Calibration detection method of signal measurement device, electronic device and storage medium

Abstract

The application provides a signal measurement device calibration detection method, an electronic device and a storage medium, and relates to the technical field of digital signals. The method deploys a test tool unit. After receiving a control instruction, the host computer can control the test tool unit to switch to different to-be-detected modes and different to-be-detected channels according to the control instruction, so as to input different types of to-be-detected signals to each to-be-detected channel of the to-be-detected device, and realize calibration testing of each channel of the to-be-detected device under different types of signals. After one-time connection between the test tool unit and the to-be-detected device, the test tool unit can be controlled to realize automatic switching control of the to-be-detected mode and the to-be-detected channel by changing the input control instruction, so that different types of detection signals can be automatically output to each channel of the to-be-detected device, calibration detection of the to-be-detected device under different types of signals is realized, and compared with the manual switching mode, the method is more simple to operate and greatly improves calibration detection efficiency.

Description

Technical Field

[0001] This application relates to the field of digital signal technology, and more specifically, to a calibration and testing method for a signal measurement device, an electronic device, and a storage medium. Background Technology

[0002] As the core module of the signal input device, the hybrid analog input signal module supports the detection of three types of input signals for each channel, so the signal input device can be used to connect to external instruments for signal detection.

[0003] In existing technologies, the performance of signal input devices under different types of input signals is usually achieved by manually switching the type of external signal in the input signal device and switching the channel to be tested in the input signal device.

[0004] However, due to the frequent switching, the error rate of manual operation is high, and the detection efficiency is relatively low. Summary of the Invention

[0005] The purpose of this application is to address the shortcomings of the prior art by providing a calibration and testing method, electronic device, and storage medium for signal measurement equipment, thereby improving the efficiency of equipment signal calibration and testing.

[0006] To achieve the above objectives, the technical solutions adopted in the embodiments of this application are as follows:

[0007] In a first aspect, embodiments of this application provide a calibration and testing method for a signal measurement device, applied to a host computer in a device testing system. The device testing system includes: a host computer and a testing fixture unit, the testing fixture unit being communicatively connected to the host computer, and the testing fixture unit being connected to the device under test via terminal blocks; the method includes:

[0008] Receive input control commands, the control commands including: the mode under test and the channel under test;

[0009] According to the control command, the test fixture unit is controlled to switch to the test mode, and the test signal is output to the device under test through the test channel;

[0010] Based on the signal test results of each channel under test of the device under test in at least one test mode, a calibration test result of the device under test is generated, which is used to indicate whether the device under test is qualified.

[0011] Optionally, the test fixture unit includes: a preset type of signal output circuit, a signal switching circuit, and a channel switching circuit. Each signal output channel of the test fixture unit is connected to each test channel of the device under test via terminal blocks. The step of controlling the test fixture unit to switch to the test mode according to the control command and outputting the test signal to the device under test through the test channel includes:

[0012] According to the test mode, the signal switching circuit is controlled to switch to the signal output circuit of the target type corresponding to the test mode;

[0013] According to the channel under test, the channel switching circuit is controlled to switch to the signal output channel corresponding to the channel under test, and the signal under test signal is output to the corresponding channel under test of the device under test through the signal output channel.

[0014] Optionally, each type of signal output circuit includes a preset number of signal sources to be tested, each signal source outputting a different signal of magnitude; the control command further includes: a signal source identifier; the step of controlling the signal switching circuit to switch to the target type of signal output circuit corresponding to the test mode according to the test mode includes:

[0015] According to the identifier of the signal source under test in the test mode, the signal switching circuit is controlled to switch to the signal source under test in the signal output circuit of the target type;

[0016] The step of outputting the test signal to the corresponding test channel of the device under test through the signal output channel includes:

[0017] The signal to be tested emitted by the signal source is output to the corresponding channel of the device under test through the signal output channel.

[0018] Optionally, generating calibration test results for the device under test based on the acquired signal test results of each channel under test in at least one test mode includes:

[0019] The test fixture unit receives the test values ​​of the target channel of the device under test under each test signal in the target test mode, wherein the target test mode is any one of the at least one test modes.

[0020] Based on the test values ​​of the target channel under each test signal and the calibration function relationship corresponding to the test mode, the signal test results of the target channel of the device under test in the target test mode are determined.

[0021] Based on the signal test results of each channel under test of the device under test in the target test mode, determine the signal test results of the device under test in the target test mode;

[0022] The test results of the device under test are generated based on the signal test results of the device under test in each test mode.

[0023] Optionally, determining the signal test result of the target channel under test of the device under test in the target test mode based on the test values ​​of the target channel under each test signal and the calibration function relationship corresponding to the test mode includes:

[0024] Based on the test values ​​of the target channel under at least two first test signals in each test signal and the calibration function relationship corresponding to the test mode, the target function relationship corresponding to the target channel under the test mode is determined.

[0025] Based on each second test signal other than the at least two test signals in each test signal, and the objective function relationship, determine the calibration test value of each second test signal respectively;

[0026] Based on the calibration test values ​​of each second test signal and the actual test values ​​of each second test signal, determine the signal test results of the target test channel under each second test signal;

[0027] Based on the signal test results of the target channel under each second test signal, the signal test results of the target channel of the device under test in the target test mode are determined.

[0028] Optionally, determining the signal test result of the target channel under each second test signal based on the calibration test value of each second test signal and the actual test value of each second test signal includes:

[0029] If the difference between the calibrated test value of the second test signal and the actual test value of the second test signal meets the preset accuracy range, then the signal test result of the target test channel under the second test signal is determined to be a test pass.

[0030] The step of determining the signal test result of the target channel under test of the device under test in the target test mode based on the signal test results of the target channel under test under each second test signal includes:

[0031] If the signal test results of the target channel under each second test signal are all passed, then the signal test result of the target channel of the device under test in the target test mode is determined to be passed.

[0032] Optionally, determining the signal test result of the device under test in the target test mode based on the signal test results of each channel under test of the device under test in the target test mode includes:

[0033] If the signal test results of each channel of the device under test in the target test mode are all passed, then the signal test results of the device under test in the target test mode are determined to be successful.

[0034] Optionally, based on the signal test results of the device under test in each test mode, a test result for the device under test is generated, including:

[0035] If the signal test results of the device under test are all successful in each test mode, then the generated test result of the device under test is that the device under test is qualified.

