An analysis method, system, terminal and storage medium for detecting voltage flicker

Abstract

The application relates to the technical field of voltage flicker, in particular to an analysis method and system for detecting voltage flicker, a terminal and a storage medium, which method comprises the following steps: acquiring a current voltage, judging whether the current voltage meets a preset voltage threshold value, if the current voltage does not meet the preset voltage threshold value, acquiring a starting node and a terminal node of voltage fluctuation, acquiring a fluctuation duration based on the starting node and the terminal node, judging whether the fluctuation duration meets a preset duration threshold value, if the fluctuation duration meets the preset duration threshold value, determining that the current voltage does not occur voltage flicker, and if the fluctuation duration does not meet the preset duration threshold value, determining that the current voltage occurs voltage flicker. The application is helpful for quickly detecting whether voltage flicker occurs, and reducing the adverse effects of voltage flicker.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of voltage flicker, and particularly relates to an analysis method and system for detecting voltage flicker, a terminal and a storage medium. BACKGROUND

[0002] With the development of industrial level and the improvement of people's living quality, power users have higher and higher requirements for power supply quality. Increasingly increasing high-power fluctuating power loads make the power supply voltage fluctuate and flicker, which seriously affects the power quality of the power grid. According to relevant standards, voltage flicker has become an important indicator for measuring power quality, and the research and analysis of voltage flicker have also attracted more and more attention from countries.

[0003] The relevant standards define the voltage flicker as the visual degree of the human eye to the flicker of the incandescent lamp caused by the voltage fluctuation. In the related technology, a flicker detection method based on Fourier transform is used to detect whether the voltage flicker occurs. The flicker detection method based on Fourier transform has the advantages of being more suitable for digital implementation and high measurement accuracy. The principle of the voltage flicker detection method based on Fourier transform is to filter and weight the flicker signal in the frequency domain, so as to obtain a higher precision measurement value. In order to further improve the flicker measurement accuracy based on Fourier transform, a spectral line interpolation correction algorithm can be used to correct the frequency spectrum, so as to reduce the influence of the frequency spectrum leakage caused by non-synchronous sampling on the accuracy of Fourier transform. However, the traditional Fourier transform measurement method needs to save a large amount of sampling data and perform Fourier transform on the sampling data in order to meet the requirements of the flicker signal resolution in the frequency range specified by the flicker measurement standard. The calculation workload is large and the calculation time is long, so it is easy to cause the voltage flicker to occur without being processed in time when the voltage flicker occurs, thereby causing adverse effects on people's production and life. SUMMARY

[0004] In order to help quickly detect whether the voltage flicker occurs and reduce the adverse effects of the voltage flicker, the present application provides an analysis method and system for detecting voltage flicker, a terminal and a storage medium.

[0005] In a first aspect, the present application provides an analysis method for detecting voltage flicker, which adopts the following technical scheme:

[0006] An analysis method for detecting voltage flicker, comprising:

[0007] obtaining a current voltage;

[0008] determining whether the current voltage meets a preset voltage threshold value;

[0009] if the current voltage does not meet the preset voltage threshold value, obtaining a starting node and a terminal node of voltage fluctuation;

[0010] acquire a fluctuation duration based on the starting node and the ending node;

[0011] determine whether the fluctuation duration meets a preset duration threshold;

[0012] if the fluctuation duration meets the preset duration threshold, determine that the current voltage does not have voltage flicker;

[0013] if the fluctuation duration does not meet the preset duration threshold, determine that the current voltage has voltage flicker.

[0014] By adopting the above technical solution, the current voltage is acquired first, and it is determined whether the voltage before the point meets the preset voltage threshold. If the current voltage does not meet the preset voltage threshold, it indicates that the current voltage has voltage fluctuation and has exceeded the voltage range allowed by the preset voltage threshold. Therefore, the starting node and the ending node of the voltage fluctuation are further acquired, and the fluctuation duration is calculated based on the starting node and the ending node. It is determined whether the fluctuation duration meets the preset duration threshold. If the fluctuation duration meets the preset duration threshold, it indicates that the voltage fluctuation is relatively gentle, and therefore it is determined that the current voltage does not have voltage flicker. If the fluctuation duration does not meet the preset duration threshold, it indicates that the voltage fluctuation is relatively sharp, and therefore it is determined that the current voltage has voltage flicker. By double determination, it can be determined whether the current voltage has voltage flicker, which has small calculation amount and short consumption time. Therefore, it can quickly detect whether the current voltage has voltage flicker, thereby helping to quickly respond to voltage flicker and reducing the adverse effects of voltage flicker.

