Performance testing methods, apparatus, equipment and storage media for electronic products

Abstract

This disclosure provides a performance testing method, apparatus, device, and storage medium for electronic products. After a power consumption test is completed, the average actual power consumption of the test device is obtained. Based on the power consumption design value of the test device and the average actual power consumption, it is determined whether the test device meets the optimal qualification conditions. If the test device does not meet the optimal qualification conditions, it is determined whether it meets the qualification conditions based on whether the test device triggers the temperature limit of the control chip and / or display chip within the test device, and by obtaining the average ambient temperature of the test device during the power consumption test. This method not only enables intelligent detection and control and convenient operation, but also effectively reduces the misjudgment rate of electronic product performance testing, avoiding waste of manpower and funds.

Description

Technical Field

[0001] This disclosure relates to the field of computer technology, and in particular to a method, apparatus, device and storage medium for testing the performance of electronic products. Background Technology

[0002] Electronic products must undergo performance testing (run-in test) before leaving the factory to ensure that the electronic products purchased by users are free of quality problems.

[0003] For example, when the electronic product is a laptop, the CPU & GPU Thermal Test (CGTT) is one of the most important performance tests. Generally, the standard testing environment temperature for laptop CGTT is 25±5℃. However, in actual testing, due to the large number of laptops being tested simultaneously, the ambient temperature in the performance testing area often reaches 35±5℃. Because the actual temperature does not meet the standard testing temperature, these products cannot achieve the expected test results, resulting in a false positive rate as high as 20%.

[0004] In existing technologies, staff often add air conditioning vents and / or increase the number of fans in the performance testing area to solve the above problems. Although this method can help speed up the circulation of hot air, the large area of ​​the performance testing area leads to large temperature differences in different parts. Therefore, in actual testing, this method cannot effectively reduce the false judgment rate of laptop performance, but instead increases the cost. Summary of the Invention

[0005] This disclosure provides a method, apparatus, device, and storage medium for testing the performance of electronic products, in order to at least solve the above-mentioned technical problems existing in the prior art.

[0006] According to a first aspect of this disclosure, a method for testing the performance of an electronic product is provided, the method comprising:

[0007] After the power consumption test of the machine under test is completed, the average actual power consumption of the machine under test is obtained;

[0008] Based on the design power consumption value of the machine under test and the average actual power consumption, determine whether the machine under test meets the optimal qualification conditions;

[0009] If the test instrument does not meet the optimal qualification conditions, then the test instrument is judged to meet the qualification conditions based on whether the test instrument triggers the temperature limit of the control chip and / or display chip in the test instrument, and the average ambient temperature of the test instrument during the power consumption test.

[0010] In one possible implementation, determining whether the test instrument meets the qualification criteria based on whether the test instrument triggers the temperature limit of the control chip and / or display chip within the test instrument and by obtaining the average ambient temperature of the test instrument during the power consumption test includes:

[0011] If the device under test triggers the temperature limit of the control chip and / or display chip inside the device under test, an ambient temperature request command is sent to the server to obtain the average ambient temperature of the device under test during the power consumption test.

[0012] Based on the average ambient temperature of the machine under test during the power consumption test, determine the reference power consumption value of the model corresponding to the average ambient temperature.

[0013] Based on the power consumption reference value of the model and the average actual power consumption of the test machine, determine whether the test machine meets the qualification conditions.

[0014] In one possible implementation, after sending an ambient temperature request command to the server to obtain the average ambient temperature of the device under test during the power consumption test, the method further includes:

[0015] If it fails to obtain the average ambient temperature of the device under test during the power consumption test, the device under test is deemed not to meet the qualification conditions based on the power consumption design value of the device under test.

[0016] In one possible implementation, the step of determining whether the test instrument meets the qualification conditions based on whether the test instrument triggers the temperature limit of the control chip and / or display chip within the test instrument and the average ambient temperature of the test instrument during the power consumption test further includes:

[0017] If the test instrument does not trigger the temperature limit of the control chip and / or display chip inside the test instrument, then the test instrument is determined to not meet the qualification conditions.

[0018] In one possible implementation, obtaining the average actual power consumption of the device under test includes:

[0019] Obtain the power consumption test period of the machine under test;

[0020] A preset power consumption extraction start point is established. Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined. Based on the multiple time-based power consumption data of the machine under test, the average actual power consumption of the machine under test is determined.

[0021] In one possible implementation, before obtaining the average actual power consumption of the device under test after the power consumption test is completed, the method further includes:

[0022] Temperature sensors are installed in each sub-region of the performance test area, and the network protocol address of each sub-region is associated with the device number of the temperature sensor corresponding to each sub-region, and stored in the data cache library.

