Error calibration method and system for multi-channel voltage acquisition chip

Abstract

The application provides a kind of error calibration method of multichannel voltage acquisition chip, for the system error of multichannel voltage acquisition chip after factory calibration, the method comprises: determining n temperature ranges, the n temperature ranges match the working environment temperature of the multichannel voltage acquisition chip;The all channels of the multichannel voltage acquisition chip are successively divided into m stages from the first channel;Wherein, the number of channels contained in each stage channel is not equal;Wherein n and m are positive integers, and n≥3, m≥2;In each temperature range, the voltage acquisition voltage of the multichannel voltage acquisition chip is carried out, to obtain the error correction value corresponding to each temperature range in each stage channel in the m stage channel and store;When the multichannel voltage acquisition chip actually collects voltage, the corresponding stage channel error correction value in the temperature range of the current environment temperature is called to carry out error correction.

Description

Technical Field

[0001] This invention relates to the field of chip error calibration, and more particularly to an error calibration method and system for a multi-channel voltage acquisition chip. Background Technology

[0002] In the BMS (Battery Management System), a key component of new energy vehicles, the accuracy of the cell voltage acquisition chip (hereinafter referred to as the AFE chip) is particularly important. The AFE collects the cell voltage values ​​returned by the battery pack cells for cell fault detection, cell charge and discharge management control, and intervention and early warning of the overall vehicle control strategy. Although the battery pack output port exists in the form of high voltage, the actual management of the battery pack is achieved by analyzing and controlling the voltage parameters of each individual cell. The voltage range of commonly used cells is generally between 2V and 5V (the voltage varies for different cell types). Each cell voltage needs to be monitored to the millivolt level; therefore, the acquisition accuracy of the AFE chip is one of its most important parameters.

[0003] AFE chips typically have significant errors after tape-out. Therefore, each chip undergoes calibration before leaving the factory. The principle is to perform benchmark calibration based on parameter performance at different temperatures to minimize errors caused by chip temperature drift. However, due to differences in the internal circuit structure of the AFE chip, system measurement errors of the calibration device, ADC gain errors, and other factors, the AFE chip still has a systematic error of 1–3.5 mV after the first calibration, and this systematic error is difficult to eliminate. Summary of the Invention

[0004] This invention provides an error calibration method for a multi-channel voltage acquisition chip to eliminate system errors present in the multi-channel voltage acquisition chip after it leaves the factory.

[0005] According to a first aspect of the present invention, an error calibration method for a multi-channel voltage acquisition chip is provided for calibrating the system error of the multi-channel voltage acquisition chip after it leaves the factory. The method includes:

[0006] Define n temperature ranges, wherein the n temperature ranges are matched to the operating environment temperature of the multi-channel voltage acquisition chip;

[0007] The multi-channel voltage acquisition chip is divided into m orders starting from the first channel; the number of channels in each order is not equal; n and m are both positive integers, and n≥3, m≥2;

[0008] Within each temperature range, the multi-channel voltage acquisition chip acquires voltage to obtain and store the error correction value corresponding to each channel in the m-order channel within each temperature range.

[0009] When the multi-channel voltage acquisition chip actually acquires voltage, it retrieves the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction.

[0010] Optionally, within various temperature ranges, the multi-channel voltage acquisition chip is subjected to voltage acquisition to obtain the error correction value for each channel in the m-order channel, specifically including:

[0011] Within various temperature ranges, voltage excitation is applied to all channels of the multi-channel voltage acquisition chip, and the excitation voltage is acquired through m-order channels.

[0012] The difference between the excitation voltage and the voltage acquired by each channel is obtained as the error value corresponding to each channel; wherein, the error value of each channel is used to characterize the set of error values ​​of the voltage acquired by each channel within each channel.

[0013] Mathematical fitting is performed on the error value of each channel to obtain the error correction value of each channel.

[0014] Optionally, mathematical fitting is performed on the error value of each channel to obtain the error correction value for each channel, specifically including:

[0015] For the error value of each channel, N averaging schemes are applied, and each averaging scheme corresponds to a pseudo-error correction value; where N is a positive integer and N≥3;

[0016] The pseudo-error correction value and the error value of each channel are sequentially substituted into a first formula. When the result of the first formula is the smallest, the corresponding pseudo-error correction value is taken as the error correction value. The first formula is used to characterize the degree of dispersion of the error value of each channel relative to the pseudo-error correction value.

