Grating temperature rise coefficient test method, device, equipment and storage medium

Abstract

The application discloses a grating temperature rise coefficient testing method, device, equipment and storage medium, the method is applied to the grating testing equipment, the grating testing equipment includes temperature measuring device, water cooling system, power meter, electrical module and optical module, the method includes: when measuring the grating to be measured by temperature measuring device, the electrical module is controlled to power supply for the optical module, and the target light is output to the grating to be measured through the internal light path of the optical module;The temperature measuring device is controlled to measure the temperature of the light passing grating to be measured, and the test temperature of the temperature measuring device, the output power of the target light and the cooling liquid parameters of the water cooling system are acquired;The temperature rise coefficient of the grating to be measured is determined according to the test temperature, the output power and the cooling liquid parameters.The temperature rise coefficient of the grating to be measured is determined by considering the cooling liquid parameters when measuring the temperature rise coefficient, and the accuracy of the temperature rise coefficient test is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of fiber lasers, and particularly relates to a grating temperature rise coefficient testing method, device, equipment and storage medium. BACKGROUND

[0002] At present, for the test of the grating temperature rise coefficient, the temperature of the light passing grating is measured, and the temperature rise coefficient of the grating is determined according to the measured temperature. However, the grating test equipment is generally provided with a cooling device, and the cooling conditions are generally different between different cooling devices, which cannot be completely the same. The test results of the same grating on different equipment are obviously different due to the influence of the cooling parameters, so that the temperature rise coefficients measured by different equipment cannot be compared horizontally, and do not have reference value.

[0003] The above content is only used to assist in understanding the technical solutions of the present application, and does not mean that the above content is prior art. SUMMARY

[0004] The main purpose of the present application is to provide a grating temperature rise coefficient testing method, device, equipment and storage medium, which aims to solve the technical problem of low test accuracy of the grating temperature rise coefficient in the prior art.

[0005] In order to achieve the above purpose, the present application provides a grating temperature rise coefficient testing method, which is applied to a grating test equipment, the grating test equipment comprises a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module, and the method comprises the following steps:

[0006] When measuring the to-be-tested grating by the temperature measuring device, the electrical module is controlled to supply power to the optical module, and the optical module outputs target light to the to-be-tested grating through the internal light path of the optical module;

[0007] The temperature measuring device is controlled to measure the temperature of the light passing to-be-tested grating, and the test temperature of the temperature measuring device, the output power of the target light and the cooling liquid parameters of the water cooling system are obtained;

[0008] The temperature rise coefficient of the to-be-tested grating is determined according to the test temperature, the output power and the cooling liquid parameters.

[0009] Optionally, the optical module comprises a plurality of pump sources, a first light path and a second light path.

[0010] The step of controlling the electrical module to supply power to the optical module and outputting target light to the to-be-tested grating through the internal light path of the optical module when measuring the to-be-tested grating by the temperature measuring device comprises:

[0011] When the temperature measuring device is calibrated by temperature, a target test mode is determined.

[0012] When the target test mode is a laser test mode, controlling the electrical module to supply power to the pump source corresponding to the first optical path;

[0013] Outputting laser light to the grating to be measured through the first optical path; and

[0014] When the target test mode is a pump light test mode, controlling the electrical module to supply power to a pump source corresponding to the second optical path;

[0015] The pump light is output to the grating to be measured through the second optical path.

[0016] Optionally, the temperature measuring device includes an infrared camera with an adjustable temperature measuring angle;

[0017] When the temperature measuring device passes the temperature calibration, before determining the target test mode, the method further includes:

[0018] When the current temperature measurement angle of the infrared camera meets the preset temperature measurement conditions, a plurality of calibration test temperatures are obtained by the temperature measurement device, and a calibration average temperature is determined according to the plurality of calibration test temperatures;

[0019] Determining whether the temperature measuring device is abnormal based on the calibration average temperature and the reference average temperature;

[0020] If not, determining whether the temperature measuring device meets the repeatability index;

[0021] If so, it is determined that the temperature measuring device has passed the temperature calibration.

[0022] Optionally, judging whether the temperature measuring device is abnormal based on the calibration average temperature and the reference average temperature includes:

[0023] determining a calibration temperature difference between the calibration average temperature and a reference average temperature;

[0024] determining a temperature compensation coefficient according to the calibration temperature difference, and adjusting the calibration average temperature according to the temperature compensation coefficient;

[0025] Whether the temperature measuring device is abnormal is determined based on the adjusted calibration average temperature and the reference average temperature.

[0026] Optionally, determining whether the temperature measuring device meets a repeatability index includes:

[0027] Controlling the temperature measuring device to repeatedly measure the temperature of a plurality of gratings with different parameters, and obtaining the repeated test temperature of each grating;

[0028] According to the repeated test temperature corresponding to the grating of different parameters, it is judged whether the temperature measuring device meets the repeated reproducibility index.

[0029] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0030] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0031] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0032] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0033] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0034] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0035] Optionally, the grating test device is provided with a height standard block, the height standard block is the same height as the to-be-tested grating, and the size of the height standard block is greater than the size of the to-be-tested grating.

[0036] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0037] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0038] Optionally, before the infrared camera completes grating focusing, the infrared camera obtains a grating test temperature of a target grating and an actual temperature of the target grating.

