A method for assessing the aging of a cable sheath and related devices

Abstract

The application discloses a cable sheath aging evaluation method and related device, comprising: intercepting a test sample from a cable sheath to be evaluated, wiping the test sample with alcohol and keeping it still; testing the test sample by using a RIGAKU-X ray polycrystalline diffractometer, recording an X ray diffraction pattern of the test sample, obtaining two crystalline diffraction peak intensities D fi and D si of a diffraction curve and angles θ fi and θ si corresponding to the two peaks according to the X ray diffraction pattern; substituting the two crystalline diffraction peak intensities D fi and D si and the angles θ fi and θ si corresponding to the two peaks into a diffraction evaluation factor calculation formula to obtain a diffraction evaluation factor; and analyzing an aging state of the cable sheath to be evaluated based on the diffraction evaluation factor. The application can conveniently, efficiently and safely detect and evaluate the aging degree of a 110kV XLPE cable sheath, and avoids damage and grounding faults caused by serious aging of the cable sheath.

Description

Technical Field

[0001] This application relates to the field of cable sheath condition assessment technology, and in particular to a method and related apparatus for assessing cable sheath aging. Background Technology

[0002] my country's economy is developing rapidly, and electricity is increasingly being used in various industries. The construction of power facilities is ongoing, and the demand for electricity in daily operations is growing daily, while the requirements for its use are also becoming increasingly stringent. Power cables are a crucial factor in determining the safety and stability of the power system. However, power cables operate in warm and humid environments for extended periods, making their sheaths susceptible to moisture intrusion and microbial erosion. Over time, this can lead to aging and damage of the cable insulation material, and in severe cases, grounding faults, posing a significant threat to the safe and stable operation of the power system.

[0003] Currently, methods for assessing the aging condition of 110kV XLPE cable sheaths are still scarce, and there are no widely used testing methods. Therefore, it is urgent to find a method for assessing the aging condition of 110kV XLPE cable sheaths, providing a basis for maintenance personnel to evaluate the service performance of cables, which is of great significance for ensuring the safe and reliable operation of power cables and improving the utilization rate of equipment assets. Summary of the Invention

[0004] This application provides a method and related apparatus for evaluating the aging of cable sheaths, used to assess the aging degree of 110kV XLPE cable sheath materials.

[0005] In view of this, the first aspect of this application provides a method for evaluating the aging of cable sheaths, the method comprising:

[0006] Test samples were obtained by cutting the cable sheath to be evaluated, wiping the test samples with alcohol, and then leaving them to stand.

[0007] The test sample was subjected to several tests using a RIGAKU-X-ray polycrystalline diffractometer, and several X-ray diffraction patterns of the test sample were recorded. Based on the several X-ray diffraction patterns, the intensities D of the two crystallization diffraction peaks of the diffraction curve were obtained. fi and D si and the angle θ corresponding to the two peaks. fi and si ;

[0008] The intensity D of the two crystal diffraction peaks fi and D si and the angle θ corresponding to the two peaks. fi and θ si Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor.

[0009] The aging state of the cable sheath to be evaluated is analyzed based on the diffraction evaluation factors.

[0010] Optionally, the formula for calculating the diffraction evaluation factor is:

[0011]

[0012] In the formula, D fi and D si θ represents the intensities of the two crystallographic diffraction peaks in the diffraction curve. fi and θ si δ represents the angles corresponding to the two peaks of the diffraction curve, and δ is the diffraction evaluation factor.

[0013] Optionally, the step of analyzing the aging state of the cable sheath to be evaluated based on the diffraction evaluation factors specifically includes:

[0014] When δ>1.16, the sheath of the cable to be evaluated is determined to be slightly aged;

[0015] When 0.72≤δ≤1.16, the sheath of the cable to be evaluated is determined to be of general aging.

[0016] When δ < 0.72, the sheath of the cable to be evaluated is determined to be severely aged.

[0017] Optionally, the step of performing several tests using a RIGAKU-X-ray polycrystalline diffractometer and recording several X-ray diffraction patterns of the test sample specifically includes:

[0018] The test sample was placed in a RIGAKU-X-ray polycrystalline diffractometer for testing. The RIGAKU-X-ray polycrystalline diffractometer was set with a tube voltage of 40 kV, a tube current of 200 μA, a Cu target, a diffraction width of DS = SS = 1°, RS = 0.3 mm, a scanning speed of 2,000 (d·min-1), and a scanning range of 10° to 35°. Several X-ray diffraction patterns of the test sample were recorded.

