A method and apparatus for testing the functionality of protective electronic products

Abstract

This invention belongs to the field of electronic product testing technology, specifically relating to a method and apparatus for functional testing of protective electronic products. The apparatus includes a main body, an internal testing platform, and a support platform located inside the main body and above the testing platform. It also includes a storage box, an electric push rod, a probe, a buffer section, a cleaning section, a rotating component, a positioning section, and a reset section. During testing, when the probe penetrates the cleaning section, the cleaning section cleans adhering impurities or oxides from the probe surface, ensuring stable contact between the probe and the electronic product contacts, thereby improving testing accuracy. During testing, when the probe contacts the electronic product contacts, the buffer section generates elastic force, applying a pushing force to the probe, ensuring tight contact between the probe and the electronic product contacts, improving the stability of the probe-contact contact and ensuring testing stability.

Description

Technical Field

[0001] This invention belongs to the field of electronic product testing technology, specifically relating to a method and apparatus for testing the function of protective electronic products. Background Technology

[0002] Electronic products are products that operate on the basis of electrical energy. There are many types of electronic products, including protective electronic products. To control the quality of electronic products, functional testing is usually performed during or after manufacturing. Before functional testing, probes are typically used to connect the electronic product to the testing equipment to form a complete testing circuit. During the testing process, some parts rely on operators manually holding and controlling the probes for contact. Dust or sweat can adhere to the probes during this process, causing oxidation or poor connection, which may affect the test results. Furthermore, the positioning effect of handheld probes is not ideal, and the probe testing process cannot be stable, resulting in insufficient overall testing accuracy.

[0003] For example, Chinese Patent Publication No. CN216411421U discloses an electronic product testing device, including a support plate. Electric push rods are connected to all four sides of the bottom of the support plate. Universal rollers are connected to the bottom ends of the electric push rods. A baffle is connected between the bottoms of the electric push rods, and a fixing mechanism is connected to the baffle. A support column is connected to one side of the top of the support plate, and an extension plate is connected to the top of the support column. A testing instrument is connected to the bottom of the extension plate near the support plate. An LED lighting panel is connected to the bottom of the testing instrument, and multiple testing devices are connected to the side walls of the testing instrument. The testing pen has a fixing ring on the side wall of the detector to match the testing pen. A display screen is connected to the detector. A placement plate is rotatably connected to the middle of the top of the support plate. The placement plate has a placement groove, and several positioning suction cups are connected in the placement groove. The testing pen is used to test electronic products. However, after repeated use, dust inevitably adheres to the testing pen during operation, which may cause oxidation or loose connection of the testing pen, potentially affecting the test results. At the same time, the positioning effect of the handheld testing pen is not ideal, and the testing pen cannot make stable contact with the contact point during the testing process, resulting in insufficient overall testing accuracy of the product. Summary of the Invention

[0004] The purpose of this invention is to provide a functional testing device for protective electronic products, which can clean impurities or metal shavings attached to the probe surface during testing, avoiding poor contact or oxidation of the probe during the testing process, while improving the stability of the contact between the probe and the contact point, thereby improving the accuracy of the test.

[0005] The specific technical solution adopted by this invention is as follows:

[0006] A functional testing device for protective electronic products, comprising a body, an internal testing platform, and a support platform located inside the body and above the testing platform, and further comprising:

[0007] A storage box is disposed inside a support platform and moves vertically within the support platform.

[0008] An electric actuator is fixed inside the machine body and located above the storage box. A connecting plate is installed at the output end of the electric actuator and the connecting plate is located inside the storage box.

[0009] The probe is located inside the storage box;

[0010] A buffer section is disposed at the upper end of the probe and is slidably connected to the connecting plate. The buffer section is used to provide a buffer distance when the probe is subjected to resistance.

[0011] A cleaning section is provided inside the storage box and located below the probe; the cleaning section is used to clean impurities from the probe surface.

[0012] A rotating component is disposed at the upper end of the cleaning part and is connected to the cleaning part. The rotating component is slidably connected to the connecting plate and is used to drive the cleaning part to rotate.

[0013] A positioning part is fixed inside the storage box and is slidably connected to a connecting plate. The positioning part is used to position the connecting plate.