[0039] In addition, to achieve the above-mentioned purpose, the application further provides a grating temperature rise coefficient testing device, which is arranged on a grating test device, and the grating test device comprises a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module.

[0040] The control module is used for controlling the electrical module to supply power to the optical module and outputting target light to the to-be-tested grating through the internal light path of the optical module when the to-be-tested grating is measured by the temperature measuring device.

[0041] The acquisition module is configured to control the temperature measuring device to measure the temperature of the light passing through the to-be-tested grating, and to acquire a test temperature of the temperature measuring device, an output power of the target light, and a cooling liquid parameter of the water cooling system.

[0042] The determination module is configured to determine the temperature rise coefficient of the to-be-tested grating according to the test temperature, the output power, and the cooling liquid parameter.

[0043] In addition, to achieve the above object, the present application further provides a grating temperature rise coefficient testing device, which comprises a memory, a processor, and a grating temperature rise coefficient testing program stored in the memory and executable on the processor, and the grating temperature rise coefficient testing program is configured to implement the steps of the grating temperature rise coefficient testing method as described above.

[0044] In addition, to achieve the above object, the present application further provides a storage medium, which stores a grating temperature rise coefficient testing program, and the grating temperature rise coefficient testing program implements the steps of the grating temperature rise coefficient testing method as described above when executed by a processor.

[0045] The present application provides a grating temperature rise coefficient testing method applied to a grating testing device, the grating testing device comprising a temperature measuring device, a water cooling system, a power meter, an electrical module, and an optical module, and the method comprises the following steps: when measuring a to-be-tested grating by the temperature measuring device, the electrical module is controlled to supply power to the optical module, and target light is output to the to-be-tested grating through an internal light path of the optical module; the temperature measuring device is controlled to measure the temperature of the light passing through the to-be-tested grating, and a test temperature of the temperature measuring device, an output power of the target light, and a cooling liquid parameter of the water cooling system are acquired; and the temperature rise coefficient of the to-be-tested grating is determined according to the test temperature, the output power, and the cooling liquid parameter. In the present application, the cooling liquid parameter is considered when measuring the temperature rise coefficient to determine the temperature rise coefficient of the to-be-tested grating, thereby improving the accuracy of the temperature rise coefficient testing. BRIEF DESCRIPTION OF DRAWINGS

[0046] Figure 1 is a grating temperature rise coefficient testing device of a hardware running environment related to an embodiment scheme of the present application, and a structural schematic diagram thereof;

[0047] Figure 2 is a flowchart of a first embodiment of the grating temperature rise coefficient testing method of the present application;

[0048] Figure 3 is a structural schematic diagram of a grating testing device in an embodiment of the grating temperature rise coefficient testing method of the present application;

[0049] Figure 4 is a structural schematic diagram of an optical mode in an embodiment of the grating temperature rise coefficient testing method of the present application;

[0050] Figure 5 Schematic diagram of controlling the output of the electrical module in an embodiment of a method for testing the temperature rise coefficient of a grating according to the present invention;

[0051] Figure 6 This is a flow chart of a second embodiment of a method for testing grating temperature rise coefficient according to the present invention;

[0052] Figure 7 This is a flow chart of a third embodiment of a method for testing a grating temperature rise coefficient according to the present invention;

[0053] Figure 8 This is a structural diagram of the infrared camera angle adjustment in an embodiment of the grating temperature rise coefficient testing method of the present invention;

[0054] Figure 9 This is a structural block diagram of the first embodiment of the grating temperature rise coefficient testing device of the present invention.

[0055] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0056] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0057] Reference Figure 1 , Figure 1 This is a schematic diagram of the structure of a grating temperature rise coefficient testing device in the hardware operating environment involved in an embodiment of the present invention.

[0058] like Figure 1 As shown, the grating temperature rise coefficient test device may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the user interface 1003 may optionally include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (Wireless-Fidelity, WI-FI) interface). The memory 1005 may be a high-speed random access memory (Random Access Memory, RAM) or a stable non-volatile memory (Non-Volatile Memory, NVM), such as a disk storage. The memory 1005 may optionally be a storage device independent of the aforementioned processor 1001.

[0059] Those skilled in the art can understand that, Figure 1 The structure shown in the figure does not constitute a limitation on the grating temperature rise coefficient test device, and can include more or fewer components than the figure, or combine certain components, or different component arrangements.

[0060] As Figure 1 As shown, the memory 1005 as a storage medium can include an operating system, a network communication module, a user interface module, and a grating temperature rise coefficient test program.

[0061] In Figure 1 In the grating temperature rise coefficient test device shown, the network interface 1004 is mainly used for data communication with a network server; the user interface 1003 is mainly used for data interaction with a user; the processor 1001 and the memory 1005 in the grating temperature rise coefficient test device of the application can be arranged in the grating temperature rise coefficient test device, and the grating temperature rise coefficient test device calls the grating temperature rise coefficient test program stored in the memory 1005 through the processor 1001, and executes the grating temperature rise coefficient test method provided by the embodiment of the application.

[0062] The embodiment of the application provides a grating temperature rise coefficient test method, which is applied to a grating test device, and the grating test device comprises a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module, and the grating temperature rise coefficient test method comprises the steps of Figure 2 , Figure 2 The flowchart of the first embodiment of the grating temperature rise coefficient test method of the application.

