A method of mapping a test equipment wiring diagram

Abstract

The application discloses a kind of test equipment wiring diagram's graphing method, based on the technical parameter of test equipment, the model of required equipment is preset, the node of model is designed according to the external port information of equipment;Test instruction is converted into configured test information, and the number, type and connection relationship of test equipment are obtained by analyzing test information, and then the corresponding wiring logic table is generated by port distribution rule and layout distribution rule, and the wiring logic table is generated wiring diagram by graphing service, this method can be applied to different kinds of equipment and connection mode, the graphing process is simple and clear, the technical operation level and subject basis requirement of test personnel are lower, the working content of equipment test is optimized, and the work efficiency and work quality are greatly improved.

Description

Technical Field

[0001] This invention relates to the field of computer technology, and in particular to a method for generating wiring diagrams for testing equipment. Background Technology

[0002] The test equipment wiring diagram contains the equipment icons and wiring information between the equipment. It serves as a reference and indicator in the production testing of the equipment. The wiring of the equipment is the foundation of the equipment testing. Only when the equipment is connected correctly can the test results be obtained smoothly. Otherwise, there is a risk of damaging the equipment under test.

[0003] In laboratory research or limited equipment testing, wiring modules are typically handled by experienced personnel, often without corresponding wiring diagrams or with only limited paper copies. This method demands a high level of experience and relevant subject knowledge from the testing staff. As the volume of equipment testing increases, a small number of experienced personnel struggle to provide adequate technical support, and training new staff is time-consuming and costly. Traditional methods for generating wiring diagrams for testing equipment include manual drawing (inefficient and inaccurate) and generation from specific standard documents (limited by equipment information, restrictive on the types of wiring diagrams, low flexibility, and narrow application). If the connection method or the type and quantity of testing equipment change, the specific standard documents need to be remade, a cumbersome update process that also places high demands on the drafting personnel.

[0004] Therefore, there is an urgent need for a method to generate wiring diagrams for test equipment that can generate them quickly, accurately, and automatically, and is applicable to different test equipment and wiring methods, thereby lowering the barrier to entry for test personnel. Summary of the Invention

[0005] To address the aforementioned problems in existing technologies, this invention proposes a method for generating wiring diagrams for test equipment. This method can quickly and accurately generate wiring diagrams for test equipment automatically. It has a wide range of applications and a simple implementation process, making it easy for testers to use.

[0006] The specific technical solution is as follows:

[0007] A method for generating a wiring diagram for a test device includes the following steps:

[0008] Based on the technical parameters of the test equipment, the pre-set standard models include: test tool model, device under test model, and custom test model;

[0009] Receive test commands and configure test information;

[0010] Parse the test information to obtain test equipment data;

[0011] Based on the test equipment data, the algorithm calculates the diagram information and generates the wiring logic table;

[0012] The wiring diagram of the test equipment is generated using the mapping system.

[0013] Furthermore, the technical parameters of the test equipment include the internal functional information and external port information of the equipment, which are used to design the test tool model, the device under test model, and the custom test model;

[0014] The test tool model includes: a terminal test model and an extended test model, which are used to indicate the terminal test equipment and the extended test equipment, respectively.

[0015] The device under test model is used to indicate the device under test;

[0016] The custom test model is used to instruct other custom external devices;

[0017] The pre-set model includes the model's main information and node information.

[0018] Furthermore, the main body information includes the external shape and internal structure; the node information includes the node type, the number of nodes, and the node distribution method; the node type and the number of nodes in the preset standard model correspond to the external port information of the device it indicates.

[0019] Furthermore, the receiving of test instructions and configuration of test information includes:

[0020] Receive test service information;

[0021] Analyze the number of devices under test and the content of the services to be tested;

[0022] Select the test channel and configure test cases based on the analysis results;

[0023] The test cases include the command sending target, the test case name, the command sending data, and the test result judgment conditions.

