Method, device, storage medium and electronic device for determining cause of dust collector tripping

Abstract

The present disclosure relates to a method, device, storage medium, and electronic device for determining the cause of a dust collector tripping, and relates to the technical field of dust collectors. The method comprises: obtaining electrical parameters of at least one of the input and output ends of a high-voltage cabinet of a dust collector, the electrical parameters including voltage and / or current; and, if the electrical parameters meet a first predetermined condition, determining the cause of the dust collector tripping as a target cause, the target cause including at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the dust collector cable. Using the method for determining the cause of a dust collector tripping proposed in the present disclosure can reduce the amount of investigation required by staff.

Description

Technical Field

[0001] The present disclosure relates to the technical field of dust collectors, and in particular to a method, device, storage medium, and electronic device for determining a tripping cause of a dust collector. Background Art

[0002] The electric bag composite dust collector is a composite dust collector that adopts the principles of electrostatic dust removal and bag dust removal. The dust is adsorbed through the electric field charging effect inside the electric bag composite dust collector, thereby discharging clean gas.

[0003] In the related art, there are many reasons that cause the electric bag composite dust collector to trip. When the electric bag composite dust collector trips, the staff needs to check the reasons that cause the electric bag composite dust collector to trip one by one, which is a heavy workload. Summary of the Invention

[0004] The purpose of the present disclosure is to provide a method, device, storage medium and electronic device for determining the cause of a dust collector tripping, so as to solve the above technical problems.

[0005] In order to achieve the above-mentioned object, a first aspect of an embodiment of the present disclosure provides a method for determining a cause of a dust collector tripping, the method comprising:

[0006] Acquiring electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector, wherein the electrical parameters include voltage and / or current;

[0007] When the electrical parameters meet the first predetermined condition, the tripping cause of the dust collector is determined to be a target cause, and the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector.

[0008] Optionally, the electrical parameters include a primary voltage and / or a primary current, the primary voltage being a voltage input to an input terminal of the high-voltage cabinet, and the primary current being a current input to an input terminal of the high-voltage cabinet; and when the electrical parameters satisfy a first predetermined condition, determining that the tripping cause of the dust collector is a target cause includes:

[0009] When the primary current is greater than a first predetermined threshold value and / or the primary voltage is less than a second predetermined threshold value, determining that the tripping cause of the dust collector is a target cause;

[0010] The first predetermined threshold is different from the second predetermined threshold.

[0011] Optionally, the electrical parameters include a secondary voltage and / or a secondary current, the secondary voltage being the voltage outputted by the output terminal of the high-voltage cabinet, and the secondary current being the current outputted by the output terminal of the high-voltage cabinet; and when the electrical parameters satisfy a first predetermined condition, determining that the tripping cause of the dust collector is a target cause includes:

[0012] When the secondary current is greater than a third predetermined threshold value and / or the secondary voltage is less than a fourth predetermined threshold value, determining that the tripping cause of the dust collector is a target cause;

[0013] The third predetermined threshold is different from the fourth predetermined threshold.

[0014] Optionally, the method further includes:

[0015] When the electrical parameter satisfies a second predetermined condition, controlling the rapping intensity of the mechanical rapping to increase to a predetermined intensity, and / or controlling the period of the mechanical rapping to extend to a predetermined period;

[0016] Wherein, the mechanical vibration is used to vibrate the dust accumulated inside the dust collector.

[0017] Optionally, when the electrical parameter satisfies a first predetermined condition, determining the tripping cause of the dust collector as a target cause includes:

[0018] When the electrical parameter satisfies a first predetermined condition and the dust collector is monitored to generate a discharge sound, the tripping cause of the dust collector is determined to be the target cause.

[0019] Optionally, when the electrical parameter satisfies a first predetermined condition, determining the tripping cause of the dust collector as a target cause includes:

[0020] When the electrical parameter satisfies a first predetermined condition, and the duration for which the electrical parameter satisfies the first predetermined condition is greater than a first predetermined duration, the tripping cause of the dust collector is determined to be a target cause.

[0021] Optionally, the method further includes:

[0022] When the electrical parameter satisfies a first predetermined condition and the duration for which the electrical parameter satisfies the first predetermined condition is less than a second predetermined duration, the electrical parameter is determined to be invalid data, and the second predetermined duration is less than the first predetermined duration.

