A test fixture for server motherboard and its use method

Abstract

The present invention provides a test fixture for a server motherboard and a method for using the same, belonging to the technical field of server test tooling. The test fixture includes a test board, a server motherboard, and an oscilloscope. The test board is provided with an MCU, a USB interface, a network port, a power input interface, and a power output interface. The network port is used to connect to the oscilloscope. The MCU is connected to a USB control chip, a network control chip, a memory chip, a power chip, and a button. The USB interface is connected to the USB control chip, and the network port is connected to the network control chip. The power chip is also connected to the power input interface and the power output interface, the power input interface is connected to an external power supply, and the power output interface is connected to the server motherboard. The power chip receives control from the MCU and supplies or stops power to the server motherboard. The server motherboard test fixture and method for using the present invention can greatly simplify the testing difficulty for R&D personnel, save labor costs, and improve testing efficiency.

Description

Technical Field

[0001] The present invention belongs to the technical field of server testing tooling, and in particular relates to a testing fixture for a server mainboard and a method for using the same. Background Art

[0002] DV is the abbreviation of Design Validation Test, which means design reliability verification.

[0003] As server applications become more and more widespread, the demand for large core databases, virtualization integration, in-memory computing, and high-performance computing is increasing. At the same time, server and information security are becoming increasingly important, and therefore the requirements for server performance are becoming increasingly higher.

[0004] During the server R&D phase, that is, after the server motherboard is assembled, R&D personnel are often required to conduct various tests, which is the server motherboard DV test. The DV test of the server motherboard is a test item that consumes a lot of R&D personnel's energy, because there are as many as thousands of signals on the server motherboard that need to be tested one by one. The CPLD of the server motherboard alone contains hundreds of signals, and each of these signals requires the server motherboard to be repeatedly powered on and off to record the moment the signal is powered on and off. Therefore, the DV test of the server motherboard is not only time-consuming and labor-intensive, but also requires at least two R&D personnel to work together for at least three weeks to basically complete it. In addition, after the DV test, the server motherboard also needs to undergo functional testing. Testing a certain function requires multiple power cycles and disconnection of the AC point, which is still time-consuming and labor-intensive. Furthermore, an oscilloscope is required to record the waveform and compare the results during the test, making the test process complex and lengthy.

[0005] This is a shortcoming of the prior art. Therefore, it is very necessary to provide a server motherboard test fixture and a method of using the same to address the above-mentioned defects in the prior art. Summary of the Invention

[0006] In view of the defects of the prior art that the DV test and functional test of the above-mentioned existing server motherboard require the cooperation of multiple people and are still time-consuming and labor-intensive, the present invention provides a server motherboard test fixture and a method of using the same to solve the above-mentioned technical problems.

[0007] In a first aspect, the present invention provides a test fixture for a server motherboard, comprising a test board, a server motherboard, and an oscilloscope;

[0008] The test board is equipped with MCU, USB interface, network port, power input interface and power output interface;

[0009] Network port, used to connect to the oscilloscope;

[0010] The MCU is connected to the USB control chip, network control chip, storage chip, power chip and buttons;

[0011] The USB interface is connected to the USB control chip, and the network port is connected to the network control chip;

[0012] The power chip is also connected to a power input interface and a power output interface, the power input interface is connected to an external power supply, and the power output interface is connected to the server motherboard;

[0013] The power chip receives control from the MCU and supplies or stops power to the server motherboard.

[0014] Furthermore, it also includes a battery;

[0015] The battery is connected to the MCU, the USB control chip and the power input interface.

[0016] Furthermore, the MCU is provided with a first power port, a first SP1 port, a second SP1 port, a first IO port group, and a second IO port group;

[0017] The first power port is connected to both the battery and the power input port;

[0018] The first SP1 port is connected to the USB control chip, and the second SP1 port is connected to the network control chip;

[0019] The first IO port group is connected to the storage chip and the power chip;

[0020] The second IO group is connected to the button.

[0021] Furthermore, the buttons include an AC power on / off button, a DC power on / off button, and a record button;

[0022] The MCU receives the AC power on / off button or DC power on / off button command and controls the power chip to supply power to or cut off the power supply to the server motherboard.

