Method for Rapidly Measuring Grain Orientation of Finished Oriented Silicon Steel Products

Abstract

This application discloses a method for rapidly measuring the grain orientation of finished oriented silicon steel products. The method comprises: treating the surface of the finished oriented silicon steel product to obtain a bright and smooth metal matrix, and obtaining a scanned photograph of the grains in the metal matrix using a scanner; setting the scanned photograph to grayscale mode to determine the average grayscale value of the grains, and based on the average grayscale value, determining the angle between the {110} crystal plane of the grain and the rolling plane to determine the crystal plane Miller index of the grain; observing the magnetic domains of the grains using the powder texture method to obtain the angle between the magnetic domain wall of the grain and the rolling direction; and determining the grain Miller index based on the crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, thereby achieving rapid measurement of the grain orientation of the finished oriented silicon steel product. The technical solution provided by this application can achieve rapid measurement of the grain orientation of finished oriented silicon steel products.

Description

Technical Field

[0001] The present application belongs to the technical field of grain orientation measurement of oriented silicon steel, and in particular relates to a method for rapidly measuring the grain orientation of finished oriented silicon steel products. Background Art

[0002] Currently, direct EBSD analysis, X-ray diffraction analysis, or the etching pit method are used to measure the crystal orientation of oriented silicon steel grains. However, due to the large grain size, the measurement process is complex, the work efficiency is low, and the measurement cost is high. Therefore, a method that can quickly measure the grain orientation of finished oriented silicon steel products is needed. Summary of the Invention

[0003] The embodiments of the present application provide a method for rapidly measuring the grain orientation of a finished product of oriented silicon steel, which can rapidly measure the grain orientation of the finished product of oriented silicon steel and solve the problems of a complex measurement process, low work efficiency, and high measurement cost.

[0004] Other features and advantages of the present application will become apparent from the following detailed description, or may be learned in part by practice of the present application.

[0005] According to a first aspect of an embodiment of the present application, a method for rapidly measuring the grain orientation of a finished product of oriented silicon steel is provided, characterized in that the method comprises: obtaining a bright and smooth metal matrix by processing the surface of the finished product of oriented silicon steel, and obtaining a scanned photograph of the grains in the metal matrix by a scanner; determining an average grayscale value of the grains by setting the scanned photograph to a grayscale mode, and determining the angle between the {110} crystal plane of the grains and the rolling plane based on the average grayscale value to determine the crystal plane Miller index of the grains; observing the magnetic domains of the grains by a powder pattern method to obtain the angle between the magnetic domain wall of the grains and the rolling direction; determining the grain Miller index based on the crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, thereby realizing rapid measurement of the grain orientation of the finished product of oriented silicon steel.

[0006] In some embodiments of the present application, based on the aforementioned scheme, the surface of the oriented silicon steel product is treated to obtain a bright and smooth metal matrix, including: immersing the oriented silicon steel product in a hydrochloric acid aqueous solution with a mass concentration of 10% to 40%, and the immersion time is greater than 3 minutes, and the temperature of the hydrochloric acid aqueous solution is 40°C to 70°C; after the corrosion of the oriented silicon steel product is completed, it is washed 1 to 2 times with a sodium carbonate aqueous solution with a mass concentration of 10% to 30%, deionized water, and anhydrous ethanol in sequence, and blown dry with cold air to obtain a bright and smooth metal matrix.

[0007] In some embodiments of the present application, based on the aforementioned scheme, determining the average grayscale value of the grain by setting the scanned photo to grayscale mode includes: obtaining the grayscale value corresponding to the grain by setting the scanned photo to grayscale mode, thereby determining the average grayscale value of the grain, wherein the area of ​​the grain used to calculate the average grayscale value is greater than or equal to one third of the total area of ​​the grain.

[0008] In some embodiments of the present application, based on the aforementioned scheme, determining the angle between the {110} crystal plane of the grain and the rolled surface according to the average grayscale value to determine the crystal plane Miller index of the grain includes: determining the angle between the {110} crystal plane of the grain and the rolled surface according to the average grayscale value; determining the crystal plane Miller index of the grain according to the angle between the {110} crystal plane of the grain and the rolled surface, and the type of texture in the oriented silicon steel product.

[0009] In some embodiments of the present application, based on the aforementioned solution, the texture types in the oriented silicon steel product include {110} to {210} plane textures.