[0019] A second aspect of this application provides a cable sheath aging assessment system, the system comprising:

[0020] The pretreatment unit is used to cut the cable sheath to be evaluated to obtain the test sample, wipe the test sample with alcohol and let it stand;

[0021] The testing unit is used to perform several tests on the test sample using a RIGAKU-X-ray polycrystalline diffractometer, record several X-ray diffraction patterns of the test sample, and obtain the intensity D of the two crystallization diffraction peaks of the diffraction curve based on the several X-ray diffraction patterns. fi and Dsi and the angle θ corresponding to the two peaks. fi and θ si ;

[0022] The calculation unit is used to calculate the intensity D of the two crystallization diffraction peaks. fi and D si and the angle θ corresponding to the two peaks. fi and θ si Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor.

[0023] An evaluation unit is used to analyze the aging state of the cable sheath to be evaluated based on the diffraction evaluation factors.

[0024] Optionally, the formula for calculating the diffraction evaluation factor is:

[0025]

[0026] In the formula, D fi and D si θ represents the intensities of the two crystallographic diffraction peaks in the diffraction curve. fi and θ si δ represents the angles corresponding to the two peaks of the diffraction curve, and δ is the diffraction evaluation factor.

[0027] Optionally, the evaluation unit is specifically used for:

[0028] When δ>1.16, the sheath of the cable to be evaluated is determined to be slightly aged;

[0029] When 0.72≤δ≤1.16, the sheath of the cable to be evaluated is determined to be of general aging.

[0030] When δ < 0.72, the sheath of the cable to be evaluated is determined to be severely aged.

[0031] Optionally, the test unit is specifically used for:

[0032] The test sample was placed in a RIGAKU-X-ray polycrystalline diffractometer for testing. The RIGAKU-X-ray polycrystalline diffractometer was set to a tube voltage of 40 kV, a tube current of 200 μA, a Cu target, a diffraction width of DS = SS = 1°, RS = 0.3 mm, a scanning speed of 2.000 (d·min-1), and a scanning range of 10° to 35°. Several X-ray diffraction patterns of the test sample were recorded.

[0033] Based on several X-ray diffraction patterns, the intensities D of the two crystallographic diffraction peaks of the diffraction curve are obtained. fi and D si and the angle θ corresponding to the two peaks. fi and θ si.

[0034] A third aspect of this application provides a cable sheath aging assessment device, the device comprising a processor and a memory:

[0035] The memory is used to store program code and transmit the program code to the processor;

[0036] The processor is configured to execute the steps of the cable sheath aging assessment method as described in the first aspect above, according to the instructions in the program code.

[0037] A fourth aspect of this application provides a computer-readable storage medium for storing program code for executing the cable sheath aging assessment method described in the first aspect above.

[0038] As can be seen from the above technical solutions, this application has the following advantages:

[0039] This application provides a method for evaluating the aging of cable sheaths, comprising: cutting a test sample from the cable sheath to be evaluated; wiping the test sample with alcohol and allowing it to stand; performing several tests on the test sample using a RIGAKU-X-ray polycrystalline diffractometer; recording several X-ray diffraction patterns of the test sample; and obtaining the intensity D of the two crystalline diffraction peaks of the diffraction curve based on the several X-ray diffraction patterns. fi and D si and the angle θ corresponding to the two peaks. fi and θ si The intensity D of the two crystal diffraction peaks fi and D si and the angle θ corresponding to the two peaks. fi and θ si Substitute these values ​​into the diffraction evaluation factor calculation formula to obtain the diffraction evaluation factor; then analyze the aging state of the cable sheath to be evaluated based on the diffraction evaluation factor.

[0040] Compared with existing technologies, this invention can conveniently, efficiently, and safely detect and evaluate the aging degree of 110kV XLPE cable sheaths, avoiding damage and grounding faults caused by severe aging of the cable sheaths, and reducing losses caused by cable faults. It provides a basis for maintenance personnel to assess the service status of cable sheaths in a timely manner, effectively ensuring the reliability of cable line operation, and has high economic and social significance. Attached Figure Description

[0041] Figure 1 This is a flowchart illustrating an embodiment of a cable sheath aging assessment method provided in this application.

[0042] Figure 2This is a schematic diagram of an embodiment of a cable sheath aging assessment system provided in this application. Detailed Implementation

[0043] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0044] Please see Figure 1 The cable sheath aging assessment method provided in this application embodiment includes:

[0045] Step 101: Cut the cable sheath to be evaluated to obtain a test sample, wipe the test sample with alcohol and let it stand;

[0046] It should be noted that a test sample with a length of 20mm, a width of 20mm, and a thickness of 0.5mm was cut from the sheath of the XLPE cable segment to be evaluated. The sample was wiped clean with alcohol in an indoor environment and left to stand for 10 minutes.