[0036] Secondly, this application also provides a calibration and testing device for a signal measurement device, applied to a host computer in a device testing system. The device testing system includes a host computer and a testing fixture unit, the testing fixture unit being communicatively connected to the host computer and connected to the device under test via a terminal block. The device includes a receiving module, a control module, and a generating module.

[0037] The receiving module is used to receive input control commands, the control commands including: the mode to be tested and the channel to be tested;

[0038] The control module is used to control the test fixture unit to switch to the test mode according to the control command, and to output the test signal to the device under test through the test channel.

[0039] The generation module is used to generate calibration test results for the device under test based on the signal test results of each channel under test in at least one test mode. The calibration test results are used to indicate whether the device under test is qualified.

[0040] Optionally, the test fixture unit includes: a preset type of signal output circuit, signal switching circuit, and channel switching circuit, wherein each signal output channel of the test fixture unit is connected to each test channel of the device under test through a terminal block.

[0041] The control module is specifically used to control the signal switching circuit to switch to the signal output circuit of the target type corresponding to the test mode according to the test mode;

[0042] According to the channel under test, the channel switching circuit is controlled to switch to the signal output channel corresponding to the channel under test, and the signal under test signal is output to the corresponding channel under test of the device under test through the signal output channel.

[0043] Optionally, each type of signal output circuit includes a preset number of signal sources to be tested, and the magnitude of the signal to be tested output by each signal source to be tested is different; the control command also includes: a signal source identifier;

[0044] The control module is specifically used to control the signal switching circuit to switch to the signal source under test in the signal output circuit of the target type according to the identifier of the signal source under test in the test mode;

[0045] The signal to be tested emitted by the signal source is output to the corresponding channel of the device under test through the signal output channel.

[0046] Optionally, the generation module is specifically used to receive the test values ​​of the target channel of the device under test under each test signal in the target test mode detected by the test fixture unit, wherein the target test mode is any one of the at least one test modes.

[0047] Based on the test values ​​of the target channel under each test signal and the calibration function relationship corresponding to the test mode, the signal test results of the target channel of the device under test in the target test mode are determined.

[0048] Based on the signal test results of each channel under test of the device under test in the target test mode, determine the signal test results of the device under test in the target test mode;

[0049] The test results of the device under test are generated based on the signal test results of the device under test in each test mode.

[0050] Optionally, the generation module is specifically used to determine the target function relationship corresponding to the target channel under the test mode based on the test values ​​of the target channel under at least two first test signals in each test signal and the calibration function relationship corresponding to the test mode;

[0051] Based on each second test signal other than the at least two test signals in each test signal, and the objective function relationship, determine the calibration test value of each second test signal respectively;

[0052] Based on the calibration test values ​​of each second test signal and the actual test values ​​of each second test signal, determine the signal test results of the target test channel under each second test signal;

[0053] Based on the signal test results of the target channel under each second test signal, the signal test results of the target channel of the device under test in the target test mode are determined.

[0054] Optionally, the generation module is specifically used to determine that the signal test result of the target channel under the second signal under test is a test pass if the difference between the calibration test value of the second signal under test and the actual test value of the second signal under test meets a preset accuracy range;

[0055] If the signal test results of the target channel under each second test signal are all passed, then the signal test result of the target channel of the device under test in the target test mode is determined to be passed.

[0056] Optionally, the generation module is specifically used to determine that the signal test result of the device under test in the target test mode is successful if the signal test results of each channel under test of the device under test in the target test mode are all passed.

[0057] Optionally, the generation module is specifically used to generate a test result for the device under test (DUT) as qualified if the signal test results of the DUT in each test mode are all successful.

[0058] Thirdly, embodiments of this application provide an electronic device, including: a processor, a storage medium, and a bus. The storage medium stores machine-readable instructions executable by the processor. When the electronic device is running, the processor communicates with the storage medium via the bus, and the processor executes the machine-readable instructions to perform the steps of the method provided in the first aspect.

[0059] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program that, when executed by a processor, performs the steps of the method provided in the first aspect.

[0060] The beneficial effects of this application are:

[0061] This application provides a calibration and testing method, electronic device, and storage medium for a signal measurement device. By deploying a test fixture unit, the host computer, upon receiving a control command, can control the test fixture unit to switch to different test modes and different test channels according to the control command. This allows for the input of different types of test signals to each test channel of the device under test, achieving calibration testing of each channel of the device under test under different signal types. In this method, the test fixture unit and the device under test only need to be connected once. By changing the input control command, the test fixture unit can automatically switch between test modes and test channels, thereby automatically outputting different types of test signals to each channel of the device under test, achieving calibration testing of the device under test under different signal types. Compared to the traditional manual control switching method, this method is simpler to operate and significantly improves calibration and testing efficiency. Attached Figure Description

[0062] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0063] Figure 1 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 1 ;

[0064] Figure 2 A topology diagram of a device detection system provided in an embodiment of this application;

[0065] Figure 3 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 2 ;

[0066] Figure 4 A block diagram illustrating the working principle of a test fixture unit provided in this application embodiment;

[0067] Figure 5 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 3 ;

[0068] Figure 6 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 4 ;

[0069] Figure 7 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 5 ;

[0070] Figure 8 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 6 ;

[0071] Figure 9 A schematic diagram of a calibration and testing device for a signal measurement equipment provided in an embodiment of this application;

[0072] Figure 10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0073] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. It should be understood that the accompanying drawings in this application are for illustrative and descriptive purposes only and are not intended to limit the scope of protection of this application. Furthermore, it should be understood that the schematic drawings are not drawn to scale. The flowcharts used in this application illustrate operations implemented according to some embodiments of this application. It should be understood that the operations in the flowcharts may not be implemented in sequence, and steps without logical contextual relationships may be reversed or implemented simultaneously. In addition, those skilled in the art, guided by the content of this application, may add one or more other operations to the flowcharts, or remove one or more operations from the flowcharts.

[0074] Furthermore, the described embodiments are merely some, not all, of the embodiments of this application. The components of the embodiments of this application described and illustrated herein can typically be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0075] It should be noted that the term "comprising" will be used in the embodiments of this application to indicate the presence of the features declared thereafter, but does not exclude the addition of other features.