[0024] Furthermore, parsing the test information to obtain test equipment data includes:

[0025] Obtain the number of test channels and the target of the command, and determine the type and quantity of the test equipment;

[0026] The test equipment is grouped according to the number of test channels;

[0027] Based on the equipment allocation rules, a test equipment relationship table is generated;

[0028] The generated device relationship table includes: setting the connection relationship between terminal test devices and extended test devices; and determining the connection relationship between test devices within the group.

[0029] Furthermore, the step of generating a wiring logic table based on test equipment data and algorithmic calculation of diagram information includes:

[0030] Calculate port wiring information based on port allocation rules;

[0031] Calculate module layout information based on page layout rules.

[0032] Furthermore, the calculation of port wiring information based on port allocation rules includes:

[0033] Obtain the test device relationship table and determine the external port information of the test device, including port type and number of ports;

[0034] Configure the first port of the extended test device to connect with the corresponding type port of the terminal test device;

[0035] Obtain the port types of the device under test and the other custom external devices;

[0036] Assign the ports of the extended test equipment to the corresponding devices under test and other custom external devices;

[0037] Generate a port relationship table from the port wiring information of the test equipment;

[0038] The port allocation of the extended test equipment includes: obtaining a set of ports of different types of the extended test equipment, wherein the port types of the port sets are the same as the port types of the device under test and the other custom external devices; sorting the unoccupied ports in the corresponding port sets according to the port identification information and allocating them in sequence;

[0039] The port allocation rules include: obtaining a set of ports of the same type as the device to be connected; and allocating ports sequentially according to a specific port sorting order.

[0040] Furthermore, the layout information calculated based on page layout rules includes:

[0041] Based on the test equipment relationship table, referencing the standard model, generate a model for the corresponding test equipment, and encode the model by comparing it with the type and grouping information of the test equipment;

[0042] Based on the page size and the size of the test tool model, the location information of the terminal test device is set;

[0043] Calculate the location information of the extended testing devices based on the number of extended testing devices and the location information of the terminal testing devices;

[0044] Using the extended test equipment as a reference position, and combining the dimensions of the device under test model and the custom test model, the position information of the test equipment in each group is calculated;

[0045] A module layout table is generated based on the model dimensions of the test equipment and the calculated position information.

[0046] Furthermore, the step of generating a wiring logic table based on test equipment data and calculating the diagram information through an algorithm also includes setting a general layout template: presetting the technical parameters of commonly used test equipment and obtaining test equipment data;

[0047] Generate the corresponding wiring logic table based on the test equipment data;

[0048] Store the wiring logic table and the corresponding test equipment data, set the template name and template ID, and generate a general layout template;

[0049] The process of calling the general layout template is as follows: traverse the stored general layout templates, compare the test equipment data of the general layout template with the test equipment data of the received test command. If the two are the same, directly reference the general layout template to obtain the corresponding wiring logic table; if the two are different, proceed to the comparison of the next general layout template; if the traversal ends and no matching general layout template is found, calculate the diagram information through the algorithm to generate the wiring logic table.

[0050] Furthermore, generating a test equipment wiring diagram through the mapping system includes: selecting the automatic flowchart generation function of the mapping system, customizing the style of the connection lines according to the external port information or the connection relationship between devices, rendering the connection logic table to show the connection lines between the test equipment models, and generating a test equipment wiring diagram.

[0051] An electronic device, comprising:

[0052] Memory and one or more processors;

[0053] The memory is communicatively connected to the one or more processors, and the memory stores instructions that can be executed by the one or more processors. When the instructions are executed by the one or more processors, the electronic device is used to implement the above method.

[0054] A computer-readable storage medium having computer-executable instructions stored thereon, which, when executed by a computing device, can be used to implement the above-described method.

