A method for measuring the relative pose of non-cooperative targets based on a combination of profilometer and 2D galvanometer
By combining a profilometer with a two-dimensional galvanometer, the problem of insufficient accuracy in relative pose measurement of non-cooperative targets is solved, enabling an efficient and precise assembly process suitable for precision docking of aerospace vehicles.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHONGQING UNIV
- Filing Date
- 2022-10-29
- Publication Date
- 2026-04-21
AI Technical Summary
Existing technologies lack sufficient accuracy in measuring the relative pose of non-cooperative targets, especially in narrow measurement areas, making it difficult to achieve high-precision assembly.
By combining a profilometer and a 2D galvanometer, a relative pose measurement device is built. The connecting ear surfaces of non-cooperative targets are measured using a 2D galvanometer and a 2D profilometer. Plane equations and normal vectors are fitted, the spatial positional relationship between the planes is calculated, and the relative pose of the main module and the sub-module is solved.
It achieves sub-micron level measurement accuracy, simplifies the calculation process, improves measurement efficiency, reduces scanning time and equipment complexity, and is suitable for high-precision assembly of aerospace vehicles.
Smart Images

Figure CN115963505B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the aerospace field, specifically to a method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer. Background Technology
[0002] With the increasing demand for satellite launches and manufacturing, most satellites are assembled from multiple segments. The assembly of these multi-segment satellite modules is a crucial component of satellite assembly and a vital link directly affecting various satellite performance characteristics. To achieve precise assembly of spacecraft, it is first necessary to obtain the spatial relative pose between the assembly and docking targets. The pose measurement technology for space cooperative targets that can be fitted with cooperation markers or painted with cooperation markings is quite mature. However, the large scale span of the area to be precisely assembled and the narrow, elongated measurement area make direct measurement difficult, falling under the category of non-cooperative target measurement, which increases the difficulty of measurement and assembly quality. Currently, the main methods used in the measurement of non-cooperative targets include: binocular vision, multi-view vision, and combined measurement using lidar sensors and optical cameras. The accuracy of these methods is greatly affected by camera resolution, resulting in relatively low measurement precision. Summary of the Invention
[0003] The purpose of this invention is to provide a method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer, comprising the following steps:
[0004] 1) Construct a relative pose measurement device. The relative pose measurement device includes a sub-module, a two-dimensional galvanometer, a 2D profilometer, a connecting rod, a main module, an auxiliary mounting platform, a six-degree-of-freedom adjustment platform, a transmitting light source, a receiving lens, a calculation module, a computer, a measurement area module, and a mechanical module.
[0005] The sub-module has a mating hole. A secondary connecting lug is installed on the side plane B2 of the sub-module.
[0006] The main module is equipped with docking pins. The main connecting lug is installed on the side plane B1 of the main module.
[0007] The steps for setting up a relative pose measurement device include:
[0008] The sub-module and the main module are mounted on the auxiliary mounting platform. The surface of the sub-module that contacts the auxiliary mounting platform is denoted as plane A2, and the surface of the main module that contacts the auxiliary mounting platform is denoted as plane A1.
[0009] The connecting rod is T-shaped and includes a vertical sub-rod perpendicular to the horizontal plane and a horizontal sub-rod parallel to the horizontal plane.
[0010] One end of the vertical sub-rod is connected to a 2D profilometer, and the other end is connected to a horizontal sub-rod. Two six-degree-of-freedom (6DOF) adjustment platforms are connected to both ends of the horizontal sub-rod. One 6DOF adjustment platform adjusts the tilt angle of the sub-module via an auxiliary mounting platform, and the other 6DOF adjustment platform adjusts the tilt angle of the main module via the auxiliary mounting platform.
[0011] One end of the two-dimensional galvanometer is connected to the sub-module, and the other end is connected to the 2D profilometer.
[0012] 2) Before emitting the light source towards the 2D galvanometer, adjust the distance L between the main module and the sub-module. Ensure that the distance L satisfies M - LA - LB ≤ L ≤ M. LA is the thickness of the main connecting lug. LB is the thickness of the sub-connecting lug. The measurement width range of the 2D profilometer in the X direction is [0, M]. M is a constant.
[0013] The light source is directed towards the two-dimensional galvanometer. The two-dimensional galvanometer refracts the light source onto plane A1 of the main module and plane A2 of the sub-module.
[0014] 3) The receiving lens receives the reflected light from plane A1 and plane A2 and transmits it to the 2D profilometer.
[0015] 4) Adjust the position of the two-dimensional galvanometer so that it refracts the light source onto plane B1 of the main module and plane B2 of the sub-module.
[0016] 5) The receiving lens receives the reflected light from planes B1 and B2 and transmits it to the 2D profilometer.
