Intraoral Cone Measurement Device for Dental Implants and Its Usage Method
The dental implant internal cone surface measurement device uses the current change to contactless measurement of the inner cone surface busbar in the implant, which solves the problems of low measurement accuracy and easy damage to the probe in the prior art, and achieves high-precision contactless measurement.
Patent Information
- Application Number
- CN202211730448.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-30
- Publication Date
- 2025-07-29
- Estimated Expiration
- 2042-12-30
AI Technical Summary
In the prior art, the measuring method of the intra-cone surface of dental implants has the problem that the accuracy is low and the measurement probe is prone to damage.
A dental implant intra-cone surface measurement device is used to draw the approximate line of the cone surface busbar in the implant through the current change between the conductive probe and the cone surface in the implant, combined with the lifting and translation components, to achieve contactless measurement.
High-precision measurement of the inner cone surface of the dental implant is achieved, avoiding direct contact between the probe and the inner cone surface and reducing the risk of damage.
Smart Images

Figure CN116123990B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of dental implant detection, and particularly to an internal conical surface measuring device for dental implants and a method for using the same. Background Art
[0002] A dental implant refers to a device that is surgically implanted into the upper and lower jaws of a human body at the toothless site. After the wound heals, an abutment and a prosthesis are installed on the upper part of the dental implant. Since the abutment and the dental implant are usually fixed by screwing, the internal conical surface of the dental implant needs to cooperate with the external conical surface of the abutment to seal the threaded inner cavity of the dental implant, prevent the entry of bacteria and residues, and avoid infection. Therefore, the accuracy requirements for the internal conical surface of the dental implant are relatively high.
[0003] Currently, steel balls and a coordinate measuring machine are often used to detect the internal conical taper and roughness of dental implants. However, the measurement using steel balls is inaccurate and cannot measure the roughness of the internal conical surface. The coordinate measuring machine needs to touch the internal conical surface of the dental implant during measurement, which is likely to scratch the internal conical surface of the dental implant after detection and is also likely to damage the expensive measuring probe. Summary of the Invention
[0004] The purpose of the present invention is to provide an internal conical surface measuring device for dental implants to solve one or more technical problems existing in the prior art, and at least provide a beneficial alternative or create conditions.
[0005] Technical solutions adopted to solve the above technical problems:
[0006] An internal conical surface measuring device for dental implants, comprising:
[0007] A base;
[0008] A conductive bracket, which is connected to the base;
[0009] A solution conduit, which is arranged above the conductive bracket;
[0010] A lifting assembly, which is connected to the base;
[0011] A translation assembly, which is connected to the lifting assembly, and the lifting assembly drives the translation assembly to move up and down;
[0012] A conductive probe, which is connected to the translation assembly, and the translation assembly drives the conductive probe to move horizontally;
[0013] A power supply;
[0014] A current sensor, which is electrically connected to the current sensor, the power supply, the conductive bracket, and the conductive probe.
[0015] The beneficial effects of the present invention are as follows: The implant is fixed to the conductive bracket, and a solution is filled into the inner tapered hole of the implant through the solution conduit. The conductive probe is moved into the inner tapered hole of the implant by the lifting assembly and the translation assembly, so that an electrical circuit is formed among the conductive probe, the solution, the implant, the conductive bracket, the current sensor, and the power supply. The current sensor can measure the magnitude of the current in the electrical circuit. Since there is a solution filled between the conductive probe and the inner tapered surface of the implant, the solution has an obstructive effect on the current. The solution is approximately equivalent to a resistor in the electrical circuit. Moreover, the smaller the distance between the conductive probe and the inner tapered surface of the implant, the less the amount of the solution between the conductive probe and the inner tapered surface of the implant, and the smaller the obstructive effect on the current. The lifting assembly and the translation assembly move the conductive probe to change the distance between the conductive probe and the inner tapered surface of the implant, thereby changing the magnitude of the current in the electrical circuit. Through the above principle, the lifting assembly and the translation assembly move the conductive probe along the generatrix of the inner tapered surface of the implant to change the position of the conductive probe. The current detected by the current sensor still remains consistent, which proves that the distance between the conductive probe and the inner tapered surface of the implant remains consistent after the movement. The moving distances of the lifting assembly and the translation assembly are recorded respectively, and then an approximate line of the generatrix of the inner tapered surface of the implant is depicted. The taper of this generatrix can be represented by the slope of this approximate line, and the roughness can be represented by the fluctuation of the approximate line. It is not necessary for the conductive probe to contact the inner tapered surface of the implant, realizing the measurement of the taper and roughness of the inner tapered surface of the implant.
[0016] As a further improvement of the above technical solution, the conductive bracket is slidably connected to the base up and down, and the dental implant inner tapered surface measuring device further includes:
[0017] A chuck, which is connected to the base and is arranged above the conductive bracket;
[0018] An adjusting mechanism, which is connected between the chuck and the conductive bracket, and the adjusting mechanism adjusts the distance between the chuck and the conductive bracket.
[0019] The distance between the chuck and the conductive bracket is adjusted by the adjusting mechanism, so that the implant is clamped between the chuck and the conductive bracket, avoiding the offset of the implant caused by the vibration generated after the lifting assembly and the translation assembly are started.
[0020] As a further improvement of the above technical solution, the chuck is provided with a through hole penetrating up and down. The solution conduit communicates with the through hole. The bottom of the chuck is provided with a conical structure, and a through slot is arranged on the side wall of the conical structure. The conductive probe passes through the through hole and extends into the slot.
[0021] The conical structure of the chuck matches the shape of the inner conical surface of the implant. The conical structure is inserted into the inner conical hole of the implant, and the outer side wall of the conical structure is in surface contact with the inner conical surface, avoiding scratching the inner conical surface, ensuring the fixed position of the implant and not easily causing slight shaking; the conductive probe passes through the through hole and extends into the slot of the conical structure, and the solution conduit fills the solution into the inner conical hole of the implant through the through hole, and the conductive probe approaches or moves away from the inner conical surface of the implant through the slot.
