Anti-Strong-Impact On-Board Dynamic Parameter Testing Method, System and Circuit Board

Abstract

The present invention belongs to the technical field of processing of dynamic parameter data for projectiles, and discloses a method, a system and a circuit board for testing dynamic parameters of projectiles against strong impacts. After the circuit board is powered on, the circuit board enters a pre-sampling mode. When the sampled data meets the requirements of the set threshold and pulse width, the circuit board enters the formal sampling mode to start triggering and collecting data; the data that meets the requirements of the threshold and pulse width is stored, and the measurement and control terminal reads the stored data and saves it locally for subsequent analysis and processing of the data. The present invention provides a reliable and effective system for testing dynamic parameters of projectiles to protect data acquisition, solves the disadvantages of weak anti-impact ability and large volume of most systems for testing dynamic parameters of projectiles, can be adapted to different types of projectiles, and meets the test requirements under different working conditions. The present invention provides a system for testing dynamic parameters of projectiles, and sets a dual triggering module for the triggering mode to accurately prevent mis-triggering and non-triggering.

Description

Technical Field

[0001] The present invention belongs to the technical field of missile-borne dynamic parameter data processing, and in particular relates to a method, system and circuit board for testing strong impact-resistant missile-borne dynamic parameter. Background Art

[0002] In extreme environments, the impact signals suffered by the missile-borne dynamic parameter test system have the characteristics of nonlinearity, high oscillation, and variable parameters. As an important device for collecting various dynamic parameters after the missile body flies out, the survivability and reliability of the missile-borne dynamic parameter test system have always been the current research focus. On the market, most missile-borne dynamic parameter test systems have the disadvantages of weak impact resistance and large size. Once applied to a strong impact test environment, they cannot meet the test requirements. Therefore, in view of the harsh working environment of the missile body, the development of a highly reliable missile-borne dynamic parameter test system that can resist strong impact has become the current development trend.

[0003] As an important part of the research on missile weapons and equipment, the missile-borne dynamic parameter test system has a harsh and complex working environment. Every piece of data collected is extremely important for subsequent weapon development and data analysis. In the existing technology, defects that affect data collection often occur due to improper design.

[0004] Through the above analysis, the problems and defects of the prior art are as follows:

[0005] (1) The existing missile-borne dynamic parameter test equipment has low measurement accuracy for weak signals and poor integrity of collected data, which cannot meet the needs of multiple tests. In order to ensure the integrity of the data, the present invention performs pre-sampling after the system is powered on. When the sampled data reaches the set threshold and pulse width requirements, the system enters the formal sampling mode and starts to trigger data collection. In order to prevent the loss of valid data when the system jumps from pre-sampling to formal sampling, trigger mode 1 selects the mean of the last M sampling points in the pre-sampling process and compares it with the set threshold. In addition, the data collected by the system must be manually erased through the measurement and control terminal.

[0006] (2) The prior art has poor efficiency in data collection and cannot provide dual protection for data. The present invention provides a Flash module and an SD card to perform dual backup and storage of data.

[0007] (3) The existing technology has poor effect in real-time visualization of processed data.

[0008] (4) The prior art cannot effectively prevent false triggering and non-triggering in the triggering mode, and has poor safety. The present invention sets a strict dual triggering mode, judges the threshold and pulse width at the same time, and effectively prevents false triggering and non-triggering.

[0009] (5) The existing missile-borne dynamic parameter testing equipment is easily subjected to an impact, which may cause the battery to explode and affect the data transmission of the circuit board.

[0010] (6) The existing technology has poor impact resistance and cannot effectively prevent the failure of the missile-borne dynamic parameter testing system. Summary of the invention

[0011] In order to overcome the problems existing in the related art, the disclosed embodiments of the present invention provide a method, system and circuit board for testing dynamic parameters of strong impact resistant missile loads, and particularly relate to a system for testing dynamic parameters of strong impact resistant missile loads used in extreme environments.

[0012] The technical solution is as follows: The dynamic parameter testing method for strong impact resistance includes the following steps:

[0013] S1, the circuit board enters the pre-sampling mode after power-on. When the sampling data reaches the set threshold and pulse width requirements, the circuit board enters the formal sampling mode and starts to trigger data collection;

[0014] S2, storing the data that meets the threshold and pulse width requirements, reading the stored data through the measurement and control terminal and saving it locally for subsequent data analysis and processing.

[0015] In step S1, the circuit board sets a set of self-add numbers as a ruler, calculates the length L of the header data covered by the ruler, and then pre-samples the data from the 0th to the Lth data to obtain a complete pre-sampled data set.

[0016] In step S1, the circuit board enters the formal sampling mode and starts to trigger data collection. The method of triggering data collection adopts a dual-load triggering method, which includes: dual-threshold triggering and adaptive pulse width matching triggering, and judges by the threshold and pulse width sensed by the integrated sensors in different directions; wherein,

[0017] The dual threshold trigger includes: judging the threshold of the first sensor or the second sensor integrated on the circuit board, the threshold is 200g-400g, where 1g = 9.8m / s 2 , the threshold setting generally meets the requirement that no human triggering will occur; when the upper limit or lower limit of the waveform meets the set threshold, the adaptive pulse width matching trigger is judged;

[0018] Adaptive pulse width matching triggering includes: first setting a benchmark for the ripple, then judging each sampling point, counting each point that exceeds the benchmark, and converting the number of points that exceed the benchmark into time. If the converted time at this time exceeds the set threshold time, it is considered that the pulse width at this time has reached the pulse width at the time of formal triggering, and the load triggering is implemented.

