Test cables, EMC testing methods, apparatus, electronic equipment and storage media

Abstract

This invention provides a test cable, an EMC testing method, an apparatus, an electronic device, and a storage medium. The test cable includes: a connection interface disposed at a first end of the test cable, the connection interface being used to connect to the device port of the device under test (DUT); and a data transceiver module disposed at a second end of the test cable, the data transceiver module being used to implement self-loop communication of data during EMC testing within the test cable; wherein the second end is opposite to the first end. The test cable provided by this invention standardizes EMC testing peripherals, providing a standardized testing scenario, thereby solving the problem that current EMC testing peripherals are not fixed, leading to inaccurate test results, and that peripheral components significantly affect the test results of the DUT.

Description

Technical Field

[0001] This invention relates to the field of EMC testing technology, and in particular to a test cable, an EMC testing method, an apparatus, an electronic device, and a storage medium. Background Technology

[0002] With the accelerating pace of the information age, various IT products are constantly being updated and are flourishing. Especially with the advent of the cloud era, the demands on various electronic products are becoming increasingly higher. Along with the continuous improvement in the performance of electronic products, the EMC (Electromagnetic Compatibility) requirements are also becoming increasingly stringent.

[0003] Currently, EMC testing requires all ports of the device under test (DUT) to be in normal working order and connected to corresponding peripherals. For example, the USB port of the DUT can be connected to a keyboard, mouse, and external hard drive, while the network port needs to be connected to a corresponding network terminal for network packet transmission and reception. However, due to the wide variety of peripherals on the market and their significant performance differences, this can affect the EMC test results of the same DUT and cause difficulties for EMC test engineers.

[0004] In other words, when conducting EMC testing, the peripheral equipment and testing scenarios are not fixed, and different companies use different peripherals for testing. This can easily lead to different test results for the same product using different peripherals, resulting in non-unique EMC test results. Summary of the Invention

[0005] This invention provides a test cable, an EMC testing method, an apparatus, an electronic device, and a storage medium. It also provides a peripheral test cable specifically designed for EMC testing to address the problem that current EMC testing peripherals are not fixed, leading to inaccurate test results and that peripheral devices significantly affect the test results of the device under test.

[0006] A first aspect of the present invention provides a test cable, comprising:

[0007] A connection interface is provided at the first end of the test cable, and the connection interface is used to connect to the device port of the device under test;

[0008] A data transceiver module is disposed at the second end of the test cable, and the data transceiver module is used to realize self-loop communication of data during EMC testing in the test cable;

[0009] The second end is opposite to the first end.

[0010] Optionally, the data transceiver module includes: a first receiving port and a first sending port;

[0011] The first receiving port is used to receive data sent by the device port of the device under test and to transmit the data to the first sending port.

[0012] The first transmitting port is used to receive data sent by the first receiving port and transmit the data to the device port of the device under test.

[0013] Optionally, the shielding conditions of the test cables are the same for the same type of device under test;

[0014] For different types of devices under test, the test cable shall meet at least one or more of the following requirements:

[0015] The test cables all operate in the same mode.

[0016] The length of the test cable is a first fixed value;

[0017] The impedance of the test cable is a second fixed value that meets the impedance requirements of CAT6 network cables.

[0018] Optionally, the outer layer of the test cable is provided with a metal shielding layer, and the test cable is grounded during the EMC test.

[0019] Optionally, the connection interface includes multiple connection interfaces of different models, which are adapted to the different models of device ports of the device under test.

[0020] Optionally, the connection interface includes at least one or more of the following: USB interface, RJ45 interface, and HDMI interface.

[0021] Optionally, the connection interface includes at least a USB interface, and the data transceiver module is equipped with a resistor;

[0022] The power signal present in the test cable is processed through the resistor and the grounding of the test cable.

[0023] A second aspect of this invention provides an EMC testing method applied to a device under test (DUT), wherein the DUT is connected to the connection interface of the test cable described in the first aspect of this invention via a device port; the method includes:

[0024] A set of traffic data is generated inside the device under test by the firmware, and the traffic data is sent to the data transceiver module of the test cable through the device port;

[0025] The device port receives the traffic data returned by the data transceiver module after completing the loopback communication;

[0026] The firmware is used to verify the traffic data received by the device port and the traffic data sent by the device port to determine whether there are any packet losses or errors, and to determine the EMC test result of the device under test.

