A self-test method and apparatus for noise of an integrated hall sensor chip

Abstract

The present application relates to the technical field of Hall sensor, and especially relates to a self-test method of noise of integrated Hall sensor chip, which comprises the following steps: obtaining a plurality of Hall signal period values of Hall elements of the integrated Hall sensor chip after controlling a motor of the integrated Hall sensor chip to stop outputting, wherein the Hall signal period value refers to the difference between a first target value and a second target value of the Hall signal in a cycle period; obtaining a noise value of the Hall signal according to the plurality of Hall signal period values; and determining a noise hysteresis value of the Hall signal according to the noise value. The method can measure the noise of the integrated Hall sensor chip, accurately determine the noise interference, improve the accuracy of noise measurement, and set the hysteresis value of the chip to be smaller, so that the motor with the chip can normally operate under smaller magnetic field change.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of Hall sensor, in particular to a self-test method and device for noise of integrated Hall sensor chip. BACKGROUND

[0002] Nowadays, integrated Hall sensor chip has a wide range of applications because Hall sensor can recognize various data by using Hall effect, and can be used to detect temperature, pressure, position, flow and other data. The output impedance of integrated Hall sensor chip is mostly high, which leads to serious attenuation of the output signal, and the output signal of the chip is easily overwhelmed by noise signal. Therefore, the existence of noise affects the accuracy and resolution of the integrated Hall sensor chip.

[0003] For noise measurement of integrated Hall sensor chip, external separation instrument is generally used for measurement to indirectly estimate the noise level integrated in the chip. The existing noise measurement method of integrated Hall sensor chip has the problem of low accuracy of noise interference measurement. SUMMARY

[0004] The self-test method and device for noise of integrated Hall sensor chip provided by the embodiments of the present application solve the technical problem of low accuracy of noise interference measurement in the prior art integrated Hall sensor chip, realize integrated measurement of noise of integrated Hall sensor chip, accurately measure noise interference, improve the accuracy of noise measurement, and also set a smaller hysteresis value of the chip, so that the motor with the chip can normally operate under smaller magnetic field changes and other technical effects.

[0005] In a first aspect, the embodiments of the present application provide a self-test method for noise of integrated Hall sensor chip, comprising:

[0006] After controlling the motor of the integrated Hall sensor chip to stop output, a plurality of Hall signal period values of the Hall element of the integrated Hall sensor chip are obtained, wherein the Hall signal period value refers to the difference between the first target value and the second target value of the Hall signal in one cycle period;

[0007] According to the plurality of Hall signal period values, a noise value of the Hall signal is obtained;

[0008] According to the noise value, a noise hysteresis value of the Hall signal is determined.

[0009] Preferably, the plurality of Hall signal period values of the Hall element of the integrated Hall sensor chip are obtained by:

[0010] For each of the plurality of Hall signal period values, a first target value and a second target value are obtained in a process of gradually increasing a bias parameter of a chopping amplifier circuit of the integrated Hall sensor chip from a first target bias parameter and a process of gradually decreasing the bias parameter from a second target bias parameter, wherein the second target bias parameter is greater than the first target bias parameter, and the bias parameter includes a bias voltage or a bias current;

[0011] The Hall signal period value is obtained according to the first target value and the second target value.

[0012] After the above operation is performed on each of the plurality of Hall signal period values, the plurality of Hall signal period values are obtained.

[0013] Preferably, the first target value is obtained by:

[0014] In the process of gradually increasing the bias parameter from the first target bias parameter, the bias parameter corresponding to the falling edge of the Hall signal is obtained, and the bias parameter corresponding to the falling edge of the Hall signal is determined as the first target value.

[0015] Preferably, the second target value is obtained by:

[0016] In the process of gradually decreasing the bias parameter from the second target bias parameter, the bias parameter corresponding to the rising edge of the Hall signal is obtained, and the bias parameter corresponding to the rising edge of the Hall signal is determined as the second target value.