[0023] In order to achieve the above-mentioned object, a second aspect of an embodiment of the present disclosure provides a device for determining a cause of a dust collector tripping, comprising:

[0024] an acquisition module configured to acquire electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector, wherein the electrical parameters include voltage and / or current;

[0025] The cause determination module is configured to determine that the tripping cause of the dust collector is a target cause when the electrical parameters meet a first predetermined condition, and the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector.

[0026] In order to achieve the above-mentioned purpose, the third aspect of the embodiment of the present disclosure provides a non-temporary computer-readable storage medium on which a computer program is stored. When the program is executed by a processor, it implements the steps of a method for determining the cause of a dust collector tripping provided by the first aspect of the embodiment of the present disclosure.

[0027] In order to achieve the above-mentioned object, a fourth aspect of the embodiments of the present disclosure provides an electronic device, including:

[0028] a memory having a computer program stored thereon;

[0029] A processor is used to execute the computer program in the memory to implement the steps of a method for determining a cause of a dust collector tripping provided in the first aspect of an embodiment of the present disclosure.

[0030] Through the above technical solution, when at least one of the following conditions exists: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector, the electrical parameters may reach the first predetermined condition, and the electrical parameters reaching the first predetermined condition will cause the dust collector to trip. Therefore, after the dust collector trips, if it is determined that the electrical parameters meet the first predetermined condition, the staff can be prompted that the cause of the dust collector tripping is at least one of the target reasons among dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector, without having to check other causes that cause the dust collector to trip, thereby reducing the staff's troubleshooting workload.

[0031] Other features and advantages of the present disclosure will be described in detail in the following detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The accompanying drawings are used to provide a further understanding of the present disclosure and constitute a part of the specification. Together with the following detailed description, they are used to explain the present disclosure but do not constitute a limitation of the present disclosure. In the accompanying drawings:

[0033] Figure 1 is a flowchart showing the steps of a method for determining a cause of a dust collector tripping according to an exemplary embodiment;

[0034] Figure 2 is a schematic diagram of a curve of primary current and primary voltage according to an exemplary embodiment;

[0035] Figure 3 is a block diagram of a device for determining a tripping cause of a dust collector according to an exemplary embodiment;

[0036] Figure 4 is a block diagram of an electronic device according to an exemplary embodiment;

[0037] Figure 5 It is a block diagram of an electronic device according to an exemplary embodiment. DETAILED DESCRIPTION

[0038] The following describes the specific embodiments of the present disclosure in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to illustrate and explain the present disclosure and are not intended to limit the present disclosure.

[0039] It should be noted that all actions of acquiring signals, information or data in the present disclosure are carried out in compliance with the corresponding data protection laws and policies of the country where they are located and with the authorization given by the owner of the corresponding device.

[0040] Figure 1 A method for determining a cause of a dust collector tripping is shown according to an exemplary embodiment. The method includes the following steps:

[0041] In step S101, electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector are obtained, where the electrical parameters include voltage and / or current.

[0042] The dust collector can be an electric bag composite dust collector including a front-stage electrostatic precipitator and a rear-stage bag dust collector. The front-stage electrostatic precipitator includes anode and cathode, a vibration mechanism, and high and low voltage power supply devices; the rear-stage bag dust collector includes a filter bag cage device, a dust cleaning system, a lift valve, a pressure differential and temperature monitoring device, etc. Under a high-voltage electric field, the front-stage electrostatic precipitator uses the ionization of the gas to make the dust acquire ions and charge. Under the action of the electric field force, the dust moves to the electrode with opposite polarity, and is captured by the electrode with opposite polarity. The front-stage electrostatic precipitator can remove more than 80% of the dust. After the front-stage electrostatic precipitator captures more than 80% of the dust, the remaining dust of less than 20% enters the rear-stage bag dust collector for secondary filtration.

[0043] The dust collector is equipped with high and low voltage power supply devices, including a high-voltage cabinet. The high-voltage cabinet can provide high-voltage direct current to the dust collector's electric field, ionizing the air within the electric field. Dust-laden gas entering the electric field is immediately charged to generate anions and cations, which then migrate to different electrodes.