[0027] Optionally, determining whether packet loss or error exists, and determining the EMC test result of the device under test, includes:

[0028] If both the packet loss rate and the bit error rate are determined to be below the preset threshold, the EMC test result of the device under test is determined to be of the first qualified level.

[0029] If both the packet loss rate and the bit error rate are higher than the preset threshold, or if the data transmission of the traffic is interrupted but can be recovered on its own, the EMC test result of the device under test is determined to be the second qualified level.

[0030] If it is determined that the data transmission is interrupted and cannot be recovered on its own, the EMC test result of the device under test is determined to be unqualified.

[0031] A third aspect of this invention provides an EMC testing apparatus applied to a device under test (DUT), wherein the DUT is connected to the connection interface of the test cable described in the first aspect of this invention via a device port; the method includes:

[0032] The data transmission module is used to generate a set of traffic data inside the device under test through firmware, and send the traffic data to the data transceiver module of the test cable through the device port;

[0033] The data receiving module is used to receive traffic data returned by the data transceiver module after completing the loopback communication through the device port;

[0034] The data verification module is used to verify the traffic data received by the device port and the traffic data sent by the device port through the firmware, to determine whether there is packet loss or packet error, and to determine the EMC test result of the device under test.

[0035] Optionally, the data verification module includes:

[0036] The first determining module is used to determine the EMC test result of the device under test as the first qualified level when both the packet loss rate and the bit error rate are lower than the preset threshold.

[0037] The second determining module is used to determine the EMC test result of the device under test as the second qualified level when it is determined that both the packet loss rate and the bit error rate are higher than the preset threshold, or when it is determined that the traffic data transmission is interrupted and can be recovered by itself.

[0038] The third determining module is used to determine that the EMC test result of the device under test is unqualified when it is determined that the traffic data transmission is interrupted and cannot be recovered on its own.

[0039] A fourth aspect of the present invention provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the EMC testing method as described in the second aspect of the present invention.

[0040] A fifth aspect of the present invention provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the EMC testing method as described in the second aspect of the present invention.

[0041] The test cable of this invention includes a connection interface and a data transceiver module. The connection interface is located at a first end of the test cable and is used to connect to the device port of the device under test (DUT). The data transceiver module is located at a second end of the test cable and is used to implement self-loop communication of data during EMC testing within the test cable. The second end is opposite to the first end. Using this test cable, during EMC testing of the DUT, the connection interface at one end connects to the device port of the DUT, and the data transceiver module at the other end enables self-loop communication of data within the test cable during EMC testing. This facilitates data transmission with the DUT and completes the EMC test. Therefore, this test cable standardizes the peripherals used in EMC testing, providing a standardized testing scenario and a consistent experimental environment unaffected by other peripherals, ensuring the consistency of EMC test results. Attached Figure Description

[0042] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0043] Figure 1 This is a structural diagram of a test cable according to an embodiment of the present invention;

[0044] Figure 2 This is a schematic diagram of a test cable according to an embodiment of the present invention;

[0045] Figure 3 This is a schematic diagram illustrating the principle of a test cable for a USB port according to an embodiment of the present invention;

[0046] Figure 4 This is a flowchart illustrating an EMC testing method according to an embodiment of the present invention;

[0047] Figure 5 This is a structural block diagram of an EMC testing device provided in an embodiment of the present invention;

[0048] Figure 6 This is a schematic diagram of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0049] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0050] As mentioned earlier, the peripheral devices used in EMC testing are currently diverse, and different laboratories use different peripherals. For example, the brand and model of the keyboard and mouse used on the USB port of the device under test will lead to different test results. Furthermore, some manufacturers use keyboards and mice with ferrite cores and shielding. While these can generally be used for normal EMC testing, their EMC performance will degrade when paired with common peripherals. This means that the EMC test results obtained in this way cannot reflect real-world application scenarios.

[0051] Therefore, in order to at least partially solve one or more of the above-mentioned problems and other potential problems, this embodiment of the invention proposes a test cable. One end of the test cable is a connection interface for connecting to the device port of the device under test (DUT), and the other end is a data transceiver module for implementing self-loop communication of data during EMC testing in the test cable to transmit data with the DUT and complete the EMC test. Thus, the test cable of this embodiment standardizes the peripheral devices for EMC testing, provides a standardized test scenario, and a consistent experimental environment that is not affected by other peripheral devices, thereby reducing the impact of peripheral devices on EMC testing, normalizing the EMC test results to the test results of the same peripheral devices, and avoiding test disputes caused by different peripheral devices.