[0023] The MCU receives the instruction to record the keystrokes and saves the test waveform of the oscilloscope into the storage chip.

[0024] Furthermore, the USB control chip is provided with a USB port, a second power port and a third SPI port;

[0025] The USB port is connected to the USB interface, and the second power port is connected to the battery and the power input interface;

[0026] The third SP1 port is connected to the first SP1 port of the MCU.

[0027] Furthermore, the network control chip is provided with a fourth SPI port and a fifth SPI port;

[0028] The fourth SP1 port is connected to the second SP1 port of the MCU;

[0029] The fifth SP1 port is connected to the network port through the RMI bus.

[0030] Furthermore, the power chip is provided with an enable pin, an input pin and an output pin;

[0031] The enable pin is connected to the MCU, the input pin is connected to the power input interface, and the output pin is connected to the power output interface.

[0032] Furthermore, it also includes a network switch and a test host;

[0033] Connect the oscilloscope to the network port of the test board, or connect it to the test board through a network switch;

[0034] The test host is connected to the USB interface of the test board, or is connected to the test board through an interactive machine.

[0035] In a second aspect, the present invention provides a method for using a test fixture for a server motherboard based on the first aspect, comprising the following steps:

[0036] S 1. Set up the test environment and connect the oscilloscope to the network port of the test board;

[0037] S2. Start the test. The MCU receives the power-on command from the AC power-on or DC power-on button, controls the power chip to supply power to the server motherboard, and controls the oscilloscope to display and store the test waveform of the server motherboard.

[0038] S3. After the test is complete, the MCU receives a power-off command from the AC power-on / off button or the DC power-on / off button, controlling the power chip to stop supplying power to the server motherboard.

[0039] S4. The test host reads the test waveform of the server mainboard through the MCU.

[0040] Furthermore, in step S1, when a network exists in the test environment, the oscilloscope, the test host, and the test board are all connected to a network switch;

[0041] When there is no network in the test environment, use a network cable to connect the oscilloscope to the network port of the test board;

[0042] In step S2, during the test, the MCU saves the test waveform of the server motherboard to the storage chip, and the external power supply charges the battery through the power input interface;

[0043] In step S4, when there is a network in the test environment, the MCU is powered by an external power supply, the test host is connected to the test board through the network switch, and the test waveform in the storage chip is read by the MCU;

[0044] When there is no network in the test environment, the battery powers the MCU and USB control chip, and the test host reads the test waveform in the storage chip from the MCU through the USB interface.

[0045] The beneficial effects of the present invention are:

[0046] The server motherboard test fixture and its use method provided by the present invention enable one-touch AC power on and off, one-touch DC power on and off, and one-touch test waveform recording. It also enables functions such as data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time via the network. Test data can also be stored on the test board in offline locations for easy access via the test host. The server motherboard test fixture and its use method of the present invention can significantly simplify testing for researchers, saving labor costs and improving testing efficiency.

[0047] In addition, the present invention has a reliable design principle, a simple structure and a very broad application prospect.

[0048] It can be seen that compared with the prior art, the present invention has outstanding substantial features and significant progress, and the beneficial effects of its implementation are also obvious. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0050] Figure 1 This is a circuit diagram of a test fixture for a server motherboard according to the present invention.

[0051] Figure 2 2 is a schematic diagram of the use of a test fixture for a server motherboard according to a fourth embodiment of the present invention.

[0052] Figure 3 The present invention is a flow chart of a method for using a server motherboard test fixture.

[0053] In the figure, 1-test board; 2-server motherboard; 3-oscilloscope; 4-MCU; 5-USB interface; 6-network port; 7-power input interface; 8-power output interface; 9-battery; 10-USB control chip; 11-network control chip; 12-storage chip; 13-power chip; 14-network switch; 15-test host; POWER1-first power port; POWER2-second power port; SP I1-first SPI port; SP I2-second SP I port; SP I3-third SPI port; SP I4-fourth SP I port; SP I5-fifth SP I port; IO1-first IO port group; IO2-second IO port group; EN-enable pin; Vin-input pin; Vout-output pin; UPORT-USB port; P1-AC power on / off button; P2-DC power on / off button; P3-record button; VCC-power terminal. DETAILED DESCRIPTION

[0054] In order to enable those skilled in the art to better understand the technical solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0055] SPI is the abbreviation of Serial Peripheral Interface, a high-speed full-duplex serial communication bus protocol.