[0023] A preset acquisition interval time is set, and temperature data from each temperature sensor is acquired according to the acquisition interval time. The acquisition time point and the temperature data of each temperature sensor are stored in the data cache.

[0024] Accordingly, obtaining the average ambient temperature of the device under test during the power consumption test includes:

[0025] Obtain the current network protocol address of the sub-region where the machine under test is located;

[0026] In the data cache, based on the current network address and the current power consumption test period of the device under test, the current temperature data uploaded by the temperature sensor corresponding to the current network address is determined;

[0027] Based on the current temperature data, determine the average ambient temperature of the machine under test during the power consumption test.

[0028] In one possible implementation, before obtaining the average actual power consumption of the device under test after the power consumption test is completed, the method further includes:

[0029] The power consumption data of the test instrument under test at various time points during the power consumption test period are stored in the power data cache library of the test instrument under test.

[0030] Accordingly, determining multiple time-based power consumption data of the machine under test based on the power consumption test period and the power consumption extraction start point includes:

[0031] Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined in the power data cache of the machine under test.

[0032] According to a second aspect of this disclosure, a performance testing apparatus for electronic products is provided, the apparatus comprising:

[0033] The power consumption acquisition module is used to acquire the average actual power consumption of the machine under test after the power consumption test is completed.

[0034] The first judgment module is used to determine whether the machine under test meets the optimal qualification conditions based on the machine power consumption design value and the average actual power consumption of the machine under test.

[0035] The second judgment module is used to determine whether the test instrument meets the qualification conditions if the test instrument does not meet the optimal qualification conditions, based on whether the test instrument triggers the power protection temperature wall and the average ambient temperature of the test instrument during the power consumption test.

[0036] In one possible implementation, the second determination module is specifically used for:

[0037] If the device under test triggers the temperature limit of the control chip and / or display chip inside the device under test, an ambient temperature request command is sent to the server to obtain the average ambient temperature of the device under test during the power consumption test.

[0038] Based on the average ambient temperature of the machine under test during the power consumption test, determine the reference power consumption value of the model corresponding to the average ambient temperature.

[0039] Based on the power consumption reference value of the model and the average actual power consumption of the test machine, determine whether the test machine meets the qualification conditions.

[0040] In one possible implementation, the second judgment module is further specifically configured to: after sending an ambient temperature request command to the server and obtaining the average ambient temperature of the device under test during the power consumption test,

[0041] If it fails to obtain the average ambient temperature of the device under test during the power consumption test, the device under test is deemed not to meet the qualification conditions based on the power consumption design value of the device under test.

[0042] In one possible implementation, the second determination module is further specifically used for:

[0043] If the test instrument does not trigger the temperature limit of the control chip and / or display chip inside the test instrument, then the test instrument is determined to not meet the qualification conditions.

[0044] In one possible implementation, the power consumption acquisition module is specifically used for:

[0045] Obtain the power consumption test period of the machine under test;

[0046] A preset power consumption extraction start point is established. Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined. Based on the multiple time-based power consumption data of the machine under test, the average actual power consumption of the machine under test is determined.

[0047] In one possible embodiment, the device further includes: a data storage module,

[0048] This is used to install temperature sensors in each sub-area of ​​the performance test area after the power consumption test of the machine under test is completed and before the actual average power consumption of the machine under test is obtained, and to establish an association between the network address of each sub-area and the device number of the temperature sensor corresponding to each sub-area, and store it in the data cache library;

[0049] A preset acquisition interval time is set, and temperature data from each temperature sensor is acquired according to the acquisition interval time. The acquisition time point and the temperature data of each temperature sensor are stored in the data cache.

[0050] Accordingly, the second judgment module is specifically used for:

[0051] Obtain the current network protocol address of the sub-region where the machine under test is located;

[0052] In the data cache, based on the current network address and the current power consumption test period of the device under test, the current temperature data uploaded by the temperature sensor corresponding to the current network address is determined;

[0053] Based on the current temperature data, determine the average ambient temperature of the machine under test during the power consumption test.

[0054] In one possible implementation, the data storage module is further configured to: before acquiring the average actual power consumption of the device under test after the power consumption test is completed,

[0055] The power consumption data of the test instrument under test at various time points during the power consumption test period are stored in the power data cache library of the test instrument under test.

[0056] Accordingly, the second judgment module is specifically used for:

[0057] Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined in the power data cache of the machine under test.

[0058] According to a third aspect of this disclosure, an electronic device is provided, comprising:

[0059] At least one processor; and

[0060] A memory communicatively connected to the at least one processor; wherein,

[0061] The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the methods described in this disclosure.

[0062] According to a fourth aspect of this disclosure, a non-transitory computer-readable storage medium is provided storing computer instructions for causing the computer to perform the methods described in this disclosure.