[0015] Optionally, after the determination that the current voltage does not have voltage flicker, the method further includes:

[0016] acquiring a voltage flicker type;

[0017] acquiring a target processing scheme based on the voltage flicker type;

[0018] processing the voltage flicker based on the target processing scheme.

[0019] By adopting the above technical solution, if the current voltage has voltage flicker, the voltage flicker type is acquired first, then the target processing scheme is acquired based on the voltage flicker type, and finally the voltage flicker is processed based on the target processing scheme. According to different voltage flicker types, the corresponding target processing scheme is selected, which helps to make the target processing scheme have more pertinence to the influence caused by different voltage flicker types, thereby helping to reduce the adverse effects of voltage flicker.

[0020] Optionally, the acquiring of the target processing scheme based on the voltage flicker type includes:

[0021] determine whether the voltage flicker type is a specified type based on the voltage flicker type;

[0022] if the voltage flicker type is the specified type, determine whether there is a historical processing scheme;

[0023] if there is the historical processing scheme, determine whether the historical processing scheme meets a preset processing requirement;

[0024] if the historical processing scheme meets the preset processing requirement, take the historical processing scheme as the target processing scheme.

[0025] By using the above technical solution, it is first determined whether the voltage flicker type is a specified type. If the voltage flicker type is the specified type, it is then determined whether there is a historical processing scheme for the voltage flicker type. If there is a historical processing scheme for the voltage flicker type, it indicates that the voltage flicker of this type occurred in a certain time period in the past, and the corresponding historical processing scheme was used to process the voltage flicker phenomenon. It is then determined whether the historical processing scheme meets a preset processing requirement. If the historical processing scheme meets the preset processing requirement, it indicates that the historical processing scheme is suitable for the voltage flicker type, and thus the historical processing scheme is directly taken as the target processing scheme. When the voltage flicker type is the specified type, the historical processing scheme corresponding to the specified type exists and meets the preset processing requirement, and the historical processing scheme is directly taken as the target processing scheme. The target processing scheme is more suitable for the voltage flicker type, and there is no need to re-draft the target processing scheme. This helps to quickly obtain the target processing scheme, and thus helps to quickly respond to the voltage flicker, thereby reducing the adverse effects of the voltage flicker.

[0026] Optionally, after determining whether the voltage flicker type is the specified type based on the voltage flicker type, the method further includes:

[0027] if the voltage flicker type is not the specified type, determine whether the current voltage is 0;

[0028] if the current voltage is 0, determine whether the current voltage is restored within a preset time node based on a preset processing scheme;

[0029] if the current voltage is not restored within the preset time node, obtain a first processing scheme as the target processing scheme.

[0030] By adopting the technical scheme, when the voltage flicker type is a non-designated type, it is further judged whether the current voltage is 0, if the current voltage is 0, it indicates that the voltage flicker may cause a short circuit and / or an open circuit of the circuit, and therefore it is further judged whether the current voltage is restored within a preset time node, if the current voltage is not restored within the preset time node, it indicates that the circuit has a fault, and therefore a first processing scheme is obtained as a target processing scheme; through multiple judgments, it is known that the current voltage is not restored within the preset time node, and therefore it is inferred whether the circuit has a fault, when the circuit has a fault, the corresponding and targeted first processing scheme is obtained as the target processing scheme, which is helpful to reduce the adverse effects of voltage flicker.

[0031] Optionally, after the current voltage is 0, the preset processing scheme is used to judge whether the current voltage is restored within a preset time node, and the method further comprises:

[0032] If the current voltage is restored within the preset time node, the preset processing scheme is used to judge whether the current voltage has voltage fluctuation within the preset time node;

[0033] If the current voltage has voltage fluctuation within the preset time node, a first processing scheme is obtained as a target processing scheme;

[0034] If the current voltage does not have the voltage fluctuation within the preset time node, a second processing scheme is obtained as the target processing scheme.

[0035] By adopting the technical scheme, if the current voltage is restored within the preset time node, it indicates that the circuit is in a conduction state, and it is further judged whether the current voltage has voltage fluctuation within the preset time node, if the current voltage has voltage fluctuation within the preset time node, it indicates that the circuit still has a fault to cause unstable voltage, and therefore the first processing scheme targeted to the circuit is used as the target processing scheme, if the current voltage does not have voltage fluctuation within the preset time node, it indicates that the circuit voltage is stable and has no fault, and therefore the second processing scheme targeted to the circuit is used as the target processing scheme; according to different situations, the processing scheme targeted to the circuit is used as the target processing scheme, which is helpful to reduce the adverse effects of voltage flicker.