[0056] EEPROM is the abbreviation of Electrically Erasable Programmable Read Only Memory, which is an electrically erasable programmable read-only memory.

[0057] MCU is the abbreviation of Microcontroller Unit, micro control unit.

[0058] GPI O is the abbreviation of General-purpose input / output, which is general-purpose input and output.

[0059] Example 1:

[0060] like Figure 1 As shown, the present invention provides a test fixture for a server motherboard, comprising a test board 1, a server motherboard 2 and an oscilloscope 3;

[0061] The test board 1 is provided with an MCU 4, a USB interface 5, an Ethernet port 6, a power input interface 7, a power output interface 8, and a battery 9;

[0062] Network port 6, used for connecting to oscilloscope 3;

[0063] The MCU 4 is connected to the USB control chip 10, the network control chip 11, the storage chip 12, the power chip 13 and the buttons;

[0064] The USB interface 5 is connected to the USB control chip 10, and the network port 6 is connected to the network control chip 11;

[0065] The power chip 13 is also connected to the power input interface 7 and the power output interface 8. The power input interface 7 is connected to an external power source, and the power output interface 8 is connected to the server mainboard 2.

[0066] The power chip 13 receives control from the MCU 4 and supplies power to the server mainboard 2 or stops supplying power.

[0067] The server motherboard test fixture provided by the present invention enables one-touch AC power on and off, one-touch DC power on and off, and one-touch test waveform recording. It also enables data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time via the network. Test data can also be stored on the test board in offline locations for easy access via the test host. This server motherboard test fixture significantly simplifies testing for researchers, saves labor costs, and improves testing efficiency.

[0068] Example 2:

[0069] like Figure 1 and Figure 2 As shown, the present invention provides a test fixture for a server motherboard, comprising a test board 1, a server motherboard 2 and an oscilloscope 3;

[0070] The test board 1 is provided with an MCU 4, a USB interface 5, an Ethernet port 6, a power input interface 7, a power output interface 8, and a battery 9;

[0071] Network port 6, used for connecting to oscilloscope 3;

[0072] The MCU 4 is connected to the USB control chip 10, the network control chip 11, the storage chip 12, the power chip 13 and the buttons;

[0073] The USB interface 5 is connected to the USB control chip 10, and the network port 6 is connected to the network control chip 11;

[0074] The power chip 13 is also connected to the power input interface 7 and the power output interface 8. The power input interface 7 is connected to an external power source, and the power output interface 8 is connected to the server mainboard 2.

[0075] The power chip 13 receives control from the MCU 4 and supplies or stops power to the server mainboard 2;

[0076] The battery 9 is connected to the MCU 4, the USB control chip 10 and the power input interface 7 via the power terminal VCC; the battery 9 is charged via the power input interface 7, and when the test board 1 is used alone, it supplies power to the MCU 4 and the USB control chip 10;

[0077] The MCU 4 is provided with a first power port POWER1, a first SPI port SP11, a second SPI port SPI2, a first IO port group IO1 and a second IO port group IO2;

[0078] The first power port POWER1 is connected to the battery 9 and the power input port 7 via the power terminal VCC; the VCU 4 can be powered from an external power source via the power input port 7, or from the battery 9;

[0079] The first SP1 port SPI1 is connected to the USB control chip 10, and the second SP1 port SP12 is connected to the network control chip 11;

[0080] The first IO port group IO1 is connected to the storage chip 12 and the power chip 13;

[0081] The second IO group I O2 is connected to the button;

[0082] The buttons include AC power on / off button P1, DC power on / off button P2, and record button P3;

[0083] The MCU 4 receives the instruction of the AC power on / off button P1 or the DC power on / off button P2, and controls the power chip 13 to supply power to the server motherboard 2 or cut off the power supply to the server motherboard 2;