[0017] Optionally, the averaging scheme includes taking an average value.

[0018] Optionally, the averaging scheme includes taking an average value.

[0019] Optionally, the mean-finding scheme includes a bisection method.

[0020] Optionally, the first formula includes the standard deviation formula.

[0021] Optionally, when the multi-channel voltage acquisition chip actually acquires voltage, retrieving the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction specifically includes: when the multi-channel voltage acquisition chip actually acquires voltage, automatically retrieving the error correction value of each channel within the temperature range of the current ambient temperature, and repairing the acquired voltage of each channel within each channel.

[0022] Optionally, when the multi-channel voltage acquisition chip actually acquires voltage, retrieving the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction specifically includes: when the multi-channel voltage acquisition chip actually acquires voltage, automatically retrieving the error correction value of each channel within the temperature range of the current ambient temperature, and repairing the acquired voltage of each channel within each channel.

[0023] According to a second aspect of the present invention, an error calibration system for a multi-channel voltage acquisition chip is provided, for implementing the error calibration method for the multi-channel voltage acquisition chip provided by the second aspect and optional embodiments of the present invention, the system comprising:

[0024] The temperature division module and the channel division module are respectively used to determine n temperature ranges, which are matched with the operating environment temperature of the multi-channel voltage acquisition chip and to divide all channels of the multi-channel voltage acquisition chip into m levels starting from the first channel; wherein the number of channels in each level is not equal; where n and m are both positive integers, and n≥3, m≥2;

[0025] The calibration module is used to acquire voltages from the multi-channel voltage acquisition chip within various temperature ranges to obtain the error correction value for each channel in the m-order channel within each temperature range.

[0026] The storage module is used to store n temperature ranges, m channels, and the error correction values ​​corresponding to each channel in each temperature range;

[0027] The main control module is used to retrieve the corresponding channel error correction value within the temperature range of the current ambient temperature when the multi-channel voltage acquisition chip actually acquires voltage, and then perform error correction.

[0028] According to a third aspect of the present invention, an electronic device is provided, comprising a processor and a memory.

[0029] The memory is used to store code and related data;

[0030] The processor is used to execute code in the memory to implement the error calibration method of the multi-channel voltage acquisition chip provided by the second aspect and alternative embodiments of the present invention.

[0031] According to a fourth aspect of the present invention, a storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the error calibration method for the multi-channel voltage acquisition chip provided by the second aspect and alternative embodiments of the present invention.

[0032] By considering the influence of ambient temperature and channel order on the multi-channel voltage acquisition chip, n temperature ranges are determined. All channels of the multi-channel voltage acquisition chip are then sequentially divided into m orders, starting from the first channel. Voltage is then acquired from the multi-channel voltage acquisition chip within each temperature range to obtain and store the error correction value for each order of the m channels within each temperature range. When the multi-channel voltage acquisition chip actually acquires voltage, the error correction value for the corresponding order of the channel within the current ambient temperature range is retrieved for error correction. Attached Figure Description

[0033] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0034] Figure 1 The flowchart of the error calibration method for the multi-channel voltage acquisition chip provided in the embodiments of the present invention Figure 1 ;

[0035] Figure 2 The flowchart of the error calibration method for the multi-channel voltage acquisition chip provided in the embodiments of the present invention Figure 2 ;

[0036] Figure 3 The flowchart of the error calibration method for the multi-channel voltage acquisition chip provided in the embodiments of the present invention Figure 3 ;

[0037] Figure 4 This is a structural block diagram of the error calibration system for a multi-channel voltage acquisition chip provided in an embodiment of the present invention. Attached Figure Description

[0039] 10-Temperature Division Module;

[0040] 20-Channel partitioning module;

[0041] 30 - Calibration Module;

[0042] 40 - Storage module;

[0043] 50 - Main control module. Detailed Implementation

[0044] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention. The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and accompanying drawings of the present invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the present invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or devices.

[0045] Before describing the embodiments of the present invention, a brief explanation of the design concept of the present invention will be given first:

[0046] Although multi-channel voltage acquisition chips undergo an error calibration using an ATE (Automatic Test Equipment) machine before leaving the factory, this calibration only corrects the chip's internal structural parameters according to manufacturing requirements and does not consider the impact of ambient temperature, channel order, and other factors on the multi-channel voltage acquisition chip during actual use. Therefore, this invention considers the linear errors caused by various influencing factors on the multi-channel voltage acquisition chip, performs error simulation, and obtains and stores the corresponding error correction values. When the multi-channel voltage acquisition chip actually acquires voltage, it retrieves the error correction value corresponding to the current environmental conditions and corrects the error in the multi-channel voltage acquisition chip.