[0019] In one embodiment, when the waveform upper limit meets the set threshold condition, starting to determine the adaptive pulse width matching trigger includes:

[0020] The last M sampling points in the pre-sampling process of any channel are selected to take the average value. The value M is dynamically set according to the test situation. When the average value of any channel of the first sensor or the second sensor is greater than the set threshold, the adaptive pulse width matching trigger is judged.

[0021] When the waveform lower limit meets the set threshold condition, the adaptive pulse width matching trigger is judged to include: when the value of the threshold voltage set by 2×reference voltage-direction I is greater than the average value of the last M sampling points in the pre-sampling process, the judgment is started.

[0022] Another object of the present invention is to provide a circuit board for implementing the strong impact resistance bullet-load dynamic parameter testing method. After the circuit board is powered on, it enters a pre-sampling mode. When the sampled data reaches the set threshold and pulse width requirements, the circuit board uses a dual bullet-load triggering method to trigger the data collection; the dual bullet-load triggering method includes dual threshold triggering and adaptive pulse width matching triggering, and the threshold and pulse width sensed by the first sensor and the second sensor integrated in the circuit board are judged; the relative position relationship between the first sensor and the second sensor is set to collect acceleration signals in different directions; the first sensor and the second sensor send the detected acceleration signals to the signal conditioning module for processing, and the processed data is transmitted to the main control module, the main control module stores the received data in the data storage module, and reads the data through the data interface on the data storage module; the power management module is connected to the external battery assembly through a line.

[0023] In one embodiment, the signal conditioning module converts the collected acceleration signal, filters out high-frequency interference through a second-order Butterworth bandpass filter and a multi-stage resistor-capacitor filter; and uses a rail-to-rail high-speed operational amplifier to suppress signal distortion; the rail-to-rail high-speed operational amplifier is also connected to a voltage regulating module;

[0024] The signal conditioning module transmits the voltage signal converted from the analog signal to the main control module, and the main control module transfers the digital signal stored in its own buffer area to the storage module, and transmits the read digital signal back to the measurement and control terminal through the serial port / card reader;

[0025] The power management module is stably boosted by the DCDC chip, and then converted by the voltage conversion chip to supply power to the operational amplifier, and is stepped down by the LDO to supply the main control module and the data storage module.

[0026] Another object of the present invention is to provide a strong impact-resistant bullet-loaded dynamic parameter testing system equipped with a circuit board, the strong impact-resistant bullet-loaded dynamic parameter testing system comprising: a housing, internal components and a battery component;

[0027] The shell is a cylindrical structure with a closed top and an open bottom, and a first prism and a second prism are provided on the outer wall of the shell, and a data interface for reading data from a data storage module is provided on the outer wall between the first prism and the second prism; a second fixing hole is provided on the first prism, a first fixing hole is provided on the second prism, and a positioning hole is provided on the top end surface of the shell;

[0028] The internal components enter the shell from the bottom of the shell, the first flange is connected to the top end surface of the shell through the positioning hole, and the second flange is fixed to the first prism through the second fixing hole;

[0029] The connecting wire of the battery assembly passes through the wire hole groove and is connected to the circuit board. A mounting mainboard is installed at the lower part of the circuit board. The third fixing hole opened on the mounting mainboard is connected to the second flange through a bolt; the second flange is provided with a fourth fixing hole and a power indicator light interface;

[0030] The circuit board is integrated with a first sensor and a second sensor. The first sensor is mounted on a first flange, and the second sensor is mounted on a second flange. The first sensor and the second sensor are arranged at relative positions.

[0031] In one embodiment, a power supply detection indicator light is provided on the circuit board, a power supply indicator light interface is provided on the outer wall between the first prism and the second prism on the housing, and the power supply detection indicator light is accommodated in the power supply indicator light interface;

[0032] The battery assembly is fixed at the second prism through the first fixing hole to close the bottom of the shell;

[0033] The battery assembly includes: a battery, a battery slot for installing the battery, and a baffle for fixing the battery in the battery slot; the baffle is fixed to both sides of the battery slot with screws.

[0034] In one embodiment, the strong impact resistant bullet-loaded dynamic parameter testing system also includes a measurement and control terminal; the measurement and control terminal includes a display module, a data selection module, a channel setting module, a serial port setting module, a parameter configuration module and a calibration reading function; after the data is stored, the signal transmission between the measurement and control terminal can be established through the serial port / card reader to complete the reading of the data; the data is stored in the form of a specified file in the data folder specified by the program.

[0035] In one embodiment, the measurement and control terminal is used to graphically display the acceleration time curve in real time, and is provided with a mean filter operation component to directly filter the obtained data and display the image.

[0036] Combining all the above technical solutions, the advantages and positive effects of the present invention are as follows:

[0037] First, in view of the technical problems existing in the above-mentioned prior art and the difficulty of solving the problems, the technical solutions to be protected by the present invention and the results and data during the research and development process are closely combined to analyze in detail and deeply how the technical solutions of the present invention solve the technical problems, and some creative technical effects brought about after solving the problems, which are specifically described as follows:

[0038] The present invention provides a missile-borne dynamic parameter testing system that reliably and effectively protects data acquisition, which solves the shortcomings of most missile-borne dynamic parameter testing systems, namely, weak impact resistance and large size. The system can be adapted to missiles of different models to meet testing requirements under different working conditions.