[0022] As a further improvement of the above technical solution, the conical structure matches the shape of the measured inner conical hole of the implant.
[0023] The conical structure matches the shape of the inner conical hole of the implant to ensure the stable installation of the conical structure and the implant and avoid loosening of the implant.
[0024] A method of using a measuring device for the inner conical surface of a dental implant, including the measuring device for the inner conical surface of a dental implant as described above, and the method of use further includes the following steps:
[0025] S1. Measure the loop current value A when the distance between the conductive probe and the inner conical surface of the implant is d, and use it as the current threshold of the implant;
[0026] S2. Fix the implant to the conductive bracket and fill the solution into the inner conical hole of the implant through the solution conduit;
[0027] S3. The translation component drives the conductive probe to approach the inner conical surface of the implant until the current value detected by the current sensor is not less than A, and then the translation component drives the conductive probe to move a distance L away from the inner conical surface of the implant and stop. After the translation component stops, the lifting component starts to drive the conductive probe to move downward until the current value detected by the current sensor is not less than A and then stops;
[0028] S4. Repeat the step S3, and record the distances H1, H2, H3, ……, Hn that the lifting component drives the conductive probe to move downward each time;
[0029] S5. After the measurement, the translation component and the lifting component drive the conductive probe back to the starting point;
[0030] S6. Draw an image according to the displacement trajectory of the conductive probe, connect the end points where the lifting component drives the conductive probe to move downward each time, and obtain an approximate line of the generatrix of the inner conical surface of the implant.
[0031] After fixing the implant on the conductive bracket, the solution conduit fills the inner conical hole of the implant with solution. Subsequently, the translation assembly drives the conductive probe to approach the inner conical surface of the implant until the current value detected by the current sensor is not less than A. Then, the translation assembly drives the conductive probe to move a distance of L away from the inner conical surface of the implant and stops. After the translation assembly stops, the lifting assembly starts to drive the conductive probe to move downward until the current value detected by the current sensor is not less than A and stops; repeat the above process, and record the distances H1, H2, H3, ……, Hn that the lifting assembly drives the conductive probe to move downward each time. Taking the vertical direction as the Y-axis and the horizontal direction as the X-axis, the trajectories of the lifting assembly and the translation assembly driving the conductive probe are in a stepped shape. Draw the displacement trajectory of the conductive probe, and then connect the end points where the lifting assembly drives the conductive probe to move downward each time, and an approximate line of the generatrix of the inner conical surface of the implant can be obtained on the plane coordinate, without the conductive probe contacting the inner conical surface of the implant, realizing the measurement of the generatrix of the inner conical surface of the implant.
[0032] As a further improvement of the above technical solution, the inner conical surface measuring device of the dental implant further includes a controller, and the lifting assembly includes:
[0033] A lifting motor;
[0034] A first encoder, which is arranged on the lifting motor, and the first encoder is electrically connected to the controller. The first encoder converts the number of rotation turns of the lifting motor into an electrical signal and transmits it to the controller;
[0035] A lifting transmission mechanism, which is connected between the lifting motor and the translation assembly, and the lifting motor drives the lifting transmission mechanism to drive the translation assembly to move up and down.
[0036] Record the number of rotation turns of the lifting motor through the first encoder, and convert it into an electrical signal and transmit it to the controller, so that the controller can accurately record the number of rotation turns of the lifting motor. The lifting motor drives the lifting transmission mechanism to drive the translation assembly to move up and down, and calculate the distance that the translation assembly moves up and down through the number of rotation turns of the lifting motor, and more accurately depict the approximate line of the generatrix of the inner conical surface of the implant.
[0037] As a further improvement of the above technical solution, the translation assembly includes:
[0038] A translation motor;
[0039] A second encoder, which is arranged on the translation motor, and the second encoder converts the number of rotation turns of the translation motor into an electrical signal and transmits it to the controller;
[0040] A translation drive mechanism is connected to the translation motor and the conductive probe, and the translation motor drives the translation drive mechanism to drive the conductive probe to move horizontally.
[0041] The number of rotations of the translation motor is recorded by a second encoder and converted into an electrical signal and sent to the controller, so that the controller can accurately record the number of rotations of the translation motor. The translation motor drives the translation drive mechanism to drive the conductive probe to move horizontally. The horizontal movement distance of the conductive probe is calculated by the number of rotations of the translation motor, and the approximate line of the generatrix of the inner conical surface in the implant is more accurately depicted.
[0042] As a further improvement of the above technical solution, the controller converts the number of rotations of the lifting motor and the number of rotations of the translation motor into the vertical movement data and horizontal movement data of the conductive probe.
[0043] The controller converts the number of rotations of the lifting motor and the translation motor into the lateral movement data and vertical movement data of the conductive probe, improving the conversion efficiency.
[0044] As a further improvement of the above technical solution, the controller is electrically connected to the current sensor, and the controller controls the start and stop of the lifting motor and the translation motor.
[0045] The current sensor converts the measured current magnitude into an electrical signal and sends it to the controller. The controller controls the start and stop of the lifting motor or the translation motor in real time according to the current magnitude. When the lifting component drives the conductive probe to move downward, when the controller reads that the current detected by the current sensor is not less than A, the controller stops the lifting motor to ensure that the position of the conductive probe stops accurately. After recording the number of rotations of the lifting motor or the translation motor, the controller then controls the translation motor to start, so that the translation component drives the conductive probe to move a distance L away from the inner conical surface of the implant and then stops. After the translation motor stops, the lifting motor will be started again. By controlling the start and stop of the lifting motor and the translation motor by the controller, the displacement of the conductive probe is made more accurate.
[0046] As a further improvement of the above technical solution, the translation drive mechanism includes a translation multi-stage reducer and a translation output member. The translation multi-stage reducer is connected to the translation motor and the translation output member. The translation output member is connected to the conductive probe, and the translation output member converts the rotational motion of the translation multi-stage reducer into the translational motion of the conductive probe.