[0017] Preferably, the noise value of the Hall signal is obtained according to the plurality of Hall signal period values, including:

[0018] The plurality of Hall signal period values are processed by variance analysis method or mean range method to obtain the noise value.

[0019] Preferably, the noise hysteresis value of the Hall signal is determined according to the noise value, including:

[0020] The noise value is added to the first historical output voltage of the Hall signal to obtain a first target flip voltage, wherein the noise hysteresis value includes the first target flip voltage.

[0021] Preferably, the noise hysteresis value of the Hall signal is determined according to the noise value, including:

[0022] The noise value is subtracted from the second historical output voltage of the Hall signal to obtain a second target flip voltage, wherein the noise hysteresis value includes the second target flip voltage, and the second target flip voltage is less than the first target flip voltage.

[0023] Based on the same inventive concept, in a second aspect, the present application provides a self-test device for noise of an integrated Hall sensor chip, comprising:

[0024] a first obtaining module, configured to obtain a plurality of Hall signal period values of a Hall element of the integrated Hall sensor chip after controlling a motor of the integrated Hall sensor chip to stop outputting, wherein the Hall signal period value refers to a difference between a first target value and a second target value of a Hall signal in a cycle period;

[0025] a second obtaining module, configured to obtain a noise value of the Hall signal according to the plurality of Hall signal period values;

[0026] a determining module, configured to determine a noise hysteresis value of the Hall signal according to the noise value.

[0027] Based on the same inventive concept, in a third aspect, the present application provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the self-test method for noise of an integrated Hall sensor chip when executing the program.

[0028] Based on the same inventive concept, in a fourth aspect, the present application provides a computer readable storage medium, wherein the computer readable storage medium stores a computer program, and the program implements the steps of the self-test method for noise of an integrated Hall sensor chip when executed by a processor.

[0029] The one or more technical solutions in the embodiments of the present application have at least the following technical effects or advantages:

[0030] In the embodiments of the present application, after controlling a motor of an integrated Hall sensor chip to stop outputting, a plurality of Hall signal period values of a Hall element of the integrated Hall sensor chip are obtained. The Hall signal period value refers to a difference between a first target value and a second target value of a Hall signal in a cycle period. Here, after the motor stops outputting, the magnetic field in the environment where the integrated Hall sensor chip is located is fixed and unchangeable, the bias parameter of the chopper amplification circuit is controlled to periodically change between a first target bias parameter and a second target bias parameter, the Hall element of the integrated Hall sensor chip is integrated and measured, and a plurality of Hall signal period values are detected to accurately measure noise interference and improve the accuracy of noise measurement.

[0031] Then, according to the plurality of Hall signal period values, a noise value of the Hall signal is obtained, and then, according to the noise value, a noise hysteresis value of the Hall signal is determined. Here, according to the noise value of the Hall signal, the noise hysteresis value of the Hall signal is determined, that is, the hysteresis value of the integrated Hall sensor chip is determined, so as to accurately determine the noise hysteresis value. Therefore, the hysteresis value of the integrated Hall sensor chip can be set smaller, and the motor with the chip can normally operate under smaller magnetic field changes. BRIEF DESCRIPTION OF DRAWINGS

[0032] Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The accompanying drawings are included to provide a description of preferred embodiments and are not intended to limit the scope of the application. Furthermore, the same reference numerals in different drawings denote the same or similar components. In the drawings:

[0033] Figure 1 A step flow diagram of the self-test method of the noise of the integrated Hall sensor chip in the embodiment of the application is shown;

[0034] Figure 2 A module diagram of the test system of the integrated Hall sensor chip in the embodiment of the application is shown;

[0035] Figure 3 A module diagram of the self-test device of the noise of the integrated Hall sensor chip in the embodiment of the application is shown. DETAILED DESCRIPTION

[0036] Exemplary embodiments of the present disclosure will be described in greater detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that the present disclosure can be more thoroughly understood and the scope of the present disclosure can be accurately conveyed to those skilled in the art.

