Calibration method and device for local oscillator leakage, electronic equipment and storage medium

Abstract

This invention relates to the fields of digital signal processing and communication technology, and discloses a method, apparatus, electronic device, and storage medium for calibrating local oscillator leakage. The local oscillator leakage calibration method includes: acquiring a feedback signal of a transmitted signal; the transmitted signal being obtained by conversion based on a service signal and a pre-input special sequence signal; the pre-input special sequence signal being a special sequence signal generated by a longest linear shift register sequence; determining the channel parameters of the service signal through the feedback signal and the special sequence signal; acquiring the local oscillator leakage value of the service signal based on the channel parameters; and calibrating the service signal based on the local oscillator leakage value. The local oscillator leakage calibration method provided by this invention can extract channel parameters in real time in a signal-free environment, thereby calibrating the local oscillator leakage.

Description

Technical Field

[0001] This application relates to the fields of digital signal processing and communication technology, and in particular to a calibration method, apparatus, electronic device, and storage medium for local oscillator leakage. Background Technology

[0002] Modern communication systems place increasingly higher demands on the bandwidth of radio frequency (RF) transceivers, such as 5G low-frequency broadband zero-IF systems and 5G high-frequency ultra-wideband systems. However, conventional RF analog devices are far from meeting the performance requirements of these systems. Digital-assisted analog calibration can optimize the local oscillator (LO) leakage error in quadrature modulation systems, thereby improving the bandwidth of the RF transceiver. Generally, analog adjustment for LO leakage calibration results in low accuracy, which is insufficient for the requirements of 5G transceivers. Therefore, digital-assisted LO leakage calibration is necessary. Digital-assisted LO leakage calibration can significantly suppress spurious leakage at the transmitting end and improve receiver sensitivity at the receiving end.

[0003] There are many methods for digitally assisted local oscillator leakage error calibration. First, the channel parameters of the transceiver must be obtained. Existing methods for obtaining channel parameters mainly include:

[0004] (1) Offline parameter calculation and adjustment are adopted. Offline testing is carried out using a signal source, spectrum analyzer and computer. Detailed measurements are performed on specific modules to finally obtain fixed channel parameters.

[0005] (2) Channel parameters are extracted by using an adaptive filter blind iteration method based on signal characteristics, and then the extracted channel parameters are optimized to obtain the final channel parameters.

[0006] (3) Transmit single-tone or broadband signals through the digital domain to obtain channel parameters.

[0007] However, the first method for obtaining channel parameters is suitable for stable environments but cannot adapt to changes in the external environment that cause errors. The parameters cannot be corrected according to the environment, and it is impossible to implement during system operation, thus failing to achieve real-time processing. The second method uses a blind iterative approach to extract channel parameters. Under sudden signal changes, the iteratively obtained channel parameters are highly unstable, leading to performance degradation and a decrease in system performance. The third method for obtaining channel parameters cannot be implemented during system operation and requires calibration operations in the foreground. Summary of the Invention

[0008] The main objective of this application is to provide a method, apparatus, electronic device, and storage medium for calibrating local oscillator leakage, which can extract channel parameters in real time in a signal-free environment to calibrate local oscillator leakage.

[0009] To at least achieve the above objectives, embodiments of this application provide a method for calibrating local oscillator leakage, comprising: acquiring a feedback signal of a transmitted signal; the transmitted signal being obtained by conversion based on a service signal and a pre-input special sequence signal; the pre-input special sequence signal being a special sequence signal generated by a longest linear shift register sequence; determining channel parameters of the service signal through the feedback signal and the special sequence signal; acquiring the local oscillator leakage value of the service signal based on the channel parameters; and calibrating the service signal based on the local oscillator leakage value.

[0010] To at least achieve the above objectives, embodiments of this application also provide a local oscillator leakage calibration apparatus, comprising: a signal acquisition module for acquiring a feedback signal of a transmitted signal; the transmitted signal is obtained by conversion based on a service signal and a pre-input special sequence signal; the pre-input special sequence signal is a special sequence signal generated by a longest linear shift register sequence; a determination module for determining channel parameters of the service signal through the feedback signal and the special sequence signal; a data acquisition module for acquiring the local oscillator leakage value of the service signal based on the channel parameters; and a calibration module for calibrating the service signal according to the local oscillator leakage value.

[0011] To at least achieve the above objectives, embodiments of this application also provide an electronic device, including: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the aforementioned local oscillator leakage calibration method.