[0047] Step 102: Perform several tests on the test sample using a RIGAKU-X-ray polycrystalline diffractometer, and record several X-ray diffraction patterns of the test sample. Based on the several X-ray diffraction patterns, obtain the intensity D of the two crystallographic diffraction peaks of the diffraction curve. fi and D si and the angle θ corresponding to the two peaks. fi and θ si ;

[0048] It should be noted that the processed cable sheath sample was placed in a RIGAKU-X-ray polycrystalline diffractometer for testing. The instrument was set with a tube voltage of 40 kV, a tube current of 200 μA, a Cu target, diffraction widths DS = SS = 1°, RS = 0.3 mm, a scanning speed of 2,000 (d·min⁻¹), and a scanning range of 10°–35°. The X-ray diffraction pattern of the cable sheath sample was recorded. The measurement was repeated 5 times, and the intensities D of the two crystallographic diffraction peaks of the diffraction curve were recorded respectively. f1 D f2 D f3 D f4 D f5 and D s1 D s2 D s3 D s4 D s5 And the angle θ corresponding to the two peaks.f1 θ f2 θ f3 θ f4 θ f5 and θ s1 θ s2 θ s3 θ s4 θ s5 .

[0049] Step 103: Intensity D of the two crystallization diffraction peaks fi and D si and the angle θ corresponding to the two peaks. fi and si Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor.

[0050] The diffraction evaluation factor is calculated using the following formula:

[0051]

[0052] In the formula, D fi and D si θ represents the intensities of the two crystallographic diffraction peaks in the diffraction curve. fi and θ si δ represents the angles corresponding to the two peaks of the diffraction curve, and δ is the diffraction evaluation factor.

[0053] Step 104: Analyze the aging status of the cable sheath to be evaluated based on diffraction evaluation factors.

[0054] Specifically:

[0055] When δ>1.16, the sheath of the cable to be evaluated is determined to be slightly aged;

[0056] When 0.72≤δ≤1.16, the sheath of the cable to be evaluated is determined to be of general aging.

[0057] When δ < 0.72, the sheath of the cable to be evaluated is determined to be severely aged.

[0058] The above is a cable sheath aging assessment method provided in the embodiments of this application. The following is a cable sheath aging assessment system provided in the embodiments of this application.

[0059] Please see Figure 2 The cable sheath aging assessment system provided in this application embodiment includes:

[0060] The pretreatment unit 201 is used to cut the cable sheath to be evaluated to obtain the test sample, wipe the test sample with alcohol and let it stand.

[0061] Test unit 202 is used to perform several tests on the test sample using a RIGAKU-X-ray polycrystalline diffractometer, record several X-ray diffraction patterns of the test sample, and obtain the intensity D of the two crystallization diffraction peaks of the diffraction curve based on the several X-ray diffraction patterns. fi and D si and the angle θ corresponding to the two peaks. fi and θ si ;

[0062] Calculation unit 203 is used to calculate the intensity D of the two crystal diffraction peaks. fi and D si and the angle θ corresponding to the two peaks. fi and θ si Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor.

[0063] Evaluation unit 204 is used to analyze the aging state of the cable sheath to be evaluated based on diffraction evaluation factors.

[0064] Furthermore, this application embodiment also provides a cable sheath aging assessment device, the device including a processor and a memory:

[0065] The memory is used to store program code and transmit the program code to the processor;

[0066] The processor is used to execute the steps of the cable sheath aging assessment method as described in the above method embodiments, according to the instructions in the program code.

[0067] Furthermore, this application embodiment also provides a computer-readable storage medium for storing program code for executing the methods described in the above method embodiments.

[0068] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the system and unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0069] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented, for example, in orders other than those illustrated or described herein. Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0070] It should be understood that in this application, "at least one (item)" means one or more, and "more than" means two or more. "And / or" is used to describe the relationship between related objects, indicating that three relationships can exist. For example, "A and / or B" can represent three cases: only A exists, only B exists, and both A and B exist simultaneously, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one (item) of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one (item) of a, b, or c can represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, and c can be single or multiple.

[0071] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection between apparatuses or units through some interfaces, and may be electrical, mechanical, or other forms.

[0072] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0073] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0074] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes: USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, optical disks, and other media capable of storing program code.

[0075] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.