[0076] Currently, in the production of mixed analog input modules, after the module circuit board is soldered, the program is burned, and the module is manufactured, signal calibration and testing are required to determine the quality of the module circuit board. The mixed analog input module here can refer to the device under test (DUT) mentioned below, or the module being tested.

[0077] Typically, mixed analog input modules require separate calibration and testing for current, voltage, and resistance signals. Each signal's linear curve is calibrated separately, and then the existing signal values ​​are used for testing to confirm the accuracy of the calibration data.

[0078] The most common method for calibrating and testing hybrid analog input modules is through manual operation in three modes. When connecting an external current source to the terminals of the device under test (DUT), the system switches to current mode via a command from the host computer for manual calibration. Then, when connecting to a voltage source, the system switches to voltage mode via a command from the host computer for voltage calibration. Finally, when connecting to a resistance box, the system switches to resistance mode via a command from the host computer for manual calibration. Each channel of the DUT requires repeated manual calibration, and when there are many channels, this process needs to be repeated multiple times.

[0079] This method requires manual operation to change the external wiring of the device under test and to switch the current source, voltage source, and resistance box via commands. This operation requires personnel to have relevant experience and be able to change terminal wiring and input commands to the host computer. The operation is cumbersome, complicated, and prone to errors. Each channel calibration test needs to be repeated once, which is time-consuming, inefficient, and results in a low product qualification rate.

[0080] Based on this, the equipment testing system of this solution includes a test fixture unit. The host computer can control the switching of the output signal and the switching of the channel of the test fixture unit, thereby automatically outputting different types of test signals to each test channel of the device under test, so as to realize the automated calibration and testing process. Only one wiring is required to realize calibration and testing under different types of test signals. The operation is simple, the test mode switching is more convenient, and the equipment testing efficiency is greatly improved.

[0081] Figure 1 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 1 This method can be applied to the host computer in an equipment testing system. The equipment testing system may include: a host computer and a testing fixture unit. The testing fixture unit is communicatively connected to the host computer and connected to the device under test via terminal blocks. Figure 1 As shown, the method may include:

[0082] S101. Receive input control commands, including: the mode under test and the channel under test.

[0083] First, let's explain the device under test (DUT), which refers to the aforementioned hybrid analog input module. The DUT may contain multiple channels. During calibration testing, each channel needs to be tested under all types of input signals. When each channel passes the test under all types of input signals, the DUT can be determined to be qualified. The qualified DUT can then be used to connect to external devices to acquire analog signals from the external devices and send the analog signals to the control equipment for signal analysis.

[0084] Inspectors can input control commands through the inspection software installed on the host computer. They can either directly input text commands or select the corresponding commands from the multiple options displayed on the interface.

[0085] Optionally, the control command may include: a test mode, which indicates the current test signal type. The test mode may include: current test mode, voltage test mode, and resistance test mode.

[0086] The channel under test is used to indicate which channel of the device under test is currently being tested.

[0087] S102. Control the test fixture unit to switch to the test mode according to the control command, and output the test signal to the device under test through the test channel.

[0088] Optionally, the host computer can control the test fixture unit to switch to the indicated test mode according to the received control command. That is, it controls the test fixture unit to turn on the signal input source of the test mode. At the same time, it controls the test fixture unit to turn on the test channel between the test fixture unit and the device under test. Thus, through the turned-on test channel, the test fixture unit can output the test signal to the test channel of the device under test.

[0089] Under the selected test mode, the test fixture unit inputs the test signal of the corresponding type to the test channel of the device under test, thereby realizing the detection of the test channel under the specified type of signal.

[0090] S103. Based on the signal test results of each channel under test of the device under test in at least one test mode, generate calibration test results for the device under test. The calibration test results are used to indicate whether the device under test is qualified.

[0091] Optionally, the test mode can include multiple modes, and the test channel can also include multiple channels. By inputting different control commands, based on the above method, the test fixture unit can be automatically switched to different test modes and different test channels. Thus, each test channel of the device under test can be used for signal calibration testing in each test mode, and the signal test results of each test channel of the device under test in each test mode can be combined to generate the calibration test results of the device under test.

[0092] In summary, the calibration and testing method for signal measurement equipment provided in this embodiment, by deploying a test fixture unit, allows the host computer to control the test fixture unit to switch to different test modes and different test channels after receiving control commands. This enables the input of different types of test signals to each test channel of the device under test, achieving calibration testing of each channel of the device under test under different signal types. In this method, the test fixture unit and the device under test only need to be connected once. By changing the input control commands, the test fixture unit can automatically switch between test modes and test channels, thereby automatically outputting different types of test signals to each channel of the device under test, achieving calibration testing of the device under test under different signal types. Compared with the traditional manual control switching method, this method is simpler to operate and greatly improves calibration and testing efficiency.

[0093] Figure 2 This is a topology diagram of a device detection system provided in an embodiment of this application. Figure 2 As shown, the test fixture unit may include: a preset type of signal output circuit, signal switching circuit and channel switching circuit. Each signal output channel of the test fixture unit is connected to each test channel of the device under test through a terminal block.

[0094] The preset signal output circuits may include: current source output circuit, voltage source output circuit, and resistor circuit.

[0095] The signal switching circuit is used to switch the type of signal output to the device under test (DUT) in a given test mode. For example, if the test mode is a current test mode, the signal switching circuit can switch to the current source output circuit to output a current signal to the DUT.

[0096] The number of signal output channels in the test fixture unit can be the same as the number of channels in the device under test, and they are connected one-to-one. As shown in the figure, signal output channel 1 of the test fixture unit can be connected to channel 1 of the device under test through a terminal block, signal output channel 2 of the test fixture unit can be connected to channel 2 of the device under test through a terminal block, and so on.

[0097] In addition, the common ground, communication interface and power interface between the test fixture unit and the device under test are also connected one by one.

[0098] The channel switching circuit is used to switch the different test channels of the test fixture unit and the device under test. For example, it can connect the signal output channel 1 of the test fixture unit to the test channel 1 of the device under test, so as to output the test signal to the channel 1 of the device under test.

[0099] In addition, the test fixture unit may also include a microcontroller minimum system circuit. The host computer interacts with the microcontroller to send control commands to control the test fixture unit to perform corresponding operations. The test results of each channel of the device under test can also be transmitted back to the host computer via the microcontroller. The host computer performs a series of calculations based on the test results to determine the pass / fail status of the device under test.