[0084] MCU 4 receives the record button instruction and saves the test waveform of oscilloscope 3 into storage chip 12;

[0085] The USB control chip 10 is provided with a USB port UPORT, a second power port POWER2 and a third SP1 port SP13;

[0086] The USB port UPORT is connected to the USB interface, and the second power port POWER2 is connected to the battery 9 and the power input interface 7 through the power terminal VCC; the USB control chip 10 can be powered from the external power supply through the power input port 7, and can also be powered by the battery 9;

[0087] The third SPI port SPI3 is connected to the first SPI port SPI1 of MCU 4;

[0088] The network control chip 11 is provided with a fourth SPI port SPI4 and a fifth SPI port SPI5;

[0089] The fourth SPI port SPI4 is connected to the second SPI port SPI2 of MCU4;

[0090] The fifth SP 1 port SP 1 5 is connected to the network port 6 via the RMI bus;

[0091] The power chip 13 is provided with an enable pin EN, an input pin Vin and an output pin Vout;

[0092] The enable pin EN is connected to the MCU 4, the input pin Vin is connected to the power input interface 7, and the output pin Vout is connected to the power output interface 8;

[0093] like Figure 2 As shown, it also includes a network switch 14 and a test host 15;

[0094] The oscilloscope 3 is connected to the network port 6 of the test board 1 via a network cable. In a test environment without a network, the oscilloscope 3 is connected to the network port 6 of the test board 1 for testing;

[0095] The test host 15 is connected to the USB interface 5 of the test board 1. In a test environment without a network, the test host 15 is connected to the MCU 4 through the USB interface 5 to read the waveform data stored in the storage chip 12 of the MCU 4.

[0096] The server motherboard test fixture provided by the present invention enables one-touch AC power on and off, one-touch DC power on and off, and one-touch test waveform recording. It also enables data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time via the network. Test data can also be stored on the test board in offline locations for easy access via the test host. This server motherboard test fixture significantly simplifies testing for researchers, saves labor costs, and improves testing efficiency.

[0097] Example 3:

[0098] like Figure 1 and Figure 2 As shown, the present invention provides a test fixture for a server motherboard, comprising a test board 1, a server motherboard 2 and an oscilloscope 3;

[0099] The test board 1 is provided with an MCU 4, a USB interface 5, an Ethernet port 6, a power input interface 7, a power output interface 8, and a battery 9; the MCU 4 uses an STM32 series microcontroller; the Ethernet port 6 uses an RJ45 Ethernet port; and the USB interface uses a USB2.0 interface.

[0100] Network port 6, used for connecting to oscilloscope 3;

[0101] The MCU 4 is connected to a USB control chip 10, a network control chip 11, a memory chip 12, a power chip 13, and a button. The memory chip 12 uses an EEPROM memory chip. The Tx / Rx signal of the EEPROM can be conveniently connected directly to the IO port of the MCU 4. The data passing through the MCU 4 can be stored in the EEPROM memory chip 12.

[0102] The USB interface 5 is connected to the USB control chip 10, and the network port 6 is connected to the network control chip 11;

[0103] The power chip 13 is also connected to the power input interface 7 and the power output interface 8. The power input interface 7 is connected to an external power source, and the power output interface 8 is connected to the server mainboard 2.

[0104] The power chip 13 receives control from the MCU 4 and supplies or stops power to the server motherboard 2. The power chip 13 can be controlled by the STM32 microcontroller serving as the MCU 4 via an enable signal. During testing, the R&D personnel connect 220V AC power to the power input interface 7, which is then connected to the server motherboard 2 through the power regulation control of the power chip 13. The tester can control whether the external power is output to the server motherboard 2 by using the AC power on / off button or the DC power on / off button on the test fixture. This eliminates the need for R&D personnel to manually unplug the 220V plug during DV testing, which requires frequent power on and off. This can be easily accomplished with one hand, while the other hand can continue to use the oscilloscope probe to select signals, greatly simplifying the R&D personnel's testing procedures.