[0044] Among them, the high-voltage cabinet has an input end and an output end. The input end inputs primary voltage and primary current, and the output end outputs secondary voltage and secondary current. Therefore, the electrical parameters of at least one of the input end and the output end of the high-voltage cabinet include at least one of the primary voltage, primary current, secondary voltage and secondary current.

[0045] In step S102, when the electrical parameters meet the first predetermined condition, the tripping cause of the dust collector is determined to be a target cause, and the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector.

[0046] Specifically, when the electrical parameter satisfies the first predetermined condition and the dust collector trips, the tripping cause of the dust collector is determined to be a target cause.

[0047] Among them, when dust accumulates on the surface of the cathode plate and / or anode plate of the dust collector, or when the cathode plate and / or anode plate of the dust collector are deformed, the discharge distance between the cathode plate and the anode plate will be shortened, thereby causing the secondary current of the high-voltage cabinet to increase and the secondary voltage to decrease. When the secondary current increases to a certain extent, it will cause the dust collector to short-circuit. In order to protect the internal circuit, the dust collector will control itself to trip.

[0048] It can be understood that the secondary current is proportional to the primary current. When the secondary current increases, the primary current increases accordingly; the secondary voltage is proportional to the primary voltage. When the secondary voltage decreases, the primary voltage decreases accordingly.

[0049] Among them, the cable of the dust collector can be one side of the coil on the input side of the high-voltage cabinet. When the coil on the input side of the high-voltage cabinet is grounded, the primary current on the input side of the high-voltage cabinet will increase instantaneously.

[0050] Therefore, when it is determined that the power output parameters meet the first predetermined condition, it can be determined that the cause of the dust collector tripping is at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the dust collector cable.

[0051] The first predetermined condition may be a current threshold and / or a voltage threshold.

[0052] If the dust collector trips due to electrical parameters meeting the first predetermined condition, a prompt device can be used to inform the staff that the target cause of the dust collector tripping is at least one of dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the dust collector cable. The staff can then investigate these three target causes based on the prompted target cause of the dust collector tripping, without having to investigate all causes of the dust collector tripping. The prompt device can be provided on the dust collector, such as a display screen or a voice announcer.

[0053] The anode and cathode plates form the cathode and cathode electrodes of the pre-electrostatic precipitator within the dust collector. A high-voltage electric field is formed between the cathode and anode plates, which are grounded and connected to a power source. Dust particles entering the high-voltage electric field acquire ions and become charged, moving from the cathode plate toward the anode plate. Upon reaching the anode plate, the charged dust particles release their electrons, depositing on the anode plate and initially filtering the gas. Generally, the greater the distance between the cathode and anode plates, the better the dust removal effect.

[0054] Through the above technical solution, when at least one of the following conditions exists: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector, the electrical parameters may reach the first predetermined condition, and the electrical parameters reaching the first predetermined condition will cause the dust collector to trip. Therefore, after the dust collector trips, if it is determined that the electrical parameters meet the first predetermined condition, the staff can be prompted that the cause of the dust collector tripping is at least one of the target reasons among dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector, without having to check other causes that cause the dust collector to trip, thereby reducing the staff's troubleshooting workload.

[0055] In a possible implementation, the electrical parameters include a primary voltage and / or a primary current, and the following steps are also included.

[0056] In step S201, when the primary current is greater than a first predetermined threshold and / or the primary voltage is less than a second predetermined threshold, the tripping cause of the dust collector is determined to be a target cause. The first predetermined threshold is different from the second predetermined threshold.

[0057] The primary voltage is the voltage input to the high-voltage cabinet input terminal, and the primary current is the current input to the high-voltage cabinet input terminal. It is understandable that when the primary current increases, the primary voltage will decrease.

[0058] Among them, the primary current of the high-voltage cabinet can be tested using precision instruments such as oscilloscopes. During the test, the maximum effective value of the primary current is captured by the oscilloscope, and then the maximum effective value of the current is converted into a peak current. The staff found that when the peak current continues for a predetermined period of time, the air switch of the dust collector will trip.

[0059] During this test, the maximum effective current value can be 1538A, the peak current can be 2175A, the predetermined duration can be 6.25ms, and the rated current of the air switch is 225A. The instantaneous protection setting of the air switch is 2250A, and the error of the instantaneous protection setting of the air switch is 10%. That is, when the peak current is within the range of [2025, 2475], it can be considered that the peak current is greater than the instantaneous protection setting.