[0100] Figure 3 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 2 Optionally, in step S102, controlling the test fixture unit to switch to the test mode according to the control command and outputting the test signal to the device under test through the test channel may include:

[0101] S301, The signal output circuit of the target type corresponding to the test mode is switched by the control signal switching circuit according to the test mode.

[0102] Optionally, control commands can be sent to the microcontroller of the test fixture unit, and the microcontroller can switch the signal output circuit to the target type signal output circuit corresponding to the test mode through the IO pin control signal switching circuit.

[0103] In this embodiment, the test mode may include: current test mode, voltage test mode, and resistance test mode; the signal output circuit of the target type corresponding to the current test mode is a current source output circuit, the signal output circuit of the target type corresponding to the voltage test mode is a voltage source output circuit, and the signal output circuit of the target type corresponding to the resistance test mode is a resistance circuit.

[0104] S302. Based on the channel under test, control the channel switching circuit to switch to the signal output channel corresponding to the channel under test, and output the test signal to the corresponding channel under test of the device under test through the signal output channel.

[0105] The microcontroller can also control the channel switching circuit via I / O pins to switch to the signal output channel corresponding to the channel under test. In this embodiment, the channel under test is as follows: Figure 2 The diagram shows that it may include 8 channels.

[0106] According to the channel under test in the control command, the channel under test between the test fixture unit and the device under test can be connected. For example, if the channel under test in the control command is channel 1 and the test mode is current test mode, then the channel switching circuit can be controlled to switch to channel 1 of the test fixture unit, thereby connecting channel 1 of the test fixture unit with channel 1 of the device under test. Then, the test signal can be output to channel 1 of the device under test through channel 1 of the test fixture unit. Here, the test signal is a current signal.

[0107] Figure 4This is a block diagram illustrating the working principle of a test fixture unit provided in an embodiment of this application. Figure 4 As shown, each type of signal output circuit includes a preset number of signal sources to be measured, and the magnitude of the signal to be measured output by each signal source is different. In one feasible embodiment, the current source output circuit, voltage source output circuit, and resistor circuit can all include, as shown in the figure... Figure 4 The image shows seven signal sources with different amplitudes.

[0108] In one alternative embodiment, for the current source output circuit and the voltage source output circuit, the above... Figure 2 The signal switching circuit and channel switching circuit shown both use analog switch circuits. Analog switch U1 is used to control the signal output of the current source output circuit, analog switch U2 is used to control the signal output of the voltage source output circuit, and analog switch U3 is used to control the channel switching.

[0109] For resistive circuits, both the signal switching circuit and the channel switching circuit use relay groups. This is because the internal resistance of switches is usually relatively large. If analog switches are used as the signal switching circuit for a resistive circuit, the internal resistance of the switches will interfere with the magnitude of the resistance signal output by the resistive circuit. Relay groups 1-7 are used to control the signal output of the resistive circuit, and relay groups 8-15 are used to control channel switching.

[0110] Figure 5 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 3 In some embodiments, the control command further includes: a signal source identifier to be tested; in step S301, switching the signal output circuit of the target type corresponding to the test mode to the control signal switching circuit according to the test mode may include:

[0111] S501. Based on the identifier of the signal source under test in the test mode, the control signal switching circuit switches to the signal source under test in the target type signal output circuit.

[0112] Optionally, the signal source identifier is used to indicate the signal source to which the target amplitude is to be switched.

[0113] When the control command includes: the test mode is current test mode, the test channel is channel 1, and the test signal source is current source 1, then the microcontroller of the test fixture unit can control the analog switch U3 to switch to channel 1 and control the analog switch U1 to switch to current source 1 (0.5mA).

[0114] When the control command includes: the test mode is current test mode, the test channel is channel 1, and the test signal source is current source 2, then the microcontroller of the test fixture unit can control the analog switch U3 to switch to channel 1 and control the analog switch U1 to switch to current source 2 (5mA).

[0115] When the control command includes: the test mode is voltage test mode, the test channel is channel 2, and the test signal source is current source 3, then the microcontroller of the test fixture unit can control the analog switch U3 to switch to channel 2 and control the analog switch U1 to switch to current source 3 (10mA).

[0116] This enables the output of a target amplitude signal of the target type to the device under test.

[0117] In step S302, outputting the test signal to the corresponding test channel of the device under test through the signal output channel may include:

[0118] S502. Output the test signal emitted by the test signal source to the corresponding test channel of the device under test through the signal output channel.

[0119] Therefore, when the microcontroller of the test fixture unit controls the analog switch U3 to switch to channel 1 and controls the analog switch U1 to switch to current source 1 (0.5mA), it can achieve the purpose of outputting a current signal of 0.5mA to channel 1 of the device under test.

[0120] Similarly, when the microcontroller of the test fixture unit controls the analog switch U3 to switch to channel 1 and controls the analog switch U1 to switch to current source 2 (5mA), it can output a current signal of 5mA to channel 1 of the device under test.

[0121] Therefore, it is possible to output various types of test signals with different amplitudes to each channel of the device under test.

[0122] Figure 6 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 4 Optionally, in step S103, generating calibration test results for the device under test based on the acquired signal test results of each channel under test in at least one test mode may include:

[0123] S601. Receive the test values ​​of the target channel of the device under test under each test signal of the target test mode detected by the test fixture unit. The target test mode is any test mode among at least one test mode.

[0124] Optionally, after the target test signal is output to the target test channel of the device under test, the microcontroller can detect the test value of the target test channel of the device under test under the target test signal and feed the test value back to the host computer, so that the host computer can receive the test value of the target test channel of the device under test under each test signal in the target test mode.

[0125] S602. Based on the test values ​​of the target channel under each test signal and the calibration function relationship corresponding to the test mode, determine the signal test results of the target channel under test in the target test mode.

[0126] For each channel under test of the device under test, a test value is obtained under different magnitude test signals in each test mode. That is, channel under test 1 corresponds to one test value under current source 1 and one test value under current source 2. Thus, channel under test 1 corresponds to one test value under each test signal output by each current source in the current test mode.

[0127] Therefore, based on the test values ​​of channel 1 under test in the current test mode under various current sources and the current calibration function relationship corresponding to the current test mode, the signal test results of channel 1 under test in the current test mode can be obtained.

[0128] S603. Based on the signal test results of each channel under test of the device under test in the target test mode, determine the signal test results of the device under test in the target test mode.