[0047] The translation multi-stage reducer converts the high-speed rotation of the translation motor into low-speed output to the translation output member. The translation motor rotates a relatively large number of turns, which helps the second encoder accurately measure the number of turns of the translation motor. The rotation motion of the translation motor is converted into the translation motion of the conductive probe through the translation multi-stage reducer and the translation output member, which helps improve the moving accuracy of the translation assembly driving the conductive probe.
[0048] As a further improvement of the above technical solution, the lifting transmission mechanism includes a lifting multi-stage reducer and a lifting output member. The lifting multi-stage reducer connects the lifting motor and the lifting output member, and the lifting output member is connected to the translation assembly. The lifting output member converts the rotation motion of the lifting multi-stage reducer into the lifting motion of the translation assembly.
[0049] The lifting multi-stage reducer converts the high-speed rotation of the lifting motor into low-speed output to the lifting output member. The lifting motor rotates a relatively large number of turns, which helps the first encoder accurately measure the number of turns of the lifting motor. The rotation motion of the lifting motor is converted into the lifting motion of the translation assembly through the lifting multi-stage reducer and the lifting output member, which helps improve the moving accuracy of the lifting assembly driving the conductive probe.
[0050] As a further improvement of the above technical solution, the solution is a sodium chloride solution.
[0051] In order to make the resistance of the solution larger to improve the measurement accuracy, the sodium chloride content in the sodium chloride solution can be controlled at 0.01%. The solution injected into the conical hole in the implant by the solution conduit is a sodium chloride solution. The sodium chloride solution is easy to obtain and will not corrode the conical surface in the implant.
[0052] As a further improvement of the above technical solution, the conductive probe is made of a copper alloy material.
[0053] The conductive probe is made of a copper alloy material, which has a relatively high conductivity and good wear resistance, helping to reduce the wear of the conductive probe.
[0054] As a further improvement of the above technical solution, in the step S1, the distance d between the conductive probe and the inner conical surface of the implant is between 10 and 50 microns.
[0055] In the step S1, the distance d between the conductive probe and the inner conical surface of the implant is less than or equal to 50 microns to ensure that the conductive probe accurately measures the current A as the threshold value, and the movement of the conductive probe in the subsequent steps S3 and S4 is restricted by taking the current A as the threshold value. In this embodiment, d is preferably 20 microns.
[0056] As a further improvement of the above technical solution, in the step S3, the distance L that the translation assembly drives the conductive probe away from the inner conical surface of the implant is between 20 and 100 microns.
[0057] If the distance of L is too large, it will reduce the measurement accuracy of the current sensor for current A. If the distance of L is too small, it will reduce the measurement efficiency of the current sensor for current A. Therefore, the distance of L is preferably between 20 microns and 100 microns.
[0058] As a further improvement of the above technical solution, in the step S3, the lifting assembly drives the translation assembly to move downward until the current value detected by the current sensor is equal to A.
[0059] In the step S3, the lifting assembly drives the translation assembly to move downward. Preferably, when the current value detected by the current sensor is equal to A, the lifting assembly is stopped to ensure that the distance difference between the conductive probe and the inner conical surface in the implant is small each time the lifting assembly stops, making the finally drawn image more accurate. Description of the Drawings
[0060] The present invention will be further described below in conjunction with the drawings and embodiments;
[0061] Figure 1 It is a schematic structural diagram of an embodiment of the inner conical surface measuring device for dental implants provided by the present invention;
[0062] Figure 2 It is a left view schematic diagram of an embodiment of the inner conical surface measuring device for dental implants provided by the present invention;
[0063] Figure 3 It is a cross-sectional schematic diagram of an embodiment of the inner conical surface measuring device for dental implants provided by the present invention;
[0064] Figure 4 It is a schematic diagram of the movement trajectory of the conductive probe in an embodiment of the usage method provided by the present invention.
[0065] 100, base; 200, conductive bracket; 300, solution conduit; 400, lifting assembly; 500, translation assembly; 600, conductive probe; 700, chuck; 710, through hole; 720, conical structure; 730, slotted; 800, adjustment mechanism; 900, implant; 910, inner conical surface; 920, movement trajectory of the conductive probe. Detailed Embodiments
[0066] This part will describe in detail the specific embodiments of the present invention. The preferred embodiments of the present invention are shown in the drawings. The role of the drawings is to supplement the description in the text part of the specification, enabling people to visually and vividly understand each technical feature and the overall technical solution of the present invention, but it cannot be understood as a limitation on the protection scope of the present invention.
[0067] In the description of the present invention, it should be understood that for the orientation description, such as the orientation or positional relationship indicated by up, down, front, back, left, right, etc., it is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present invention.
[0068] In the description of the present invention, if there are descriptions with words such as "several", its meaning is one or more, and the meaning of multiple is more than two. Understanding such as greater than, less than, exceeding, etc. does not include the present number, and understanding such as above, below, within, etc. includes the present number.
[0069] In the description of the present invention, unless otherwise clearly defined, words such as setting, installing, connecting, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meaning of the above words in the present invention in combination with the specific content of the technical solution.
[0070] Referring to Figures 1 to 3 , the following embodiments are made for the internal conical surface measuring device of the dental implant of the present invention:
[0071] The internal conical surface measuring device of the dental implant includes a base 100, a conductive bracket 200, a solution conduit 300, a lifting assembly 400, a translation assembly 500, a conductive probe 600, a power supply, and a current sensor.
[0072] The conductive bracket 200 is connected to the base 100, and the conductive bracket 200 extends forward to the front of the base 100. The solution conduit 300 is connected to the base 100, and the nozzle of the solution conduit 300 is located above the conductive bracket 200.
[0073] The lifting assembly 400 is connected to the base 100, the translation assembly 500 is connected to the lifting assembly 400, and the lifting assembly 400 drives the translation assembly 500 to move in the vertical direction.
[0074] The conductive probe 600 is connected to the translation assembly, and the translation assembly 500 drives the conductive probe 600 to move in the front-back direction.