[0060] Among them, the primary current proposed in the present disclosure can be the peak current in the above test. Through the above test, it can be determined that the first predetermined threshold for comparison with the primary current is 2250A. It can be understood that there is also a 10% error in the first predetermined threshold. When the primary current is within the range of [2025, 2475], it can be considered that the primary current is greater than the first predetermined threshold. Similarly, the principle that the primary voltage is less than the second predetermined threshold is similar.

[0061] See also Figure 2 As shown, Figure 2 The horizontal axis is time, and the vertical axis is current value or voltage value. Figure 2 The curve at the top is the curve of primary current change. Figure 2 The curve at the bottom is the primary voltage variation curve. Figure 2 It can be seen that through Figure 2 According to the curve graph shown, when the primary current is greater than the first predetermined threshold value and / or the primary voltage is less than the second predetermined threshold value, it is determined that the cause of the dust collector tripping is that the primary current is too large and / or the primary voltage is too small, and the fundamental cause of the primary current being too large and / or the primary voltage being too small is at least one of dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and cable grounding of the dust collector.

[0062] Therefore, when the primary current is greater than the first predetermined threshold and / or the primary voltage is less than the second predetermined threshold, it can be determined that the cause of the dust collector tripping is at least one of the target reasons including dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and cable grounding of the dust collector.

[0063] Through the above technical solution, when the primary current is greater than the first predetermined threshold and / or the primary voltage is less than the second predetermined threshold, it can be determined that the cause of the dust collector tripping is the target cause, so the target cause of the dust collector tripping can be prompted, so that the staff can obtain the target cause and conduct investigation according to the target cause, without the need for the staff to investigate the causes of the dust collector tripping one by one.

[0064] In a possible implementation, the electrical parameters include secondary voltage and / or secondary current, and the following steps are also included.

[0065] In step S301, when the secondary current is greater than a third predetermined threshold and / or the secondary voltage is less than a fourth predetermined threshold, the tripping cause of the dust collector is determined to be a target cause. The third predetermined threshold is different from the fourth predetermined threshold.

[0066] The secondary voltage is the voltage output from the high-voltage cabinet output terminal, and the secondary current is the current output from the high-voltage cabinet output terminal. It is understood that when the secondary current increases, the secondary voltage decreases.

[0067] Through the above technical solution, when the secondary current is greater than the third predetermined threshold and / or the secondary voltage is less than the fourth predetermined threshold, it can be determined that the cause of the dust collector tripping is the target cause, so the target cause of the dust collector can be prompted, so that the staff can obtain the target cause and conduct investigation according to the target cause, without the need for the staff to investigate the causes of the dust collector tripping one by one.

[0068] In a possible implementation, when the electrical parameters meet the first predetermined condition, if the dust collector trips, the cause of the dust collector tripping is mostly dust accumulation inside the dust collector, so the present disclosure further proposes the following steps:

[0069] In step S401, when the electrical parameter satisfies a second predetermined condition, the rapping intensity of the mechanical rapping is controlled to increase to a predetermined intensity, and / or the period of the mechanical rapping is controlled to extend to a predetermined period.

[0070] Among them, mechanical vibration is to vibrate the surface of the cathode plate and the surface of the anode plate by a hammer head, thereby shaking off the dust deposited on the surface of the cathode plate and the anode plate.

[0071] Since the dust collector is used to remove dust, dust may often accumulate inside the dust collector. In the absence of external impact on the dust collector, the cathode and anode plates of the dust collector generally do not deform. Therefore, in the event of a dust collector trip, if the electrical parameters meet the first predetermined condition, it can be determined that the cause of the dust collector trip is likely dust accumulation inside the dust collector, rather than deformation of the cathode or anode plates. Therefore, in order to remove the dust accumulation inside the dust collector, the vibration intensity of the mechanical vibration can be increased to a predetermined intensity and / or the mechanical vibration period can be extended to a predetermined period.

[0072] For example, the rapping intensity is increased to 0.5 times of the original intensity, or the rapping cycle of the mechanical rapping is extended from the original rapping time of 10 minutes to rapping time of 20 minutes.

[0073] Wherein, when the first predetermined condition and the second predetermined condition are of current type, the second predetermined condition is smaller than the first predetermined condition; when the first predetermined condition and the second predetermined condition are of voltage type, the second predetermined condition is larger than the first predetermined condition.