[0129] Therefore, the signal test results of each channel under test of the device under test in the current test mode can be obtained separately, and the signal test results of the device under test in the current test mode can be obtained by combining the test results.

[0130] S604. Generate the test results of the device under test based on the signal test results of the device under test in each test mode.

[0131] Based on this, the signal test results of the device under test can be obtained in the current test mode, voltage test mode, and resistance test mode respectively. The test results of the three modes are combined to generate the test results of the device under test.

[0132] Figure 7 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 5 Optionally, in step S602, determining the signal test result of the target channel under test in the target test mode based on the test values ​​of each signal under test and the calibration function relationship corresponding to the test mode may include:

[0133] S701. Based on the test values ​​of the target channel under at least two first signals under each signal under test and the calibration function relationship corresponding to the test mode, determine the target function relationship corresponding to the target channel under test under the test mode.

[0134] Taking the current test mode as an example, there are a total of 7 types of signals to be tested, which are the current signals output by 7 different current sources. For each type of current signal to be tested, channel 1 under test corresponds to a test value. The test values ​​corresponding to at least two of the 7 types of current signals to be tested, as well as the calibration function relationship corresponding to the test mode, can be selected to determine the target function relationship corresponding to channel 1 under the current test mode.

[0135] S702. Based on each second test signal (excluding at least two test signals) among the test signals and the objective function relationship, determine the calibration test value of each second test signal.

[0136] Assuming that the first test signal selected includes the test signal output by current source 1 and the test signal output by current source 2, then the second test signal in this embodiment includes the test signals output by current sources 3 to 7 respectively.

[0137] Optionally, the second signal to be tested can be input into the objective function relationship to obtain the calibration test value of the second signal to be tested.

[0138] S703. Based on the calibration test value of each second test signal and the actual test value of each second test signal, determine the signal test result of the target test channel under each second test signal.

[0139] Meanwhile, after outputting the second test signal to the test channel 1, the actual test value of the test channel 1 can also be detected. Then, based on the calibration test value and the actual test value of the second test signal, the signal test result of the target test channel under each second test signal can be determined.

[0140] S704. Based on the signal test results of the target channel under each second test signal, determine the signal test results of the target channel under test of the device under test in the target test mode.

[0141] The target function relationship corresponding to the channel under test can be generated by the test value under the first test signal. The target function relationship can be verified based on the actual test value and calibration test value under each second test signal, thereby obtaining the signal test result of the target channel under test of the device under test in the target test mode.

[0142] By repeating the above method, the signal test results of each channel under test of the device under test in each test mode can be obtained.

[0143] Figure 8 A flowchart illustrating the calibration and testing method for the signal measurement device provided in this application embodiment. Figure 6Optionally, in step S703, determining the signal test result of the target channel under each second signal under test based on the calibration test value of each second signal under test and the actual test value of each second signal under test may include:

[0144] S801. If the difference between the calibrated test value and the actual test value of the second test signal meets the preset accuracy range, then the signal test result of the target test channel under the second test signal is determined to be a successful test.

[0145] For any second test signal, if the difference between its calibrated test value and the actual test value meets the accuracy requirements, then the signal test of the target test channel under the second test signal can be determined to be passed.

[0146] In step S704, based on the signal test results of the target channel under each second test signal, the signal test results of the target channel under test of the device under test in the target test mode are determined, which may include:

[0147] S802. If the signal test results of the target channel under each second test signal are all passed, then the signal test result of the target channel of the device under test in the target test mode is determined to be passed.

[0148] Therefore, when the signal test results of the target channel under each second test signal are all passed, it can be determined that the signal test of the target channel of the device under test in the target test mode has passed.

[0149] Optionally, in step S603, determining the signal test result of the device under test in the target test mode based on the signal test results of each channel under test of the device under test in the target test mode may include: if the signal test results of each channel under test of the device under test in the target test mode are all passed, then the signal test result of the device under test in the target test mode is determined to be a successful signal test of the device under test in the target test mode.

[0150] For a given test mode, if the test results of all test channels of the device under test in that test mode are all passed, then the signal test result of the device under test in that test mode can be determined as a successful test.

[0151] Optionally, in step S604, generating the test result of the device under test based on the signal test results of the device under test in each test mode may include: if the signal test results of the device under test in each test mode are all signal test successful, then the generated test result of the device under test is that the device under test is qualified.

[0152] Therefore, if the test results of the device under test are all successful in each test mode, the device under test can be determined to be a qualified device.

[0153] The following examples illustrate the testing process under different modes:

[0154] First, calibration and testing of current test mode.

[0155] Step 1: The host computer controls the microcontroller of the test fixture unit according to the received control commands. The microcontroller enables analog switch chips U1 and U3 through I / O pins. Analog switch chip U1 selects input current sources of different amplitudes, and analog switch chip U3 selects output channels of different channels, such as... Figure 4 As shown.

[0156] Step 2: U3 selects channel 1, U1 selects current source 1 (X1), and the test value of channel 1 of the device under test is Y1;

[0157] Step 3: U3 selects channel 1, U1 selects current source 2 (X2), and the test value of channel 1 of the device under test is Y2;

[0158] Step 4: Having obtained (X1, Y1) and (X2, Y2) through the above steps, the calibration function for the current is Y = aX + b. Substitute (X1, Y1) and (X2, Y2) into the formula...

[0159] aX1+b=Y1

[0160] aX² + b = Y²

[0161] The values ​​of a and b are calculated, the relationship Y = aX + b is determined, and the objective function relationship corresponding to channel 1 in the current test mode is generated.

[0162] Step 5: U3 selects channel 1, U1 selects current source 3 (X3), the actual test value of channel 1 of the device under test is Y′3; calculate the calibration test value Y3 using the relationship Y=aX+b, compare the values ​​of Y′3 and Y3 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0163] Step 6: U3 selects channel 1, U1 selects current source 4 (X4), the actual test value of channel 1 of the device under test is Y′4; calculate the calibration test value Y4 using the relationship Y=aX+b, compare the values ​​of Y′4 and Y4 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0164] Step 7: U3 selects channel 1, U1 selects current source 5 (X5), the actual test value of channel 1 of the device under test is Y′5; calculate Y5 using the formula Y=aX+b, compare the values ​​of Y′5 and Y5 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0165] Step 8: Select current source 6 (X6) for U1 and channel 1 for U3. The actual test value of channel 1 of the device under test is Y′6. Calculate the calibrated test value Y6 using the formula Y=aX+b. If the values ​​of Y′6 and Y6 are within the accuracy range, then the test result of channel 1 is a pass.