[0017] 6) The 2D profilometer measures the coordinates of planes A1 and B1 in the X coordinate system of the main module. a Y a Z a O a The coordinates of each point on the plane, and the coordinates of plane A2 and plane B2 in the coordinate system X of the sub-module. b1 Y b1 Z b1 O b1 The coordinates of each point on the surface;
[0018] 7) Based on the coordinates of each point on plane A1, set the normal vector as P. j =(A j B j C j Fit plane A1 in coordinate system X a Y a Z a O a The plane equation P1 and spatial normal PA1 in the equation; j = 1, 2, 3, 4;
[0019] The equation of plane P1 is shown below:
[0020] A j X+B j Y+C j ZD j =0 (1)
[0021] In the formula, D j It is a constant.
[0022] Based on the coordinates of each point on plane A2, fit the coordinates of plane A2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P2 and the spatial normal PA2 in the equation;
[0023] Based on the coordinates of each point on plane B1, fit the coordinate system X of plane B1. a Y a Z a O a The plane equation P3 and the spatial normal PB1 in the equation;
[0024] Based on the coordinates of each point on plane B2, fit the plane B2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P4 and the spatial normal PB2 in the equation;
[0025] 8) Based on the plane equations and spatial normals of planes A1 and A2, calculate the parameter dθx that characterizes the spatial positional relationship between planes A1 and A2. b1 , dθy b1 The angle between plane A1 and plane A2 is denoted as θ; θx b1 ,θy b1 This indicates the rotation angle of the sub-module around the x-axis and y-axis in the XYZO coordinate system;
[0026] The included angle θ satisfies the following formula:
[0027]
[0028] In the formula, normal PA1 = (A1, B1, C1) and normal PA2 = (A2, B2, C2).
[0029] 9) Based on the plane equations and spatial normal vectors of planes B1 and B2, calculate the parameter dθ'y used to characterize the spatial positional relationship between planes B1 and B2. b1 ,dθ'z b1 ;
[0030] The included angle θ' satisfies the following equation:
[0031]
[0032] In the formula, normal PB1 = (A3, B3, C3) and normal PB2 = (A4, B4, C4).
[0033] 10) Based on the parameter dθx used to characterize the spatial relationship between plane A1 and plane A2 b1 , dθy b1 After leveling planes A1 and A2, calculate the distance dz between them.
[0034] The distance dz between plane A1 and plane A2 is shown below:
[0035]
[0036] The distance dx between planes B1 and B2 is calculated based on the parameters used to characterize the spatial relationship between them. b1 ;
[0037] 11) Based on the distance dz between plane A1 and plane A2, and the distance dx between plane B1 and plane B2... b1 The relative poses of the main module and the sub-module are calculated.
[0038] The steps to calculate the relative poses of the main module and the sub-module include:
[0039] 11.1) Calculate the distance resolution Dx between the main module and the sub-module, i.e.:
[0040] Dx=c / d (5)
[0041] In the formula, c is the maximum measurement distance of the 2D profilometer, and d is the number of points on the profile obtained by the 2D profilometer.
[0042] 11.2) Calculate the y of the main module b1 z b1 o b1 The included angle and the y-axis of the submodule a z a o a included angle around axis o b1 z b1 Rotation angle θz b1 At that time, rotation angle θz b1 resolution Dθz b1 As shown below:
[0043] Dθz b1 =Dx / ef / pi (6)
[0044] In the formula, e and f are the height and length of the main module and the sub-module, respectively.
[0045] 11.3) Based on the plane equations of planes A1, A2, B1, and B2, and the resolution Dθz b1 Calculate the value around axis o b1 x b1 Rotation angle θx b1 resolution Dθx b1 and around the axis b1 y b1 Rotation angle θy b1 resolution Dθy b1 .
[0046] 11.4) Determine the resolution Dθx b1 Resolution accuracy Dθy b1 Resolution accuracy Dθz b1 If the value is greater than a preset threshold, proceed to step 11.5; otherwise, replace the sensor and return to step 11.1.
[0047] 11.5) Based on the pose relationship of the measured area, the pose of the non-cooperative target area is obtained, so as to realize the precise docking assembly of the docking pin and the docking hole.
[0048] The technical advantages of this invention are undeniable. It offers high precision, fast measurement, and sub-micron level accuracy. This invention is lightweight, consumes little power, and is easy to measure. It cleverly utilizes two mutually perpendicular surfaces of the connecting lug portion of the target structure to indirectly calculate the relative pose between the mating hole and the mating pin, reducing the difficulty of calculation and scanning time while improving calculation accuracy. Attached Figure Description
[0049] Figure 1 This is a schematic diagram of the overall structure of a spatial non-cooperative target measurement relative pose method based on a combination of a profilometer and a two-dimensional galvanometer.
[0050] Figure 2 This is a schematic diagram of a method for measuring the relative pose of a non-cooperative target in space based on a combination of a profilometer and a two-dimensional galvanometer.
