Chip package testing system and testing method thereof

Abstract

The present application relates to the field of chip package testing, in particular to a chip package testing system and a testing method thereof. The system comprises a testing box, the inside of which is divided into a testing room and a chip in-out room. The testing room is divided into a feeding room with adsorption equipment and detection equipment, a discharging room, and two groups of detection rooms. The rotating plate is divided into four groups of rotatable detection stations, each of which is provided with a positioning assembly. The testing box is also provided with a feeding box, a qualified product discharging box, an unqualified product discharging box, and a controller. Through the rotation of the detection stations, the feeding room, the two groups of detection rooms, and the discharging room are sequentially opposite, and the feeding, detection, and classified discharging are automatically performed. The structure is compact, and the items for simultaneous detection can be installed and replaced according to needs. The detection process is cyclic, continuous, efficient, and intelligent. After the detection is completed, the qualified products and unqualified products are classified and recycled, the detection results are intuitive, the classification and statistics are convenient, and the detection efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of chip packaging testing, and more particularly to a chip packaging testing system and its testing method. Background Technology

[0002] The casing used to house semiconductor integrated circuit chips serves to place, fix, seal, and protect the chip, enhance its electrical and thermal performance, and act as a bridge between the chip's internal world and external circuits—the contacts on the chip are connected to the pins of the package by wires, and these pins, in turn, connect to other devices via wires on the printed circuit board. Therefore, packaging plays a crucial role in CPUs and other LSI integrated circuits. During the chip packaging process, it is necessary to inspect the packaging quality, such as performing pressure tests on the packaged chip to check its strength.

[0003] In existing technologies, chip packaging is typically tested manually or using simple machinery, requiring multiple tests to complete the entire inspection process. This results in low automation, consuming significant manpower and yielding unsatisfactory test results. There is no cyclical, continuous, efficient, or intelligent testing process, and the test results are not intuitive. Therefore, we propose a chip packaging testing system and its testing method. Summary of the Invention

[0004] To address the problems existing in the background technology, this invention proposes a chip packaging testing system and its testing method. This invention automatically performs feeding, testing, and sorting of materials by rotating a testing station that sequentially aligns with the feeding room, two sets of testing rooms, and the discharging room. The system has a compact structure, and the items to be tested can be installed and replaced as needed. The testing process is cyclical, continuous, efficient, and intelligent. After testing, qualified and unqualified products are sorted and collected. The test results are intuitive, facilitating classification and statistical analysis, and improving testing efficiency.

[0005] This invention proposes a chip packaging testing system, including a test chamber. The test chamber has a rotating plate inside, which divides it into an upper test chamber and a lower chip inlet / outlet chamber. The test chamber has a cross-shaped upper partition, dividing its upper space into a circularly arranged inlet chamber, an outlet chamber, and two sets of testing chambers. Each of the inlet, outlet, and testing chambers has a movable lifting mechanism. Adsorption devices are installed on the lifting mechanisms of the inlet and outlet chambers, and testing devices are installed on the lifting mechanisms of the testing chambers. A cross-shaped lower partition is located at the top of the rotating plate, dividing it into four circularly arranged testing stations. A motor drives the lower part of the testing stations. The testing stations rotate with the rotating plate, sequentially facing or intersecting with the inlet, the two testing chambers, and the outlet chamber. Each testing station has an opening connecting the test chamber and the chip inlet / outlet chamber; a positioning component is installed on the opening. The upper and lower partitions have transmitters and receivers for position sensors. The test chamber is also equipped with a feed box, a qualified product discharge box, a non-qualified product discharge box, and a controller.

[0006] Preferably, the feed box is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber; the qualified product outlet box is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber; the unqualified product outlet box is disposed on the outer wall of the test chamber and is located above the qualified product outlet box; the test chamber is provided with a push port that communicates with the unqualified product outlet box.

[0007] Preferably, the positioning assembly includes a drive unit, a rotating disk, a translation frame, a cylinder, and a positioning element; the rotating disk is driven by the drive unit and is rotatably mounted on the through-hole, with an inlet / outlet slot at the center of the rotating disk; the translation frame has an L-shaped structure, is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot; the cylinder is mounted on both sides of the inlet / outlet slot, and controls the opening and closing of the inlet / outlet slot by driving the horizontal section of the translation frame on the corresponding side to slide, while simultaneously clamping the vertical section; the positioning element is mounted on the vertical section of the translation frame.

[0008] Preferably, the longitudinal section of the inlet and outlet channel is a T-shaped structure; the vertical sliding mechanism of the translation frame is set on the horizontal section of the inlet and outlet channel.

[0009] Preferably, the driving component includes a second motor, a first gear, and a second gear; the first gear is located at the bottom of the rotating disk and has an inlet and outlet that connect to the through slot; the second motor is located on one side of the rotating disk; the second gear is keyed to the main shaft of the second motor and meshes with the first gear.