[0014] The reset part is slidably connected to the support platform, and the lower end of the reset part is fixed to a stop block that contacts the lower part of the storage box. The reset part is used to restore the storage box to its original state.

[0015] The dust suction unit is connected to the rotating component, and one end of the dust suction unit is fixed on the support platform. The dust suction unit is used to absorb dust and impurities inside the cleaning unit.

[0016] In a preferred embodiment, the buffer includes a fixing ring a, a fixing tube, a fixing ring b, and a spring a. The fixing ring a is fixed to the upper end of the probe's outer side, the fixing tube is fixed to the upper end of the fixing ring a, the fixing tube is slidably connected to the connecting plate, the fixing ring b is fixed to the upper end of the fixing tube, and the spring a is disposed on the outer side of the fixing tube and located between the connecting plate and the fixing ring a.

[0017] In a preferred embodiment, the cleaning unit includes a cleaning tube a, a cleaning tube b, a cleaning brush, a magnetic ring, a cleaning cotton, and a plurality of extruders. The cleaning tube b is threadedly connected to the interior of the lower end of the storage box, the cleaning tube a is rotatably connected to the upper end of the cleaning tube b, the cleaning brush is disposed inside the cleaning tube a, the magnetic ring is disposed at the lower end of the interior of the cleaning tube a, the cleaning cotton is disposed inside the cleaning tube b, and the plurality of extruders are disposed inside the cleaning tube b and located outside the cleaning cotton.

[0018] In a preferred embodiment, the extrusion element includes an arcuate block and a compression spring. The arcuate block is disposed inside the cleaning tube b and near the cleaning cotton, and the compression spring is fixed to the side of the arcuate block away from the cleaning cotton.

[0019] In a preferred embodiment, under normal conditions, the spring is in a compressed state. After the probe penetrates the cleaning cotton and separates from it, a certain gap will appear at the point where the cleaning cotton is penetrated. The elastic force generated by the spring will push the arc block to move, squeezing the cleaning cotton and causing the point where the cleaning cotton is penetrated to contract.

[0020] In a preferred embodiment, the rotating component includes a helical portion and a vertical portion, the helical portion being located above the vertical portion, the helical portion being slidably connected to the connecting plate, and the vertical portion being fixedly connected to the cleaning pipe a.

[0021] In a preferred embodiment, the dust extraction unit includes a fan, a dust exhaust pipe, a connecting pipe, a fixing plate, and a telescopic pipe. The fan is fixed to the surface of the support platform, the dust exhaust pipe is fixed to the output end of the fan, and the other end of the dust exhaust pipe passes through the machine body and is located on the outside of the machine body. The connecting pipe is fixed to the input end of the fan, the fixing plate is fixed inside the machine body and is located above the connecting plate, the telescopic pipe is fixed to the upper end of the rotating component, the end of the connecting pipe away from the fan passes through the fixing plate, and the end of the telescopic pipe away from the rotating component is connected to the connecting pipe.

[0022] In a preferred embodiment, the positioning part includes a positioning bar and a limiting block. The positioning bar is fixed inside the storage box and passes through the connecting plate, and the limiting block is fixed at the upper end of the positioning bar and located above the connecting plate.

[0023] In a preferred embodiment, the reset part includes a reset rod, a stop block, a connecting block, and a spring b. The reset rod is slidably connected inside the support platform and near the storage box. The stop block is fixed to the lower end of the reset rod and contacts the storage box. The connecting block is fixed to the upper end of the reset rod. The spring b is disposed on the outside of the reset rod and located between the support platform and the connecting block.

[0024] A second objective of this invention is to provide a method for testing the functionality of protective electronic products, used in the aforementioned device for testing the functionality of protective electronic products, comprising the following steps:

[0025] Step 1: Place the electronic product to be tested on the testing table;

[0026] Step 2: Activate the electric push rod, which pushes the connecting plate and moves the storage box downwards. As the storage box moves downwards, it also moves the reset part synchronously.

[0027] When the reset section moves to its maximum travel, it will restrict the movement of the storage box;

[0028] Step 3: The electric push rod continues to run, and the electric push rod will push the connecting plate to move inside the storage box, so that the probe passes through the cleaning section and cleans the probe through the cleaning section. At the same time, the dust and impurities inside the cleaning section are absorbed through the dust suction section.