[0051] In the diagram: 1. Docking hole; 2. Sub-module; 3. 2D galvanometer; 4. 2D profilometer; 5. Connecting rod; 6. Docking pin; 7. Main module; 8. Sub-connecting ear; 9. Main connecting ear; 10. Auxiliary installation platform; 11. Six-degree-of-freedom adjustment platform; 12. Measurement module; 13. Emitting light source; 14. Receiving lens; 15. Solving module; 16. Computer; 17. Measurement area module; 18. Mechanical module. Detailed Implementation
[0052] The present invention will be further described below with reference to embodiments, but it should not be construed that the scope of the present invention is limited to the following embodiments. Various substitutions and modifications made based on ordinary technical knowledge and common practices in the art without departing from the above-described technical concept of the present invention should be included within the scope of protection of the present invention.
[0053] Example 1:
[0054] See Figures 1 to 2 The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination includes the following steps:
[0055] 1) Construct a relative pose measurement device. The relative pose measurement device includes a sub-module 2, a two-dimensional galvanometer 3, a 2D profilometer 4, a connecting rod 5, a main module 7, an auxiliary mounting platform 10, a six-degree-of-freedom adjustment platform 11, a transmitting light source 13, a receiving lens 14, a calculation module 15, a computer 16, a measurement area module 17, and a mechanical module 18.
[0056] The measurement module 12 includes a two-dimensional galvanometer 3, a 2D profilometer 4, a transmitting light source 13, and a receiving lens 14.
[0057] The measurement area module 17 includes the areas where the main module 7 and the sub-module 2 are located.
[0058] Mechanical module 18 includes devices other than the measurement module and the calculation module.
[0059] The sub-module 2 has a docking hole 1. The side plane B2 of the sub-module 2 is equipped with a secondary connecting lug 8.
[0060] The main module 7 is provided with docking pins 6. The main connecting lugs 9 are installed on the side plane B1 of the main module 7.
[0061] The steps for setting up a relative pose measurement device include:
[0062] Sub-module 2 and main module 7 are installed on auxiliary installation platform 10. The surface of sub-module 2 in contact with auxiliary installation platform 10 is denoted as plane A2, and the surface of main module 7 in contact with auxiliary installation platform 10 is denoted as plane A1.
[0063] The connecting rod 5 is T-shaped and includes a vertical sub-rod perpendicular to the horizontal plane and a horizontal sub-rod parallel to the horizontal plane.
[0064] One end of the vertical sub-rod is connected to the 2D profiler 4, and the other end is connected to the horizontal sub-rod. The two ends of the horizontal sub-rod are respectively connected to two six-degree-of-freedom adjustment platforms 11. One six-degree-of-freedom adjustment platform 11 adjusts the tilt angle of the sub-module 2 via the auxiliary mounting platform 10, and the other six-degree-of-freedom adjustment platform 11 adjusts the tilt angle of the main module 7 via the auxiliary mounting platform 10.
[0065] One end of the two-dimensional galvanometer 3 is connected to the sub-module 2, and the other end is connected to the 2D profilometer 4.
[0066] 2) Before the emitting light source 13 emits light to the two-dimensional galvanometer 3, adjust the distance L between the main module 7 and the sub-module 2. Ensure that the distance L satisfies M - LA - LB ≤ L ≤ M. LA is the thickness of the main connecting lug. LB is the thickness of the sub-connecting lug. The 2D profilometer 4 has a measurement width range of [0, M] in the X direction. M is a constant.
[0067] The light source 13 emits light towards the two-dimensional galvanometer 3. The two-dimensional galvanometer 3 refracts the light source onto plane A1 of the main module 7 and plane A2 of the sub-module 2.
[0068] 3) The receiving lens 14 receives the reflected light from plane A1 and plane A2, which is the receiving surface after scanning the measurement point, and transmits it to the 2D profilometer 4.
[0069] 4) Adjust the position of the two-dimensional galvanometer 3 so that the two-dimensional galvanometer 3 refracts the light source onto plane B1 of the main module 7 and plane B2 of the sub-module 2.
[0070] 5) The receiving lens 14 receives the reflected light from planes B1 and B2 and transmits it to the 2D profilometer 4.
[0071] 6) The 2D profilometer (4) measures the coordinates of plane A1 and plane B1 in the coordinate system X of the main module 7. a Y a Z a O a The coordinates of each point on the plane, and the coordinates of plane A2 and plane B2 in the coordinate system X of sub-module 2. b1 Y b1 Z b1 O b1 The coordinates of each point on the surface;
[0072] 7) Based on the coordinates of each point on plane A1, set the normal vector as P. j =(A j B j C j Fit plane A1 in coordinate system X a Y a Z a O a The plane equation P1 and spatial normal PA1 in the equation; j = 1, 2, 3, 4;
[0073] The equation of plane P1 is shown below:
[0074] A j X+B j Y+C j ZD j =0 (1)
[0075] In the formula, D j It is a constant.