[0055] The above technical solution has the following advantages or beneficial effects:

[0056] The method for generating wiring diagrams for test equipment according to this invention is based on a pre-set standard model and configured test information. It automatically generates corresponding wiring diagrams for test equipment through a diagram generation system. The method is convenient, rapid, and highly automated. The pre-set standard model can change with the technical parameters of the test equipment, and different equipment connection relationships and port allocation relationships can be obtained according to the configured test cases. Therefore, this diagram generation method is applicable to a wide range of equipment types and wiring methods. In this method, testers only need to configure test cases according to the test business information, which simplifies the diagram generation process and reduces the workload of testers. Attached Figure Description

[0057] Figure 1 This is a schematic flowchart illustrating a method for generating a wiring diagram for a test device, as provided in an embodiment of this application. Detailed Implementation

[0058] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0059] Combination Figure 1 As shown, in an embodiment of the present invention, a method for generating a wiring diagram for a test device includes the following steps:

[0060] S1. Based on the technical parameters of the test equipment, the pre-set standard models include: test tool model, device under test model and custom test model;

[0061] S2. Receive test instructions and configure test information;

[0062] S3. Parse the test information to obtain test equipment data;

[0063] S4. Based on the test equipment data, the diagram information is calculated through an algorithm to generate a wiring logic table;

[0064] S5. Generate the wiring diagram of the test equipment through the mapping system.

[0065] Preferably, the technical parameters of the test equipment include the internal functional information and external port information of the equipment, which are used to design the test tool model, the device under test model, and the custom test model;

[0066] The test tool model includes: a terminal test model and an extended test model, which are used to indicate the terminal test equipment and the extended test equipment, respectively.

[0067] The device under test model is used to indicate the device under test;

[0068] The custom test model is used to instruct other custom external devices;

[0069] The pre-set model includes the model's main information and node information.

[0070] In a preferred embodiment, the testing equipment includes a device under test (DUT), auxiliary testing equipment, testing tools, etc. The DUT is a wired device. Currently, common DUTs in actual production and application include various types of modules, PCBA boards, and main control chips. The auxiliary testing equipment is set according to the testing requirements. For example, if it is required to detect the temperature of the DUT in the working state, then a thermometer is needed to complete the task. Similarly, it may also include voltmeters, ammeters, etc.

[0071] For example, the terminal testing device is generally used to send signals to the device under test (DUT) and receive signals returned by the DUT, and uploads the returned signals to the testing platform via wired or wireless communication, facilitating automated management of device test data and traceability of historical information. The extended testing device is an auxiliary expansion component of the terminal testing device, having multiple connectable ports for connecting the DUT and the auxiliary testing device. Optionally, the internal functional information and external port information of the device are represented through the graphical design and node design of the corresponding model.

[0072] Preferably, the main body information includes the external shape and internal structure; the node information includes the node type, the number of nodes, and the node distribution method; the node type and the number of nodes in the preset standard model correspond to the external port information of the device it indicates.

[0073] In a preferred embodiment, the standard model is designed with a rectangular shape. The design of the rectangle within the terminal test device and extended test device can refer to the structure and color of the actual device; for example, the position and shape of built-in components can be added inside the rectangle, and the color can be set to green. For the device under test and other custom external devices, whose internal structure and specific form are unpredictable, they can be identified using rectangles and text. The ports of the device under test and other custom external devices are of a single type, and their port information is set during test configuration. The node information of the corresponding models for the terminal test device and extended test device has a preset specified type and quantity. Generally, nodes of the same type are arranged together and set sequentially along the outer edge of the rectangle in a certain order. Each node has a node name corresponding to its port name, facilitating the retrieval of the corresponding node and completing the connection between models.

[0074] In a preferred embodiment, the ports of the terminal testing device and the extended testing device are named according to a combination of the port type name and a serial number. For example, if the terminal testing device has three types of ports named "typeA", "typeB", and "typeC", with four ports of each type, then each port can be named "typeA1, typeA2, typeA3", "typeB1, typeB2, typeB3", and "typeC1, typeC2, typeC3". The naming of nodes can directly reference the name of their corresponding ports, or a different rule can be set to ensure a one-to-one correspondence between nodes and ports and an unambiguous allocation. Optionally, based on the above example, the three types of nodes can be arranged on the outer sides of the three sides of the rectangle.