[0063] This disclosure discloses a performance testing method, apparatus, device, and storage medium for electronic products. After a power consumption test is completed, the average actual power consumption of the test device is obtained. Based on the power consumption design value of the test device and the average actual power consumption, it is determined whether the test device meets the optimal qualification conditions. If the test device does not meet the optimal qualification conditions, it is determined whether the test device meets the qualification conditions based on whether the test device triggers the temperature limit of the control chip and / or display chip within the test device, and by obtaining the average ambient temperature of the test device during the power consumption test. This not only enables intelligent detection and control and convenient operation, but also effectively reduces the misjudgment rate of electronic product performance testing.

[0064] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this disclosure, nor is it intended to limit the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0065] The above and other objects, features, and advantages of this disclosure will become readily apparent from the following detailed description of exemplary embodiments, taken in conjunction with the accompanying drawings. Several embodiments of this disclosure are illustrated in the drawings by way of example and not limitation, in which:

[0066] In the accompanying drawings, the same or corresponding reference numerals indicate the same or corresponding parts.

[0067] Figure 1A A schematic diagram illustrating the implementation flow of an electronic product performance testing method provided in Embodiment 1 of this disclosure is shown.

[0068] Figure 1B A logical framework diagram of an exemplary performance testing method for an electronic product provided in Embodiment 1 of this disclosure is shown.

[0069] Figure 2A A schematic diagram illustrating the implementation flow of an electronic product performance testing method provided in Embodiment 2 of this disclosure is shown.

[0070] Figure 2B A flowchart illustrating the workflow of an electronic product performance testing method according to Embodiment 2 of this disclosure is shown.

[0071] Figure 3 This diagram illustrates the structure of an electronic product performance testing device according to Embodiment 3 of this disclosure;

[0072] Figure 4 A schematic diagram of the composition structure of an electronic device according to an embodiment of the present disclosure is shown. Detailed Implementation

[0073] To make the objectives, features, and advantages of this disclosure more apparent and understandable, the technical solutions in the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without creative effort are within the scope of protection of this disclosure.

[0074] Example 1

[0075] Figure 1A This is a flowchart illustrating a performance testing method for an electronic product according to Embodiment 1 of this disclosure. This method can be executed by a performance testing device for the electronic product provided in this embodiment, which can be implemented using software and / or hardware. Specifically, the method includes:

[0076] S110. After the power consumption test of the machine under test is completed, obtain the average actual power consumption of the machine under test.

[0077] The device under test (DUT) can be any type of electronic product used for performance testing; for example, in this embodiment, the DUT is a laptop computer. Power consumption testing can be used to test the performance of the central processing unit (CPU) and / or graphics processing unit (GPU) within the electronic product. It can also be described as a single-stress test to test CPU or GPU performance, or a dual-stress test to test both CPU and GPU performance. The actual average power consumption can be the average actual power consumption of the DUT during the power consumption test period under stable operating conditions.

[0078] Specifically, this embodiment can detect whether the device under test (DUT) is qualified based on the average actual power consumption of the DUT. Specifically, after the power consumption test of the DUT is completed, this embodiment can obtain the actual power consumption values ​​of the DUT at various time points during the power consumption test period through a server, and then perform average processing on these actual power consumption values ​​to obtain the average actual power consumption of the DUT.

[0079] In this embodiment of the disclosure, obtaining the average actual power consumption of the device under test includes: obtaining the power consumption test time period of the device under test; preset the power consumption extraction start point; determining multiple time power consumption data of the device under test based on the power consumption test time period and the power consumption extraction start point; and determining the average actual power consumption of the device under test based on the multiple time power consumption data of the device under test.

[0080] The power consumption test period can be the total time used by the device under test (DUT) during the power consumption test. The power consumption extraction start point can be the time point set in this embodiment to begin extracting the actual power consumption value in order to obtain a stable actual power consumption value. The power consumption data can be the actual power consumption values ​​at various time points within the power consumption test period after the DUT has been running stably.

[0081] Specifically, to obtain the average actual power consumption of the device under test (DUT), this embodiment first needs to obtain the actual power consumption value during the power consumption test period after the DUT has been running stably. Since the actual power consumption value of each DUT is unstable during the warm-up phase, this embodiment can set a corresponding power consumption extraction start point based on the actual performance of the DUT. Then, using this power consumption extraction start point, the power consumption test period of the DUT is extracted, excluding the unstable actual power consumption value in the early stage, thus obtaining the actual power consumption value after the DUT has been running stably, i.e., multiple time-based power consumption data of the DUT. These power consumption data are then averaged to determine the average actual power consumption of the DUT. For example, if the power consumption test period of the DUT is 15 minutes and the power consumption extraction start point is 5 minutes, then the actual power consumption value between the 5th and 15th minutes of the power consumption test is collected, and its average actual power consumption is calculated.