[0029] When the probe contacts the contact of the electronic product under test, the electric push rod continues to apply force, causing the buffer part to move inside the connecting plate, providing a buffer distance for the probe and making the probe make tight contact with the contact.

[0030] Step 4: Control the power supply of different probes according to the testing requirements to test the corresponding functions of the electronic product under test;

[0031] Step 5: Record the test data.

[0032] The technical effects achieved by this invention are as follows:

[0033] In this invention, during the detection process, when the probe penetrates the cleaning section, the cleaning section cleans the impurities or oxides adhering to the probe surface to ensure the stability of the contact between the probe and the electronic product contacts, thereby improving the accuracy of the detection.

[0034] In this invention, during testing, when the probe contacts the electronic product's contact point, the buffer part generates elastic force, applying a pushing force to the probe, ensuring tight contact between the probe and the electronic product's contact point. This improves the stability of the probe-contact contact during testing, avoids unexpected connection interruptions during the testing process, and ensures the stability of the testing. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the structure of the body of the present invention;

[0036] Figure 2 This is a schematic diagram of the structure of the support platform, storage box, electric push rod and connecting plate of the present invention.

[0037] Figure 3This is a schematic diagram of the connection between the storage box, electric push rod, connecting plate and reset part of the present invention;

[0038] Figure 4 This is a schematic diagram of the structure of the connecting plate of the present invention moving in the storage box;

[0039] Figure 5 This is a cross-sectional view of the storage box of the present invention;

[0040] Figure 6 This is a schematic diagram of the connection between the probe and the buffer section of the present invention;

[0041] Figure 7 This is a schematic diagram of the connection between the cleaning part and the rotating part of the present invention;

[0042] Figure 8 This is a schematic diagram of the structure of the present invention, showing the separation of the cleaning part and the rotating part;

[0043] Figure 9 This is an exploded view of the cleaning section of the present invention;

[0044] Figure 10 This is a cross-sectional view of the cleaning part of the present invention.

[0045] The attached diagram lists the components represented by each number as follows:

[0046] 1. Machine body; 2. Testing table; 3. Support platform; 4. Storage box; 5. Electric push rod; 6. Connecting plate; 7. Probe; 8. Rotating component;

[0047] 10. Buffer section; 11. Fixing ring a; 12. Fixing tube; 13. Fixing ring b; 14. Spring a;

[0048] 20. Cleaning section; 21. Cleaning tube a; 22. Cleaning tube b; 23. Cleaning brush; 24. Magnetic ring; 25. Cleaning cotton; 26. Arc block; 27. Compression spring;

[0049] 30. Positioning part; 31. Positioning rod; 32. Limiting block;

[0050] 40. Reset part; 41. Reset rod; 42. Stop block; 43. Connecting block; 44. Spring b;

[0051] 50. Dust extraction unit; 51. Fan; 52. Dust exhaust pipe; 53. Connecting pipe; 54. Fixing plate; 55. Telescopic pipe. Detailed Implementation

[0052] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0053] Many specific details are set forth in the following description in order to provide a full understanding of the invention. However, the invention may also be practiced in other ways different from those described herein, and those skilled in the art can make similar extensions without departing from the spirit of the invention. Therefore, the invention is not limited to the specific embodiments disclosed below.

[0054] Secondly, the term "an embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The phrase "in a preferred embodiment" appearing in different places throughout this specification does not necessarily refer to the same embodiment, nor is it a single or selective embodiment that mutually excludes other embodiments.