[0063] In this embodiment, the grating temperature rise coefficient test method comprises the following steps:

[0064] Step S10: When measuring the to-be-measured grating by the temperature measuring device, the electrical module is controlled to supply power to the optical module, and the target light is output to the to-be-measured grating through the internal light path of the optical module.

[0065] It should be noted that the execution subject of the embodiment can be a computing service device, an industrial computer or the like having data processing, network communication and program running functions, or an electronic device capable of realizing the above functions. The following takes an industrial computer as an example to illustrate the embodiment and each of the following embodiments.

[0066] It can be understood that before the temperature rise coefficient of the to-be-measured grating is tested, the temperature measuring device can be calibrated in temperature to improve the accuracy of the temperature rise coefficient test; the temperature measuring device can be a temperature testing device for the to-be-measured grating in light, for example, the temperature measuring device comprises an infrared camera, an infrared instrument or other devices with the same or similar functions.

[0067] In the embodiment, the corresponding branch in the electrical module is controlled to be turned on according to the target test mode, and the corresponding optical branch in the optical module is powered through the turned-on branch, so that the optical module outputs target light corresponding to the target test mode; the target test mode includes a laser test mode and a pump light test mode, and the target light includes laser and pump light.

[0068] Step S20: controlling the temperature measuring device to measure the temperature of the light-transmitting to-be-tested grating, and acquiring a test temperature of the temperature measuring device, an output power of the target light, and a cooling liquid parameter of the water cooling system.

[0069] It can be understood that the to-be-tested grating is provided with a temperature measuring point in advance, the temperature measuring device is controlled to move to the temperature measuring point provided in advance, and a test temperature detected by the temperature measuring device at the temperature measuring point is acquired; the temperature measuring point is at least one, which can be set according to a specific scene, and the embodiment is not limited herein; the output power of the target light can be acquired by measuring with a power meter; the cooling liquid parameter includes a specific heat capacity of the cooling liquid, a flow rate of the cooling liquid, a return temperature of the cooling liquid, and a set temperature of the cooling liquid.

[0070] Step S30: determining a temperature rise coefficient of the to-be-tested grating according to the test temperature, the output power, and the cooling liquid parameter.

[0071] In an example, a structural schematic diagram of the grating test device can refer to Figure 3 The grating test device includes a two-axis temperature measuring device, a water cooling system, an industrial computer, an electrical module, and an optical module, wherein the industrial computer and the electrical module are arranged in the electrical cabinet, the to-be-tested grating is provided with three temperature measuring points, which are respectively at an entrance, a middle part, and an exit of the to-be-tested grating; when the two-axis temperature measuring device is calibrated by temperature, the branch corresponding to the target test mode in the electrical module is controlled to be turned on, and the corresponding optical path in the optical module is powered through the turned-on branch, so that the optical module outputs target light corresponding to the target test mode; after the to-be-tested grating transmits light, the two-axis temperature measuring device is controlled to move to the three temperature measuring points to measure the temperature; assuming that the ambient temperature beside the current indoor device is T0, the highest temperature measured by the two-axis temperature measuring device is T2, the maximum output power of the target light is P, the specific heat capacity of the cooling liquid is C 冷 , the flow rate of the cooling liquid is Q 冷 , the return temperature of the cooling liquid is T 冷回 , and the set temperature of the cooling liquid is T 冷设 , then the temperature rise coefficient of the to-be-tested grating can be calculated according to an equivalent temperature rise coefficient formula, and the equivalent temperature rise coefficient can refer to formula 1:

[0072]

[0073] The equivalent temperature rise coefficient η is a dimensionless quantity that can eliminate the influence of cooling conditions on the grating temperature rise coefficient test, improve the accuracy of the measurement results, and facilitate the horizontal comparison of measurement results between different devices.

[0074] Furthermore, currently, the pump light and laser tests of the grating are generally tested separately. Fiber lasers and semiconductor lasers are generally two independent light sources, resulting in high cost and large space occupied by the test equipment. In order to reduce equipment cost and space occupied by the equipment, the optical module includes several pump sources, a first optical path, and a second optical path; the step S10 includes:

[0075] Step S101: determining a target test mode when the temperature measuring device passes temperature calibration;

[0076] Step S102: When the target test mode is a laser test mode, controlling the electrical module to supply power to a pump source corresponding to the first optical path;

[0077] Step S103: outputting laser light to the grating to be measured through the first optical path; and

[0078] Step S104: When the target test mode is a pump light test mode, controlling the electrical module to supply power to the pump source corresponding to the second optical path;

[0079] Step S105: outputting pump light to the grating to be measured through the second optical path.

[0080] It can be understood that the target test mode includes a laser test mode and a pump light test mode; the laser test mode can be a mode in which the temperature rise coefficient of the grating to be tested is tested after controlling the laser to pass through the grating to be tested; the pump light test mode can be a mode in which the temperature rise coefficient of the grating to be tested is tested after controlling the pump light to pass through the grating to be tested; a coupler (red light 6+1), a high reflectivity grating (HR), a resonant cavity (YDCF), a low reflectivity grating (OC), a coupler (rear end 6+1), and a mold stripper (CMS) are sequentially arranged in the first optical path; a coupler (rear end 6+1) and a mold stripper (CMS) are sequentially arranged in the second optical path; the pump light output by the pump source outputs laser after passing through the first optical path; the pump light output by the pump source outputs pump light after passing through the second optical path.