[0076] Based on the coordinates of each point on plane A2, fit the coordinates of plane A2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P2 and the spatial normal PA2 in the equation;
[0077] Based on the coordinates of each point on plane B1, fit the coordinate system X of plane B1. a Y a Z a O a The plane equation P3 and the spatial normal PB1 in the equation;
[0078] Based on the coordinates of each point on plane B2, fit the plane B2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P4 and the spatial normal PB2 in the equation;
[0079] 8) Based on the plane equations and spatial normals of planes A1 and A2, calculate the parameter dθx that characterizes the spatial positional relationship between planes A1 and A2. b1 , dθy b1 The angle between plane A1 and plane A2 is denoted as θ; θx b1 ,θy b1 This represents the rotation angle of submodule 2 around the x-axis and y-axis in the XYZO coordinate system; the positional relationship of planes A1 and A2 after they are parallel is as follows: Figure 2 As shown, they are not actually parallel.
[0080] The included angle θ satisfies the following formula:
[0081]
[0082] In the formula, normal PA1 = (A1, B1, C1) and normal PA2 = (A2, B2, C2).
[0083] 9) Based on the plane equations and spatial normal vectors of planes B1 and B2, calculate the parameter dθ'y used to characterize the spatial positional relationship between planes B1 and B2. b1 ,dθ'z b1 ;
[0084] The included angle θ' satisfies the following equation:
[0085]
[0086] In the formula, normal PB1 = (A3, B3, C3) and normal PB2 = (A4, B4, C4).
[0087] 10) Based on the parameter dθx used to characterize the spatial relationship between plane A1 and plane A2 b1 , dθy b1 After leveling planes A1 and A2, calculate the distance dz between them.
[0088] The distance dz between plane A1 and plane A2 is shown below:
[0089]
[0090] The distance dx between planes B1 and B2 is calculated based on the parameters used to characterize the spatial relationship between them. b1 ;dx b1 The formula is the inverse trigonometric function of formula (3).
[0091] 11) Based on the distance dz between plane A1 and plane A2, and the distance dx between plane B1 and plane B2... b1 The relative poses of the main module 7 and the sub-module 2 are calculated.
[0092] The steps to calculate the relative poses of main module 7 and sub-module 2 include:
[0093] 11.1) Calculate the distance resolution Dx between the main module 7 and the sub-module 2, that is:
[0094] Dx=c / d (5)
[0095] In the formula, c is the maximum measurement distance of the 2D profilometer 3. d is the number of points on the contour line obtained by the 2D profilometer 3. The contour line refers to the line formed by the laser points fed back to the 2D profilometer from the scanned surface.
[0096] 11.2) Calculate y of main module 7 b1 z b1 o b1 The included angle and the y-angle of sub-module 2 a z a o a included angle around axis o b1 z b1 Rotation angle θz b1 At that time, rotation angle θz b1 resolution Dθz b1 As shown below:
[0097] Dθz b1 =Dx / ef / pi (6)
[0098] In the formula, e and f are the height and length of the main module 7 and the sub-module 2, respectively.
[0099] 11.3) Based on the plane equations of planes A1, A2, B1, and B2, and the resolution Dθz b1 Calculate the value around axis o b1 x b1 Rotation angle θx b1 resolution Dθx b1 and around the axis b1 y b1 Rotation angle θy b1 resolution Dθy b1 .
[0100] 11.4) Determine the resolution Dθx b1 Resolution accuracy Dθy b1 Resolution accuracy Dθz b1 If the value is greater than a preset threshold, proceed to step 11.5; otherwise, replace the sensor and return to step 11.1.
[0101] Because different sensors have varying measurement accuracies for modules of different sizes, if the measurement error is greater than or close to the resolution accuracy, then the sensor cannot provide accurate measurements, and a sensor with higher measurement accuracy is needed. Therefore, this step calculates the resolution accuracy to determine whether the sensor's accuracy meets the requirements.
[0102] 11.5) Based on the pose relationship of the measured area, the pose of the non-cooperative target area is obtained, so as to realize the precise docking assembly of the docking pin and the docking hole.
