An aging test method, apparatus and medium for amorphous alloy strip

Abstract

This invention discloses an aging test method, apparatus, and medium for amorphous alloy strips. The method includes: applying constant mechanical stress, a constant electric field, and stepped thermal stress to the amorphous alloy strip using the aging apparatus, and obtaining the surface resistivity of the insulating coating of the amorphous alloy strip at intervals using a microammeter; stopping the aging apparatus after running for a preset aging time and measuring aging parameters offline; scoring the insulating coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulating coating, and confirming the aging state of the amorphous alloy strip based on the scoring results. This invention simultaneously applies thermal stress, electrical stress, and mechanical stress loads, enriching external stress conditions to achieve more environmental simulation effects that closely approximate real aging conditions.

Description

Technical Field

[0001] This invention relates to the field of electrical materials technology, and in particular to an aging test method, apparatus and medium for amorphous alloy strips. Background Technology

[0002] Currently, there are numerous cases of accelerated aging tests on organic and inorganic insulations in the field of electrical materials technology, including accelerated thermal aging, accelerated electrical aging, and combined thermo-electrical-mechanical aging tests. However, research on thermal aging tests for the surface insulation of amorphous alloy strips is limited, and is restricted to accelerated thermal aging tests at multiple constant temperatures. For example, reference 1 [Song Shouxu et al., Study on Thermal Aging Behavior of Insulating Coating of B35AV 1900 Silicon Steel] proposed conducting thermal aging experiments at different temperatures on the insulating coating of a silicon steel sheet for an electric vehicle motor: measuring the interlayer resistance of the insulating coating and conducting scratch tests, and combining scanning electron microscopy (SEM) and Fourier transform infrared spectroscopy (FTIR) to characterize and analyze the aged coating and obtain the aging law of the surface coating. This type of test method uses multiple constant temperatures for accelerated aging tests, requires a large number of test samples, and consumes a long test time; moreover, no mechanical or electrical stress is applied during aging, which cannot truly reflect the multi-factor environmental stress that the surface coating can withstand. Summary of the Invention

[0003] This invention provides an aging test method, apparatus, and medium for amorphous alloy strips. In an aging apparatus, thermal stress, electrical stress, and mechanical stress loads are applied to the test sample simultaneously, solving the problem of single external stress conditions in accelerated aging tests and simulating the real environment that the insulating coating on the surface of amorphous alloy strips can withstand.

[0004] To achieve the above objectives, a first aspect of this application provides an aging test method for amorphous alloy strips, comprising:

[0005] The amorphous alloy strip is pretreated to form annular metal coatings on the upper and lower surfaces of the amorphous alloy strip.

[0006] The amorphous alloy strip is connected to the microammeter in the aging device via metal leads, and the amorphous alloy strip is placed in the metal clamp in the aging device.

[0007] The aging device is sealed, and constant mechanical stress, constant electric field, and stepped thermal stress are applied to the amorphous alloy strip through the aging device. The surface resistivity of the insulating coating of the amorphous alloy strip is obtained at intervals through the microammeter.

[0008] The aging device is stopped after running for a preset aging time, and aging parameters are measured offline.

[0009] The insulation coating performance of the amorphous alloy strip is scored based on the aging parameters and the surface resistivity of the insulation coating, and the aging state of the amorphous alloy strip is confirmed based on the scoring results.

[0010] In one possible implementation of the first aspect, the aging device includes: a metal clamp, a mechanical hand, an electric field module, a heating module, and a microammeter;

[0011] The metal clamp holds the amorphous alloy strip by mechanical contact; the mechanical tentacles apply mechanical stress to the amorphous alloy strip by mechanical contact; the electric field module and the heating module are installed on the inner wall of the aging device to apply a constant electric field and stepped thermal stress to the amorphous alloy strip; the microammeter is placed in an isolated independent space inside the aging device; the metal clamp and the mechanical tentacles are connected to the inner wall of the aging device.

[0012] In one possible implementation of the first aspect, connecting the amorphous alloy strip to a microammeter in the aging apparatus via metal leads and placing the amorphous alloy strip in a metal fixture within the aging apparatus specifically includes:

[0013] The annular metal coating at the center of the upper surface of the amorphous alloy strip is used as the high voltage electrode, the annular metal coating on the outer side of the upper surface of the amorphous alloy strip is used as the measuring electrode, and the annular metal coating on the outer side of the lower surface of the amorphous alloy strip is used as the protective electrode. These are connected to the microammeter in the aging device via metal leads.