[0075] Preferably, the receiving of test instructions and configuration of test information includes:

[0076] Receive test service information;

[0077] Analyze the number of devices under test and the content of the services to be tested;

[0078] Select the test channel and configure test cases based on the analysis results;

[0079] The test cases include the command sending target, the test case name, the command sending data, and the test result judgment conditions.

[0080] In a preferred embodiment, the aforementioned test service information generally includes the number of devices under test and the content to be tested on each device. This information is typically obtained in text format and parsed by testers to complete the relevant test configurations. The configuration includes selecting test channels and determining the number of devices under test that can be tested simultaneously. This can be set based on the total number of devices under test and a pre-set standard model. For example, if the number of ports matching the terminal test model with the devices under test in the pre-set model is 5, and the number of devices under test in the test service information is 4, then selecting test channel 4 allows for simultaneous testing of 4 devices under test. When the required number of devices under test is 10, the number of test channels is set to 5, meaning the test is conducted in two sessions, testing 5 devices under test each time. Therefore, the number of test channels cannot exceed the number of ports corresponding to the terminal test model, and the pre-set model should be designed based on the content of commonly used test services.

[0081] In a preferred embodiment, the process of configuring test cases includes: writing test case names, selecting command sending targets, setting command sending data, and setting test result judgment conditions. The execution order of test cases and the test type can also be set. The test type can be either standard testing or custom script testing. Standard testing directly calls built-in standard instructions, while custom script testing requires manually writing scripts based on the test content, uploading them to the system, and then executing the script instructions. Test result judgment conditions are used to judge the results after the test cases are executed. These conditions can also be left unjudged, and are applied to test cases for query functions. The command sending targets include "test devices" and "custom devices." "Test devices" refer to the device under test specified in the corresponding test service, and the execution of its corresponding test cases generally involves sending command data from the terminal test device to the device under test. "Custom devices" refer to other custom external devices, typically auxiliary testing tools. Preferably, a custom device configuration function is also provided, including parameters such as the name and port type of the custom device. The configured custom device is a single-port type device.

[0082] Preferably, parsing the test information to obtain test equipment data includes:

[0083] Obtain the number of test channels and the target of the command, and determine the type and quantity of the test equipment;

[0084] The test equipment is grouped according to the number of test channels;

[0085] Based on the equipment allocation rules, a test equipment relationship table is generated;

[0086] The generated device relationship table includes: setting the connection relationship between terminal test devices and extended test devices; and determining the connection relationship between test devices within the group.

[0087] In a preferred embodiment, the connection relationships of the test devices within a group include: the connection relationship between the extended test device and the device under test (DUT), the connection relationship between the extended test device and other custom external devices, and the connection relationship between the DUT and other custom external devices. If, based on the received test instructions, two test channels are selected and two test cases are configured, with the corresponding command sending targets being "test device" and "custom device," optionally, the "custom device" is set to a smart voltmeter, then the required test devices for this test include: one terminal test device, two extended test devices, two DUTs, and two smart voltmeters. Furthermore, the required devices are grouped according to the channels, with each group including one extended test box, one DUT, and one smart voltmeter. The generated device relationship table includes: the terminal test device is connected to two extended test devices respectively; each group's extended test box is connected to the DUT; each group's extended test box is connected to the smart voltmeter; and each group's smart voltmeter is connected to the DUT.

[0088] Preferably, the step of generating a wiring logic table by calculating the diagram information based on test equipment data using an algorithm includes:

[0089] Calculate port wiring information based on port allocation rules;

[0090] Calculate module layout information based on page layout rules.