[0055] Secondly, the present invention is described in detail with reference to the schematic diagrams. When detailing the embodiments of the present invention, for ease of explanation, the cross-sectional views illustrating the device structure may be partially enlarged, not according to the usual scale. Furthermore, the schematic diagrams are merely examples and should not limit the scope of protection of the present invention. In addition, actual fabrication should include three-dimensional spatial dimensions of length, width, and depth. Example 1

[0056] Please see the appendix Figures 1 to 5As shown, this is the first embodiment of the present invention. This embodiment provides a functional testing device for protective electronic products. The functional testing device includes a body 1, a testing platform 2 disposed inside the body 1, and a support platform 3 disposed inside the body 1 and above the testing platform 2. It also includes a storage box 4, an electric push rod 5, a probe 7, a rotating component 8, a buffer 10, a cleaning component 20, a positioning component 30, a reset component 40, and a dust extraction component 50. The storage box 4 is disposed inside the support platform 3 and moves vertically within the support platform 3. The electric push rod 5 is fixed inside the body 1 and is located above the storage box 4. A connecting plate 6 is installed at the output end of the electric push rod 5 and is located inside the storage box 4. The probe 7 is disposed inside the storage box 4. The buffer 10 is disposed above the probe 7 and is slidably connected to the connecting plate 6. The punching part 10 provides a buffer distance when the probe 7 encounters resistance. The cleaning part 20 is located inside the storage box 4 and below the probe 7. The cleaning part 20 is used to clean impurities on the surface of the probe 7. The rotating part 8 is located at the upper end of the cleaning part 20 and is connected to the cleaning part 20. The rotating part 8 is slidably connected to the connecting plate 6 and is used to drive the cleaning part 20 to rotate. The positioning part 30 is fixed inside the storage box 4 and is slidably connected to the connecting plate 6. The positioning part 30 is used to position the connecting plate 6. The reset part 40 is slidably connected to the support platform 3, and the stop block 42 fixed at the lower end of the reset part 40 contacts the lower part of the storage box 4. The reset part 40 is used to restore the storage box 4 to its original state. The dust suction part 50 is connected to the rotating part 8 and one end of the dust suction part 50 is fixed to the support platform 3. The dust suction part 50 is used to absorb dust and impurities inside the cleaning part 20.

[0057] Specifically, the electronic product to be tested is placed on the testing stage 2, and the electric push rod 5 is activated. This push rod 5 pushes the connecting plate 6, causing the storage box 4 to move downwards. As the storage box 4 moves downwards, the reset part 40 moves synchronously. When the reset part 40 reaches its maximum stroke, it restricts the movement of the storage box 4. The electric push rod 5 continues to push the connecting plate 6 to move inside the storage box 4. While the connecting plate 6 moves inside the storage box 4, it is positioned by the positioning part 30, allowing the probe 7 to penetrate the cleaning part 20. Simultaneously, the rotating part 8 slides inside the connecting plate 6, causing the cleaning part 20 to rotate. The cleaning part 20 then cleans the probe 7. During cleaning, the dust and impurities inside the cleaning unit 20 are absorbed by the dust suction unit 50. When the probe 7 contacts the contact point of the electronic product under test, the electric push rod 5 continues to apply force, causing the buffer unit 10 to move inside the connecting plate 6 under force, providing a buffer distance for the probe 7 and ensuring that the probe 7 is in close contact with the contact point. According to the testing needs, different probes 7 are controlled to be energized to test the corresponding functions of the electronic product under test. After the test, the electric push rod 5 drives the connecting plate 6 to move back to its original position. During the movement, the reset unit 40 pushes the storage box 4 to move back to its original position for the next test.

[0058] In a preferred embodiment, please refer to Figure 5 and Figure 6 The buffer part 10 includes a fixing ring a11, a fixing tube 12, a fixing ring b13, and a spring a14. The fixing ring a11 is fixed to the upper end of the probe 7 outside, the fixing tube 12 is fixed to the upper end of the fixing ring a11, the fixing tube 12 is slidably connected to the connecting plate 6, the fixing ring b13 is fixed to the upper end of the fixing tube 12, and the spring a14 is disposed on the outside of the fixing tube 12 and located between the connecting plate 6 and the fixing ring a11.

[0059] In this embodiment, when the probe 7 contacts the contact of the electronic product under test, the connecting plate 6 continues to move, causing the fixing tube 12 to slide inside the connecting plate 6. At the same time, the spring a14 is compressed and generates elastic force. The elastic force generated when the spring a14 is compressed will exert a downward force on the probe 7, so that the probe 7 is in close contact with the contact of the electronic product under test, thereby improving the stability of the contact between the probe 7 and the contact.

