Method, device, equipment and storage medium for prolonging data storage time

Abstract

The application relates to the technical field of storage, and discloses a method, device and equipment for prolonging data storage time and a storage medium, wherein the method comprises the following steps: performing influence factor testing on each Nand, so that each Nand obtains a corresponding weight value; taking the Nand with the maximum weight value as a cold storage particle; and transferring data with a write times lower than a times threshold into the cold storage particle, so as to ensure the stability of cold data storage.

Description

Technical Field

[0001] This invention relates to the field of storage technology, and in particular to methods, apparatus, devices and storage media for extending data storage time. Background Technology

[0002] Existing solid-state drives (SSDs) suffer from leakage current issues. Over time, the accumulated leakage current effect on the data stored in the flash memory chips can lead to a situation where the number of erroneous bits exceeds the maximum error correction capability of the storage controller chip, resulting in erroneous data reads. High-temperature environments accelerate leakage current, further shortening data storage time.

[0003] As solid-state drives (SSDs) become larger and more powerful, flash memory chips typically use a multi-channel, multi-die configuration. Concurrent operations cause the flash memory chips and storage controller chips to generate more heat, which not only necessitates heat dissipation for SSDs, but also reduces the storage time of data stored in the flash memory chips due to the increased ambient temperature.

[0004] Especially for large-capacity storage, considering the priority of signal stability, chips are usually symmetrically attached to both sides of the substrate and these chips are concentrated in a certain area of ​​the substrate as much as possible, so that the heat accumulation effect is more obvious.

[0005] The most common approach is to accelerate heat dissipation, such as adding heat sinks or fans to solid-state drives, to reduce the ambient temperature of the device. At the same time, data that has not been updated for a long time is refreshed periodically to reduce the probability of such errors.

[0006] Current technologies rely on direct physical heat dissipation, and there's no known method to actively avoid high-temperature areas. Furthermore, current cold data processing typically involves refreshing the data periodically, reading it out and writing it back. If the area being written back to is still sensitive to ambient temperature, or if the area being written to is prone to leakage current, the refresh frequency must be increased. Otherwise, the stability of storing cold data cannot be guaranteed, which in turn affects device performance and shortens its lifespan (adding an extra PE cycle). Summary of the Invention

[0007] The main objective of this invention is to solve the problem that existing methods cannot guarantee the stability of cold data storage.

[0008] The first aspect of the present invention provides a method for extending data storage time, comprising:

[0009] An impact factor test is performed on each Nand on the solid-state drive to obtain the corresponding test results, and a corresponding weight value is identified in each Nand based on the test results.

[0010] The Nand with the largest weight value is selected as the cold storage particle, wherein the cold storage particle is used to preferentially store cold data.

[0011] Record the number of times data in each Nand array of the solid-state drive has been erased and written, and obtain a record table;

[0012] Within a preset time period, data in the record table that has been erased or rewritten less than a preset threshold number is transferred to the cold storage particles.

[0013] Preferably, in a second implementation of the first aspect of the present invention, the influencing factor includes the number of error bits, which is negatively linearly correlated with the weight value of the Nand.

[0014] Preferably, in a third implementation of the first aspect of the present invention, the impact factor test for each Nand on the solid-state drive includes:

[0015] The solid-state drive is placed in an environment of 100 degrees Celsius, and random numbers are written into each of the Nand blocks within the solid-state drive.

[0016] Random numbers in each Nand are read at different time intervals to obtain the number of error bits in each Nand.

[0017] Preferably, in the fourth implementation of the first aspect of the present invention, the solid-state drive is provided with a computing chip, and the influencing factor includes the distance between the Nand and the computing chip, wherein the distance between the Nand and the computing chip is positively linearly correlated with the weight value of the Nand.

[0018] Preferably, in a fifth implementation of the first aspect of the present invention, the influencing factor includes temperature, and the influencing factor includes writing temperature and storage temperature;

[0019] By combining the various writing temperatures and the various storage temperatures, a variety of temperature combinations are obtained;

[0020] Solid-state drives are used to store data under various temperature combinations to obtain a table showing the relationship between temperature combinations and data storage duration. The data storage duration is positively linearly correlated with the weight value of the Nand.

[0021] Preferably, in a sixth implementation of the first aspect of the present invention, after transferring data in each Nand that has been erased or written less than a preset threshold number to the cold storage particle within a preset time period, the method further includes:

[0022] Determine whether the temperature of the Nand during the read / write process exceeds a preset temperature threshold;

[0023] If so, reduce the read / write rate of the Nand.

[0024] If not, then no action will be taken.

