Method, apparatus and electronic device for testing SAW filter device

Abstract

The application discloses a SAW filter device testing method, device and electronic equipment, the method comprises the following steps: obtaining the test index of the device to be tested, the test index comprises an in-band insertion loss index and an out-of-band suppression index; obtaining a passband frequency range and a passband endpoint frequency based on the in-band insertion loss index, and obtaining a suppression frequency range and a corresponding suppression endpoint frequency based on the out-of-band suppression index; segmenting the passband frequency range according to the passband endpoint frequency, and segmenting the suppression frequency range according to the suppression endpoint frequency, thereby obtaining a plurality of pass-through sub-frequency ranges and a plurality of suppression sub-frequency ranges; setting a plurality of first test frequency points in the pass-through sub-frequency ranges according to the passband endpoint frequency, and setting a plurality of second test frequency points in the suppression sub-frequency ranges according to the suppression endpoint frequency; and testing the device to be tested according to the sampling values of the first test frequency points and the second test frequency points. The application optimizes the test frequency point allocation mode, directly samples the frequency range endpoint frequency, improves the SAW filter device test precision, and reduces the proportion of edge failure products.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of filter detection, and in particular to a SAW filter device testing method and device and electronic equipment. BACKGROUND

[0002] A filter is a device for selecting a specific frequency signal and filtering interference signals, and is a basic device in a wireless communication system. A surface acoustic wave (SAW) filter is widely used in communication equipment due to its small size and high performance. The performance of a SAW filter is mainly manifested by piezoelectric materials and interdigital transducers. An input end interdigital transducer converts an electrical signal into an acoustic signal, and the acoustic wave propagates horizontally on the filter surface in the form of a standing wave. An output end interdigital transducer converts the received acoustic signal into an electrical signal output, thereby realizing filtering.

[0003] The main performance indicators of a SAW filter include a passband bandwidth, an in-band insertion loss (IL), an out-of-band rejection, and a temperature drift. Among them, the passband bandwidth, the in-band insertion loss, and the out-of-band rejection can be calculated by a network analyzer. The network analyzer sets a test frequency point according to a measurement frequency range, and sets a measurement time of each test frequency point according to a need, and calculates a dB value according to a sampling value of the test frequency.

[0004] In the prior art, the method for setting a test frequency point by the network analyzer is to set the frequency points uniformly in the measurement frequency range. For example, in a factory production line test, one frequency point is set every 1MHz in the insertion loss frequency band, which has the following problems: the extreme value of the insertion loss usually appears at the frequency band end point, and the method of uniformly setting the frequency points cannot guarantee that the network analyzer samples the frequency band end point of the insertion loss indicator. If the network analyzer does not actually sample the frequency band end point of the insertion loss indicator, the dB value at the frequency band end point of the insertion loss is calculated by using the average value of the actual sampling values on both sides of the frequency band end point. This method uses an interpolation average method to process the missing data of the network analyzer sampling, which is easy to cause the change of the dB value to exceed the test precision (generally 0.05dB) of the network analyzer itself. This change of the dB value cannot be solved by increasing the number of test points, and increasing the number of test points will also increase the test time, and the interpolation average method is easy to cause misjudgment of edge failure products, for example, judging a qualified device as not passing the test, affecting the product yield, or judging a unqualified device as passing the test, affecting the normal use of customers. SUMMARY

[0005] The application provides a SAW filter device test method, device and electronic equipment, to solve the problem of unreasonable filter test frequency point setting, which leads to the change of dB value at the end of the frequency band exceeding the test precision of the network analyzer itself, and easily causes the misjudgment of edge failure products, and improves the SAW filter device test precision.

[0006] According to an aspect of the application, a SAW filter device test method is provided, comprising:

[0007] Obtaining a test index of a device to be tested, the test index comprising an in-band insertion loss index and an out-of-band suppression index;

[0008] Obtaining a passband frequency band and a passband end frequency based on the in-band insertion loss index, and obtaining a suppression frequency band and a corresponding suppression end frequency based on the out-of-band suppression index;

[0009] Segmenting the passband frequency band according to the passband end frequency, and segmenting the suppression frequency band according to the suppression end frequency, to obtain a plurality of pass-through sub-frequency bands and a plurality of suppression sub-frequency bands;

[0010] Setting a plurality of first test frequency points in the pass-through sub-frequency bands according to the passband end frequency, and setting a plurality of second test frequency points in the suppression sub-frequency bands according to the suppression end frequency, wherein the plurality of first test frequency points comprise all passband end frequencies of the passband frequency band in a normal temperature segment and a full temperature segment; and the plurality of second test frequency points comprise all suppression end frequencies of the suppression frequency band in the normal temperature segment and the full temperature segment;

[0011] Testing the device to be tested according to the sampling values of the first test frequency points and the second test frequency points.

[0012] According to another aspect of the present application, there is provided a SAW filter device testing apparatus for performing the above-mentioned SAW filter device testing method, the testing apparatus comprising: a testing index obtaining module for obtaining testing indexes of a device under test, the testing indexes comprising an in-band insertion loss index and an out-of-band rejection index; a testing index analyzing module for obtaining a passband frequency range and passband end frequencies based on the in-band insertion loss index, and obtaining a rejection frequency range and corresponding rejection end frequencies based on the out-of-band rejection index; a frequency point configuring module for segmenting the passband frequency range according to the passband end frequencies, and segmenting the rejection frequency range according to the rejection end frequencies, to obtain a plurality of pass-through sub-frequency ranges and a plurality of rejection sub-frequency ranges; the frequency point configuring module is further configured to set a plurality of first testing frequency points in the pass-through sub-frequency ranges according to the passband end frequencies, and set a plurality of second testing frequency points in the rejection sub-frequency ranges according to the rejection end frequencies, wherein the plurality of first testing frequency points comprise all passband end frequencies of the passband frequency range in a normal temperature range and a full temperature range; the plurality of second testing frequency points comprise all rejection end frequencies of the rejection frequency range in the normal temperature range and the full temperature range; and a testing executing module for testing the device under test according to sampling values of the first testing frequency points and the second testing frequency points.

[0013] According to another aspect of the present application, there is provided an electronic device, comprising: at least one processor; and a memory connected with the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the above-mentioned SAW filter device testing method.