[0074] For example, when the first predetermined condition is the first predetermined threshold or the second predetermined threshold, if the type of the second predetermined condition is current, the second predetermined condition is less than the first predetermined threshold; if the type of the second predetermined condition is voltage, the second predetermined condition is greater than the second predetermined threshold; when the first predetermined condition is the third predetermined threshold or the fourth predetermined threshold, if the type of the second predetermined condition is current, the second predetermined condition is less than the third predetermined threshold; if the type of the second predetermined condition is voltage, the second predetermined condition is greater than the fourth predetermined threshold.

[0075] Through the above-mentioned settings, the vibration intensity and / or vibration cycle of the mechanical vibration can be controlled to be extended when the electrical parameters meet the second predetermined conditions. In this way, the dust accumulation inside the dust collector can be controlled to gradually decrease when the electrical parameters have not reached the first predetermined conditions, so that the electrical parameters will not meet the first predetermined conditions, thereby reducing the chances of the dust collector tripping and reducing the probability of the dust collector tripping.

[0076] With the above technical solution, when the electrical parameter satisfies the second predetermined condition, the mechanical rapping intensity is controlled to increase to a predetermined intensity, and / or the mechanical rapping cycle is controlled to extend to a predetermined period. With the increased rapping intensity or rapping cycle, dust accumulation within the dust collector can be removed more quickly, preventing dust collector tripping caused by dust accumulation.

[0077] In a possible implementation, the present disclosure further proposes the following steps:

[0078] In step S501, when the electrical parameter satisfies a first predetermined condition and the dust collector is monitored to generate a discharge sound, it is determined that the tripping cause of the dust collector is the target cause.

[0079] Specifically, when the electrical parameter meets the first predetermined condition, the dust collector trips, and the dust collector is monitored to generate a discharge sound, the tripping cause of the dust collector is determined to be a target cause.

[0080] Among them, when using a dust collector to conduct an air lift test on the electric field, after the peak current increased to the instantaneous protection setting of the air switch and lasted for a predetermined period of time, the test personnel saw an obvious spark discharge fault inside the dust collector through the open manhole of the dust collector, and then the dust collector tripped.

[0081] Therefore, the present invention can further determine that the cause of the dust collector tripping is caused by excessive current when the electrical parameters meet the first predetermined condition and the dust collector is monitored to produce a discharge sound. The cause of the excessive current is the target cause proposed above, which can make the accuracy of determining that the cause of the dust collector tripping is the target cause higher.

[0082] In a possible implementation, the present disclosure further includes the following steps:

[0083] In step S601, when the electrical parameter satisfies a first predetermined condition and the duration for which the electrical parameter satisfies the first predetermined condition is greater than the first predetermined duration, it is determined that the tripping cause of the dust collector is a target cause.

[0084] Among them, affected by the external environment, the electrical parameters may suddenly change and reach the range of the first predetermined condition. If the electrical parameters meet the first predetermined condition, it may be a misjudgment to determine that the cause of the dust collector tripping is the target cause.

[0085] Therefore, only when the electrical parameters meet the first predetermined conditions and the time for which the electrical parameters meet the first predetermined conditions is greater than the first predetermined time can it be determined that the electrical parameters are maintained within the range of the first predetermined conditions. Only then can it be determined that the cause of the dust collector tripping is the target cause, thereby avoiding misjudgment.

[0086] Through the above technical solution, when the electrical parameters meet the first predetermined condition and the time for which the electrical parameters meet the first predetermined condition continues to meet the first predetermined time, the tripping cause of the dust collector is determined to be the target cause, thereby avoiding the situation where the electrical parameters suddenly change and prompt the tripping cause of the dust collector.

[0087] In a possible implementation, the present disclosure further includes the following steps:

[0088] In step S701, when the electrical parameter satisfies a first predetermined condition and the duration for which the electrical parameter satisfies the first predetermined condition is less than a second predetermined duration, it is determined that the electrical parameter is invalid data and the second predetermined duration is less than the first predetermined duration.

[0089] Among them, when the electrical parameters meet the first predetermined condition and the time duration for which the electrical parameters meet the first predetermined condition is less than the second predetermined time duration, it can be determined that the electrical parameters obtained by the recorder have undergone a sudden change due to the influence of the external environment. At this time, it can be determined that the electrical parameters are invalid data and are not displayed.

