Method and system for detecting a metal coating of a curved sample
By calibrating and adjusting the angle of the X-ray fluorescence detector, the accuracy problem of detecting the coating thickness of curved samples was solved, and rapid and accurate quality control was achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ELECTRIC POWER RES INST OF EAST INNER MONGOLIA ELECTRIC POWER
- Filing Date
- 2022-11-29
- Publication Date
- 2026-04-17
AI Technical Summary
Existing technologies cannot quickly and accurately detect the thickness of the metal coating on curved surface samples, resulting in an inability to effectively control their quality.
Using a calibrated X-ray fluorescence detector, the initial and final calibrations of the uncalibrated instrument were performed, and the incident angle of the X-rays was adjusted using planar standard blocks and spacers to ensure measurement accuracy.
It enables rapid and accurate detection of the thickness of metal coatings on curved surface samples, is suitable for quality control, and ensures the accuracy and applicability of the detection.
Smart Images
Figure CN115980110B_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of metal coating detection technology, and particularly relates to a method and system for detecting metal coatings on curved surface samples. Background Technology
[0002] The statements in this section are merely background information related to the present invention and do not necessarily constitute prior art.
[0003] Metal plating processes are widely used in daily industrial production, especially in electrical contact parts of power systems, where there are many components with silver plating on copper substrates, silver plating on aluminum substrates, nickel plating on copper substrates, and tin plating. The thickness control of the plating layer is crucial to the quality of the components. Currently, relevant enterprise and industry standards generally use X-ray fluorescence detection to test the thickness of this plating layer; arbitration uses microscopy. However, microscopy requires destroying the sample and cannot be used as a routine quality control test method.
[0004] The inventors discovered that X-ray fluorescence detection is generally used for planar inspection. For some curved samples, the X-ray incident angle is not perpendicular to the surface being inspected, and there is an air gap between the inspection surface and the inspection window of the equipment. These factors limit the ability of X-ray fluorescence detection to directly measure the thickness of the coating on curved surfaces, thus making it impossible to quickly and accurately determine whether the metal coating on curved samples is qualified. Summary of the Invention
[0005] To address the technical problems mentioned above, this invention provides a method and system for detecting the metal coating of curved samples. This method can quickly detect the thickness of the metal coating on curved samples to determine whether the metal coating is suitable. It is applicable to the quality control and general testing of metal coatings on curved samples.
[0006] To achieve the above objectives, the present invention adopts the following technical solution:
[0007] The first aspect of the present invention provides a method for detecting metal coatings on curved surface samples, comprising:
[0008] The thickness of the metal coating on the curved surface sample was measured using a calibrated X-ray fluorescence detector.
[0009] The difference between the measured thickness of the metal coating and the designed thickness is used to determine whether the metal coating of the curved surface sample is qualified.
[0010] The calibration process for the X-ray fluorescence detector is as follows:
[0011] Select a planar standard block that is closest to the designed thickness of the metal coating on the curved sample, and use the planar standard block to perform initial calibration on the uncalibrated X-ray fluorescence detector;
[0012] A spacer block with a thickness of S is vertically added to the planar standard block, and then the initially calibrated X-ray fluorescence detector is finally calibrated; where S = rr * cosθ, r is the radius of curvature of the curved sample; θ is the maximum angle between the ray and the normal of the curved surface after the ray is incident vertically from the top of the arc.
[0013] As one implementation method, the process of initial calibration of an uncalibrated X-ray fluorescence detector using a planar standard block is as follows:
[0014] Several test values were repeatedly measured on a planar standard block using an uncalibrated X-ray fluorescence detector, and the average value of these test values was used to perform initial calibration of the uncalibrated X-ray fluorescence detector.
[0015] The advantage of the above scheme is that it achieves the initial adjustment of the uncalibrated X-ray fluorescence detector by measuring the planar standard block multiple times, which can ensure the accuracy of measuring the thickness of the metal coating on curved samples.
[0016] As one implementation method, the process of performing final calibration on an initially calibrated X-ray fluorescence detector is as follows:
[0017] The X-ray fluorescence detector was initially calibrated and then repeatedly tested on a planar standard block with vertically added spacers of thickness S. Several test values were obtained and the average value was calculated. The product of this average value and cosθ was used as the calibration value to finally calibrate the X-ray fluorescence detector.
[0018] The advantage of the above scheme is that, since the key influencing factors for the detection of curved and flat samples are the diameter of the collimator of the X-ray fluorescence detector (i.e., the area of the emitted and received beams) and the radius of curvature of the tested object, the X-ray fluorescence detector can be further calibrated by adding a planar standard block with a vertical spacing thickness of S to make it suitable for measuring curved samples.