[0105] The battery 9 is connected to the MCU 4, the USB control chip 10, and the power input interface 7 via the power terminal VCC. The battery 9 is charged via the power input interface 7 and, when the test board 1 is used alone, supplies power to the MCU 4 and the USB control chip 10. The battery 9 is used to enable USB reading. When the USB reading function is used, the battery 9 independently supplies power to the STM32 microcontroller serving as the MCU 4. During testing, the battery 9 can be charged in a timely manner.

[0106] MCU 4 is provided with a first power port POWER1, a first SPI port SP11, a second SPI port SPI2, a first IO port group IO1 and a second IO port group IO2; the first SPI port SP11 adopts the SPI port provided by the STM32 microcontroller, and the second SPI port SPI2 is configured to support the SPI protocol through software;

[0107] The first power port POWER1 is connected to the battery 9 and the power input port 7 via the power terminal VCC; the VCU 4 can be powered from an external power source via the power input port 7, or from the battery 9;

[0108] The first SP1 port SPI1 is connected to the USB control chip 10, and the second SP1 port SP12 is connected to the network control chip 11;

[0109] The first IO port group IO1 is connected to the storage chip 12 and the power chip 13;

[0110] The second IO group I O2 is connected to the button;

[0111] The buttons include AC power on / off button P1, DC power on / off button P2, and record button P3;

[0112] The MCU 4 receives the instruction of the AC power on / off button P1 or the DC power on / off button P2, and controls the power chip 13 to supply power to the server motherboard 2 or cut off the power supply to the server motherboard 2;

[0113] MCU 4 receives the record button instruction and saves the test waveform of oscilloscope 3 into storage chip 12;

[0114] The USB control chip 10 is provided with a USB port UPORT, a second power port POWER2 and a third SP1 port SP13;

[0115] The USB port UPORT is connected to the USB interface 5, and the second power port POWER2 is connected to the battery 9 and the power input interface 7 through the power terminal VCC; the USB control chip 10 can draw power from an external power source through the power input port 7, or from the battery 9;

[0116] The third SPI port SPI 3 is connected to the first SPI port SPI 1 of the MCU 4; the USB control chip 10 uses a network protocol conversion chip HT42B533, which can convert the SPI protocol into a USB protocol and connect to a USB2.0 port;

[0117] The network control chip 11 is provided with a fourth SPI port SPI4 and a fifth SPI port SPI5; the network controller chip uses the TCP / IP protocol stack chip w5200, and the network controller chip is connected to the second SPI port SPI2 of the STM32 microcontroller via the SPI protocol; the TCP / IP protocol network control chip 11 can convert the SPI protocol into the MDI protocol, that is, the fifth SPI port SPI5 is connected to the RJ45 network port 6 via the MDI protocol to achieve network connection;

[0118] The fourth SPI port SPI4 is connected to the second SPI port SPI2 of MCU4;

[0119] The fifth SP 1 port SP 1 5 is connected to the network port 6 via the RMI bus;

[0120] The power chip 13 is provided with an enable pin EN, an input pin Vin and an output pin Vout;

[0121] The enable pin EN is connected to the MCU 4, the input pin Vin is connected to the power input interface 7, and the output pin Vout is connected to the power output interface 8;

[0122] like Figure 2 As shown, it also includes a network switch 14 and a test host 15;

[0123] The oscilloscope 3 is connected to the network port 6 of the test board 1 via a network cable. In a test environment without a network, the oscilloscope 3 is connected to the network port 6 of the test board 1 for testing;

[0124] The test host 15 is connected to the USB interface 5 of the test board 1. In a test environment without a network, the test host 15 is connected to the MCU 4 through the USB interface 5 to read the waveform data stored in the storage chip 12 of the MCU 4.

[0125] Example 4:

[0126] like Figure 1 and Figure 2 As shown, the present invention provides a test fixture for a server motherboard, comprising a test board 1, a server motherboard 2 and an oscilloscope 3;

[0127] The test board 1 is provided with an MCU 4, a USB interface 5, an Ethernet port 6, a power input interface 7, a power output interface 8, and a battery 9; the MCU 4 uses an STM32 series microcontroller; the Ethernet port 6 uses an RJ45 Ethernet port; and the USB interface uses a USB2.0 interface.