[0060] Secondly, please refer to again Figures 7 to 10 The cleaning unit 20 includes a cleaning tube a21, a cleaning tube b22, a cleaning brush 23, a magnetic ring 24, a cleaning cotton 25, and multiple extrusion components. The cleaning tube b22 is threadedly connected to the interior of the lower end of the storage box 4. The cleaning tube a21 is rotatably connected to the upper end of the cleaning tube b22. The cleaning brush 23 is disposed inside the cleaning tube a21. The magnetic ring 24 is disposed at the lower end of the interior of the cleaning tube a21. The cleaning cotton 25 is disposed inside the cleaning tube b22. The multiple extrusion components are disposed inside the cleaning tube b22 and located outside the cleaning cotton 25.

[0061] It should be noted that the extrusion component includes an arc block 26 and a compression spring 27. The arc block 26 is located inside the cleaning tube b22 and close to the cleaning cotton 25, and the compression spring 27 is fixed on the side of the arc block 26 away from the cleaning cotton 25.

[0062] Furthermore, under normal conditions, the spring 27 is in a compressed state. After the probe 7 penetrates the cleaning cotton 25 and separates from it, a certain gap will appear at the point where the cleaning cotton 25 is penetrated. The elastic force generated by the spring 27 will push the arc block 26 to move, squeezing the cleaning cotton 25 and causing the point where the cleaning cotton 25 is penetrated to contract.

[0063] As described above, when probe 7 penetrates cleaning tube a21, probe 7 comes into contact with cleaning brush 23. Cleaning brush 23 cleans impurities or oxides from the surface of probe 7. The cleaned metal shavings fall onto the surface of magnetic ring 24 and are collected by magnetic ring 24. When probe 7 penetrates cleaning cotton 25, cleaning cotton 25 wipes the surface of probe 7 to clean any remaining impurities. After testing, probe 7 is removed from the inside of cleaning cotton 25. At the point where probe 7 penetrates the middle of cleaning cotton 25, the spring force of compression spring 27 causes arc block 26 to squeeze cleaning cotton 25, compressing and closing the penetration point. This ensures that probe 7 and cleaning cotton 25 remain in close contact during subsequent tests, guaranteeing the cleaning effect.

[0064] Secondly, please refer to it again. Figure 5 , Figure 7 and Figure 8 The rotating part 8 includes a spiral part and a vertical part. The spiral part is located above the vertical part. The spiral part is slidably connected to the connecting plate 6, and the vertical part is fixedly connected to the cleaning tube a21.

[0065] It should be noted that the connecting plate 6 has a spiral groove that matches the spiral part, so that the spiral part can rotate along the trajectory of the spiral groove.

[0066] It is worth mentioning that when the electric push rod 5 pushes the connecting plate 6 to move inside the storage box 4, the connecting plate 6 will generate a thrust on the rotating part 8, causing the spiral groove to squeeze the spiral part. Since the position of the connecting plate 6 moves inside the storage box 4, while the position of the rotating part 8 does not change relative to the storage box 4, the cleaning tube a21 and the cleaning tube b22 are rotatably connected, causing the spiral part to rotate along the trajectory of the spiral groove, which in turn causes the rotating part 8 to rotate. This causes the rotating part 8 to drive the cleaning tube a21 to rotate at the upper end of the cleaning tube b22, thereby causing the cleaning brush 23 to rotate around the surface of the probe 7 to clean the oxide part or dust and impurities on the surface of the probe 7.

[0067] Secondly, please refer to it again. Figure 4The dust extraction unit 50 includes a fan 51, a dust exhaust pipe 52, a connecting pipe 53, a fixing plate 54, and a telescopic pipe 55. The fan 51 is fixed on the surface of the support platform 3. The dust exhaust pipe 52 is fixed at the output end of the fan 51. The other end of the dust exhaust pipe 52 passes through the body 1 and is located on the outside of the body 1. The connecting pipe 53 is fixed at the input end of the fan 51. The fixing plate 54 is fixed inside the body 1 and is located above the connecting plate 6. The telescopic pipe 55 is fixed at the upper end of the rotating part 8. The end of the connecting pipe 53 away from the fan 51 passes through the fixing plate 54. The end of the telescopic pipe 55 away from the rotating part 8 is connected to the connecting pipe 53.