[0052] Please refer to Figure 1 , Figure 1 This is a structural diagram of a test cable according to an embodiment of the present invention. Figure 1 As shown, the test cable 100 includes a connection interface 101 and a data transceiver module 102. It should be noted that... Figure 1The illustration shows that the connection interface 101 and the data transceiver module 102 have a communication relationship, but does not restrict the circuit connection relationship between the connection interface 101 and the data transceiver module 102. The test cable provided in this embodiment is used to connect to the device under test (DUT) during EMC testing to simulate the normal operating environment of the DUT and ensure that the device ports of the DUT are in normal working condition. The test cable in this embodiment includes at least a connection interface and a data transceiver module.

[0053] The connection interface is located at the first end of the test cable and is used to connect to the device port of the device under test.

[0054] In this embodiment, the first end of the cable under test (DUT) is provided with a connection interface for connecting to the device port of the device under test (DUT). For example, when the DUT requires EMC testing, the DUT cable connects to the DUT's device port via the connection interface. In this embodiment, the DUT is an electronic device requiring EMC testing, such as a server, switch, mobile phone, computer, tablet, smartwatch, etc. The connection interface in this embodiment can receive data signals transmitted from the DUT's device port by connecting to it.

[0055] A data transceiver module is disposed at the second end of the test cable. The data transceiver module is used to realize self-loop communication of data during EMC testing in the test cable.

[0056] In this embodiment, a data transceiver module is provided at the second end of the cable under test. This module enables loopback communication of data during EMC testing within the cable, ensuring data communication and reflecting the actual EMC testing situation, i.e., reflecting the actual situation of the device under test during EMC testing. In this embodiment, the first and second ends of the test cable can be either ends, with the second end opposite to the first end. This data transceiver module enables loopback communication of data signals emitted from the device port of the device under test, ensuring data communication during EMC testing while the test results are unaffected by external devices.

[0057] The test cable of this embodiment can be connected to the device under test (EUT) during EMC testing, and the data transceiver module enables self-loop communication of data during EMC testing. While realizing the functions of the device ports of the EUT, it does not rely on other external devices. The test cable is connected uniformly during EMC testing to ensure that all device ports of the EUT are in normal working condition. This avoids the problem of inconsistent EMC test scenarios caused by connecting the EUT to different peripheral devices. Thus, it solves the current problems of inconsistent peripheral devices and test scenarios in EMC testing, inaccurate test results due to the use of different peripheral devices for the same product, and the significant impact of peripheral devices on the test results of the EUT.

[0058] In conjunction with the above embodiments, in one embodiment, the present invention also provides a test cable. In this test cable, the data transceiver module includes: a first receiving port and a first transmitting port.

[0059] The first receiving port is used to receive data sent by the device port of the device under test and to transmit the data to the first sending port.

[0060] In this embodiment, during EMC testing, the test cable can receive data from the device port through the connection interface. The data is transmitted in the cable under test, and the data transceiver module of the cable under test can receive the data through the first receiving port. At this time, the data transceiver module can perform simple data processing on the data, that is, the data is swapped through the data transceiver module: after receiving the data sent from the device port of the device under test through the first receiving port, the data is passed to the first sending port in the data transceiver module, and the first sending port sends the data back to the device port of the device under test.

[0061] The first transmitting port is used to receive data sent by the first receiving port and transmit the data to the device port of the device under test.

[0062] In this embodiment, the first transmitting port of the data transceiver module can receive the data sent by the first receiving port and transmit the received data to the device port of the device under test through the connection interface of the test cable, thereby completing the self-looping of data during the EMC test.

[0063] For example, the device port of the device under test may send a differential signal carrying data. The data transceiver module receives the differential signal through the first receiving port, the first receiving port transmits the received differential signal to the first transmitting port, and the first transmitting port transmits the received differential signal back to the device port of the device under test.

[0064] In this embodiment, the data transceiver module of the test cable can receive data signals sent from the device port through the first receiving port, then transmit the data received by the first receiving port to the first transmitting port, and then transmit the data back to the device port through the first transmitting port. Thus, during the EMC test, the test cable itself completes the data transmission with the device under test, completes the data self-loop, and thus completes the EMC test of the device under test.