[0014] The technical scheme of the embodiment of the present application acquires a test index of a device to be tested, the test index including an in-band insertion loss index and an out-of-band suppression index; acquires a passband frequency band and a passband endpoint frequency based on the in-band insertion loss index, and acquires a suppression frequency band and a corresponding suppression endpoint frequency based on the out-of-band suppression index; segments the passband frequency band according to the passband endpoint frequency, and segments the suppression frequency band according to the suppression endpoint frequency, to obtain a plurality of pass-through sub-frequency bands and a plurality of suppression sub-frequency bands; sets a plurality of first test frequency points in the pass-through sub-frequency band according to the passband endpoint frequency, and sets a plurality of second test frequency points in the suppression sub-frequency band according to the suppression endpoint frequency, so that the plurality of first test frequency points include all passband endpoint frequencies of the passband frequency band in a normal temperature segment and a full temperature segment; the plurality of second test frequency points include all suppression endpoint frequencies of the suppression frequency band in the normal temperature segment and the full temperature segment; and performs performance testing on the device to be tested according to the sampling values of the first test frequency points and the second test frequency points. By optimizing the allocation mode of the test frequency points, directly sampling the frequency band endpoint frequency, and sampling the insertion loss extreme value to the maximum extent, the missing data is not required to be processed by introducing an interpolation average method, the in-band test precision of the insertion loss is higher than the hardware test precision of the network analyzer itself, the unreasonable setting of the existing filter test frequency points is solved, the change of the dB value at the frequency band endpoint is greater than the test precision of the network analyzer itself, the problem of misjudgment of the edge failure product is solved, the SAW filter device test precision is improved, the proportion of the edge failure product is reduced, the electrical performance testing is performed by directly sampling the specific frequency band endpoint frequency, the sampling point number is not required to be increased, the test time can be shortened, and the method is suitable for the production line mass production testing scene.

[0015] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0017] Figure 1 A flowchart of a SAW filter device test method is provided for the first embodiment of the present application;

[0018] Figure 2 A flowchart of a SAW filter device test method of a first alternative embodiment provided for the first embodiment of the present application;

[0019] Figure 3A flow chart of a SAW filter device test method of a second alternative embodiment provided for the first embodiment of the present application;

[0020] Figure 4 A flow chart of a SAW filter device test method of a third alternative embodiment provided for the first embodiment of the present application;

[0021] Figure 5 A test curve diagram of a test frequency point of the prior art;

[0022] Figure 6 A test curve diagram of a test frequency point provided for the first embodiment of the present application;

[0023] Figure 7 A structure diagram of a SAW filter device test apparatus provided for the second embodiment of the present application;

[0024] Figure 8 A structure diagram of an electronic device for implementing the SAW filter device test method of the present application. DETAILED DESCRIPTION

[0025] In order to make the personnel in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by the personnel in the art without creative labor should belong to the scope of protection of the present application.

[0026] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0027] Embodiment one

[0028] Figure 1A flowchart of a SAW filter device test method is provided for Embodiment One of the present application. The present embodiment can be applied to the application scenario of production line mass production testing of SAW filter devices. The method can be executed by a SAW filter device test apparatus, which can be implemented in the form of hardware and / or software, and can be configured in a computer device. As shown in FIG. Figure 1 The SAW filter device test method specifically includes the following steps:

[0029] S1: Obtain the test index of the device under test, which includes the in-band insertion loss index and the out-of-band suppression index.

[0030] The test index refers to an electrical parameter used to determine whether the actual electrical performance of the device under test meets the design requirements. Based on the gating frequency band of the device under test, the test index can be divided into the in-band insertion loss index and the out-of-band suppression index. The in-band insertion loss index is a threshold value used to represent the attenuation capability of the device under test to signals within the passband. The smaller the absolute value of the in-band insertion loss value, the better the pass-through performance of the signals within the passband. The out-of-band suppression index is a threshold value used to represent the attenuation capability of the device under test to signals outside the passband. The greater the absolute value of the out-of-band suppression value, the better the suppression performance of the signals outside the passband.

[0031] In the embodiments of the present application, the device under test can be any one of the following: a single SAW filter, a duplexer, or a multiplexer. The duplexer is composed of an RX filter, a TX filter, and an ANT antenna, and can be used to isolate the transmitted and received signals to ensure that the receiving and transmitting can work normally at the same time. The multiplexer is composed of multiple groups of bandpass filters with different frequency bands. Taking a quadplexer as an example, it is composed of two RX filters, two TX filters, and an ANT antenna.

[0032] In an embodiment, the test index can be set based on a specific compensation value.

[0033] Specifically, the in-band insertion loss index includes at least one passband frequency band and the insertion loss value corresponding to each passband frequency band; and the out-of-band suppression index includes at least one suppression frequency band and the suppression corresponding to each suppression frequency band.

[0034] S2: Obtain the passband frequency band and the passband endpoint frequency based on the in-band insertion loss index, and obtain the suppression frequency band and the suppression endpoint frequency based on the out-of-band suppression index.

[0035] The passband frequency band can cover all frequency bands within the in-band insertion loss index, and the passband endpoint frequency is the frequency value at the endpoint of the frequency band shown in the in-band insertion loss index. The suppression frequency band can cover all frequency bands within the out-of-band suppression index, and the suppression endpoint frequency is the frequency value at the endpoint of the frequency band shown in the out-of-band suppression index.

[0036] In the embodiments of the present application, based on the temperature drift phenomenon of chip testing, the in-band insertion loss index can include an in-band insertion loss index in a normal temperature section and an in-band insertion loss index in a full temperature section, and the out-of-band suppression index includes an out-of-band suppression index in a normal temperature section and an out-of-band suppression index in a full temperature section.

[0037] Exemplarily, the present application provides a test index of a device under test, as shown in Table 1:

[0038]

[0039] As can be known from Table 1, the in-band insertion loss index of the device under test in a normal temperature section is that the absolute value of the minimum value of the insertion loss in the frequency section [F1, F2] needs to be less than the absolute value of the maximum loss value α1 in the normal temperature section; the in-band insertion loss index in a full temperature section is that the absolute value of the minimum value of the insertion loss in the frequency section [F1', F2'] needs to be less than the absolute value of the maximum loss value α2 in the full temperature section. Correspondingly, the passband frequency section of the device under test is a frequency section that can completely cover the passband frequency section [F1, F2] in the normal temperature section and the passband frequency section [F1', F2'] in the full temperature section, and the passband end frequency includes all of the following items: the passband end frequencies F1 and F2 in the normal temperature section, and the passband end frequencies F1' and F2' in the full temperature section.

[0040] Continuing to refer to Table 1, the out-of-band suppression index of the device under test in a normal temperature section is that the absolute value of the maximum value of the suppression in the frequency section [F 10 ,F 20 ] needs to be greater than the absolute value of the minimum suppression value β1 in the normal temperature section; the out-of-band suppression index in a full temperature section is that the absolute value of the maximum value of the insertion loss in the frequency section [F 10 ',F 20 '] needs to be less than the absolute value of the minimum suppression value β2 in the full temperature section. Correspondingly, the suppression frequency section is a frequency section that can completely cover the suppression frequency section [F 10 ,F 20 ] in the normal temperature section and the suppression frequency section [F 10 ',F 20 '] in the full temperature section, and the suppression end frequency includes all of the following items: the suppression end frequencies F 10 and F 20 in the normal temperature section, and the suppression end frequencies F 10 ' and F 20 ' in the full temperature section.