[0068] It should be noted that the rotating part 8 has a hollow structure, which facilitates the connection between the rotating part 8 and the cleaning part 20, ensuring the transmission of gas.

[0069] As described above, while the cleaning section 20 cleans the dust and impurities on the surface of the probe 7, the fan 51 is started, so that the gas inside the connecting pipe 53 enters the output end through the input end of the fan 51, and is then discharged through the dust exhaust pipe 52. Because the gas in the connecting pipe 53 is extracted, the telescopic pipe 55 and the rotating part 8 generate suction, which in turn absorbs the dust and impurities in the cleaning section 20, preventing the dust and impurities from adhering to the probe 7 and ensuring the cleanliness of the probe 7.

[0070] Secondly, please refer to it again. Figure 5 The positioning part 30 includes a positioning bar 31 and a limiting block 32. The positioning bar 31 is fixed inside the storage box 4 and passes through the connecting plate 6. The limiting block 32 is fixed at the upper end of the positioning bar 31 and is located above the connecting plate 6.

[0071] As described above, when the electric push rod 5 pushes the connecting plate 6 to move inside the storage box 4, the connecting plate 6 will slide on the surface of the positioning rod 31, so that the connecting plate 6 moves vertically along the positioning rod 31. The design of the limiting block 32 can prevent the connecting plate 6 from separating from the limiting block 32.

[0072] Secondly, please refer to it again. Figure 5 The reset part 40 includes a reset rod 41, a stop block 42, a connecting block 43, and a spring b44. The reset rod 41 is slidably connected inside the support platform 3 and close to the storage box 4. The stop block 42 is fixed to the lower end of the reset rod 41 and contacts the storage box 4. The connecting block 43 is fixed to the upper end of the reset rod 41. The spring b44 is disposed on the outside of the reset rod 41 and located between the support platform 3 and the connecting block 43.

[0073] As described above, when the electric push rod 5 pushes the storage box 4 to move, the storage box 4 pushes the stop block 42 to move downward, causing the reset rod 41 to move downward as well. This causes the spring b44 to be compressed. When the spring b44 is compressed to its maximum extent, the stop block 42 will stop moving, thereby stopping the storage box 4 from moving. After detection, when the electric push rod 5 cancels the pushing force applied to the storage box 4, the elastic force of the spring b44 causes the stop block 42 to generate an upward pushing force, which in turn generates an upward pushing force on the storage box 4, causing the storage box 4 to return to its original position.

[0074] Implementation of Column 2

[0075] This invention also discloses a method for testing the functionality of protective electronic products, specifically including the following steps:

[0076] Step 1: Place the electronic product to be tested on testing platform 2;

[0077] Step 2: Activate the electric push rod 5, which pushes the connecting plate 6 and drives the storage box 4 to move downward. When the storage box 4 moves downward, it drives the reset part 40 to move synchronously.

[0078] When the reset unit 40 moves to its maximum stroke, it will restrict the movement of the storage box 4;

[0079] Step 3: The electric push rod 5 continues to operate. The electric push rod 5 will push the connecting plate 6 to move inside the storage box 4, so that the probe 7 penetrates the cleaning section 20 and cleans the probe 7 through the cleaning section 20. At the same time, the dust and impurities inside the cleaning section 20 are absorbed by the dust suction section 50.

[0080] When the probe 7 contacts the contact of the electronic product under test, the electric push rod 5 continues to apply the pushing force, causing the buffer part 10 to move inside the connecting plate 6 under force, providing a buffer distance for the probe 7 and making the probe 7 in close contact with the contact.

[0081] Step 4: Control the power supply of different probes 7 according to the testing requirements to test the corresponding functions of the electronic product under test;

[0082] Step 5: Record the test data.