[0103] Example 2:
[0104] A method for measuring the relative pose of non-cooperative targets in space based on a combination of profilometer and 2D galvanometer (reference) Figure 1 It includes: 1. Docking hole; 2. Sub-module; 3. Two-dimensional galvanometer; 4. 2D profilometer; 5. Connecting rod; 6. Docking pin; 7. Main module; 8. Sub-connecting lug; 9. Main connecting lug; 10. Auxiliary mounting platform; 11. Six-degree-of-freedom adjustment platform; 12. Measurement module; 13. Emitting light source; 14. Receiving lens; 15. Solving module; 16. Computer; 17. Measurement area module; 18. Mechanical module. Among them:
[0105] The mounting positions of the various devices are as follows: Figure 1 The overall structural diagram of the present invention is shown below, and the principle of pose measurement is as follows: Figure 2 The schematic diagram of the measurement method is shown. The main steps of this measurement scheme are as follows:
[0106] Step 1. Based on the X-axis measurement width range of the 2D contour laser measuring instrument (0-Mmm), the thickness of the two connecting lugs plus the distance between the two modules must meet the following requirements:
[0107] LA+L+LB≤M
[0108] Where LA is the thickness of the main module connecting lug, LB is the thickness of the sub-module connecting lug, and L is the distance between the main module and the sub-module. Therefore, the distance between the main module and the sub-module is less than M-LA-LB≤L≤M (mm), which means that the two docking modules need to be moved within this distance range first.
[0109] Step 2.2D profilometer records the measurement data returned by the 2D profilometer probe through the deflection scanning connection ear inside the two-dimensional galvanometer, thus realizing the coordinate measurement of each point on plane A1, plane B1, plane A2 and plane B2 in the XYZO coordinate system.
[0110] Step 3. By using the spatial coordinate points on plane A1, the plane equation and spatial normal in the coordinate system XYZO can be fitted as PA1. Similarly, the plane equations and spatial normals of planes B1, A2 and B2 can be calculated as PB1, PA2 and PB2 respectively.
[0111] Step 4. Based on the spatial equations of each plane and the corresponding normals PA1 and PA2, calculate dθxb1 and dθyb1. This allows you to determine the spatial relationship between planes A1 and A2, and then calculate the distance dz between the two planes. Similarly, you can calculate dθyb1 using the spatial relationship between planes B1 and B2 and vectors PB1 and PB2. b1 , dθz b1 dx b1 .
[0112] The specific calculation formulas for dθxb1 and dθyb1 are as follows:
[0113]
[0114] Where PA1 = (A1, B1, C1), PA2 = (A2, B2, C2), and the angle θ between the two planes.
[0115] Step 5. Finally, by solving the relationship between the four faces, the remaining four degrees of freedom can be calculated, thus solving for the relative pose of the two connected modules, i.e., six spatial degrees of freedom. The principle is as follows.
[0116] Based on a single scan at any position after leveling, the distance of the region with no returned value among the reflected line segment coordinates is dy. The distance difference between planes A1 and A2 is represented by the combined accuracy of the 2D profilometer and 2D galvanometer, which is a micrometer, meaning the resolution of dz is a micrometer. The distance difference between planes B1 and B2 is represented by the combined accuracy of the 2D profilometer and 2D galvanometer, which is b micrometer, meaning the resolution of dy is b micrometer. Given that the measurement range of the 2D profilometer is c millimeters and the number of points on the profilometer is d, the distance resolution between the two modules is:
[0117] Dx = c / d
[0118] Where Dx represents the distance resolution between the two modules.
[0119] Combination Figure 1 On the main module y b1 z b1 o b1 With sub-module y a z a o a The process of calculating the included angle around the axis o b1 z b1 Rotation angle θz b1 The resolution is:
[0120] Dθz b1 =Dx / ef / pi
[0121] Wherein, Dθz b1 For rotation angle θz b1 The resolution is given by , and e and f are the height and length of the module, respectively.
[0122] By fitting the coordinates of each plane to the connecting ear plane of the two modules, and considering truncation errors during data processing, the orbital distance around the axis can be preliminarily estimated. b1 x b1 with o b1 y b1 Resolution of axis rotation angle Dθx b1 With Dθy b1 The pose of the non-cooperative target area was obtained based on the pose relationship of the measured area, and the precise docking assembly of the docking pin and the docking hole was realized.
[0123] This invention discloses a method for measuring the pose of a non-cooperative target in space based on a combination of a profilometer and a 2D galvanometer, comprising a 2D galvanometer, a 2D profilometer, an auxiliary mounting platform, a six-degree-of-freedom adjustment platform, and a calculation module. The 2D profilometer and 2D galvanometer combination scans two connecting lugs on the main and auxiliary modules. The calculation module fits the information of the four surfaces to calculate the relative pose relationship between the docking pin and the docking hole. This device, employing a combination of a 2D profilometer and a 2D galvanometer, leverages the advantages of the 2D galvanometer, such as fast scanning response time, large scanning area, and low cost. It can measure the information of the four surfaces of the connecting lugs without the need for other mechanical structures, improving measurement efficiency while maintaining accuracy. This method offers advantages such as high measurement accuracy, fast calculation, simple structure, small size, light weight, and low power consumption, making it particularly suitable for high-precision assembly of aerospace vehicles and related fields.