[0047] Please refer to Figure 1 This invention provides an error calibration method for a multi-channel voltage acquisition chip, used to calibrate the system error of the multi-channel voltage acquisition chip after it leaves the factory. The method includes:

[0048] S1: Determine n temperature ranges, wherein the n temperature ranges are matched to the operating environment temperature of the multi-channel voltage acquisition chip.

[0049] S2: Divide all channels of the multi-channel voltage acquisition chip into m orders starting from the first channel; where the number of channels in each order is not equal; where n and m are both positive integers, and n≥3, m≥2.

[0050] S3: Within each temperature range, the multi-channel voltage acquisition chip is used to acquire voltages to obtain and store the error correction values ​​corresponding to each channel in the m-order channel within each temperature range.

[0051] S4: When the multi-channel voltage acquisition chip actually acquires voltage, it retrieves the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction.

[0052] As a specific implementation method, the multi-channel voltage acquisition chip described in this embodiment of the invention is a battery cell voltage acquisition chip, also known as an AFE chip.

[0053] Please refer to Figure 2 In one specific implementation, S3 involves sampling voltages from the multi-channel voltage acquisition chip within various temperature ranges to obtain the error correction value for each channel in the m-th order. Specifically, this includes:

[0054] S31: Within each temperature range, apply voltage excitation to all channels of the multi-channel voltage acquisition chip, and acquire the excitation voltage through m-order channels.

[0055] S32: Obtain the difference between the excitation voltage and the voltage acquired by each channel as the error value corresponding to each channel; wherein, the error value of each channel is used to characterize the set of error values ​​of the voltage acquired by each channel within each channel.

[0056] S33: Perform mathematical fitting on the error value of each channel to obtain the error correction value for each channel.

[0057] Please refer to Figure 3 As a specific implementation method, S33 performs mathematical fitting on the error value of each channel to obtain the error correction value of each channel, specifically including:

[0058] S331: For the error value of each channel, N averaging schemes are applied, and each averaging scheme corresponds to a pseudo-error correction value; where N is a positive integer and N≥3.

[0059] S332: Substitute the pseudo-error correction value and the error value of each channel into a first formula in sequence. When the result of the first formula is the smallest, the corresponding pseudo-error correction value is taken as the error correction value; wherein the first formula is used to characterize the degree of dispersion of the error value of each channel relative to the pseudo-error correction value.

[0060] As a specific implementation, in S4, when the multi-channel voltage acquisition chip actually acquires voltage, the error correction value of the corresponding channel within the temperature range of the current ambient temperature is retrieved for error correction. Specifically, this includes: when the multi-channel voltage acquisition chip actually acquires voltage, automatically retrieving the error correction value of each channel within the temperature range of the current ambient temperature, and repairing the acquired voltage of each channel within each channel.

[0061] As a specific implementation, in step S4, when the multi-channel voltage acquisition chip actually acquires voltage, retrieving the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction further includes: when the multi-channel voltage acquisition chip actually acquires voltage, if the number of channels with errors in a certain channel exceeds a first threshold of the total number of channels in that channel, then the error correction value corresponding to that channel within the temperature range of the current ambient temperature is retrieved, and the acquired voltage of each channel in that channel is corrected for error; if the number of channels with errors in a certain channel is lower than the first threshold of the total number of channels in that channel, then there is no need to correct the error of that channel.

[0062] As a detailed embodiment, the entire error calibration process is illustrated using a 16-channel voltage acquisition chip as an example:

[0063] In the process of using the 16-channel voltage acquisition chip in this embodiment of the invention, it was found that different operating ambient temperatures and different channel orders would cause linearity errors to the voltage acquisition chip. Specifically, the effect of different channel orders on the voltage acquisition chip is as follows: the first to eighth channels of the 16-channel voltage acquisition chip are divided into first-order channels; the ninth to sixteenth channels are divided into second-order channels; and a voltage excitation of 2000mV is applied to the voltage acquisition chip. For specific data, please refer to Table 1.