[0039] Second, considering the technical solution as a whole or from the perspective of the product, the technical effects and advantages of the technical solution to be protected by the present invention are described in detail as follows:

[0040] (1) The present invention provides a missile-borne dynamic parameter test system. In order to meet the data testing requirements of a tiny space, the weak signal collected by the sensor is amplified and adjusted by a charge amplifier to improve the measurement accuracy of the system. A second-order Butterworth bandpass filter and a multi-stage resistor-capacitor filter are designed to filter out high-frequency interference; a rail-to-rail high-speed operational amplifier is used to suppress signal distortion; and multiple groups of amplification factors are designed to perform multi-level adjustments to the output voltage. In terms of software, in order to prevent the loss of valid data, the test system is first powered on, and the system will enter the pre-sampling mode. When the missile launch system is running, it will enter the formal sampling mode. The data collected by the system must be manually erased through the measurement and control terminal to ensure the integrity of data collection and meet multiple test requirements.

[0041] (2) In order to ensure the high efficiency of data collection in the present invention, the data storage module is provided with both a Flash module and an SD card module. The Flash chip with non-volatile function is selected to effectively prevent the possibility of data loss due to power supply problems; further, when the dynamic parameter system on board is damaged due to over-impact and the Flash module cannot be used normally, the measurement and control terminal can still read the backup data of the SD card through the card reader, which plays a double protection role for the data.

[0042] (3) The present invention provides a measurement and control terminal for a missile-borne dynamic parameter test system, the measurement and control terminal comprising a display module, a data selection module, a channel setting module, a serial port setting module, a parameter configuration module and a calibration reading function. After the data is stored, a signal transmission can be established between the measurement and control terminal through the serial port / card reader to complete the reading of the data, and the data is stored in the form of a specified file in a data folder specified by the program. At the same time, the acceleration time curve is displayed graphically in real time, and a mean filter operation component is provided to directly filter and display the obtained data. In order to prevent the loss of valid data and ensure the integrity of data acquisition, the data collected by the system must be manually erased through the measurement and control terminal.

[0043] (4) The present invention provides a missile-borne dynamic parameter testing system, which sets a dual trigger module for the trigger mode to accurately prevent false triggering and non-triggering.

[0044] Furthermore, the trigger mode 1: dual threshold triggering, the thresholds of the first sensor and the second sensor are judged. When the upper limit of the waveform meets condition 1 or the lower limit of the waveform meets condition 2, the system starts to judge the trigger mode 2. Including:

[0045] Trigger judgment of the waveform upper limit: select the average of the last M sampling points in the pre-sampling mode (M can be dynamically set according to the test situation). When the average of any one of the two channels of the first sensor or the second sensor is greater than the set threshold, the system starts to judge trigger mode 2.

[0046] Trigger judgment of the waveform lower limit: Trigger mode 2 is judged only when the value of the threshold voltage set by 2×reference voltage-direction I is greater than the average value of M sampling points.

[0047] Furthermore, the second trigger mode: adaptive pulse width matching trigger, in order to avoid the ripple generated by the circuit board itself causing false triggering of the system, first set a benchmark for the ripple, then judge each sampling point, count each point exceeding the benchmark, and convert the number of points exceeding the benchmark into time. When the converted time exceeds the set threshold time, it can be considered that the pulse width at this time has reached the pulse width at the time of formal triggering, and the system is formally triggered.

[0048] (5) The battery slot of the missile-borne dynamic parameter test system described in the present invention is separated from the mounting main board by a second flange to prevent the missile-borne dynamic parameter test system from being subjected to excessive impact and causing the battery to explode and affect the data transmission of the circuit board. In addition, one end of the battery assembly can be disassembled at any time to facilitate battery replacement.

[0049] (6) The missile-borne dynamic parameter test system of the present invention adopts a double-layer nested design. When the missile body is launched and hit, the double-layer nested design can protect the missile-borne dynamic parameter test system, improve its impact resistance, and avoid failure of the missile-borne dynamic parameter test system.

[0050] Third, as auxiliary evidence of the inventiveness of the claims of the present invention, it is also reflected in the following important aspects:

[0051] (1) After the implementation of the technical solution of the present invention, the effectiveness of missile-borne data collection can be effectively improved and the test cost can be greatly reduced.

[0052] (2) The prior art does not yet have a test system with such a dual triggering mode, and the present invention fills the technical gap in data acquisition.

[0053] (3) Due to the harsh working environment of the projectile, in actual tests, in order to ensure the success rate of the test, the projectile-borne dynamic parameter test system is generally a disposable product. If the dynamic parameter information of the projectile is not collected during the test, and the projectile-borne dynamic parameter test system is damaged, this will not only cause a loss of manpower and financial resources, but also a series of extremely important weapon development parameters. The present invention solves the pain points in data collection of the projectile-borne dynamic parameter test system, and has significant economic benefits and sustainable use benefits. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] The accompanying drawings herein are incorporated in and constitute a part of the specification, illustrate embodiments consistent with the present disclosure, and together with the description, serve to explain the principles of the present disclosure;

[0055] Figure 1 It is a flow chart of a method for testing dynamic parameters of strong impact resistance bullet load provided by an embodiment of the present invention;

[0056] Figure 2 It is a schematic diagram of the structure of the circuit board in the present invention provided by an embodiment of the present invention;

[0057] Figure 3 is a circuit diagram of a signal conditioning module provided by an embodiment of the present invention;

[0058] Figure 4 is a circuit diagram of a data storage module provided by an embodiment of the present invention;

[0059] Figure 5 is a circuit diagram of a power management module provided by an embodiment of the present invention;

[0060] Figure 6 It is a flow chart of a method for testing dynamic parameters of strong impact resistance bullet load provided by an embodiment of the present invention;