[0012] To at least achieve the above objectives, embodiments of this application also provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the aforementioned local oscillator leakage calibration method.

[0013] The local oscillator leakage calibration method proposed in this application obtains the feedback signal of the transmitted signal. The transmitted signal is obtained by converting the service signal and a pre-input special sequence signal, where the special sequence signal is generated by the longest linear shift register. The channel parameters of the service signal can be determined using the feedback signal and the special sequence signal. Then, based on the channel parameters, the local oscillator leakage value of the service signal can be obtained, and the service signal is calibrated using the local oscillator leakage value. This application's embodiment directly obtains the feedback signals of the service signal and the special sequence signal from the RF transceiver, and determines the channel parameters using these signals. It can adaptively match the current operating bandwidth of the RF transceiver, and can extract channel parameters in real time even in signal-free environments, thereby performing local oscillator leakage calibration. It has the advantages of high performance, low power consumption, and high flexibility. Attached Figure Description

[0014] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements with the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings do not constitute a limitation on scale.

[0015] Figure 1 This is a flowchart of a local oscillator leakage calibration method according to an embodiment of the present invention;

[0016] Figure 2 This is a framework diagram of a local oscillator leakage calibration method according to an embodiment of the present invention;

[0017] Figure 3 This is a schematic diagram of the structure of a special sequence generation module according to an embodiment of the present invention;

[0018] Figure 4 This is a schematic diagram of the structure of a special sequence injection module according to an embodiment of the present invention;

[0019] Figure 5 This is a schematic diagram of the structure of a special sequence and feedback correlation module according to another embodiment of the present invention;

[0020] Figure 6 This is a schematic diagram of a local oscillator leakage calibration device according to another embodiment of the present invention;

[0021] Figure 7 This is a schematic diagram of the structure of an electronic device according to another embodiment of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the various embodiments of this application will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details have been provided in the various embodiments of this application to help readers better understand this application. However, the technical solutions claimed in this application can be implemented even without these technical details and various changes and modifications based on the following embodiments. The division of the various embodiments below is for the convenience of description and should not constitute any limitation on the specific implementation of this application. The various embodiments can be combined with and referenced by each other without contradiction.

[0023] One embodiment of the present invention relates to a local oscillator leakage calibration method, applied to an electronic device, wherein the electronic device may be, but is not limited to, a radio frequency transceiver such as a zero-IF transceiver. The implementation flowchart of the local oscillator leakage calibration method of this embodiment is shown below. Figure 1As shown, it includes:

[0024] Step 101: Obtain the feedback signal of the transmitted signal.

[0025] Step 102: Determine the channel parameters of the service signal through feedback signals and special sequence signals.

[0026] Step 103: Obtain the local oscillator leakage value of the service signal based on the channel parameters.

[0027] Step 104: Calibrate the service signal based on the local oscillator leakage value.

[0028] In this embodiment, the feedback signal of the transmitted signal is acquired. The transmitted signal is obtained by converting the service signal and a pre-input special sequence signal, where the special sequence signal is generated by the longest linear shift register. The channel parameters of the service signal can be determined using the feedback signal and the special sequence signal. Then, based on the channel parameters, the local oscillator leakage value of the service signal can be obtained. The service signal is then calibrated using the local oscillator leakage value. This embodiment directly acquires the feedback signals of the service signal and the special sequence signal from the RF transceiver, and determines the channel parameters using these signals. This allows for adaptive matching of the current operating bandwidth of the RF transceiver, and even in signal-free environments, channel parameters can be extracted in real time for local oscillator leakage calibration. It offers advantages such as high performance, low power consumption, and high flexibility.

[0029] The following is a detailed description of the implementation details of the local oscillator leakage calibration method in this embodiment. The following content is only for the convenience of understanding the implementation details and is not necessary for implementing this solution.

[0030] In step 101, before the transmission signal is emitted, one of the transmission signals is connected to the feedback (FB) channel via the feedback line to obtain the feedback signal of the transmission signal.

[0031] The transmitted signal is obtained by converting the service signal and the pre-input special sequence signal. Specifically, after the chip generates the service signal and before the service signal conversion, the special sequence signal is input into the transmit digital link and converted into a transmitted signal after being combined with the service signal.

[0032] The pre-input special sequence signal is generated by the longest linear shift register sequence (i.e., the m-sequence). The m-sequence can be generated by a binary linear feedback shift register, mainly composed of n cascaded registers, a shift pulse generator, and a modulo-2 adder. Different feedback line positions will result in different sequences with different periods. By changing the position of the linear feedback, the longest possible sequence can be generated by the shift register, up to P=2. n -1.