[0010] Preferably, each testing station is equipped with a pusher component; the pusher component includes a second cylinder and a pusher plate. The second cylinder is mounted on the lower partition frame, and the telescopic rod is equipped with the pusher plate, enabling it to move horizontally between the two sets of translation frames.

[0011] Preferably, guide rods are provided on both sides of the inlet and outlet through slot; the two ends of the guide rods are slidably connected to the corresponding side of the translation frame, and the middle end is provided with an anti-slip locking sleeve; the horizontal section of the translation frame is provided with a locking groove that matches the locking sleeve.

[0012] Preferably, the positioning component includes a spring and a positioning rod; a mounting hole is provided at the bottom of the vertical section of the translation frame; the spring is disposed in the mounting hole; one end of the positioning rod extends into the mounting hole and is connected to the spring, and the other end is provided with a hemispherical positioning head.

[0013] Preferably, the movable lifting component includes a third motor, a lead screw, a moving block, and a third cylinder; the third motor is mounted on the upper partition frame; the lead screw is driven by the third motor to rotate within the feeding chamber, the discharging chamber, and the two sets of testing chambers; the moving block is threadedly connected to the lead screw to achieve horizontal movement; the third cylinder is located at the lower end of the moving block, and its telescopic rod end is detachably connected to the adsorption equipment / testing equipment.

[0014] This invention further proposes a testing method for the above-mentioned chip packaging testing system, the steps of which are as follows:

[0015] S1. Select the required testing equipment and install it at the end of the cylinder's three telescopic rod in the two sets of testing chambers; install the adsorption equipment at the end of the cylinder's three telescopic rod in the feeding chamber and discharging chamber.

[0016] S2. Place the packaged chips to be tested into the feed box;

[0017] S3. The rotating plate rotates, and the upper and lower partition frames rotate relative to each other until the transmitter and receiver of each set of positioning sensors sense the positioning. The positioning component opposite to the feeding chamber works, and the cylinder drives the two sets of translation frames to move backward, opening the inlet and outlet passage. Driven by the cylinder, the adsorption equipment passes through the passage, extends into the feeding box, and adsorbs the chip at the top to the detection chamber.

[0018] S4. The translation frame moves in opposite directions, the inlet and outlet through slots close, and the positioning component clamps and fixes the chip.

[0019] S5. The rotating plate rotates, transferring the fixed chip to two sets of detection rooms in sequence for various tests. During the detection process, the moving lifting component drives the detection equipment to move up and down and back and forth, while the driving component drives the rotating disk to rotate, so as to comprehensively and multi-angle detect the quality of chip packaging.

[0020] S6. After the test is completed, the fixed chip enters the discharge room; if it is a qualified product, the qualified chip is transferred to the qualified product discharge box by opening the inlet and outlet channel; if it is a defective product, the pusher plate pushes it into the pusher port and it falls into the defective product discharge box.

[0021] Compared with the prior art, the present invention has the following beneficial technical effects:

[0022] This invention features a feeding chamber, a discharging chamber, and two sets of testing chambers at the top of the testing chamber, four testing stations in the middle, and a chip loading / unloading chamber at the bottom. By rotating the testing stations, they sequentially align with the feeding chamber, the two testing chambers, and the discharging chamber, automatically performing feeding, testing, and sorting / discharging. The structure is compact, and the items being tested can be installed and replaced as needed. The testing process is cyclical, continuous, efficient, and intelligent. After testing, qualified and unqualified products are sorted and collected. The test results are intuitive, facilitating classification and statistics, and improving testing efficiency. During testing, two sets of translation frames move backwards, opening the inlet / outlet channels. The adsorption device extends into the feeding box, adsorbing the topmost chip into the testing chamber. The translation frames then move forwards, closing the inlet / outlet channels. Simultaneously, the chip is placed on the horizontal section of the translation frames. Positioning components on both sides clamp and fix the chip. The opening and closing of the inlet / outlet channels and the placement and clamping of the positioning components are synchronized using the sliding control of the translation frames. This ensures efficient and stable material handling and fixing, facilitating subsequent testing. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the structure of one embodiment of the present invention;

[0024] Figure 2 This is a cross-sectional view (first perspective) of one embodiment of the present invention;

[0025] Figure 3 This is a cross-sectional view (second perspective) of one embodiment of the present invention;

[0026] Figure 4 This is a top view of the positioning component in one embodiment of the present invention;

[0027] Figure 5 for Figure 3 Enlarged view of point A in the image;

[0028] Figure 6 for Figure 4 Enlarged view of section B in the middle.