[0061] Figure 7Schematic diagram of the hardware structure of the dynamic parameter testing system for strong impact resistance provided by an embodiment of the present invention;

[0062] Figure 8 This is a schematic diagram of the power indicator light interface connection provided by an embodiment of the present invention;

[0063] Fig. 9 This is a schematic diagram of the connection of the mainboard provided by an embodiment of the present invention;

[0064] Fig.10 is an acceleration curve under a practical test provided by an embodiment of the present invention;

[0065] In the figure: 1. Shell; 2. Data interface; 3. First prism; 4. Second prism; 5. First flange; 6. First sensor; 7. Circuit board; 8. Install motherboard; 9. Wire hole slot; 10. Second sensor; 11. Second flange; 12. Battery slot; 13. Baffle; 14. Battery assembly; 15. Positioning hole; 16. First fixing hole; 17. Second fixing hole; 18. Third fixing hole; 19. Fourth fixing hole; 20. Power indicator light interface; 21. Measurement and control terminal. DETAILED DESCRIPTION

[0066] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present invention, so the present invention is not limited by the specific implementation disclosed below.

[0067] 1. Explanation of the embodiment:

[0068] like Figure 1 As shown, an embodiment of the present invention provides a method for testing dynamic parameters of strong impact resistance missile load, comprising the following steps:

[0069] S1, the circuit board 7 enters the pre-sampling mode after being powered on. When the sampled data reaches the set threshold and pulse width requirements, the circuit board 7 enters the formal sampling mode and starts to trigger data collection;

[0070] S2, the data that reaches the threshold value and pulse width requirement is stored, and the measurement and control terminal 21 reads the stored data and saves it locally for subsequent analysis and processing of the data.

[0071] Further, in step S1, the circuit board 7 sets a set of self-add numbers as a ruler, calculates the length L of the header data covered by the ruler, and then moves the L pre-sampled data starting from the 0th data to the end of the pre-sampled data, thereby obtaining a complete pre-sampled data set.

[0072] Further, in step S1, the circuit board 7 enters the formal sampling mode and starts to trigger data collection. The method of triggering data collection adopts a dual-load triggering mode, and the dual-load triggering mode includes: triggering mode 1, dual threshold triggering; triggering mode 2, adaptive pulse width matching triggering;

[0073] By integrating the thresholds and pulse widths sensed by sensors in different directions, trigger mode 1 and trigger mode 2 are obtained, including:

[0074] Trigger mode 1: Dual threshold trigger, judging the threshold of the first sensor 6 or the second sensor 10 integrated on the circuit board 7, the threshold is 200g-400g, where 1g = 9.8m / s 2 , the threshold setting of the upper limit of the waveform generally meets the requirement that no human triggering will occur. When the upper limit of the waveform meets condition 1 or the lower limit of the waveform meets condition 2, the trigger mode 2 is judged;

[0075] Trigger mode 2: Adaptive pulse width matching trigger. First, set a benchmark for the ripple, then judge each sampling point, count each point that exceeds the benchmark, and convert the number of points that exceed the benchmark into time. If the converted time at this time exceeds the set threshold time, it is considered that the pulse width at this time has reached the pulse width at the time of formal triggering, and the load triggering is implemented.

[0076] Further, the upper limit of the waveform satisfies condition 1 to determine the trigger mode 2, including: selecting the last M sampling points in the pre-sampling process of any channel to take the average, M is dynamically set according to the test situation, and when the average of any one of the two channels of the first sensor 6 or the second sensor 10 is greater than the set threshold, the trigger mode 2 is judged;

[0077] When the waveform lower limit meets condition 2, the trigger mode 2 is judged to include: when the value of the threshold voltage set by 2×reference voltage-direction I is greater than the average value of the last M sampling points in the pre-sampling process, the trigger mode 2 is judged to start.

[0078] Example 1

[0079] like Figure 2 As shown, it is a block diagram of the structure of the circuit board in the embodiment of the present invention. After the circuit board 7 is powered on, it enters the pre-sampling mode. When the sampled data reaches the set threshold and pulse width requirements, the circuit board 7 uses a dual-load triggering method to trigger the data collection; the dual-load triggering method includes a dual-threshold triggering and an adaptive pulse width matching triggering, and the threshold and pulse width sensed by the first sensor 6 and the second sensor 10 integrated in the circuit board 7 are judged; the relative position relationship between the first sensor 6 and the second sensor 10 is set to collect acceleration signals in different directions;

[0080] Exemplarily, the circuit board 7 includes: a sensor module, a signal conditioning module, a main control module, a data storage module, a data interface 2 and a power management module; the sensor module includes a first sensor 6 and a second sensor 10;

[0081] The signal conditioning module establishes a signal connection with the first sensor 6 and the second sensor 10. In the embodiment of the present invention, the first sensor 6 and the second sensor 10 are piezoelectric sensors; the piezoelectric sensor sends the detected acceleration signal to the signal conditioning module for processing, and the processed data is transmitted to the main control module. The main control module stores the received data in the data storage module, and the tester reads the data through the data interface 2 on the data storage module; the power management module is connected to the battery assembly 14 through a line.