[0033] It should be noted that the period length of the special sequence signal in this embodiment is greater than or equal to 2. 23 .

[0034] In one example, before obtaining the feedback signal for the transmitted signal, it is first necessary to confirm that the temperature change of the chip generating the service signal exceeds a preset threshold. For example, the chip temperature is detected by an on-chip sensor, and the preset threshold value is an empirical value. By confirming that the temperature change of the chip generating the service signal exceeds the preset threshold, it is confirmed that the local oscillator leakage value of the service signal exceeds a preset threshold, thereby triggering local oscillator leakage calibration. That is, before the transmitted signal is emitted, one of the transmitted signals is connected to the FB channel through the feedback line to obtain the feedback signal of the transmitted signal.

[0035] It is understandable that if the temperature change of the chip that generates the service signal is less than or equal to the preset threshold, it means that the local oscillator leakage value is within the preset range and will not affect the bandwidth of the RF transceiver, and therefore will not obtain the feedback signal of the transmitted signal.

[0036] In step 102, after obtaining the feedback signal of the transmitted signal, the channel parameters of the service signal are determined based on the feedback signal and the special sequence signal.

[0037] Specifically, the feedback signal and the special sequence signal are multiplied to obtain the delay value of the service signal, and then the channel parameters are determined based on the delay value.

[0038] In one example, before multiplying the feedback signal and the special sequence signal to obtain the delay value of the service signal, the special sequence signal is first input into multiple delay units to obtain multiple delayed special sequence signals. The feedback signal is then multiplied by each of the multiple delayed special sequence signals to obtain multiple delay values ​​of the service signal. The average of these multiple delay values ​​and the average of the squares of the multiple delay values ​​are then calculated to obtain the actual delay value of the service signal. By obtaining multiple delay values ​​of the service signal and calculating their average and the average of their squares, a more accurate delay value can be obtained.

[0039] In one example, before determining the channel parameters based on the delay value, it is necessary to obtain the DC value of the feedback signal and the DC value of the transmitted signal, and then determine the channel parameters based on the DC values ​​of the feedback signal, the transmitted signal, and the delay value. Specifically, given the delay value, the channel parameters are calculated using the DC values ​​of the feedback signal and the transmitted signal.

[0040] For example, the DC values ​​of the feedback signals for the I-channel and Q-channel signals are Efb1 and Efb2, respectively, and the special sequence signal is PN, ETX. DC φ is the DC value of the transmitted signal, φ is the channel parameter, and A is the amplitude of the special sequence signal.

[0041] When the special sequence signal is positive, that is, A is A PN+ At that time, Efb1 = (ETX) DC +A PN+ )*φ;

[0042] When the special sequence signal is negative, that is, A is A PN- At that time, Efb2 = (ETX) DC -A PN- )*φ;

[0043] Based on the above formula, we can derive that (Efb1 + Efb2) / 2 = ETX DC *φ;

[0044] Therefore, the channel parameter φ = (Efb1 + Efb2) / 2 / A.

[0045] In step 103, the local oscillator leakage value of the service signal can be obtained based on the channel parameters. The formula for calculating the local oscillator leakage value is as follows:

[0046] ETX cal = (Efb1+Efb2) / 2 / φ-ETX DC

[0047] Among them, ETX cal This is the leakage value of the local oscillator.

[0048] In step 104, the service signal is calibrated based on the local oscillator leakage value. Specifically, the local oscillator leakage value can be compensated based on the local oscillator leakage calibration value to achieve local oscillator leakage calibration.

[0049] In one example, EI and EQ are the calibration values ​​for the I-channel and Q-channel signals, respectively, where EI and EQ are:

[0050] EI=ETX Cal .real

[0051] EQ = ETX Cal .imag

[0052] In one example, after calibrating the service signal based on the local oscillator leakage value, it is confirmed whether the temperature change of the chip generating the service signal exceeds a preset threshold. If the temperature change of the chip generating the service signal exceeds the preset threshold, the local oscillator leakage calibration method of this embodiment is repeated. That is, after calibrating the local oscillator leakage, if the local oscillator leakage value does not meet the calibration conditions, i.e., the local oscillator leakage calibration value has not been reached, then steps 101 to 104 above are repeated.