[0075] The power supply and the current sensor can be arranged inside or outside the base 100, and only need to electrically connect the power supply, the current sensor, the conductive bracket 200, and the conductive probe 600 together.
[0076] Fix the implant 900 to the conductive bracket 200, fill the inner conical hole of the implant 900 with a solution using the solution conduit 300, and move the conductive probe 600 into the inner conical hole of the implant 900 through the lifting assembly 400 and the translation assembly 500, so that an electrical circuit is formed among the conductive probe 600, the solution, the implant 900, the conductive bracket 200, the current sensor, and the power supply, and the current sensor can measure the magnitude of the current in the electrical circuit.
[0077] Since there is a solution filled between the conductive probe 600 and the inner conical surface of the implant 900, the solution has an obstructive effect on the current. The solution is approximately equivalent to a resistor in the electrical circuit. Moreover, the smaller the distance between the conductive probe 600 and the inner conical surface of the implant 900, the less the amount of the solution between the conductive probe 600 and the inner conical surface of the implant 900, and the smaller the obstructive effect on the current.
[0078] The lifting assembly 400 and the translation assembly 500 move the conductive probe, change the distance between the conductive probe and the inner conical surface of the implant 900, and thus change the magnitude of the current in the electrical circuit.
[0079] Based on the above principle, move the conductive probe along the generatrix of the inner conical surface of the implant 900 through the lifting assembly 400 and the translation assembly 500, and move the position of the conductive probe 600. The current detected by the current sensor still remains consistent, which proves that the distance between the conductive probe 600 and the inner conical surface of the implant 900 remains consistent after the movement. Record the respective moving distances of the lifting assembly 400 and the translation assembly 500, and then depict an approximate line of the generatrix of the inner conical surface of the implant 900. Among them, the taper of the generatrix can be represented by the slope of the approximate line, and the roughness can be represented by the fluctuation of the approximate line. This can measure the taper and roughness of the inner conical surface of the implant 900 without the conductive probe 600 contacting the inner conical surface of the implant.
[0080] In some embodiments, a chute is provided on the front side wall of the base 100, and the rear end of the conductive bracket 200 is slidably connected to the chute. The chuck 700 is connected to the front side wall of the base 100 through a connecting rod, and the chuck 700 and the conductive bracket 200 are distributed at an upper and lower interval. The adjusting mechanism 800 is an adjusting screw. A vertically penetrating screw hole is provided in the middle of the connecting rod, and the top end of the adjusting screw penetrates through the screw hole. The conductive bracket 200 is provided with a vertically penetrating assembly hole, and the bottom end of the adjusting screw is rotatably connected to the assembly hole. Rotate the adjusting screw to move the conductive bracket 200 up and down along the chute, and thus adjust the distance between the chuck 700 and the conductive bracket 200.
[0081] Use the adjusting mechanism 800 to adjust the distance between the chuck 700 and the conductive bracket 200, so that the implant 900 is clamped between the chuck 700 and the conductive bracket 200, and avoid the vibration generated after the lifting assembly 400 and the translation assembly 500 are started from causing the implant 900 to shift.
[0082] In some embodiments, the chuck 700 is provided with a through hole 710 penetrating in the up-down direction. The solution conduit 300 is connected to the chuck 700, and the nozzle of the solution conduit 300 communicates with the through hole 710. The bottom of the chuck 700 is provided with a conical structure 720, the shape of the conical structure 720 is conical, and a slot 730 penetrating in the front-back direction is provided on the side wall of the conical structure 720, and the slot 730 communicates with the through hole 710. The conductive probe 600 penetrates into the through hole 710 from top to bottom, and the conductive probe 600 extends out behind the conical structure 720 from the rear side of the slot 730.
[0083] The conical structure 720 of the chuck 700 matches the shape of the inner conical surface of the implant 900. The conical structure 720 is inserted into the inner conical hole of the implant 900, and the outer side wall of the conical structure 720 is in surface contact with the inner conical surface, avoiding scratching the inner conical surface, and can ensure that the position of the implant 900 is fixed and not prone to slight shaking.
[0084] The conductive probe 600 passes through the through hole 710 and extends into the slot 730 of the conical structure 720. The solution conduit 300 fills the solution into the inner conical hole of the implant 900 through the through hole 710, and the conductive probe 600 approaches or moves away from the inner conical surface of the implant 900 through the slot 730.
[0085] The following embodiments are made for the usage method of the inner conical surface measuring device of the dental implant of the present invention:
[0086] The usage method includes the following steps:
[0087] S1. Calculate or experimentally measure the loop current value A when the distance between the probe 600 and the inner conical surface of the implant 900 is d, and use it as the threshold for the translation and lifting of the conductive probe 600 when measuring any model of implant.
[0088] S2. Fix the implant 900 on the conductive bracket 200, and the solution conduit 300 fills the solution into the inner conical hole of the implant 900.
[0089] S3. The translation assembly 500 drives the conductive probe 600 to approach the inner conical surface of the implant 900 until the current value detected by the current sensor is not less than A, then the translation assembly 500 drives the conductive probe 600 to move away from the inner conical surface of the implant by a distance L and then stops. After the translation assembly stops, the lifting assembly 400 starts to drive the conductive probe to move downward until the current value detected by the current sensor is not less than A and then stops.
[0090] S4. Repeat step S3 and record the distances H1, H2, H3,..., Hn that the lifting assembly 500 drives the conductive probe 600 to move downward each time.
[0091] S5. After the measurement is completed, the translation assembly and the lifting assembly drive the conductive probe back to the starting point;
[0092] S6. Draw an image according to the displacement trajectory of the conductive probe 600, connect the end points where the lifting assembly 400 drives the conductive probe 600 to move downward each time, and obtain an approximate line of the generatrix of the inner conical surface of the implant 900.
[0093] Calculate or experimentally measure the loop current value A when the distance between the probe 600 and the inner conical surface of the implant 900 is d, and use the current value A as the threshold for the translation and lifting of the conductive probe 600 when measuring any model of implant.