[0036] Optionally, the method further comprises:

[0037] Obtaining a historical voltage condition;

[0038] Based on the historical voltage condition, a time node with the minimum power consumption is obtained as a target use time node;

[0039] Obtaining a power consumption plan;

[0040] Based on the power consumption plan, a plan level is obtained.

[0041] determining whether the plan level exceeds a preset level threshold;

[0042] if the plan level exceeds the preset level threshold, using electricity based on the electricity plan;

[0043] if the plan level does not exceed the preset level threshold, using electricity based on the target use time node.

[0044] By adopting the technical solution, the time node with the minimum electricity consumption is obtained as the target use time node according to the historical voltage condition, the plan level is obtained according to the electricity plan, and it is determined whether the plan level exceeds the preset level threshold. If the plan level exceeds the preset level threshold, it indicates that the plan level is high, and therefore electricity is used according to the electricity plan. If the plan level does not exceed the preset level threshold, it indicates that the plan level is low, and therefore electricity is used according to the target use time node. According to the size relationship between the plan level and the preset level threshold, different electricity use time is selected, which helps to reduce the occurrence of voltage flicker caused by using high-power equipment in the electricity peak period, and thus helps to reduce the adverse effects of voltage flicker.

[0045] In a second aspect, the application further discloses an analysis system for detecting voltage flicker, which adopts the following technical solution:

[0046] An analysis system for detecting voltage flicker, comprising:

[0047] a first acquisition module configured to acquire a current voltage;

[0048] a first determination module configured to determine whether the current voltage meets a preset voltage threshold;

[0049] a second acquisition module configured to acquire a start node and an end node of voltage fluctuation if the current voltage does not meet the preset voltage threshold;

[0050] a third acquisition module configured to acquire a fluctuation duration based on the start node and the end node;

[0051] a second determination module configured to determine whether the fluctuation duration meets a preset duration threshold;

[0052] a first determination module configured to determine that the current voltage does not have voltage flicker if the fluctuation duration meets the preset duration threshold;

[0053] a second determination module configured to determine that the current voltage has voltage flicker if the fluctuation duration does not meet the preset duration threshold.

[0054] By adopting the technical scheme, the current voltage is acquired first, and it is judged whether the voltage before the point meets the preset voltage threshold value; if the current voltage does not meet the preset voltage threshold value, it indicates that the current voltage has voltage fluctuation and has exceeded the voltage range allowed by the preset voltage threshold value, so the starting node and the ending node of the voltage fluctuation are further acquired, and the fluctuation duration is calculated according to the starting node and the ending node; it is judged whether the fluctuation duration meets the preset duration threshold value; if the fluctuation duration meets the preset duration threshold value, it indicates that the voltage fluctuation is relatively gentle, so it is determined that the current voltage does not have voltage flicker; if the fluctuation duration does not meet the preset duration threshold value, it indicates that the voltage fluctuation is relatively sharp, so it is determined that the current voltage has voltage flicker; by the double judgment, whether the current voltage has voltage flicker can be determined, the calculation amount is small, the time consumption is short, so whether the current voltage has voltage flicker can be quickly detected, thereby helping to quickly respond to voltage flicker, and further reducing the adverse effects of voltage flicker.

[0055] In a third aspect, the application provides a computer device, which adopts the following technical scheme:

[0056] An intelligent terminal includes a memory and a processor, the memory is used to store a computer program capable of running on the processor, and the processor loads the computer program to execute the method of the first aspect.

[0057] By adopting the technical scheme, the computer program is generated based on the method of the first aspect and stored in the memory to be loaded and executed by the processor, so that the intelligent terminal is made of the memory and the processor, and the user can use it conveniently.

[0058] In a fourth aspect, the application provides a computer readable storage medium, which adopts the following technical scheme:

[0059] A computer readable storage medium stores a computer program, and the computer program is loaded by a processor to execute the method of the first aspect.

[0060] By adopting the technical scheme, the computer program is generated based on the method of the first aspect and stored in the computer readable storage medium to be loaded and executed by the processor, and the computer readable storage medium facilitates the readability and storage of the computer program.