[0091] Preferably, the calculation of port wiring information based on port allocation rules includes:

[0092] Obtain the test device relationship table and determine the external port information of the test device, including port type and number of ports;

[0093] Configure the first port of the extended test device to connect with the corresponding type port of the terminal test device;

[0094] Obtain the port types of the device under test and the other custom external devices;

[0095] Assign the ports of the extended test equipment to the corresponding devices under test and other custom external devices;

[0096] Generate a port relationship table from the port wiring information of the test equipment;

[0097] The port allocation of the extended test equipment includes: obtaining a set of ports of different types of the extended test equipment, wherein the port types of the port sets are the same as the port types of the device under test and the other custom external devices; sorting the unoccupied ports in the corresponding port sets according to the port identification information and allocating them in sequence;

[0098] The port allocation rules include: obtaining a set of ports of the same type as the device to be connected; and allocating ports sequentially according to a specific port sorting order.

[0099] In a preferred embodiment, both the terminal test device "box" and the extended test device "hub" have three types of ports: type A (first type), type B (second type), and type C (third type). Each device has five ports of each type, labeled with their corresponding type name and serial number; for example, type A1 ports are labeled "type A1, type A2, type A3, type A4, type A5". If the extended test device is set to type A by default, labeled "hub:type A1" and connected to the terminal test device, then the type A ports of the terminal test device are sequentially assigned to the "hub:type A1" ports in each group. Optionally, if the port type of the device under test is type B, then the set of type B ports in the extended test device is obtained, and the unused ports in the set are sequentially assigned to the corresponding devices under test according to their serial numbers. The port assignment process for other custom external devices is the same as for the devices under test. The port relationship table clearly shows the connection relationships between the test devices and is an important basis for automatically generating wiring diagrams.

[0100] Preferably, the layout information calculated based on page layout rules includes:

[0101] Based on the test equipment relationship table, referencing the standard model, generate a model for the corresponding test equipment, and encode the model by comparing it with the type and grouping information of the test equipment;

[0102] Based on the page size and the size of the test tool model, the location information of the terminal test device is set;

[0103] Calculate the location information of the extended testing devices based on the number of extended testing devices and the location information of the terminal testing devices;

[0104] Using the extended test equipment as a reference position, and combining the dimensions of the device under test model and the custom test model, the position information of the test equipment in each group is calculated;

[0105] A module layout table is generated based on the model dimensions of the test equipment and the calculated position information.

[0106] In a preferred embodiment, the test tool model, the device under test (DUT) model, and the custom test model have corresponding standard models. After referencing a model, it is encoded according to the test device information. For example, the terminal test model is encoded as " / box"; the extended test model is encoded as " / hub_n", where n is the group number based on the test channel grouping; the DUT model is encoded as " / textDevice_n"; and other custom external devices, such as smart voltmeters, can be encoded as " / voltmeter_n". The location information of the test devices can be represented by coordinates. The coordinates of the extended test devices and the terminal test devices are evenly set on the page, ensuring that the models corresponding to each device are fully displayed and do not overlap, while also providing sufficient layout space for devices within each group. The coordinates of the DUT and other custom external devices are calculated based on the coordinates of the extended test devices.

[0107] Preferably, the step of generating a wiring logic table based on test equipment data and calculating the diagram information through an algorithm further includes setting a general layout template: presetting the technical parameters of commonly used test equipment and obtaining test equipment data;

[0108] Generate the corresponding wiring logic table based on the test equipment data;

[0109] Store the wiring logic table and the corresponding test equipment data, set the template name and template ID, and generate a general layout template;

[0110] The process of calling the general layout template is as follows: traverse the stored general layout templates, compare the test equipment data of the general layout template with the test equipment data of the received test command. If the two are the same, directly reference the general layout template to obtain the corresponding wiring logic table; if the two are different, proceed to the comparison of the next general layout template; if the traversal ends and no matching general layout template is found, calculate the diagram information through the algorithm to generate the wiring logic table.

[0111] In a preferred embodiment, the template for the general layout can be set according to the number of test channels that can be set. Each number of test channels corresponds to one layout template. The layout template contains the location and size information of the terminal test device and the extended test device. Preferably, based on the layout template of each test channel, information including the device under test and different custom external devices can also be set. Therefore, when generating the wiring logic table, the template set with the same number of test channels as the service is first searched in the preset general layout template. Then, the templates that match the test channels are traversed to see if the device under test and the custom external devices also match the template. If they do, the location and size information in the template can be directly called, which can generate the wiring diagram more conveniently and quickly.