[0124] Example 3:
[0125] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination includes the following steps:
[0126] 1. Construct the relative pose measurement device; the relative pose measurement device includes a sub-module 2, a two-dimensional galvanometer 3, a 2D profilometer 4, a connecting rod 5, a main module 7, an auxiliary installation platform 10, a six-degree-of-freedom adjustment platform 11, a emitting light source 13, a receiving lens 14, a calculation module 15, a computer 16, a measurement area module 17, and a mechanical module 18.
[0127] The sub-module 2 is provided with a docking hole 1; the side plane B2 of the sub-module 2 is provided with a secondary connecting lug 8;
[0128] The main module 7 is provided with docking pins 6; the main connecting ear 9 is installed on the side plane B1 of the main module 7.
[0129] The steps for setting up a relative pose measurement device include:
[0130] Sub-module 2 and main module 7 are installed on auxiliary installation platform 10; the surface of sub-module 2 in contact with auxiliary installation platform 10 is denoted as plane A2, and the surface of main module 7 in contact with auxiliary installation platform 10 is denoted as plane A1.
[0131] The connecting rod 5 is T-shaped and includes a vertical sub-rod perpendicular to the horizontal plane and a horizontal sub-rod parallel to the horizontal plane.
[0132] One end of the vertical sub-rod is connected to the 2D profiler 4, and the other end is connected to the horizontal sub-rod; the two ends of the horizontal sub-rod are respectively connected to two six-degree-of-freedom adjustment platforms 11; one six-degree-of-freedom adjustment platform 11 adjusts the tilt angle of the sub-module 2 through the auxiliary installation platform 10, and the other six-degree-of-freedom adjustment platform 11 adjusts the tilt angle of the main module 7 through the auxiliary installation platform 10.
[0133] One end of the two-dimensional galvanometer 3 is connected to the sub-module 2, and the other end is connected to the 2D profilometer 4;
[0134] 2. The light source 13 emits light towards the two-dimensional galvanometer 3; the two-dimensional galvanometer 3 refracts the light source onto plane A1 of the main module 7 and plane A2 of the sub-module 2;
[0135] 3 The receiving lens 14 receives the reflected light from plane A1 and plane A2 and transmits it to the 2D profilometer 4;
[0136] 4. Adjust the position of the two-dimensional galvanometer 3 so that the two-dimensional galvanometer 3 refracts the light source onto plane B1 of the main module 7 and plane B2 of the sub-module 2;
[0137] 5. The receiving lens 14 receives the reflected light from planes B1 and B2 and transmits it to the 2D profilometer 4.
[0138] The 2D profilometer 4 described in section 6 measures the coordinates of planes A1 and B1 in the coordinate system X of the main module 7. a Y a Z a O a The coordinates of each point on the plane, and the coordinates of plane A2 and plane B2 in the coordinate system X of sub-module 2. b1 Y b1 Z b1 O b1 The coordinates of each point on the surface;
[0139] 7. Based on the coordinates of each point on plane A1, set the normal vector as P. j =(A j B j C j Fit plane A1 in coordinate system X a Y a Z a O a The plane equation P1 and spatial normal PA1 are given; j = 1, 2, 3, 4; A j B j C j Represents coordinates;
[0140] Based on the coordinates of each point on plane A2, fit the coordinates of plane A2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P2 and the spatial normal PA2 in the equation;
[0141] Based on the coordinates of each point on plane B1, fit the coordinate system X of plane B1. a Y a Z a O aThe plane equation P3 and the spatial normal PB1 in the equation;
[0142] Based on the coordinates of each point on plane B2, fit the plane B2 in the X-axis. b1 Y b1 Z b1 O b1 The plane equation P4 and the spatial normal PB2 in the equation;
[0143] 8. Based on the plane equations and spatial normals of planes A1 and A2, calculate the parameter dθx used to characterize the spatial positional relationship between planes A1 and A2. b1 , dθy b1 The angle between plane A1 and plane A2 is denoted as θ; θx b1 ,θy b1 This indicates the rotation angle of submodule 2 around the x-axis and y-axis in the XYZO coordinate system;
[0144] 9. Based on the plane equations and spatial normal vectors of planes B1 and B2, calculate the parameter dθ'y used to characterize the spatial positional relationship between planes B1 and B2. b1 ,dθ'z b1 ;
[0145] 10. Based on the parameter dθx used to characterize the spatial relationship between plane A1 and plane A2 b1 , dθy b1 After leveling planes A1 and A2, calculate the distance dz between them.
[0146] The distance dx between planes B1 and B2 is calculated based on the parameters used to characterize the spatial relationship between them. b1 ;
[0147] 11. Based on the distance dz between plane A1 and plane A2, and the distance dx between plane B1 and plane B2... b1 The relative poses of the main module 7 and the sub-module 2 are calculated.
[0148] Example 4:
[0149] The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer is described in Example 3. The measurement width range of the 2D profilometer in the 4X direction is [0, M], where M is a constant.