[0041] S3: segmenting the passband frequency section according to the passband end frequency, and segmenting the suppression frequency section according to the suppression end frequency, to obtain a plurality of passband sub-sections and a plurality of suppression sub-sections.

[0042] Among them, the points at the passband end frequencies or the points close to the passband end frequencies can be used as the segmentation points of the passband frequency section, and the points at the suppression end frequencies or the points close to the suppression end frequencies can be used as the segmentation points of the suppression frequency section.

[0043] For example, if the normal-temperature-band passband frequency range is defined as 2300-2400 MHz and the full-temperature-band passband frequency range is defined as 2296.25-2404.92 MHz, four sets of segmented frequency points can be set according to the four end-point frequencies 2300 MHz, 2400 MHz, 2296.25 MHz and 2404.92 MHz, each set of segmented frequency points including the end frequency of the preceding sub-frequency range and the start frequency of the following sub-frequency range, and the passband frequency range is divided into five conducting sub-frequency ranges based on the four sets of segmented frequency points.

[0044] It should be noted that the frequency interval at the junction of the two adjacent conducting sub-frequency ranges can be set to any value less than or equal to 1 MHz, and the frequency interval at the junction of the two adjacent suppressing sub-frequency ranges can be adjusted as needed according to the actual number of test points.

[0045] S4: setting a plurality of first test frequency points in the conducting sub-frequency range according to the passband end-point frequencies and setting a plurality of second test frequency points in the suppressing sub-frequency range according to the suppressing end-point frequencies.

[0046] The plurality of first test frequency points include all passband end-point frequencies of the passband frequency range in the normal-temperature range and the full-temperature range, and the plurality of second test frequency points include all suppressing end-point frequencies of the suppressing frequency range in the normal-temperature range and the full-temperature range.

[0047] Specifically, in any conducting sub-frequency range, the test frequency points can be inserted with the same interpolation step, and in different conducting sub-frequency ranges, the test frequency points can be configured with different interpolation steps.

[0048] It should be noted that when configuring the test frequency points, the more test frequency points are set, the longer the test time is. When the present application is applied to the production line mass production test scenario, the balance between the sampling frequency points and the number of frequency points can be achieved by adjusting the interpolation steps of different frequency ranges, so as to improve the test precision while shortening the test time.

[0049] S5: testing the device under test according to the sampling values of the first test frequency points and the second test frequency points.

[0050] The sampling values can be the sampling values of the insertion loss of the network analyzer at the test frequency points.

[0051] In the embodiments of the present application, the extreme values of the insertion loss or the suppression usually occur at the end-point frequencies of the frequency ranges. The passband end-point frequencies or the suppressing end-point frequencies can be allocated to the sampling points of the network analyzer, and after the segmented frequency points are allocated, the accurate values of the segmented frequency points can be calculated by using the following Formula 1:

[0052] S 21_dB = 20*lg|S 21 (i)| (Formula 1)

[0053] wherein S 21 (i) represents the loss data collected by the network analyzer when the sampling frequency is i. By sampling the end frequency of the frequency band, the dB value of the test precision in the insertion loss frequency band is higher than the hardware precision of the network analyzer itself (for example, 0.05 dB).

[0054] Specifically, when performing electrical performance testing on the device under test, first, the test indicators of the device under test are obtained, for example, the in-band insertion loss indicator and the out-of-band suppression indicator, the passband frequency band and the passband end frequency are set according to all the frequency bands in the in-band insertion loss indicator, and the suppression frequency band and the suppression end frequency are set according to all the frequency bands in the out-of-band suppression indicator. Then, the passband end frequency or the suppression end frequency is allocated to the sampling points of the network analyzer. After allocating the frequency points in sections, the accurate values of the segmented frequency points are calculated, and the passband frequency band is divided into multiple sub-frequency bands, such as the pass-through sub-frequency band and the suppression sub-frequency band, according to the segmented frequency points. Further, multiple first test frequency points are set in the pass-through sub-frequency band, and multiple second test frequency points are set in the suppression sub-frequency band, so that the multiple first test frequency points include all the passband end frequencies of the in-band insertion loss indicator in the normal temperature segment and the full temperature segment, and the multiple second test frequency points include all the suppression end frequencies of the out-of-band suppression indicator in the normal temperature segment and the full temperature segment. All the first test frequency points and the second test frequency points are allocated to the network analyzer, and the device under test is tested according to the sampling values of the first test frequency points and the second test frequency points. If the absolute value of the sampling value of any first test frequency point is greater than the absolute value of the maximum loss value (for example, α1 or α2) in the in-band insertion loss indicator, or the absolute value of the sampling value of any second test frequency point is less than the absolute value of the minimum loss value (for example, β1 or β2) in the out-of-band suppression indicator, it is determined that the quality test of the device under test fails. If the absolute values of the sampling values of all the first test frequency points are all less than the absolute value of the maximum loss value (for example, α1 or α2) in the in-band insertion loss indicator, and the absolute values of the sampling values of all the second test frequency points are all greater than the absolute value of the minimum loss value (for example, β1 or β2) in the out-of-band suppression indicator, it is determined that the quality test of the device under test passes.

[0055] The technical scheme of the present application optimizes the allocation mode of the test frequency points, directly samples the end frequency of the frequency band, maximizes the sampling of the insertion loss extreme value, does not need to introduce the interpolation average method to process missing data, makes the test precision dB value in the insertion loss frequency band higher than the hardware test precision of the network analyzer itself, solves the problem that the existing filter test frequency point setting is unreasonable, causing the dB value at the end of the frequency band to change more than the test precision of the network analyzer itself, which easily causes the misjudgment of the edge failure product, is beneficial to improve the test precision of the SAW filter device, reduce the proportion of the edge failure product, directly samples the specific frequency band end frequency for electrical performance testing, does not need to increase the number of sampling points, can shorten the test time, and is suitable for production line mass production test scenes.

[0056] Optionally, Figure 2 The flow chart of the SAW filter device test method of the first alternative embodiment provided for the first embodiment of the present application is based on Figure 1 The specific implementation of obtaining the test index is exemplarily shown.

[0057] As Figure 2 shown, the test index of the device under test is obtained, including the following steps:

[0058] S101: Obtain a compensation value based on the deviation between the machine test and the solder test of the device under test. The compensation value includes an in-band insertion loss compensation value and an out-of-band suppression compensation value.

