Test system and test method thereof

Abstract

This invention discloses a testing system and method. The testing system includes a frame, a turntable, and testing components. A workbench is mounted on the frame and divided into multiple stations. The turntable is rotatably mounted on the workbench. Multiple testing components are spaced apart along the circumference of the turntable, each forming a mounting slot. Each testing component has a testing module connected to an external device and electrically connected to the product under test. The turntable rotates to allow the testing components to sequentially enter different stations. One station is a DC testing station, where the testing module performs DC testing on the product under test. Another station is a night vision testing station, equipped with a light-shielding component connected to the workbench. A third station is a real-scene testing station, where a real-scene test image card is suspended on the workbench and positioned opposite the turntable. This invention's testing system can perform multiple types of tests simultaneously, thereby improving testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of IPC production, and more specifically to a testing system and testing method. Background Technology

[0002] IPC (IP Camera, Network Camera) products require testing before leaving the factory to screen out defective products. Chinese invention patent CN114500989A discloses an intelligent IPC testing device, including an imaging light source board, a distance adjustment component, a teleconverter, and a clamping component. The distance adjustment component includes a support frame and a lifting platform. The clamping component includes a mounting base and a placement plate. The mounting base is disposed on the lifting platform, and the placement plate is connected to the mounting base for placing the device to be tested. This structure can perform imaging tests on IPC products; however, it can only perform imaging tests, with limited test types, and cannot perform night vision or DC tests. Product quality cannot be guaranteed, and only one IPC product can be tested at a time, resulting in low testing efficiency. Summary of the Invention

[0003] The main objective of this invention is to provide a testing system and method to solve the problems of limited testing types and low testing efficiency of traditional testing devices.

[0004] To achieve the above objectives, the testing system proposed in this invention includes a frame, a turntable, and testing components. The frame is equipped with a workbench, which is divided into multiple workstations. The turntable is rotatably mounted on the workbench. Multiple testing components are spaced apart circumferentially on the turntable. Each testing component has a mounting slot that matches the shape of the product under test. Each testing component includes a testing module connected to an external device and electrically connected to the product under test. The turntable rotates to allow the testing components to sequentially enter different workstations. One workstation is a DC testing workstation, where the testing module performs DC testing on the product under test. Another workstation is a night vision testing workstation, equipped with a light-shielding component connected to the workbench. A third workstation is a real-scene testing workstation, where a real-scene test image card is suspended on the workbench and positioned opposite the turntable.

[0005] Optionally, the light-shielding assembly includes a light-shielding cover and a connecting strip, one end of the connecting strip being connected to the workbench and the other end of the connecting strip being connected to the light-shielding cover, and a clearance space being formed between the light-shielding cover and the workbench for the test assembly to pass through.

[0006] Optionally, the test component includes a mounting base and a base, the mounting base having the mounting groove, the base being connected to the turntable, and the mounting base and the base being detachably connected.

[0007] Optionally, the two ends of the base are a first connecting ear and a second connecting ear, respectively. The test module includes a POE plug and a non-POE plug disposed on the first connecting ear, and a voltmeter disposed on the second connecting ear. The POE plug is electrically connected to the voltmeter, and the POE plug and the non-POE plug are used to electrically connect to the product under test.

[0008] Optionally, the first connector ear is provided with a network interface for electrical connection with the external device, the network interface being used for electrical connection with the product under test.

[0009] Optionally, the testing system further includes a slip ring, the turntable is sleeved on the slip ring, and the POE plug, the non-POE plug and the network interface are electrically connected to the external device through the slip ring.

[0010] Optionally, the testing system further includes multiple sensing plates, which are spaced apart circumferentially along the turntable and connected to the turntable. The number of sensing plates is the same as the number of testing components and they are arranged in a one-to-one correspondence. The testing system also includes a fixed plate, which is detachably connected to the worktable by fasteners. A sensor is provided on the fixed plate, and the sensor forms a sensing groove through which the sensing plates pass.

[0011] Optionally, the sensing plate includes a first connecting segment and a second connecting segment connected to each other and arranged at an angle. The first connecting segment is detachably connected to the turntable via a locking member, and the second connecting segment is used to pass through the sensing groove.