[0090] Invalid data may be data that is not displayed by the oscilloscope.

[0091] Through the above technical solution, when the electrical parameter meets the first predetermined condition and the time for which the electrical parameter meets the first predetermined condition is less than the second predetermined time, the electrical parameter is determined to be invalid data, thereby avoiding the invalid data from affecting the misjudgment of the cause of the dust collector tripping.

[0092] Figure 3 A device for determining a dust collector tripping cause according to an exemplary embodiment is shown. The device 300 for determining a dust collector tripping cause includes: an acquisition module 310 and a cause determination module 320;

[0093] An acquisition module 310 is configured to acquire electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector, wherein the electrical parameters include voltage and / or current;

[0094] The cause determination module 320 is configured to determine that the tripping cause of the dust collector is a target cause when the electrical parameters meet a first predetermined condition, and the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of the cable of the dust collector.

[0095] Optionally, the electrical parameter includes a primary voltage and / or a primary current, the primary voltage being a voltage input to the high-voltage cabinet input terminal, and the primary current being a current input to the high-voltage cabinet input terminal; the cause determination module 320 includes:

[0096] a first cause determination submodule, configured to determine that the tripping cause of the dust collector is a target cause when the primary current is greater than a first predetermined threshold and / or the primary voltage is less than a second predetermined threshold;

[0097] The first predetermined threshold is different from the second predetermined threshold.

[0098] Optionally, the electrical parameter includes a secondary voltage and / or a secondary current, the secondary voltage being the voltage outputted by the high-voltage cabinet output terminal, and the secondary current being the current outputted by the high-voltage cabinet output terminal; the cause determination module 320 includes:

[0099] a second cause determination submodule, configured to determine that the tripping cause of the dust collector is a target cause when the secondary current is greater than a third predetermined threshold and / or the secondary voltage is less than a fourth predetermined threshold;

[0100] The third predetermined threshold is different from the fourth predetermined threshold.

[0101] Optionally, the device 300 for determining the cause of a dust collector tripping includes:

[0102] a rapping control module configured to control the rapping intensity of the mechanical rapping to increase to a predetermined intensity and / or control the period of the mechanical rapping to extend to a predetermined period when the electrical parameter satisfies a second predetermined condition;

[0103] Wherein, the mechanical vibration is used to vibrate the dust accumulated inside the dust collector.

[0104] Optionally, the cause determination module 320 includes:

[0105] The third cause determination submodule is configured to determine that the tripping cause of the dust collector is the target cause when the electrical parameter satisfies the first predetermined condition and the dust collector is monitored to generate a discharge sound.

[0106] Optionally, the cause determination module 320 includes:

[0107] The fourth cause determination submodule is configured to determine that the tripping cause of the dust collector is a target cause when the electrical parameter meets the first predetermined condition and the duration for which the electrical parameter meets the first predetermined condition is greater than the first predetermined duration.

[0108] Optionally, the device 300 for determining the cause of a dust collector tripping includes:

[0109] The invalid data determination module is configured to determine that the electrical parameter is invalid data when the electrical parameter meets a first predetermined condition and the time duration for which the electrical parameter meets the first predetermined condition is less than a second predetermined time duration, and the second predetermined time duration is less than the first predetermined time duration.

[0110] Regarding the apparatus in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0111] Figure 4FIG. 7 is a block diagram of an electronic device 700 according to an exemplary embodiment. Figure 4 As shown, the electronic device 700 may include: a processor 701 , a memory 702 , and may further include one or more of a multimedia component 703 , an input / output (I / O) interface 704 , and a communication component 705 .