[0059] Wherein, the machine test is a method of testing the filtering performance of the device under test by using a test machine, which sucks the device under test through the test machine suction nozzle and presses it onto the circuit board; the solder test is a method of testing the filtering performance of the device under test after the device under test is soldered to the circuit board. Because the test environments of the machine test and the solder test are different, the test results of the filtering performance of the device under test have deviations, and the compensation value is a parameter for eliminating the test deviation between the machine test and the solder test.

[0060] It should be noted that different compensation values can be set in different frequency bands. For example, the compensation value in the passband can be set to be greater than the compensation value outside the passband; outside the passband, the farther the distance from the passband frequency band, the greater the absolute value of the compensation value. The specific value of the compensation value can be set based on research and development or test experience, which is not limited.

[0061] S102: Determine the in-band insertion loss index according to the in-band insertion loss compensation value, and determine the out-of-band suppression index according to the out-of-band suppression compensation value. Wherein, the in-band insertion loss index includes the in-band insertion loss index in the normal temperature segment and the in-band insertion loss index in the full temperature segment. In the normal temperature segment and the full temperature segment, the in-band insertion loss compensation value can be set to the same value.

[0062] Exemplarily, taking the on-frequency band as an example, if the in-band insertion loss compensation value of the normal temperature segment and the full temperature segment is defined as 0.14, the solder test data is: in the normal temperature (for example, 25℃) state, the insertion loss in the 2300.0-2400.0MHz frequency band is greater than -2.5dB; considering temperature drift, the passband frequency band after temperature drift is 2296.25-2404.92MHz, and in the temperature drift state, the insertion loss in the 2296.25-2404.92MHz frequency band is greater than -3.1dB, Table 2 shows a test index data table of a device under test.

[0063]

[0064] In combination with Table 2, the loss compensation value in the passband is defined as 0.14 dB, and the in-band insertion loss index at normal temperature is represented as: the minimum value of the insertion loss needs to be greater than -2.64 dB in the frequency band of 2300 MHz to 2400 MHz; considering the temperature drift (for example, -20℃ to 75℃), the in-band insertion loss index at full temperature is represented as: the minimum value of the insertion loss needs to be greater than -3.24 dB in the frequency band of 2296.25 MHz to 2404.92 MHz.

[0065] Therefore, by developing the difference between the machine measurement and the solder measurement, the test index of the device to be measured is corrected, so as to improve the test accuracy and avoid the influence of the deviation between the machine measurement and the solder measurement on the test result.

[0066] Optionally, Figure 3 The flow chart of the SAW filter device test method of the second alternative embodiment provided for the first embodiment of the present application is based on Figure 1 and exemplarily shows a specific implementation of setting the segmentation frequency points.

[0067] As Figure 3 shown, the passband frequency band is segmented according to the passband endpoint frequency, including the following steps:

[0068] S301: Obtain the normal-temperature passband endpoint frequency and the full-temperature passband endpoint frequency.

[0069] S302: Sort the normal-temperature passband endpoint frequency and the full-temperature passband endpoint frequency in ascending order to obtain a first endpoint frequency sorting result.

[0070] S303: Set the segmentation frequency points according to the first endpoint frequency sorting result, and segment the passband frequency band based on the segmentation frequency points to obtain a plurality of on-conduction sub-frequency bands.

[0071] As Figure 3 shown, the suppression frequency band is segmented according to the suppression endpoint frequency, including the following steps:

[0072] S304: Obtain the normal-temperature suppression endpoint frequency and the full-temperature suppression endpoint frequency.

[0073] S305: Sort the normal-temperature suppression endpoint frequency and the full-temperature suppression endpoint frequency in ascending order to obtain a second endpoint frequency sorting result.

[0074] S306: Set the segmentation frequency points according to the second endpoint frequency sorting result, and segment the suppression frequency band based on the segmentation frequency points to obtain a plurality of suppression sub-frequency bands.

[0075] The segmentation frequency points can be the frequency points at or close to the endpoint frequencies.

[0076] Specifically, two segment frequencies are set at the end point frequency, one of which is the terminal frequency of the previous sub-frequency band, and the other is the starting frequency of the next sub-frequency band. After obtaining the segment frequencies, the segment frequencies can be allocated to the network analyzer as sampling points. By calculating the sampling points, the loss value corresponding to the end point frequency can be obtained, avoiding missing or sampling the loss extreme point.

[0077] In an embodiment, the segment frequencies are set according to the end point frequency sorting result, including: obtaining the minimum end point frequency F min and the maximum end point frequency F max in the end point frequency sorting result; determining the minimum end point frequency F min as the first segment frequency F d1 , and determining the maximum end point frequency F max as the second segment frequency F d2 ; determining the third segment frequency F max according to the adjacent frequency of the minimum end point frequency F d3 , and determining the fourth segment frequency F max according to the adjacent frequency of the maximum end point frequency F d4 ; segmenting the passband frequency band based on the first segment frequency F d1 , the second segment frequency F d2 , the third segment frequency F d3 and the fourth segment frequency F d4 .

[0078] The frequency value of the third segment frequency F d3 is less than the first segment frequency F d1 (i.e., the minimum end point frequency F min ), and the interval between the third segment frequency F d3 and the first segment frequency F d1 (i.e., the minimum end point frequency F min ) is less than or equal to a preset unit frequency interval, for example, 1MHz; the frequency value of the fourth segment frequency F d4 is greater than the second segment frequency F d2 (i.e., the maximum end point frequency F max ), and the interval between the fourth segment frequency F d4 and the second segment frequency F d2 (i.e., the maximum end point frequency F max ) is less than or equal to twice the preset unit frequency interval, for example, 2MHz.

[0079] Specifically, based on the first segment frequency F d1 , the second segment frequency F d2 , the third segment frequency F d3 and the fourth segment frequency Fd4 The passband frequency band can be segmented into the following conduction sub-bands: F S To F d3 F d1 To F d2 F d4 To F E , of which F S F is the starting frequency of the frequency band preceding the frequency band where the in-band insertion loss index is located; E It is the termination frequency of the next frequency band after the frequency band where the in-band insertion loss index is located.

[0080] Optionally, setting segmented frequency points based on the endpoint frequency sorting results further includes: obtaining the first intermediate frequency F from the endpoint frequency sorting results. Z1 Second intermediate frequency F Z2 Among them, the first intermediate frequency F Z1 Greater than the minimum endpoint frequency F min And the first intermediate frequency F Z1 Less than the second intermediate frequency F Z2 The second intermediate frequency F Z2 Less than the maximum endpoint frequency F max According to the first intermediate frequency F Z1 Determine the fifth segment frequency point F d5 and the sixth segment frequency point F d6 And according to the second intermediate frequency F Z2 Determine the seventh segment frequency point F d7 and the eighth segment frequency point F d8 Based on the first segment frequency point F d1 Second segment frequency point F d2 Third segment frequency point F d3 Fourth segment frequency point F d4 Fifth segment frequency point F d5 The sixth segment frequency point F d6 , Seventh segment frequency point F d7 and the eighth segment frequency point F d8 The passband frequency band is segmented.