[0064]

[0065] Table 1

[0066] As shown in Table 1 above, after the voltage acquisition chip leaves the factory, there is still a large error between the actual cell voltage measurement value and the value acquired by the voltage acquisition chip. This error is caused by the different channel orders. In the voltage acquisition chip, this error generally exists in the form of a fixed offset trend (e.g., the actual cell voltage value is greater than or less than the value acquired by the voltage acquisition chip).

[0067] The specific impact of different operating ambient temperatures on the voltage acquisition chip is as follows: A voltage excitation of 2000mV was applied to the voltage acquisition chip under low temperature, normal temperature, and high temperature conditions, respectively, and only the voltage acquired by the first-order channel of the voltage acquisition chip was referenced. Specific data can be found in Table 2.

[0068]

[0069] Table 2

[0070] As shown in Table 2 above, after the voltage acquisition chip leaves the factory, there is still a large error between the actual cell voltage measurement value and the value acquired by the voltage acquisition chip. This error is caused by different temperature conditions. In the voltage acquisition chip, this error generally exists in the form of a fixed offset trend (such as the actual cell voltage value being greater than or less than the value acquired by the voltage acquisition chip).

[0071] Therefore, the possible operating environment temperature of the voltage acquisition chip is divided into low temperature, normal temperature, and high temperature; where low temperature is less than -10℃; normal temperature is -10℃ to 60℃; and high temperature is greater than 60℃. The channels of the voltage acquisition chip are also divided into first-order channels and second-order channels; where the first-order channels are channels one through eight; and the second-order channels are channels nine through sixteen. Of course, the influencing factors considered in this embodiment may vary depending on the actual usage scenario, such as different measurement ranges, different humidity levels, etc., which are not limited here. Furthermore, the division of temperature range and channel order can also be changed according to actual needs. For example, temperature can also be divided into low temperature, medium-low temperature, normal temperature, medium-high temperature, and high temperature, etc., which are not limited here. The channel order can be divided according to the specific number of channels; for example, a 32-channel chip can be divided into four orders of 8 channels each, which is not limited here.

[0072] First, under low-temperature conditions, the voltage acquisition chip is voltage-excited by an ATE (Automatic Temperature Regulator) machine. After the voltage acquisition chip acquires the excitation voltage, it transmits the voltage data to the ATE machine. The ATE machine calculates the difference between the current excitation voltage value and the voltage acquired by each channel in each stage of the voltage acquisition chip to obtain the error values ​​of the first and second stage channels under low-temperature conditions. The error value of each stage channel is used to characterize the set of error values ​​of the voltage acquired by each channel within each stage channel. Various averaging schemes are applied to the error values ​​of the first and second stage channels, including average, median, bisection, and normal distribution, etc., which will not be listed individually. For each stage channel, each averaging scheme corresponds to a pseudo-error correction value. Then, the pseudo-error correction value and the error value of each stage channel are successively substituted into the standard deviation formula to obtain the pseudo-error correction value corresponding to the minimum standard deviation, which is used as the error correction value of that stage channel. The standard deviation formula can also be replaced with other formulas that can characterize the degree of dispersion, which is not limited here.

[0073] The error correction values ​​obtained from the first-order channel and the second-order channel are stored; specifically, the storage method is to select an 8-bit register of the voltage acquisition chip.

[0074] Bits 1 and 2 are used to store the error base; specifically, 0b00: 0.1mv; 0b01: 0.2mv; 0b10: 0.3mv; 0b11: 1.0mv; of course, the specific error base can be changed according to the requirements, and is not limited here.

[0075] Bits 3 and 4 are used to store the error multiplier corresponding to bits 1 and 2; specifically, 0b00 represents 1x; 0b01 represents 2x; 0b10 represents 3x; 0b11 represents 5x; of course, the specific error multiplier can be changed according to the requirements, and is not limited here.

[0076] The 5th bit is used to store the sign of the error correction value; specifically, 0b0 indicates a positive error bias; 0b1 indicates a negative error bias.

[0077] The 6th bit is used to store the channel order; specifically, 0b0 indicates the first-order channel; 0b1 indicates the second-order channel.

[0078] Bits 7 and 8 are used to store the temperature range; specifically, 0b00: no calibration required; 0b01: low temperature; 0b10: room temperature; 0b11: high temperature. Please refer to Table 3 for details.