[0112] The processor 701 is used to control the overall operation of the electronic device 700 to complete all or part of the steps in the above-mentioned method for determining the cause of a dust collector trip. The memory 702 is used to store various types of data to support the operation of the electronic device 700. This data may include, for example, instructions for any application or method operating on the electronic device 700, as well as application-related data, such as contact information, sent and received messages, pictures, audio, video, etc. The memory 702 can be implemented by any type of volatile or non-volatile storage device, or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. The multimedia component 703 may include a screen and an audio component. The screen may be, for example, a touch screen, and the audio component is used to output and / or input audio signals. For example, the audio component may include a microphone for receiving external audio signals. The received audio signals may be further stored in the memory 702 or transmitted via the communication component 705. The audio component also includes at least one speaker for outputting audio signals. The I / O interface 704 provides an interface between the processor 701 and other interface modules, which may include a keyboard, a mouse, buttons, etc. These buttons may be virtual or physical buttons. The communication component 705 is used for wired or wireless communication between the electronic device 700 and other devices. Wireless communication, such as Wi-Fi, Bluetooth, Near Field Communication (NFC), 2G, 3G, 4G, NB-IOT, eMTC, or other 5G networks, or a combination thereof, is not limited here. Accordingly, the communication component 705 may include a Wi-Fi module, a Bluetooth module, an NFC module, etc.

[0113] In an exemplary embodiment, the electronic device 700 may be implemented by one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to execute the above-mentioned method for determining the cause of a dust collector tripping.

[0114] In another exemplary embodiment, a computer-readable storage medium including program instructions is further provided. When executed by a processor, the program instructions implement the steps of the above-described method for determining the cause of a dust collector trip. For example, the computer-readable storage medium may be the above-described memory 702 including the program instructions. The program instructions may be executed by the processor 701 of the electronic device 700 to implement the above-described method for determining the cause of a dust collector trip.

[0115] Figure 5 1 is a block diagram of an electronic device 1900 according to an exemplary embodiment. For example, the electronic device 1900 may be provided as a server. Figure 5 The electronic device 1900 includes one or more processors 1922 and a memory 1932 for storing a computer program executable by the processor 1922. The computer program stored in the memory 1932 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processor 1922 may be configured to execute the computer program to perform the aforementioned method for determining a dust collector tripping cause.

[0116] In addition, electronic device 1900 may further include a power supply component 1926 and a communication component 1950. The power supply component 1926 may be configured to perform power management for electronic device 1900, and the communication component 1950 may be configured to enable communication, such as wired or wireless communication, for electronic device 1900. Furthermore, electronic device 1900 may further include an input / output (I / O) interface 1958. Electronic device 1900 may operate based on an operating system stored in memory 1932.

[0117] In another exemplary embodiment, a computer-readable storage medium including program instructions is also provided. When executed by a processor, the program instructions implement the steps of the above-mentioned method for determining the cause of a dust collector trip. For example, the non-transitory computer-readable storage medium may be the above-mentioned memory 1932 including the program instructions. The program instructions may be executed by the processor 1922 of the electronic device 1900 to implement the above-mentioned method for determining the cause of a dust collector trip.

[0118] In another exemplary embodiment, a computer program product is further provided. The computer program product includes a computer program executable by a programmable device, and has a code portion for executing the above-mentioned method for determining a tripping cause of a dust collector when executed by the programmable device.

[0119] The preferred embodiments of the present disclosure are described in detail above in conjunction with the accompanying drawings. However, the present disclosure is not limited to the specific details of the above embodiments. Within the technical concept of the present disclosure, various simple modifications can be made to the technical solutions of the present disclosure, and these simple modifications all fall within the scope of protection of the present disclosure.

[0120] It should also be noted that the various specific technical features described in the above specific embodiments can be combined in any appropriate manner without contradiction. In order to avoid unnecessary repetition, the present disclosure will not further describe various possible combinations.

[0121] In addition, the various embodiments of the present disclosure may be arbitrarily combined, and as long as they do not violate the concept of the present disclosure, they should also be regarded as the contents disclosed by the present disclosure.