[0053] The iterative formula for the local oscillator leakage calibration value is as follows:

[0054] LOL n =LOL n-1 +[EIEQ]

[0055] LOL0 =

[00]

[0056] In one example, embodiments of the present invention are applied in, for example... Figure 2 The framework shown includes: a digital baseband 201, a digital-to-analog converter 202 (DAC), a low-pass filter 203, a local oscillator modulator 204, an RF bandpass filter 205, a power amplifier module 206, a local oscillator modulator 207, a low-pass filter 208, and an analog-to-digital converter 209 (ADC).

[0057] It will be understood by those skilled in the art that Figure 2 The various devices shown are for illustrative purposes only. In actual implementations, the link will also include some attenuation and matching devices, which are not shown in the figure.

[0058] Specifically, the digital baseband module 201 includes: a baseband signal, a special sequence generation module, a special sequence injection module, a transmit digital link, a feedback digital link, and special sequence and feedback related modules.

[0059] Among them, the baseband signal is the service signal generated by the radio frequency transceiver, such as the I-channel signal and the Q-channel signal.

[0060] The special sequence generation module, namely the longest linear shift register sequence, is used to generate special sequence signals.

[0061] In one example, a structural diagram of the special sequence generation module is shown below. Figure 3 As shown, it includes a modulo-2 adder 301, a feedback line connection module 302, and an output module 303.

[0062] In the feedback line connection module 302, the connection status of the feedback line is represented by c. i It means, c i =1 indicates that this line is connected, meaning that the temperature change of the chip generating the service signal exceeds a preset threshold, requiring local oscillator leakage calibration, and thus obtaining the feedback signal of the transmitted signal; c i =0 indicates that this line is disconnected, meaning that the temperature change of the chip that generates the service signal is less than or equal to the preset threshold, and there is no need to obtain the feedback signal of the transmitted signal.

[0063] The state of the ni-th stage output in output module 303 is represented by a. n-i Indicates (a) i =0 or ai =1, i = integer).

[0064] Because it is necessary to obtain the feedback signal of the transmitted signal, the input of the longest linear shift register is controlled by the output signal. Each shift results in a state, and after several shifts, a certain state will be repeated. The process then repeats itself.

[0065] The special sequence injection module is used to input the special sequence signal into the transmission digital link after the special sequence signal is generated.

[0066] In one example, a schematic diagram of the special sequence injection module is shown below. Figure 4 As shown, it includes: special sequence signals, such as PN sequence signals, adder 1, adder 2, and service signals of the transmit link, such as I-channel signal S1I and Q-channel signal S1Q.

[0067] Specifically, the PN sequence signal is added to the I-channel signal S1I and the Q-channel signal S1Q by adder 1 and adder 2 respectively, and outputs S2I and S2Q.

[0068] The transmitting digital link is used to input digital signals, i.e., baseband signals, into the digital-to-analog converter 102.

[0069] The feedback digital link is used to receive the feedback signal of the transmitted signal, wherein the feedback signal is a digital signal.

[0070] The special sequence and feedback-related modules are used to process the feedback signal and special sequence to obtain the data required for local oscillator leakage calibration.

[0071] In one example, a structural diagram of the special sequence and feedback-related modules is shown below. Figure 5 As shown, it includes:

[0072] Cdelay includes delay units, small delay units, multipliers, adders, and accumulators.

[0073] Specifically, the special sequence signal is input to the Cdelay delay unit, then passes through a small delay unit, is multiplied by the feedback signal, and then enters the adder and accumulator to obtain the delay value.

[0074] The number of small delay units is greater than or equal to 1. In specific implementations, those skilled in the art can set the number of small delay units according to actual needs. For example, the number of small delay units can be set according to the characteristics and power consumption of the device. The number shown in the figure is 32, namely D1 to D32.

[0075] The DAC102 is used to convert digital signals into analog signals.

[0076] Low-pass filter 103 is used to filter analog signals.

[0077] Local oscillator modulator 104 is used to modulate the received analog signal into a radio frequency signal, wherein the analog signal is a feedback signal of the transmitted signal.

[0078] The RF bandpass filter 105 is used to filter RF signals.

[0079] The power amplifier module 106 is used to amplify and transmit the radio frequency signal, i.e. the transmitted signal.

[0080] Local oscillator modulator 107 is used to demodulate radio frequency signals into analog signals.

[0081] Low-pass filter 108 is used to filter analog signals.