[0037] Embodiment One

[0038] The first embodiment of the present application provides a self-test method of the noise of an integrated Hall sensor chip, as shown in Figure 1 The self-test method of the noise of the integrated Hall sensor chip comprises the following steps:

[0039] S101, after stopping the output of the motor controlled by the integrated Hall sensor chip, obtaining a plurality of Hall signal period values of the Hall element of the integrated Hall sensor chip, wherein the Hall signal period value refers to the difference between the first target value and the second target value of the Hall signal in one cycle period;

[0040] S102, obtaining a noise value of the Hall signal according to the plurality of Hall signal period values;

[0041] S103, determining the noise hysteresis value of the Hall signal according to the noise value.

[0042] The self-test method of noise of the integrated Hall sensor chip in the embodiment is applied to a test system of the chip, as shown in the figure. Figure 2 The test system includes a noise control unit 201, a Hall element 203, a chopping amplifier circuit 202 and a digital-to-analog converter 204. The integrated Hall sensor chip includes the Hall element 203 and the chopping amplifier circuit 202. The Hall element 203 is connected to the noise control unit 201 through the chopping amplifier circuit 202, and the noise control unit 201 is connected to the chopping amplifier circuit 202 through the digital-to-analog converter. The digital-to-analog converter is used to input a bias voltage or a bias current to the chopping amplifier circuit 202 according to the control command of the noise control unit 201. The bias voltage is a reference voltage for comparison with the Hall signal, and is used to measure the upper and lower limits of the Hall signal. The bias current is a reference current for comparison with the Hall signal.

[0043] Next, the specific implementation steps of the self-test method of noise of the integrated Hall sensor chip provided in the embodiment will be described in detail in combination with Figure 1 and Figure 2

[0044] First, step S101 is performed. After the motor controlled by the integrated Hall sensor chip is stopped from outputting, a plurality of Hall signal period values of the Hall element 203 of the integrated Hall sensor chip are obtained, wherein the Hall signal period value refers to the difference between the first target value and the second target value of the Hall signal in one cycle.

[0045] Specifically, the integrated Hall sensor chip and the motor are an integral whole, and the motor needs to be controlled to stop outputting first. After the motor stops outputting, the magnetic field in the environment where the integrated Hall sensor chip is located is fixed and unchangeable, and under this condition, the ideal Hall signal is unchangeable. Due to the influence of factors such as device noise, circuit noise and test environment noise of the motor, the actual Hall signal fluctuates within a certain range.

[0046] ​After the motor is controlled to stop output, the process of obtaining the plurality of Hall signal period values is that, for each of the plurality of Hall signal period values, the Hall signal will be flipped in the process of gradually increasing the bias parameter of the chopper amplification circuit 202 from the first target bias parameter and gradually decreasing from the second target bias parameter, and the first target value and the second target value are obtained according to the flipping of the Hall signal. The bias parameter includes a bias voltage or a bias current, and the first target bias parameter and the second target bias parameter can be set according to actual needs, and the second target bias parameter is greater than the first target bias parameter. The Hall signal period value is obtained according to the first target value and the second target value.

[0047] After the above operation is performed on each Hall signal period value, the plurality of Hall signal period values are obtained.

[0048] Specifically, taking obtaining one Hall signal period value as an object, the noise control unit 201 controls the bias parameter of the chopper amplification circuit 202 through the digital-to-analog converter. In the process of gradually changing the bias parameter from the first target bias parameter to the second target bias parameter, the output parameter of the Hall signal is essentially unchanged. As the bias parameter gradually increases, the gap between the output parameter of the Hall signal and the bias parameter gradually decreases, the bias parameter gradually approaches the lower edge of the Hall signal, and the Hall signal will flip at the lower edge. At this time, the bias parameter corresponding to the flipping of the Hall signal is determined as the first target value, and the first target value is obtained. The output parameter corresponds to the bias parameter. For example, if the bias parameter is a bias voltage, the output parameter is the output voltage of the Hall signal, and if the bias parameter is a bias current, the output parameter is the output current of the Hall signal.