[0019] As one implementation method, the formula for calculating the maximum angle θ between the ray and the normal to the arc surface after the ray is incident perpendicularly from the apex of the arc is:
[0020]
[0021] Where L is the projection of the effective detection window area of the X-ray fluorescence detector onto the arc.
[0022] In one implementation, the projection L of the effective detection window area of the X-ray fluorescence detector onto the arc is 1.5 times the diameter of the collimator of the X-ray fluorescence detector.
[0023] As one implementation method, if the difference between the measured thickness of the metal coating and the designed thickness is less than a preset threshold, the metal coating of the curved sample is determined to be qualified; otherwise, the metal coating of the curved sample is unqualified.
[0024] A second aspect of the present invention provides a metal coating detection system for curved surface samples, comprising an X-ray fluorescence detector and a processor communicatively connected thereto;
[0025] The X-ray fluorescence detector, after calibration, is used to measure the thickness of the metal coating on curved surface samples.
[0026] The processor is used to receive the measured value of the metal coating thickness and determine whether the metal coating of the curved sample is qualified based on the difference between the measured value of the metal coating thickness and the designed thickness.
[0027] The calibration process for the X-ray fluorescence detector is as follows:
[0028] Select a planar standard block that is closest to the designed thickness of the metal coating on the curved sample, and use the planar standard block to perform initial calibration on the uncalibrated X-ray fluorescence detector;
[0029] A spacer block with a thickness of S is vertically added to the planar standard block, and then the initially calibrated X-ray fluorescence detector is finally calibrated; where S = rr * cosθ, r is the radius of curvature of the curved sample; θ is the maximum angle between the ray and the normal of the curved surface after the ray is incident vertically from the top of the arc.
[0030] As one implementation method, the process of initial calibration of an uncalibrated X-ray fluorescence detector using a planar standard block is as follows:
[0031] Several test values were repeatedly measured on a planar standard block using an uncalibrated X-ray fluorescence detector, and the average value of these test values was used to perform initial calibration of the uncalibrated X-ray fluorescence detector.
[0032] As one implementation method, the process of performing final calibration on an initially calibrated X-ray fluorescence detector is as follows:
[0033] The X-ray fluorescence detector was initially calibrated and then repeatedly tested on a planar standard block with vertically added spacers of thickness S. Several test values were obtained and the average value was calculated. The product of this average value and cosθ was used as the calibration value to finally calibrate the X-ray fluorescence detector.
[0034] As one implementation method, the formula for calculating the maximum angle θ between the ray and the normal to the arc surface after the ray is incident perpendicularly from the apex of the arc is:
[0035]
[0036] Where L is the projection of the effective detection window area of the X-ray fluorescence detector onto the arc.
[0037] Compared with existing technical solutions, the beneficial effects of the present invention are:
[0038] (1) This invention uses a planar standard block that is closest to the designed thickness of the metal coating of the curved sample to perform preliminary calibration of the X-ray fluorescence detector, and then uses a spacer block with a thickness of S to be added vertically on the planar standard block to perform final calibration of the X-ray fluorescence detector. This invention can quickly detect the thickness of the metal coating of the curved sample to determine whether the metal coating of the curved sample is suitable. It is suitable for general quality control of the metal coating of curved samples.
[0039] (2) The present invention utilizes multiple measurements of the planar standard block to achieve the initial zeroing adjustment of the uncalibrated X-ray fluorescence detector, which can ensure the accuracy of measuring the thickness of the metal coating on curved surface samples.
[0040] (3) Since the key influencing factors for the detection of curved and flat samples are the diameter of the collimator of the X-ray fluorescence detector (i.e. the area of the emitted and received beams) and the radius of curvature of the tested object, this invention further calibrates the X-ray fluorescence detector by adding a planar standard block with a vertically added spacing thickness of S, so that it can be used for the measurement of curved samples.
[0041] Advantages of additional aspects of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description
[0042] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.
[0043] Figure 1 This is a flowchart of a method for detecting metal coatings on curved samples provided in an embodiment of the present invention;
[0044] Figure 2 This invention provides a standard planar block with an added spacer block of thickness S.
[0045] Figure 3 This is a schematic diagram of a metal coating detection system for curved surface samples provided in an embodiment of the present invention. Detailed Implementation
[0046] The present invention will be further described below with reference to the accompanying drawings and embodiments.