[0061] In summary, the application has the following beneficial technical effects:

[0062] The current voltage is acquired first, and it is judged whether the voltage before the point meets the preset voltage threshold. If the current voltage does not meet the preset voltage threshold, it indicates that the current voltage has voltage fluctuation and has exceeded the voltage range allowed by the preset voltage threshold, so the starting node and the ending node of the voltage fluctuation are further acquired, and the fluctuation duration is calculated according to the starting node and the ending node. It is judged whether the fluctuation duration meets the preset duration threshold. If the fluctuation duration meets the preset duration threshold, it indicates that the voltage fluctuation is relatively gentle, so it is determined that the current voltage does not have voltage flicker. If the fluctuation duration does not meet the preset duration threshold, it indicates that the voltage fluctuation is relatively sharp, so it is determined that the current voltage has voltage flicker. Through the double judgment, whether the current voltage has voltage flicker can be judged, the calculation amount is small, the time consumption is short, so whether the current voltage has voltage flicker can be quickly detected, thereby helping to quickly respond to voltage flicker, and the adverse effects of voltage flicker are reduced. BRIEF DESCRIPTION OF DRAWINGS

[0063] Figure 1 is a main flowchart of an analysis method for detecting voltage flicker according to an embodiment of the present application;

[0064] Figure 2 is a step flowchart of steps S201 to S203;

[0065] Figure 3 is a step flowchart of steps S301 to S304;

[0066] Figure 4 is a step flowchart of steps S401 to S403;

[0067] Figure 5 is a step flowchart of steps S501 to S503;

[0068] Figure 6 is a step flowchart of steps S601 to S607;

[0069] Figure 7 is a module diagram of an analysis system for detecting voltage flicker according to an embodiment of the present application.

[0070] BRIEF DESCRIPTION OF DRAWINGS

[0071] 1, first acquisition module; 2, first judgment module; 3, second acquisition module; 4, third acquisition module; 5, second judgment module; 6, first determination module; 7, second determination module. DETAILED DESCRIPTION

[0072] In a first aspect, the present application discloses an analysis method for detecting voltage flicker.

[0073] REFERENCE Figure 1An analysis method for detecting voltage flicker, comprising steps S101 to S107:

[0074] Step S101: obtaining a current voltage.

[0075] Specifically, in the embodiment, the current voltage is the voltage of a current load. In the embodiment, the load can be an incandescent lamp, and the rated voltage of the incandescent lamp is 220 V. The current voltage can be measured by using a voltmeter or a multimeter.

[0076] Step S102: determining whether the current voltage meets a preset voltage threshold.

[0077] Specifically, the preset voltage threshold can be set according to the rated voltage of the incandescent lamp. In the embodiment, the preset voltage threshold is set to 90% to 110% of the rated voltage of the incandescent lamp.

[0078] Step S103: if the current voltage does not meet the preset voltage threshold, obtaining a start node and an end node of voltage fluctuation.

[0079] Specifically, in the embodiment, the start node is a time node at which voltage fluctuation starts, and the end node is a time node at which voltage fluctuation ends. In the embodiment, voltage fluctuation means that the current voltage is not within the preset voltage threshold, for example, the current voltage is higher than the preset voltage threshold or the current voltage is lower than the preset voltage threshold. In the embodiment, a voltage-time waveform diagram can be generated according to the current voltage at different time nodes, and the start node and the end node of voltage fluctuation can be obtained from the voltage-time waveform diagram.

[0080] In addition, if the current voltage meets the preset voltage threshold, the current operation is terminated and the step S101 is returned.

[0081] Step S104: obtaining a fluctuation duration based on the start node and the end node.

[0082] Specifically, in the embodiment, the fluctuation duration is the length of time during which voltage fluctuation occurs, and the fluctuation duration is the difference between the end node and the start node.

[0083] Step S105: determining whether the fluctuation duration meets a preset duration threshold.

[0084] Specifically, in the embodiment, the preset duration threshold can be set to 1 s or other duration.

[0085] Step S106: if the fluctuation duration meets the preset duration threshold, determining that the current voltage does not have voltage flicker.

[0086] Specifically, in the embodiment, the fluctuation duration meeting the preset duration threshold means that the fluctuation duration is within the preset duration range.

[0087] Step S107: If the fluctuation duration does not satisfy the preset duration threshold, it is determined that the current voltage has voltage flicker.

[0088] Specifically, in this embodiment, the fluctuation duration not satisfying the preset duration threshold means that the fluctuation duration is not within the preset duration range.