[0012] Optionally, one of the workstations is a loading workstation, which is connected to a loading and conveying mechanism; another of the workstations is a unloading workstation, which is connected to an unloading and conveying mechanism; the DC test workstation, the night vision test workstation, and the real-world test workstation are all located between the loading workstation and the unloading workstation.

[0013] In addition, the present invention also provides a testing method based on the testing system described above, comprising the following steps:

[0014] Place the product to be tested into the mounting slot;

[0015] The turntable rotates so that the test components pass sequentially through the DC test station, the night vision test station, and the real-world test station;

[0016] When the test component is moved to the DC test station, the product under test is electrically connected to the test module, and the test module performs DC testing on the product under test.

[0017] When the test components are moved to the night vision test station, the product under test switches to night vision mode;

[0018] When the test component moves to the real-world test station, it controls the product under test to take a picture of the real-world test chart.

[0019] In this invention, multiple test components are spaced circumferentially on a turntable, which is rotatably mounted on a worktable, allowing the turntable to rotate and drive the test components to rotate as well. Each test component has a mounting slot that matches the shape of the product under test (IPC). The mounting slot ensures a stable and reliable connection between the IPC and the test components, preventing the IPC from shaking and thus improving the reliability of the test results. Each test component includes a test module connected to an external device, which is a computer, that displays and stores the test results. After the IPC is installed in the mounting slot, the test module is electrically connected to the IPC. The turntable rotates, causing the test components and the IPC to sequentially enter different workstations. One of these workstations is a DC testing station. When the test components and the IPC enter the DC testing station, the test module performs DC testing on the IPC, enabling the test system to perform DC testing on the IPC. Specifically, the DC testing of the IPC by the test module utilizes existing technology. One workstation is a night vision testing station, equipped with a light-shielding component connected to the workbench for installation and fixation. When the test component and the product under test (DUT) enter the night vision testing station, the light-shielding component blocks light from the test component and the DUT, switching the DUT to night vision mode. The DUT is then photographed, and the image is checked on a computer, enabling the testing system to perform night vision testing on the DUT. Another workstation is a real-scene testing station, with a real-scene test image card suspended above the workbench, positioned opposite a turntable. When the test component and the DUT enter the real-scene testing station, the DUT photographs the real-scene test image card, and the image is checked on a computer for clarity and color accuracy, enabling the testing system to perform real-scene testing on the DUT. Furthermore, the turntable rotates to move the test components and DUT sequentially into different workstations, allowing for simultaneous testing at multiple workstations and improving testing efficiency. The testing system of this invention can perform DC testing, night vision testing, and real-world testing on the product under test. This variety of testing methods ensures product quality, reduces risks, and facilitates the establishment of standardized processes. Furthermore, the rotating turntable drives the testing components and the product under test sequentially into different workstations for testing, allowing multiple workstations to perform testing simultaneously, thereby improving testing efficiency and providing a simple and convenient operation. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0021] Figure 1 This is a three-dimensional structural diagram of a testing system according to an embodiment of the present invention;

[0022] Figure 2 This is a cross-sectional schematic diagram of a test system according to an embodiment of the present invention;

[0023] Figure 3 This is a schematic diagram of the connection of a test component according to an embodiment of the present invention;

[0024] Figure 4 This is a schematic diagram of the connection structure of the fixed disk according to an embodiment of the present invention.

[0025] Explanation of icon numbers:

[0026] label name label name 100 Test System 321 First connecting ear 10 frame 3211 POE plug 11 workbench 3212 Non-POE plug 12 DC testing station 3213 Network interface 13 Night vision testing station 322 Second connecting ear 14 Real-world testing station 3221 Voltmeter 15 Material loading station 40 Light-shielding components 16 Material unloading station 41 Sunshade 20 turntable 42 Connecting strip 21 Part One 43 Avoiding space 22 Part Two 50 Fixed plate 221 Induction plate 51 Sensors 30 Test Components 511 Induction slot 31 Mounting base 60 slip ring 311 Mounting slot 70 External devices 32 base

[0027] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0028] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present invention.

[0029] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indication will also change accordingly.