[0010] In some embodiments of the present application, based on the aforementioned scheme, the magnetic domains of the grains are observed by the powder texture method to obtain the angle between the magnetic domain wall of the grains and the rolling direction, including: when the magnetic field intensity is greater than or equal to 0.3mT, a magnetic domain observation liquid is dropped to a specified position of the grain, and the magnetic domains of the grains are observed and photographed after 30s to 60s, thereby observing the magnetic domains of the grains by the powder texture method to obtain the angle between the magnetic domain wall of the grains and the rolling direction.

[0011] In some embodiments of the present application, based on the aforementioned scheme, the magnetic domain observation liquid is a water-based Fe3O4 suspension, wherein the particle size of the Fe3O4 suspension is 5μm to 50μm, and the concentration of the Fe3O4 suspension is 1mg / L to 10mg / L.

[0012] In some embodiments of the present application, based on the aforementioned scheme, the method includes: before using the magnetic domain observation liquid, it is necessary to stir the magnetic domain observation liquid with a magnetic stirrer at a stirring rate of 10 r / min to 50 r / min.

[0013] In some embodiments of the present application, based on the aforementioned scheme, before observing the magnetic domains of the grains, the method further includes: covering the surface of the metal substrate with a flat plastic film made of polypropylene, and fixing the plastic film on the metal substrate, wherein the thickness of the plastic film is less than or equal to 0.03 mm, and the area of ​​the plastic film is larger than the area of ​​the area to be observed.

[0014] In some embodiments of the present application, based on the aforementioned scheme, before measuring the orientation of the grains, the method also includes: selecting grains with a width greater than or equal to 5 mm, a length greater than or equal to 5 mm, and an area equivalent circle diameter greater than or equal to 1 mm to measure the orientation of the grains.

[0015] The beneficial effects of this application are as follows: During the implementation of this application, a bright and smooth metal matrix is ​​obtained by treating the surface of a finished oriented silicon steel product, and a scanned photograph of the crystal grains in the metal matrix is ​​obtained using a scanner. By setting the scanned photograph to grayscale mode, the average grayscale value of the crystal grains is determined. Based on the average grayscale value, the angle between the {110} crystal plane of the crystal grain and the rolled surface is determined to determine the crystal plane Miller index of the crystal grain.

[0016] Since the Miller index of the grain needs to be determined by the Miller index of the crystal plane and the <001> The angle between the crystal direction and the rolling direction is obtained. <001> The crystal orientation is difficult to measure, and the direction of the magnetic domain wall of the grain is parallel to the grain. <001> Therefore, the orientation of the grains can be determined by observing the direction of the magnetic domain walls. <001> The magnetic domain of the grain is observed by the powder texture method to obtain the angle between the magnetic domain wall of the grain and the rolling direction, thereby obtaining the direction of the grain. <001> The angle between the crystal orientation and the rolling direction. Based on the obtained crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, the grain Miller index can be determined, thereby achieving rapid measurement of the grain orientation of the finished oriented silicon steel product.

[0017] Based on this, the method for quickly measuring the grain orientation of finished oriented silicon steel products proposed in this application can quickly measure the grain orientation of finished oriented silicon steel products. It can also solve the problems of complex measurement process, low work efficiency, and high measurement cost. At the same time, for oriented silicon steel, it is possible to quickly and accurately obtain the angle between the {110} crystal plane of the grain and the rolled surface, as well as the <001> The angle between the crystal direction and the rolling direction has important guiding significance for product texture control and performance optimization.

[0018] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The accompanying drawings are incorporated into and constitute a part of the specification, illustrating embodiments consistent with the present application and, together with the specification, serving to explain the principles of the present application. It is obvious that the drawings described below are merely some embodiments of the present application, and a person of ordinary skill in the art can derive other drawings based on these drawings without inventive effort. In the drawings:

[0020] Figure 1A flow chart showing a method for rapidly measuring grain orientation of finished oriented silicon steel products in an embodiment of the present application is shown;

[0021] Figure 2 A graph showing the relationship between the angle between the {110} crystal plane and the rolled surface of the grain and the grayscale value of the image in the embodiment of the present application is shown;

[0022] Figure 3 A comparison diagram of grayscale values ​​and texture types in an embodiment of the present application is shown;

[0023] Figure 4 The figure shows the observation results of the grain magnetic domains in the embodiment of the present application. DETAILED DESCRIPTION

[0024] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0025] In addition, described feature, structure or characteristic can be combined in one or more embodiments in any suitable manner.In the following description, many specific details are provided so as to provide a full understanding of the embodiments of the present application. However, it will be appreciated by those skilled in the art that the technical scheme of the present application can be put into practice without one or more of the specific details, or other methods, components, devices, steps etc. can be adopted. In other cases, known methods, devices, implementations or operations are not shown or described in detail to avoid blurring the various aspects of the application.