[0094] After fixing the implant 900 to the conductive bracket 200, the solution conduit 300 fills the inner conical hole of the implant 900 with a solution. Subsequently, the translation assembly 500 drives the conductive probe 600 close to the inner conical surface of the implant 900. When the current value detected by the current sensor is not less than A, the translation assembly 500 drives the conductive probe 600 to move a distance L away from the inner conical surface of the implant 900 and then stops. After the translation assembly 500 stops, the lifting assembly 400 starts and drives the conductive probe 600 to move downward until the current value detected by the current sensor is not less than A, then the lifting assembly 400 stops operating. Repeat the above process, and record the distances H1, H2, H3,..., Hn that the lifting assembly 400 drives the conductive probe 600 to move downward each time. Taking the vertical direction as the Y-axis and the horizontal direction as the X-axis, the trajectory of the lifting assembly 400 and the translation assembly 500 driving the conductive probe 600 is in a stepped shape. Draw the displacement trajectory of the conductive probe 600, and then connect the end points where the lifting assembly 400 drives the conductive probe 600 to move downward each time, and an approximate line of the generatrix of the inner conical surface of the implant 900 can be obtained without the conductive probe 600 contacting the inner conical surface of the implant 900, realizing the measurement of the generatrix of the inner conical surface of the implant 900.
[0095] In some embodiments, the solution is a sodium chloride solution.
[0096] The solution injected into the inner conical hole of the implant by the solution conduit is a sodium chloride solution. The sodium chloride solution is easy to obtain and will not corrode the inner conical surface of the implant.
[0097] In some embodiments, the conductive probe is made of a copper alloy material.
[0098] The conductive probe is made of a copper alloy material, which has a relatively high conductivity and good wear resistance, helping to reduce the wear of the conductive probe.
[0099] In some embodiments, in step S1, the distance d between the conductive probe and the inner conical surface of the implant is between 10 and 50 micrometers.
[0100] In some embodiments, in step S3, the distance L between the conductive probe and the inner conical surface of the implant is between 20 and 100 micrometers.
[0101] In step S1, the distance between the conductive probe and the inner conical surface of the implant is less than or equal to 20 micrometers to ensure that the conductive probe accurately measures the current A as the threshold value, and the movement of the conductive probe in subsequent steps S3 and S4 is restricted using current A as the threshold value.
[0102] In some embodiments, in step S3, the lifting assembly drives the translation assembly to move downward until the current value detected by the current sensor is equal to A.
[0103] In step S3, the lifting assembly drives the translation assembly to move downward. Preferably, the lifting assembly stops when the current value detected by the current sensor is equal to A, to ensure that the distance difference between the conductive probe and the inner conical surface of the implant is small each time the lifting assembly stops, making the finally drawn image more accurate. In some embodiments, the conductive probe 600 is made of copper alloy material.
[0104] In some embodiments, the lifting assembly 400 includes a lifting motor, a first encoder, and a lifting transmission mechanism. The lifting motor is connected to the base 100 through a support. The output shaft of the lifting motor rotates around the vertical axis, and the output shaft of the lifting motor faces downward. The first encoder is connected to the inside of the lifting motor. The first encoder is used to measure the number of rotations of the rotor inside the lifting motor, and thus measure the number of rotations of the output shaft. The lifting transmission mechanism is connected to the lifting motor and the translation assembly 500. The lifting transmission mechanism converts the rotational motion of the lifting motor into the up and down movement of the translation assembly 500.
[0105] The lifting transmission mechanism includes a multi-stage lifting speed reducer and a lifting output member. The input end of the multi-stage lifting speed reducer is connected to the output shaft of the lifting motor. The lifting output member is a lead screw-nut transmission member. The output end of the multi-stage lifting speed reducer is connected to the lead screw. The nut is sleeved on the lead screw, and the nut is connected to the translation assembly 500. Then, when the lead screw rotates, the nut drives the translation assembly 500 to move in the up and down direction.
[0106] The multi-stage lifting speed reducer converts the high-speed rotation of the lifting motor into a low-speed output to the lifting output member. The lifting motor rotates a large number of turns, which helps the first encoder accurately measure the number of rotations of the lifting motor. Converting the rotational motion of the lifting motor into the lifting motion of the translation assembly 500 through the multi-stage lifting speed reducer and the lifting output member helps improve the movement accuracy of the lifting assembly 400 driving the conductive probe 600.
[0107] The dental implant inner conical surface measuring device further includes a controller. The controller is electrically connected to the first encoder. The first encoder converts the number of rotations of the output shaft of the lifting motor into an electrical signal and transmits it to the controller.
[0108] The rotation turns of the lifting motor are recorded by the first encoder and converted into electrical signals and transmitted to the controller, so that the controller can accurately record the rotation turns of the lifting motor. The lifting motor drives the lifting transmission mechanism to drive the translation assembly to move up and down. The distance that the translation assembly 500 moves up and down is calculated by the rotation turns of the lifting motor, and the approximate line of the generatrix of the inner conical surface of the implant 900 is depicted more accurately.
[0109] In some embodiments, the translation assembly includes a translation motor, a second encoder, and a translation transmission mechanism. The translation motor is connected to the lifting transmission mechanism. The output shaft of the translation motor rotates around the front-rear axis, and the output shaft of the translation motor faces forward. The second encoder is disposed inside the translation motor and is used to measure the rotation turns of the rotor inside the translation motor, and thus measure the rotation turns of the output shaft. The translation transmission mechanism is connected between the translation motor and the conductive probe 600, and the translation transmission mechanism converts the rotational motion of the translation motor into the front-rear motion of the conductive probe 600.
[0110] The translation transmission mechanism includes a translation multi-stage reducer and a translation output member. The input end of the translation multi-stage reducer is connected to the output shaft of the translation motor. The translation output member is a lead screw-nut transmission member. The output end of the translation multi-stage reducer is connected to the lead screw. The nut is sleeved on the lead screw, and the nut is connected to the conductive probe 600. Then, when the lead screw rotates, the nut drives the conductive probe 600 to move in the front-rear direction.