[0082] S120. Based on the design power consumption value and the average actual power consumption of the machine under test, determine whether the machine under test meets the optimal qualification conditions.

[0083] The power consumption design value is based on the specific model of the machine under test (DUT). It represents the optimal power consumption value designed by the R&D engineers, which is also the lowest actual power consumption value of the DUT under qualified conditions. The optimal qualified condition can be considered the best condition for determining whether the performance of the DUT is qualified.

[0084] Specifically, because different models have different heat dissipation capabilities for their heat sinks, and the selected CPUs and GPUs also differ, the power consumption design values ​​for each test machine model also vary. Therefore, this embodiment compares the average actual power consumption of the test machine with its corresponding model's power consumption design value to determine whether the test machine meets the optimal qualification criteria. For example, if the average actual power consumption of the test machine is less than or equal to its corresponding model's power consumption design value, then the test machine meets the optimal qualification criteria, and is considered qualified.

[0085] S130. If the test instrument does not meet the optimal qualification conditions, the test instrument is judged to meet the qualification conditions based on whether the test instrument triggers the temperature limit of the control chip and / or display chip inside the test instrument, and the average ambient temperature of the test instrument during the power consumption test.

[0086] The temperature limit can be a critical temperature value set to protect the laptop's chips. The average ambient temperature can be the average temperature of the surrounding environment of the device under test during power consumption testing.

[0087] In this embodiment of the disclosure, if the test instrument does not trigger the temperature limit of the control chip and / or display chip inside the test instrument, it is determined that the test instrument does not meet the qualification conditions.

[0088] Specifically, due to the influence of temperature, some qualified test devices (DDTs) fail to meet the optimal pass conditions during power consumption testing. Therefore, this embodiment designs a second evaluation criterion to reduce the misjudgment rate of DDT performance. If the DDT does not meet the optimal pass conditions, when the power consumption test is a single-core stress test, for example, testing the control chip of the CPU, the DDT is judged as an unqualified product because the temperature limit of the CPU control chip is not triggered; similarly, when testing the control chip of the GPU, the DDT is judged as an unqualified product because the temperature limit of the GPU control chip is not triggered. When the power consumption test is a dual-core stress test, if either the temperature limit of the CPU control chip or the temperature limit of the GPU display chip is not triggered, the DDT will be judged as an unqualified product. Whether it's a single-stress test or a dual-stress test, if the optimal pass conditions are not met, as long as the CPU control chip temperature limit and / or GPU display chip temperature limit are triggered, this embodiment can obtain the ambient temperature value of the test machine at each time point during the power consumption test period obtained from the server. The average ambient temperature of the test machine during the power consumption test can be obtained, and the power consumption design value of the test machine corresponding to the average ambient temperature value can be used to determine whether the test machine meets the pass conditions.

[0089] The method provided in this embodiment can effectively solve the problem of misjudgment of the performance of the test equipment caused by the ambient temperature in the performance testing area. This method not only effectively saves manpower, but also saves a lot of money.

[0090] In this embodiment of the disclosure, after sending an ambient temperature request command to the server to obtain the average ambient temperature of the device under test during the power consumption test, the method further includes: if obtaining the average ambient temperature of the device under test during the power consumption test fails, then based on the power consumption design value of the device under test, it is determined that the device under test does not meet the qualification conditions.

[0091] Specifically, in this embodiment, if the device under test (DUT) does not meet the optimal qualification conditions and triggers the temperature limit of the control chip and / or display chip within the DUT, the DUT is likely qualified, and the misjudgment of its performance is solely due to temperature factors. Therefore, this embodiment needs to retrieve the ambient temperature values ​​at various points in time during the power consumption test period from the server, and then re-evaluate the performance of the DUT. However, if the ambient temperature of the DUT during the power consumption test period cannot be obtained due to network latency or a damaged temperature sensor, and thus the average ambient temperature of the DUT during the power consumption test period cannot be obtained, in this case, for safety, this embodiment still judges based on the optimal qualification conditions. By using the power consumption design value of the model and the judgment result of the average actual power consumption of the DUT, it is directly determined that the DUT does not meet the qualification conditions.

[0092] In this embodiment of the disclosure, before obtaining the actual average power consumption of the device under test (DUT) after the power consumption test is completed, the method further includes: installing temperature sensors in each sub-area of ​​the performance test area, establishing an association between the network protocol address of each sub-area and the device number of the corresponding temperature sensor, and storing the association in a data cache; pre-setting a collection interval time, collecting temperature data from each temperature sensor according to the collection interval time, and storing the collection time point and the temperature data of each temperature sensor in the data cache; correspondingly, obtaining the average ambient temperature of the DUT during the power consumption test includes: obtaining the current network protocol address of the sub-area where the DUT is located; determining the current temperature data uploaded by the temperature sensor corresponding to the current network protocol address in the data cache based on the current network protocol address and the current power consumption test time period of the DUT; and determining the average ambient temperature of the DUT during the power consumption test based on the current temperature data.