[0082] Example 2

[0083] In the embodiment of the present invention, Figure 3 As shown, the signal conditioning module converts the collected acceleration signal, and under the premise of miniaturization design, a second-order Butterworth bandpass filter and a multi-stage resistor-capacitor filter are designed to filter out high-frequency interference; a rail-to-rail high-speed operational amplifier is used to suppress signal distortion; and multiple groups of amplification factors are designed to facilitate debugging of the output acceleration signal strength. In order to ensure that the acceleration data collected by the high-range sensor is still between 0-3.3V when converted into voltage, a special voltage regulation module is set after the rail-to-rail high-speed operational amplifier. In order to ensure the flexibility of voltage regulation, the appropriate 3.3V or 5V supply voltage can be selected through a 0Ω resistor, and then the resistance value of the voltage regulation module can be reasonably adjusted according to the range.

[0084] Furthermore, the signal conditioning module transmits the voltage signal converted from the analog signal to the main control module, the main control module transfers the digital signal stored in its own cache area to the storage module, and transmits the read digital signal back to the measurement and control terminal 21 through the serial port / card reader; the selected storage chip is W25Q256 model Flash, which has a large storage capacity and non-volatile function, and can ensure the data integrity and storage capacity of the recorder; the SD card is used as a backup memory to improve the efficiency of data recovery while providing double protection for the data.

[0085] in, Figure 4 This is the circuit principle of the data storage module provided by the embodiment of the present invention.

[0086] like Figure 5As shown in the power management module provided by the embodiment of the present invention, the anti-strong impact missile-loaded dynamic parameter test system specially designs an anti-reverse current protection circuit in the power supply part. Aiming at the problem of small internal space of the missile body and inconvenient assembly, under the premise of ensuring miniaturization design, the chips are mainly patch-type and micro-sized. The external power supply voltage is 3.7V, which can be stably boosted to +5V by the DCDC chip, and then converted to -5V by the voltage conversion chip to ensure the normal power supply of the operational amplifier, and then the LDO is used to reduce the voltage from +5V to +3.3V to supply the main control module and the data storage module.

[0087] Example 3

[0088] In the embodiment of the present invention, the dynamic parameter test system for resisting strong impact missiles can be displayed in real time through the measurement and control terminal 21 after collecting data. The measurement and control terminal 21 of the dynamic parameter test system for resisting strong impact missiles includes a display module, a data selection module, a channel setting module, a serial port setting module, a parameter configuration module and a calibration reading function; wherein, the data selection module can select and display the test data saved at different times; the channel setting module can display channel A, channel B and the curve after mean filtering separately or simultaneously; the parameter configuration module can change the reference voltage, unit acceleration voltage and sampling interval according to the test requirements. In order to achieve the accuracy of the system triggering method, the threshold value when the system is triggered can be changed through the measurement and control terminal 21 without changing the hardware; in order to prevent the loss of valid data and ensure the integrity of data collection, the data collected by the system must be manually erased through the measurement and control terminal 21.

[0089] Furthermore, the dynamic parameter test system for resisting strong impact missile load is designed with a dual trigger mode for the sensor module. To ensure the integrity of the collected data, a set of self-add numbers is set in the program as a scale during the jump from pre-collection to formal collection. The length L of the header data covered is calculated by the scale, and then the L data starting from the 0th data of the pre-sampled data are moved to the end of the pre-sampled data, thereby obtaining a complete pre-sampled data set to avoid data loss. Based on this, the implementation form of trigger mode 1 is: dual threshold triggering, judging the threshold of the first sensor 6 or the second sensor 10. When the upper limit of the waveform meets condition 1 or the lower limit of the waveform meets condition 2, the system will start to judge trigger mode 2: Condition 1. Trigger judgment of the upper limit of the waveform: select the last M sampling points in the pre-sampling process of any channel to take the average (M can be dynamically set according to the test situation). When the average of any channel of the first sensor 6 or the second sensor 10 is greater than the set threshold, the system starts to judge trigger mode 2. Condition 2. For reverse waveform trigger judgment: When the value of the threshold voltage set by 2×reference voltage-direction I is greater than the average of the last M sampling points in the pre-sampling process, the trigger mode 2 is judged. The implementation form of trigger mode 2 is: adaptive pulse width matching trigger. In order to avoid the ripple generated by the circuit board 7 itself causing false triggering of the system, a reference is set for the ripple first, and then each sampling point is judged, and each point exceeding the reference is counted, and the number of points exceeding the reference is converted into time. Sampling is performed every 0.0001s. Assuming that 2000 points exceed the reference line, the converted time is 200ms. If the converted time exceeds the set threshold time at this time, it can be considered that the pulse width at this time has reached the pulse width at the time of formal triggering. At this time, the system is formally triggered, and the missile-borne dynamic parameter test system starts to collect data.

[0090] like Figure 6 The anti-strong-impact missile-borne dynamic parameter test method provided in the embodiment of the present invention includes two parts: data storage and data reading. After the missile-borne dynamic parameter test system is powered on, if no information from the measurement and control terminal 21 is received within a certain period of time, it enters the data storage mode. The system will enter the pre-sampling mode. When the sampled data reaches the set threshold and pulse width requirements, the system will enter the formal sampling mode. The collected data will be first stored in a certain cache area of ​​the main control module. After the data collection is completed, the data will be written to the data storage module to complete the storage and the test system will be powered off. After the missile-borne dynamic parameter test system receives the data reading command from the measurement and control terminal 21 after powering on, it enters the data reading mode. The main control module of the test system reads the data from the data storage module, communicates with the measurement and control terminal 21 through the serial port / card reader, and adopts the continuous reading mode to read all the data in the data storage module to the measurement and control terminal 21. The measurement and control terminal 21 saves the read data locally to facilitate subsequent data analysis and processing.