[0081] In the specific implementation, refer to Figure 4 and Figure 5 , Figure 4 is a structural diagram of the optical mode, Figure 5The schematic diagram for controlling the output of the electrical module; the electrical module has 6 output channels: A-F, and the stable constant current DC power supply can continuously output different currents, that is, different powers; when the target test mode is the laser test mode, one or more of the A, B and C channels in the electrical module are controlled to be turned on to supply power to the optical module, the first optical path in the optical module outputs laser to the to-be-tested grating, and finally enters the water cooling system, realizing the test of the temperature rise coefficient of the to-be-tested grating when the laser passes through; when the target test mode is the pump light test mode, one or more of the D, E and F channels in the electrical module are controlled to be turned on to supply power to the optical module, the second optical path in the optical module outputs pump light to the to-be-tested grating, and finally enters the water cooling system, realizing the test of the temperature rise coefficient of the to-be-tested grating when the pump light passes through. Each output channel of the electrical module corresponds to at least one pump source, and a DC relay is arranged on each output channel, and any channel in A-F can be controlled to be turned on or turned off by controlling the attraction and disconnection of the DC relay, for example, a high-level signal is output to the DC relay in the output channel A to control the attraction of the DC relay, then the electrical module supplies power to the optical module through the channel A, and the other channels can be similarly deduced, and each output channel can be automatically and quickly switched.

[0082] The embodiment provides a grating temperature rise coefficient test method applied to a grating test device, the grating test device comprising a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module, the method comprising: when measuring a to-be-tested grating by using the temperature measuring device, supplying power to the optical module by using the electrical module, and outputting target light to the to-be-tested grating by using an internal optical path of the optical module; controlling the temperature measuring device to measure the temperature of the to-be-tested grating, and acquiring a test temperature of the temperature measuring device, an output power of the target light and a cooling liquid parameter of the water cooling system; and determining the temperature rise coefficient of the to-be-tested grating according to the test temperature, the output power and the cooling liquid parameter. In the embodiment, the cooling liquid parameter is considered when measuring the temperature rise coefficient, so that the temperature rise coefficient of the to-be-tested grating is determined, and the accuracy of the temperature rise coefficient test is improved.

[0083] Reference Figure 6 , Figure 6 The embodiment provides a grating temperature rise coefficient test method applied to a grating test device, the grating test device comprising a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module, the method comprising: when measuring a to-be-tested grating by using the temperature measuring device, supplying power to the optical module by using the electrical module, and outputting target light to the to-be-tested grating by using an internal optical path of the optical module; controlling the temperature measuring device to measure the temperature of the to-be-tested grating, and acquiring a test temperature of the temperature measuring device, an output power of the target light and a cooling liquid parameter of the water cooling system; and determining the temperature rise coefficient of the to-be-tested grating according to the test temperature, the output power and the cooling liquid parameter. In the embodiment, the cooling liquid parameter is considered when measuring the temperature rise coefficient, so that the temperature rise coefficient of the to-be-tested grating is determined, and the accuracy of the temperature rise coefficient test is improved.

[0084] Based on the first embodiment, in the embodiment, the temperature measuring device comprises an infrared camera with an adjustable temperature measuring angle, and before the step S101, the method further comprises:

[0085] Step S01: when the current temperature measuring angle of the infrared camera meets a preset temperature measuring condition, acquiring a plurality of calibration test temperatures by using the temperature measuring device, and determining a calibration average temperature according to the plurality of calibration test temperatures.

[0086] It can be understood that the current temperature measurement angle can be an angle at which the infrared camera measures the temperature of the grating to be measured; the preset temperature measurement condition can be a condition that an influence of reflected light of the grating to be measured on the temperature measured by the infrared camera is within a certain range, for example, a difference between a measured temperature and an actual temperature of the same grating is less than a preset value, and it is determined that the current temperature measurement angle of the infrared camera meets the preset temperature measurement condition; the calibration test temperature can be a grating temperature measured by the temperature measurement device during temperature calibration; the calibration average temperature can be an average of the calibration test temperatures, and the highest temperature and the lowest temperature in the calibration test temperatures can be removed, and an average of the remaining temperatures is taken as the calibration average temperature, which is not limited in the embodiment.

[0087] Step S02: determining whether the temperature measurement device is abnormal according to the calibration average temperature and the reference average temperature.

[0088] In an implementation, the reference average temperature can be obtained by manual measurement, and whether the temperature measurement device is abnormal is determined according to a calibration temperature difference between the calibration average temperature and the reference average temperature.

[0089] Step S03: if not, determining whether the temperature measurement device meets a repeatability and reproducibility (R&R) index.

[0090] It can be understood that the R&R index can be an index representing the repeatability and reproducibility of the temperature measurement device, and the R&R index can also be referred to as a GRR index.

[0091] Step S04: if yes, determining that the temperature measurement device passes the temperature calibration.