[0047] It should be noted that the following detailed description is illustrative and intended to provide further explanation of the invention. Unless otherwise specified, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.
[0048] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.
[0049] Example 1
[0050] Reference Figure 1 This embodiment provides a method for detecting the metal coating on curved surface samples, which includes:
[0051] Step 1: Measure the thickness of the metal coating on the curved sample using a calibrated X-ray fluorescence detector.
[0052] Step 2: Determine whether the metal coating of the curved sample is qualified based on the difference between the measured metal coating thickness and the designed thickness. If the difference between the measured metal coating thickness and the designed thickness is less than a preset threshold, the metal coating of the curved sample is qualified; otherwise, the metal coating of the curved sample is unqualified.
[0053] In step 1, the calibration process for the X-ray fluorescence detector is as follows:
[0054] Step 1.1: Select a planar standard block that is closest to the designed thickness of the metal coating on the curved sample, and use the planar standard block to perform initial calibration on the uncalibrated X-ray fluorescence detector.
[0055] The initial calibration process for an uncalibrated X-ray fluorescence detector using a planar standard block is as follows:
[0056] By repeatedly measuring several values on a planar standard block using an uncalibrated X-ray fluorescence detector, and then using the average of these values, the uncalibrated X-ray fluorescence detector is initially calibrated. This method of using multiple measurements on the planar standard block achieves zeroing and initial adjustment of the uncalibrated X-ray fluorescence detector, ensuring the accuracy of measuring the thickness of metal coatings on curved samples.
[0057] Step 1.2: Vertically add a spacer block with a spacing thickness of S to the planar standard block, such as... Figure 2 As shown, the X-ray fluorescence detector, which was initially calibrated, is then subjected to final calibration; where S = rr * cosθ, r is the radius of curvature of the curved sample; θ is the maximum angle between the ray and the normal to the curved surface after the ray is incident perpendicularly from the apex of the arc. Figure 2 In the diagram, the white blocks are standard plane calibration blocks; the gray blocks are spacers.
[0058] The process of performing the final calibration on the initially calibrated X-ray fluorescence detector is as follows:
[0059] The X-ray fluorescence detector was initially calibrated, and repeated tests were performed on a planar standard block with vertically added spacers of thickness S. Several test values were obtained, and the average value was calculated. The product of this average value and cosθ was used as the calibration value to finally calibrate the X-ray fluorescence detector. Since the key influencing factors for detecting curved and planar samples are the diameter of the collimator of the X-ray fluorescence detector (i.e., the area of the emitted and received beams) and the radius of curvature of the sample being tested, the X-ray fluorescence detector was further calibrated using a planar standard block with vertically added spacers of thickness S to make it suitable for measuring curved samples.
[0060] When a ray is incident perpendicularly from the apex of the arc, the formula for calculating the maximum angle θ between the ray and the normal to the arc surface is:
[0061]
[0062] sinθ=L2r
[0063] Where L is the projection of the effective detection window area of the X-ray fluorescence detector onto the arc.
[0064] The projection L of the effective detection window area of the X-ray fluorescence detector onto the arc is 1.5 times the diameter of the collimator of the X-ray fluorescence detector.
[0065] The calibration process is illustrated with the following example:
[0066] The circuit breaker moving contact is designed with a diameter of 2r = 90mm, made of silver-plated copper, with a designed silver plating thickness of 50μm; the portable X-ray fluorescence detector used has an effective detection diameter of L = 13mm, calculated as follows:
[0067] cosθ=0.9895, S=0.47mm.
[0068] Therefore, a standard Ag / Cu flat test block with a thickness close to the design value of 48.34 μm was used to calibrate the equipment.
[0069] Ten values were measured on a planar standard block, and the average value was calculated to be 48.172 μm. The device was then calibrated.
[0070] A 0.47 mm thick spacer block was added to the planar standard test block, and measurements were then taken on the standard block. Ten values were measured: 38.380; 39.567; 39.170; 38.992; 38.318; 38.770; 38.325; 38.798; 38.382; 38.192, and the average value was calculated. The sample was calibrated by multiplying the average value by cosθ.
[0071] Example 2
[0072] Reference Figure 3 This embodiment provides a metal coating detection system for curved surface samples, which includes an X-ray fluorescence detector and a processor connected in communication with it;
[0073] The X-ray fluorescence detector, after calibration, is used to measure the thickness of the metal coating on curved surface samples.
[0074] The processor is used to receive the measured value of the metal coating thickness and determine whether the metal coating of the curved sample is qualified based on the difference between the measured value of the metal coating thickness and the designed thickness.