[0166] Step 9: U3 selects channel 1, U1 selects current source 7 (X7), the actual test value of channel 1 of the device under test is Y′7; calculate the calibration test value Y7 using the formula Y=aX+b, compare the values ​​of Y′7 and Y7 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0167] Step 10: Perform current detection on X3-X7 respectively through steps 5 to 9 to complete the test of channel 1.

[0168] For channels 2-8, the above steps can be repeated. Channels 2, 3, 4, 5, 6, 7, and 8 are selected sequentially via U3 to perform current detection on different channels. For each channel, the current detection uses two test values ​​to calculate the target function relationship, and the remaining five test values ​​are used to verify the correctness of the linear curve of the signal represented by the target function relationship.

[0169] It is worth noting that in the example above, the signals to be measured output from current source 1 and current source 2 are used as the first signal to be measured, and the signals to be measured output from current sources 3-7 are used as the second signal to be measured. In practical applications, any two or more signals to be measured can be used as the first signal to be measured, and the rest can be used as the second signal to be measured.

[0170] Second, calibration and testing of voltage test modes.

[0171] Step 1: The host computer controls the microcontroller of the test fixture unit according to the received control commands. The microcontroller enables analog switch chips U2 and U3 through I / O pins. Analog switch chip U2 selects input voltage sources of different amplitudes, and analog switch chip U3 selects output channels of different channels, such as... Figure 4 As shown.

[0172] Step 2: Select channel 1 for U3, select voltage source 1 (V1) for U2, and the test value for channel 1 of the device under test is W1;

[0173] Step 3: Select channel 1 for U3, select voltage source 2 (V2) for U2, and the test value for channel 1 of the device under test is W2;

[0174] Step 4: Through the above steps, we obtain (V1, W1) and (V2, W2). The voltage calibration function is W = cV + d. Substitute (V1, W1) and (V2, W2) into the formula.

[0175] cV1+d=W1

[0176] cV² + d = W²

[0177] The values ​​of c and d are calculated, the relationship W = cV + d is determined, and the objective function relationship corresponding to channel 1 in voltage test mode is obtained.

[0178] Step 5: U3 selects channel 1, U2 selects voltage source 3 (V3), the actual test value of channel 1 of the device under test is W′3; calculate the calibrated test value W3 using the formula W=cV+d, compare the values ​​of W′3 and W3 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0179] Step 6: U3 selects channel 1, U2 selects voltage source 4 (V4), the actual test value of channel 1 of the device under test is W′4; calculate the calibrated test value W4 using the formula W=cV+d, compare the values ​​of W′4 and W4 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0180] Step 7: U3 selects channel 1, U2 selects voltage source 5 (V5), the actual test value of channel 1 of the device under test is W′5; calculate the calibrated test value W5 using the formula W=cV+d, compare the values ​​of W′5 and W5 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0181] Step 8: U3 selects channel 1, U2 selects voltage source 6 (V6), the actual test value of channel 1 of the device under test is W′6; calculate the calibrated test value W6 using the formula W=cV+d, compare the values ​​of W′6 and W6 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0182] Step 9: U3 selects channel 1, U2 selects voltage source 7 (V7), the actual test value of channel 1 of the device under test is W′7; calculate the calibration test value W7 using the formula W=cV+d, compare the values ​​of W′7 and W7 and if they are within the accuracy range, then the test result of channel 1 is that the test is passed;

[0183] Step 10: Perform voltage detection for V3-V7 using steps 5 to 9 to complete the voltage detection for channel 1. Then, perform voltage detection for the other channels in sequence. Select channels 2, 3, 4, 5, 6, 7, and 8 sequentially using U3 to perform voltage detection for different channels.

[0184] Third, calibration and testing of resistance test modes.

[0185] Step 1: The host computer controls the microcontroller of the test fixture unit according to the received control commands. The microcontroller controls relays 1-7 through I / O pins to select different amplitude resistance values ​​for input, and relays 8-15 to select different channel outputs, such as... Figure 4 As shown.

[0186] Step 2: Relay 8 selects channel 1, relay 1 selects the resistance value (R1), and the test value of channel 1 of the device under test is Z1;

[0187] Step 3: Relay 8 selects channel 1, relay 2 selects the resistance value (R2), and the test value of channel 1 of the device under test is Z2;

[0188] Step 4: Using the above steps, we obtain (R1, Z1) and (R2, Z2). The calibration function for the resistor is Z = fR + g. Substituting (R1, Z1) and (R2, Z2) into the equation...

[0189] fR1+g=Z1

[0190] fR² + g = Z²

[0191] The values ​​of f and g are calculated, the relationship Z = fR + g is determined, and the objective function relationship corresponding to channel 1 in the resistance test mode is obtained.

[0192] Step 5: Relay 8 selects channel 1, relay 3 selects the resistance value (R3), and the actual test value of channel 1 of the device under test is Z′3; calculate the calibrated test value Z3 using the relationship Z=fR+g, and compare the values ​​of Z′3 and Z3. If they are within the accuracy range, the resistance test result of channel 1 is considered to have passed the test.

[0193] Step 6: Relay 8 selects channel 1, relay 4 selects the resistance value (R4), and the actual test value of channel 1 of the device under test is Z′4; calculate the calibrated test value Z4 using the relationship Z=fR+g, and compare the values ​​of Z′4 and Z4. If they are within the accuracy range, the resistance test result of channel 1 is considered to be a pass.

[0194] Step 7: Relay 8 selects channel 1, relay 5 selects the resistance value (R5), and the actual test value of channel 1 of the device under test is Z′5; calculate the calibrated test value Z5 using the relationship Z=fR+g, and compare the values ​​of Z′5 and Z5. If they are within the accuracy range, the resistance test result of channel 1 is a pass.

[0195] Step 8: Relay 8 selects channel 1, relay 6 selects the resistance value (R6), and the actual test value of channel 1 of the device under test is Z′6; calculate the calibrated test value Z6 using the relationship Z=fR+g, and compare the values ​​of Z′6 and Z6. If they are within the accuracy range, the resistance test result of channel 1 is a pass.