[0112] Preferably, generating a test equipment wiring diagram through the mapping system includes: selecting the automatic flowchart generation function of the mapping system, customizing the style of the connection lines according to the external port information or the connection relationship between devices, rendering the wiring logic table to show the connection lines between the test equipment models, and generating a test equipment wiring diagram.

[0113] In a preferred embodiment, the diagramming service converts the wiring data of each device into a corresponding connection diagram. The diagramming service can utilize a visualization engine, currently including charting engine eCharts, 3D modeling engine Three.js, visualization engine D3.js, and visualization engine Antv / G6. Through the automatic flowchart generation function of these visualization engines, the wiring relationships between devices can be displayed more vividly and graphically. For example, if the visualization engine Antv / G6 is selected as the diagramming service, its good compatibility allows it to integrate with different testing systems. The principle is that the online diagramming method on the platform can generate wiring diagrams in real time, providing a better user experience.

[0114] In Example 1, based on testing business requirements, the preset test tool model includes three types of nodes corresponding to three types of ports, labeled as "X, Y, Z"; the terminal test model has 6, 6, and 1 types respectively, with nodes and ports labeled with the same names as "X1, X2, X3, X4, X5, X6; Y1, Y2, Y3, Y4, Y5, Y6; Z1"; the extended test model has 6, 6, and 4 types respectively, similarly labeled as "X1, X2, X3, X4, X5, X6; Y1, Y2, Y3, Y4, Y5, Y6; Z1, Z2, Z3, Z4"; among them, the terminal test model is used to indicate a production test intelligent terminal device, which can send commands to the device under test and receive signals from the device under test, and also supports... The terminal test model connects to the host computer via wired serial port, Bluetooth, or Wi-Fi to upload test signals. Here, the terminal test model is designated " / box". The extended test model indicates a multi-port device capable of connecting to production test intelligent terminal devices and other hardware resources. Based on the received test instructions, a device under test (DUT) needs to be tested, and no other custom external devices are configured. Therefore, the corresponding wiring diagram consists of a terminal test model, an extended test model, and a DUT model. The selected test channel quantity is one. By default, the "X6" port of the extended test model is connected to the terminal test model. The port type of the DUT is "X". Following the port labeling order, the "X1" port of the extended test model is assigned to the DUT. The coordinate information of each model is calculated based on the page size. A connection logic table is generated based on the above connection relationships, port allocation relationships, and coordinate information. Using a visualization engine, the corresponding test device wiring diagram for this embodiment is generated, greatly facilitating the work of testers.

[0115] Example 2: A service testing four devices. Parsing the test content and selecting four test channels reveals the need for four extended test devices and one terminal test device. This test service includes three test cases: testing the device's switching function, operating temperature, and voltage. Therefore, the command sending targets include a smart thermometer, a smart voltmeter, and the device under test (DUT). The required devices also include four smart thermometers, four smart voltmeters, and four DUTs, grouped and numbered according to the test channels. If the test channels are labeled "Channel 1," "Channel 2," "Channel 3," and "Channel 4," then the smart thermometers are correspondingly labeled "Smart Thermometer 1," "Smart Thermometer 2," "Smart Thermometer 3," and "Smart Thermometer 4," and the DUTs and smart voltmeters are labeled similarly. Pre-set DUT models and custom test models are represented by rectangles, with the device name inside indicating the device label. Assume the DUTs, smart thermometers, and smart voltmeters are all "UART" type ports. The terminal test device and extended test devices each include UART ports, IO ports, and communication port types labeled "UART," "IO_PIN," and "T," with different quantities assigned. Based on the device allocation rules, the terminal test device " / box" is connected to the extended test devices of each group. The extended test devices connect to the devices under test, smart thermometers, and smart voltmeters within the group. By default, the "uart4" port of the extended test device is connected to the terminal test device. The extended test device of the first test channel is labeled " / box:uart:1 / hub1", indicating that the extended test device "hub1" is connected to the "uart1" port of the terminal test device. Based on the port allocation rules, the port connection relationship can be calculated, and the coordinate information of each model can be further calculated to ensure that the generated wiring diagram is evenly distributed on the page and the connection lines are clearly displayed. Preferably, if there are four pre-set test channels and a general layout template containing two custom external devices, the layout information in the template is referenced after the template is retrieved to generate a wiring logic table. Through the flowchart generation function of the visualization engine, the information in the wiring logic table is rendered into a device wiring diagram, which effectively improves the work efficiency and accuracy of device testing.

