuring device (10) further includes a driving mechanism (3), which is used to drive the detection element (22) to move along the preset direction (T).

5. The thickness measuring device (10) according to claim 4, characterized in that, The driving mechanism (3) includes a third driver (31), a base (32) and a bracket (33) slidably disposed on the base (32). The detection element (22) is disposed on the bracket (33). The third driver (31) is used to drive the bracket (33) to move along the preset direction (T).

6. The thickness measuring device (10) according to any one of claims 1-3, characterized in that, The calibration mechanism (2) further includes a calibration component (30) for calibrating the thickness gauge (1).

7. The thickness measuring device (10) according to any one of claims 1-3, characterized in that, The first driver (21) together with the detection element (22) is configured as a displacement sensor (221).

8. A calibration method for a thickness measuring device (10), applied to the thickness measuring device (10) according to any one of claims 1-7, characterized in that, Includes the following steps: Using a thickness gauge (1), the thickness at the detection position (51) on the part to be measured (50) is obtained and recorded as the first thickness; Using the first driver (21), the detection element (22) is driven to obtain the thickness at the detection position (51) by contact measurement, which is recorded as the second thickness; The thickness gauge (1) is deemed qualified based on whether the difference between the first thickness and the second thickness is within a preset range.

9. The calibration method for the thickness measuring device (10) according to claim 8, characterized in that, The step of using a first driver (21) to drive a detection element (22) to obtain the thickness at the detection position (51) by contact measurement includes: The control reference base (23) is moved to fit against one side of the test piece (50) opposite to the detection position (51); A first point (A) and a second point (B) are taken on the side of the reference base (23) facing the test piece (50), and the first point (A) and the second point (B) are located on opposite sides of the test piece (50) along the preset direction (T); A coordinate system is constructed with the first point (A) as the origin, the horizontal direction as the X-axis and the vertical direction as the Y-axis. The position coordinates of the second point (B) are obtained using the detection component (22). A functional relationship Y is established between the first point (A) and the second point (B), Y=KX, where K is the slope of one side of the reference base (23) relative to the horizontal direction. The position coordinates (X0, Y0) of the detection position (51) are obtained using the detection element (22), and Y0-KX0 is calculated according to the function relationship Y, which is recorded as the second thickness.

10. A electrode thickness measurement system, characterized in that, include: Electrode (20), the test piece (50) is an electrode (20); The thickness measuring device (10) according to any one of claims 1-7, wherein the thickness gauge (1) is used to obtain the thickness of the electrode (20).

Images