[0089] The analysis method for detecting voltage flicker provided in this embodiment first acquires the current voltage, and determines whether the voltage before the point satisfies the preset voltage threshold. If the current voltage does not satisfy the preset voltage threshold, it means that the current voltage has voltage fluctuation and has exceeded the voltage range allowed by the preset voltage threshold. Therefore, the starting node and the ending node of the voltage fluctuation need to be further acquired, and the fluctuation duration is calculated according to the starting node and the ending node. It is determined whether the fluctuation duration satisfies the preset duration threshold. If the fluctuation duration satisfies the preset duration threshold, it means that the voltage fluctuation is relatively smooth, and therefore it is determined that the current voltage does not have voltage flicker. If the fluctuation duration does not satisfy the preset duration threshold, it means that the voltage fluctuation is relatively sharp, and therefore it is determined that the current voltage has voltage flicker. Through the double determination, it can be determined whether the current voltage has voltage flicker, which has small calculation amount, short time consumption, and therefore can quickly detect whether the current voltage has voltage flicker, so as to help quickly respond to voltage flicker and reduce the adverse effects of voltage flicker.

[0090] Reference Figure 2 In one of the implementation manners of this embodiment, after step S106, if the fluctuation duration satisfies the preset duration threshold, it is determined that the current voltage does not have voltage flicker, and the method further includes steps S201 to S203.

[0091] Step S201: Acquire the voltage flicker type.

[0092] Specifically, in this embodiment, the voltage flicker type includes voltage flicker caused by voltage fluctuation due to high-power electrical starting, voltage flicker caused by circuit system failure, voltage flicker caused by the influence of operating waves generated during automatic switching of system equipment, and the like. In this embodiment, a plurality of voltage flicker types are pre-set and stored.

[0093] Step S202: Acquire the target processing scheme based on the voltage flicker type.

[0094] Specifically, in this embodiment, the target processing scheme is the final processing scheme for voltage flicker.

[0095] Step S203: Process the voltage flicker based on the target processing scheme.

[0096] Specifically, in this embodiment, processing the voltage flicker means processing the load circuit after voltage flicker according to the target processing scheme, for example, improving the power supply capacity, and the like.

[0097] The analysis method for detecting voltage flicker provided by the embodiment can, if the current voltage has voltage flicker, first acquire the voltage flicker type, then acquire the target processing scheme according to the voltage flicker type, and finally process the voltage flicker according to the target processing scheme. According to different voltage flicker types, the corresponding target processing scheme is selected, which helps to make the influence of the target processing scheme on different voltage flicker types more targeted, thereby helping to reduce the adverse effects of voltage flicker.

[0098] Reference Figure 3 In one of the embodiments of the present embodiment, the specific steps of acquiring the target processing scheme based on the voltage flicker type in step S202 include steps S301 to S304.

[0099] Step S301: Determine whether the voltage flicker type is a specified type based on the voltage flicker type.

[0100] Specifically, in the present embodiment, the specified type is a common and controllable type, for example, the power equipment has impact load or fluctuation load (electric arc furnace, steel smelting furnace, steel rolling machine, electric welding machine, rail transit, electrified railway, and short-circuit test load, etc.), the system equipment automatically switches to produce operation wave influence (automatic switching of standby power supply and automatic reclosing action), etc.

[0101] Step S302: If the voltage flicker type is the specified type, determine whether there is a historical processing scheme.

[0102] Specifically, in the present embodiment, the historical processing scheme is a processing scheme developed for the specified type within a certain time threshold (for example, one month or one year) in the past.

[0103] Step S303: If there is a historical processing scheme, determine whether the historical processing scheme meets the preset processing requirement.

[0104] Specifically, in the present embodiment, the preset processing requirement is a pre-set effect requirement, and determining whether the historical processing scheme meets the preset processing requirement is to determine whether the historical processing scheme can achieve the preset effect. In addition, if there is no historical processing scheme, the most frequently used processing scheme can be selected as the target processing scheme according to big data.

[0105] Step S304: If the historical processing scheme meets the preset processing requirement, the historical processing scheme is used as the target processing scheme.

[0106] Specifically, in the present embodiment, if the historical processing scheme does not meet the preset processing requirement, a processing scheme that meets the preset processing requirement is selected as the target processing scheme according to big data.

[0107] The analysis method for detecting voltage flicker provided by the embodiment first determines whether the voltage flicker type is a specified type, and if the voltage flicker type is the specified type, determines whether there is a historical processing scheme for the voltage flicker type. If there is a historical processing scheme for the voltage flicker type, it indicates that the voltage flicker of the type occurred in a certain time period in the past, and the corresponding historical processing scheme was used to process the voltage flicker phenomenon. Then, it is determined whether the historical processing scheme meets the preset processing requirement. If the historical processing scheme meets the preset processing requirement, it indicates that the historical processing scheme is suitable for the voltage flicker type, and thus the historical processing scheme is directly used as the target processing scheme. When the voltage flicker type is the specified type, if not only there is a historical processing scheme corresponding to the specified type, but also the historical processing scheme meets the preset processing requirement, the historical processing scheme is directly used as the target processing scheme. The target processing scheme is more suitable for the voltage flicker type, and there is no need to redevelop the target processing scheme, which helps to quickly obtain the target processing scheme, so as to quickly respond to the voltage flicker, and thus reduce the adverse effects of the voltage flicker.