Claims

1. A method for assessing the aging of cable sheaths, characterized in that, include: Test samples were obtained by cutting the cable sheath to be evaluated, wiping the test samples with alcohol, and then leaving them to stand. The test sample was subjected to several tests using a RIGAKU-X-ray polycrystalline diffractometer, and several X-ray diffraction patterns of the test sample were recorded. Based on the several X-ray diffraction patterns, the intensities of the two crystallographic diffraction peaks of the diffraction curve were obtained. and and the angles corresponding to the two peaks. and ; Intensity of the two crystal diffraction peaks and and the angles corresponding to the two peaks. and Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor. The aging state of the cable sheath to be evaluated is analyzed based on the diffraction evaluation factors. The formula for calculating the diffraction evaluation factor is as follows: ； In the formula, and The intensities of the two crystallographic diffraction peaks in the diffraction curve are... and The angles corresponding to the two peaks of the diffraction curve. This is the diffraction evaluation factor.

2. The cable sheath aging assessment method according to claim 1, characterized in that, The analysis of the aging state of the cable sheath to be evaluated based on the diffraction evaluation factors specifically includes: When δ>1.16, the sheath of the cable to be evaluated is determined to be slightly aged; When 0.72≤δ≤1.16, the sheath of the cable to be evaluated is determined to be of general aging. When δ < 0.72, the sheath of the cable to be evaluated is determined to be severely aged.

3. The cable sheath aging assessment method according to claim 1, characterized in that, The process involves performing several tests using a RIGAKU-X-ray polycrystalline diffractometer and recording several X-ray diffraction patterns of the test sample, specifically including: The test sample was placed in a RIGAKU-X-ray polycrystalline diffractometer for testing. The RIGAKU-X-ray polycrystalline diffractometer was set to a tube voltage of 40 kV, a tube current of 200 μA, a Cu target, a diffraction width of DS=SS=1°, RS=0.3 mm, a scanning speed of 2.000 (d•min-1), and a scanning range of 10°~35°. Several X-ray diffraction patterns of the test sample were recorded.

4. A cable sheath aging assessment system, characterized in that, include: The pretreatment unit is used to cut the cable sheath to be evaluated to obtain the test sample, wipe the test sample with alcohol and let it stand; The testing unit is used to perform several tests on the test sample using a RIGAKU-X-ray polycrystalline diffractometer, record several X-ray diffraction patterns of the test sample, and obtain the intensity of two crystallization diffraction peaks of the diffraction curve based on the several X-ray diffraction patterns. and and the angles corresponding to the two peaks. and ; The calculation unit is used to calculate the intensity of two crystal diffraction peaks. and and the angles corresponding to the two peaks. and Substitute these values ​​into the formula for calculating the diffraction evaluation factor to obtain the diffraction evaluation factor. An evaluation unit is used to analyze the aging state of the cable sheath to be evaluated based on the diffraction evaluation factors. The formula for calculating the diffraction evaluation factor is as follows: ； In the formula, and The intensities of the two crystallographic diffraction peaks in the diffraction curve are... and The angles corresponding to the two peaks of the diffraction curve. This is the diffraction evaluation factor.

5. The cable sheath aging assessment system according to claim 4, characterized in that, The evaluation unit is specifically used for: When δ>1.16, the sheath of the cable to be evaluated is determined to be slightly aged; When 0.72≤δ≤1.16, the sheath of the cable to be evaluated is determined to be of general aging. When δ < 0.72, the sheath of the cable to be evaluated is determined to be severely aged.

6. The cable sheath aging assessment system according to claim 4, characterized in that, The test unit is specifically used for: The test sample was placed in a RIGAKU-X-ray polycrystalline diffractometer for testing. The RIGAKU-X-ray polycrystalline diffractometer was set to a tube voltage of 40 kV, a tube current of 200 μA, a Cu target, a diffraction width of DS=SS=1°, RS=0.3 mm, a scanning speed of 2.000 (d•min-1), and a scanning range of 10°~35°. Several X-ray diffraction patterns of the test sample were recorded. Based on several X-ray diffraction patterns, the intensities of the two crystallographic diffraction peaks of the diffraction curves are obtained. and and the angles corresponding to the two peaks. and .

7. A cable sheath aging assessment device, characterized in that, The device includes a processor and a memory: The memory is used to store program code and transmit the program code to the processor; The processor is used to execute the cable sheath aging assessment method according to any one of claims 1-3 according to the instructions in the program code.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium is used to store program code for executing the cable sheath aging assessment method according to any one of claims 1-3.

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