[0081] Among them, the fifth segment frequency point F d5 The frequency value is less than the sixth segment frequency point F. d6 Frequency value, fifth segment frequency point F d5 With the first intermediate frequency F Z1 The interval between them is less than or equal to the preset unit frequency interval, and the sixth segment frequency point F d6 With the first intermediate frequency F Z1 The interval between them is less than or equal to the preset unit frequency interval, for example, 1MHz; the seventh segment frequency point F d7 The frequency value is less than the eighth segment frequency point F.d8 the frequency value of the eighth segment frequency point F d8 and the second intermediate frequency F d2 is less than or equal to twice the preset unit frequency interval, for example, 2MHz.

[0082] Specifically, based on the first segment frequency point F d1 , the second segment frequency point F d2 , the third segment frequency point F d3 , the fourth segment frequency point F d4 , the fifth segment frequency point F d5 , the sixth segment frequency point F d6 , the seventh segment frequency point F d7 and the eighth segment frequency point F d8 , the passband frequency range can be segmented into the following pass-through sub-frequency ranges: F S to F d3 , F d1 to F d5 , F d6 to F d7 , F d8 to F d2 , F d4 to F E , wherein F S is the starting frequency of the previous frequency range of the frequency range where the in-band insertion loss index is located; F E is the terminal frequency of the next frequency range of the frequency range where the in-band insertion loss index is located.

[0083] Exemplarily, the segment frequency point configuration method can be described in detail in combination with specific data. The normal temperature segment passband frequency range is defined as 2300MHz to 2400MHz, and the full temperature segment passband frequency range is defined as 2296.25MHz to 2404.92MHz. The normal temperature segment passband endpoint frequencies are 2300.0MHz and 2400MHz, and the full temperature segment passband endpoint frequencies are 2296.25MHz and 2404.92MHz. The endpoint frequency sorting result in the order from small to large is: 2296.25MHz < 2300.0MHz < 2400.0MHz < 2404.92MHz, wherein 2296.25MHz is the minimum endpoint frequency F min , 2300.0MHz is the first intermediate frequency F Z1 , 2400.0MHz is the second intermediate frequency F Z2 , and 2404.92MHz is the maximum endpoint frequency F max .

[0084] At this time, 2296.25MHz can be taken as the first segment frequency point F d1 ; and 2404.92MHz can be taken as the second segment frequency point F d2; a frequency point (e.g. 2296.0 MHz) close to 2296.25 MHz as the third partial segment frequency point F d3 ; a frequency point (e.g. 2406.0 MHz) close to 2404.92 MHz as the fourth partial segment frequency point F d4 ; a frequency point (e.g. 2300.0 MHz) close to 2300.0 MHz as the fifth partial segment frequency point F d5 ; another frequency point (e.g. 2301.0 MHz) close to 2300.0 MHz as the sixth partial segment frequency point F d6 ; a frequency point (e.g. 2403.0 MHz) close to 2400.0 MHz as the seventh partial segment frequency point F d7 ; another frequency point (e.g. 2404.0 MHz) close to 2400.0 MHz as the eighth partial segment frequency point F d8 Based on this, the insertion loss partial segment frequency point settings can be divided into the following on frequencies as shown in Table III:

[0085]

[0086] As shown in Table III, F S is the start frequency of the preceding frequency segment of the frequency segment where the in-band insertion loss index is located, and F E is the end frequency of the following frequency segment of the frequency segment where the in-band insertion loss index is located. Exemplarily, F S may be set as 2279 MHz, and F E may be set as 2436 MHz, and the specific values thereof are not limited.

[0087] It should be noted that if the normal-temperature segment passband end frequency and the full-temperature segment passband end frequency coincide, i.e. F1 and F1' coincide, and F2 and F2' coincide, the segment frequency points can be set according to the coinciding end frequencies. At this time, the insertion loss partial segment frequency point settings can be divided into the following on frequencies as shown in Table IV: s to F 1L , F1 (or F1') to F2 (or F2'), F 2H to F E , wherein F S is the start frequency of the preceding frequency segment of the frequency segment where the in-band insertion loss index is located, and F E is the end frequency of the following frequency segment of the frequency segment where the in-band insertion loss index is located.

[0088] It should be further noted that the method of segmenting the suppression frequency segment according to the suppression end frequency is similar to the above-mentioned method of segmenting the passband frequency segment according to the passband end frequency, and will not be described herein again.

[0089] Therefore, according to the technical scheme of the present application, the segment frequency points are set according to the band end points defined in the in-band insertion loss index and the out-of-band suppression index, the segment frequency points are distributed to the network analyzer as sampling points, the loss sampling at the end frequency is realized, the loss extreme point is avoided to be missed or not sampled, the test frequency point is optimized, and the SAW filter device test precision is improved, and the edge failure product ratio is reduced.

[0090] Optionally, Figure 4 The flow chart of the SAW filter device test method of the third alternative embodiment provided by the first embodiment of the present application is based on Figure 1 The specific embodiment of the segment insertion test frequency point is exemplarily shown.

[0091] As Figure 4 shown, a plurality of first test frequency points are set in the on sub-band according to the on sub-band end frequency, including:

[0092] S401: The on sub-band end frequency is set as the first test frequency point.

[0093] S402: The first interpolation step is set according to the on sub-band end frequency and the on sub-band, and the first test frequency point is inserted in the on sub-band based on the first interpolation step.

[0094] The first interpolation step is less than or equal to the preset unit frequency interval. Exemplarily, the first interpolation step can be set as one or more values less than or equal to 1MHz.

[0095] It should be noted that in the embodiments of the present application, the first interpolation step can be set as different values in different on sub-bands.

[0096] Exemplarily, taking the in-band insertion loss index part frequency points of the B40RX filter model as an example, the in-band insertion loss index of the normal temperature segment is defined as: the minimum insertion loss needs to be greater than -2.64dB in the 2300MHz to 2400MHz frequency band; the full temperature segment in-band insertion loss index is established considering the temperature drift (for example, -20℃ to 75℃), and the full temperature segment in-band insertion loss index is: the minimum insertion loss needs to be greater than -3.24dB in the 2296.25MHz to 2404.92MHz frequency band. Taking 2296.25MHz, 2300.0MHz, 2400.0MHz and 2404.92MHz as the end frequency, combining the segment result shown in Table 3 above, and the number requirement of the test frequency point, the test frequency point distribution table as shown in Table 4 can be established:

[0097]

[0098] According to the above Table 4, the interpolation step is 0.537 MHz, and the test frequencies allocated in the frequency band of 2296.25 MHz to 2300.0 MHz are as follows: 2296.25 MHz, 2296.78 MHz, 2297.32 MHz, 2297.86 MHz, 2298.39 MHz, 2298.93 MHz, 2299.47 MHz, and 2300.0 MHz; the interpolation step is 1 MHz, and the test frequencies allocated in the frequency band of 2301.0 MHz to 2403.0 MHz are as follows: 2301.0 MHz, 2302.0 MHz, 2303.0 MHz, …, 2401.0 MHz, 2402.0 MHz, and 2403.0 MHz; and the test frequencies allocated in the frequency band of 2404.0 MHz to 2404.92 MHz are as follows: 2404.0 MHz and 2404.92 MHz.