[0093] The network address can be the network address used by each sub-region within the performance test area. The interval time can be the interval for collecting temperature data; for example, in this embodiment, the collection time is set to collect data once every 1 minute. The data cache can be a database established on the server to store the ambient temperature of each sub-region. The collection interval time can be the interval set for collecting ambient temperature data.

[0094] Generally, a factory area for testing the performance of a machine under test (DUT) consists of multiple performance testing sub-areas. Each sub-area is equipped with a temperature sensor and a network address, and each temperature sensor has a corresponding device number, with each network address being different. In this embodiment, to accurately obtain the ambient temperature of each DUT, a correlation is established between the network address of each sub-area and the device number of the corresponding temperature sensor, and this correlation is stored in a data cache to record the ambient temperature and acquisition time of each sub-area. During the acquisition process, this embodiment can collect temperature data from each temperature sensor according to the acquisition interval, distinguishing them by different network addresses, and storing the acquisition time point and the temperature data of each temperature sensor in the data cache.

[0095] In this embodiment, when a user needs to obtain the ambient temperature value of the device under test during the power consumption test through the server, the user can first obtain the current network address of the performance test sub-region where the device under test is located, find the corresponding temperature sensor device number through the network address of the performance test sub-region in the data cache library, find the current power consumption test time period of the device under test through the temperature sensor device number, obtain the temperature data of multiple time points within the current power consumption test time period, and finally perform average processing on the obtained temperature data to determine the average ambient temperature of the device under test during the power consumption test.

[0096] In this embodiment of the disclosure, before obtaining the average actual power consumption of the device under test after the power consumption test is completed, the method further includes: storing the power consumption data of the device under test at various time points during the power consumption test period in the power data cache of the device under test; correspondingly, determining multiple time power consumption data of the device under test based on the power consumption test period and the power consumption extraction start point, including: determining multiple time power consumption data of the device under test in the power data cache of the device under test based on the power consumption test period and the power consumption extraction start point.

[0097] The power data cache library can be a database used to cache the actual power consumption values ​​at various time points within the power consumption test period.

[0098] Specifically, in this embodiment, the actual power consumption data of the device under test (DUT) is stored in the DUT's power data cache. Therefore, after the DUT completes the power consumption test, this embodiment stores the actual power consumption values ​​at each time point within the power consumption test period into the DUT's power data cache. Based on testing requirements, when the average actual power consumption of the DUT needs to be obtained, this embodiment can determine the power consumption period of the DUT's stable operating state by using the power consumption test period and the power consumption extraction start point. Then, using this power consumption period, it retrieves multiple time-based power consumption data of the DUT within the corresponding time period from the DUT's power data cache.

[0099] For example, Figure 1B This is a logical framework diagram of an exemplary performance testing method for an electronic product provided in this disclosure. Figure 1B As shown, this embodiment uploads the ambient temperature data collected by temperature sensors in each sub-region to the server for storage via a wireless router (AP) using the Message Queuing Transport (MQTT) protocol. Simultaneously, it uploads the corresponding network protocol address. For example, the reporting time can be 40 seconds per upload, and the data can be stored in a database service. Alternatively, this embodiment can upload data to the server via a web API request, based on the power consumption test period and the network protocol address of the corresponding performance test sub-region for each device under test. This establishes a complete correspondence between the data and the average ambient temperature on the server for subsequent processing. Furthermore, this embodiment requires the cooperation of an interface database service (JAVA service) and an EMQ service to complete the performance testing process for the devices under test.

[0100] The performance testing method for electronic products provided in this embodiment can automatically and intelligently complete performance testing and improve testing efficiency by constructing the association relationship between the network address of each sub-region and the device number of the temperature sensor corresponding to each sub-region, and by obtaining power consumption data from the power data cache library.

[0101] Example 2

[0102] Figure 2A This is a flowchart of a performance testing method for an electronic product provided in Embodiment 2 of this disclosure. Based on the above embodiments, this embodiment further includes determining whether the device under test (DUT) meets the qualification conditions by considering whether the DUT triggers the temperature limit of its control chip and / or display chip and by obtaining the average ambient temperature of the DUT during the power consumption test. The method includes: if the DUT triggers the temperature limit of its control chip and / or display chip, sending an ambient temperature request command to the server to obtain the average ambient temperature of the DUT during the power consumption test; determining a model power consumption reference value corresponding to the average ambient temperature; and determining whether the DUT meets the qualification conditions based on the model power consumption reference value and the actual average power consumption of the DUT. Specifically, this method includes:

[0103] S210. After the power consumption test of the machine under test is completed, obtain the average actual power consumption of the machine under test.