[0092] In a specific implementation, when a difference between a grating test temperature measured by the infrared camera and an actual grating temperature is less than a preset value, it is determined that the current temperature measurement angle of the infrared camera meets the preset temperature measurement condition, the grating is controlled to be in a light transmission state, the infrared camera is controlled to measure the temperature of the grating in the light transmission state, a plurality of calibration test temperatures are obtained, a calibration average temperature of the calibration test temperatures is calculated, whether the temperature measurement device is abnormal is determined according to a temperature difference between the calibration average temperature and a reference average temperature, if not, whether the temperature measurement device meets the R&R index is determined, and if yes, it is determined that the temperature measurement device passes the temperature calibration.

[0093] Further, to determine whether the temperature measurement device is abnormal, the step S02 includes: determining a calibration temperature difference between the calibration average temperature and the reference average temperature; determining a temperature compensation coefficient according to the calibration temperature difference, and adjusting the calibration average temperature according to the temperature compensation coefficient; and determining whether the temperature measurement device is abnormal according to the adjusted calibration average temperature and the reference average temperature.

[0094] It can be understood that the temperature compensation coefficient can be a coefficient for temperature compensation of the standard average temperature, and the adjusted temperature after adjustment according to the temperature compensation coefficient is closer to the actual temperature of the grating.

[0095] In an example, the grating of the same light transmission is repeatedly measured N times to obtain N calibration test temperatures, the average of the N calibration test temperatures is calculated to obtain a calibration average temperature; the grating is repeatedly measured N times by the calibrated thermal imager, the average of the N temperatures is calculated to obtain a reference average temperature, the calibration temperature difference between the calibration average temperature and the reference average temperature is calculated, and it is judged whether the calibration temperature difference is less than the calibration temperature difference threshold. If yes, it is determined that the temperature measuring device is normal; if no, the initial temperature compensation coefficient is reduced by the calibration temperature difference to obtain a modified temperature compensation coefficient, the calibration average temperature is added to the modified temperature compensation coefficient to obtain an adjusted calibration average temperature, and the step of calculating the calibration temperature difference between the calibration average temperature and the reference average temperature is repeatedly executed. If the calibration temperature difference obtained after adjusting the calibration average temperature m times is still greater than the calibration temperature threshold, it is determined that the temperature measuring device is abnormal; if the calibration temperature difference obtained after adjusting the calibration average temperature less than m times is less than or equal to the calibration temperature threshold, it is determined that the temperature measuring device is normal.

[0096] In a specific implementation, for example, the same grating is automatically repeatedly measured 3 times, and the calibration test temperatures of different positions (input end, middle part and output end) of the grating are recorded, and the calibration average temperature of the calibration test temperatures is calculated. At the same time, the grating is repeatedly measured 3 times by the calibrated handheld thermal imager, and the test temperatures of different positions (input end, middle part and output end) of the grating are recorded, and the reference average temperature is calculated. The temperature difference AT between the calibration average temperature and the reference average temperature is calculated. If AT<0.5℃, the temperature measuring device is normal; if AT>0.5℃, the temperature compensation coefficient is modified: Tnew=T-T, where Tnew is the modified compensation temperature coefficient, T is the initial temperature compensation coefficient, the calibration average temperature is added to Tnew to obtain the adjusted calibration average temperature, and the above steps are repeated to recalibrate until AT<0.5℃. If AT>0.5℃ after 3 times of correct operation, the temperature measuring device is abnormal and needs to be checked and repaired.

[0097] Further, in order to judge whether the repeatability and reproducibility of the temperature measuring device meet the test requirements, the method for judging whether the temperature measuring device meets the repeatability and reproducibility index comprises: controlling the temperature measuring device to repeatedly measure the temperature of a plurality of gratings with different parameters, and obtaining the repeated test temperatures of each grating; and judging whether the temperature measuring device meets the repeatability and reproducibility index according to the repeated test temperatures of the gratings with different parameters.

[0098] In the embodiment, the repeat calculation index can also be referred to as a GRR index of the measuring device, which is used to represent the accuracy, stability, repeatability and reproducibility of the measuring device; the repeat reproducibility index of the temperature measuring device can be calculated according to the repeat test temperature corresponding to the grating of different parameters, and when the calculated repeat reproducibility index is less than or equal to the preset repeat reproducibility calculation index, it is determined that the temperature measuring device passes the temperature calibration.

[0099] In the embodiment, when the current temperature measuring angle of the infrared camera meets the preset temperature measuring condition, the calibration test temperature is obtained by the temperature measuring device, and the calibration average temperature is determined according to the calibration test temperature; whether the temperature measuring device is abnormal is determined according to the calibration average temperature and the reference average temperature; if not, whether the temperature measuring device meets the repeat reproducibility index is determined; if yes, it is determined that the temperature measuring device passes the temperature calibration. The temperature calibration of the temperature measuring device is performed in the embodiment, the accuracy of the temperature test of the temperature measuring device is improved, and thus the accuracy of the temperature rise coefficient test of the to-be-tested grating is improved.

[0100] Reference Figure 7 , Figure 7 FIG. 3 is a flowchart of a third embodiment of a grating temperature rise coefficient test method according to the present application.

[0101] Based on the above embodiments, before the step S01, the method further includes:

[0102] Step S001: When the infrared camera completes the grating focusing, the grating test temperature of the target grating is obtained by the infrared camera, and the actual temperature of the target grating is obtained.