[0014] The metal clamps in the aging device fix the two ends of the amorphous alloy strip through mechanical contact.

[0015] In one possible implementation of the first aspect, applying stepped thermal stress to the amorphous alloy strip via the aging apparatus specifically includes:

[0016] The amorphous alloy strip is heated at a constant heating rate, with each heating interval lasting for an equal duration and the interval duration being much shorter than the duration of the isothermal phase.

[0017] In one possible implementation of the first aspect, the aging parameters include: coating adhesion and strip magnetic loss.

[0018] In one possible implementation of the first aspect, the step of evaluating the insulation coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulation coating specifically involves:

[0019] Each aging parameter and the surface resistivity of the insulating coating are assigned a corresponding weighting factor; the sum of all weighting factors is 1.

[0020] The insulation coating performance score of the amorphous alloy strip is calculated based on the aging parameters and corresponding weighting factors, the surface resistivity of the insulation coating and corresponding weighting factors.

[0021] In one possible implementation of the first aspect, the weighting factors corresponding to the aging parameters and the weighting factors corresponding to the surface resistivity of the insulating coating are obtained from an expert system, or from empirical values, or from training an artificial neural network.

[0022] In one possible implementation of the first aspect, confirming the aging state of the amorphous alloy strip based on the scoring result specifically includes:

[0023] The aging state of the amorphous alloy strip is determined based on the evaluation score range in which the scoring result falls; the aging state corresponding to the evaluation score range includes "severe deterioration", "deterioration", "good" and "excellent".

[0024] A second aspect of this application provides an aging test apparatus for amorphous alloy strips, comprising:

[0025] The pretreatment module is used to perform surface pretreatment on the amorphous alloy strip, so that an annular metal coating is formed on the upper and lower surfaces of the amorphous alloy strip.

[0026] The connection module connects the amorphous alloy strip to the microammeter in the aging device via metal leads, and places the amorphous alloy strip in the metal clamp in the aging device;

[0027] An aging module is used to seal the aging device, apply constant mechanical stress, constant electric field, and stepped thermal stress to the amorphous alloy strip through the aging device, and obtain the surface resistivity of the insulating coating of the amorphous alloy strip at intervals through the microammeter.

[0028] The offline testing module allows the aging device to stop running after a preset aging time and tests the aging parameters offline.

[0029] The status confirmation module scores the insulation coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulation coating, and confirms the aging status of the amorphous alloy strip based on the scoring results.

[0030] A third aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aging test method for amorphous alloy strips as described above.

[0031] Compared to existing technologies, the present invention provides an aging test method, apparatus, and medium for amorphous alloy strips. This method involves surface-treating the amorphous alloy strip and then placing it in an aging apparatus, simultaneously applying thermal stress, electrical stress, and mechanical stress loads to enrich the external stress conditions and achieve a wider range of environmental simulations that closely resemble real aging conditions. During the application of stepped thermal stress, the cumulative effect of thermal aging is utilized to accelerate the aging test, solving the problem of high test time for accelerated aging under constant temperature conditions. Finally, the insulation coating performance of the amorphous alloy strip is scored, and the aging state of the amorphous alloy strip is confirmed based on the scoring results, accurately and intuitively reflecting the aging results of the amorphous alloy strip under simulated aging conditions. Attached Figure Description

[0032] Figure 1 This is a schematic flowchart of an aging test method for amorphous alloy strip provided in an embodiment of the present invention;

[0033] Figure 2 This is a schematic diagram of the structure of an aging device provided in an embodiment of the present invention;

[0034] Figure 3 This is a schematic diagram illustrating the connection between an amorphous alloy strip and a microammeter according to an embodiment of the present invention;

[0035] Figure 4 This is a schematic diagram illustrating the application of stepped thermal stress according to an embodiment of the present invention. Detailed Implementation

[0036] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0037] Please see Figure 1 An embodiment of the present invention provides an aging test method for amorphous alloy strips, comprising:

[0038] S10. Perform surface pretreatment on the amorphous alloy strip to form annular metal coatings on the upper and lower surfaces of the amorphous alloy strip.