[0104] S220. Based on the design power consumption value and the average actual power consumption of the machine under test, determine whether the machine under test meets the optimal qualification conditions.

[0105] S230. If the device under test triggers the temperature limit of the control chip and / or display chip inside the device under test, send an ambient temperature request command to the server to obtain the average ambient temperature of the device under test during the power consumption test.

[0106] Specifically, when the device under test (DUT) fails to meet the optimal qualification conditions and triggers the temperature limit of the control chip and / or display chip within the DUT, a secondary test is required to eliminate misjudgments of the DUT's performance caused by temperature factors. Therefore, in this embodiment, when the DUT fails to meet the optimal qualification conditions and triggers the temperature limit of the control chip and / or display chip within the DUT, a request command to retrieve the ambient temperature needs to be sent to the server. After receiving the command, the server can provide the user with the ambient temperature values ​​of the DUT at various time points during the power consumption test period. By obtaining these ambient temperature values, the average ambient temperature of the DUT during the power consumption test process can be obtained.

[0107] S240. Based on the average ambient temperature of the machine under test during the power consumption test, determine the reference power consumption value of the model corresponding to the average ambient temperature.

[0108] The power consumption reference value can be the power consumption design value of the model corresponding to the machine under test at different temperatures.

[0109] Specifically, in this embodiment, based on the calculated average ambient temperature of the device under test during the power consumption test, the power consumption reference value of the corresponding model of the device under test at the average ambient temperature is queried.

[0110] S250. Based on the reference power consumption value of the model and the average actual power consumption of the machine under test, determine whether the machine under test meets the qualification conditions.

[0111] Specifically, in this embodiment, the server can obtain the actual power consumption values ​​of the device under test at various time points during the power consumption test period. These actual power consumption values ​​are then averaged to obtain the average actual power consumption of the device under test during the power consumption test period. This average actual power consumption value is then compared with the power consumption reference value of the device under test to determine whether the device under test meets the qualification conditions.

[0112] In this embodiment, if the test instrument fails to meet the optimal qualification conditions and triggers the temperature limit of the control chip and / or display chip within the test instrument, the determination of whether the performance of the test instrument is qualified can be achieved through the following specific algorithm:

[0113] 1. Obtain the average ambient temperature during the power consumption test period for the device under test:

[0114]

[0115] Where Tamb is the average ambient temperature, Tt is the current ambient temperature, n is the total test duration, and i is the calculation start time.

[0116] 2. Obtain the power consumption design values ​​of the instrument under test at different temperatures:

[0117]

[0118] Where PS represents the power consumption design value of the test instrument for different ambient temperatures.

[0119] 3. When the average actual power consumption of the machine under test is greater than or equal to the design power consumption value of the machine under test, the machine under test meets the qualification condition:

[0120]

[0121] Where Pt is the actual power consumption of the device under test.

[0122] It should be noted that this embodiment does not limit the order of steps S210 to S250. For example, in this embodiment, ambient temperature acquisition can be performed at any step. In another embodiment, such as Figure 2B As shown, the average ambient temperature can also be obtained directly after the test begins.

[0123] The performance testing of electronic products provided in this embodiment can avoid the problem of inaccurate testing of the test equipment caused by the ambient temperature, thereby improving the accuracy of performance testing.

[0124] Example 3

[0125] Figure 3 This is a schematic diagram of the structure of a performance testing device for electronic products provided in an embodiment of this disclosure. The device specifically includes:

[0126] The power consumption acquisition module 310 is used to acquire the average actual power consumption of the machine under test after the power consumption test is completed.

[0127] The first judgment module 320 is used to determine whether the machine under test meets the optimal qualification conditions based on the machine power consumption design value and the average actual power consumption of the machine under test.

[0128] The second judgment module 330 is used to determine whether the test instrument meets the optimal qualification conditions if the test instrument does not meet the optimal qualification conditions, based on whether the test instrument triggers the power protection temperature wall and the average ambient temperature value of the test instrument during the power consumption test.

[0129] In one possible implementation, the second determination module 330 is specifically used for:

[0130] If the device under test triggers the temperature limit of the control chip and / or display chip inside the device under test, an ambient temperature request command is sent to the server to obtain the average ambient temperature of the device under test during the power consumption test.

[0131] Based on the average ambient temperature of the machine under test during the power consumption test, determine the reference power consumption value of the model corresponding to the average ambient temperature.