[0026] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically separate entities. That is, these functional entities may be implemented in software, in one or more hardware modules or integrated circuits, or in different networks and / or processor devices and / or microcontroller devices.

[0027] The flowcharts shown in the accompanying drawings are for illustrative purposes only and do not necessarily include all contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps may be decomposed, while others may be combined or partially combined. Therefore, the actual execution order may vary depending on the actual situation.

[0028] The following is a detailed description of this application:

[0029] Figure 1 The flowchart of the method for quickly measuring the grain orientation of the finished product of oriented silicon steel in the embodiment of the present application is shown. Figure 1 As shown, the method for rapidly measuring the grain orientation of a finished product of oriented silicon steel includes at least steps 110 to 170, which are described in detail as follows:

[0030] In step 110, a bright and smooth metal matrix is ​​obtained by processing the surface of the oriented silicon steel product, and a scanning photograph of the grains in the metal matrix is ​​obtained by a scanner.

[0031] In this application, to clearly observe the grains and obtain their grayscale values, the surface of the finished oriented silicon steel product needs to be etched and cleaned. After etching and cleaning, a bright and smooth metal matrix can be obtained. At the same time, the grains on the metal matrix can be serially numbered to facilitate comparison and differentiation between grains.

[0032] Furthermore, in some embodiments of the present application, determining the average grayscale value of the grain by setting the scanned photo to grayscale mode includes: obtaining the grayscale value corresponding to the grain by setting the scanned photo to grayscale mode, thereby determining the average grayscale value of the grain, wherein the area of ​​the grain used to calculate the average grayscale value is greater than or equal to one third of the total area of ​​the grain.

[0033] Continue to refer to Figure 1 In step 130, the average grayscale value of the grain is determined by setting the scanned photo to grayscale mode, and the angle between the {110} crystal plane of the grain and the rolled surface is determined based on the average grayscale value to determine the crystal plane Miller index of the grain.

[0034] In this application, reference is made to Figure 2 , shows the relationship between the angle between the {110} crystal plane and the rolled surface of the grain in the embodiment of the present application and the image grayscale value. Figure 2 As shown in the figure, the angle between the {110} plane of the grain and the rolled surface has a good linear relationship with the image grayscale value. Furthermore, due to the different atomic densities and arrangements of different crystal planes, different crystal planes have different reflectivity. Therefore, the grayscale value of the scanning image can reflect the reflective state and thus determine the texture type of the crystal plane.

[0035] Specifically, refer to Figure 3 , shows a comparison diagram of grayscale value and texture type in the embodiment of the present application. Figure 3 As can be seen from the figure, the smaller the grayscale value of the grain in the scanned photo, the closer the grain is to black, and the closer the crystal plane Miller index is to the {110} crystal plane. Conversely, the closer the grain is to white, the closer the crystal plane Miller index is to the {210} crystal plane.

[0036] Based on this, after determining the average gray value of the grains, Figure 2Then, the angle between the {110} crystal plane of the grain and the rolled surface is determined. Then, the crystal plane Miller index of the grain can be determined in combination with the texture type in the oriented silicon steel product.

[0037] Furthermore, in some embodiments of the present application, determining the angle between the {110} crystal plane of the grain and the rolled surface based on the average grayscale value to determine the crystal plane Miller index of the grain includes: determining the angle between the {110} crystal plane of the grain and the rolled surface based on the average grayscale value; determining the crystal plane Miller index of the grain based on the angle between the {110} crystal plane of the grain and the rolled surface, and the type of texture in the oriented silicon steel product.

[0038] Furthermore, in some embodiments of the present application, the texture types in the oriented silicon steel product include {110} to {210} plane textures.