[0029] Reference numerals: 1. Test box; 2. Feed box; 3. Qualified product discharge box; 4. Unqualified product discharge box; 5. Controller; 6. Rotating plate; 7. Lower separator frame; 8. Upper separator frame; 9. Position sensor; 10. Motor 3; 11. Lead screw; 12. Moving block; 13. Cylinder 3; 14. Feeding chamber; 15. Discharge chamber; 16. Inspection chamber; 17. Rotating disk; 18. Inlet / outlet channel; 19. Translation frame; 20. Positioning component; 21. Cylinder 1; 22. Gear 1; 23. Gear 2; 24. Motor 2; 25. Motor 1; 26. Spring; 27. Positioning rod; 28. Guide rod; 29. ​​Clamping sleeve; 30. Cylinder 2; 31. Push plate; 32. Pushing component; 33. Positioning assembly. Detailed Implementation

[0030] Example 1

[0031] like Figure 1-3 As shown, the chip packaging testing system proposed in this invention includes a test chamber 1. A rotating plate 6 is installed inside the test chamber 1, dividing it into an upper testing chamber and a lower chip inlet / outlet chamber. The testing chamber is equipped with a cross-shaped upper partition 8, dividing its upper space into a circularly arranged inlet chamber 14, outlet chamber 15, and two sets of testing chambers 16. Movable lifting components are installed in the inlet chamber 14, outlet chamber 15, and the two sets of testing chambers 16. Adsorption devices are installed on the lifting ends of the movable lifting components in the inlet chamber 14 and outlet chamber 15; testing devices are installed on the lifting ends of the movable lifting components in the two sets of testing chambers 16. A cross-shaped lower partition frame 7 is installed at the upper end of the rotating plate 6, dividing it into four groups of testing stations arranged in a ring. A motor 25 is installed at the lower end to drive the rotation of the testing stations. The testing stations rotate with the rotating plate 6, and are successively opposite or staggered with the feeding chamber 14, the two groups of testing chambers 16, and the discharging chamber 15. Each group of testing stations is provided with an opening connecting the testing chamber and the chip entry / exit chamber. A positioning component 33 is installed on the opening. The upper partition frame 8 and the lower partition frame 7 are provided with the transmitter and receiver of the position sensor 9. The testing box 1 is also provided with a feeding box 2, a qualified product discharge box 3, a non-qualified product discharge box 4, and a controller 5.

[0032] Furthermore, the feed box 2 is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber 14; the qualified product outlet box 3 is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber 15; the unqualified product outlet box 4 is disposed on the outer wall of the test chamber 1 and is located above the qualified product outlet box 3; the test chamber 1 is provided with a push port that communicates with the unqualified product outlet box 4.

[0033] This embodiment includes an upper feeding chamber 14, an outlet chamber 15, and two sets of inspection chambers 16, four sets of inspection stations in the middle, and a lower chip entry / exit chamber. By rotating the inspection stations, they sequentially align with the feeding chamber 14, the two sets of inspection chambers 16, and the outlet chamber 15, automatically performing feeding, inspection, and sorting of the chips. The inspection items can be installed and replaced as needed. The inspection process is cyclical, continuous, efficient, and intelligent. After inspection, qualified and unqualified products are sorted and collected. The inspection results are intuitive, facilitating classification and statistics, and improving inspection efficiency.

[0034] Example 2

[0035] like Figure 1-3As shown, the chip packaging testing system proposed in this invention includes a test chamber 1. A rotating plate 6 is installed inside the test chamber 1, dividing it into an upper testing chamber and a lower chip inlet / outlet chamber. The testing chamber is equipped with a cross-shaped upper partition 8, dividing its upper space into a circularly arranged inlet chamber 14, outlet chamber 15, and two sets of testing chambers 16. Movable lifting components are installed in the inlet chamber 14, outlet chamber 15, and the two sets of testing chambers 16. Adsorption devices are installed on the lifting ends of the movable lifting components in the inlet chamber 14 and outlet chamber 15; testing devices are installed on the lifting ends of the movable lifting components in the two sets of testing chambers 16. A cross-shaped lower partition frame 7 is installed at the upper end of the rotating plate 6, dividing it into four groups of testing stations arranged in a ring. A motor 25 is installed at the lower end to drive the rotation of the testing stations. The testing stations rotate with the rotating plate 6, and are successively opposite or staggered with the feeding chamber 14, the two groups of testing chambers 16, and the discharging chamber 15. Each group of testing stations is provided with an opening connecting the testing chamber and the chip entry / exit chamber. A positioning component 33 is installed on the opening. The upper partition frame 8 and the lower partition frame 7 are provided with the transmitter and receiver of the position sensor 9. The testing box 1 is also provided with a feeding box 2, a qualified product discharge box 3, a non-qualified product discharge box 4, and a controller 5.

[0036] Furthermore, the feed box 2 is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber 14; the qualified product outlet box 3 is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber 15; the unqualified product outlet box 4 is disposed on the outer wall of the test chamber 1 and is located above the qualified product outlet box 3; the test chamber 1 is provided with a push port that communicates with the unqualified product outlet box 4.