[0132] Based on the reference power consumption value of the model and the average actual power consumption of the machine under test, determine whether the machine under test meets the qualification conditions.

[0133] In one possible implementation, the second judgment module is further specifically used to: after sending an ambient temperature request command to the server to obtain the average ambient temperature of the machine under test during the power consumption test, if obtaining the average ambient temperature of the machine under test during the power consumption test fails, then based on the power consumption design value of the machine under test, determine that the machine under test does not meet the qualification conditions.

[0134] In one possible implementation, the second judgment module 330 is further specifically used to: if the machine under test does not trigger the temperature limit of the control chip and / or display chip inside the machine under test, then determine that the machine under test does not meet the qualification conditions.

[0135] In one embodiment, the power consumption acquisition module 310 is specifically used to: acquire the power consumption test period of the machine under test; preset the power consumption extraction start point; determine multiple time power consumption data of the machine under test based on the power consumption test period and the power consumption extraction start point; and determine the actual average power consumption of the machine under test based on the multiple time power consumption data of the machine under test.

[0136] In one possible implementation, it further includes: a data storage module, used to: install temperature sensors in each sub-area of ​​the performance test area after the power consumption test of the test machine is completed and before obtaining the actual average power consumption of the test machine, and establish an association between the network address of each sub-area and the device number of the corresponding temperature sensor in each sub-area, and store it in a data cache library; preset a collection interval time, collect temperature data of each temperature sensor according to the collection interval time, and store the collection time point and the temperature data of each temperature sensor in the data cache library;

[0137] Accordingly, the second judgment module is specifically used to: obtain the current network address of the sub-region where the test equipment is located; in the data cache, determine the current temperature data uploaded by the temperature sensor corresponding to the current network address based on the current network address and the current power consumption test time period of the test equipment; and determine the average ambient temperature of the test equipment during the power consumption test based on the current temperature data.

[0138] In one embodiment, the data storage module is further configured to: store the power consumption data of the machine under test at various time points during the power consumption test period in the power data cache library of the machine under test before obtaining the actual average power consumption of the machine under test after the power consumption test is completed;

[0139] Correspondingly, the second judgment module is specifically used to: determine multiple time-based power consumption data of the test machine in the power data cache library of the test machine based on the power consumption test period and the power consumption extraction start point.

[0140] According to embodiments of this disclosure, this disclosure also provides an electronic device and a readable storage medium.

[0141] Figure 4 A schematic block diagram of an example electronic device 400 that can be used to implement embodiments of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0142] like Figure 4 As shown, device 400 includes a computing unit 401, which can perform various appropriate actions and processes based on a computer program stored in read-only memory (ROM) 402 or a computer program loaded from storage unit 408 into random access memory (RAM) 403. RAM 403 may also store various programs and data required for the operation of device 400. The computing unit 401, ROM 402, and RAM 403 are interconnected via bus 404. Input / output (I / O) interface 405 is also connected to bus 404.

[0143] Multiple components in device 400 are connected to I / O interface 405, including: input unit 406, such as keyboard, mouse, etc.; output unit 407, such as various types of monitors, speakers, etc.; storage unit 408, such as disk, optical disk, etc.; and communication unit 409, such as network card, modem, wireless transceiver, etc. Communication unit 409 allows device 400 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0144] The computing unit 401 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of the computing unit 401 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various computing units running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 401 performs the various methods and processes described above, such as a performance testing method for an electronic product. For example, in some embodiments, a performance testing method for an electronic product may be implemented as a computer software program tangibly contained in a machine-readable medium, such as storage unit 408. In some embodiments, part or all of the computer program may be loaded and / or installed on device 400 via ROM 402 and / or communication unit 409. When the computer program is loaded into RAM 403 and executed by the computing unit 401, one or more steps of a performance testing method for an electronic product described above may be performed. Alternatively, in other embodiments, the computing unit 401 may be configured to perform a performance testing method for an electronic product by any other suitable means (e.g., by means of firmware).

[0145] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), system-on-a-chip (SoCs), complex programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0146] The program code used to implement the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0147] In the context of this disclosure, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. Machine-readable media can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0148] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0149] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with embodiments of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0150] Computer systems can include clients and servers. Clients and servers are generally located far apart and typically interact via communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other. Servers can be cloud servers, servers in distributed systems, or servers incorporating blockchain technology.

[0151] It should be understood that the various forms of processes shown above can be used to rearrange, add, or delete steps. For example, the steps described in this disclosure can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution disclosed in this disclosure can be achieved, and this is not limited herein.

[0152] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this disclosure, "a plurality of" means two or more, unless otherwise explicitly specified.

[0153] The above description is merely a specific embodiment of this disclosure, but the scope of protection of this disclosure is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this disclosure should be included within the scope of protection of this disclosure. Therefore, the scope of protection of this disclosure should be determined by the scope of the claims.