[0049] Then, in the process of gradually changing the bias parameter from the second target bias parameter to the first target bias parameter, as the bias parameter gradually decreases, the gap between the output parameter of the Hall signal and the bias parameter gradually decreases, the bias parameter gradually approaches the upper edge of the Hall signal, and the Hall signal will flip at the upper edge. At this time, the bias parameter corresponding to the flipping of the Hall signal is determined as the second target value, and the second target value is obtained.

[0050] Then, the first target value and the second target value are subtracted to obtain one Hall signal period value. The period of the Hall signal represents the alternating change process of gradually increasing the control bias parameter from the first target bias parameter and gradually decreasing from the second target bias parameter, that is, the process of gradually increasing the control bias parameter from the first target bias parameter first, determining the bias parameter corresponding to the flipping of the Hall signal at the lower edge, and then gradually decreasing the control bias parameter from the second target bias parameter.

[0051] For example, assume that the first target bias parameter of the chopper amplification circuit 202 is 0 mV and the second target bias parameter is 4 mV. During the process of gradually increasing the bias voltage of the chopper amplification circuit 202 from 0 mV, the bias voltage first starts to bias low, and the Hall signal is higher than the bias voltage, indicating that the output of the Hall signal is high. As the bias voltage gradually increases, the gap between the output voltage of the Hall signal and the bias voltage gradually decreases, and the bias voltage gradually approaches the noise lower edge of the Hall signal, until the Hall signal flips, at which time the obtained bias voltage is V L . V L is determined as the first target value. Then, during the process of gradually decreasing the bias voltage of the chopper amplification circuit 202 from 4 mV, the bias voltage first starts to bias high, and the Hall signal is lower than the bias voltage, i.e., the output of the Hall signal is low. As the bias voltage gradually decreases, the gap between the output voltage of the Hall signal and the bias voltage gradually decreases, and the bias voltage gradually approaches the noise upper edge of the Hall signal, until the Hall signal flips, at which time the obtained bias voltage is V H . V H is determined as the second target value. The first target value and the second target value are subtracted to obtain a Hall signal period value, i.e., 2 x V noise . H -V L .

[0052] Continue the process of gradually increasing the bias parameter of the chopper amplification circuit 202 of the integrated Hall sensor chip from the first target bias parameter and gradually decreasing from the second target bias parameter, and obtain multiple Hall signal period values, i.e., multiple 2 x V noise . Among them, the number of Hall signal period values can be set according to actual needs, such as obtaining 100 Hall signal period values. If the number of Hall signal period values is determined as N, then the period of the Hall signal is N, and N is an integer greater than 1.

[0053] In this embodiment, after the motor stops outputting, the magnetic field in the environment where the integrated Hall sensor chip (especially the Hall element) is located is fixed. Due to the influence of factors such as device noise, circuit noise and test environment noise of the motor, under the condition that the magnetic field in the environment where the integrated Hall sensor chip is located is fixed, the bias parameter of the chopper amplification circuit 202 is periodically changed between the first target bias parameter and the second target bias parameter, and multiple Hall signal period values are detected. Therefore, the integrated measurement of the chip of the integrated Hall sensor (especially the Hall element) in this embodiment can accurately measure the noise interference and improve the accuracy of noise measurement.

[0054] Then, step S102 is performed to obtain the noise value of the Hall signal according to the multiple Hall signal period values.

[0055] Specifically, the multiple Hall signal period values are processed by a variance analysis method or a mean range method to obtain noise values V N to obtain an accurate noise degree and guarantee the accuracy of noise measurement. The confidence condition of the variance analysis method or the mean range method is set according to actual requirements.