[0039] Furthermore, in some embodiments of the present application, before measuring the orientation of the grains, the method also includes: selecting grains with a width greater than or equal to 5 mm, a length greater than or equal to 5 mm, and an area equivalent circle diameter greater than or equal to 1 mm to measure the orientation of the grains.

[0040] Continue to refer to Figure 1 In step 150, the magnetic domains of the grains are observed by a powder texture method to obtain the angle between the magnetic domain wall of the grains and the rolling direction.

[0041] In this application, the Miller index of the grain needs to be calculated by the Miller index of the crystal plane and the <001> The angle between the crystal direction and the rolling direction is obtained. <001> The crystal orientation is difficult to measure, and the direction of the magnetic domain wall of the grain is parallel to the grain. <001> Therefore, the orientation of the grains can be determined by observing the direction of the magnetic domain walls. <001> Based on this, the magnetic domain of the grain can be observed by the powder texture method to obtain the angle between the magnetic domain wall of the grain and the rolling direction, thereby obtaining the angle of the grain. <001> The angle between the crystal direction and the rolling direction.

[0042] Specifically, refer to Figure 4 , shows the results of the observation of the magnetic domains of the grains in the embodiment of the present application. Figure 4 As can be seen from the figure, numbers 1, 2, 3, 4, 5, and 6 correspond to the magnetic domain walls inside different grains. Therefore, the orientation of the grains can be determined by observing the direction of the magnetic domain walls. <001> crystal orientation, thereby determining the grain <001> The angle between the crystal direction and the rolling direction.

[0043] Furthermore, in some embodiments of the present application, the magnetic domains of the grains are observed by the powder texture method to obtain the angle between the magnetic domain wall of the grains and the rolling direction, including: when the magnetic field intensity is greater than or equal to 0.3 mT, a magnetic domain observation liquid is dropped to a specified position of the grain, and the magnetic domains of the grains are observed and photographed after 30s to 60s, thereby observing the magnetic domains of the grains by the powder texture method to obtain the angle between the magnetic domain wall of the grains and the rolling direction.

[0044] Furthermore, in some embodiments of the present application, the magnetic domain observation liquid is a water-based Fe3O4 suspension, wherein the particle size of the Fe3O4 suspension is 5μm to 50μm, and the concentration of the Fe3O4 suspension is 1mg / L to 10mg / L.

[0045] Furthermore, in some embodiments of the present application, the method includes: before using the magnetic domain observation liquid, stirring the magnetic domain observation liquid with a magnetic stirrer at a stirring rate of 10 r / min to 50 r / min.

[0046] Furthermore, in some embodiments of the present application, before observing the magnetic domains of the grains, the method further includes: covering the surface of the metal substrate with a flat polypropylene plastic film and securing the plastic film to the metal substrate, wherein the thickness of the plastic film is less than or equal to 0.03 mm and the area of ​​the plastic film is larger than the area of ​​the region to be observed. It is understood that the area of ​​the region to be observed is the area of ​​the metal substrate in which the grains can be observed.

[0047] Continue to refer to Figure 1 In step 170, the grain Miller index is determined according to the crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, thereby realizing rapid measurement of the grain orientation of the oriented silicon steel product.

[0048] In this application, after determining the crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, the crystal plane Miller index and the grain <001> The angle between the crystal direction and the rolling direction can be used to determine the grain Miller index and quickly measure the grain orientation of the finished oriented silicon steel product.

[0049] Specifically, referring to Table 1, a comparison table of grain orientations in the embodiments of the present application is shown.

[0050]

[0051] Table 1

[0052] As shown in Table 1, the Miller index of the grains corresponding to grain numbers 1-5 obtained according to steps 110 to 170 in the method of the present application is consistent with the Miller index results obtained by the grain orientation method determined by the existing EBSD method, which means that the method of the present application for quickly measuring the grain orientation of the finished oriented silicon steel product can accurately measure the grain orientation of the finished oriented silicon steel product. Moreover, under the premise of accurately measuring the grain orientation of the finished oriented silicon steel product, the present application also solves the problems of complex measurement process, low work efficiency, and high measurement cost. At the same time, for oriented silicon steel, it is necessary to quickly and accurately obtain the angle between the {110} crystal plane of the grain and the rolled surface, as well as the grain's <001> The angle between the crystal direction and the rolling direction has important guiding significance for product texture control and performance optimization.