[0030] Furthermore, in this invention, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0031] In this invention, unless otherwise explicitly specified and limited, the terms "connection," "fixed," etc., should be interpreted broadly. For example, "fixed" can mean a fixed connection, a detachable connection, or an integral part; it can mean a mechanical connection or an electrical connection; it can mean a direct connection or an indirect connection through an intermediate medium; it can mean the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0032] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are feasible for those skilled in the art. If the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

[0033] In this invention, the descriptions of directions such as "up," "down," "front," "back," "left," and "right" are as follows: Figure 1 The directions shown are for reference only and are used to interpret the location. Figure 1 The relative positional relationship between the components in the shown posture is such that if the specific posture changes, the directional indication will also change accordingly.

[0034] This invention provides a testing system.

[0035] In one embodiment, such as Figures 1 to 4 As shown, the testing system 100 includes a frame 10, a turntable 20, and testing components 30. A workbench 11 is mounted on the frame 10 and divided into multiple workstations. The turntable 20 is rotatably mounted on the workbench 11. Multiple testing components 30 are spaced apart along the circumference of the turntable 20. Each testing component 30 has a mounting groove 311 that matches the shape of the product to be tested. Each testing component 30 is equipped with a testing module, which is connected to an external device 70. The test module is used to electrically connect with the product under test. The turntable 20 rotates so that the test components 30 enter different stations in sequence. One station is the DC test station 12, where the test module performs DC testing on the product under test. Another station is the night vision test station 13, which is equipped with a light-shielding component 40 connected to the workbench 11. A third station is the real-scene test station 14, where a real-scene test image card (not shown) is suspended on the workbench 11 and is positioned opposite to the turntable 20.

[0036] Multiple test components 30 are spaced apart circumferentially on a turntable 20, which is rotatably mounted on a worktable 11. The rotation of the turntable 20 drives the multiple test components 30 to rotate. Each test component 30 has a mounting groove 311 that matches the shape of the product under test (IPC). The mounting groove 311 ensures a stable and reliable connection between the product under test and the test component 30, preventing the product from shaking and thus improving the reliability of the test results. Each test component 30 includes a test module connected to an external device 70 (a computer) that displays and stores the test results.

[0037] After the product under test (DUT) is installed in the mounting slot 311, the test module is electrically connected to the DUT. The turntable 20 rotates to drive the test component 30 and the DUT sequentially into different workstations. One of the workstations is the DC test workstation 12. When the test component 30 and the DUT enter the DC test workstation 12, the test module performs DC testing on the DUT, thus enabling the test system 100 to perform DC testing on the DUT. Specifically, the test module uses existing technology to perform DC testing on the DUT. Another workstation is the night vision test workstation 13. The night vision test workstation 13 is equipped with a light-shielding component 40, which is connected to the workbench 11 for installation and fixation. When the test component 30 and the DUT enter the night vision test workstation 13, the light-shielding component 40 blocks light from the test component 30 and the DUT, causing the DUT to switch to night vision mode. The DUT takes a picture, which is then checked on a computer, thus enabling the test system 100 to perform night vision testing on the DUT. One of the workstations is the real-scene testing workstation 14. A real-scene test image card is suspended directly above the workbench 11, and the real-scene test image card is positioned opposite the turntable 20. When the test component 30 and the product under test enter the real-scene testing workstation 14, the product under test takes a picture of the real-scene test image card. The computer checks whether the photo is clear and whether the colors are normal, thus enabling the testing system 100 to perform real-scene testing on the product under test. Furthermore, the turntable 20 rotates to move the test component 30 and the product under test sequentially into different workstations, allowing multiple workstations to perform testing simultaneously, thereby improving testing efficiency.

[0038] The testing system 100 in this embodiment can perform DC testing, night vision testing, and real-world testing on the product under test. This variety of testing methods ensures product quality, reduces risks, and facilitates the establishment of standardized product processes. Furthermore, the turntable 20 rotates, causing the testing components 30 and the product under test to sequentially enter different workstations for testing. Multiple workstations can be tested simultaneously, thereby improving testing efficiency and providing a simple and convenient operation.

[0039] In one embodiment, please refer to the reference Figure 1The light-shielding assembly 40 includes a light-shielding cover 41 and a connecting strip 42. One end of the connecting strip 42 is connected to the workbench 11, and the other end of the connecting strip 42 is connected to the light-shielding cover 41. A clearance space 43 is formed between the light-shielding cover 41 and the workbench 11 for the test assembly 30 to pass through.