[0196] Step 9: Relay 8 selects channel 1, relay 7 selects the resistance value (R7), and the actual test value of channel 1 of the device under test is Z′7; calculate the calibrated test value Z7 using the relationship Z=fR+g, and compare the values ​​of Z′7 and Z7. If they are within the accuracy range, the resistance test result of channel 1 is a pass.

[0197] Step 10: Perform resistance detection on R3-R7 respectively using steps 5 to 9 to complete the resistance detection for channel 1. Then, perform resistance detection on the other channels in sequence. By switching relays 9, 10, 11, 12, 13, 14, and 15 on, resistance detection is performed on different channels.

[0198] By using the above methods, the tests of each channel under each test mode can be completed separately, and the test results can be combined to obtain the test results of the device under test.

[0199] In summary, the calibration and testing method for signal measurement equipment provided in this embodiment, by deploying a test fixture unit, allows the host computer to control the test fixture unit to switch to different test modes and different test channels after receiving control commands. This enables the input of different types of test signals to each test channel of the device under test, achieving calibration testing of each channel of the device under test under different signal types. In this method, the test fixture unit and the device under test only need to be connected once. By changing the input control commands, the test fixture unit can automatically switch between test modes and test channels, thereby automatically outputting different types of test signals to each channel of the device under test, achieving calibration testing of the device under test under different signal types. Compared with the traditional manual control switching method, this method is simpler to operate and greatly improves calibration and testing efficiency.

[0200] The following describes the apparatus, equipment, and storage medium used to implement the calibration and testing method of the signal measurement equipment provided in this application. The specific implementation process and technical effects are described above and will not be repeated below.

[0201] Figure 9 This is a schematic diagram of a calibration and testing device for a signal measurement equipment provided in an embodiment of this application. The functions implemented by this calibration and testing device correspond to the steps performed by the method described above. Figure 9 As shown, the device may include: a receiving module 910, a control module 920, and a generating module 930;

[0202] The receiving module 910 is used to receive input control commands, which include: the mode under test and the channel under test;

[0203] The control module 920 is used to control the test fixture unit to switch to the test mode according to the control command, and output the test signal to the device under test through the test channel;

[0204] The generation module 930 is used to generate calibration test results for the device under test based on the signal test results of each channel under test in at least one test mode. The calibration test results are used to indicate whether the device under test is qualified.

[0205] Optionally, the test fixture unit includes: a preset type of signal output circuit, signal switching circuit and channel switching circuit, and each signal output channel of the test fixture unit is connected to each test channel of the device under test through a terminal block.

[0206] The control module 920 is specifically used to switch the control signal switching circuit to the target type signal output circuit corresponding to the test mode according to the test mode control signal switching circuit.

[0207] Based on the channel under test, the control channel switching circuit switches to the signal output channel corresponding to the channel under test, and outputs the test signal to the corresponding channel under test of the device under test through the signal output channel.

[0208] Optionally, each type of signal output circuit includes a preset number of signal sources to be tested, and the magnitude of the signal to be tested output by each signal source to be tested is different; the control command also includes: the identifier of the signal source to be tested;

[0209] The control module 920 is specifically used to control the signal switching circuit to switch to the signal source under test in the target type signal output circuit according to the signal source identifier under test mode.

[0210] The signal to be tested is output from the signal source to the corresponding channel of the device under test through the signal output channel.

[0211] Optionally, the generation module 930 is specifically used to receive the test values ​​of the target channel of the device under test under each test signal of the target test mode detected by the test fixture unit, wherein the target test mode is any test mode among at least one test mode.

[0212] Based on the test values ​​of the target channel under each test signal and the calibration function relationship corresponding to the test mode, determine the signal test results of the target channel under test of the device under test in the target test mode.

[0213] Based on the signal test results of each channel under test of the device under test in the target test mode, determine the signal test results of the device under test in the target test mode.

[0214] Based on the signal test results of the device under test in each test mode, the test results of the device under test are generated.

[0215] Optionally, the generation module 930 is specifically used to determine the target function relationship corresponding to the target channel under the test mode based on the test values ​​of the target channel under at least two first test signals in each test signal and the calibration function relationship corresponding to the test mode.

[0216] Based on each second test signal (excluding at least two test signals) among the test signals and the objective function relationship, determine the calibration test value of each second test signal.

[0217] Based on the calibration test values ​​of each second test signal and the actual test values ​​of each second test signal, determine the signal test results of the target test channel under each second test signal;

[0218] Based on the signal test results of the target channel under each second test signal, determine the signal test results of the target channel of the device under test in the target test mode.

[0219] Optionally, the generation module 930 is specifically used to determine that the signal test result of the target channel under the second signal under test is a test pass if the difference between the calibration test value and the actual test value of the second signal under test meets the preset accuracy range.

[0220] If the signal test results of the target channel under each second test signal are all passed, then the signal test result of the target channel of the device under test in the target test mode is determined to be passed.

[0221] Optionally, the generation module 930 is specifically used to determine that the signal test result of the device under test in the target test mode is successful if the signal test results of each channel under test of the device under test in the target test mode are all passed.

[0222] Optionally, the generation module 930 is specifically used to generate a test result for the device under test (DUT) that is qualified if the signal test results of the DUT in each test mode are all successful.

[0223] The above-described device is used to execute the method provided in the foregoing embodiments, and its implementation principle and technical effect are similar, so they will not be described again here.

[0224] These modules can be one or more integrated circuits configured to implement the above methods, such as one or more Application Specific Integrated Circuits (ASICs), one or more digital signal processors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs). Alternatively, when a module is implemented using processing element scheduler code, the processing element can be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. Furthermore, these modules can be integrated together as a system-on-a-chip (SOC).

[0225] The modules described above can be connected or communicate with each other via wired or wireless connections. Wired connections can include metal cables, optical fibers, hybrid cables, or any combination thereof. Wireless connections can include connections via LAN, WAN, Bluetooth, ZigBee, or NFC, or any combination thereof. Two or more modules can be combined into a single module, and any module can be divided into two or more units. Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems and devices described above can be referred to the corresponding processes in the method embodiments, and will not be repeated here.

[0226] Figure 10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. The device may be a computing device or a host computer with data processing capabilities.

[0227] The device may include: a processor 801 and a storage medium 802.

[0228] Storage medium 802 is used to store programs, and processor 801 calls the programs stored in storage medium 802 to execute the above method embodiments. The specific implementation and technical effects are similar, and will not be described in detail here.