[0053] The foregoing is merely an embodiment of the present application and is not intended to limit the present application. Various modifications and variations are possible for those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present application shall be included within the scope of the claims of the present application.

Claims

1. A method for rapidly measuring the grain orientation of a finished product of oriented silicon steel, characterized in that: The method comprises: A bright and smooth metal matrix is ​​obtained by processing the surface of the oriented silicon steel product, and a scanning photograph of the grains in the metal matrix is ​​obtained by a scanner; By setting the scanned photograph to a grayscale mode, an average grayscale value of the grain is determined, and based on the average grayscale value, an angle between a {110} crystal plane of the grain and a rolled surface is determined to determine a crystal plane Miller index of the grain; Observing the magnetic domains of the grains by a powder texture method to obtain the angle between the magnetic domain walls of the grains and the rolling direction; Determining the grain Miller index according to the crystal plane Miller index and the angle between the magnetic domain wall and the rolling direction, thereby realizing rapid measurement of the grain orientation of the oriented silicon steel product; The method comprises treating the surface of the oriented silicon steel product to obtain a bright and smooth metal matrix, comprising: immersing the oriented silicon steel product in a hydrochloric acid aqueous solution with a mass concentration of 10% to 40%, and the immersion time is greater than 3 minutes, and the temperature of the hydrochloric acid aqueous solution is 40° C. to 70° C.; after the oriented silicon steel product is corroded, washing it 1 to 2 times with a sodium carbonate aqueous solution with a mass concentration of 10% to 30%, deionized water, and anhydrous ethanol, and drying it with cold air, thereby obtaining a bright and smooth metal matrix; The step of determining the angle between the {110} crystal plane of the grain and the rolled surface according to the average grayscale value to determine the crystal plane Miller index of the grain comprises: constructing a relationship diagram between the angle between the {110} crystal plane of the grain and the rolled surface and the image grayscale value, and determining the angle between the {110} crystal plane of the grain and the rolled surface according to the average grayscale value; and determining the crystal plane Miller index of the grain according to the angle between the {110} crystal plane of the grain and the rolled surface and the type of texture in the oriented silicon steel product. Wherein, the texture types in the oriented silicon steel product include {110}~{210} plane textures.

2. The method according to claim 1, characterized in that The step of determining the average grayscale value of the grains by setting the scanned photo to a grayscale mode includes: The grayscale value corresponding to the grain is obtained by setting the scanned photo to grayscale mode, thereby determining the average grayscale value of the grain, wherein the area of ​​the grain used to calculate the average grayscale value is greater than or equal to one third of the total area of ​​the grain.

3. The method according to claim 1, characterized in that The method of observing the magnetic domains of the grains by a powder texture method to obtain the angle between the magnetic domain walls of the grains and the rolling direction comprises: When the magnetic field strength is greater than or equal to 0.3 mT, the magnetic domain observation liquid is dropped to the specified position of the grain, and the magnetic domain of the grain is observed and photographed after 30s to 60s, so as to observe the magnetic domain of the grain by the powder texture method and obtain the angle between the magnetic domain wall of the grain and the rolling direction.

4. The method according to claim 3, characterized in that The magnetic domain observation liquid is a water-based Fe3O4 suspension, wherein the particle size of the Fe3O4 suspension is 5 μm to 50 μm, and the concentration of the Fe3O4 suspension is 1 mg / L to 10 mg / L.

5. The method according to claim 3, characterized in that The method comprises: Before using the magnetic domain observation liquid, it is necessary to stir the magnetic domain observation liquid with a magnetic stirrer at a stirring rate of 10 r / min to 50 r / min.

6. The method according to claim 1, characterized in that Before observing the magnetic domains of the grains, the method further comprises: A flat plastic film made of polypropylene is covered on the surface of the metal substrate, and the plastic film is fixed to the metal substrate, wherein the thickness of the plastic film is less than or equal to 0.03 mm, and the area of ​​the plastic film is larger than the area of ​​the area to be observed.

7. The method according to claim 1, characterized in that Before measuring the orientation of the grains, the method further includes: Select grains with a width greater than or equal to 5 mm, a length greater than or equal to 5 mm, and an area equivalent circle diameter greater than or equal to 1 mm for grain orientation measurement.

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