[0040] One end of the connecting strip 42 is connected to the workbench 11, enabling the installation and fixation of the connecting strip 42. The other end of the connecting strip 42 is connected to the light shield 41, thereby enabling the installation and fixation of the light shield 41. A clearance space 43 is formed between the light shield 41 and the workbench 11, through which the test component 30 passes. By setting the clearance space 43, interference from the light shield 41 on the rotation of the test component 30 is avoided, making the use of the light shield 41 more convenient. When the test component 30 and the product under test enter the night vision test station 13, the light shield 41 covers the product under test, allowing the product under test to switch to night vision mode, thereby enabling the test system 100 to perform night vision testing on the product under test.

[0041] In one embodiment, please refer to the reference Figure 2 The test component 30 includes a mounting base 31 and a base 32. The mounting base 31 has a mounting groove 311, and the base 32 is connected to the turntable 20. The mounting base 31 and the base 32 are detachably connected.

[0042] The mounting slot 311 of the test component 30 is formed on the mounting base 31. The mounting base 31 and the base 32 are detachably connected, which facilitates the replacement of the mounting base 31 after wear, making the use of the mounting base 31 more convenient. The base 32 is connected to the turntable 20, thereby realizing the connection between the test component 30 and the turntable 20. The turntable 20 can drive the base 32, the mounting base 31 and the product under test to rotate.

[0043] In one embodiment, please refer to the reference Figure 2 The base 32 has a first connecting ear 321 and a second connecting ear 322 at its two ends. The test module includes a POE plug 3211 and a non-POE plug 3212 disposed on the first connecting ear 321, and a voltmeter 3221 disposed on the second connecting ear 322. The POE plug 3211 is electrically connected to the voltmeter 3221, and the POE plug 3211 and the non-POE plug 3212 are used to electrically connect to the product under test.

[0044] Current IPC products can be categorized by whether they support Power over Ethernet (PoE). These can be classified as PoE IPCs or non-PoE IPCs, with the biggest functional difference being whether or not they support PoE. The PoE connector 3211 is used to test PoE-enabled IPCs. The product under test (DUT) is electrically connected to the PoE connector 3211, which is also electrically connected to a voltmeter 3221. The voltmeter 3221 displays the voltage of the DUT in real time. The non-PoE connector 3212 is used to test IPCs that do not support PoE. The DUT is electrically connected to the non-PoE connector 3212. A successful test is achieved when the DUT powers on normally. By configuring the PoE connector 3211 and the non-PoE connector 3212, the test component 30 can test both PoE-enabled and non-PoE-enabled products, thus improving the compatibility of the test system 100.

[0045] In one embodiment, please refer to the reference Figure 2 The first connector 321 is provided with a network interface 3213 for electrical connection with an external device 70. The network interface 3213 is used for electrical connection with the product under test.

[0046] One end of the network interface 3213 is electrically connected to an external device 70, which is a computer, and the other end of the network interface 3213 is electrically connected to the product under test. The network interface 3213 connects the product under test to the computer, enabling the computer to display and store the test results (photos taken during real-world testing and night vision testing).

[0047] In one embodiment, please refer to the reference Figure 1 The test system 100 also includes a slip ring 60, a turntable 20 is fitted outside the slip ring 60, and a POE plug 3211, a non-POE plug 3212 and a network interface 3213 are electrically connected to an external device 70 through the slip ring 60.

[0048] The turntable 20 is fitted around the slip ring 60, which mainly consists of two parts: a rotating part and a stationary part. The rotating part is connected to the turntable 20 and rotates with it, while the stationary part is connected to the external device 70. By using the slip ring 60, the wires of the turntable 20 are prevented from getting tangled during rotation, making the turntable 20 easier to use and improving the safety and reliability of the testing system 100.

[0049] In one embodiment, please refer to the reference Figure 3 and Figure 4The testing system 100 also includes multiple sensor plates 221, which are spaced apart along the circumference of the turntable 20 and connected to the turntable 20. The number of sensor plates 221 is the same as that of multiple test components 30 and they are set one-to-one. The testing system 100 also includes a fixed plate 50, which is detachably connected to the worktable 11 by fasteners. A sensor 51 is provided on the fixed plate 50, and the sensor 51 forms a sensing groove 511 through which the sensor plate 221 passes.