[0116] An electronic device, comprising the above-described method for generating a wiring diagram of a test device, includes: a memory and one or more processors;

[0117] The memory is communicatively connected to the one or more processors, and the memory stores instructions that can be executed by the one or more processors. When the instructions are executed by the one or more processors, the electronic device is used to implement the method described in any of the above embodiments.

[0118] A computer-readable storage medium includes the above-described method for generating a wiring diagram of a test device, and stores computer-executable instructions thereon, which, when executed by a computing device, are used to implement the method described in any of the above embodiments.

[0119] A computer program product includes a method for generating a wiring diagram of a test device as described above. The computer program product includes a computer program stored on a computer-readable storage medium. The computer program includes program instructions that, when executed by a computer, are used to implement the method described in any of the above embodiments.

[0120] In summary, the method for generating wiring diagrams for test equipment according to the present invention combines the parameters of the test equipment with a pre-set test tool model, a device under test model, and a custom test model, which are directly called when generating the corresponding wiring diagram. The model also includes port information of different types of nodes corresponding to the devices, used to display the connection relationship between the ports of the devices. According to different test channels and test cases configured for business purposes, the wiring logic table is parsed and calculated according to rules, and a clear and complete wiring diagram is obtained through the diagram generation service. This expands the applicability of the method, not limited to specific equipment types or wiring methods, and is more flexible. In equipment testing, this method also reduces the technical requirements for personnel, saves personnel training costs, effectively improves test quality based on accurate wiring diagrams, and enhances the automation level of the testing work.

[0121] The aforementioned computer-readable storage media include physically volatile and non-volatile, removable and non-removable media implemented in any manner or technology for storing information such as computer-readable instructions, data structures, program modules or other data. Specifically, computer-readable storage media include, but are not limited to, USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other solid-state storage technologies, CD-ROMs, digital versatile discs (DVDs), HD-DVDs, Blu-ray or other optical storage devices, magnetic tapes, disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed by a computer.

[0122] Those skilled in the art will recognize that the units and method steps of the various examples described in conjunction with the embodiments of this application can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0123] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application.

Claims

1. A method for generating a wiring diagram for a test device, characterized in that, Includes the following steps: Based on the technical parameters of the test equipment, a standard model is pre-set. The standard model includes: test tool model, device under test model and custom test model. Receive test commands and configure test information; Parse the test information to obtain test equipment data; Based on the test equipment data, the algorithm calculates the diagram information and generates the wiring logic table; Generate wiring diagrams for test equipment using a mapping system; The technical parameters of the test equipment include the internal functional information and external port information of the equipment, which are used to design the test tool model, the device under test model and the custom test model; The test tool model includes: a terminal test model and an extended test model, which are used to indicate the terminal test equipment and the extended test equipment, respectively. The device under test model is used to indicate the device under test; The custom test model is used to instruct other custom external devices; The standard model includes the model's main information and node information; The process of generating a wiring logic table based on test equipment data and algorithmic calculation of diagram information includes: Calculate port wiring information based on port allocation rules; Calculate module layout information based on page layout rules; The layout information calculated based on page layout rules includes: Based on the test equipment relationship table, referencing the standard model, generate a model for the corresponding test equipment, and encode the model by comparing it with the type and grouping information of the test equipment; Based on the page size and the size of the test tool model, the location information of the terminal test device is set; Calculate the location information of the extended testing devices based on the number of extended testing devices and the location information of the terminal testing devices; Using the extended test equipment as a reference position, and combining the dimensions of the device under test model and the custom test model, the position information of the test equipment in each group is calculated; A module layout table is generated based on the model dimensions of the test equipment and the calculated position information.