[0111] The translation multi-stage reducer converts the high-speed rotation of the translation motor into low-speed output to the translation output member. The translation motor has a relatively large number of rotation turns, which helps the second encoder accurately measure the rotation turns of the translation motor. By the translation multi-stage reducer and the translation output member, the rotational motion of the translation motor is converted into the translational motion of the conductive probe 600, which helps to improve the moving accuracy of the translation assembly 500 driving the conductive probe 600.
[0112] The second encoder is electrically connected to the controller. The first encoder converts the rotation turns of the output shaft of the translation motor into electrical signals and transmits them to the controller.
[0113] The rotation turns of the translation motor are recorded by the second encoder and converted into electrical signals and transmitted to the controller, so that the controller can accurately record the rotation turns of the translation motor. The translation motor drives the translation transmission mechanism to drive the conductive probe 600 to move back and forth. The distance that the conductive probe 600 moves back and forth is calculated by the rotation turns of the translation motor, and the approximate line of the generatrix of the inner conical surface of the implant 900 is depicted more accurately.
[0114] In some embodiments, the controller is electrically connected to a current sensor. The current sensor converts the measured current magnitude into an electrical signal and sends it to the controller. The controller controls the start and stop of the lifting motor or the translation motor in real time according to the current magnitude. After the lifting assembly drives the conductive probe to move downward, when the controller reads that the current detected by the current sensor is not less than A, the controller stops the lifting motor to ensure that the position of the conductive probe stops accurately. After recording the number of rotation turns of the lifting motor or the translation motor, the controller then controls the start of the translation motor to drive the translation assembly to move the conductive probe away from the inner conical surface of the implant by a distance L. By controlling the start and stop of the lifting motor and the translation motor through the controller, the displacement of the conductive probe is made more accurate.
[0115] In a more preferred embodiment, the inner conical surface measuring device for dental implants includes a base 100, a conductive bracket 200, a solution conduit 300, a lifting assembly 400, a translation assembly 500, a conductive probe 600, a power source, a current sensor, a chuck 700, an adjusting mechanism 800, and a controller.
[0116] The base 100 is fixed on a horizontal plane. A sliding groove is provided on the front side wall of the base 100, and the sliding groove extends in the vertical direction. A slider is provided at the rear end of the conductive bracket 200, and the slider is slidably disposed in the sliding groove, so that the conductive bracket 200 slides in the vertical direction.
[0117] A connecting rod is provided at the rear end of the chuck 700, and the connecting rod is connected to the front side wall of the base 100. The chuck 700 and the conductive bracket 200 are spaced apart vertically, and the chuck 700 is fixedly connected to the base 100.
[0118] The adjusting mechanism 800 is composed of an adjusting screw and a vertical rod. The bottom of the adjusting screw is connected to the vertical rod. A screw hole penetrating vertically is provided in the middle of the connecting rod, and the top end of the adjusting screw is inserted into the screw hole. The conductive bracket 200 is provided with an assembly hole penetrating vertically, and the bottom end of the vertical rod is rotatably connected to the assembly hole. By rotating the adjusting screw, the vertical rod drives the conductive bracket 200 to move up and down along the sliding groove, thereby adjusting the distance between the chuck 700 and the conductive bracket 200.
[0119] The lifting assembly 400 includes a lifting motor, a first encoder, and a lifting transmission mechanism. The lifting motor is connected to the base 100 through a C-shaped support. The bottom end of the C-shaped support is connected to the rear side wall of the base 100, and the top end of the C-shaped support is connected to the lifting motor. The output shaft of the lifting motor rotates around a vertical axis, and the output shaft of the lifting motor faces downward.
[0120] The first encoder is connected to the inside of the lifting motor. The first encoder is used to measure the number of rotation turns of the rotor inside the lifting motor, and thus measure the number of rotation turns of the output shaft.
[0121] The lifting drive mechanism includes a multi-stage lifting speed reducer and a lifting output member. The input end of the multi-stage lifting speed reducer is connected to the output shaft of the lifting motor. The lifting output member is a screw-nut transmission member. The output end of the multi-stage lifting speed reducer is connected to the screw. The nut is sleeved on the screw, and the nut is connected to the translation assembly 500. Then, when the screw rotates, the nut drives the translation assembly 500 to move in the vertical direction.
[0122] The translation assembly includes a translation motor, a second encoder, and a translation drive mechanism. The translation motor is connected to the lifting drive mechanism. The output shaft of the translation motor rotates about the front-rear axis, and the output shaft of the translation motor faces forward. The second encoder is arranged inside the translation motor and is used to measure the number of rotations of the rotor inside the translation motor, and thus measure the number of rotations of the output shaft.
[0123] The translation drive mechanism includes a multi-stage translation speed reducer and a translation output member. The input end of the multi-stage translation speed reducer is connected to the output shaft of the translation motor. The translation output member is a screw-nut transmission member. The output end of the multi-stage translation speed reducer is connected to the screw. The nut is sleeved on the screw, and the nut is connected to the conductive probe 600. Then, when the screw rotates, the nut drives the conductive probe 600 to move in the front-rear direction.
[0124] The chuck 700 is provided with a through hole 710 penetrating in the vertical direction. The solution conduit 300 is connected to the chuck 700, and the pipe orifice of the solution conduit 300 communicates with the through hole 710. The bottom of the chuck 700 is provided with a conical structure 720. The shape of the conical structure 720 is conical. The side wall of the conical structure 720 is provided with a slot 730 penetrating in the front-rear direction, and the slot 730 communicates with the through hole 710. The conductive probe 600 is made of copper alloy material. The conductive probe 600 extends downward into the through hole 710, and the conductive probe 600 extends out from the rear side of the slot 730 behind the conical structure 720.