[0050] The turntable 20 includes a first part 21 and a second part 22 connected together. The first part 21 is located on the workbench 11 and connected to multiple test components 30. The second part 22 is located below the workbench 11, and multiple sensing plates 221 are arranged at circumferential intervals along the second part 22, and all of the sensing plates 221 are connected to the second part 22. Rotation of the second part 22 drives the sensing plates 221 to rotate. The number of sensing plates 221 is the same as the number of test components 30, and they are arranged in a one-to-one correspondence, so that the sensing plates 221 and the test components 30 rotate synchronously. The fixed plate 50 is detachably connected to the workbench 11 by fasteners, specifically bolts. Bolts have the advantages of being easy to obtain and easy to install, and the threaded connection makes the connection between the fixed plate 50 and the workbench 11 stable and reliable. The detachable connection between the fixed plate 50 and the workbench 11 facilitates the replacement of the fixed plate 50 after wear, improving the flexibility of the fixed plate 50 in use. A sensor 51 is mounted on the fixed disk 50, and a sensing groove 511 is formed on the sensor 51. The second part 22 drives the sensing plate 221 to rotate, so that the sensing plate 221 passes through the sensing groove 511. The sensor 51 senses the rotation of the sensing plate 221, thereby realizing that the sensor 51 can sense the rotation of the test component 30 and the product under test. By setting the sensor 51 and the sensing plate 221 in cooperation, the rotation of the test component 30 and the product under test can be monitored, improving the reliability and stability of the test results.

[0051] In one embodiment, please refer to the reference Figure 3 and Figure 4 The sensing plate 221 includes a first connecting section and a second connecting section that are connected to each other and arranged at an angle. The first connecting section is detachably connected to the turntable 20 by a locking member, and the second connecting section is used to pass through the sensing groove 511.

[0052] The first connecting section and the second connecting section are connected and are arranged at an angle. The first connecting section is detachably connected to the turntable 20. Specifically, the first connecting section and the second part 22 are detachably connected by a locking element, which is a bolt. Bolts have the advantages of being easy to obtain and convenient to install. Furthermore, the detachable connection between the first connecting section and the second part 22 enables the detachable connection between the sensing element 221 and the turntable 20, facilitating the replacement of the sensing element 221 after wear and making the use of the sensing element 221 more flexible. The second connecting section is used to pass through the sensing groove 511, thereby enabling the sensing element 221 to pass through the sensing groove 511.

[0053] In one embodiment, please refer to the reference Figure 1 One of the stations is the loading station 15, which is used to connect with the loading and conveying mechanism (not shown in the figure); the other station is the unloading station 16, which is used to connect with the unloading and conveying mechanism (not shown in the figure). The DC test station 12, the night vision test station 13, and the real-world test station 14 are all located between the loading station 15 and the unloading station 16.

[0054] The loading station 15 is used to connect with the loading and unloading mechanism, and the unloading station 16 is used to connect with the unloading and unloading mechanism. The DC test station 12, the night vision test station 13, and the real-world test station 14 are all located between the loading station 15 and the unloading station 16. By setting up the loading station 15 and the unloading station 16, the automation level of the test system 100 is increased, the labor cost is reduced, and the test efficiency is improved, which is conducive to achieving standardized operation.

[0055] In addition, the present invention also provides a testing method based on the testing system 100 described above, comprising the following steps:

[0056] Place the product under test into the mounting slot 311; this allows for the installation and fixation of the product under test, preventing it from shaking and affecting the test results, and improving the stability and reliability of the test results.

[0057] The turntable 20 rotates so that the test component 30 passes through the DC test station 12, the night vision test station 13 and the real scene test station 14 in sequence; multiple stations can be tested simultaneously, which improves testing efficiency and is easy to operate.

[0058] When the test component 30 moves to the DC test station 12, the product under test is electrically connected to the test module, and the test module performs DC testing on the product under test.

[0059] When test component 30 is moved to night vision test station 13, the product under test switches to night vision mode;

[0060] When the test component 30 moves to the real-world test station 14, it controls the product under test to take a picture of the real-world test image card.

