A device and method for evaluating the radiation performance of a quasi-optical device

Abstract

The present invention provides a device and method for evaluating the radiation performance of a quasi-optical device. The device includes a signal transmitting component and a signal receiving component. The method includes: a generated Gaussian beam signal propagates towards the device under test at a preset incident angle; a part of the Gaussian beam signal propagated to the device under test is reflected by the device under test, and another part is transmitted through the device under test; the reflected Gaussian beam signal and the transmitted Gaussian beam signal are respectively received, and the reflected radiation field data and the transmitted radiation field data are respectively obtained; the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test are obtained. By transmitting and reflecting the Gaussian beam signal through the device under test, collecting the transmitted and reflected Gaussian beam signals, performing correlation analysis and calculation on the test field data and the standard field data, and calculating and analyzing the influence factors of the radiation performance through the coupling coefficient of the electromagnetic field, the present invention has the technical effects of being simple and easy to implement, fast in calculation, and strong in universality.

Description

Technical Field

[0001] The present invention relates to the technical field of device radiation performance evaluation, and in particular, to an apparatus and method for evaluating the radiation performance of quasi-optical devices. Background Art

[0002] The quasi-optical feed network system can achieve multi-band composite detection, and can separate multi-frequency and multi-polarization signals. Compared with the direct feed method of traditional feed horns, the quasi-optical feed network system has the advantages of high transmission efficiency and low insertion loss. The quasi-optical feed network system is composed of the layout and combination of quasi-optical components such as reflecting mirrors, polarization grids, frequency selective surfaces, and plane folding mirrors. Among them, the reflecting mirror is mainly used to change the beam propagation direction, the polarization grid realizes the polarization separation function of vertical polarization and horizontal polarization signals, and the frequency selective surface realizes the frequency separation function of electromagnetic radiation signals in different frequency bands.

[0003] Quasi-optical devices such as frequency selective surfaces and polarization grids are the core components of the quasi-optical system, and their performance directly affects the function realization of the quasi-optical feed network. Usually, in the design stage of the quasi-optical feed network system, it is defaulted that the frequency selective surface and the polarization grid only affect the insertion loss of the quasi-optical system, do not affect the radiation performance of the quasi-optical system, and will not cause changes in the beam width of the quasi-optical system. However, due to factors such as device surface accuracy and unstable material performance during the actual processing of the product, there is a possibility that the quasi-optical device affects the radiation performance of the quasi-optical system. Therefore, it is necessary to evaluate the radiation performance of the quasi-optical device, and according to the obtained influence factors of the quasi-optical device on the radiation performance, compensation is carried out during the design and integration of the quasi-optical system, so as to eliminate the influence of the quasi-optical device on the system radiation performance. Summary of the Invention

[0004] Aiming at the defects in the prior art, the purpose of the present invention is to provide an apparatus for evaluating the radiation performance of quasi-optical devices.

[0005] According to an apparatus for evaluating the radiation performance of quasi-optical devices provided by the present invention, it includes a signal transmitting component, a signal receiving component, and a device under test;

[0006] The Gaussian beam signal generated by the signal transmitting component propagates towards the device under test at a preset incident angle;

[0007] A part of the Gaussian beam signal propagating to the device under test is reflected by the device under test, and the other part is transmitted through the device under test;

[0008] The scanning surfaces of the signal receiving component respectively receive the reflected Gaussian beam signal and the transmitted Gaussian beam signal, and respectively obtain the reflected radiation field data and the transmitted radiation field data;

[0009] Obtain the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test according to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data, and the reference transmitted radiation field data.

[0010] Optionally, the signal transmitting component includes a first fixing member, a signal transmitting module, and a feed horn. The signal transmitting module, the feed horn, and the device under test are all assembled on the first fixing member. The signal generated by the signal transmitting module is converted into a Gaussian beam signal through the feed horn and propagates towards the device under test from the horn aperture surface at a preset incident angle.

[0011] Optionally, the first fixing member includes a rotating table, a position adjusting table, a first assembly table, and a second assembly table. The position adjusting table is assembled on the rotating table. The first assembly table and / or the second assembly table are assembled on the position adjusting table in an adjustable position manner. The signal transmitting module and the feed horn are assembled on the first assembly table, and the device under test is assembled on the second assembly table.

[0012] Optionally, the device under test is assembled on the second assembly table through a rotating device.