[0079]

[0080] Table 3

[0081] For the error correction value of the first-order channel under low-temperature conditions, its storage address is set as follows: bits 7 and 8 are selected as 10; bit 6 is selected as 1; and bits 5 to 1 are selected according to the magnitude of the error correction value. The storage of the error correction value of the second-order channel under low-temperature conditions is the same as that of the first-order channel, and will not be described again here.

[0082] Under both normal and high temperature conditions, the error correction values ​​of the first and second channels of the voltage acquisition chip are acquired and stored, following the same steps as described above under low temperature conditions, and will not be repeated here. Of course, in addition to storing the error correction values ​​of each channel under different temperature conditions in the registers of the voltage acquisition chip, they can also be stored in a computer and retrieved via code; this is not limited here.

[0083] When the voltage acquisition chip actually acquires the voltage, there are two methods for error correction:

[0084] The first method is as follows: When the voltage acquisition chip actually acquires voltage, it automatically retrieves the error correction value of the corresponding channel according to the current ambient temperature to correct the error. The voltage acquisition chip then outputs the corrected acquisition voltage to the MCU of the control unit through a digital signal. At this time, the acquisition voltage actually read by the MCU is the corrected value, thereby realizing error calibration.

[0085] The second method involves the following steps: When the voltage acquisition chip actually acquires voltage, the MCU of the control unit first reads the acquired voltage. Based on the number of channels with errors in each stage, it determines whether error correction is needed. If the number of channels with errors in each stage exceeds five, the MCU retrieves the error correction value corresponding to each channel within the current ambient temperature range and performs error correction on each channel in each stage, thus achieving error calibration. If the number of channels with errors in each stage is less than five, no calibration is required. Of course, the set error calibration threshold can be adjusted according to requirements and is not limited here.

[0086] This invention provides an error calibration method for the multi-channel voltage acquisition chip, with a calibration accuracy of up to 0.1mV and a maximum calibration range of up to 5mV. Since the error range of voltage acquisition chips on the market is generally ±2mV to ±5mV, a calibration range of 5mV can meet the calibration requirements of most voltage acquisition chips.

[0087] Please refer to Figure 4This invention also provides an error calibration system for a multi-channel voltage acquisition chip, used to implement the error calibration method for the multi-channel voltage acquisition chip provided in this invention. The system includes:

[0088] Temperature division module 10 and channel division module 20 are respectively used to determine n temperature ranges, the n temperature ranges being matched with the operating environment temperature of the multi-channel voltage acquisition chip and used to divide all channels of the multi-channel voltage acquisition chip into m levels starting from the first channel; wherein, the number of channels contained in each level is not equal; where n and m are both positive integers, and n≥3, m≥2;

[0089] The calibration module 30 is used to collect voltage from the multi-channel voltage acquisition chip in various temperature ranges to obtain the error correction value corresponding to each channel in the m-order channel in various temperature ranges.

[0090] The storage module 40 is used to store n temperature ranges, m-order channels, and the error correction values ​​corresponding to each order channel in each temperature range;

[0091] The main control module 50 is used to retrieve the corresponding channel error correction value within the temperature range of the current ambient temperature when the multi-channel voltage acquisition chip actually acquires the voltage, and then perform error correction.

[0092] This invention also provides an electronic device, including a processor and a memory.

[0093] The memory is used to store code and related data;

[0094] The processor is used to execute the code in the memory to implement the error calibration method of the multi-channel voltage acquisition chip provided in the embodiments of the present invention.

[0095] This invention also provides a storage medium storing a computer program that, when executed by a processor, implements the error calibration method for the multi-channel voltage acquisition chip provided in this invention.

[0096] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. An error calibration method for a multi-channel voltage acquisition chip, used to calibrate the system error of the multi-channel voltage acquisition chip after it leaves the factory, characterized in that, The method includes: Define n temperature ranges, wherein the n temperature ranges are matched to the operating environment temperature of the multi-channel voltage acquisition chip; The multi-channel voltage acquisition chip is divided into m orders starting from the first channel; the number of channels in each order is not equal; n and m are both positive integers, and n≥3, m≥2; Within each temperature range, the multi-channel voltage acquisition chip is used to acquire voltage to obtain and store the error correction value corresponding to each channel in the m-order channel within each temperature range. When the multi-channel voltage acquisition chip actually acquires voltage, it retrieves the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction.