[0075] The calibration process for the X-ray fluorescence detector is as follows:
[0076] Step a: Select a planar standard block that is closest to the designed thickness of the metal coating on the curved sample, and use the planar standard block to perform initial calibration on the uncalibrated X-ray fluorescence detector.
[0077] The initial calibration process for an uncalibrated X-ray fluorescence detector using a planar standard block is as follows:
[0078] By repeatedly measuring several values on a planar standard block using an uncalibrated X-ray fluorescence detector, and then using the average of these values, the uncalibrated X-ray fluorescence detector is initially calibrated. This method of using multiple measurements on the planar standard block achieves zeroing and initial adjustment of the uncalibrated X-ray fluorescence detector, ensuring the accuracy of measuring the thickness of metal coatings on curved samples.
[0079] Step b: Vertically add a spacer block with a spacing thickness of S to the planar standard block, such as... Figure 2 As shown, the X-ray fluorescence detector that was initially calibrated is then subjected to final calibration; where S = rr * cosθ, r is the radius of curvature of the curved sample; θ is the maximum angle between the ray and the normal to the curved surface after the ray is incident perpendicularly from the top of the arc.
[0080] The process of performing the final calibration on the initially calibrated X-ray fluorescence detector is as follows:
[0081] The X-ray fluorescence detector was initially calibrated, and repeated tests were performed on a planar standard block with vertically added spacers of thickness S. Several test values were obtained, and the average value was calculated. The product of this average value and cosθ was used as the calibration value to finally calibrate the X-ray fluorescence detector. Since the key influencing factors for detecting curved and planar samples are the diameter of the collimator of the X-ray fluorescence detector (i.e., the area of the emitted and received beams) and the radius of curvature of the sample being tested, the X-ray fluorescence detector was further calibrated using a planar standard block with vertically added spacers of thickness S to make it suitable for measuring curved samples.
[0082] When a ray is incident perpendicularly from the apex of the arc, the formula for calculating the maximum angle θ between the ray and the normal to the arc surface is:
[0083]
[0084] Where L is the projection of the effective detection window area of the X-ray fluorescence detector onto the arc.
[0085] The projection L of the effective detection window area of the X-ray fluorescence detector onto the arc is 1.5 times the diameter of the collimator of the X-ray fluorescence detector.
[0086] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.
Claims
1. A method for detecting metal coatings on curved surface samples, characterized in that, include: The thickness of the metal coating on the curved surface sample was measured using a calibrated X-ray fluorescence detector. The difference between the measured thickness of the metal coating and the designed thickness is used to determine whether the metal coating of the curved surface sample is qualified. The calibration process for the X-ray fluorescence detector is as follows: Select a planar standard block that is closest to the designed thickness of the metal coating on the curved sample, and use the planar standard block to perform initial calibration on the uncalibrated X-ray fluorescence detector; A vertically added interval with a thickness of [missing information] is added to the standard plane block. The interval blocks are then used to perform a final calibration of the initially calibrated X-ray fluorescence detector; among which... , Let be the radius of curvature of the curved surface sample; The maximum angle between the ray and the normal to the arc surface when the ray is incident perpendicularly from the apex of the arc is calculated using the following formula: in, The projection of the effective detection window area of the X-ray fluorescence detector onto the arc; The process of initial calibration of an uncalibrated X-ray fluorescence detector using a planar standard block is as follows: Several test values were repeatedly measured on a planar standard block using an uncalibrated X-ray fluorescence detector, and the average value of these test values was used to perform initial calibration of the uncalibrated X-ray fluorescence detector. The process of performing final calibration on an X-ray fluorescence detector that has undergone initial calibration is as follows: Using an X-ray fluorescence detector after initial calibration, the vertically added interval thickness was... Repeated testing was performed on the planar standard block of the spacer block to obtain several test values, and the average value was calculated. This average value was then compared with... The product of these values is used as the calibration value to ultimately calibrate the X-ray fluorescence detector.
2. The method for detecting metal coatings on curved surface samples as described in claim 1, characterized in that, X-ray fluorescence detectors can effectively detect the projection of the window area onto the arc. It is 1.5 times the diameter of the collimator of the X-ray fluorescence detector.
3. The method for detecting metal coatings on curved surface samples as described in claim 1, characterized in that, If the difference between the measured thickness of the metal coating and the designed thickness is less than a preset threshold, the metal coating of the curved sample is deemed qualified; otherwise, the metal coating of the curved sample is deemed unqualified.
Citation Information
Patent Citations
Shape of band steel cross section detecting and rectifying method
CN103028616A