Claims

1. A performance testing method for electronic products, characterized in that, The method includes: After the power consumption test of the machine under test is completed, the average actual power consumption of the machine under test is obtained; Based on the design power consumption value of the machine under test and the average actual power consumption, determine whether the machine under test meets the optimal qualification conditions; If the test instrument does not meet the optimal qualification condition, then the test instrument is judged to meet the qualification condition based on whether the test instrument triggers the temperature limit of the control chip and / or display chip in the test instrument, and the average ambient temperature of the test instrument during the power consumption test. The step of determining whether the test instrument meets the qualification conditions based on whether the test instrument triggers the temperature limit of the control chip and / or display chip within the test instrument and by obtaining the average ambient temperature of the test instrument during the power consumption test includes: If the device under test triggers the temperature limit of the control chip and / or display chip inside the device under test, an ambient temperature request command is sent to the server to obtain the average ambient temperature of the device under test during the power consumption test. Based on the average ambient temperature of the machine under test during the power consumption test, determine the reference power consumption value of the model corresponding to the average ambient temperature. Based on the power consumption reference value of the model and the average actual power consumption of the test machine, determine whether the test machine meets the qualification conditions.

2. The method according to claim 1, characterized in that, After sending an ambient temperature request command to the server to obtain the average ambient temperature of the device under test during the power consumption test, the method further includes: If it fails to obtain the average ambient temperature of the device under test during the power consumption test, the device under test is deemed not to meet the qualification conditions based on the power consumption design value of the device under test.

3. The method according to claim 1, characterized in that, The step of determining whether the test instrument meets the qualification conditions based on whether the test instrument triggers the temperature limit of the control chip and / or display chip inside the test instrument and the average ambient temperature of the test instrument during the power consumption test further includes: If the test instrument does not trigger the temperature limit of the control chip and / or display chip inside the test instrument, then the test instrument is determined to not meet the qualification conditions.

4. The method according to claim 3, characterized in that, The step of obtaining the average actual power consumption of the machine under test includes: Obtain the power consumption test period of the machine under test; A preset power consumption extraction start point is established. Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined. Based on the multiple time-based power consumption data of the machine under test, the average actual power consumption of the machine under test is determined.

5. The method according to claim 4, characterized in that, Before obtaining the average actual power consumption of the device under test after the power consumption test is completed, the following steps are included: Temperature sensors are installed in each sub-region of the performance test area, and the network protocol address of each sub-region is associated with the device number of the temperature sensor corresponding to each sub-region, and stored in the data cache library. A preset acquisition interval time is set, and temperature data from each temperature sensor is acquired according to the acquisition interval time. The acquisition time point and the temperature data of each temperature sensor are stored in the data cache. Accordingly, obtaining the average ambient temperature of the device under test during the power consumption test includes: Obtain the current network protocol address of the sub-region where the machine under test is located; In the data cache, based on the current network address and the current power consumption test period of the device under test, the current temperature data uploaded by the temperature sensor corresponding to the current network address is determined; Based on the current temperature data, determine the average ambient temperature of the machine under test during the power consumption test.

6. The method according to claim 5, characterized in that, Before obtaining the average actual power consumption of the device under test after the power consumption test is completed, the following steps are included: The power consumption data of the test instrument under test at various time points during the power consumption test period are stored in the power data cache library of the test instrument under test. Accordingly, determining multiple time-based power consumption data of the machine under test based on the power consumption test period and the power consumption extraction start point includes: Based on the power consumption test period and the power consumption extraction start point, multiple time-based power consumption data of the machine under test are determined in the power data cache of the machine under test.

7. A performance testing device for electronic products, characterized in that, The device includes: The power consumption acquisition module is used to acquire the average actual power consumption of the machine under test after the power consumption test is completed. The first judgment module is used to determine whether the machine under test meets the optimal qualification conditions based on the machine power consumption design value and the average actual power consumption of the machine under test. The second judgment module is used to determine whether the test equipment meets the qualification conditions if the test equipment does not meet the optimal qualification conditions, based on whether the test equipment triggers the power protection temperature wall and the average ambient temperature of the test equipment during the power consumption test. The second judgment module is further configured to, if the device under test triggers the temperature limit of the control chip and / or display chip within the device under test, send an ambient temperature request command to the server to obtain the average ambient temperature of the device under test during the power consumption test; determine a model power consumption reference value corresponding to the average ambient temperature of the device under test during the power consumption test; and determine whether the device under test meets the qualification conditions based on the model power consumption reference value and the actual average power consumption of the device under test.

8. An electronic device, characterized in that, include: At least one processor; as well as A memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-6.

9. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method according to any one of claims 1-6.

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