[0037] As shown in 4-5, the positioning assembly 33 includes a driving component, a rotating disk 17, a translation frame 19, a cylinder 21, and a positioning component 20. The rotating disk 17 is driven by the driving component and is rotatably mounted on the through-hole. The center of the rotating disk 17 is provided with an inlet / outlet slot 18. The translation frame 19 has an L-shaped structure and is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot 18. The cylinder 21 is mounted on both sides of the inlet / outlet slot 18 and controls the opening and closing of the inlet / outlet slot 18 by driving the horizontal section of the translation frame 19 on the corresponding side to slide, while simultaneously clamping the vertical section. The positioning component 20 is mounted on the vertical section of the translation frame 19.

[0038] This embodiment features a positioning component 33. Before feeding, cylinder 21 drives two sets of translation frames 19 to move backwards, opening the inlet / outlet channel 18. Driven by cylinder 13, the adsorption device passes through the opening and extends into the feeding box 2, adsorbing the top chip into the detection chamber. Then, the translation frames 19 move in opposite directions, closing the inlet / outlet channel 18, and simultaneously placing the chip on the horizontal section of the translation frames 19. The positioning components 20 on both sides clamp and fix the chip. The sliding control of the translation frames 19 to open and close the inlet / outlet channel 18, and the simultaneous placement and clamping of the positioning components 20, ensures efficient and stable material handling and fixing, facilitating subsequent testing.

[0039] Example 3

[0040] like Figure 1-3 As shown, the chip packaging testing system proposed in this invention includes a test chamber 1. A rotating plate 6 is installed inside the test chamber 1, dividing it into an upper testing chamber and a lower chip inlet / outlet chamber. The testing chamber is equipped with a cross-shaped upper partition 8, dividing its upper space into a circularly arranged inlet chamber 14, outlet chamber 15, and two sets of testing chambers 16. Movable lifting components are installed in the inlet chamber 14, outlet chamber 15, and the two sets of testing chambers 16. Adsorption devices are installed on the lifting ends of the movable lifting components in the inlet chamber 14 and outlet chamber 15; testing devices are installed on the lifting ends of the movable lifting components in the two sets of testing chambers 16. A cross-shaped lower partition frame 7 is installed at the upper end of the rotating plate 6, dividing it into four groups of testing stations arranged in a ring. A motor 25 is installed at the lower end to drive the rotation of the testing stations. The testing stations rotate with the rotating plate 6, and are successively opposite or staggered with the feeding chamber 14, the two groups of testing chambers 16, and the discharging chamber 15. Each group of testing stations is provided with an opening connecting the testing chamber and the chip entry / exit chamber. A positioning component 33 is installed on the opening. The upper partition frame 8 and the lower partition frame 7 are provided with the transmitter and receiver of the position sensor 9. The testing box 1 is also provided with a feeding box 2, a qualified product discharge box 3, a non-qualified product discharge box 4, and a controller 5.

[0041] Furthermore, the feed box 2 is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber 14; the qualified product outlet box 3 is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber 15; the unqualified product outlet box 4 is disposed on the outer wall of the test chamber 1 and is located above the qualified product outlet box 3; the test chamber 1 is provided with a push port that communicates with the unqualified product outlet box 4.

[0042] As shown in 4-5, the positioning assembly 33 includes a driving component, a rotating disk 17, a translation frame 19, a cylinder 21, and a positioning component 20. The rotating disk 17 is driven by the driving component and is rotatably mounted on the through-hole. The center of the rotating disk 17 is provided with an inlet / outlet slot 18. The translation frame 19 has an L-shaped structure and is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot 18. The cylinder 21 is mounted on both sides of the inlet / outlet slot 18 and controls the opening and closing of the inlet / outlet slot 18 by driving the horizontal section of the translation frame 19 on the corresponding side to slide, while simultaneously clamping the vertical section. The positioning component 20 is mounted on the vertical section of the translation frame 19.

[0043] Furthermore, the longitudinal section of the inlet / outlet channel 18 is a T-shaped structure; the vertical sliding frame 19 is vertically slidably set on the horizontal section of the inlet / outlet channel 18. The chip enters the inlet / outlet channel 18 from the vertical section and is then fixed on the horizontal section of the inlet / outlet channel 18, providing good support.

[0044] Furthermore, the driving components include a second motor 24, a first gear 22, and a second gear 23. The first gear 22 is located at the bottom of the rotating disk 17 and has an inlet / outlet connecting to the through-slot 18. The second motor 24 is located on one side of the rotating disk 17. The second gear 23 is keyed to the main shaft of the second motor 24 and meshes with the first gear 22. Through the transmission of the second motor 24, the first gear 22 and the second gear 23 are driven to rotate, ultimately achieving the rotation of the rotating disk 17. This facilitates adjusting the chip angle during detection, resulting in more comprehensive detection.