[0099] According to Table 4, when inserting test frequencies in the same on sub-band, a fixed first interpolation step can not be used to configure the frequencies, and the all passband endpoint frequencies in the normal temperature segment and the full temperature segment can be adaptively set as test frequencies.

[0100] Referring to FIG. 4, according to the suppression endpoint frequency, a plurality of second test frequencies are set in the suppression sub-band, including: Figure 4

[0101] S403: The sub-band endpoint of the suppression sub-band is set as a second test frequency.

[0102] S404: A second interpolation step is set according to the suppression endpoint frequency and the suppression sub-band, and a second test frequency is inserted in the suppression sub-band based on the second interpolation step.

[0103] The second interpolation step is greater than the first interpolation step. For example, the second interpolation step can be set to any value greater than 2 MHz.

[0104] Specifically, after the frequency band segmentation is completed, the number of points that need to be collected can be added according to the interpolation step corresponding to different sub-bands. The first interpolation step in the on sub-band is less than or equal to 1 MHz, and the number of interpolation points in the suppression sub-band can be appropriately reduced according to actual needs. Thus, by adjusting the first interpolation step and the second interpolation step and appropriately reducing the settings of the suppression sub-band, the total number of test frequencies is controlled, the test precision and the test time are balanced, and the test frequencies are optimized.

[0105] In an embodiment, the total number of the first test frequencies and the second test frequencies is not more than 400.

[0106] ​Specifically, there is a contradiction between test time and test accuracy, the more the test frequency points are set, the higher the test accuracy is and the lower the test time is. For the SAW filter, considering the mass production output and the test quantity, the total number of the test frequency points of the pass-through frequency band and the suppression frequency band is not more than 400, which is beneficial to maintain the balance between the test time and the test accuracy, and ensures the test time requirement while optimizing the test accuracy.

[0107] Further, after the frequency band and the test frequency point are set, the network analyzer is calibrated, and the sampling value of each test frequency point is calculated by using the calibrated network analyzer to obtain the loss value at each frequency point.

[0108] Figure 5 Fig. 1 is a test curve schematic diagram of a test frequency point according to the prior art; Figure 6 Fig. 1 is a test curve schematic diagram of a test frequency point according to the prior art;

[0109] Fig. 2 shows the test frequency point configuration method according to the embodiment of the present application; Figure 5 As shown in Fig. 2, the frequency points are uniformly set in the 2279-2436 MHz frequency band, and the interpolation step is set to 1 MHz, and a total of 158 points are set. As shown in Fig. 3, the test frequency point M1 is displayed in the 2300-2400 MHz frequency band, and the minimum insertion loss value is greater than -2.64 dB. Figure 6 As shown in Fig. 3, in the test curve of the network analyzer, the test frequency point M2 is displayed in the 2296.25-2404.92 MHz frequency band, and the minimum loss value appears at 2404.92 MHz. Since the actual network analyzer does not sample 2404.92 MHz, the actual sampling values of the two adjacent points 2404 MHz and 2405 MHz are summed and averaged by using Formula 1, and the actual loss value obtained by frequency point sampling is -3.2671 dB, which is less than -3.24 dB. At this time, the actual industrial computer determines that the test of the device under test fails, causing the edge product to fail.

[0110] Fig. 2 shows the test frequency point configuration method according to the embodiment of the present application; Figure 6 As shown in Fig. 2, the frequency points are uniformly set in the 2279-2436 MHz frequency band, and the interpolation step is set to 1 MHz, and a total of 158 points are set. As shown in Fig. 3, the test frequency point M1 is displayed in the 2300-2400 MHz frequency band, and the minimum insertion loss value is greater than -2.64 dB. Figure 5 As shown in Fig. 3, in the test curve of the network analyzer, the test frequency point M2 is displayed in the 2296.25-2404.92 MHz frequency band, and the minimum loss value appears at 2404.92 MHz. Since the actual network analyzer does not sample 2404.92 MHz, the actual sampling values of the two adjacent points 2404 MHz and 2405 MHz are summed and averaged by using Formula 1, and the actual loss value obtained by frequency point sampling is -3.2671 dB, which is less than -3.24 dB. At this time, the actual industrial computer determines that the test of the device under test fails, causing the edge product to fail.

[0111] Embodiment two

[0112] Based on the same inventive concept, the second embodiment of the present application provides a SAW filter device testing apparatus, which can execute the SAW filter device testing method provided by any of the embodiments of the present application, and has the corresponding function modules and beneficial effects of the execution method.

[0113] Figure 7 A structural schematic diagram of a SAW filter device testing apparatus provided by the second embodiment of the present application is shown in FIG. 2. As shown in the figure, the testing apparatus comprises: Figure 7

[0114] A test index acquisition module 100, configured to acquire test indexes of a device under test, the test indexes comprising an in-band insertion loss index and an out-of-band suppression index;

[0115] A test index analysis module 200, configured to acquire a passband frequency band and passband endpoint frequencies based on the in-band insertion loss index, and acquire a suppression frequency band and corresponding suppression endpoint frequencies based on the out-of-band suppression index;

[0116] A frequency point configuration module 300, configured to segment the passband frequency band according to the passband endpoint frequencies, and segment the suppression frequency band according to the suppression endpoint frequencies, to obtain a plurality of pass-through sub-frequency bands and a plurality of suppression sub-frequency bands;

[0117] The frequency point configuration module 300 is further configured to set a plurality of first test frequency points in the pass-through sub-frequency bands according to the passband endpoint frequencies, and set a plurality of second test frequency points in the suppression sub-frequency bands according to the suppression endpoint frequencies, wherein the plurality of first test frequency points comprise all passband endpoint frequencies of the passband frequency band in a normal temperature segment and a full temperature segment; and the plurality of second test frequency points comprise all suppression endpoint frequencies of the suppression frequency band in the normal temperature segment and the full temperature segment.

[0118] A test execution module 400, configured to test the device under test according to the sampling values of the first test frequency points and the second test frequency points.