[0025] A second aspect of the present invention provides an apparatus for extending data storage time, the apparatus comprising:

[0026] The detection module is used to perform an impact factor test on each Nand on the solid-state drive, and to identify the corresponding weight value in each Nand based on the test results.

[0027] The selection module is used to select the Nand with the largest weight value as the cold storage particle, wherein the cold storage particle is used to preferentially store cold data.

[0028] The recording module is used to record the number of times data in each Nand block of the solid-state drive has been erased and written, and to obtain a recording table;

[0029] The cold data processing module is used to transfer data in each Nand that has been erased or written less than a preset threshold number to the cold storage particle within a preset time period.

[0030] A third aspect of the present invention provides an apparatus for extending data storage time, the apparatus comprising: a memory and at least one processor, the memory storing instructions, and the memory and the at least one processor being interconnected via a line;

[0031] The at least one processor invokes the instructions in the memory to cause the device to execute the above-described method for extending data storage time.

[0032] A fourth aspect of the present invention provides a computer-readable storage medium storing instructions that, when executed on a computer, cause the computer to perform the above-described method for extending data storage time.

[0033] The beneficial effects of this invention are as follows: by performing an impact factor test on each Nand, each Nand is given a corresponding weight value. The Nand with the largest weight value is used as the cold storage particle, and data with fewer than the number of erase / write cycles is transferred to the cold storage particle to ensure the stability of cold data storage. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the first embodiment of the method for extending data storage time in this invention;

[0035] Figure 2 This is a schematic diagram of a second embodiment of the method for extending data storage time in this invention;

[0036] Figure 3 This is a schematic diagram of a third embodiment of the method for extending data storage time in this invention;

[0037] Figure 4 This is a schematic diagram of one embodiment of the device for extending data storage time in this invention.

[0038] Figure 5 This is a schematic diagram of one embodiment of a device for extending data storage time according to an embodiment of the present invention. Detailed Implementation

[0039] This invention provides a method, system, apparatus, device, and storage medium for extending data storage time.

[0040] The terms “first,” “second,” “third,” “fourth,” etc. (if present) in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms “comprising” or “having,” and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0041] For ease of understanding, the specific process of the embodiments of the present invention is described below. Please refer to [link / reference]. Figure 1-3 One embodiment of the method for extending data storage time in this invention includes:

[0042] 101. Perform an impact factor test on each Nand on the solid-state drive, obtain the corresponding test results, and identify the corresponding weight value in each Nand according to the test results;

[0043] NAND flash memory combines the high density of EPROM with the flexibility of EEPROM. When NAND flash memory wears down, the speed of erasure and program operations slows down considerably. When transferring multiple small files, if each file is smaller than the block size defined by the NAND flash memory, it can result in very low transfer rates. Access lag also affects performance, but it is less than that of hard drives. Different types, processes, and technologies of NAND flash memory have different read and write speeds. Therefore, to identify which factors affect the data storage duration in NAND, it is necessary to test each NAND flash memory for the corresponding factors. By using the controlled variable method, the corresponding factors are identified, and the weight values ​​of each NAND flash memory are assigned based on the test results. The test results indicate how the corresponding factors affect the data storage duration, data integrity during read and write operations, and the stability of the speed. Based on these factors, the NAND flash memory is "scored," which means judging the storage quality of the NAND flash memory. The assigned weight values ​​are used to indicate the storage quality and storage priority of the current NAND flash memory.

[0044] Furthermore, the influencing factor includes the number of error bits, which is negatively linearly correlated with the weight value of the Nand.

[0045] In one disclosed embodiment, since data is stored in Nand arrays arranged according to storage peaks, there are gaps, or windows, between the storage peaks. The larger the window, the better the storage performance of the current Nand array, the less interference there is between data, and the less likely there are read / write errors after storage. However, when there are overlaps between storage peaks, the data will be disordered during reading, leading to incomplete data or read errors. The window between storage peaks is also affected by many factors, including the quality of the Nand array itself during production. Therefore, by scanning the storage peaks in the Nand array, it is possible to find out if there are overlaps among these storage peaks and record the number of overlaps, which is the number of error bits. The more error bits there are, the worse the storage capacity of the current Nand array is, and therefore the lower the weight value of the corresponding Nand array, and the less likely it is to be prioritized for storage.

[0046] Furthermore, the "perform impact factor testing on each Nand on the solid-state drive" can specifically be performed as follows:

[0047] 1011. Place the solid-state drive in an environment of 100 degrees Celsius and write random numbers into each of the Nand blocks in the solid-state drive;

[0048] 1012. Read random numbers from each of the Nand arrays at different time intervals to obtain the number of error bits in each Nand array.