[0013] Optionally, the signal receiving component includes a signal receiving module and a second fixing member. The signal receiving module is assembled on the second fixing member.

[0014] Optionally, the second fixing member includes a scanning frame and a scanning movement control system; the scanning frame moves horizontally and vertically according to the control signal of the scanning movement control system to achieve scanning within a two-dimensional plane range.

[0015] The present invention also provides a method for evaluating the radiation performance of a quasi-optical device, including the following steps:

[0016] The generated Gaussian beam signal propagates towards the device under test at a preset incident angle;

[0017] A part of the Gaussian beam signal propagated to the device under test is reflected by the device under test, and another part is transmitted through the device under test;

[0018] Receive the reflected Gaussian beam signal and the transmitted Gaussian beam signal respectively, and obtain the reflected radiation field data and the transmitted radiation field data respectively;

[0019] Obtain the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test according to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data, and the reference transmitted radiation field data.

[0020] Optionally, the process of obtaining the reference reflected radiation field data further includes:

[0021] Replace the device under test with a plane mirror, and the generated Gaussian beam signal propagates towards the plane mirror at a preset incident angle;

[0022] Receive the Gaussian beam signal reflected by the plane mirror from the received Gaussian beam signal, and obtain the reference reflected radiation field data.

[0023] Optionally, the process of obtaining the reference transmitted radiation field data further includes:

[0024] Perform direct transmission on the generated Gaussian beam signal and receive the directly transmitted Gaussian beam signal;

[0025] Obtain the reference transmitted radiation field data according to the received Gaussian beam signal.

[0026] Optionally, the calculation formulas for the transmission radiation performance influence factor and the reflection radiation performance influence factor are respectively:

[0027]

[0028]

[0029] Where E r1 (x, y) is the reflected radiation field data, E r2 (x, y) is the reference reflected radiation field data, E t1 (x, y) is the reference transmitted radiation field data, E t2 (x, y) is the transmitted radiation field data, η t is the coupling coefficient between E t1 (x, y) and E t2 (x, y), η r is the coupling coefficient between E r1 (x, y) and E r2 (x, y), x is the abscissa, y is the ordinate.

[0030] Compared with the prior art, the present invention has the following beneficial effects:

[0031] A quasi-optical device radiation performance evaluation device and method provided by the present invention transmit and reflect a Gaussian beam signal through a device under test, collect the transmitted and reflected Gaussian beam signals, thereby obtaining test field data, and perform correlation analysis and calculation on the test field data and standard field data. Among them, the standard field data is the reference reflected radiation field data and the reference transmitted radiation field data, and the radiation performance influence factor is calculated and analyzed through the coupling coefficient of the electromagnetic field, which has the technical effects of being simple and easy to execute and fast in calculation. In addition, considering that the aperture size and working incident angle of each device under test are different, the quasi-optical device radiation performance evaluation device provided in this application can be applied to devices under test with different sizes and incident angles, and has universality. Description of the Drawings

[0032] Other features, objects, and advantages of the present invention will become more apparent from the following detailed description of non - limiting embodiments with reference to the accompanying drawings:

[0033] Figure 1 Schematic structural diagram of the radiation performance evaluation device of the quasi - optical device in the transmission state provided in the first embodiment of the present invention;

[0034] Figure 2 Schematic structural diagram of the radiation performance evaluation device of the quasi - optical device in the reflection state provided in the first embodiment of the present invention.

[0035] Figure 3 Schematic structural diagram of the signal emission component provided in the first embodiment of the present invention;

[0036] Figure 4 Partial enlarged view of the signal emission component provided in the first embodiment of the present invention;

[0037] Figure 5 Flow chart of the method for evaluating the radiation performance of the quasi - optical device provided in the second embodiment of the present invention;

[0038] Figure 6 Flow chart for obtaining the reference reflection radiation field data provided in the second embodiment of the present invention;

[0039] Figure 7 Flow chart for obtaining the reference transmission radiation field data provided in the second embodiment of the present invention;

[0040] Figure 8 Another flow chart for obtaining the reference transmission radiation field data provided in the second embodiment of the present invention.