[0039] S11. Connect the amorphous alloy strip to the microammeter in the aging device via metal leads, and place the amorphous alloy strip in the metal clamp in the aging device.

[0040] S12. Seal the aging device, apply constant mechanical stress, constant electric field and stepped thermal stress to the amorphous alloy strip through the aging device, and obtain the surface resistivity of the insulating coating of the amorphous alloy strip at intervals through the microammeter.

[0041] S13. The aging device is stopped after running for a preset aging time, and the aging parameters are measured offline.

[0042] S14. Based on the aging parameters and the surface resistivity of the insulating coating, the insulating coating performance of the amorphous alloy strip is scored, and the aging state of the amorphous alloy strip is confirmed based on the scoring results.

[0043] The embodiments of the present invention conduct accelerated aging tests, and apply stresses that include three types of external loads: thermal, electrical, and mechanical stresses. The variety of load types can realistically simulate the environmental stresses that various amorphous alloy soft magnetic tapes can withstand when used as magnetic cores for power equipment.

[0044] Generally, if multiple amorphous alloy strips are to be subjected to accelerated aging tests simultaneously, the steps are as follows:

[0045] Step 1: Pretreatment, surface pretreatment of amorphous ribbon, metal electrode plating, and welding of foil leads;

[0046] Step 2: Place m portions of the pretreated amorphous ribbon sample into the metal fixture, and press... Figure 3 Connect the microammeter;

[0047] Step 3: Apply constant mechanical stress and electric field, and then apply stepped thermal stress respectively;

[0048] Step 4: Conduct accelerated aging tests according to the predetermined time. The accelerated aging time for 1 to m samples is divided into t1, t1+t2, ..., t1+t2+t3+...+tm.

[0049] Step 5: During the aging process of each aging sample, the resistivity is measured online at intervals;

[0050] Step 6: After 1 to m samples reach the predetermined aging time, measure the coating adhesion and strip loss offline respectively;

[0051] Step 7: Conduct a comprehensive assessment of aging performance;

[0052] Step 8: Establish aging performance degradation curves.

[0053] Please see Figure 2 For example, the aging device includes: a metal clamp 2, a mechanical hand 3, an electric field module 4, a heating module 5, and a microammeter 6.

[0054] The metal clamp holds the amorphous alloy strip by mechanical contact; the mechanical tentacles apply mechanical stress to the amorphous alloy strip by mechanical contact; the electric field module and the heating module are installed on the inner wall of the aging device to apply a constant electric field and stepped thermal stress to the amorphous alloy strip; the microammeter is placed in an isolated independent space inside the aging device; the metal clamp and the mechanical tentacles are connected to the inner wall of the aging device.

[0055] like Figure 2 As shown, the aging device used in this embodiment is a square-structured aging condition simulation device. An electric field module 4 and a heating module 5 are installed on the inner wall to apply thermal and electrical stress to the amorphous alloy strip in the form of a field; and to apply mechanical stress to the amorphous alloy strip in the form of mechanical contact.

[0056] In this embodiment, the mechanical tentacles are in mechanical contact with the amorphous alloy strip without any adhesion. Stress can be generated within the mechanical tentacles using springs, hydraulic pressure, or other means and applied to the amorphous alloy strip.

[0057] When no stress is applied, the flexible magnetic tape is planar with a thickness of approximately 20 micrometers. When the flexible magnetic tape is fabricated into magnetic components (such as transformer cores), it needs to be wound into a square or arc shape, at which point the tape is subjected to stress and forms an arch. To simulate the stress conditions of flexible magnetic tape in actual applications in real devices, Figure 2 When a planar strip is subjected to external stress, it undergoes slight deformation and forms an arch shape.

[0058] Please see Figure 3 For example, S12 specifically includes:

[0059] The annular metal coating at the center of the upper surface of the amorphous alloy strip is used as the high voltage electrode, the annular metal coating on the outer side of the upper surface of the amorphous alloy strip is used as the measuring electrode, and the annular metal coating on the outer side of the lower surface of the amorphous alloy strip is used as the protective electrode. These are connected to the microammeter in the aging device via metal leads.

[0060] The metal clamps in the aging device fix the two ends of the amorphous alloy strip through mechanical contact.