[0065] In conjunction with the above embodiments, in one implementation, the present invention also provides a test cable. In this embodiment, the shielding conditions of the test cable are the same for the same type of device under test.

[0066] When performing EMC testing on a device under test (DUT), the DUT needs to be in a normal working state. Different types of DUTs may have different operating requirements and require different operating conditions to ensure that the DUT is in a normal working state. Among these, the shielding conditions of peripheral devices are crucial to the operating requirements of the DUT.

[0067] Therefore, in this embodiment, for devices under test (DUTs) of the same type, the shielding conditions of the test cables used for EMC testing are identical. These shielding conditions include whether the test cable has external shielding or not. In other words, the presence or absence of external shielding on the test cable is fixed for the same type of DUT. For example, for DUT A, the test cable used for EMC testing of DUT A has external shielding; conversely, for DUT B, the test cable used for EMC testing of DUT B does not have external shielding. This ensures a uniform testing environment during EMC testing and conforms to the normal operating conditions of the DUT.

[0068] In this embodiment, for different types of devices under test, the test cable meets at least one or more of the following conditions: the test cable operates in the same mode; the length of the test cable is a first fixed value; and the impedance of the test cable is a second fixed value that meets the impedance requirements of CAT6 network cable.

[0069] In this embodiment, the cable parameters of the test cable used for EMC testing of different types of devices under test (DUTs) must be fixed. These cable parameters must include at least one or more of the following: operating mode, cable length, and impedance value. In other words, for all DUTs, whether they are of the same type or different types, the operating mode, cable length, and impedance value of the test cable used for EMC testing are fixed.

[0070] For all types of devices under test (DUTs), the test cable operates in the same mode. The length of the test cable is a fixed first value, which can be freely set as needed, such as 3 meters. This embodiment does not impose any restrictions on the specific value of the first fixed value. For all types of DUTs, the impedance of the test cable must meet the second fixed value required for CAT6 network cable impedance to ensure normal signal transmission. This second fixed value can also be freely set as needed, and this embodiment does not impose any restrictions on its specific value.

[0071] In this embodiment, the operating mode, cable length, and cable impedance of the test cable are fixed for different types of devices under test (DUTs). For the same type of DUT, the shielding conditions of the test cable are fixed. This allows the test cable in this embodiment to not only meet the EMC testing requirements of various types of DUTs, but also ensure a uniform testing environment during EMC testing by fixing the parameters of the test cable. This results in a more ideal representation of the EMC test results, rather than first eliminating the influence of peripheral equipment when problems are detected. This embodiment avoids damage to peripheral equipment caused by EMI testing during EMC testing (EMC testing includes EMI (electromagnetic interference) testing and EMS (electromagnetic immunity) testing), thus solving the problem that the test cannot reflect the actual situation of most peripheral equipment because the surrounding equipment itself has too good anti-interference capabilities.

[0072] In conjunction with the above embodiments, in one embodiment, the present invention also provides a test cable. In this embodiment, the outer layer of the test cable is provided with a metal shielding layer, and the test cable is grounded during the EMC test.

[0073] In this embodiment, when the test cable is shielded by an external shield, i.e., when the device under test requires shielding of the cable, additional shielding can be added to the test cable. Specifically, the test cable may have a metal shielding layer on its outer layer, i.e., a magnetic ring may be placed on the outside of the test cable.

[0074] When using a test cable with a metallic shield to perform EMC testing on the device under test (DUT), the cable's terminal must be grounded. The ground of the cable terminal and the ground of the shield must be connected together; that is, the test cable needs to be grounded during EMC testing. This is because if the test cable with a metallic shield is not used for telephone connections, the shield will form a natural monopole antenna, which does not conform to the actual usage of the cable during EMC testing and will lead to poorer EMC test results.

[0075] In one embodiment, when the test cable is not shielded (i.e., the device under test does not require shielding), no additional shielding is needed. In this case, the test cable will not have a metal shielding layer; that is, there will be no ferrite core on the outside of the test cable.

[0076] In conjunction with the above embodiments, in one embodiment, the present invention also provides a test cable. In this embodiment, the connection interface includes multiple connection interfaces of different models, which are adapted to different models of device ports of the device under test.