[0041] In the figure: 1. Signal receiving component; 101. Signal receiving module; 102. Mounting base; 103. Transverse movement control system; 104. Longitudinal movement control system; 2. Rotary table; 3. Signal emission module; 4. Transmission - reflection reference; 5. Device under test; 6. Feed horn; 7. Rotation device; 8. Position adjustment table; 9. First assembly table; 10. Second assembly table; 11. Positioning reference. Detailed implementation manners

[0042] The present invention will be described in detail below with reference to specific embodiments. The following embodiments will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several changes and improvements can still be made. These all belong to the protection scope of the present invention.

[0043] Embodiment 1

[0044] Please refer to Figure 1 and Figure 5 For the device for evaluating the radiation performance of the quasi-optical device in the present invention, it may include a signal transmitting component, a signal receiving component 1, and a device under test 5;

[0045] The Gaussian beam signal generated by the signal transmitting component propagates towards the device under test 5 at a preset incident angle. The Gaussian beam signal has the advantages of concentrated energy and good anti-interference performance, and it also carries more information;

[0046] A part of the Gaussian beam signal propagating to the device under test 5 is reflected by the device under test 5, and the other part transmits through the device under test 5;

[0047] The scanning surface of the signal receiving component 1 respectively receives the reflected Gaussian beam signal and the transmitted Gaussian beam signal, and respectively obtains the reflected radiation field data and the transmitted radiation field data;

[0048] According to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data, and the reference transmitted radiation field data, the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test are obtained.

[0049] It can be understood that the signal transmitting component generally includes a first fixing member, a signal transmitting module 3, and a feed horn 6. The signal transmitting module 3, the feed horn 6, and the device under test 5 are all assembled on the first fixing member. The signal generated by the signal transmitting module 3 is converted into a Gaussian beam signal by the feed horn 6 and propagates towards the device under test 5 from the horn aperture surface at a preset incident angle. Among them, the signal generated by the signal transmitting module 3 is generally an electromagnetic wave signal, and the device under test 5 generally has a fixed incident angle. Therefore, a preset incident angle is required to adapt to the corresponding fixed incident angle of the device under test 5.

[0050] Please refer to Figure 4 , on the basis of the above signal transmitting component, in order to facilitate the adjustment of the distance between the feed horn 6 and the device under test 5, and at the same time, it is also possible to conveniently adjust the angle of the signal transmitting component, the first fixing member may include a rotating table 2, a position adjusting table 8, a first assembly table 9, and a second assembly table 10. The position adjusting table 8 is assembled on the rotating table 2, and the first assembly table 9 and / or the second assembly table 10 are assembled on the position adjusting table 8 in a position-adjustable manner. It can be understood that generally, only one of the first assembly table 9 and the second assembly table 10 needs to be assembled in a position-adjustable manner to realize the adjustment of the distance between the device under test 5 and the feed horn 6. Of course, it is also possible that both are adjustable, and the adjustment method can be in the form of a screw adjustment component. Please refer to Figure 4, where the view at B is an enlarged view of A. A positioning reference 11 can be set on the position adjustment stage 8. The positioning reference 11 is used to identify the distance between the device under test 5 and the feed horn 6. The positioning reference 11 can be a distance scale line. The signal emission module 3 and the feed horn 6 are assembled on the first assembly stage 9, and the device under test 5 is assembled on the second assembly stage 10. Among them, the rotating stage 2 can rotate by a quantified angle, so as to drive the signal emission module 3 and the feed horn 6 to rotate to an appropriate angle. Moreover, please refer to Figure 4 , in order to ensure the accuracy requirements of the test directivity, a transmission and reflection reference 4 is also set on the rotating stage. Use the target ball of the laser tracker to take no less than 3 points on three adjacent surfaces of the transmission and reflection reference 4 respectively, and fit out three surfaces through the picked points. Taking the intersection point of the three surfaces as the origin, and the normal directions of the three surfaces as the X-axis, Y-axis, and Z-axis respectively to establish a coordinate system, and determine the test directivity accuracy through this coordinate system. Specifically, the z-axis direction can be set as the direction of the outgoing beam of the feed horn. Next Figure 3 , in the figure, there is a schematic diagram of the coordinate system. When performing the transmission test, adjust the rotating stage 2 so that the outgoing beam points to the receiving probe of the scanning frame, and make the probe parallel to the z-axis of the reference coordinate system. When performing the reflection test, adjust the rotating stage 2 so that the reflected beam points to the receiving probe of the scanning frame, and the included angle between the probe and the projection of the z-axis of the reference coordinate system on the YOZ plane is 180°-(2*incident angle). Please refer to Figure 3 the dotted line in. Or it can be described as the included angle with the negative z-axis direction being 2 times the incident angle. At the same time, the device under test 5 can also be assembled on the second assembly stage 10 through the rotating device 7. On the basis of the structure of the above-mentioned first fixing member, only one signal receiving component 1 can be set, and it can still complete the reception of the Gaussian beam signal reflected and transmitted. That is, after completing the reception of the transmitted Gaussian beam signal, adjust the angle of the device under test 5 itself and the overall angle of the signal emission component, so that the Gaussian beam signal reflected by the device under test 5 can be transmitted to the signal receiving component 1.