[0061] Existing methods for measuring the surface resistivity of strips using metal contact electrodes cannot measure resistivity during accelerated aging, even though resistance changes continuously with accelerated aging time. Therefore, this embodiment proposes an online method for measuring the surface resistivity of amorphous alloy strips in accelerated aging tests. The specific connection method is as follows... Figure 3 As shown, Figure 3The paper presents a method for mounting measuring electrodes on an insulating coating on the surface of amorphous alloy strips. The method uses a ring-shaped metal coating as the electrode and welds foil leads as potential leads on the electrode. This method can obtain the continuous change curve of surface resistance in real time during the online aging process, which is more timely than offline measurement after aging.

[0062] Please see Figure 4 For example, applying stepped thermal stress to the amorphous alloy strip through the aging device specifically includes:

[0063] The amorphous alloy strip is heated at a constant heating rate, with each heating interval lasting for an equal duration and the interval duration being much shorter than the duration of the isothermal phase.

[0064] For the i-th sample, according to Figure 4 The heating process is carried out in a stepped manner, with a constant heating rate, i.e., tp is constant.

[0065] The accelerated thermal aging time for the i-th sample is t1+t2+…+ti;

[0066] Where tp is the heating time, which is much shorter than the duration of the isothermal stage t1, t2, ..., ti, ..., tm, and can be ignored.

[0067] For example, the aging parameters include: coating adhesion and strip magnetic loss.

[0068] For example, the step of scoring the insulation coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulation coating specifically involves:

[0069] Each aging parameter and the surface resistivity of the insulating coating are assigned a corresponding weighting factor; the sum of all weighting factors is 1.

[0070] The insulation coating performance score of the amorphous alloy strip is calculated based on the aging parameters and corresponding weighting factors, the surface resistivity of the insulation coating and corresponding weighting factors.

[0071] For example, the weighting factors corresponding to the aging parameters and the weighting factors corresponding to the surface resistivity of the insulating coating are obtained from an expert system, or from empirical values, or from training an artificial neural network.

[0072] Before scoring, for the m-th sample, a graded scoring method is used, and the various aging properties are normalized according to Formula 1. m / s0<1.

[0073] Formula 1 (Comprehensive Evaluation of Surface Coating Aging Performance):

[0074] Y​m =w1s m / s0+w2F m / F0+…w i X m / X0+…+w N P m / P0;

[0075] In the above formula, s m This represents the aging value of surface resistivity; F m Aging value of the adhesion between the surface insulating coating and the tape; P m Aging value of magnetic loss of the strip; s0: initial value of surface resistivity; F0: initial value of adhesion between surface insulating coating and strip; P0: initial value of magnetic loss of strip; N: number of evaluation index dimensions.

[0076] When calculating the weighting factors, it is important to note that w1~w N As a weighting factor, it represents the contribution of this parameter to aging performance. The performance index has N dimensions, 0... <w1~w N <1, w1+w2+…+w N The sum is 1; this implementation only uses three performance indicators: surface resistivity of the insulating coating, coating adhesion, and magnetic loss of the tape, but it can be expanded according to actual needs. X can be performance indicators such as surface insulating coating porosity and interlayer resistivity of amorphous alloy soft magnetic tape.

[0077] The weighting factors can be trained based on expert systems, empirical values, or artificial neural networks. This embodiment uses empirical values.

[0078] Based on literature review and extensive operational data, the most important indicators affecting the performance of amorphous alloy flexible magnetic tape coatings are: surface resistivity of the insulating coating, coating adhesion, and magnetic loss of the tape. Additionally, surface insulating coating porosity is selected as an extended indicator. The weighting factors for surface resistivity, coating adhesion, magnetic loss, and surface insulating coating porosity are 0.3, 0.3, 0.25, and 0.15 respectively.

[0079] For example, confirming the aging state of the amorphous alloy strip based on the scoring results specifically includes:

[0080] The aging state of the amorphous alloy strip is determined based on the evaluation score range in which the scoring result falls; the aging state corresponding to the evaluation score range includes "severe deterioration", "deterioration", "good" and "excellent".

[0081] As can be seen from the above embodiments, the weight factors w1 to w4 are 0 <w1~w N <1, the sum is 1.