[0049] In steps 1011-1012, the 100-degree Celsius environment represents the highest temperature that a solid-state drive (SSD) can operate at in real-world applications. Although SSDs may operate at even higher temperatures, the average operating temperature of an SSD, as commonly used by consumers, is between 50-75 degrees Celsius, fluctuating by only about 5 degrees Celsius. Existing SSDs also have additional heat sinks or other heatsinks for cooling, allowing them to maintain a good operating temperature even under high loads. Therefore, the 100-degree Celsius setting is to simulate the high-temperature conditions of an SSD in real-world applications, and to perform NAND screening under these conditions.

[0050] Furthermore, the solid-state drive is equipped with a computing chip, and the influencing factor includes the distance between the Nand and the computing chip, and the distance between the Nand and the computing chip is positively linearly correlated with the weight value of the Nand.

[0051] In one disclosed embodiment, the solid-state drive (SSD) includes a substrate, NAND flash memory, and computing chips. The memory chips and computing chips are soldered onto the substrate. There are typically three, four, six, or eight NAND flash units arranged on the substrate. In a single-board SSD, the computing chips and NAND flash memory are soldered to the same side, usually with only three or four NAND flash units. The computing chips are located at the ends of the substrate. Since both NAND flash memory and computing chips generate heat during operation, especially the computing chips which need to read, write, and manage data within the NAND flash memory, their heat generation is higher. The other NAND flash units are arranged side-by-side. On the substrate, the NAND flash memory closest to the computing chip is affected not only by its own heat generation but also by the heat generation of the computing chip and the adjacent NAND flash memory. As a result, the NAND flash memory at this location is most affected by the overall heat source. The NAND flash memory in the middle position is also affected by the heat generation of the NAND flash memory on both sides, so the heat source impact of the NAND flash memory at this position is moderate. The NAND flash memory furthest from the computing chip, that is, at the very end position, is only affected by the heat generation of itself and the NAND flash memory on one side. Therefore, the NAND flash memory at the very end position is least affected by the overall heat source, meaning that the NAND flash memory at this position has a higher weight value.

[0052] 102. The Nand with the largest weight value is selected as the cold storage particle, wherein the cold storage particle is used to preferentially store cold data;

[0053] 103. Record the number of times the data in each Nand block of the solid-state drive has been erased and written, and obtain a record table;

[0054] In steps 102-103, the stored data can be categorized into hot data, warm data, and cold data. Hot data refers to data from the past six months or less, which users frequently query. Correspondingly, hot data is placed in hot storage. For example, popular videos have high access volumes and demanding hardware, often requiring high-performance servers, storage, and bandwidth. Warm data can be data from the past six months to the past year. Users sometimes need to query data from the past year online, and this data is also suitable for storage in a database. If the data volume is small, the distinction between warm and hot data may not be necessary. Cold data is data that is rarely used. This data can be stored in a lower-performance, cheaper file system. Correspondingly, cold data is placed in cold storage. For example, less popular videos have low access volumes and low data center performance requirements, and are generally allocated to lower-performance servers.

[0055] Therefore, we only need to distinguish cold data here. We define cold data as data with low access volume or low read / write frequency within a specified time. Here, FTL is used to identify and move cold data.

[0056] Furthermore, the influencing factors include write temperature and storage temperature;

[0057] By combining the various writing temperatures and the various storage temperatures, a variety of temperature combinations are obtained;

[0058] Solid-state drives are used to store data under various temperature combinations to obtain a table showing the relationship between temperature combinations and data storage duration. The data storage duration is positively linearly correlated with the weight value of the Nand.

[0059] In one disclosed embodiment, the number of error bits and the influence factors of distance from the computing chip in the two embodiments mentioned above are both indirectly affected by temperature. However, temperature is not simply positively or negatively linearly correlated with the weight value of the Nand, but is determined by the write temperature and the storage temperature after power failure. Here we tested several temperature combinations, where the write temperature is 40 degrees Celsius or 55 degrees Celsius, and the storage temperature is 25 degrees Celsius or 40 degrees Celsius. The following is a table comparing the temperature combinations with the data storage duration:

[0060]

[0061]

[0062] Therefore, the data storage time can be obtained from the comparison table of temperature combination and data storage duration. When the write temperature is 55 degrees Celsius and the storage temperature is 25 degrees Celsius, the data storage time can reach 404 weeks.

[0063] 104. Within a preset time period, transfer data in the record table whose number of erase / write cycles is lower than a preset threshold to the cold storage particles.

[0064] 1051. Determine whether the temperature of the Nand during the read / write process is greater than a preset temperature threshold;

[0065] 1052. If so, reduce the read / write rate of the Nand.