[0128] Network port 6, used for connecting to oscilloscope 3;

[0129] The MCU 4 is connected to a USB control chip 10, a network control chip 11, a memory chip 12, a power chip 13, and a button. The memory chip 12 uses an EEPROM memory chip. The Tx / Rx signal of the EEPROM can be conveniently connected directly to the IO port of the MCU 4. The data passing through the MCU 4 can be stored in the EEPROM memory chip 12.

[0130] The USB interface 5 is connected to the USB control chip 10, and the network port 6 is connected to the network control chip 11;

[0131] The power chip 13 is also connected to the power input interface 7 and the power output interface 8. The power input interface 7 is connected to an external power source, and the power output interface 8 is connected to the server mainboard 2.

[0132] The power chip 13 receives control from the MCU 4 and supplies or stops power to the server motherboard 2. The power chip 13 can be controlled by the STM32 microcontroller serving as the MCU 4 via an enable signal. During testing, the R&D personnel connect 220V AC power to the power input interface 7, which is then connected to the server motherboard 2 through the power regulation control of the power chip 13. The tester can control whether the external power is output to the server motherboard 2 by using the AC power on / off button or the DC power on / off button on the test fixture. This eliminates the need for R&D personnel to manually unplug the 220V plug during DV testing, which requires frequent power on and off. This can be easily accomplished with one hand, while the other hand can continue to use the oscilloscope probe to select signals, greatly simplifying the R&D personnel's testing procedures.

[0133] The battery 9 is connected to the MCU 4, the USB control chip 10, and the power input interface 7. The battery 9 is charged through the power input interface 7 and provides power to the MCU 4 and the USB control chip 10 when the test board 1 is used alone. The battery 9 is used to enable USB reading. When the USB reading function is used, the battery 9 independently provides power to the STM32 microcontroller serving as the MCU 4, and the battery 9 can be charged in time during testing.

[0134] MCU 4 is provided with a first power port POWER1, a first SPI port SP11, a second SPI port SPI2, a first IO port group IO1 and a second IO port group IO2; the first SPI port SP11 adopts the SPI port provided by the STM32 microcontroller, and the second SPI port SPI2 is configured to support the SPI protocol through software;

[0135] The first power port POWER1 is connected to both the battery 9 and the power input port 7;

[0136] The first SP1 port SPI1 is connected to the USB control chip 10, and the second SP1 port SP12 is connected to the network control chip 11;

[0137] The first IO port group IO1 is connected to the storage chip 12 and the power chip 13;

[0138] The second IO group I O2 is connected to the button;

[0139] The buttons include AC power on / off button P1, DC power on / off button P2, and record button P3;

[0140] The MCU 4 receives the instruction of the AC power on / off button P1 or the DC power on / off button P2, and controls the power chip 13 to supply power to the server motherboard 2 or cut off the power supply to the server motherboard 2;

[0141] MCU 4 receives the record button instruction and saves the test waveform of oscilloscope 3 into storage chip 12;

[0142] The USB control chip 10 is provided with a USB port UPORT, a second power port POWER2 and a third SP1 port SP13;

[0143] The USB port UPORT is connected to the USB interface 5, and the second power port POWER2 is connected to the battery 9 and the power input interface 7; the USB control chip 10 can be powered from an external power source through the power input port 7, or can be powered by the battery 9;

[0144] The third SPI port SPI 3 is connected to the first SPI port SPI 1 of the MCU 4; the USB control chip 10 uses a network protocol conversion chip HT42B533, which can convert the SPI protocol into a USB protocol and connect to a USB2.0 port;

[0145] The network control chip 11 is provided with a fourth SPI port SPI4 and a fifth SPI port SPI5; the network controller chip uses the TCP / IP protocol stack chip w5200, and the network controller chip is connected to the second SPI port SPI2 of the STM32 microcontroller via the SPI protocol; the TCP / IP protocol network control chip 11 can convert the SPI protocol into the MDI protocol, that is, the fifth SPI port SPI5 is connected to the RJ45 network port 6 via the MDI protocol to achieve network connection;

[0146] The fourth SPI port SPI4 is connected to the second SPI port SPI2 of MCU4;