Claims

1. A method for determining the cause of a dust collector tripping, characterized in that: The method comprises: Acquiring electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector, wherein the electrical parameters include voltage and / or current; When the electrical parameter satisfies a first predetermined condition, determining the tripping cause of the dust collector as a target cause, wherein the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of the cathode plate and / or anode plate of the dust collector, and grounding of a cable of the dust collector; Wherein, the electrical parameters include a primary voltage and / or a primary current, the primary voltage is a voltage input to the input terminal of the high-voltage cabinet, and the primary current is a current input to the input terminal of the high-voltage cabinet; when the electrical parameters meet a first predetermined condition, determining that the tripping cause of the dust collector is a target cause includes: determining that the tripping cause of the dust collector is a target cause when the primary current is greater than a first predetermined threshold and / or the primary voltage is less than a second predetermined threshold, the first predetermined threshold being different from the second predetermined threshold; The electrical parameters include a secondary voltage and / or a secondary current, the secondary voltage is a voltage outputted by the output terminal of the high-voltage cabinet, and the secondary current is a current outputted by the output terminal of the high-voltage cabinet; when the electrical parameters satisfy a first predetermined condition, determining that the tripping cause of the dust collector is a target cause includes: determining that the tripping cause of the dust collector is a target cause when the secondary current is greater than a third predetermined threshold and / or the secondary voltage is less than a fourth predetermined threshold, and the third predetermined threshold is different from the fourth predetermined threshold; The high-voltage cabinet can provide high-voltage direct current to the electric field of the dust collector, so that the air in the electric field is ionized, and the dust-laden gas entering the electric field can be charged to generate anions and cations and move to different electrodes.

2. The method according to claim 1, characterized in that The method further comprises: When the electrical parameter satisfies a second predetermined condition, controlling the rapping intensity of the mechanical rapping to increase to a predetermined intensity, and / or controlling the period of the mechanical rapping to extend to a predetermined period; Wherein, the mechanical vibration is used to vibrate the dust accumulated inside the dust collector; Wherein, when the first predetermined condition and the second predetermined condition are of current type, the second predetermined condition is smaller than the first predetermined condition; when the first predetermined condition and the second predetermined condition are of voltage type, the second predetermined condition is larger than the first predetermined condition.

3. The method according to claim 1, characterized in that When the electrical parameter satisfies the first predetermined condition, determining the tripping cause of the dust collector as a target cause includes: When the electrical parameter satisfies a first predetermined condition and the dust collector is monitored to generate a discharge sound, the tripping cause of the dust collector is determined to be the target cause.

4. The method according to claim 1, wherein When the electrical parameter satisfies the first predetermined condition, determining the tripping cause of the dust collector as a target cause includes: When the electrical parameter satisfies a first predetermined condition, and the duration for which the electrical parameter satisfies the first predetermined condition is greater than a first predetermined duration, the tripping cause of the dust collector is determined to be a target cause.

5. The method according to claim 4, characterized in that The method further comprises: When the electrical parameter satisfies a first predetermined condition and the duration for which the electrical parameter satisfies the first predetermined condition is less than a second predetermined duration, the electrical parameter is determined to be invalid data, and the second predetermined duration is less than the first predetermined duration.

6. A device for determining the cause of a dust collector tripping, characterized in that: include: an acquisition module configured to acquire electrical parameters of at least one of an input end and an output end of a high-voltage cabinet of a dust collector, wherein the electrical parameters include voltage and / or current; a cause determination module configured to, when the electrical parameter satisfies a first predetermined condition, determine that a tripping cause of the dust collector is a target cause, wherein the target cause includes at least one of the following: dust accumulation inside the dust collector, deformation of a cathode plate and / or anode plate of the dust collector, or grounding of a cable of the dust collector; Wherein, the electrical parameters include a primary voltage and / or a primary current, the primary voltage being the voltage input to the input terminal of the high-voltage cabinet, and the primary current being the current input to the input terminal of the high-voltage cabinet; the cause determination module is further configured to determine that the tripping cause of the dust collector is a target cause when the primary current is greater than a first predetermined threshold and / or the primary voltage is less than a second predetermined threshold, and the first predetermined threshold is different from the second predetermined threshold; Wherein, the electrical parameters include a secondary voltage and / or a secondary current, the secondary voltage being the voltage outputted by the output terminal of the high-voltage cabinet, and the secondary current being the current outputted by the output terminal of the high-voltage cabinet; the cause determination module is further configured to determine that the tripping cause of the dust collector is a target cause when the secondary current is greater than a third predetermined threshold value and / or the secondary voltage is less than a fourth predetermined threshold value, and the third predetermined threshold value is different from the fourth predetermined threshold value; The high-voltage cabinet can provide high-voltage direct current to the electric field of the dust collector, so that the air in the electric field is ionized, and the dust-laden gas entering the electric field can be charged to generate anions and cations and move to different electrodes.

7. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

8. An electronic device, characterized in that: include: a memory having a computer program stored thereon; A processor, configured to execute the computer program in the memory to implement the steps of the method according to any one of claims 1 to 5.

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