[0150] Example 5:
[0151] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer is described in Example 3. Before the light source 13 emits light to the two-dimensional galvanometer 3, the distance L between the main module 7 and the sub-module 2 is adjusted so that the distance L satisfies M-LA-LB≤L≤M; LA is the thickness of the main connecting lug; and LB is the thickness of the sub-connecting lug.
[0152] Example 6:
[0153] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination is described in Example 3. The included angle θ satisfies the following formula:
[0154]
[0155] In the formula, normal PA1 = (A1, B1, C1) and normal PA2 = (A2, B2, C2); A1, B1, C1, A2, B2, C2 represent coordinates.
[0156] Example 7:
[0157] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination is described in Example 3, where the included angle θ' satisfies the following formula:
[0158]
[0159] In the formula, normal PB1 = (A3, B3, C3) and normal PB2 = (A4, B4, C4); A3, B3, C3, A4, B4, C4 represent coordinates.
[0160] Example 8:
[0161] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination is described in Example 3. The steps for calculating the relative pose of the main module 7 and the sub-module 2 include:
[0162] 1. Calculate the distance resolution Dx between the main module 7 and the sub-module 2, that is:
[0163] Dx = c / d
[0164] In the formula, c is the maximum measurement distance of the 2D profilometer 3; d is the number of points on the contour line obtained by the 2D profilometer 3.
[0165] 2. Calculate the y of main module 7 b1 z b1 o b1 The included angle and the y-angle of sub-module 2 a z a o a included angle around axis o b1 z b1 Rotation angle θzb1 At that time, rotation angle θz b1 resolution Dθz b1 As shown below:
[0166] Dθz b1 =Dx / ef / pi
[0167] In the formula, e and f are the height and length of the main module 7 and the sub-module 2, respectively;
[0168] 3. Based on the plane equations of planes A1, A2, B1, and B2, and the resolution Dθz b1 Calculate the value around axis o b1 x b1 Rotation angle θx b1 resolution Dθx b1 and around the axis b1 y b1 Rotation angle θy b1 resolution Dθy b1 ;
[0169] 4. Determine the resolution Dθx b1 Resolution accuracy Dθy b1 Resolution accuracy Dθz b1 If the value is greater than a preset threshold, proceed to step 5; otherwise, replace the sensor and return to step 1.
[0170] 5. Based on the pose relationship of the measured area, the pose of the non-cooperative target area is obtained, enabling precise docking and assembly of the docking pin and the docking hole. The pose of the non-cooperative target area is the pose of the center point of the docking pin. The measured area is the pose of the connecting lugs; since they are all on the sub-module, their pose relationships are known. Therefore, the pose of the non-cooperative target area can be obtained based on the pose relationship of the measured area.
[0171] Example 9:
[0172] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination is described in Example 3. The plane equation P1 is shown below:
[0173] A j X+B j Y+C j ZD j =0
[0174] In the formula, D j It is a constant.
[0175] Example 10:
[0176] The method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination is described in Example 3. The distance dz between plane A1 and plane A2 is shown below:
[0177]
[0178] In the formula, D1 and D2 are constants.
Claims
1. A method for measuring the relative pose of a non-cooperative target based on a profilometer and a two-dimensional galvanometer combination, characterized in that, Includes the following steps: Step 1) Construct a relative pose measurement device; the relative pose measurement device includes a sub-module (2), a two-dimensional galvanometer (3), a 2D profilometer (4), a connecting rod (5), a main module (7), an auxiliary installation platform (10), a six-degree-of-freedom adjustment platform (11), a transmitting light source (13), a receiving lens (14), a calculation module (15), a computer (16), a measurement area module (17), and a mechanical module (18); The sub-module (2) is provided with a docking hole (1); the side plane B2 of the sub-module (2) is provided with a sub-connecting lug (8); The main module (7) is provided with a docking pin (6); the main connecting ear (9) is installed on the side plane B1 of the main module (7). The steps for setting up a relative pose measurement device include: The sub-module (2) and the main module (7) are installed on the auxiliary installation platform (10); the surface of the sub-module (2) in contact with the auxiliary installation platform (10) is denoted as plane A2, and the surface of the main module (7) in contact with the auxiliary installation platform (10) is denoted as plane A1; The connecting rod (5) is T-shaped and includes a vertical sub-rod perpendicular to the horizontal plane and a horizontal sub-rod parallel to the horizontal plane; One end of the vertical sub-rod is connected to the 2D profiler (4), and the other end is connected to the horizontal sub-rod; the two ends of the horizontal sub-rod are respectively connected to two six-degree-of-freedom adjustment platforms (11); one six-degree-of-freedom adjustment platform (11) adjusts the tilt angle of the sub-module (2) through the auxiliary installation platform (10), and the other six-degree-of-freedom adjustment platform (11) adjusts the tilt angle of the main module (7) through the auxiliary installation platform (10); One end of the two-dimensional galvanometer (3) is connected to the sub-module (2), and the other end is connected to the 2D profilometer (4); Step 2) The emitting light source (13) emits light into the two-dimensional