[0051] Exemplarily, for simplicity of structure, the signal receiving component 1 is generally designed to include a signal receiving module 101 and a second fixing member, and the signal receiving module 101 is assembled on the second fixing member.

[0052] In this embodiment, in addition to adjusting the signal transmitting component to enable the signal receiving component to receive the Gaussian beam signal well, the second fixing member may further include a lateral movement control system 103, a longitudinal movement control system 104, and a mounting base 102. The mounting base 102 is assembled on 104 in a position-adjustable manner. The longitudinal movement control system 104 is assembled on the lateral movement control system 103. The mounting base 102 is moved laterally and longitudinally through a slide rail. The signal receiving module 101 is installed on the mounting base 102. Specifically, the above-mentioned second fixing member may be a scanning frame in an antenna test system, which includes a receiving probe, a receiving module, a scanning frame, and corresponding control motors, etc. The above-mentioned second fixing member belongs to large-scale test equipment and can be used to receive the electromagnetic field strength at the probe. The receiving module processes the signal and sends it to the terminal control. The scanning frame can be controlled to move through the control motor to perform scanning within a plane, thereby obtaining the electromagnetic field strength distribution within the entire scanning plane.

[0053] Embodiment 2

[0054] Please refer to Figure 6 , this embodiment provides a method for evaluating the radiation performance of a quasi-optical device. This method is implemented using the above-mentioned device, and its test environment is located in a microwave anechoic chamber environment, including the following steps:

[0055] S1, the generated Gaussian beam signal propagates towards the device under test at a preset incident angle;

[0056] S2, a part of the Gaussian beam signal that propagates to the device under test is reflected by the device under test, and the other part is transmitted through the device under test;

[0057] S3, respectively receive the Gaussian beam signal reflected out and the Gaussian beam signal transmitted through, and respectively obtain the reflected radiation field data and the transmitted radiation field data;

[0058] S4, calculate the influence factor of the transmission radiation performance and the influence factor of the reflection radiation performance of the device under test according to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data, and the reference transmitted radiation field data.

[0059] It can be understood that, please refer to Figure 7 , the reference reflected radiation field data and the reference transmitted radiation field data are not ready-made data, but are obtained on-site. Among them, the process of obtaining the reference reflected radiation field data further includes:

[0060] A1, replace the device under test with a plane mirror, that is, remove the device under test and install the plane mirror in the position of the device under test. The generated Gaussian beam signal propagates towards the plane mirror at a preset incident angle;

[0061] A2 receives the Gaussian beam signal reflected by the plane mirror from the Gaussian beam signal and obtains the reference reflected radiation field data.

[0062] Please refer to Figure 8 , the process of obtaining the reference transmitted radiation field data further includes:

[0063] B1 directly transmits and receives the generated Gaussian beam signal. Here, the so-called direct transmission means that there is only air between the feed horn and the signal receiving component, and there are no other interfering devices;

[0064] B2 obtains the reference transmitted radiation field data according to the received Gaussian beam signal.

[0065] When obtaining the above reference reflected radiation field data and reference transmitted radiation field data, the influencing factors of the transmission radiation performance and the reflection radiation performance of the device under test can be calculated. The calculation formula is:

[0066]

[0067]

[0068] Among them, E r1 (x, y) is the reflected radiation field data, E r2 (x, y) is the reference reflected radiation field data, E t1 (x, y) is the reference transmitted radiation field data, E t2 (x, y) is the transmitted radiation field data, η t is the coupling coefficient between E t1 (x, y) and E t2 (x, y), η r is the coupling coefficient between E r1 (x, y) and E r2 (x, y), x is the abscissa of this point, y is the ordinate of this point. Among them, the coordinate system is the coordinate system set at the center of the receiving probe of the scanning frame. E(x, y) represents the electromagnetic field strength at this coordinate position.