[0082] Based on empirical values, the weighting factors are set to w1~w4 = {0.3, 0.3, 0.15, 0.25}. The number of evaluation index dimensions N is 4, including: s m Surface resistivity, F m Adhesion between surface insulating coating and tape, X m P represents the porosity of the surface coating. m Magnetic loss of the strip.

[0083] According to Formula 1, the performance of the insulating coating of amorphous alloy soft magnetic tape after aging is divided into four levels: severely deteriorated, deteriorated, good, and excellent.

[0084]

[0085]

[0086] Compared to existing technologies, the present invention provides an aging test method for amorphous alloy strips. This method involves surface-treating the amorphous alloy strip and then placing it in an aging device, simultaneously applying thermal stress, electrical stress, and mechanical stress loads to enrich the external stress conditions and achieve a wider range of environmental simulations that closely resemble real aging conditions. During the application of stepped thermal stress, the cumulative effect of thermal aging is utilized to accelerate the aging test, solving the problem of long test times for accelerated aging under constant temperature conditions. Finally, the insulation coating performance of the amorphous alloy strip is scored, and the aging state of the amorphous alloy strip is confirmed based on the scoring results, accurately and intuitively reflecting the aging results of the amorphous alloy strip under simulated aging conditions.

[0087] One embodiment of this application provides an aging test device for amorphous alloy strips, including: a pretreatment module, a connection module, an aging module, an offline testing module, and a status confirmation module.

[0088] The pretreatment module is used to perform surface pretreatment on the amorphous alloy strip, so that an annular metal coating is formed on the upper and lower surfaces of the amorphous alloy strip.

[0089] The connection module connects the amorphous alloy strip to the microammeter in the aging device via metal leads, and places the amorphous alloy strip in the metal clamp in the aging device.

[0090] An aging module is used to seal the aging device, apply constant mechanical stress, constant electric field, and stepped thermal stress to the amorphous alloy strip through the aging device, and obtain the surface resistivity of the insulating coating of the amorphous alloy strip at intervals through the microammeter.

[0091] The offline testing module causes the aging device to stop running after a preset aging time, and performs offline testing of aging parameters.

[0092] The status confirmation module scores the insulation coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulation coating, and confirms the aging status of the amorphous alloy strip based on the scoring results.

[0093] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working process of the positioning device described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0094] Compared to existing technologies, the aging test apparatus for amorphous alloy strips provided in this invention involves surface-treating the amorphous alloy strip and then placing it into an aging sub-device. Simultaneously, thermal stress, electrical stress, and mechanical stress loads are applied to enrich the external stress conditions, achieving a wider range of environmental simulations that closely resemble real aging conditions. During the application of stepped thermal stress, the cumulative effect of thermal aging is utilized to accelerate the aging test, solving the problem of high test time for accelerated aging under constant temperature conditions. Finally, the insulation coating performance of the amorphous alloy strip is scored, and the aging state of the amorphous alloy strip is confirmed based on the scoring results, accurately and intuitively reflecting the aging results of the amorphous alloy strip under simulated aging conditions.

[0095] One embodiment of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aging test method for amorphous alloy strips as described above.

[0096] In the several embodiments provided in this application, it will be understood that each block in the flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than those shown in the figures. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved.

[0097] If the aforementioned functions are implemented as software functional modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0098] The above description represents the preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. An aging test method for amorphous alloy strip, characterized in that, include: The amorphous alloy strip is pretreated to form annular metal coatings on the upper and lower surfaces of the amorphous alloy strip. The amorphous alloy strip is connected to a microammeter in the aging device via metal leads. The amorphous alloy strip is placed in a metal fixture in the aging device. Specifically, the amorphous alloy strip is used as a high-voltage electrode with a central annular metal coating on its upper surface, a measuring electrode with an outer annular metal coating on its upper surface, and a protective electrode with an outer annular metal coating on its lower surface. These electrodes are then connected to the microammeter in the aging device via metal leads. The aging device is sealed, and constant mechanical stress, constant electric field, and stepped thermal stress are applied to the amorphous alloy strip through the aging device. The surface resistivity of the insulating coating of the amorphous alloy strip is obtained at intervals through the microammeter. The aging device is stopped after running for a preset aging time, and aging parameters are measured offline. The insulation coating performance of the amorphous alloy strip is scored based on the aging parameters and the surface resistivity of the insulation coating, and the aging state of the amorphous alloy strip is confirmed based on the scoring results. Specifically, applying stepped thermal stress to the amorphous alloy strip through the aging device includes: The amorphous alloy strip is heated at a constant heating rate, with each heating interval lasting for an equal duration and the interval duration being much shorter than the duration of the isothermal phase.