[0108] With reference to Figure 4 In one of the embodiments of the present embodiment, after step S301 of determining whether the voltage flicker type is a specified type based on the voltage flicker type, steps S401 to S403 are further included.

[0109] Step S401: If the voltage flicker type is not the specified type, it is determined whether the current voltage is 0.

[0110] Specifically, in the present embodiment, the voltage flicker type that is not the specified type can be caused by equipment failure due to lightning or other unexpected factors.

[0111] Step S402: If the current voltage is 0, it is determined whether the current voltage is restored within a preset time node based on a preset processing scheme.

[0112] Specifically, in the present embodiment, the preset processing scheme is a scheme of using a backup power supply device or circuit to supply power to the load circuit when the current voltage is 0. It is worth noting that when the current voltage is 0, the system will use a new power supply to the load circuit, such as using a capacitor or using other power supply sources, etc. The preset time node can be 1 minute or other time set according to actual conditions. Voltage recovery means that the voltage value changes from 0 to a voltage value greater than 0.

[0113] Step S403: If the current voltage is not restored within the preset time node, a first processing scheme is obtained as the target processing scheme.

[0114] Specifically, in this embodiment, if the current voltage is not restored within the preset time node, it indicates that the current voltage is still 0 after the power supply to the load circuit is restored, and thus it can be determined that the load circuit has a fault, resulting in a circuit failure. Therefore, the first processing scheme is used as the target processing scheme, that is, the scheme of replacing the load circuit with a backup circuit. For example, two identical load circuits are provided, one as a main load circuit and the other as a backup load circuit. When the main load circuit fails and the circuit is not connected, the backup load circuit is used.

[0115] The analysis method for detecting voltage flicker provided by the present embodiment further determines whether the current voltage is 0 when the voltage flicker type is not the specified type. If the current voltage is 0, it indicates that the voltage flicker may cause a circuit short circuit and / or open circuit, and thus it is necessary to further determine whether the current voltage is restored within the preset time node. If the current voltage is not restored within the preset time node, it indicates that the circuit has a fault, and thus the first processing scheme is obtained as the target processing scheme. Through multiple determinations, it is known that the current voltage is not restored within the preset time node, and thus it is inferred whether the circuit has a fault. When the circuit has a fault, the corresponding and targeted first processing scheme is obtained as the target processing scheme, which helps to reduce the adverse effects of voltage flicker.

[0116] Reference Figure 5 In one of the embodiments of the present embodiment, if the current voltage is 0 in step S402, the determination of whether the current voltage is restored within the preset time node based on the preset processing scheme further includes steps S501 to S503:

[0117] Step S501: If the current voltage is restored within the preset time node, it is determined whether the current voltage has voltage fluctuation within the preset time node based on the preset processing scheme.

[0118] Step S502: If the current voltage has voltage fluctuation within the preset time node, the first processing scheme is obtained as the target processing scheme.

[0119] Specifically, in this embodiment, if the current voltage has voltage fluctuation within the preset time node, it indicates that there is a poor contact or other fault in the load circuit, resulting in unstable current voltage. Therefore, the first processing scheme is still used as the target processing scheme.

[0120] Step S503: If the current voltage does not have voltage fluctuation within the preset time node, the second processing scheme is obtained as the target processing scheme.

[0121] Specifically, in the embodiment, if the current voltage does not exist voltage fluctuation within the preset time node, it indicates that the power supply of the load circuit exists tripping symptom, and after re-supplying power, the load circuit is normally turned on, therefore, the second processing scheme is adopted as the target processing scheme, and the second processing scheme is a scheme of continuing to supply power according to the current power supply state.

[0122] The analysis method for detecting voltage flicker provided by the embodiment judges whether the current voltage exists voltage fluctuation within the preset time node if the current voltage has recovered within the preset time node, and if the current voltage exists voltage fluctuation within the preset time node, it indicates that the circuit still exists fault leading to unstable voltage, therefore, the second processing scheme specific to the circuit is adopted as the target processing scheme, and if the current voltage does not exist voltage fluctuation within the preset time node, it indicates that the circuit voltage is stable and does not exist fault, therefore, the third processing scheme specific to the circuit is adopted as the target processing scheme; the processing scheme specific to different situations is adopted as the target processing scheme, which helps to reduce the adverse effects of voltage flicker.