[0056] Then, step S103 is performed to determine the noise hysteresis value of the Hall signal according to the noise value.

[0057] Specifically, the noise value V N is subtracted from the second historical output voltage V turn1 of the Hall signal to obtain the second target flip voltage V T1 , that is, V T1 = V turn1 -V N . The noise value V N is added to the first historical output voltage V turn2 of the Hall signal to obtain the first target flip voltage V T2 , that is, V T2 = V turn2 + V N . The first historical output voltage is the maximum output voltage of the historical Hall signal, and the second output voltage is the minimum output voltage of the historical Hall signal. The historical Hall signal is the Hall signal detected before the noise of the integrated Hall sensor chip is measured. The noise hysteresis value includes the first target flip voltage and the second target flip voltage, the second target flip voltage is smaller than the first target flip voltage, the first target flip voltage is the voltage of the Hall signal when the upper edge flips, and the second target flip voltage is the voltage of the Hall signal when the lower edge flips. The Hall signal is subsequently controlled to run between the first target flip voltage and the second target flip voltage.

[0058] In this embodiment, the noise hysteresis value of the Hall signal is determined according to the noise value of the Hall signal, that is, the hysteresis value of the integrated Hall sensor chip is determined, so that the noise hysteresis value is accurately determined. Therefore, the hysteresis value of the integrated Hall sensor chip can be set smaller, the motor with the chip can normally operate under a magnetic induction intensity of 1 mT or less, and the recognition accuracy of the magnetic induction intensity can be improved.

[0059] The one or more technical solutions in the embodiments of the present application have at least the following technical effects or advantages:

[0060] In the embodiment, after the motor controlling the integrated Hall sensor chip stops outputting, a plurality of Hall signal period values of the Hall signal of the integrated Hall sensor chip are acquired. The Hall signal period value refers to a difference between a first target value and a second target value of the Hall signal in a cycle period. Here, after the motor stops outputting, the magnetic field in the environment where the integrated Hall sensor chip is located is fixed, the bias parameter of the chopper amplification circuit is controlled to periodically change between a first target bias parameter and a second target bias parameter, the integrated Hall sensor chip is measured, and the plurality of Hall signal period values are detected to accurately measure the noise interference and improve the accuracy of noise measurement.

[0061] Then, the noise value of the Hall signal is obtained according to the plurality of Hall signal period values, and then the noise hysteresis value of the Hall signal is determined according to the noise value. Here, the noise hysteresis value of the Hall signal is determined according to the noise value of the Hall signal, that is, the hysteresis value of the integrated Hall sensor chip is determined to accurately determine the noise hysteresis value. Therefore, the hysteresis value of the integrated Hall sensor chip can be set smaller, and the motor with the chip can normally operate under smaller magnetic field changes.

[0062] Embodiment two

[0063] Based on the same inventive concept, the second embodiment of the present application also provides a self-test device for noise of an integrated Hall sensor chip, as shown in Figure 3 The self-test device comprises:

[0064] The first acquisition module 301 is configured to acquire a plurality of Hall signal period values of a Hall element of the integrated Hall sensor chip after a motor controlling the integrated Hall sensor chip stops outputting, wherein the Hall signal period value refers to a difference between a first target value and a second target value of the Hall signal in a cycle period.

[0065] The second acquisition module 302 is configured to obtain a noise value of the Hall signal according to the plurality of Hall signal period values.

[0066] The determination module 303 is configured to determine a noise hysteresis value of the Hall signal according to the noise value.

[0067] As an optional embodiment, the first acquisition module 301 is configured to acquire the plurality of Hall signal period values of the Hall element of the integrated Hall sensor chip, and the first acquisition module 301 comprises:

[0068] For each of the plurality of Hall signal period values, a first target value and a second target value are obtained in a process of gradually increasing a bias parameter of a chopping amplifier circuit of the integrated Hall sensor chip from a first target bias parameter and in a process of gradually decreasing the bias parameter from a second target bias parameter, wherein the second target bias parameter is greater than the first target bias parameter, and the bias parameter includes a bias voltage or a bias current;

[0069] The Hall signal period value is obtained according to the first target value and the second target value.