2. The aging test method for amorphous alloy strip as described in claim 1, characterized in that, The aging device includes: a metal clamp, a mechanical hand, an electric field module, a heating module, and a microamperometer; The metal clamp holds the amorphous alloy strip by mechanical contact; the mechanical tentacles apply mechanical stress to the amorphous alloy strip by mechanical contact; the electric field module and the heating module are installed on the inner wall of the aging device to apply a constant electric field and stepped thermal stress to the amorphous alloy strip; the microammeter is placed in an isolated independent space inside the aging device; the metal clamp and the mechanical tentacles are connected to the inner wall of the aging device.

3. The aging test method for amorphous alloy strip as described in claim 1, characterized in that, The step of connecting the amorphous alloy strip to the microammeter in the aging device via metal leads and placing the amorphous alloy strip in the metal clamp of the aging device specifically includes: The metal clamps in the aging device fix the two ends of the amorphous alloy strip through mechanical contact.

4. The aging test method for amorphous alloy strip as described in claim 1, characterized in that, The aging parameters include: coating adhesion and strip magnetic loss.

5. The aging test method for amorphous alloy strip as described in claim 1, characterized in that, The insulation coating performance of the amorphous alloy strip is evaluated based on the aging parameters and the surface resistivity of the insulation coating, specifically as follows: Each aging parameter and the surface resistivity of the insulating coating are assigned a corresponding weighting factor; the sum of all weighting factors is 1. The insulation coating performance score of the amorphous alloy strip is calculated based on the aging parameters and corresponding weighting factors, the surface resistivity of the insulation coating and corresponding weighting factors.

6. The aging test method for amorphous alloy strip as described in claim 5, characterized in that, The weighting factors corresponding to the aging parameters and the weighting factors corresponding to the surface resistivity of the insulating coating are obtained from an expert system, or from empirical values, or from training an artificial neural network.

7. The aging test method for amorphous alloy strip as described in claim 1, characterized in that, The process of confirming the aging state of the amorphous alloy strip based on the scoring results specifically includes: The aging state of the amorphous alloy strip is determined based on the estimated score range in which the scoring result falls; the aging states corresponding to the estimated score range include "severe deterioration", "deterioration", "good" and "excellent".

8. An aging test apparatus for amorphous alloy strips, characterized in that, include: The pretreatment module is used to perform surface pretreatment on the amorphous alloy strip, so that an annular metal coating is formed on the upper and lower surfaces of the amorphous alloy strip. The connection module connects the amorphous alloy strip to the microammeter in the aging device via metal leads, and places the amorphous alloy strip in the metal fixture in the aging device. Specifically, it includes: using the central annular metal coating on the upper surface of the amorphous alloy strip as a high-voltage electrode, the outer annular metal coating on the upper surface of the amorphous alloy strip as a measuring electrode, and the outer annular metal coating on the lower surface of the amorphous alloy strip as a protective electrode, and connecting them to the microammeter in the aging device via metal leads. An aging module is used to seal the aging device, apply constant mechanical stress, constant electric field, and stepped thermal stress to the amorphous alloy strip through the aging device, and obtain the surface resistivity of the insulating coating of the amorphous alloy strip at intervals through the microammeter. The offline testing module allows the aging device to stop running after a preset aging time and tests the aging parameters offline. The status confirmation module scores the insulation coating performance of the amorphous alloy strip based on the aging parameters and the surface resistivity of the insulation coating, and confirms the aging status of the amorphous alloy strip based on the scoring results. Specifically, applying stepped thermal stress to the amorphous alloy strip through the aging device includes: The amorphous alloy strip is heated at a constant heating rate, with each heating interval lasting for an equal duration and the interval duration being much shorter than the duration of the isothermal phase.

9. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed by a processor, implements the aging test method for amorphous alloy strip as described in any one of claims 1 to 7.

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