[0103] It can be understood that, in order to improve the accuracy of the temperature test, the focusing needs to be performed in advance before the temperature test of the to-be-tested grating; the grating test temperature can be the temperature obtained by the infrared camera in the current angle for the temperature test of the grating; the actual temperature can be the temperature obtained by the calibrated infrared instrument for the temperature test of the target grating; the above temperature test can be obtained after the grating is lighted, or can be obtained without lighting the grating, which is not limited in the embodiment.

[0104] Step S002: Determine the temperature difference between the grating test temperature and the actual temperature.

[0105] In the embodiment, the temperature difference is obtained by subtracting the actual temperature from the grating test temperature.

[0106] Step S003: When the temperature difference is greater than or equal to the temperature threshold, the infrared camera is controlled to continuously adjust the temperature measuring angle.

[0107] It can be understood that when the temperature difference is greater than the temperature threshold, it is determined that the infrared camera is affected by the reflection of the grating when measuring the temperature at the current angle, resulting in an overestimated temperature, and the temperature measuring angle of the infrared camera needs to be adjusted.

[0108] Step S004: In the process of controlling the infrared camera to adjust the temperature measuring angle, it is determined whether the temperature difference is less than the temperature threshold.

[0109] In this embodiment, in the process of controlling the infrared camera to adjust the temperature measuring angle, the temperature difference between the grating test temperature and the actual temperature can be obtained in real time, and it is determined whether the temperature difference is less than the temperature threshold.

[0110] Step S005: If yes, control the infrared camera to stop adjusting the temperature measuring angle, and determine that the current temperature measuring angle of the infrared camera meets the preset temperature measuring condition.

[0111] In specific implementation, referring to Figure 8 , Figure 8 is a structural schematic diagram of the infrared camera. The infrared camera is movably connected with the mounting plate (for example, connected by screws, pins, etc.). It is assumed that the initial angle of the infrared camera is as shown in Figure 8 , the infrared camera is controlled to obtain the grating test temperature of the target grating at the initial angle, and the actual temperature of the target grating measured by the calibrated infrared instrument is obtained. The temperature difference between the grating test temperature and the actual temperature is calculated. If the temperature difference is greater than the temperature threshold, it is determined that the reflection of the target grating enters the infrared camera, resulting in an overestimated temperature. At this time, the infrared camera is controlled to rotate counterclockwise first. If the temperature difference is less than the temperature threshold during the rotation, the infrared camera is stopped at the current position, and it is determined that the current temperature measuring angle meets the preset temperature measuring condition. If the temperature difference is always greater than or equal to the temperature threshold during the counterclockwise rotation, the infrared camera is continuously controlled to rotate clockwise, and the infrared camera is stopped when the temperature difference is less than the temperature threshold.

[0112] Further, since the size of the heating area of the to-be-measured grating is small, generally between 50-600 μm in diameter, the infrared camera may not be able to focus normally, resulting in inaccurate measured temperature. In order to improve the temperature measuring accuracy of the infrared camera, a height standard block is arranged on the grating test device, the height standard block is the same height as the to-be-measured grating, the size of the height standard block is greater than the size of the to-be-measured grating, and before the step S001, the infrared camera is controlled to focus through the height standard block; when the infrared camera focuses on the height standard block, it is determined that the infrared camera completes the grating focusing.

[0113] It can be understood that the height standard block can be a standard block for focusing of the infrared camera, and the height standard block is fixedly installed at a temperature measurement origin of the infrared camera and is in the same height as the to-be-measured grating.

[0114] In a specific implementation, a height standard block is arranged at a position of a temperature measurement origin of the infrared camera and in the same height as the to-be-measured grating, for example, the height standard block is a cuboid with a side length greater than or equal to 10 mm. Before temperature measurement, the infrared camera is controlled to focus on the height standard block. Because the height standard block has a large size, automatic focusing can be quickly completed. In addition, the height standard block is in the same height as the to-be-measured grating. After the infrared camera focuses on the height standard block, it can be determined that the infrared camera can also focus on the to-be-measured grating in the current state.

[0115] In the embodiment, when the infrared camera completes grating focusing, the grating test temperature of the target grating is acquired by the infrared camera, and the actual temperature of the target grating is acquired. The temperature difference between the grating test temperature and the actual temperature is determined. When the temperature difference is greater than or equal to a temperature threshold, the infrared camera is controlled to continuously adjust the temperature measurement angle. In the process of controlling the infrared camera to adjust the temperature measurement angle, it is determined whether the temperature difference is less than the temperature threshold. If yes, the infrared camera is controlled to stop adjusting the temperature measurement angle, and it is determined that the current temperature measurement angle of the infrared camera meets the preset temperature measurement condition. In the embodiment, the temperature measurement angle of the infrared camera is adjusted, so that the light reflected by the surface of the to-be-measured grating entering the infrared camera is avoided, and the test temperature of the infrared camera is prevented from being too high, thereby improving the temperature measurement accuracy of the infrared camera.

[0116] In addition, the embodiment of the present application also provides a storage medium, and the storage medium stores a grating temperature rise coefficient test program. When the grating temperature rise coefficient test program is executed by a processor, the steps of the grating temperature rise coefficient test method described above are implemented.