[0045] Example 4

[0046] like Figure 1-3 As shown, the chip packaging testing system proposed in this invention includes a test chamber 1. A rotating plate 6 is installed inside the test chamber 1, dividing it into an upper testing chamber and a lower chip inlet / outlet chamber. The testing chamber is equipped with a cross-shaped upper partition 8, dividing its upper space into a circularly arranged inlet chamber 14, outlet chamber 15, and two sets of testing chambers 16. Movable lifting components are installed in the inlet chamber 14, outlet chamber 15, and the two sets of testing chambers 16. Adsorption devices are installed on the lifting ends of the movable lifting components in the inlet chamber 14 and outlet chamber 15; testing devices are installed on the lifting ends of the movable lifting components in the two sets of testing chambers 16. A cross-shaped lower partition frame 7 is installed at the upper end of the rotating plate 6, dividing it into four groups of testing stations arranged in a ring. A motor 25 is installed at the lower end to drive the rotation of the testing stations. The testing stations rotate with the rotating plate 6, and are successively opposite or staggered with the feeding chamber 14, the two groups of testing chambers 16, and the discharging chamber 15. Each group of testing stations is provided with an opening connecting the testing chamber and the chip entry / exit chamber. A positioning component 33 is installed on the opening. The upper partition frame 8 and the lower partition frame 7 are provided with the transmitter and receiver of the position sensor 9. The testing box 1 is also provided with a feeding box 2, a qualified product discharge box 3, a non-qualified product discharge box 4, and a controller 5.

[0047] Furthermore, the feed box 2 is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber 14; the qualified product outlet box 3 is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber 15; the unqualified product outlet box 4 is disposed on the outer wall of the test chamber 1 and is located above the qualified product outlet box 3; the test chamber 1 is provided with a push port that communicates with the unqualified product outlet box 4.

[0048] As shown in 4-5, the positioning assembly 33 includes a driving component, a rotating disk 17, a translation frame 19, a cylinder 21, and a positioning component 20. The rotating disk 17 is driven by the driving component and is rotatably mounted on the through-hole. The center of the rotating disk 17 is provided with an inlet / outlet slot 18. The translation frame 19 has an L-shaped structure and is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot 18. The cylinder 21 is mounted on both sides of the inlet / outlet slot 18 and controls the opening and closing of the inlet / outlet slot 18 by driving the horizontal section of the translation frame 19 on the corresponding side to slide, while simultaneously clamping the vertical section. The positioning component 20 is mounted on the vertical section of the translation frame 19.

[0049] Furthermore, the longitudinal section of the inlet / outlet channel 18 is a T-shaped structure; the vertical sliding frame 19 is vertically slidably set on the horizontal section of the inlet / outlet channel 18. The chip enters the inlet / outlet channel 18 from the vertical section and is then fixed on the horizontal section of the inlet / outlet channel 18, providing good support.

[0050] Furthermore, the driving components include a second motor 24, a first gear 22, and a second gear 23. The first gear 22 is located at the bottom of the rotating disk 17 and has an inlet / outlet connecting to the through-slot 18. The second motor 24 is located on one side of the rotating disk 17. The second gear 23 is keyed to the main shaft of the second motor 24 and meshes with the first gear 22. Through the transmission of the second motor 24, the first gear 22 and the second gear 23 are driven to rotate, ultimately achieving the rotation of the rotating disk 17. This facilitates adjusting the chip angle during detection, resulting in more comprehensive detection.

[0051] like Figure 6 As shown, each testing station is equipped with a pusher component 32; the pusher component 32 includes a second cylinder 30 and a pusher plate 31. The second cylinder 30 is mounted on the lower separator 7, and the pusher plate 31 is mounted on the telescopic rod, allowing it to move horizontally between the two sets of translation frames 19. When the test result is unqualified, the pusher plate 31 is driven to move horizontally by the second cylinder 30, pushing the chip on the translation frame 19 to the push port, where it falls into the unqualified product discharge box 4. Qualified products enter the qualified product discharge box 3, automatically completing the sorting process.

[0052] like Figure 2-3 As shown, the movable lifting component includes a motor 10, a lead screw 11, a moving block 12, and a cylinder 13. The motor 10 is mounted on the upper partition frame 8. The lead screw 11, driven by the motor 10, rotates within the feeding chamber 14, the discharging chamber 15, and the two sets of testing chambers 16. The moving block 12, threadedly connected to the lead screw 11, moves horizontally. The cylinder 13 is located at the lower end of the moving block 12, and its telescopic rod end is detachably connected to the adsorption / testing equipment. The motor 10 drives the lead screw 11 to rotate, causing the moving block 12 to move on the lead screw 11, which in turn drives the cylinder 13 to move horizontally. Simultaneously, the telescopic rod end of the cylinder 13 moves up and down, ultimately adjusting the position of the adsorption / testing equipment to meet the needs of feeding, testing, and discharging.