[0061] The testing method in this embodiment can perform DC testing, night vision testing, and real-world testing on the product under test. This variety of testing methods ensures product quality, reduces risks, and facilitates the establishment of standardized product processes. Furthermore, the rotating turntable 20 drives the testing components 30 and the product under test to sequentially enter different workstations for testing. Multiple workstations can be tested simultaneously, resulting in high testing efficiency and simple, convenient operation.

[0062] The above are merely preferred embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural transformations made under the concept of the present invention using the description and drawings of the present invention, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present invention.

Claims

1. A testing system, characterized in that, The testing system includes: A frame, on which a workbench is provided, the workbench being divided into multiple workstations; A turntable, which is rotatably mounted on the worktable; The test components are multiple in number and are spaced apart on the turntable along its circumference. Each test component has a mounting groove that matches the shape of the product under test. Each test component is equipped with a test module that is connected to an external device and is used to electrically connect to the product under test. The turntable rotates so that the test components sequentially enter different workstations. One of the workstations is a DC testing workstation, where the testing module performs DC testing on the product under test. One of the workstations is a night vision testing workstation, which is equipped with a light-shielding component, and the light-shielding component is connected to the workbench. One of the workstations is a real-scene testing workstation, and a real-scene testing image card is suspended on the workbench. The real-scene testing image card is set opposite to the turntable. The test component includes a mounting base and a base. The mounting base has the mounting groove, and the base is connected to the turntable. The mounting base and the base are detachably connected. The base has a first connecting ear and a second connecting ear at its two ends. The test module includes a POE plug and a non-POE plug disposed on the first connecting ear, and a voltmeter disposed on the second connecting ear. The POE plug is electrically connected to the voltmeter. The POE plug and the non-POE plug are used to electrically connect to the product under test. The testing system also includes multiple sensor plates, which are spaced apart along the circumference of the turntable and connected to the turntable. The number of sensor plates is the same as the number of test components and they are arranged in a one-to-one correspondence. The testing system also includes a fixed plate, which is detachably connected to the worktable by fasteners. A sensor is provided on the fixed plate, and the sensor forms a sensing groove for the sensor plates to pass through. The turntable includes a first part and a second part connected to each other. The first part is located on the workbench and is connected to a plurality of the test components. The second part is located below the workbench. A plurality of the sensing plates are arranged at circumferential intervals along the second part, and all of the sensing plates are connected to the second part. The second part is used to drive the sensing plates to rotate.

2. The testing system as described in claim 1, characterized in that, The light-shielding assembly includes a light-shielding cover and a connecting strip. One end of the connecting strip is connected to the workbench, and the other end of the connecting strip is connected to the light-shielding cover. A clearance space is formed between the light-shielding cover and the workbench for the test assembly to pass through.

3. The testing system as described in claim 1, characterized in that, The first connector ear is provided with a network interface for electrical connection with the external device, and the network interface is used for electrical connection with the product under test.

4. The testing system as described in claim 3, characterized in that, The testing system also includes a slip ring, the turntable is sleeved on the slip ring, and the POE plug, the non-POE plug and the network interface are electrically connected to the external device through the slip ring.

5. The testing system according to any one of claims 1 to 4, characterized in that, The sensing element includes a first connecting segment and a second connecting segment that are connected to each other and arranged at an angle. The first connecting segment is detachably connected to the turntable via a locking member, and the second connecting segment is used to pass through the sensing slot.

6. The testing system according to any one of claims 1 to 4, characterized in that, One of the workstations is a loading workstation, which is used to connect to a loading and conveying mechanism; One of the workstations is a material unloading workstation, which is used to connect to the material unloading and conveying mechanism. The DC test workstation, the night vision test workstation, and the real-scene test workstation are all located between the material loading workstation and the material unloading workstation.

7. A test method based on the test system according to any one of claims 1 to 6, characterized in that, Includes the following steps: Place the product under test into the mounting slot; the mounting slot is used to install and fix the product under test, and to prevent the product under test from shaking and affecting the test results. The turntable rotates so that the test components pass sequentially through the DC test station, the night vision test station, and the real-world test station; When the test component is moved to the DC test station, the product under test is electrically connected to the test module, and the test module performs DC testing on the product under test. When the test components are moved to the night vision test station, the product under test switches to night vision mode; When the test component moves to the real-world test station, it controls the product under test to take a picture of the real-world test chart.

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