[0117] Reference Figure 9 , Figure 9 The grating temperature rise coefficient test device is arranged in a grating test equipment, and the grating test equipment includes a temperature measurement device, a water cooling system, a power meter, an electrical module, and an optical module.

[0118] As Figure 9 shown, the grating temperature rise coefficient test device provided by the embodiment of the present application includes:

[0119] A control module 10 is configured to control the electrical module to supply power to the optical module when the to-be-measured grating is measured by the temperature measurement device, and output target light to the to-be-measured grating through an internal light path of the optical module.

[0120] The acquisition module 20 is configured to control the temperature measuring device to measure the temperature of the light grating to be measured, and to acquire a test temperature of the temperature measuring device, an output power of the target light, and a cooling liquid parameter of the water cooling system.

[0121] The determination module 30 is configured to determine the temperature rise coefficient of the light grating to be measured according to the test temperature, the output power, and the cooling liquid parameter.

[0122] In the embodiment, when the temperature measuring device is calibrated, the cooling liquid parameter is considered to determine the temperature rise coefficient of the light grating to be measured, and the accuracy of the temperature rise coefficient test is improved.

[0123] Based on the first embodiment of the grating temperature rise coefficient test device, the second embodiment of the grating temperature rise coefficient test device is provided.

[0124] In the embodiment, the control module 10 is further configured to determine a target test mode when the temperature measuring device is calibrated, control the electrical module to supply power to the pump source corresponding to the first light path when the target test mode is a laser test mode, output laser to the light grating to be measured through the first light path, and control the electrical module to supply power to the pump source corresponding to the second light path when the target test mode is a pump light test mode, and output pump light to the light grating to be measured through the second light path. The optical module includes a plurality of pump sources, a first light path, and a second light path.

[0125] The control module 10 is further configured to acquire a plurality of calibration test temperatures through the temperature measuring device when the current temperature measuring angle of the infrared camera meets a preset temperature measuring condition, and determine a calibration average temperature according to the plurality of calibration test temperatures.

[0126] According to the calibration average temperature and the reference average temperature, it is determined whether the temperature measuring device is abnormal. If not, it is determined whether the temperature measuring device meets a repeatability index. If yes, it is determined that the temperature measuring device is calibrated. The temperature measuring device includes an infrared camera with an adjustable temperature measuring angle.

[0127] The control module 10 is further configured to determine a calibration temperature difference between the calibration average temperature and the reference average temperature, determine a temperature compensation coefficient according to the calibration temperature difference, adjust the calibration average temperature according to the temperature compensation coefficient, and determine whether the temperature measuring device is abnormal according to the adjusted calibration average temperature and the reference average temperature.

[0128] The control module 10 is further configured to control the temperature measuring device to repeatedly measure the temperature of a plurality of gratings with different parameters, and to acquire a plurality of repeated test temperatures of the gratings. According to the repeated test temperatures of the gratings with different parameters, it is determined whether the temperature measuring device meets a repeatability index.

[0129] The control module 10 is further configured to acquire a grating test temperature of a target grating and an actual temperature of the target grating by the infrared camera when the infrared camera completes the grating focusing, determine a temperature difference between the grating test temperature and the actual temperature, control the infrared camera to continuously adjust the temperature measurement angle when the temperature difference is greater than or equal to a temperature threshold, and determine whether the temperature difference is less than the temperature threshold in the process of controlling the infrared camera to adjust the temperature measurement angle, and if so, control the infrared camera to stop adjusting the temperature measurement angle, and determine that the current temperature measurement angle of the infrared camera meets a preset temperature measurement condition.

[0130] The control module 10 is further configured to control the infrared camera to focus by the height standard block, and determine that the infrared camera completes the grating focusing when the infrared camera focuses on the height standard block.

[0131] Other embodiments or specific implementations of the grating temperature rise coefficient testing device can refer to the above-mentioned method embodiments, which will not be described here.

[0132] It should be noted that in this document, the terms "comprising", "containing", or any other variant thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or includes elements inherent to such a process, method, article or system. Without more limitations, the element defined by the statement "including a" does not exclude the presence of another identical element in the process, method, article or system including the element.

[0133] The above-mentioned embodiment numbers of the present application are only for description, and do not represent the advantages and disadvantages of the embodiments.

[0134] Through the above description of the embodiments, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be realized by software and necessary general hardware platform, of course, also can be realized by hardware, but in many cases, the former is a better embodiment. Based on such understanding, the technical solutions of the present application can be embodied in the form of a software product, which is stored in a storage medium (such as a read-only memory / random access memory, a magnetic disk, an optical disk), and includes a plurality of instructions for making a terminal device (which can be a mobile phone, a computer, a server, an air conditioner, or a network device) execute the method described in each embodiment of the present application.

[0135] The above merely describes the preferred embodiments of the present application, and is not intended to limit the patent scope of the present application, and any equivalent structure or equivalent process conversion, or direct or indirect application in other related technical fields, which are made by using the content of the present application specification and drawings, are also included in the patent protection scope of the present application.