[0053] Example 5

[0054] like Figure 1-3 As shown, the chip packaging testing system proposed in this invention includes a test chamber 1. A rotating plate 6 is installed inside the test chamber 1, dividing it into an upper testing chamber and a lower chip inlet / outlet chamber. The testing chamber is equipped with a cross-shaped upper partition 8, dividing its upper space into a circularly arranged inlet chamber 14, outlet chamber 15, and two sets of testing chambers 16. Movable lifting components are installed in the inlet chamber 14, outlet chamber 15, and the two sets of testing chambers 16. Adsorption devices are installed on the lifting ends of the movable lifting components in the inlet chamber 14 and outlet chamber 15; testing devices are installed on the lifting ends of the movable lifting components in the two sets of testing chambers 16. A cross-shaped lower partition frame 7 is installed at the upper end of the rotating plate 6, dividing it into four groups of testing stations arranged in a ring. A motor 25 is installed at the lower end to drive the rotation of the testing stations. The testing stations rotate with the rotating plate 6, and are successively opposite or staggered with the feeding chamber 14, the two groups of testing chambers 16, and the discharging chamber 15. Each group of testing stations is provided with an opening connecting the testing chamber and the chip entry / exit chamber. A positioning component 33 is installed on the opening. The upper partition frame 8 and the lower partition frame 7 are provided with the transmitter and receiver of the position sensor 9. The testing box 1 is also provided with a feeding box 2, a qualified product discharge box 3, a non-qualified product discharge box 4, and a controller 5.

[0055] Furthermore, the feed box 2 is slidably disposed in the chip inlet / outlet chamber, with its upper opening opposite to the feed chamber 14; the qualified product outlet box 3 is disposed in the chip inlet / outlet chamber, with its upper opening opposite to the outlet chamber 15; the unqualified product outlet box 4 is disposed on the outer wall of the test chamber 1 and is located above the qualified product outlet box 3; the test chamber 1 is provided with a push port that communicates with the unqualified product outlet box 4.

[0056] As shown in 4-5, the positioning assembly 33 includes a driving component, a rotating disk 17, a translation frame 19, a cylinder 21, and a positioning component 20. The rotating disk 17 is driven by the driving component and is rotatably mounted on the through-hole. The center of the rotating disk 17 is provided with an inlet / outlet slot 18. The translation frame 19 has an L-shaped structure and is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot 18. The cylinder 21 is mounted on both sides of the inlet / outlet slot 18 and controls the opening and closing of the inlet / outlet slot 18 by driving the horizontal section of the translation frame 19 on the corresponding side to slide, while simultaneously clamping the vertical section. The positioning component 20 is mounted on the vertical section of the translation frame 19.

[0057] Furthermore, the longitudinal section of the inlet / outlet channel 18 is a T-shaped structure; the vertical sliding frame 19 is vertically slidably set on the horizontal section of the inlet / outlet channel 18. The chip enters the inlet / outlet channel 18 from the vertical section and is then fixed on the horizontal section of the inlet / outlet channel 18, providing good support.

[0058] Furthermore, the driving components include a second motor 24, a first gear 22, and a second gear 23. The first gear 22 is located at the bottom of the rotating disk 17 and has an inlet / outlet connecting to the through-slot 18. The second motor 24 is located on one side of the rotating disk 17. The second gear 23 is keyed to the main shaft of the second motor 24 and meshes with the first gear 22. Through the transmission of the second motor 24, the first gear 22 and the second gear 23 are driven to rotate, ultimately achieving the rotation of the rotating disk 17. This facilitates adjusting the chip angle during detection, resulting in more comprehensive detection.

[0059] like Figure 6 As shown, each testing station is equipped with a pusher component 32; the pusher component 32 includes a second cylinder 30 and a pusher plate 31. The second cylinder 30 is mounted on the lower separator 7, and the pusher plate 31 is mounted on the telescopic rod, allowing it to move horizontally between the two sets of translation frames 19. When the test result is unqualified, the pusher plate 31 is driven to move horizontally by the second cylinder 30, pushing the chip on the translation frame 19 to the push port, where it falls into the unqualified product discharge box 4. Qualified products enter the qualified product discharge box 3, automatically completing the sorting process.

[0060] Furthermore, guide rods 28 are provided on both sides of the inlet / outlet slot 18; the two ends of the guide rods 28 are slidably connected to the corresponding translation frames 19, and the middle end is provided with an anti-slip locking sleeve 29; the horizontal section of the translation frame 19 is provided with a locking groove that matches the locking sleeve 29. The translation frame 19 moves along the guide rods 28 with a stable trajectory. When the two sets of translation frames 19 approach each other, the locking sleeve 29 engages with the locking grooves on both sides, providing more stable support for the chip.