[0147] The fifth SP 1 port SP 1 5 is connected to the network port 6 via the RMI bus;

[0148] The power chip 13 is provided with an enable pin EN, an input pin Vin and an output pin Vout;

[0149] The enable pin EN is connected to the MCU 4, the input pin Vin is connected to the power input interface 7, and the output pin Vout is connected to the power output interface 8;

[0150] like Figure 2 As shown, it also includes a network switch 14 and a test host 15;

[0151] The oscilloscope 3 is connected to the test board 1 through the network switch 14. In a network test environment, the oscilloscope 3 is connected to the test board 1 through the network for use;

[0152] The test host 15 is connected to the test board 1 through the network interactive machine 14. In a network test environment, the test host 15 is connected to the test board 1 through the network, and then reads the waveform data stored in the storage chip 12 of the MCU 4;

[0153] The network switch 15 is connected to the oscilloscope 3 , the test host 15 and the test board 1 via the RMI protocol.

[0154] The server motherboard test fixture provided by the present invention enables one-touch AC power on and off, one-touch DC power on and off, and one-touch test waveform recording. It also enables data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time via the network. Test data can also be stored on the test board in offline locations for easy access via the test host. This server motherboard test fixture significantly simplifies testing for researchers, saves labor costs, and improves testing efficiency.

[0155] Example 5:

[0156] like Figure 3 As shown, the present invention provides a method for using a test fixture for a server motherboard based on the above-mentioned embodiments 1, 2, and 3, comprising the following steps:

[0157] S 1. Set up the test environment and connect the oscilloscope to the network port of the test board;

[0158] S 2. Start the test. The MCU receives the power-on command from the AC power-on or DC power-on button, controls the power chip to supply power to the server motherboard, and controls the oscilloscope to display and store the test waveform of the server motherboard.

[0159] S 3. After the test is completed, the MCU receives the power-off command from the AC power-on / off button or the DC power-on / off button, and controls the power chip to stop supplying power to the server motherboard;

[0160] S4. The test host reads the test waveform of the server mainboard through the MCU.

[0161] The present invention provides a method for using a server motherboard test fixture. Using a single button, the device can power on and off AC power supplies, power on and off DC power supplies, and record test waveforms. It also enables data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time. Even without a network connection, test data can be stored on the test board for easy access from the test host. This method significantly simplifies testing for researchers, reduces labor costs, and improves testing efficiency.

[0162] Example 6:

[0163] like Figure 3 As shown, the present invention provides a method for using a test fixture for a server motherboard based on the above-mentioned embodiments 1, 2, and 3, comprising the following steps:

[0164] S 1. Set up the test environment and connect the oscilloscope to the network port of the test board;

[0165] When there is a network in the test environment, connect the oscilloscope, test host, and test board to the network switch;

[0166] When there is no network in the test environment, use a network cable to connect the oscilloscope to the network port of the test board;

[0167] S 2. Start the test. The MCU receives the power-on command from the AC power on / off button or the DC power on / off button, controls the power chip to supply power to the server motherboard, and controls the oscilloscope to display and store the test waveform of the server motherboard. During the test, the MCU saves the test waveform of the server motherboard to the storage chip, and the external power supply charges the battery through the power input interface.

[0168] S 3. After the test is completed, the MCU receives the power-off command from the AC power-on / off button or the DC power-on / off button, and controls the power chip to stop supplying power to the server motherboard;

[0169] S4. The test host reads the test waveform of the server motherboard through the MCU;

[0170] When there is a network in the test environment, the MCU is powered by an external power supply, the test host is connected to the test board through a network switch, and then the test waveform in the storage chip is read through the MCU;

[0171] When there is no network in the test environment, the battery powers the MCU and USB control chip, and the test host reads the test waveform in the storage chip from the MCU through the USB interface.

[0172] The present invention provides a method for using a server motherboard test fixture. Using a single button, the device can power on and off AC power supplies, power on and off DC power supplies, and record test waveforms. It also enables data reading from a test host. Furthermore, the test board, the server motherboard under test, an oscilloscope, and the test host can be connected via a network, allowing researchers to access test data at any time. Even without a network connection, test data can be stored on the test board for easy access from the test host. This method significantly simplifies testing for researchers, reduces labor costs, and improves testing efficiency.