[0119] Optionally, when the passband frequency band is segmented according to the passband endpoint frequencies, the frequency point configuration module 300 is configured to acquire normal temperature segment passband endpoint frequencies and full temperature segment passband endpoint frequencies; sort the normal temperature segment passband endpoint frequencies and the full temperature segment passband endpoint frequencies in ascending order to obtain an endpoint frequency sorting result; set a segmentation frequency point according to the endpoint frequency sorting result, and segment the passband frequency band based on the segmentation frequency point.

[0120] ​Optionally, when setting the segment frequency points according to the endpoint frequency sorting result, the frequency point configuration module 300 is configured to obtain the minimum endpoint frequency and the maximum endpoint frequency in the endpoint frequency sorting result; determine the minimum endpoint frequency as a first segment frequency point and the maximum endpoint frequency as a second segment frequency point; determine a third segment frequency point according to the adjacent frequency of the minimum endpoint frequency, the frequency value of the third segment frequency point being less than that of the minimum endpoint frequency, and the interval between the third segment frequency point and the minimum endpoint frequency being less than or equal to a preset unit frequency interval; determine a fourth segment frequency point according to the adjacent frequency of the maximum endpoint frequency, the frequency value of the fourth segment frequency point being greater than that of the maximum endpoint frequency, and the interval between the fourth segment frequency point and the maximum endpoint frequency being less than or equal to twice the preset unit frequency interval; and segment the passband frequency range based on the first segment frequency point, the second segment frequency point, the third segment frequency point and the fourth segment frequency point.

[0121] Optionally, when setting the segment frequency points according to the endpoint frequency sorting result, the frequency point configuration module 300 is further configured to obtain a first intermediate frequency and a second intermediate frequency in the endpoint frequency sorting result, the first intermediate frequency being greater than the minimum endpoint frequency and less than the second intermediate frequency, and the second intermediate frequency being less than the maximum endpoint frequency; determine a fifth segment frequency point and a sixth segment frequency point according to the first intermediate frequency, the frequency value of the fifth segment frequency point being less than that of the sixth segment frequency point, the interval between the fifth segment frequency point and the first intermediate frequency being less than or equal to the preset unit frequency interval, and the interval between the sixth segment frequency point and the first intermediate frequency being less than or equal to the preset unit frequency interval; determine a seventh segment frequency point and an eighth segment frequency point according to the second intermediate frequency, the frequency value of the seventh segment frequency point being less than that of the eighth segment frequency point, and the interval between the eighth segment frequency point and the second intermediate frequency being less than or equal to twice the preset unit frequency interval; and segment the passband frequency range based on the first segment frequency point, the second segment frequency point, the third segment frequency point, the fourth segment frequency point, the fifth segment frequency point, the sixth segment frequency point, the seventh segment frequency point and the eighth segment frequency point.

[0122] Optionally, when setting the plurality of first test frequency points in the conducting sub-frequency range according to the passband endpoint frequency, the frequency point configuration module 300 is configured to set the sub-frequency range endpoint of the conducting sub-frequency range as a first test frequency point; set a first interpolation step length according to the passband endpoint frequency and the conducting sub-frequency range, and insert the first test frequency points in the conducting sub-frequency range based on the first interpolation step length; wherein the first interpolation step length is less than or equal to the preset unit frequency interval.

[0123] Optionally, when the plurality of second test frequency points are set in the suppression sub-band according to the suppression end frequency, the frequency point configuration module 300 is configured to set a sub-band end point of the suppression sub-band as a second test frequency point; set a second interpolation step according to the suppression end frequency and the suppression sub-band, and insert the second test frequency points in the suppression sub-band based on the second interpolation step; wherein the second interpolation step is greater than the first interpolation step.

[0124] Optionally, when the test index of the device under test is acquired, the test index acquisition module 100 is configured to acquire a compensation value based on a deviation between the machine test and the solder test of the device under test, the compensation value including an in-band insertion loss compensation value and an out-of-band suppression compensation value; determine an in-band insertion loss index according to the in-band insertion loss compensation value, and determine an out-of-band suppression index according to the out-of-band suppression compensation value.

[0125] Optionally, the total number of the first test frequency points and the second test frequency points is not more than 400.

[0126] Embodiment three

[0127] Based on the same inventive concept, the embodiment three of the present application provides an electronic device, which comprises at least one processor, and a memory connected with the at least one processor in communication; wherein the memory stores a computer program which can be executed by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the SAW filter device test method provided by any of the above-mentioned embodiments, and has the corresponding function modules and beneficial effects of the execution method.

[0128] Figure 8 A structural schematic diagram of an electronic device that can be used to implement embodiments of the present application is shown. The electronic device is intended to represent various forms of digital computers, such as laptops, desktops, tablets, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular telephones, smart phones, wearable devices (such as headsets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be examples only, and are not intended to limit the implementations of the present application described and / or claimed in this document.

[0129] As Figure 8As shown, the electronic device 10 includes at least one processor 11, and a memory, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., communicatively connected to the at least one processor 11, where the memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer programs stored in the read-only memory (ROM) 12 or loaded into the random access memory (RAM) 13 from the storage unit 18. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0130] Various components in the electronic device 10 are connected to the I / O interface 15, including an input unit 16, such as a keyboard, a mouse, etc., an output unit 17, such as various types of displays, a speaker, etc., a storage unit 18, such as a magnetic disk, an optical disk, etc., and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0131] The processor 11 can be various general and / or special-purpose processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs various methods and processes described above, such as the SAW filter device testing method.

[0132] In some embodiments, the SAW filter device testing method can be implemented as a computer program tangibly embodied in a computer readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the SAW filter device testing method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the SAW filter device testing method by any other appropriate means, such as by means of firmware.

[0133] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0134] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0135] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0136] To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0137] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0138] The computing system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. A server can be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system, to solve the defects of large management difficulty and weak business scalability in traditional physical host and VPS service.

[0139] It should be understood that the various forms of flow shown above can be re-ordered, added to, or deleted from without departing from the scope of the present disclosure. For example, the steps recited in the present disclosure can be executed in parallel, executed in sequence, or executed in a different order, as long as the desired results of the present disclosure are achieved, and the present disclosure is not limited herein.

[0140] The specific embodiments described hereinabove are not intended to be limiting, and persons skilled in the art will appreciate that various modifications, combinations, sub-combinations and alternatives can be made to the specific embodiments without departing from the spirit and scope of the disclosure. Any alternatives, modifications, equivalents, and the like of all of the above described devices, systems, compositions, methods, and / or other related embodiments are intended to be encompassed by the present disclosure.