[0091] Example 4

[0092] like Figure 7-Figure 9 As shown, the strong impact bullet-load resistance dynamic parameter testing system provided in the embodiment of the present invention is cylindrical in shape as a whole and includes: a shell 1, internal components and a battery component 14.

[0093] The housing 1 is a cylindrical structure with a closed top and an open bottom, and a first prism 3 and a second prism 4 are provided on its outer wall, and a data interface 2 for a tester to read data from a data storage module is provided on the outer wall between the first prism 3 and the second prism 4;

[0094] A second fixing hole 17 is provided on the first prism 3 , a first fixing hole 16 is provided on the second prism 4 , and a positioning hole 15 is provided on the top end surface of the housing 1 .

[0095] The internal components include a first flange 5, a first sensor 6, a circuit board 7, a mounting main board 8; a wire hole slot 9, a second sensor 10, a second flange 11, and a fourth fixing hole 19;

[0096] The internal components enter the shell 1 from the bottom of the shell 1, the first flange 5 is connected to the top end surface of the shell 1 through the positioning hole 15, and the second flange 11 is fixed to the first prism 3 through the second fixing hole 17;

[0097] The connecting wire of the battery assembly 14 passes through the wire hole groove 9 and is connected to the circuit board 7. A mounting main board 8 is installed at the lower part of the circuit board 7. The third fixing hole 18 opened on the mounting main board 8 is connected to the second flange 11 through bolts; the second flange 11 is provided with a fourth fixing hole 19 and a power indicator light interface 20 for fixing the internal components as a whole and connected to the housing 1;

[0098] The circuit board 7 integrates a first sensor 6 and a second sensor 10. The first sensor 6 is mounted on the first flange 5, and the second sensor 10 is mounted on the second flange 11. The first sensor 6 and the second sensor 10 are arranged at relative positions to collect acceleration signals in different directions.

[0099] The circuit board 7 is provided with a power supply detection indicator light, and the power supply indicator light interface 20 is provided on the outer wall between the first prism 3 and the second prism 4 of the housing. The power supply detection indicator light is accommodated in the power supply indicator light interface 20 .

[0100] In the embodiment of the present invention, the battery assembly 14 is fixed to the second prism 4 through the first fixing hole 16 to close the bottom of the housing 1 .

[0101] The battery assembly 14 includes: a battery, a battery slot 12 for installing the battery, and a baffle 13 for fixing the battery in the battery slot 12; the baffle 13 is fixed to both sides of the battery slot 12 with screws to prevent the battery from loosening and falling off.

[0102] In the embodiment of the present invention, the internal components are integrally fixedly installed in the housing 1 , and the battery assembly 14 is installed at the bottom of the housing 1 .

[0103] Example 5

[0104] Figure 2 The embodiment of the present invention provides a dynamic parameter test system for resisting strong impact missiles, including the contents mentioned in Embodiments 1 to 4, and also includes a measurement and control terminal 21; namely:

[0105] It includes a shell 1, internal components and a battery component 14.

[0106] The internal components include a first flange 5, a first sensor 6, a circuit board 7, a mounting main board 8; a wire hole slot 9, a second sensor 10, a second flange 11, and a fourth fixing hole 19;

[0107] The circuit board 7 includes a sensor module, a signal conditioning module, a main control module, a data storage module, a data interface 2 and a power management module; the sensor module includes a first sensor 6 and a second sensor 10;

[0108] The sensor module is rigidly connected to the internal components and establishes a signal connection with the main control module through the signal conditioning module.

[0109] The sensor module receives the acceleration signal and transmits it to the signal conditioning module to convert it into a voltage signal. After being received by the main control module, it is transmitted to the Flash module and SD card of the data storage module for data storage and backup. After the test, the stored data can be transmitted to the measurement and control terminal 21 through the data acquisition module (serial port / card reader);

[0110] The housing 1, internal components and battery assembly 14 form a strong impact protection module, which adopts a two-layer nested design to greatly improve the strong impact resistance of the missile-borne dynamic parameter test system;

[0111] Data interfaces 2 and power indicator lights are provided on both sides of the housing 1, which facilitate test personnel to read data and replace batteries in time; the missile-borne dynamic parameter testing system has the function of multi-channel (≥2 channels) synchronous acquisition of dynamic parameters.

[0112] Furthermore, the data storage module is provided with a Flash module and an SD card module at the same time. When the circuit board 7 of the dynamic parameter system resistant to strong impact is damaged due to over-impact and the measurement and control terminal 21 cannot read the data in the Flash module through the serial port, the backup data of the SD card can still be read through the card reader, which not only plays a dual protection role for the data but also improves the efficiency of data recovery.

[0113] Furthermore, the internal components can be independently disassembled and assembled as a whole. The circuit board 7 is fixedly mounted on the mounting main board 8, and is isolated from the battery assembly 14 by the first flange 5, so as to reduce the impact of battery explosion on data transmission caused by over-impact on the test system; the two sides of the mounting main board 8 are respectively fixedly connected to the first flange 5 and the second flange 11; the second flange 11 is provided with a wire hole 9, and the data line on the circuit board 7 and the line of the power supply detection indicator light are installed between the first prism 3 and the second prism 4 through the wire slot hole 9, so that the layout of the lines is more concise and the lines are not easily confused;

[0114] Furthermore, the measurement and control terminal 21 includes a display module, a data selection module, a channel setting module, a serial port setting module, a parameter configuration module and a calibration reading function. After the data is stored, the signal transmission between the measurement and control terminal 21 can be established through the serial port / card reader to complete the reading of the data. The measurement and control terminal 21 can store the data in the form of a specified file in a data folder specified by the program. Furthermore, the measurement and control terminal 21 can graphically display the acceleration time curve in real time, and is provided with a mean filter operation component to directly filter the obtained data and display the image.