[0070] After the above operation is performed on each of the plurality of Hall signal period values, the plurality of Hall signal period values are obtained.

[0071] As an optional embodiment, the first target value is obtained by:

[0072] In the process of gradually increasing the bias parameter from the first target bias parameter, a bias parameter corresponding to a falling edge of the Hall signal is obtained, and the bias parameter corresponding to the falling edge of the Hall signal is determined as the first target value.

[0073] As an optional embodiment, the second target value is obtained by:

[0074] In the process of gradually decreasing the bias parameter from the second target bias parameter, a bias parameter corresponding to a rising edge of the Hall signal is obtained, and the bias parameter corresponding to the rising edge of the Hall signal is determined as the second target value.

[0075] As an optional embodiment, the second obtaining module 302 is configured to obtain the noise value of the Hall signal according to the plurality of Hall signal period values, including:

[0076] The plurality of Hall signal period values are processed by a variance analysis method or a mean range method to obtain the noise value.

[0077] As an optional embodiment, the determining module 303 is configured to determine the noise hysteresis value of the Hall signal according to the noise value, including:

[0078] The noise value is calculated with a first historical output voltage of the Hall signal to obtain a first target flip voltage, and the noise hysteresis value includes the first target flip voltage.

[0079] As an optional embodiment, the determining module 303 is configured to determine the noise hysteresis value of the Hall signal according to the noise value, including:

[0080] The noise value is subtracted from a second historical output voltage of the Hall signal to obtain a second target flipping voltage, wherein the noise hysteresis value comprises the second target flipping voltage, and the second target flipping voltage is less than the first target flipping voltage.

[0081] Since the self-test device for noise of the integrated Hall sensor chip in the embodiment is a device used in the self-test method for noise of the integrated Hall sensor chip in Embodiment One of the present application, the specific implementation of the self-test device for noise of the integrated Hall sensor chip in the embodiment and its various variations can be understood by those skilled in the art based on the self-test method for noise of the integrated Hall sensor chip in Embodiment One of the present application. Therefore, how the self-test device for noise of the integrated Hall sensor chip realizes the method in Embodiment One of the present application will not be described in detail here. As long as those skilled in the art use the device in the self-test method for noise of the integrated Hall sensor chip in Embodiment One of the present application, it falls within the scope of the present application.

[0082] Embodiment Three

[0083] Based on the same inventive concept, the third embodiment of the present application further provides a computer device, which comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps of any one of the self-test methods for noise of the integrated Hall sensor chip when executing the program.

[0084] Embodiment Four

[0085] Based on the same inventive concept, the fourth embodiment of the present application further provides a computer readable storage medium, which stores a computer program, and the program implements the steps of any one of the self-test methods for noise of the integrated Hall sensor chip when executed by a processor.

[0086] Those skilled in the art should understand that the embodiments of the present application can be provided as a method, a system, or a computer program product. Therefore, the present application can be in the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, the present application can be in the form of a computer program product implemented on one or more computer usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer usable program code.

[0087] The present application is described in reference to the flowchart illustrations and / or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more flowcharts and / or blocks Figure 1 one or more flowcharts and / or blocks

[0088] These computer program instructions can also be stored in a computer- readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instructions which implement the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more flowcharts and / or blocks Figure 1 one or more flowcharts and / or blocks

[0089] These computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the flowchart illustrations and / or block diagrams block or blocks. Figure 1 one or more flowcharts and / or blocks Figure 1 one or more flowcharts and / or blocks

[0090] While preferred embodiments of the application have been described, it should be apparent that additional changes and modifications can be made to the embodiments without departing from the spirit and scope of the application. It is the intention, therefore, to include by the appended claims any such modifications and variations as fall within the scope of the application. It is to be understood that the above description is intended to be illustrative, and not restrictive. Many other embodiments will be apparent to those of skill in the art upon reviewing the above description. The scope of the application should, therefore, be determined not with reference to the above description, but instead with reference to the appended claims, along with their full scope of equivalents.