[0229] The storage medium 802 stores program code, which, when executed by the processor 801, causes the processor 801 to perform various steps in the methods according to various exemplary embodiments of this application described in the "Exemplary Methods" section above.

[0230] The processor 801 can be a general-purpose processor, such as a central processing unit (CPU), digital signal processor (DSP), application-specific integrated circuit (ASIC), field-programmable gate array (FPGA), or other programmable logic device, discrete gate or transistor logic device, or discrete hardware component, capable of implementing or executing the methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this application can be directly manifested as being executed by a hardware processor, or executed by a combination of hardware and software modules within the processor.

[0231] Storage medium 802, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules. The storage medium can include at least one type of storage medium, such as flash memory, hard disk, multimedia card, card-type storage medium, random access memory (RAM), static random access memory (SRAM), programmable read-only memory (PROM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), magnetic storage medium, magnetic disk, optical disk, etc. The storage medium is any other medium capable of carrying or storing desired program code in the form of instructions or data structures that can be accessed by a computer, but is not limited thereto. In the embodiments of this application, storage medium 802 can also be a circuit or any other device capable of implementing storage functions for storing program instructions and / or data.

[0232] Optionally, this application also provides a program product, such as a computer-readable storage medium, including a program that, when executed by a processor, performs the above-described method embodiments.

[0233] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0234] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0235] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in a combination of hardware and software functional units.

[0236] The integrated units implemented as software functional units described above can be stored in a computer-readable storage medium. These software functional units, stored in a storage medium, include several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute some steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

Claims

1. A calibration and testing method for a signal measurement device, characterized in that, A host computer is used in an equipment testing system. The equipment testing system includes a host computer and a testing fixture unit. The testing fixture unit is communicatively connected to the host computer and connected to the device under test (DUT) via terminal blocks. The testing fixture unit includes a preset type signal output circuit, a signal switching circuit, and a channel switching circuit. The preset type signal output circuit includes a current source output circuit, a voltage source output circuit, and a resistor circuit. The signal switching circuit is used to switch to the signal output circuit corresponding to a given test mode, so as to output a signal of the corresponding type to the DUT to the DUT. Each signal output channel of the testing fixture unit is connected to each test channel of the DUT via terminal blocks. The channel switching circuit is used to switch the signal output channels of the testing fixture unit to each test channel of the DUT. The method includes: Receive input control commands, the control commands including: the mode under test and the channel under test; According to the control command, the test fixture unit is controlled to switch to the test mode, and the test signal is output to the device under test through the test channel; Based on the obtained signal test results of each channel under test of the device under test in at least one test mode, a calibration test result of the device under test is generated, and the calibration test result is used to indicate whether the device under test is qualified. The step of generating calibration test results for the device under test based on the acquired signal test results of each channel under test in at least one test mode includes: The test fixture unit receives the test values ​​of the target channel of the device under test under each test signal in the target test mode, wherein the target test mode is any one of the at least one test modes. Based on the test values ​​of the target channel under at least two first test signals in each test signal and the calibration function relationship corresponding to the test mode, the target function relationship corresponding to the target channel under the test mode is determined. Based on each second test signal other than the at least two test signals in each test signal, and the objective function relationship, determine the calibration test value of each second test signal respectively; Based on the calibration test values ​​of each second test signal and the actual test values ​​of each second test signal, determine the signal test results of the target test channel under each second test signal; Based on the signal test results of the target channel under each second test signal, the signal test results of the target channel of the device under test in the target test mode are determined. Based on the signal test results of each channel of the device under test in the target test mode, determine the signal test results of the device under test in the target test mode; The test results of the device under test are generated based on the signal test results of the device under test in each test mode.

2. The method according to claim 1, characterized in that, The step of controlling the test fixture unit to switch to the test mode according to the control command and outputting the test signal to the device under test through the test channel includes: According to the test mode, the signal switching circuit is controlled to switch to the signal output circuit of the target type corresponding to the test mode; According to the channel under test, the channel switching circuit is controlled to switch to the signal output channel corresponding to the channel under test, and the signal under test signal is output to the corresponding channel under test of the device under test through the signal output channel.

3. The method according to claim 2, characterized in that, Each type of signal output circuit includes a preset number of signal sources to be tested, and the magnitude of the signal to be tested output by each signal source to be tested is different; The control command further includes: a signal source identifier; the step of controlling the signal switching circuit to switch to the target type signal output circuit corresponding to the test mode according to the test mode includes: According to the identifier of the signal source under test in the test mode, the signal switching circuit is controlled to switch to the signal source under test in the signal output circuit of the target type; The step of outputting the test signal to the corresponding test channel of the device under test through the signal output channel includes: The signal to be tested emitted by the signal source is output to the corresponding channel of the device under test through the signal output channel.

4. The method according to claim 1, characterized in that, The step of determining the signal test result of the target test channel under each second test signal based on the calibration test value of each second test signal and the actual test value of each second test signal includes: If the difference between the calibrated test value of the second test signal and the actual test value of the second test signal meets the preset accuracy range, then the signal test result of the target test channel under the second test signal is determined to be a test pass. The step of determining the signal test result of the target channel under test of the device under test in the target test mode based on the signal test results of the target channel under test under each second test signal includes: If the signal test results of the target channel under each second test signal are all passed, then the signal test result of the target channel of the device under test in the target test mode is determined to be passed.

5. The method according to claim 1, characterized in that, The step of determining the signal test result of the device under test (DUT) in the target test mode based on the signal test results of each DUT channel in the target test mode includes: If the signal test results of each channel of the device under test in the target test mode are all passed, then the signal test results of the device under test in the target test mode are determined to be successful.

6. The method according to claim 1, characterized in that, Based on the signal test results of the device under test in each test mode, the detection results of the device under test are generated, including: If the signal test results of the device under test are all successful in each test mode, then the generated test result of the device under test is that the device under test is qualified.

7. An electronic device, characterized in that, include: The device includes a processor, a storage medium, and a bus, wherein the storage medium stores program instructions executable by the processor, and when the electronic device is running, the processor communicates with the storage medium via the bus, and the processor executes the program instructions to perform the steps of the method as described in any one of claims 1 to 6.

8. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, performs the steps of the method as described in any one of claims 1 to 6.

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