[0125] The conical structure 720 of the chuck 700 matches the shape of the inner conical surface of the implant 900. The conical structure 720 is inserted into the inner conical hole of the implant 900, and the outer side wall of the conical structure 720 is in surface contact with the inner conical surface, avoiding scratching the inner conical surface, and can ensure that the position of the implant 900 is fixed and not prone to slight shaking.
[0126] The conductive probe 600 passes through the through hole 710 and then extends into the slot 730 of the conical structure 720. The solution conduit 300 fills the solution into the inner conical hole of the implant 900 through the through hole 710, and the conductive probe 600 approaches or moves away from the inner conical surface of the implant 900 through the slot 730.
[0127] The conductive probe 600 is composed of a first fixed rod, a second fixed rod, a rotating rod, and a probe. The first fixed rod is connected to the housing of the translation motor, and the relative position of the first fixed rod and the translation motor is fixed. The second fixed rod is connected to the translation output member, so that the translation output member drives the second fixed rod to move back and forth relative to the first fixed rod. The top end of the rotating rod is hinged to the second fixed rod, and the bottom end of the rotating rod is hinged to the first fixed rod. The probe is connected to the bottom of the rotating rod, and the probe passes through the through hole 710 of the chuck 700 and extends into the slot 730 of the conical structure 720. When the second fixed rod moves back and forth, the rotating rod drives the probe to rotate around the horizontal axis, so that the probe approaches or moves away from the inner conical surface of the implant 900. The second fixed rod, the rotating rod, and the probe are all made of conductive metal materials to facilitate the conduction of the conductive probe 600.
[0128] The power supply and the current sensor can be arranged inside or outside the base 100, and only need to electrically connect the power supply, the current sensor, the conductive bracket 200, and the conductive probe 600 together.
[0129] The controller is electrically connected to the first encoder, the second encoder, and the current sensor. The rotation number of the lifting motor is recorded by the first encoder and converted into an electrical signal and transmitted to the controller, so that the controller can accurately record the rotation number of the lifting motor. The lifting motor drives the lifting transmission mechanism to drive the translation assembly to move up and down, and the controller calculates the distance that the translation assembly 500 moves up and down from the rotation number of the lifting motor. The rotation number of the translation motor is recorded by the second encoder and converted into an electrical signal and transmitted to the controller, so that the controller can accurately record the rotation number of the translation motor. The translation motor drives the translation transmission mechanism to drive the conductive probe 600 to move back and forth, and the controller calculates the distance that the conductive probe 600 moves back and forth from the rotation number of the translation motor.
[0130] The usage method includes:
[0131] S1. After calculating or experimentally measuring that the loop current value is A when the distance between the probe 600 and the inner conical surface of the implant 900 is 50 μm, use it as the current threshold for the translation and lifting of the conductive probe 600 when measuring any model of implant. S2. Fix the implant 900 on the conductive bracket 200, and the solution conduit 300 fills the inner conical hole of the implant 900 with sodium chloride solution; the sodium chloride solution is mixed by sodium chloride and pure water. The higher the concentration of sodium chloride, the higher the conductivity of the sodium chloride solution, the smaller the hindrance effect on the current, which is equivalent to the smaller the resistance;
[0132] S3. The translation component 500 drives the conductive probe 600 to approach the inner conical surface of the implant 900. When the distance between the conductive probe 600 and the inner conical surface of the implant 900 is no more than 20 microns and the current value detected by the current sensor is equal to A, the translation component 500 drives the conductive probe 600 to move away from the inner conical surface of the implant 900 by 50 microns and then stops immediately. Then, the lifting component 400 is started to drive the conductive probe 600 to move downward until the current value detected by the current sensor is equal to A and then stops immediately;
[0133] S4. Repeat step S3 and record the distances H1, H2, H3, ……, Hn that the lifting component 500 drives the conductive probe 600 to move downward each time;
[0134] S5. After the measurement is completed, the translation component and the lifting component drive the conductive probe back to the starting point for the next measurement;
[0135] S6. Draw an image based on the displacement trajectory of the conductive probe 600, connect the end points where the lifting component 400 drives the conductive probe 600 to move downward each time, and obtain an approximate line of the generatrix of the inner conical surface of the implant 900.
[0136] Refer to Figure 4 , the displacement trajectory of the conductive probe 600 is in a gradually downward stepped shape. At the beginning, the conductive probe 600 is at a position far from the inner conical surface 910 of the implant 900. Subsequently, the translation component 500 drives the conductive probe 600 to move backward, making the conductive probe 600 approach the inner conical surface 910, so that the distance between the conductive probe 600 and the inner conical surface 910 is 20 microns. The current sensor reads the current in the current loop formed by the conductive probe 600, sodium chloride solution, implant 900, conductive bracket, and power supply as A.
[0137] Subsequently, the translation component 500 drives the conductive probe 600 to move away from the inner conical surface 910 and then stops. The translation component 500 drives the conductive probe 600 to move a distance of L and then stops. At this time, the current value measured by the current sensor is much less than A. Then, the lifting component 400 is started to drive the conductive probe 600 to move downward. As the conductive probe 600 gradually approaches the inner conical surface 910, the current value measured by the current sensor gradually increases until the current value measured by the current sensor is equal to A, and then the lifting component 400 stops. And record the distance H1 that the lifting component 400 drives the conductive probe 600 to move during this process. Repeat the above process until H2, H3, H4, …… Hn are obtained.
[0138] According to the movement trajectory of the conductive probe 600, a trajectory schematic diagram similar to Figure 4 is drawn. Its trajectory can be obtained by recording the rotation data of the lifting motor and the translation motor, and then the controller converts it into the movement data of the conductive probe 600 in the horizontal and vertical directions and draws it.
[0139] Subsequently, the end points where each lifting component 400 drives the conductive probe 600 to move downward are connected together to form an approximate line of the generatrix of the inner conical surface 910; therefore, the taper of this generatrix can be represented by the slope of the approximate line, and the roughness can be represented by the fluctuation of the approximate line. Finally, the lifting component 400 drives the conductive probe 600 to move upward and away from the inner conical surface 910.