galvanometer (3); the two-dimensional galvanometer (3) refracts the light source to plane A1 of the main module (7) and plane A2 of the sub-module (2); Step 3) The receiving lens (14) receives the reflected light from plane A1 and plane A2 and transmits it to the 2D profilometer (4). Step 4) Adjust the position of the two-dimensional galvanometer (3) so that the two-dimensional galvanometer (3) refracts the light source to plane B1 of the main module (7) and plane B2 of the sub-module (2); Step 5) The receiving lens (14) receives the reflected light from plane B1 and plane B2 and transmits it to the 2D profilometer (4). Step 6) The 2D profilometer (4) measures the coordinates of plane A1 and plane B1 in the main module (7). The coordinates of each point on the plane, and the coordinate system of plane A2 and plane B2 in submodule (2). The coordinates of each point on the surface; Step 7) Based on the coordinates of each point on plane A1, set the normal vector as follows: Fit plane A1 in coordinate system Plane equations Spatial normal PA1; j=1,2,3,4; Represents coordinates; Based on the coordinates of each point on plane A2, fit the plane A2 in... Plane equations and spatial normal PA2; Based on the coordinates of each point on plane B1, fit the coordinate system of plane B1. Plane equations and spatial normal PB1; Based on the coordinates of each point on plane B2, fit the plane B2 in... Plane equations and spatial normal PB2; Step 8) Based on the plane equations and spatial normals of planes A1 and A2, calculate the parameters used to characterize the spatial positional relationship between planes A1 and A2. The angle between plane A1 and plane A2 is denoted as . ; , This indicates the rotation angle of the submodule (2) around the x-axis and y-axis in the XYZO coordinate system; Step 9) Based on the plane equations and spatial normal vectors of plane B1 and plane B2, calculate the parameters used to characterize the spatial positional relationship between plane B1 and plane B2. ; Step 10) Based on the parameters used to characterize the spatial relationship between plane A1 and plane A2 After leveling planes A1 and A2, calculate the distance dz between them. The distance between plane B1 and plane B2 is calculated based on the parameters used to characterize the spatial relationship between them. ; Step 11) Based on the distance dz between plane A1 and plane A2, and the distance between plane B1 and plane B2 The relative poses of the main module (7) and the sub-module (2) are calculated.
2. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that: The measurement width range of the 2D profilometer (4) in the X direction is [0, M]; M is a constant.
3. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 2, characterized in that: Before the emitting light source (13) emits light to the two-dimensional galvanometer (3), adjust the distance L between the main module (7) and the sub-module (2) so that the distance L satisfies M-LA-LB≤L≤M; LA is the thickness of the main connecting ear; LB is the thickness of the sub-connecting ear.
4. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that: included angle Satisfy the following formula: (1) In the formula, the normal direction , legal direction ; , Represents coordinates.
5. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that: included angle Satisfy the following formula: (2) In the formula, the normal direction , legal direction ; , Represents coordinates.
6. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that, The steps to calculate the relative poses of the main module (7) and the sub-module (2) include: Step 1) Calculate the distance resolution Dx between the main module (7) and the sub-module (2), that is: Dx = c / d (3) In the formula, c is the maximum measurement distance of the 2D profilometer (3); d is the number of points on the contour line obtained by the 2D profilometer (3); Step 2) Calculate the main module (7) The included angle and sub-module (2) included angle around axis Rotation angle At that time, rotation angle resolution As shown below: = Dx / ef / pi(4) In the formula, e and f are the height and length of the main module (7) and the sub-module (2), respectively; Step 3) Based on the plane equations and resolution of planes A1, A2, B1, and B2 Calculate about the axis Rotation angle resolution and around the axis Rotation angle resolution ; Step 4) Determine the resolution accuracy Resolution accuracy Resolution accuracy If the value exceeds a preset threshold, proceed to step 5; otherwise, replace the sensor and return to step 1. Step 5) Obtain the pose of the non-cooperative target area based on the pose relationship of the measured area to achieve precise docking assembly of the docking pin and the docking hole; the pose of the non-cooperative target area is the pose of the center point of the docking pin; the measured area is the pose of the connecting ear, and since they are all on the sub-module, the pose relationship between them is known; therefore, the pose of the non-cooperative target area can be obtained based on the pose relationship of the measured area.
7. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that, Plane equations As shown below: (5) In the formula, It is a constant.
8. The method for measuring the relative pose of a non-cooperative target based on a combination of a profilometer and a two-dimensional galvanometer as described in claim 1, characterized in that, The distance dz between plane A1 and plane A2 is shown below: (6) In the formula, , It is a constant.
Citation Information
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