[0061] Furthermore, the positioning component 20 includes a spring 26 and a positioning rod 27; a mounting hole is provided at the bottom of the vertical section of the translation frame 19; the spring 26 is disposed in the mounting hole; one end of the positioning rod 27 extends into the mounting hole and connects to the spring 26, and the other end is provided with a hemispherical positioning head. When the chip is placed on the vertical section of the translation frame 19, the positioning rods 27 on both sides gradually move closer to it until the chip is locked. The spring 26 pushes the positioning rod 27 to fix the chip firmly, ensuring its stability during the testing process.

[0062] like Figure 2-3As shown, the movable lifting component includes a motor 10, a lead screw 11, a moving block 12, and a cylinder 13. The motor 10 is mounted on the upper partition frame 8. The lead screw 11, driven by the motor 10, rotates within the feeding chamber 14, the discharging chamber 15, and the two sets of testing chambers 16. The moving block 12, threadedly connected to the lead screw 11, moves horizontally. The cylinder 13 is located at the lower end of the moving block 12, and its telescopic rod end is detachably connected to the adsorption / testing equipment. The motor 10 drives the lead screw 11 to rotate, causing the moving block 12 to move on the lead screw 11, which in turn drives the cylinder 13 to move horizontally. Simultaneously, the telescopic rod end of the cylinder 13 moves up and down, ultimately adjusting the position of the adsorption / testing equipment to meet the needs of feeding, testing, and discharging.

[0063] Example 6

[0064] This invention further proposes a testing method for the above-mentioned chip packaging testing system, the steps of which are as follows:

[0065] S1. Select the required testing equipment and install it at the end of the telescopic rod of cylinder 3 13 in the two sets of testing chambers 16; install the adsorption equipment at the end of the telescopic rod of cylinder 3 13 in the feeding chamber 14 and the discharging chamber 15.

[0066] S2. Place the packaged chip to be tested into the feed box 2;

[0067] S3, the rotating plate 6 rotates, the upper partition frame 8 and the lower partition frame 7 rotate relative to each other until the transmitter and receiver of each set of position sensors 9 sense the position; the positioning component 33 opposite to the feeding chamber 14 works, and the cylinder 1 21 drives the two sets of translation frames 19 to move backward, and the inlet and outlet channel 18 opens; the adsorption equipment, driven by the cylinder 3 13, passes through the opening, extends into the feeding box 2, and adsorbs the chip at the top to the detection chamber;

[0068] S4. The translation frame 19 moves to the opposite side, the inlet and outlet through slot 18 closes, and the positioning component 20 clamps and fixes the chip.

[0069] S5. The rotating plate 6 rotates, transferring the fixed chip to two sets of detection rooms 16 in sequence for various tests. During the test, the moving lifting component drives the detection equipment to move up and down and back and forth, while the driving component drives the rotating disk 17 to rotate, so as to comprehensively and multi-angle test the quality of chip packaging.

[0070] S6. After the test is completed, the fixed chip enters the discharge chamber 15. If it is a qualified product, the qualified chip is transferred to the qualified product discharge box 3 by opening the inlet and outlet channel. If it is a defective product, the pusher plate 31 pushes it into the pusher port and it falls into the defective product discharge box 4.

[0071] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited thereto. Various changes can be made within the scope of knowledge possessed by those skilled in the art without departing from the spirit of the present invention.

Claims

1. A chip packaging and testing system, characterized in that, Includes a test chamber (1); the test chamber (1) is equipped with a rotating plate (6) inside, which divides it into an upper test chamber and a lower chip entry and exit chamber; The testing chamber is equipped with a cross-shaped upper partition frame (8), which divides the space above it into a circular feeding room (14), a discharging room (15), and two sets of testing rooms (16); the feeding room (14), the discharging room (15), and the two sets of testing rooms (16) are all equipped with movable lifting components; Adsorption devices are installed on the movable lifting parts of the feeding chamber (14) and the discharging chamber (15); detection devices are installed on the movable lifting parts of the two sets of detection chambers (16). A cross-shaped lower partition frame (7) is provided at the upper end of the rotating plate (6), which divides it into four groups of testing stations arranged in a ring. A motor (25) is provided at the lower end to drive its rotation. The testing stations rotate with the rotating plate (6) and are opposite or staggered to the feeding room (14), the two groups of testing rooms (16), and the discharging room (15) in sequence. Each group of testing stations is provided with an opening that connects the testing chamber and the chip entry and exit chamber. A positioning component (33) is provided on the opening. The upper partition (8) and lower partition (7) are equipped with the transmitter and receiver of the position sensor (9); The test box (1) is also equipped with a feed box (2), a qualified product discharge box (3), a non-qualified product discharge box (4) and a controller (5); The positioning assembly (33) includes a drive unit, a rotating disk (17), a translation frame (19), a cylinder (21), and a positioning component (20). The rotating disk (17) is driven by the drive unit and is rotatably mounted on the through-hole. The center of the rotating disk (17) is provided with an inlet / outlet slot (18). The translation frame (19) has an L-shaped structure and is mirror-image, and is mounted on the upper end slot of the inlet / outlet slot (18). The cylinder (21) is mounted on both sides of the inlet / outlet slot (18), and controls the opening and closing of the inlet / outlet slot (18) by driving the horizontal section of the translation frame (19) on the corresponding side to slide, while simultaneously clamping the vertical section. The positioning component (20) is mounted on the vertical section of the translation frame (19). The longitudinal section of the inlet / outlet channel (18) is a T-shaped structure; the vertical sliding of the translation frame (19) is set on the horizontal section of the inlet / outlet channel (18); The driving components include a second motor (24), a first gear (22), and a second gear (23); the first gear (22) is located at the bottom of the rotating disk (17), and the first gear (22) has an inlet and outlet that connect to the inlet and outlet through slot (18); the second motor (24) is located on one side of the rotating disk (17); the second gear (23) is keyed to the main shaft of the second motor (24) and meshes with the first gear (22); The movable lifting component includes a third motor (10), a lead screw (11), a moving block (12), and a third cylinder (13); the third motor (10) is mounted on the upper partition frame (8); the lead screw (11) is driven by the third motor (10) to rotate in the feeding chamber (14), the discharging chamber (15), and the two sets of detection chambers (16); the moving block (12) is threadedly connected to the lead screw (11) to achieve horizontal movement; the third cylinder (13) is located at the lower end of the moving block (12), and its telescopic rod end is detachably connected to the adsorption equipment / detection equipment.