[0077] Because devices under test (DUTs) vary widely, their port types also vary, meaning there may be multiple different port models. This embodiment addresses this by ensuring the test cable is compatible with DUTs possessing various port models. The test cable's connection interface can include multiple different types of connection interfaces, each compatible with a specific port model of the DUT. The test cable can then connect to the DUT's port via the compatible interface, ensuring its applicability to various peripheral ports. This allows for standardized EMC testing of any DUT, further enhancing the test cable's versatility in EMC testing.

[0078] In one optional embodiment, the connection interface includes at least one or more of the following: a USB interface, an RJ45 interface, and an HDMI interface. Specifically, the USB interface of the test cable is compatible with the USB port of the device under test (DUT); the RJ45 interface of the test cable is compatible with the RJ45 port of the DUT; and the HDMI interface of the test cable is compatible with the HDMI port of the DUT.

[0079] like Figure 2 As shown, Figure 2 This is a schematic diagram of a test cable according to an embodiment of the present invention. Figure 2 In the test cable, the device port is an RJ45 port, and the connection interface of the test cable is an RJ45 interface. Figure 2In this test cable, the signals from the RJ45 port can be led out through the connector via the RJ45 connector. The impedance of the test cable must meet the requirements of a standard CAT6 network cable. No external shielding is added, and the cable length is maintained at 3 meters for consistent test results. The end of the test cable includes a processing IC, which is the data transceiver module within the test cable. The processing IC in the test cable can transmit the differential signal data received from the first receiving port (RX port) to the first transmitting port (TX port), and then return it to the RJ45 port (RJ45 connector) through the first transmitting port, thus achieving data self-looping. In this embodiment, the RJ45 port of the device under test (DUT) can transmit multiple sets of differential signals with the processing IC of the test cable. MDI 0DP and MDI 0DN form one set of differential signals, MDI 1DP and MDI 1DN form another set, and so on. The same set of differential signals can be used for both receiving and transmitting simultaneously. For example, MDI 0DP and MDI 0DN can both be used for transmitting or both for receiving. Data can be received through MDI 0DP and MDI 0DN, processed by the processing IC, and then transmitted back through MDI 1DP and MDI 1DN. This embodiment uses the RJ45 port as an example; the situations for USB and HDMI ports are the same or similar.

[0080] In conjunction with the above embodiments, in one implementation, the present invention also provides a test cable. In this embodiment, the connection interface includes at least a USB interface, and the data transceiver module includes a resistor. The power signal present in the test cable is processed through the resistor and the test cable grounding.

[0081] In this embodiment, the data transceiver module of the test cable includes a resistor, and the test cable's connection interface includes at least a USB interface. When the device under test (DUT) has a USB port, and the test cable is connected to the DUT's USB port via the USB interface, during EMC testing, the USB signal emitted by the DUT through the USB port includes a VBUS power signal, resulting in a VBUS power signal in the test cable. Therefore, in this embodiment, the power signal in the test cable is processed through the included resistor and grounding: that is, the test cable can simulate a real-world usage scenario by using a resistor and grounding the cable, thereby enhancing the processing of the power signal and ensuring that the current of the power signal conforms to actual usage conditions. Figure 3 As shown, Figure 3 This is a schematic diagram illustrating the principle of a test cable for a USB port according to an embodiment of the present invention. Figure 3In this context, GND represents the grounding terminal, R0 is the resistance value set in the test cable, and VBUS is the VBUS power signal.

[0082] In conjunction with the above embodiments, in one embodiment, the present invention also provides an EMC testing method. Please refer to... Figure 4 , Figure 4 This is a flowchart illustrating an EMC testing method according to an embodiment of the present invention. The EMC testing method is applied to a device under test (DUT). In this embodiment, the DUT is an electronic device requiring EMC testing, such as a server, switch, mobile phone, computer, tablet, smartwatch, etc., and the DUT has a device port. The DUT is connected to the connection interface of the test cable described in any of the above embodiments through the device port. The method includes:

[0083] Step S11: Generate a set of traffic data inside the device under test through the firmware, and send the traffic data to the data transceiver module of the test cable through the device port.