[0069] The specific embodiments of the present invention have been described above. It should be understood that the present invention is not limited to the above specific embodiments, and those skilled in the art can make various changes or modifications within the scope of the claims, which do not affect the essence of the present invention. Without conflict, the embodiments of the present application and the features in the embodiments can be combined with each other arbitrarily.

Claims

1. A device for evaluating the radiation performance of a quasi-optical device, characterized in that, It includes a signal transmitting component, a signal receiving component and a device under test; The Gaussian beam signal generated by the signal transmitting component propagates towards the device under test at a preset incident angle; Part of the Gaussian beam signal that propagates to the device under test is reflected by the device under test, and the other part transmits through the device under test; The scanning surface of the signal receiving component respectively receives the reflected Gaussian beam signal and the transmitted Gaussian beam signal, and respectively obtains the reflected radiation field data and the transmitted radiation field data; Calculate the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test according to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data and the reference transmitted radiation field data.

2. The quasi-optical device radiation performance evaluation apparatus according to claim 1, characterized in that: The signal transmitting component includes a first fixing member, a signal transmitting module and a feed horn. The signal transmitting module, the feed horn and the device under test are all assembled on the first fixing member. The signal generated by the signal transmitting module is converted into a Gaussian beam signal by the feed horn and propagates towards the device under test at a preset incident angle from the horn aperture surface.

3. The quasi-optical device radiation performance evaluation apparatus according to claim 2, characterized in that The first fixing member includes a rotating table, a position adjusting table, a first assembly table and a second assembly table. The position adjusting table is assembled on the rotating table. The first assembly table and / or the second assembly table are assembled on the position adjusting table in a position-adjustable manner. The signal transmitting module and the feed horn are assembled on the first assembly table, and the device under test is assembled on the second assembly table.

4. The quasi-optical device radiation performance evaluation apparatus according to claim 3, wherein: The device under test is assembled on the second assembly table through a rotating device.

5. The quasi-optical device radiation performance evaluation apparatus according to claim 1, characterized in that, The signal receiving component includes a signal receiving module and a second fixing member. The signal receiving module is assembled on the second fixing member.

6. The quasi-optical device radiation performance evaluation apparatus according to claim 5, wherein The second fixing member includes a scanning frame and a scanning movement control system; The scanning frame moves horizontally and vertically according to the control signal of the scanning movement control system to achieve scanning within a two-dimensional plane range.

7. A method for evaluating the radiation performance of a quasi-optical device, characterized in that, It includes the following steps: The generated Gaussian beam signal propagates towards the device under test at a preset incident angle; Part of the Gaussian beam signal that propagates to the device under test is reflected by the device under test, and the other part transmits through the device under test; Respectively receive the reflected Gaussian beam signal and the transmitted Gaussian beam signal, and respectively obtain the reflected radiation field data and the transmitted radiation field data; Calculate the influence factors of the transmission radiation performance and the reflection radiation performance of the device under test according to the reflected radiation field data, the transmitted radiation field data, the reference reflected radiation field data and the reference transmitted radiation field data.

8. The method for evaluating the radiation performance of a quasi-optical device according to claim 7, characterized in that The process of obtaining the reference reflected radiation field data further includes: Replace the device under test with a plane mirror, and the generated Gaussian beam signal propagates towards the plane mirror at a preset incident angle; Receive the Gaussian beam signal reflected by the plane mirror in the Gaussian beam signal, and obtain the reference reflected radiation field data.

9. The method for evaluating the radiation performance of a quasi-optical device according to claim 7, characterized in that, The process of obtaining the reference transmitted radiation field data further includes: Perform direct transmission of the generated Gaussian beam signal and receive the directly transmitted Gaussian beam signal; Obtain the reference transmitted radiation field data according to the received Gaussian beam signal.

10. The method for evaluating the radiation performance of a quasi-optical device according to claim 7, characterized in that, The calculation formulas for the influence factors of the transmission radiation performance and the reflection radiation performance are respectively: ； Among them, is the reflected radiation field data, is the reference reflected radiation field data, is the reference transmitted radiation field data, is the transmitted radiation field data, is and 's coupling coefficient, is and 's coupling coefficient, x is the abscissa, and y is the ordinate.

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