[0123] Reference Figure 6 In one of the embodiments of the embodiment, the specific steps of step S504 include steps S601 to S607.

[0124] Step S601: Obtain historical voltage condition.

[0125] Specifically, in the embodiment, the historical voltage condition includes voltage high-low condition and specific voltage value of the load circuit at different time nodes, the system saves the current voltage in real time and forms a voltage time table, the voltage time table stores different time nodes and voltage values corresponding to different time nodes, therefore, the historical voltage condition can be obtained from the voltage time table.

[0126] Step S602: Obtain the time node with the minimum power consumption as the target use time node based on the historical voltage condition.

[0127] Step S603: Obtain power consumption plan.

[0128] Specifically, in the embodiment, the power consumption plan is a plan of using high-power electrical equipment that may cause voltage flicker by the user, including use time, etc.

[0129] Step S604: Obtain plan level based on the power consumption plan.

[0130] Specifically, in the embodiment, the plan level is the important level of the power consumption plan, and the plan level can be first level, second level and third level, etc., and the order according to the importance is first level>second level>third level.

[0131] Step S605: determining whether the plan level exceeds a preset level threshold.

[0132] Specifically, in this embodiment, the preset level threshold can be set to level two.

[0133] Step S606: if the plan level exceeds the preset level threshold, using electricity based on the electricity plan.

[0134] Step S607: if the plan level does not exceed the preset level threshold, using electricity based on the target use time node.

[0135] The analysis method for detecting voltage flicker provided by the embodiment acquires a time node with the minimum electricity consumption as a target use time node according to historical voltage conditions, acquires a plan level according to an electricity plan, determines whether the plan level exceeds a preset level threshold, and if the plan level exceeds the preset level threshold, indicates that the plan level is high, so electricity is used according to the electricity plan, and if the plan level does not exceed the preset level threshold, indicates that the plan level is low, so electricity is used according to the target use time node. According to the size relationship between the plan level and the preset level threshold, different electricity use time is selected, which helps to reduce the occurrence of voltage flicker caused by using high-power equipment during the electricity peak period, thereby helping to reduce the adverse effects of voltage flicker.

[0136] The implementation principle of the analysis method for detecting voltage flicker provided by the embodiment is as follows: acquiring a current voltage, determining whether the current voltage satisfies a preset voltage threshold, if the current voltage does not satisfy the preset voltage threshold, acquiring a start node and an end node of voltage fluctuation, acquiring a fluctuation duration based on the start node and the end node, determining whether the fluctuation duration satisfies a preset duration threshold, if the fluctuation duration satisfies the preset duration threshold, determining that the current voltage does not occur voltage flicker, and if the fluctuation duration does not satisfy the preset duration threshold, determining that the current voltage occurs voltage flicker.

[0137] In a second aspect, the application further discloses an analysis system for detecting voltage flicker.

[0138] Reference Figure 7 An analysis system for detecting voltage flicker, comprising:

[0139] A first acquisition module, configured to acquire a current voltage;

[0140] A first determination module, configured to determine whether the current voltage satisfies a preset voltage threshold;

[0141] A second acquisition module, if the current voltage does not satisfy the preset voltage threshold, the second acquisition module is configured to acquire a start node and an end node of voltage fluctuation;

[0142] A third acquisition module, configured to acquire a fluctuation duration based on the start node and the end node.

[0143] a second judging module, configured to judge whether the fluctuation duration meets a preset duration threshold;

[0144] a first determining module, if the fluctuation duration meets the preset duration threshold, the first determining module is configured to determine that the current voltage does not occur voltage flicker;

[0145] a second determining module, if the fluctuation duration does not meet the preset duration threshold, the second determining module is configured to determine that the current voltage occurs voltage flicker.

[0146] In a third aspect, an embodiment of the present application discloses an intelligent terminal, comprising a memory and a processor, the memory is used for storing a computer program capable of running on the processor, when the processor loads the computer program, the analysis method for detecting voltage flicker of the above-mentioned embodiment is executed.

[0147] In a fourth aspect, an embodiment of the present application discloses a computer readable storage medium, and the computer readable storage medium stores a computer program, wherein when the computer program is loaded by a processor, the analysis method for detecting voltage flicker of the above-mentioned embodiment is executed.