[0173] Although the present invention has been described in detail with reference to the accompanying drawings and in conjunction with preferred embodiments, the present invention is not limited thereto. Without departing from the spirit and essence of the present invention, a person of ordinary skill in the art may make various equivalent modifications or substitutions to the embodiments of the present invention, and such modifications or substitutions shall be within the scope of the present invention. Any person skilled in the art who can easily conceive of changes or substitutions within the technical scope disclosed in the present invention shall be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be based on the scope of protection of the claims.

Claims

1. A test fixture for a server motherboard, characterized in that: Includes test board, server motherboard and oscilloscope; The test board is equipped with MCU, USB interface, network port, power input interface and power output interface; Network port, used to connect to the oscilloscope; The MCU is connected to the USB control chip, network control chip, storage chip, power chip and buttons; The USB interface is connected to the USB control chip, and the network port is connected to the network control chip; The power chip is also connected to a power input interface and a power output interface, the power input interface is connected to an external power supply, and the power output interface is connected to the server motherboard; The power chip receives control from the MCU and supplies power to or stops the server motherboard. The MCU is provided with a first power port, a first SPI port, a second SPI port, a first IO port group and a second IO port group; The first power port is connected to both the battery and the power input port; The first SPI port is connected to the USB control chip, and the second SPI port is connected to the network control chip; The first IO port group is connected to the storage chip and the power chip; The second IO group is connected to the button; The buttons include AC power on / off button, DC power on / off button and record button; The MCU receives the AC power on / off button or DC power on / off button command and controls the power chip to supply power to or cut off the power supply to the server motherboard. The MCU receives the record key command and saves the oscilloscope's test waveform into the memory chip; The USB control chip is provided with a USB port, a second power port and a third SPI port; The USB port is connected to the USB interface, and the second power port is connected to the battery and the power input interface; The third SPI port is connected to the first SPI port of the MCU; The network control chip is provided with a fourth SPI port and a fifth SPI port; The fourth SPI port is connected to the second SPI port of the MCU; The fifth SPI port is connected to the network port via the RMI bus.

2. The server motherboard test fixture according to claim 1, wherein: Also includes batteries; The battery is connected to the MCU, the USB control chip and the power input interface.

3. The server motherboard test fixture according to claim 2, wherein: The power chip is provided with an enable pin, an input pin and an output pin; The enable pin is connected to the MCU, the input pin is connected to the power input interface, and the output pin is connected to the power output interface.

4. The server motherboard test fixture according to claim 2, wherein: Also includes network switches and test hosts; Connect the oscilloscope to the network port of the test board, or connect it to the test board through a network switch; The test host is connected to the USB interface of the test board, or is connected to the test board through an interactive machine.

5. A method for using a test fixture for a server motherboard according to any one of claims 1 to 4, characterized in that: The steps include: S1. Set up the test environment and connect the oscilloscope to the network port of the test board; S2. Start the test. The MCU receives the power-on command from the AC power-on or DC power-on button, controls the power chip to supply power to the server motherboard, and controls the oscilloscope to display and store the test waveform of the server motherboard. S3. After the test is complete, the MCU receives a power-off command from the AC power-on / off button or the DC power-on / off button, controlling the power chip to stop supplying power to the server motherboard. S4. The test host reads the test waveform of the server mainboard through the MCU.

6. The method for using the server motherboard test fixture according to claim 5, wherein: In step S1, when there is a network in the test environment, the oscilloscope, the test host, and the test board are all connected to the network switch; When there is no network in the test environment, use a network cable to connect the oscilloscope to the network port of the test board; In step S2, during the test, the MCU saves the test waveform of the server motherboard to the storage chip, and the external power supply charges the battery through the power input interface; In step S4, when there is a network in the test environment, the MCU is powered by an external power supply, the test host is connected to the test board through the network switch, and the test waveform in the storage chip is read by the MCU; When there is no network in the test environment, the battery powers the MCU and USB control chip, and the test host reads the test waveform in the storage chip from the MCU through the USB interface.

Images