2. The method for generating a wiring diagram for a test device as described in claim 1, characterized in that, The main information includes the external shape and internal structure; the node information includes the node type, the number of nodes, and the node distribution method; the node type and the number of nodes in the standard model correspond to the external port information of the device it indicates.

3. The method for generating a wiring diagram for a test device as described in claim 1, characterized in that, The receiving of test instructions and the configuration of test information include: Receive test service information; Analyze the number of devices under test and the content of the services to be tested; Select the test channel and configure test cases based on the analysis results; The test cases include the command sending target, the test case name, the command sending data, and the test result judgment conditions.

4. The method for generating a wiring diagram for a test device as described in claim 3, characterized in that, The process of parsing the test information and obtaining test equipment data includes: Obtain the number of test channels and the target of the command, and determine the type and quantity of the test equipment; The test equipment is grouped according to the number of test channels; Based on the equipment allocation rules, a test equipment relationship table is generated; The generation of the test equipment relationship table includes: setting the connection relationship between the terminal test equipment and the extended test equipment; and determining the connection relationship between test equipment within the group.

5. The method for generating a wiring diagram for a test device as described in claim 1, characterized in that, The calculation of port wiring information based on port allocation rules includes: Obtain the test device relationship table to determine the external port information of the test device, including port type and number of ports; Configure the first port of the extended test device to connect with the corresponding type port of the terminal test device; Obtain the port types of the device under test and the other custom external devices; Assign the ports of the extended test equipment to the corresponding devices under test and other custom external devices; Generate a port relationship table from the port wiring information of the test equipment; The port allocation of the extended test equipment includes: obtaining a set of ports of different types of the extended test equipment, wherein the port types of the port sets are the same as the port types of the device under test and the other custom external devices; sorting the unoccupied ports in the corresponding port sets according to the port identification information and allocating them in sequence; The port allocation rules include: obtaining a set of ports of the same type as the device to be connected; and allocating ports sequentially according to a specific port sorting order.

6. The method for generating a wiring diagram for a test device as described in claim 1, characterized in that, The process of generating a wiring logic table based on test equipment data and algorithmic calculation of diagram information also includes setting a general layout template: presetting the technical parameters of commonly used test equipment and obtaining test equipment data; Generate the corresponding wiring logic table based on the test equipment data; Store the wiring logic table and the corresponding test equipment data, set the template name and template ID, and generate a general layout template; The process of calling the general layout template is as follows: traverse the stored general layout templates, compare the test equipment data of the general layout template with the test equipment data of the received test command. If the two are the same, directly reference the general layout template to obtain the corresponding wiring logic table; if the two are different, proceed to the comparison of the next general layout template; if the traversal ends and no matching general layout template is found, calculate the diagram information through the algorithm to generate the wiring logic table.

7. The method for generating a wiring diagram for a test device as described in claim 1, characterized in that, Generating a test equipment wiring diagram using a mapping system includes: selecting the automatic flowchart generation function of the mapping system, customizing the style of the connection lines according to the external port information or the connection relationship between devices, rendering the wiring logic table to show the connection lines between the test equipment models, and generating a test equipment wiring diagram.

8. An electronic device, characterized in that, include: Memory and one or more processors; The memory is communicatively connected to the one or more processors, and the memory stores instructions that can be executed by the one or more processors. When the instructions are executed by the one or more processors, the electronic device is used to implement the method as described in any one of claims 1-7.

9. A computer-readable storage medium having stored thereon computer-executable instructions which, when executed by a computing device, can be used to implement the method as claimed in any one of claims 1-7.

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