[0083] The working principle of this invention is as follows: The electronic product to be tested is placed on the testing stage 2. The electric push rod 5 is activated, causing it to push the connecting plate 6 and move the storage box 4 downwards. As the storage box 4 moves downwards, the reset part 40 moves synchronously. When the reset part 40 reaches its maximum stroke, it restricts the movement of the storage box 4. The electric push rod 5 continues to push the connecting plate 6 to move inside the storage box 4. While the connecting plate 6 moves inside the storage box 4, it is positioned by the positioning part 30, allowing the probe 7 to penetrate the cleaning part 20. Simultaneously, the rotating part 8 slides inside the connecting plate 6, causing the cleaning part 20 to rotate. The cleaning part 20 then... 7. Cleaning is performed. During cleaning, the dust and impurities inside the cleaning unit 20 are absorbed by the dust suction unit 50. When the probe 7 contacts the contact point of the electronic product under test, the electric push rod 5 continues to apply a pushing force, causing the buffer unit 10 to move inside the connecting plate 6 under force, providing a buffer distance for the probe 7 and ensuring that the probe 7 is in close contact with the contact point. According to the testing needs, different probes 7 are controlled to be energized to test the corresponding functions of the electronic product under test. After the test, the electric push rod 5 drives the connecting plate 6 to move back to the original position. During the movement, the reset unit 40 pushes the storage box 4 to move back to the original position for the next test.

[0084] The above description is merely a preferred embodiment of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention. Structures, devices, and operating methods not specifically described or explained in this invention are implemented according to conventional methods in the art unless otherwise specified or limited.

Claims

1. A functional testing device for protective electronic products, the functional testing device comprising a body (1), a testing platform (2) disposed inside the body (1), and a support platform (3) disposed inside the body (1) and above the testing platform (2), characterized in that: Also include: Storage box (4) is arranged in the inside of support table (3), the storage box (4) moves along the vertical direction in the inside of support table (3); Electric push rod (5) is fixed in the inside of machine body (1), and the electric push rod (5) is located above the storage box (4), the output end of the electric push rod (5) is installed with connecting plate (6), and the connecting plate (6) is located in the inside of the storage box (4); Probe (7) is arranged in the inside of storage box (4); Buffer part (10) is arranged in the upper end of probe (7), and the buffer part (10) is slidably connected with connecting plate (6), and the buffer part (10) is used to provide a buffer distance when the probe (7) is subjected to resistance; Cleaning part (20) is arranged in the inside of storage box (4) and is located at the lower part of probe (7), and the cleaning part (20) is used to clean the impurities on the surface of probe (7); Rotating part (8) is arranged in the upper end of cleaning part (20), and the rotating part (8) is communicated with cleaning part (20), the rotating part (8) is slidably connected with connecting plate (6), and the rotating part (8) is used to drive cleaning part (20) to rotate; Positioning part (30) is fixed in the inside of storage box (4), the positioning part (30) is slidably connected with connecting plate (6), and the positioning part (30) is used to position connecting plate (6); Reset part (40) is slidably connected with support table (3), and the lower end of the stop block (42) fixedly connected with the reset part (40) is in contact with the lower part of the storage box (4), and the reset part (40) is used to restore the storage box (4) to the original state; Dust collection part (50) is communicated with rotating part (8), one end of the dust collection part (50) is fixed on support table (3), and the dust collection part (50) is used to absorb the dust and impurities in the inside of cleaning part (20); The cleaning part (20) comprises cleaning pipe a (21), cleaning pipe b (22), cleaning brush (23), magnetic ring (24), cleaning cotton (25) and a plurality of extrusion pieces, the cleaning pipe b (22) is threadedly connected in the inside of the lower end of the storage box (4), the cleaning pipe a (21) is rotatably connected at the upper end of the cleaning pipe b (22), the cleaning brush (23) is arranged in the inside of the cleaning pipe a (21), the magnetic ring (24) is arranged at the lower end in the inside of the cleaning pipe a (21), the cleaning cotton (25) is arranged in the inside of the cleaning pipe b (22), and the plurality of extrusion pieces are arranged in the inside of the cleaning pipe b (22) and located outside the cleaning cotton (25); The extrusion piece comprises arc block (26) and compression spring (27), the arc block (26) is arranged in the inside of the cleaning pipe b (22) and is close to the position of the cleaning cotton (25), and the compression spring (27) is fixed on the side of the arc block (26) away from the cleaning cotton (25).