[0115] Furthermore, in order to reduce power consumption and meet data collection requirements in various harsh environments, the strong impact resistant missile-loaded dynamic parameter test system adopts two triggering methods to accurately prevent false triggering. The dual triggering methods include:

[0116] First, dual threshold triggering, by setting different thresholds for the first sensor 6 and the second sensor 10 in two directions, when the upper limit or lower limit of the waveform reaches the set threshold, the system starts to determine the trigger mode two adaptive pulse width matching trigger.

[0117] Secondly, adaptive pulse width matching trigger. When the ripple of the circuit board 7 is too large for some reason, increasing the probability of false triggering, the first sensor 6 and the second sensor 10 can determine whether the system is triggered by the pulse width, and count each point that exceeds the ripple reference. When the counted points exceed the converted threshold, the system will be officially triggered.

[0118] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0119] Since the information interaction, execution process, etc. between the above-mentioned devices / units are based on the same concept as the method embodiment of the present invention, their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0120] Those skilled in the art can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated in one processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of the present invention. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment.

[0121] 2. Application examples:

[0122] Application Examples

[0123] The embodiment of the present invention provides a method for testing dynamic parameters of missile-borne weapons that are resistant to strong impacts. The method can be applied to data collection of missile-borne weapon parameters, effectively avoiding false triggering and non-triggering, and improving the efficiency of data collection.

[0124] An embodiment of the present invention provides a circuit board 7 for dynamic parameter testing resistant to strong impact bullet loads. The circuit board 7 includes a signal conditioning module, a main control module, a data storage module, a data interface 2 and a power management module. The circuit board 7 realizes the function of data acquisition while meeting miniaturization conditions.

[0125] An embodiment of the present invention further provides a computer device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps in any of the above-mentioned method embodiments when executing the computer program.

[0126] An embodiment of the present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0127] An embodiment of the present invention further provides an information data processing terminal, which, when executed on an electronic device, provides a user input interface to implement the steps in the above method embodiments. The information data processing terminal is not limited to mobile phones, computers, and switches.

[0128] An embodiment of the present invention further provides a server, which is used to provide a user input interface to implement the steps in the above method embodiments when executed on an electronic device.

[0129] An embodiment of the present invention provides a computer program product. When the computer program product runs on an electronic device, the electronic device can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0130] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device that can carry the computer program code to the camera / terminal device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a disk or an optical disk.

[0131] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0132] III. Evidence of the relevant effects of the embodiments:

[0133] like Fig.10 As shown, the acceleration curve measured by the embodiment of the present invention under the dynamic parameter test of the missile using compressed air as the ejection power source proves that the software, hardware and method of the test system can be implemented. During the test, the device is installed in the cartridge, and the high-pressure nitrogen is used to drive the projectile to move, thereby recording the acceleration signal of the test projectile flying out of the cartridge.

[0134] Compared with the prior art, the present invention adopts a dual triggering method and two data storage schemes to improve the data acquisition rate. The test preparation is simple and convenient. The circuit structure, dual triggering method and protection structure of the test system ensure that the collected data are accurate and effective. The test results are intuitive and visible. The measured curves collected by the test system are clearer, which lays a good foundation for subsequent data analysis and can be promoted for use.

[0135] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any modifications, equivalent substitutions and improvements made by any technician familiar with the technical field within the technical scope disclosed by the present invention and within the spirit and principles of the present invention should be covered within the protection scope of the present invention.

Claims

1. A method for testing dynamic parameters of strong impact loads. It is characterized in that The method comprises the following steps: S1, the circuit board (7) enters a pre-sampling mode after being powered on, and when the sampled data reaches the set threshold value and pulse width requirements, the circuit board (7) enters a formal sampling mode, and uses a dual-load triggering method to trigger the data collection; the dual-load triggering method includes: dual-threshold triggering and adaptive pulse width matching triggering, which is judged by integrating the threshold value and pulse width sensed by sensors in different directions. When the system reaches the triggering requirement, it enters the formal sampling mode, and the collected data is first stored in a certain cache area of ​​the main control module. After the data collection is completed, the data is written to the data storage module, and the test system is powered off after the storage is completed; S2, storing the data that meets the threshold and pulse width requirements, reading the stored data through the measurement and control terminal (21) and saving it locally for subsequent data analysis; after the missile-borne dynamic parameter test system receives a data reading command from the measurement and control terminal (21) after power-on, it enters a data reading mode, the main control module of the test system reads the data from the data storage module, communicates with the measurement and control terminal (21) through the serial port / card reader, adopts a continuous reading mode to read all the data in the data storage module into the measurement and control terminal (21), and the measurement and control terminal (21) saves the read data locally for data analysis and processing; In step S1, the dual threshold triggering includes: judging the threshold of the first sensor (6) or the second sensor (10) integrated in the circuit board (7), and starting to judge the adaptive pulse width matching trigger when the upper limit of the waveform or the lower limit of the waveform meets the set threshold condition; Adaptive pulse width matching triggering includes: first setting a benchmark for the ripple, then judging each sampling point, counting each point that exceeds the benchmark, and converting the number of points that exceed the benchmark into time. If the converted time at this time exceeds the set threshold time, it is considered that the pulse width at this time has reached the pulse width at the time of formal triggering, and the load triggering is implemented.

