Composite graded layer gallium nitride power transistor
By introducing a gradient layer and a modulation island structure into GaN-based power transistors, the problem of poor reverse conduction characteristics of traditional GaN-based junction field-effect transistors is solved, achieving low turn-on voltage drop and high withstand voltage capability, thereby improving the power efficiency and reliability of the device.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- XIDIAN UNIV
- Filing Date
- 2023-03-08
- Publication Date
- 2026-05-29
AI Technical Summary
Existing silicon-based power switching devices cannot meet the requirements of high temperature, high voltage, high frequency, and high power density. Traditional GaN-based junction field-effect transistors have poor reverse conduction characteristics, resulting in large turn-on voltage drop, large leakage current, low breakdown voltage, and low power efficiency.
A composite graded-layer gallium nitride power transistor is designed. By setting first and second graded layers and modulation islands in the drift layer, reverse conduction characteristics and high voltage withstand capability are achieved. Gallium nitride, silicon, diamond or silicon carbide materials are used, and epitaxial processes and ion implantation technology are combined to form a multilayer structure.
It achieves reverse conduction with low turn-on voltage drop, reduces leakage current in the turn-off state, improves breakdown voltage and threshold voltage, and enhances device integration and process compatibility.
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Figure CN116207097B_ABST