[0084] In this embodiment, during EMC testing of the device under test (DUT), the DUT can implement packet transmission and reception commands through software to complete the EMC test. Specifically, the DUT's firmware can randomly generate a set of traffic data within the DUT, and then send this traffic data to the connected test cable through the device port, i.e., send the traffic data to the data transceiver module of the test cable through the device port.

[0085] Step S12: Receive the traffic data returned by the data transceiver module after completing the loopback communication through the device port.

[0086] In this embodiment, after the data transceiver module of the test cable receives the traffic data, it can realize the self-loop of the traffic data through the data transceiver module and transmit the traffic data to the device port of the device under test. In this way, the device under test in this embodiment can receive the traffic data returned by the data transceiver module after completing the self-loop communication through the device port.

[0087] In an optional embodiment, the data transceiver module may receive traffic data sent by the device port through the first receiving port, then the first receiving port sends the received traffic data to the first sending port, and then the first sending port returns the traffic data to the device port, thereby completing the self-loop communication of traffic data.

[0088] Step S13: Using the firmware, verify the traffic data received by the device port and the traffic data sent by the device port to determine whether there is packet loss or error, and determine the EMC test result of the device under test.

[0089] In this embodiment, after the device under test receives the traffic data returned by the test cable through the device port, it can use the firmware to verify the traffic data received by the device port and the traffic data sent by the device port, determine whether there are packet loss or errors in the traffic data received by the device port compared with the sent traffic data, obtain the EMC result of the device under test, and thus complete the EMC test.

[0090] In one optional embodiment, the device port of the device under test (DUT) includes a second receiving port and a second transmitting port. The DUT's firmware randomly generates traffic data internally and can then transmit this traffic data to the first receiving port of the test cable's data transceiver module via the second transmitting port. After the test cable's data transceiver module completes data loopback communication, the first transmitting port of the data transceiver module returns the traffic data to the second receiving port of the device port. After receiving the traffic data returned by the test cable through the second receiving port, the DUT can compare the traffic data received at the second receiving port with the traffic data transmitted at the second transmitting port using its firmware to determine packet loss or error conditions, thereby completing the EMC test of the DUT.

[0091] In this embodiment, the device under test (DUT) generates a random data packet internally via its firmware. This data packet is transmitted to the test cable via the second transmitting port of the device port. After looping through the test cable, the data packet is transmitted back to the second receiving port of the device port. The firmware then compares the data received at the second receiving port with the data transmitted at the second transmitting port. This allows for observation of whether packet loss or errors occur during the EMC testing process. Simultaneously, the actual data communication between the simulated device port and external peripherals can be determined during the packet transmission and reception process of the DUT's device port, thus enabling EMC testing. The EMC testing method in this embodiment provides a standardized testing scenario—a consistent experimental environment unaffected by other devices—through the test cable. This allows the device port to function without relying on external equipment, and by fixing the cable length and specifications, data transmission is completed through the cable itself. Furthermore, the firmware of the device under test (DUT) generates, sends, and counts traffic packets. The device port sends traffic packets, which are then routed back to the device port via the external test cable, thus achieving EMC testing. This method determines the communication status of the traffic data during EMC testing transmission to judge the EMC test results. This solves the problems of current EMC testing methods, such as inconsistent peripherals, inaccurate test results, and significant impacts from surrounding equipment on the test results.

[0092] In conjunction with the above embodiments, in one embodiment, the present invention also provides an EMC testing method. In this method, step S13, "determining whether there is packet loss or error, and determining the EMC test result of the device under test," specifically includes steps S21 to S23:

[0093] Step S21: If both the packet loss rate and the bit error rate are determined to be below the preset threshold, the EMC test result of the device under test is determined to be of the first qualified level.

[0094] In this embodiment, the device under test (DUT) can use its firmware to determine lost traffic data and received traffic data with errors based on the traffic data received and sent at the device port. Therefore, based on the lost and received traffic data with errors, the DUT can determine the packet loss rate and bit error rate (BER) between the traffic data received and sent at the device port, i.e., the packet loss rate and BER of the transmitting and receiving packets. The packet loss rate is the proportion of lost traffic data to the sent traffic data, and the BER is the proportion of erroneous traffic data to the sent traffic data.