2. The electronic product function detection device according to claim 1, wherein: The buffer part (10) comprises a fixed ring a (11), a fixed tube (12), a fixed ring b (13) and a spring a (14), the fixed ring a (11) is fixed at the upper end outside the probe (7), the fixed tube (12) is fixed at the upper end of the fixed ring a (11), the fixed tube (12) is slidingly connected with the connecting plate (6), the fixed ring b (13) is fixed at the upper end of the fixed tube (12), and the spring a (14) is arranged outside the fixed tube (12) and between the connecting plate (6) and the fixed ring a (11).

3. The electronic product function detection device of claim 1, wherein: In the normal state, the compression spring (27) is in a compressed state, after the probe (7) penetrates the cleaning cotton (25) and is separated from the cleaning cotton (25), a certain gap will appear at the position penetrated by the cleaning cotton (25), and the elastic force generated by the compression spring (27) will push the circular arc block (26) to move, so that the cleaning cotton (25) is extruded, and the position penetrated by the cleaning cotton (25) is shrunk.

4. The electronic product function detection device of claim 1, wherein: The rotating part (8) comprises a spiral part and a vertical part, the spiral part is located at the upper part of the vertical part, the spiral part is slidingly connected with the connecting plate (6), and the vertical part is fixedly connected with the cleaning tube a (21).

5. The electronic product function detection device of claim 1, wherein: The dust suction part (50) comprises a fan (51), a dust discharge pipe (52), a connecting pipe (53), a fixed plate (54) and an extension pipe (55), the fan (51) is fixed on the surface of the support table (3), the dust discharge pipe (52) is fixed at the output end of the fan (51), the other end of the dust discharge pipe (52) penetrates the machine body (1) and is located outside the machine body (1), the connecting pipe (53) is fixed at the input end of the fan (51), the fixed plate (54) is fixed inside the machine body (1) and above the connecting plate (6), the extension pipe (55) is fixed at the upper end of the rotating part (8), one end of the connecting pipe (53) away from the fan (51) penetrates the fixed plate (54), and one end of the extension pipe (55) away from the rotating part (8) is in communication with the connecting pipe (53).

6. The electronic product function detection device of claim 1, wherein: The positioning part (30) comprises a positioning rod (31) and a limiting block (32), the positioning rod (31) is fixed inside the storage box (4) and penetrates the connecting plate (6), and the limiting block (32) is fixed at the upper end of the positioning rod (31) and above the connecting plate (6).

7. The electronic product function detection device of claim 1, wherein: The reset part (40) comprises a reset rod (41), a stop block (42), a connecting block (43) and a spring b (44), the reset rod (41) is slidingly connected inside the support table (3) and close to the position of the storage box (4), the stop block (42) is fixed at the lower end of the reset rod (41) and in contact with the storage box (4), the connecting block (43) is fixed at the upper end of the reset rod (41), and the spring b (44) is arranged outside the reset rod (41) and between the support table (3) and the connecting block (43).

8. A method for detecting the function of a protective electronic product, used in the protective electronic product function detection device according to any one of claims 1 to 7, characterized in that, The steps are as follows: Step 1: Place the electronic product to be tested on the detection table (2). Second step: start the electric push rod (5), so that the electric push rod (5) pushes the connecting plate (6) and drives the storage box (4) to move downward, the storage box (4) moves downward to drive the reset part (40) to move synchronously; When the reset part (40) moves to the maximum stroke, the movement of the storage box (4) is limited; Third step: the electric push rod (5) continues to run, the electric push rod (5) will push the connecting plate (6) to move inside the storage box (4), so that the probe (7) penetrates through the cleaning part (20) and cleans the probe (7) through the cleaning part (20), at the same time of cleaning, the dust and impurities inside the cleaning part (20) are absorbed by the dust suction part (50); When the probe (7) contacts the contact point of the electronic product to be detected, the electric push rod (5) continues to apply the pushing force, so that the buffer part (10) moves inside the connecting plate (6) under the stress, provides the buffer distance for the probe (7), and makes the probe (7) closely contact with the contact point; Fourth step: according to the detection needs, control different probes (7) to be electrified, and detect the corresponding functions of the electronic product to be detected; Fifth step: record the detection data.

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