[0148] The above are preferred embodiments of the present application, and are not intended to limit the protection scope of the present application, therefore: all equivalent changes made according to the structure, shape, principle of the present application should be covered within the protection scope of the present application.

Claims

1. An analytical method for detecting voltage flicker, characterized by, The method comprises the following steps: obtaining a current voltage; determining whether the current voltage meets a preset voltage threshold; if the current voltage does not meet the preset voltage threshold, obtaining a starting node and a terminal node of voltage fluctuation; based on the starting node and the terminal node, obtaining a fluctuation duration; determining whether the fluctuation duration meets a preset duration threshold; if the fluctuation duration meets the preset duration threshold, determining that the current voltage does not have voltage flicker; if the fluctuation duration does not meet the preset duration threshold, determining that the current voltage has voltage flicker; obtaining a voltage flicker type; based on the voltage flicker type, obtaining a target processing scheme, specifically comprising: based on the voltage flicker type, determining whether the voltage flicker type is a specified type; if the voltage flicker type is the specified type, determining whether there is a historical processing scheme; if there is the historical processing scheme, determining whether the historical processing scheme meets a preset processing requirement; if the historical processing scheme meets the preset processing requirement, taking the historical processing scheme as the target processing scheme; if the voltage flicker type is not the specified type, determining whether the current voltage is 0; if the current voltage is 0, determining whether the current voltage is restored within a preset time node based on a preset processing scheme; if the current voltage is not restored within the preset time node, obtaining a first processing scheme as the target processing scheme; if the current voltage is restored within the preset time node, determining whether there is voltage fluctuation of the current voltage within the preset time node based on a preset processing scheme; if there is voltage fluctuation of the current voltage within the preset time node, obtaining a first processing scheme as the target processing scheme; if there is no voltage fluctuation of the current voltage within the preset time node, obtaining a second processing scheme as the target processing scheme; based on the target processing scheme, processing the voltage flicker.

2. The analysis method for detecting voltage flicker according to claim 1, wherein Further comprising: obtaining a historical voltage condition; based on the historical voltage condition, obtaining a time node with the minimum power consumption as a target use time node; obtaining a power consumption plan; based on the power consumption plan, obtaining a plan level; determining whether the plan level exceeds a preset level threshold; if the plan level exceeds the preset level threshold, consuming electricity based on the power consumption plan; if the plan level does not exceed the preset level threshold, consuming electricity based on the target use time node.

3. An analytical system for detecting voltage flicker, characterized by The method comprises the following steps: a first obtaining module is configured to obtain a current voltage; a first determining module is configured to determine whether the current voltage meets a preset voltage threshold; a second obtaining module is configured to obtain a starting node and a terminal node of voltage fluctuation if the current voltage does not meet the preset voltage threshold; a third obtaining module is configured to obtain a fluctuation duration based on the starting node and the terminal node; a second determining module is configured to determine whether the fluctuation duration meets a preset duration threshold; a first determining module is configured to determine that the current voltage does not have voltage flicker if the fluctuation duration meets the preset duration threshold; The second determining module is configured to determine that the current voltage has voltage flicker if the fluctuation duration does not satisfy the preset duration threshold The fourth obtaining module is configured to obtain a voltage flicker type of the voltage flicker. The fifth obtaining module is configured to obtain a target processing scheme based on the voltage flicker type, and specifically includes: determining whether the voltage flicker type is a specified type based on the voltage flicker type; determining whether there is a historical processing scheme if the voltage flicker type is the specified type; determining whether the historical processing scheme satisfies a preset processing requirement if there is the historical processing scheme; obtaining the historical processing scheme as the target processing scheme if the historical processing scheme satisfies the preset processing requirement; determining whether the current voltage is 0 if the voltage flicker type is not the specified type; determining whether the current voltage is restored within a preset time node based on a preset processing scheme if the current voltage is 0; obtaining a first processing scheme as the target processing scheme if the current voltage is not restored within the preset time node; determining whether there is voltage fluctuation within the preset time node based on the preset processing scheme if the current voltage is restored within the preset time node; obtaining the first processing scheme as the target processing scheme if there is voltage fluctuation; and obtaining a second processing scheme as the target processing scheme if there is no voltage fluctuation.

4. A smart terminal comprising a memory, a processor, characterized in that, The processing module is configured to process the voltage flicker based on the target processing scheme.

5. A computer-readable storage medium having stored therein a computer program, characterized in that, The memory is configured to store a computer program capable of running on the processor. The computer program is loaded by the processor to execute the method in any one of claims 1 to 2. The computer program is loaded by the processor to execute the method in any one of claims 1 to 2.

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