[0095] In this embodiment, if the firmware determines that both the packet loss rate and the bit error rate are below a preset threshold, the EMC test result of the device under test can be determined to be of the first qualified level, such as level A. The preset threshold is a pre-determined threshold for both the packet loss rate and the bit error rate. In this embodiment, it can be arbitrarily set according to actual needs; for example, the preset threshold can be 5%. This embodiment does not impose any restrictions on the specific value of the preset threshold.

[0096] Step S22: If it is determined that both the packet loss rate and the bit error rate are higher than the preset threshold, or if it is determined that the traffic data transmission is interrupted but can be recovered on its own, the EMC test result of the device under test is determined to be the second qualified level.

[0097] In this embodiment, while determining the packet loss rate and bit error rate, the firmware can also monitor the data transmission status of the device port in real time during the EMC test, determine whether there is a data transmission interruption on the device port, and determine whether data transmission can be automatically restored after a data interruption occurs.

[0098] Specifically, it can be determined that there is a data transmission interruption on the device port if it is found that no data has been received for more than a first time period; conversely, it can be determined that there is no data transmission interruption on the device port if it is found that no data has been received for more than the first time period. Furthermore, it can be determined that the device port can automatically resume data transmission if it is determined that data transmission can be automatically resumed within a second time period after an interruption occurs; conversely, it can be determined that the device port cannot automatically resume data transmission if it is determined that data transmission cannot be automatically resumed within a second time period after an interruption occurs. In this embodiment, both the first and second time periods are preset based on human experience and can be freely set. This embodiment does not impose any restrictions on the specific values ​​of the first and second time periods.

[0099] In this embodiment, if the firmware determines that both the packet loss rate and the bit error rate are higher than the preset threshold, or if the firmware determines that the data transmission of the device terminal is interrupted but can recover on its own, the EMC test result of the device under test can be determined to be the second qualified level, such as determining that the EMC test result of the device under test is level B.

[0100] Step S23: If it is determined that the data transmission of the traffic is interrupted and cannot be recovered on its own, the EMC test result of the device under test is determined to be unqualified.

[0101] In this embodiment, if the firmware determines that the data transmission of the device terminal is interrupted and cannot be recovered on its own, the EMC test result of the device under test can be determined to be unqualified, such as determining that the EMC test result of the device under test is grade C.

[0102] In this embodiment, the data transmission of the device port can be monitored in real time through firmware to complete the sending and statistics of device port traffic packets. The EMC test results of the device under test can be determined by determining the data transmission and packet loss error rate of the device port, thereby completing the EMC test of the device under test.

[0103] It should be noted that, for the sake of simplicity, the method embodiments are all described as a series of actions. However, those skilled in the art should understand that the embodiments of the present invention are not limited to the described order of actions, because according to the embodiments of the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions involved are not necessarily essential to the embodiments of the present invention.

[0104] Based on the same inventive concept, one embodiment of the present invention provides an EMC testing device 500. This EMC testing device 500 can be applied to a device under test (DUT), which is connected to the connection interface of the test cable described in any of the above embodiments via a device port. (See reference) Figure 5 , Figure 5 This is a structural block diagram of an EMC testing device provided in an embodiment of the present invention. Figure 5 As shown, the EMC testing apparatus 500 includes:

[0105] The data transmission module 501 is used to generate a set of traffic data inside the device under test through firmware, and send the traffic data to the data transceiver module of the test cable through the device port;

[0106] The data receiving module 502 is used to receive traffic data returned by the data transceiver module after completing the loopback communication through the device port;

[0107] The data verification module 503 is used to verify the traffic data received by the device port and the traffic data sent by the device port through the firmware, to determine whether there is packet loss or packet error, and to determine the EMC test result of the device under test.

[0108] Optionally, the data verification module 503 includes:

[0109] The first determining module is used to determine the EMC test result of the device under test as the first qualified level when both the packet loss rate and the bit error rate are lower than the preset threshold.

[0110] The second determining module is used to determine the EMC test result of the device under test as the second qualified level when it is determined that both the packet loss rate and the bit error rate are higher than the preset threshold, or when it is determined that the traffic data transmission is interrupted and can be recovered by itself.

[0111] The third determining module is used to determine that the EMC test result of the device under test is unqualified when it is determined that the traffic data transmission is interrupted and cannot be recovered on its own.