2. According to the method for testing dynamic parameters of strong impact load resistance in claim 1, It is characterized in that In step S1, the circuit board (7) sets a set of self-add numbers as a ruler, calculates the length L of the data covering the header by using the ruler, and then pre-samples from the 0th data to the Lth data, thereby obtaining a complete pre-sampled data set.

3. According to the method for testing dynamic parameters of strong impact load resistance in claim 1, It is characterized in that When the upper limit of the waveform meets the set threshold condition, starting to judge the adaptive pulse width matching trigger includes: selecting the last M sampling points in the pre-sampling process of any channel to take the average value, and when the average value of any channel of the first sensor (6) or the second sensor (10) is greater than the set threshold value, starting to judge the adaptive pulse width matching trigger; When the lower limit of the waveform meets the set threshold condition, the adaptive pulse width matching trigger is judged to include: when the value of the threshold voltage set by 2×reference voltage-direction I is greater than the average value of the last M sampling points in the pre-sampling process, the judgment is started.

4. A circuit board implementing the method for testing dynamic parameters of strong impact resistance according to any one of claims 1 to 3, It is characterized in that After the circuit board is powered on, it enters a pre-sampling mode. When the sampled data reaches the set threshold value and pulse width requirements, the circuit board (7) triggers the data collection using a dual-load triggering method. The dual-load triggering method includes a dual-threshold triggering method and an adaptive pulse width matching triggering method. The judgment is made through the threshold value and pulse width sensed by the first sensor (6) and the second sensor (10) integrated in the circuit board (7). The first sensor (6) and the second sensor (10) are arranged relative to each other and are used to collect acceleration signals in different directions. The first sensor (6) and the second sensor (10) send the detected acceleration signals to the signal conditioning module for processing, and transmit the processed data to the main control module. The main control module stores the received data in the data storage module and reads the data through the data interface (2) on the data storage module. The power management module is connected to an external battery assembly (14) via a line.

5. The circuit board according to claim 4, It is characterized in that The signal conditioning module converts the collected acceleration signal, filters out high-frequency interference through a second-order Butterworth bandpass filter and a multi-stage resistor-capacitor filter; and uses a rail-to-rail high-speed operational amplifier to suppress signal distortion; the rail-to-rail high-speed operational amplifier is also connected to a voltage regulating module; The signal conditioning module transmits the voltage signal converted from the analog signal to the main control module, and the main control module transfers the digital signal stored in its own buffer area to the storage module, and transmits the read digital signal back to the measurement and control terminal (21) through the serial port / card reader; The power management module is stably boosted by the DCDC chip, and then converted by the voltage conversion chip to supply power to the operational amplifier, and is stepped down by the LDO to supply the main control module and the data storage module.

6. A strong impact bullet-load dynamic parameter testing system equipped with the circuit board of claim 4, It is characterized in that The high-impact ballistic dynamic parameter testing system comprises: a housing (1), internal components and a battery component (14); The shell (1) is a cylindrical structure with a closed top and an open bottom. A first prism (3) and a second prism (4) are provided on the outer wall of the shell (1). A data interface (2) for a data storage module to read data is provided on the outer wall between the first prism (3) and the second prism (4). A second fixing hole (17) is provided on the first prism (3), a first fixing hole (16) is provided on the second prism (4), and a positioning hole (15) is provided on the top end face of the shell (1). The internal component enters the shell (1) from the bottom of the shell (1), the first flange (5) is connected to the top end surface of the shell (1) through the positioning hole (15), and the second flange (11) is fixed to the first prism (3) through the second fixing hole (17); The connecting wire of the battery assembly (14) passes through the wire hole groove (9) and is connected to the circuit board (7); a mounting main board (8) is installed at the lower part of the circuit board (7); a third fixing hole (18) provided on the mounting main board (8) is connected to the second flange (11) via a bolt; a fourth fixing hole (19) and a power indicator light interface (20) are provided on the second flange (11); The circuit board (7) is integrated with a first sensor (6) and a second sensor (10); the first sensor (6) is mounted on the first flange (5), and the second sensor (10) is mounted on the second flange (11); the first sensor (6) and the second sensor (10) are arranged opposite to each other.

7. The strong impact resistant bullet-load dynamic parameter testing system according to claim 6, It is characterized in that A power supply quantity detection indicator light is provided on the circuit board (7); a power supply indicator light interface (20) is provided on the outer wall between the first prism (3) and the second prism (4); the power supply quantity detection indicator light is accommodated in the power supply indicator light interface (20); the battery assembly (14) is fixed to the second prism (4) through the first fixing hole (16), and the bottom of the housing (1) is closed; The battery assembly (14) comprises: a battery, a battery slot (12) for mounting the battery, and a baffle (13) for fixing the battery in the battery slot (12); the baffle (13) is fixed to both sides of the battery slot (12) by screws.

8. The strong impact ballistic dynamic parameter testing system according to claim 6, It is characterized in that The strong impact resistant missile-loaded dynamic parameter test system further comprises a measurement and control terminal (21); the measurement and control terminal (21) comprises a display module, a data selection module, a channel setting module, a serial port setting module, a parameter configuration module and a calibration reading function; after the data is stored, signal transmission can be established between the measurement and control terminal (21) through the serial port / card reader to complete the reading of the data; and the data is stored in the form of a specified file in a data folder specified by the program.

9. The strong impact ballistic dynamic parameter testing system according to claim 8, It is characterized in that The measurement and control terminal (21) is used for graphically displaying the acceleration time curve in real time, and is provided with a mean filter operation component for directly filtering the obtained data and displaying an image.

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