Claims

1. A method for testing the temperature rise coefficient of a grating, characterized in that: The grating temperature rise coefficient testing method is applied to a grating testing device, which includes a temperature measuring device, a water cooling system, a power meter, an electrical module, and an optical module. The method includes: When the temperature measuring device is used to measure the grating to be measured, the electrical module is controlled to supply power to the optical module, and target light is output to the grating to be measured through the internal optical path of the optical module; Controlling the temperature measuring device to measure the temperature of the grating to be measured through which light passes, and obtaining the test temperature of the temperature measuring device, the output power of the target light, and the coolant parameters of the water cooling system; The temperature rise coefficient of the grating to be measured is determined according to the test temperature, the output power and the coolant parameters.

2. The method according to claim 1, wherein The optical module includes a plurality of pump sources, a first optical path and a second optical path; When the temperature measuring device is used to measure the grating to be measured, controlling the electrical module to power the optical module and outputting target light to the grating to be measured through the internal optical path of the optical module includes: When the temperature measuring device passes temperature calibration, determining a target test mode; When the target test mode is a laser test mode, controlling the electrical module to supply power to the pump source corresponding to the first optical path; Outputting laser light to the grating to be measured through the first optical path; and When the target test mode is a pump light test mode, controlling the electrical module to supply power to a pump source corresponding to the second optical path; The pump light is output to the grating to be measured through the second optical path.

3. The method according to claim 2, wherein The temperature measuring device includes an infrared camera with an adjustable temperature measuring angle; When the temperature measuring device passes the temperature calibration, before determining the target test mode, the method further includes: When the current temperature measurement angle of the infrared camera meets the preset temperature measurement conditions, a plurality of calibration test temperatures are obtained by the temperature measurement device, and a calibration average temperature is determined according to the plurality of calibration test temperatures; Determining whether the temperature measuring device is abnormal based on the calibration average temperature and the reference average temperature; If not, determining whether the temperature measuring device meets the repeatability index; If so, it is determined that the temperature measuring device has passed the temperature calibration.

4. The method according to claim 3, wherein The determining whether the temperature measuring device is abnormal according to the calibration average temperature and the reference average temperature includes: determining a calibration temperature difference between the calibration average temperature and a reference average temperature; determining a temperature compensation coefficient according to the calibration temperature difference, and adjusting the calibration average temperature according to the temperature compensation coefficient; Whether the temperature measuring device is abnormal is determined based on the adjusted calibration average temperature and the reference average temperature.

5. The method according to claim 3, wherein Determining whether the temperature measuring device meets the repeatability index includes: Controlling the temperature measuring device to repeatedly measure the temperature of a plurality of gratings with different parameters, and obtaining the repeated test temperature of each grating; Whether the temperature measuring device meets the repeatability index is determined based on the repeated test temperatures corresponding to the gratings with different parameters.

6. The method according to claim 3, wherein When the current temperature measurement angle of the infrared camera meets the preset temperature measurement condition, the method further includes: obtaining a plurality of calibration test temperatures through the temperature measurement device, and determining a calibration average temperature according to the plurality of calibration test temperatures. When the infrared camera completes grating focusing, obtaining a grating test temperature of the target grating through the infrared camera, and obtaining an actual temperature of the target grating; determining a temperature difference between the grating test temperature and the actual temperature; When the temperature difference is greater than or equal to a temperature threshold, controlling the infrared camera to continuously adjust the temperature measurement angle; In the process of controlling the infrared camera to adjust the temperature measurement angle, determining whether the temperature difference is less than the temperature threshold; If so, the infrared camera is controlled to stop adjusting the temperature measurement angle, and it is determined that the current temperature measurement angle of the infrared camera meets the preset temperature measurement conditions.

7. The method according to claim 6, wherein The grating test device is provided with a height standard block, the height standard block is the same as the grating to be tested, and the size of the height standard block is larger than the size of the grating to be tested; When the infrared camera completes grating focusing, obtaining the grating test temperature of the target grating through the infrared camera, and before obtaining the actual temperature of the target grating, the method further includes: Controlling the infrared camera to focus through the height standard block; When the infrared camera focuses on the height standard block, it is determined that the infrared camera completes grating focusing.

8. A grating temperature rise coefficient testing device, characterized in that: The grating temperature rise coefficient test device is arranged on a grating test device, and the grating test device includes a temperature measuring device, a water cooling system, a power meter, an electrical module and an optical module. The grating temperature rise coefficient test device includes: a control module, configured to control the electrical module to supply power to the optical module and output target light to the grating to be measured through an internal optical path of the optical module when the grating to be measured is measured by the temperature measuring device; an acquisition module, configured to control the temperature measuring device to measure the temperature of the grating to be measured through which light passes, and to obtain the test temperature of the temperature measuring device, the output power of the target light, and the coolant parameters of the water cooling system; A determination module is used to determine the temperature rise coefficient of the grating to be measured according to the test temperature, the output power and the coolant parameters.

9. A grating temperature rise coefficient test device, characterized in that: The device includes: a memory, a processor, and a grating temperature rise coefficient test program stored in the memory and executable on the processor, wherein the grating temperature rise coefficient test program is configured to implement the steps of the grating temperature rise coefficient test method according to any one of claims 1 to 7.

10. A storage medium, characterized in that: The storage medium stores a grating temperature rise coefficient test program, and when the grating temperature rise coefficient test program is executed by the processor, the steps of the grating temperature rise coefficient test method according to any one of claims 1 to 7 are implemented.

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