[0112] Based on the same inventive concept, another embodiment of the present invention provides an electronic device 600, such as... Figure 6 As shown. Figure 6 This is a schematic diagram of an electronic device according to an embodiment of the present invention. The electronic device includes a processor 601, a memory 602, and a computer program stored in the memory 602 and executable on the processor 601. When the computer program is executed by the processor, it implements the steps in the EMC testing method described in any of the above embodiments of the present invention.

[0113] Based on the same inventive concept, another embodiment of the present invention provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps in the EMC testing method as described in any of the above embodiments of the present invention.

[0114] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on the differences from other embodiments. The same or similar parts between the various embodiments can be referred to each other.

[0115] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0116] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0117] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of the present invention.

[0118] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed in this invention can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0119] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0120] In the embodiments provided by this invention, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0121] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0122] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0123] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, essentially, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0124] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A test cable, characterized in that, include: A connection interface is provided at the first end of the test cable. The connection interface is used to connect to the device port of the device under test and to receive data signals transmitted from the device port of the device under test. The connection interface includes multiple connection interfaces of different models, which are adapted to different models of device ports of the device under test. A data transceiver module is disposed at the second end of the test cable, and the data transceiver module is used to realize self-loop communication of data during EMC testing in the test cable; The second end is opposite to the first end; For the same type of device under test, the shielding conditions of the test cables are the same; For different types of devices under test, the test cable meets at least one or more of the following conditions: the test cable operates in the same mode; the length of the test cable is a first fixed value; and the impedance of the test cable is a second fixed value that meets the impedance requirements of CAT6 network cable. When the device under test (DUT) is subjected to EMC testing, the connection interface at one end is connected to the device port of the DUT, and the data transceiver module at the other end enables self-loop communication of data within the test cable during the EMC testing process, so as to transmit data with the DUT and complete the EMC test.

2. The test cable according to claim 1, characterized in that, The data transceiver module includes: a first receiving port and a first sending port; The first receiving port is used to receive data sent by the device port of the device under test and to transmit the data to the first sending port. The first transmitting port is used to receive data sent by the first receiving port and transmit the data to the device port of the device under test.

3. The test cable according to claim 1, characterized in that, The test cable has a metal shielding layer on its outer layer, and the test cable is grounded during the EMC test.

4. The test cable according to claim 1, characterized in that, The connection interface includes at least one or more of the following: USB interface, RJ45 interface, and HDMI interface.

5. The test cable according to claim 4, characterized in that, The connection interface includes at least a USB interface, and the data transceiver module is equipped with a resistor. The power signal present in the test cable is processed through the resistor and the grounding of the test cable.

6. An EMC testing method, characterized in that, Applied to a device under test, wherein the device under test is connected to the connection interface of the test cable as described in any one of claims 1 to 5 via a device port; the method includes: A set of traffic data is generated inside the device under test by the firmware, and the traffic data is sent to the data transceiver module of the test cable through the device port; The device port receives the traffic data returned by the data transceiver module after completing the loopback communication; The firmware is used to verify the traffic data received by the device port and the traffic data sent by the device port to determine whether there are any packet losses or errors, and to determine the EMC test result of the device under test.

7. The EMC testing method according to claim 6, characterized in that, The determination of whether packet loss or error exists, and the determination of the EMC test results of the device under test, include: If both the packet loss rate and the bit error rate are determined to be below the preset threshold, the EMC test result of the device under test is determined to be of the first qualified level. If both the packet loss rate and the bit error rate are higher than the preset threshold, or if the data transmission of the traffic is interrupted but can be recovered on its own, the EMC test result of the device under test is determined to be the second qualified level. If it is determined that the data transmission is interrupted and cannot be recovered on its own, the EMC test result of the device under test is determined to be unqualified.

8. An EMC testing device, characterized in that, Applied to a device under test, wherein the device under test is connected to the connection interface of the test cable as described in any one of claims 1 to 5 via a device port; the device includes: The data transmission module is used to generate a set of traffic data inside the device under test through firmware, and send the traffic data to the data transceiver module of the test cable through the device port; The data receiving module is used to receive traffic data returned by the data transceiver module after completing the loopback communication through the device port; The data verification module is used to verify the traffic data received by the device port and the traffic data sent by the device port through the firmware, to determine whether there is packet loss or packet error, and to determine the EMC test result of the device under test.

9. An electronic device, characterized in that, include: A processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the EMC testing method as described in claim 6 or 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the EMC testing method as described in claim 6 or 7.

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