2. The error calibration method for the multi-channel voltage acquisition chip according to claim 1, characterized in that, Within various temperature ranges, voltage acquisition is performed on the multi-channel voltage acquisition chip to obtain the error correction value for each channel in the m-order channel, specifically including: Within various temperature ranges, voltage excitation is applied to all channels of the multi-channel voltage acquisition chip, and the excitation voltage is acquired through m-order channels. The difference between the excitation voltage and the voltage acquired by each channel is obtained as the error value corresponding to each channel; wherein, the error value of each channel is used to characterize the set of error values ​​of the voltage acquired by each channel within each channel. Mathematical fitting is performed on the error value of each channel to obtain the error correction value of each channel.

3. The error calibration method for the multi-channel voltage acquisition chip according to claim 1, characterized in that, Mathematical fitting is performed on the error value of each channel to obtain the error correction value for each channel, specifically including: For the error value of each channel, N averaging schemes are applied, and each averaging scheme corresponds to a pseudo-error correction value; where N is a positive integer and N≥3; The pseudo-error correction value and the error value of each channel are sequentially substituted into a first formula. When the result of the first formula is the smallest, the corresponding pseudo-error correction value is taken as the error correction value. The first formula is used to characterize the degree of dispersion of the error value of each channel relative to the pseudo-error correction value.

4. The error calibration method for the multi-channel voltage acquisition chip according to claim 3, characterized in that, The mean averaging scheme includes taking the average value.

5. The error calibration method for the multi-channel voltage acquisition chip according to claim 3, characterized in that, The mean averaging scheme includes taking the median.

6. The error calibration method for the multi-channel voltage acquisition chip according to claim 3, characterized in that, The mean-finding scheme includes the dichotomy method.

7. The error calibration method for the multi-channel voltage acquisition chip according to claim 3, characterized in that, The first formula includes the standard deviation formula.

8. The error calibration method for the multi-channel voltage acquisition chip according to claim 1, characterized in that, When the multi-channel voltage acquisition chip actually acquires voltage, the error correction value of the corresponding channel within the temperature range of the current ambient temperature is retrieved for error correction. Specifically, this includes: when the multi-channel voltage acquisition chip actually acquires voltage, the error correction value of each channel within the temperature range of the current ambient temperature is automatically retrieved, and the acquired voltage of each channel within each channel is repaired.

9. The error calibration method for the multi-channel voltage acquisition chip according to claim 1, characterized in that, When the multi-channel voltage acquisition chip actually acquires voltage, retrieving the corresponding channel error correction value within the temperature range of the current ambient temperature for error correction further includes: when the multi-channel voltage acquisition chip actually acquires voltage, if the number of channels with errors in a certain channel exceeds a first threshold of the total number of channels in that channel, then the error correction value corresponding to that channel within the temperature range of the current ambient temperature is retrieved, and the acquired voltage of each channel in that channel is corrected for error; if the number of channels with errors in a certain channel is lower than the first threshold of the total number of channels in that channel, then no error correction is needed for that channel.

10. An error calibration system for a multi-channel voltage acquisition chip, characterized in that, An error calibration method for implementing the multi-channel voltage acquisition chip according to any one of claims 1-9, the system comprising: The temperature division module and the channel division module are respectively used to determine n temperature ranges, which are matched with the operating environment temperature of the multi-channel voltage acquisition chip and to divide all channels of the multi-channel voltage acquisition chip into m levels starting from the first channel; wherein the number of channels in each level is not equal; where n and m are both positive integers, and n≥3, m≥2; The calibration module is used to acquire voltage from the multi-channel voltage acquisition chip within various temperature ranges to obtain the error correction value for each channel in the m-order channel within each temperature range. The storage module is used to store n temperature ranges, m channels, and the error correction values ​​corresponding to each channel in each temperature range; The main control module is used to retrieve the corresponding channel error correction value within the temperature range of the current ambient temperature when the multi-channel voltage acquisition chip actually acquires voltage, and then perform error correction.

11. An electronic device, characterized in that, Including processor and memory, The memory is used to store code and related data; The processor is used to execute the code in the memory to implement the error calibration method of the multi-channel voltage acquisition chip according to any one of claims 1-9.

12. A storage medium having a computer program stored thereon, which, when executed by a processor, implements the error calibration method for the multi-channel voltage acquisition chip according to any one of claims 1-9.

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