[0066] 1053. If not, then no action is taken.

[0067] In steps 1051-1053, the temperature of each Nand during the current read / write process is detected, and it is determined whether the temperature exceeds a threshold temperature, which is 70 degrees Celsius or above, or 80 degrees Celsius or above. Therefore, the read / write rate of the Nand is reduced to control heat generation, thereby extending the lifespan of the Nand and the storage time of the data within it.

[0068] In this embodiment, an impact factor test is performed on each Nand to obtain a corresponding weight value. The Nand with the largest weight value is selected as the cold storage particle, and data with fewer than the number of erase / write cycles is transferred to the cold storage particle to ensure the stability of cold data storage.

[0069] The method for extending data storage time in embodiments of the present invention has been described above. The apparatus for extending data storage time in embodiments of the present invention is described below. Please refer to [link / reference]. Figure 4 One embodiment of the device for extending data storage time in this invention includes:

[0070] The detection module 201 is used to perform an impact factor test on each Nand on the solid-state drive, and to identify the corresponding weight value in each Nand based on the test results.

[0071] Selection module 202 is used to select the Nand with the largest weight value as the cold storage particle, wherein the cold storage particle is used to preferentially store cold data;

[0072] Recording module 203 is used to record the number of times data in each Nand block of the solid-state drive has been erased and written, and to obtain a record table;

[0073] The cold data processing module 204 is used to transfer data in each Nand that has been erased or written less than a preset threshold number to the cold storage particle within a preset time period.

[0074] In another embodiment of the device for extending data storage time according to the present invention, the device for extending data storage time includes:

[0075] The detection module 201 is used to perform an impact factor test on each Nand on the solid-state drive, and to identify the corresponding weight value in each Nand based on the test results.

[0076] Selection module 202 is used to select the Nand with the largest weight value as the cold storage particle, wherein the cold storage particle is used to preferentially store cold data;

[0077] Recording module 203 is used to record the number of times data in each Nand block of the solid-state drive has been erased and written, and to obtain a record table;

[0078] The cold data processing module 204 is used to transfer data in each Nand that has been erased or written less than a preset threshold number to the cold storage particle within a preset time period.

[0079] The influencing factor includes the number of error bits, which is negatively linearly correlated with the weight value of the Nand.

[0080] Specifically, the "perform impact factor testing on each Nand on the solid-state drive" function, when the impact factor is the number of faulty bits, can also be executed as follows:

[0081] The solid-state drive is placed in an environment of 100 degrees Celsius, and random numbers are written into each of the Nand blocks within the solid-state drive.

[0082] Random numbers in each Nand are read at different time intervals to obtain the number of error bits in each Nand.

[0083] The solid-state drive (SSD) is equipped with a computing chip. The influencing factor includes the distance between the NAND flash memory and the computing chip. The distance between the NAND flash memory and the computing chip is positively linearly correlated with the weight value of the NAND flash memory.

[0084] The influencing factors include write temperature and storage temperature. Multiple write temperatures and multiple storage temperatures are combined to obtain multiple temperature combinations. Solid-state drives are used to store data under each of the multiple temperature combinations to obtain a table of temperature combinations and data storage duration. The data storage duration is positively linearly correlated with the weight value of the Nand.

[0085] Specifically, the following can be executed after the cold data processing module 204:

[0086] Determine whether the temperature of the Nand during the read / write process exceeds a preset temperature threshold;

[0087] If so, reduce the read / write rate of the Nand.

[0088] If not, then no operation is performed. Specifically, the configuration module 201 can also execute:

[0089] In this embodiment, an impact factor test is performed on each Nand to obtain a corresponding weight value. The Nand with the largest weight value is selected as the cold storage particle, and data with fewer than the number of erase / write cycles is transferred to the cold storage particle to ensure the stability of cold data storage.

[0090] The above is attached Figure 4 The device for extending data storage time in the embodiments of the present invention will be described in detail from the perspective of modular functional entities. The device for extending data storage time in the embodiments of the present invention will be described in detail from the perspective of hardware processing.

[0091] Appendix Figure 5 This is a schematic diagram of a device for extending data storage time according to an embodiment of the present invention. The device 300 for extending data storage time can vary significantly due to different configurations or performance characteristics. It may include one or more central processing units (CPUs) 310 (e.g., one or more processors) and a memory 320, and one or more storage media 330 (e.g., one or more massive solid-state drives) for storing application programs 333 or data 332. The memory 320 and storage media 330 can be temporary or persistent storage. The program stored in the storage media 330 may include one or more modules (not shown in the diagram), each module including a series of instruction operations on the device 300 for extending data storage time. More preferably, the processor 310 may be configured to communicate with the storage media 330 and execute the series of instruction operations on the storage media 330 on the device 300 for extending data storage time.