[0140] The above has specifically described the preferred embodiments of the present invention, but the present invention is not limited to the described embodiments. Those skilled in the art can also make various equivalent variations or substitutions without departing from the spirit of the present invention, and these equivalent variations or substitutions are all included within the scope defined by the claims of this application.
Claims
1. A method for using an internal conical surface measuring device for dental implants, characterized in that: Internal taper measuring device applied to dental implants, the internal taper measuring device for dental implants comprising: Base (100); Conductive bracket (200), which is connected to the base (100); Solution conduit (300), which is arranged above the conductive bracket (200); Lifting assembly (400), which is connected to the base (100); Translation assembly (500), which is connected to the lifting assembly (400), and the lifting assembly (400) drives the translation assembly (500) to move up and down; Conductive probe (600), which is connected to the translation assembly (500), and the translation assembly (500) drives the conductive probe (600) to move horizontally; Power supply; Current sensor, the current sensor, the power supply, the conductive bracket (200), and the conductive probe (600) are electrically connected; The usage method comprises the following steps: S1. Measure the loop current value A when the distance between the conductive probe (600) and the internal taper of the implant (900) is d, and take it as the current threshold of the implant (900); S2. Fix the implant (900) on the conductive bracket (200), and fill the internal taper hole of the implant (900) with solution through the solution conduit (300); S3. The translation assembly (500) drives the conductive probe (600) to approach the internal taper of the implant (900) until the current value detected by the current sensor is not less than A. Subsequently, the translation assembly (500) drives the conductive probe (600) to move a distance L away from the internal taper of the implant (900) and then stops. After the translation assembly (500) stops, the lifting assembly (400) starts to drive the conductive probe (600) to move downward until the current value detected by the current sensor is not less than A and then stops; S4. Repeat step S3, and record the distances H1, H2, H3, ……, Hn that the lifting assembly (400) drives the conductive probe (600) to move downward each time; S5. After the measurement, the translation assembly (500) and the lifting assembly (400) drive the conductive probe (600) back to the starting point; S6. Draw an image according to the displacement trajectory of the conductive probe (600), connect the end points where the lifting assembly (400) drives the conductive probe (600) to move downward each time, and obtain an approximate line of the generatrix of the internal taper of the implant (900).
2. The method of use according to claim 1, wherein: The conductive bracket (200) is connected to the base (100) in a vertically slidable manner, and the internal taper measuring device for dental implants further comprises: Chuck (700), which is connected to the base (100), and the chuck (700) is arranged above the conductive bracket (200); Adjusting mechanism (800), which is connected between the chuck (700) and the conductive bracket (200), and the adjusting mechanism (800) adjusts the distance between the chuck (700) and the conductive bracket (200).
3. The method of use according to claim 2, wherein: The chuck (700) is provided with a through hole (710) penetrating up and down. The solution conduit (300) communicates with the through hole (710). The bottom of the chuck (700) is provided with a conical structure (720). The side wall of the conical structure (720) is provided with a through slot (730). The conductive probe (600) passes through the through hole (710) and extends into the slot (730).
4. The method of use according to claim 3, wherein: The conical structure (720) matches the shape of the inner conical hole of the measured implant (900).
5. The method of use according to claim 1, wherein: The inner conical surface measuring device for dental implant further includes a controller. The lifting assembly (400) includes: A lifting motor; A first encoder, which is arranged on the lifting motor. The first encoder is electrically connected to the controller. The first encoder converts the number of rotation turns of the lifting motor into an electrical signal and transmits it to the controller; A lifting transmission mechanism, which is connected between the lifting motor and the translation assembly (500). The lifting motor drives the lifting transmission mechanism to drive the translation assembly (500) to move up and down.
6. The method of use according to claim 5, characterized in that: The translation assembly (500) includes: A translation motor; A second encoder, which is arranged on the translation motor. The second encoder converts the number of rotation turns of the translation motor into an electrical signal and transmits it to the controller; A translation transmission mechanism, which is connected between the translation motor and the conductive probe (600). The translation motor drives the translation transmission mechanism to drive the conductive probe (600) to move horizontally.
7. The usage method according to claim 6, characterized in that: The controller converts the number of rotation turns of the lifting motor and the number of rotation turns of the translation motor into the vertical movement data and horizontal movement data of the conductive probe (600).
8. The method of use according to claim 6, characterized in that: The controller is electrically connected to the current sensor. The controller controls the start and stop of the lifting motor and the translation motor.
9. The usage method according to claim 6, characterized in that: The translation transmission mechanism includes a translation multi-stage speed reducer and a translation output member. The translation multi-stage speed reducer connects the translation motor and the translation output member. The translation output member is connected to the conductive probe (600). The translation output member converts the rotational movement of the translation multi-stage speed reducer into the translational movement of the conductive probe (600).
10. The usage method according to claim 5, characterized in that: The lifting transmission mechanism includes a lifting multi-stage speed reducer and a lifting output member. The lifting multi-stage speed reducer connects the lifting motor and the lifting output member. The lifting output member is connected to the translation assembly (500). The lifting output member converts the rotational movement of the lifting multi-stage speed reducer into the lifting movement of the translation assembly (500).
11. The usage method according to claim 1, characterized in that: The solution is a sodium chloride solution.
12. The usage method according to claim 1, wherein: The conductive probe (600) is made of a copper alloy material.
13. The usage method according to claim 1, characterized in that: In the step S1, the distance d between the conductive probe (600) and the inner conical surface of the implant (900) is between 10 and 50 microns.
14. The method of use according to claim 1, wherein: In the step S3, the distance L that the translation assembly (500) drives the conductive probe (600) away from the inner conical surface of the implant (900) is between 20 and 100 microns.
15. The method of use according to claim 1, characterized in that: In step S3, the lifting assembly (400) drives the translation assembly (500) to move downward until the current value detected by the current sensor is equal to A.
Citation Information
Patent Citations
Method for detecting connection taper of dental implant
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