Claims

1. A method of testing a SAW filter device, characterized by, The method comprises the following steps: acquiring a test index of a device to be tested, the test index comprising an in-band insertion loss index and an out-of-band suppression index; acquiring a passband frequency band and passband end frequencies based on the in-band insertion loss index, and acquiring a suppression frequency band and corresponding suppression end frequencies based on the out-of-band suppression index; segmenting the passband frequency band according to the passband end frequencies, and segmenting the suppression frequency band according to the suppression end frequencies, to obtain a plurality of passband sub-frequency bands and a plurality of suppression sub-frequency bands; setting a plurality of first test frequencies in the passband sub-frequency bands according to the passband end frequencies, and setting a plurality of second test frequencies in the suppression sub-frequency bands according to the suppression end frequencies, wherein the plurality of first test frequencies comprise all passband end frequencies of the passband frequency band in a normal temperature segment and a full temperature segment; and the plurality of second test frequencies comprise all suppression end frequencies of the suppression frequency band in the normal temperature segment and the full temperature segment; testing the device to be tested according to sample values of the first test frequencies and the second test frequencies; the step of segmenting the passband frequency band according to the passband end frequencies comprises the following steps: acquiring normal temperature segment passband end frequencies and full temperature segment passband end frequencies; sorting the normal temperature segment passband end frequencies and the full temperature segment passband end frequencies in ascending order to obtain a first end frequency sorting result; setting a segmentation frequency based on the first end frequency sorting result, and segmenting the passband frequency band based on the segmentation frequency to obtain a plurality of passband sub-frequency bands; the step of segmenting the suppression frequency band according to the suppression end frequencies comprises the following steps: acquiring normal temperature segment suppression end frequencies and full temperature segment suppression end frequencies; sorting the normal temperature segment suppression end frequencies and the full temperature segment suppression end frequencies in ascending order to obtain a second end frequency sorting result; setting a segmentation frequency based on the second end frequency sorting result, and segmenting the suppression frequency band based on the segmentation frequency to obtain a plurality of suppression sub-frequency bands; wherein the segmentation frequency can be a frequency point at or close to an end frequency; the step of setting a plurality of first test frequencies in the passband sub-frequency bands according to the passband end frequencies comprises the following steps: setting a sub-frequency band end point of the passband sub-frequency band as a first test frequency; setting a first interpolation step based on the passband end frequencies and the passband sub-frequency band, and inserting the first test frequencies in the passband sub-frequency band based on the first interpolation step; wherein the first interpolation step is less than or equal to a preset unit frequency interval; the step of setting a plurality of second test frequencies in the suppression sub-frequency bands according to the suppression end frequencies comprises the following steps: setting a sub-frequency band end point of the suppression sub-frequency band as a second test frequency; setting a second interpolation step based on the suppression end frequencies and the suppression sub-frequency band, and inserting the second test frequencies in the suppression sub-frequency band based on the second interpolation step; wherein the second interpolation step is greater than the first interpolation step.

2. The method of claim 1, wherein, the step of setting a segmentation frequency based on the end frequency sorting result comprises the following steps: acquiring a minimum end frequency and a maximum end frequency in the end frequency sorting result; determining the minimum end point frequency as a first segmentation frequency point and determining the maximum end point frequency as a second segmentation frequency point; determining a third segmentation frequency point according to a frequency adjacent to the minimum end point frequency, the third segmentation frequency point having a frequency value less than the minimum end point frequency and an interval between the third segmentation frequency point and the minimum end point frequency less than or equal to a preset unit frequency interval; determining a fourth segmentation frequency point according to a frequency adjacent to the maximum end point frequency, the fourth segmentation frequency point having a frequency value greater than the maximum end point frequency and an interval between the fourth segmentation frequency point and the maximum end point frequency less than or equal to twice the preset unit frequency interval; segmenting the passband frequency range based on the first segmentation frequency point, the second segmentation frequency point, the third segmentation frequency point and the fourth segmentation frequency point.

3. The method of claim 2, wherein, The setting of the segmentation frequency points according to the end point frequency sorting result further includes: obtaining a first intermediate frequency and a second intermediate frequency in the end point frequency sorting result, the first intermediate frequency being greater than the minimum end point frequency and less than the second intermediate frequency, and the second intermediate frequency being less than the maximum end point frequency; determining a fifth segmentation frequency point and a sixth segmentation frequency point according to the first intermediate frequency, the fifth segmentation frequency point having a frequency value less than the sixth segmentation frequency point, an interval between the fifth segmentation frequency point and the first intermediate frequency less than or equal to a preset unit frequency interval, and an interval between the sixth segmentation frequency point and the first intermediate frequency less than or equal to the preset unit frequency interval; determining a seventh segmentation frequency point and an eighth segmentation frequency point according to the second intermediate frequency, the seventh segmentation frequency point having a frequency value less than the eighth segmentation frequency point, and an interval between the eighth segmentation frequency point and the second intermediate frequency less than or equal to twice the preset unit frequency interval; segmenting the passband frequency range based on the first segmentation frequency point, the second segmentation frequency point, the third segmentation frequency point, the fourth segmentation frequency point, the fifth segmentation frequency point, the sixth segmentation frequency point, the seventh segmentation frequency point and the eighth segmentation frequency point.

4. The method of claim 1, wherein, The obtaining of the test index of the device under test includes: obtaining a compensation value based on a deviation between machine test and solder test of the device under test, wherein the compensation value includes an in-band insertion loss compensation value and an out-of-band suppression compensation value; determining the in-band insertion loss index according to the in-band insertion loss compensation value, and determining the out-of-band suppression index according to the out-of-band suppression compensation value.

5. The method according to any one of claims 1-4, characterized in that, The total number of the first test frequency points and the second test frequency points is not more than 400.

6. A SAW filter device test apparatus characterized by comprising: A test device for performing the SAW filter device test method of any one of claims 1-5, the test device comprising: a test index obtaining module configured to obtain a test index of a device under test, the test index including an in-band insertion loss index and an out-of-band suppression index; a test index analyzing module configured to obtain a passband frequency range and passband end point frequencies based on the in-band insertion loss index, and obtain a suppression frequency range and corresponding suppression end point frequencies based on the out-of-band suppression index; The frequency point configuration module is configured to segment the passband frequency band according to the passband end point frequencies and segment the suppression frequency band according to the suppression end point frequencies, to obtain a plurality of pass-through sub-frequency bands and a plurality of suppression sub-frequency bands. The frequency point configuration module is further configured to set a plurality of first test frequency points in the pass-through sub-frequency bands according to the passband end point frequencies and set a plurality of second test frequency points in the suppression sub-frequency bands according to the suppression end point frequencies, wherein the plurality of first test frequency points include all passband end point frequencies of the passband frequency band in a normal temperature section and a full temperature section; and the plurality of second test frequency points include all suppression end point frequencies of the suppression frequency band in the normal temperature section and the full temperature section. The test execution module is configured to test the device under test according to sample values of the first test frequency points and the second test frequency points.

7. An electronic device, comprising: The electronic device comprises: at least one processor; and a memory connected with the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the SAW filter device test method in any one of claims 1-5.

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