[0092] The device 300 for extending data storage time may also include one or more power supplies 340, one or more wired or wireless network interfaces 350, one or more input / output interfaces 360, and / or one or more operating systems 331, such as Windows Server, Mac OS X, Unix, Linux, FreeBSD, etc. Those skilled in the art will understand that... Figure 5The device structure shown for extending data storage time does not constitute a limitation on the device for extending data storage time, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0093] The present invention also provides a computer-readable storage medium, which may be a non-volatile computer-readable storage medium or a volatile computer-readable storage medium, wherein the computer-readable storage medium stores instructions that, when the instructions are executed on a computer, cause the computer to perform the steps of the method and system for extending data storage time.

[0094] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the system, device, or unit described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0095] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0096] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for prolonging data storage time, applied to a solid state disk, characterized in that, The method comprises: Each Nand on the solid state disk is subjected to an influence factor test, a corresponding test result is obtained, and a corresponding weight value is identified in each Nand according to the test result; The Nand with the largest weight value is used as a cold storage particle, wherein the cold storage particle is used to preferentially store cold data; The number of times of erasing and writing data in each Nand in the solid state disk is recorded to obtain a record table; Data with a number of times of erasing and writing lower than a preset threshold in the record table is transferred to the cold storage particle within a preset time; The solid state disk is provided with an operation chip, the influence factor includes the distance between the Nand and the operation chip, and the distance between the Nand and the operation chip is positively linearly related to the weight value of the Nand; The influence factor includes a writing temperature and a storage temperature; A plurality of writing temperatures and a plurality of storage temperatures are combined to obtain a plurality of temperature combinations; The solid state disk is subjected to data storage under a plurality of temperature combinations to obtain a comparison table of temperature combinations and data storage time lengths, wherein the data storage time length is positively linearly related to the weight value of the Nand.

2. The method of extending data storage time of claim 1, wherein, The influence factor includes the number of error bits, and the number of error bits is negatively linearly related to the weight value of the Nand.

3. The method of extending data storage time of claim 2, wherein, The influence factor test of each Nand on the solid state disk comprises: The solid state disk is placed in an environment of 100 degrees Celsius, and random numbers are written in each Nand in the solid state disk; The random numbers in each Nand are read at different time intervals to obtain the number of error bits of each Nand.

4. The method for extending data storage time according to claim 1, wherein, After the data with a number of times of erasing and writing lower than a preset threshold in each Nand is transferred to the cold storage particle within a preset time, the method further comprises: Judging whether the temperature of the Nand during the reading and writing process is greater than a preset temperature threshold; If yes, the reading and writing speed of the Nand is reduced; If not, no operation is performed.

5. An apparatus for extending data storage time, characterized by, The device for prolonging data storage time comprises: A detection module for performing an influence factor test on each Nand on the solid state disk and identifying a corresponding weight value in each Nand according to the obtained test result; A selection module for using the Nand with the largest weight value as a cold storage particle, wherein the cold storage particle is used to preferentially store cold data; A recording module for recording the number of times of erasing and writing data in each Nand in the solid state disk to obtain a record table; A cold data processing module for transferring data with a number of times of erasing and writing lower than a preset threshold in each Nand to the cold storage particle within a preset time; The solid state disk is provided with an operation chip, the influence factor includes the distance between the Nand and the operation chip, and the distance between the Nand and the operation chip is positively linearly related to the weight value of the Nand; The influence factor includes a writing temperature and a storage temperature; A plurality of writing temperatures and a plurality of storage temperatures are combined to obtain a plurality of temperature combinations; The solid state disk is subjected to data storage under a plurality of temperature combinations to obtain a comparison table of temperature combinations and data storage time lengths, wherein the data storage time length is positively linearly related to the weight value of the Nand. The solid state disk is respectively subjected to data storage under a plurality of temperature combinations to obtain a control table of temperature combinations and data storage time lengths, wherein the data storage time length is positively linearly correlated with the weight value of the Nand.

6. An apparatus for extending data storage time, characterized by, The device for prolonging data storage time comprises a memory and at least one processor, the memory has instructions stored therein, and the memory and the at least one processor are interconnected by a circuit; The at least one processor invokes the instructions in the memory, so that the device for prolonging data storage time executes the method for prolonging data storage time according to any one of claims 1-4.

7. A computer-readable storage medium having stored thereon a computer program, characterized in that The computer program is executed by a processor to implement the method for prolonging data storage time according to any one of claims 1-4.

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