[0091] Obviously, many modifications and variations of the present application are possible in light of the above teachings. It is, therefore, to be understood that within the scope of the appended claims and their equivalents, the application can be practiced otherwise than as specifically described.

Claims

1. A self-test method of noise of an integrated Hall sensor chip, characterized by, The method comprises the following steps: After controlling the motor stop output of the integrated Hall sensor chip, a plurality of Hall signal period values of a Hall element of the integrated Hall sensor chip are obtained, wherein the Hall signal period value refers to a difference between a first target value and a second target value of a Hall signal in a cycle period, and the method comprises the following steps: For each Hall signal period value in the plurality of Hall signal period values, a first target value and a second target value are obtained in a process of gradually increasing a bias parameter of a chopper amplification circuit of the integrated Hall sensor chip from a first target bias parameter and a process of gradually decreasing the bias parameter from a second target bias parameter, wherein the second target bias parameter is greater than the first target bias parameter, and the bias parameter comprises a bias voltage or a bias current; According to the first target value and the second target value, the Hall signal period value is obtained; After the above operation is performed on each Hall signal period value, the plurality of Hall signal period values are obtained; The first target value is obtained by the following steps: In the process of gradually increasing the bias parameter from the first target bias parameter, a bias parameter corresponding to a falling edge flip of the Hall signal is obtained, and the bias parameter corresponding to the falling edge flip of the Hall signal is determined as the first target value; The second target value is obtained by the following steps: In the process of gradually decreasing the bias parameter from the second target bias parameter, a bias parameter corresponding to a rising edge flip of the Hall signal is obtained, and the bias parameter corresponding to the rising edge flip of the Hall signal is determined as the second target value; According to the plurality of Hall signal period values, a noise value of the Hall signal is obtained; According to the noise value, a noise hysteresis value of the Hall signal is determined by the following steps: The noise value and a first historical output voltage of the Hall signal are added to obtain a first target flip voltage, wherein the noise hysteresis value comprises the first target flip voltage; The noise value and a second historical output voltage of the Hall signal are subtracted to obtain a second target flip voltage, wherein the noise hysteresis value comprises the second target flip voltage, the second target flip voltage is less than the first target flip voltage, the first historical output voltage is a maximum output voltage of a historical Hall signal, the second historical output voltage is a minimum output voltage of the historical Hall signal, and the historical Hall signal is a Hall signal detected before the noise of the integrated Hall sensor chip is measured.

2. The method of claim 1, wherein, The noise value of the Hall signal is obtained according to the plurality of Hall signal period values by the following steps: The plurality of Hall signal period values are processed by a variance analysis method or a mean extreme difference method to obtain the noise value.

3. A self-test device for noise of an integrated Hall sensor chip, characterized in that The device comprises an integrated Hall sensor chip noise self-test method according to any one of claims 1-2, and the device comprises: A first obtaining module is configured to obtain a plurality of Hall signal period values of a Hall element of an integrated Hall sensor chip after controlling a motor stop output of the integrated Hall sensor chip, wherein the Hall signal period value refers to a difference between a first target value and a second target value of a Hall signal in a cycle period. A second obtaining module, configured to obtain a noise value of the Hall signal according to the plurality of Hall signal period values; A determining module, configured to determine a noise hysteresis value of the Hall signal according to the noise value.

4. A computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, The processor executes the program to implement the method steps in any one of claims 1-2.

5. A computer-readable storage medium having stored thereon a computer program, characterized in that, The program is executed by the processor to implement the method steps in any one of claims 1-2. The program is executed by the processor to implement the method steps in any one of claims 1-2.

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