2. The chip packaging and testing system according to claim 1, characterized in that, The feed box (2) is slidably set in the chip inlet and outlet chamber, with its upper opening opposite to the feed chamber (14); the qualified product outlet box (3) is set in the chip inlet and outlet chamber, with its upper opening opposite to the outlet chamber (15); the unqualified product outlet box (4) is set on the outer wall of the test box (1) and is located above the qualified product outlet box (3); the test box (1) is provided with a push port that communicates with the unqualified product outlet box (4).

3. The chip packaging and testing system according to claim 2, characterized in that, Each testing station is equipped with a pusher (32); the pusher (32) includes a second cylinder (30) and a pusher plate (31). The second cylinder (30) is set on the lower partition frame (7), and the telescopic rod is set with the pusher plate (31) so that it can move horizontally between the two sets of translation frames (19).

4. The chip packaging and testing system according to claim 1, characterized in that, Guide rods (28) are provided on both sides of the inlet and outlet through slot (18); the two ends of the guide rods (28) are slidably connected to the corresponding side of the translation frame (19), and the middle end is provided with an anti-slip locking sleeve (29); the horizontal section of the translation frame (19) is provided with a locking groove that matches the locking sleeve (29).

5. The chip packaging and testing system according to claim 1, characterized in that, The positioning component (20) includes a spring (26) and a positioning rod (27); the bottom of the vertical section of the translation frame (19) is provided with a mounting hole; the spring (26) is set in the mounting hole; one end of the positioning rod (27) extends into the mounting hole and connects to the spring (26), and the other end is provided with a hemispherical positioning head.

6. A test method for a chip packaging test system according to any one of claims 1-5, characterized in that, The steps are as follows: S1. Select the required testing equipment and install it at the end of the telescopic rod of cylinder three (13) in the two sets of testing chambers (16); install the adsorption equipment at the end of the telescopic rod of cylinder three (13) in the feeding chamber (14) and the discharging chamber (15); S2. Place the packaged chip to be tested into the feed box (2); S3. The rotating plate (6) rotates, and the upper partition frame (8) and the lower partition frame (7) rotate relative to each other until the transmitter and receiver of each set of position sensors (9) sense the position. The positioning component (33) opposite to the feeding chamber (14) works, and the cylinder one (21) drives the two sets of translation frames (19) to move backward, and the inlet and outlet through slot (18) opens. The adsorption device, driven by the cylinder three (13), passes through the through-hole, extends into the feeding box (2), and adsorbs the chip at the top to the detection chamber. S4. The translation frame (19) moves to the opposite side, the inlet and outlet slot (18) closes, and at the same time the positioning component (20) clamps and fixes the chip; S5. The rotating plate (6) rotates and transfers the fixed chip to the two sets of detection rooms (16) in turn to perform various tests. During the test, the moving lifting component drives the detection equipment to move up and down and back and forth, while the driving component drives the rotating disk (17) to rotate, so as to comprehensively and multi-angle test the quality of chip packaging. S6. After the test is completed, the fixed chip enters the discharge room (15). When it is a qualified product, the qualified chip is transferred to the qualified product discharge box (3) by opening the inlet and outlet channel. When it is a non-qualified product, the pusher plate (31) pushes it into the pusher port and it falls into the non-qualified product discharge box (4).

Images