[0082] The ADC109 is used to convert analog signals into digital signals and input the digital signals into the feedback digital link.

[0083] It should be noted that the examples described above in this embodiment are merely illustrative for ease of understanding and do not constitute a limitation on the technical solution of the present invention.

[0084] The steps of the various methods described above are only for clarity. In practice, they can be combined into one step or some steps can be split into multiple steps. As long as they include the same logical relationship, they are all within the scope of protection of this patent. Adding insignificant modifications or introducing insignificant designs to the algorithm or process, but without changing the core design of the algorithm and process, are also within the scope of protection of this patent.

[0085] Another embodiment of the present invention relates to a calibration device for local oscillator leakage. The details of the calibration device for local oscillator leakage in this embodiment are described below. The following implementation details are provided for ease of understanding and are not essential for implementing this example. Figure 6 This is a schematic diagram of the local oscillator leakage calibration device described in this embodiment, including: a signal acquisition module 601, a determination module 602, a data acquisition module 603, and a calibration module 604.

[0086] Specifically, the signal acquisition module 601 is used to acquire the feedback signal of the transmitted signal; wherein the transmitted signal is obtained by conversion based on the service signal and the pre-input special sequence signal; the pre-input special sequence signal is a special sequence signal generated by the longest linear shift register sequence.

[0087] The determination module 602 is used to determine the channel parameters of the service signal through feedback signals and special sequence signals.

[0088] In one example, the determination module 602 is also used to multiply the feedback signal and the special sequence signal to obtain the delay value of the service signal; and to determine the channel parameters based on the delay value.

[0089] In one example, the determining module 602 is further configured to, after inputting a special sequence signal into multiple delay units to obtain multiple delayed special sequence signals, multiply the feedback signal by the multiple delayed special sequence signals respectively to obtain multiple delay values ​​of the service signal; calculate the average of the multiple delay values ​​and the average of the squares of the multiple delay values ​​to obtain the delay value of the service signal.

[0090] In one example, the determining module 602 is further configured to determine channel parameters based on the DC value of the feedback signal, the DC value of the transmitted signal, and the delay value after acquiring the DC value of the feedback signal and the DC value of the transmitted signal.

[0091] The data acquisition module 603 is used to acquire the local oscillator leakage value of the service signal based on the channel parameters.

[0092] In one example, the data acquisition module 603 is also used to acquire the local oscillator leakage value of the service signal based on the DC value of the feedback signal, the DC value of the transmitted signal, and the channel parameters.

[0093] The calibration module 604 is used to calibrate the service signal based on the local oscillator leakage value.

[0094] It is not difficult to see that this embodiment is a device embodiment corresponding to the above method embodiments, and this embodiment can be implemented in conjunction with the above method embodiments. The relevant technical details and technical effects mentioned in the above embodiments are still valid in this embodiment, and will not be repeated here to reduce repetition. Accordingly, the relevant technical details mentioned in this embodiment can also be applied to the above embodiments.

[0095] It is worth mentioning that all modules involved in this embodiment are logical modules. In practical applications, a logical unit can be a physical unit, a part of a physical unit, or a combination of multiple physical units. Furthermore, to highlight the innovative aspects of this invention, this embodiment does not introduce units that are not closely related to solving the technical problem proposed by this invention; however, this does not mean that other units are absent from this embodiment.

[0096] Another embodiment of the present invention relates to an electronic device, such as Figure 7As shown, it includes: at least one processor 701; and a memory 702 communicatively connected to the at least one processor 701; wherein the memory 702 stores instructions executable by the at least one processor 701, the instructions being executed by the at least one processor 701 to enable the at least one processor 701 to perform the local oscillator leakage calibration method in the above embodiments.

[0097] The memory and processor are connected via a bus, which can include any number of interconnecting buses and bridges, connecting various circuits of one or more processors and memories. The bus can also connect various other circuits, such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and will not be described further herein. The bus interface provides an interface between the bus and the transceiver. The transceiver can be a single element or multiple elements, such as multiple receivers and transmitters, providing a unit for communicating with various other devices over a transmission medium. Data processed by the processor is transmitted over the wireless medium via an antenna, which further receives data and transmits it to the processor.

[0098] The processor manages the bus and general processing, and also provides various functions, including timing, peripheral interfaces, voltage regulation, power management, and other control functions. Memory is used to store data used by the processor during operation.

[0099] Another embodiment of the present invention relates to a computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the method embodiments described above.

[0100] That is, those skilled in the art will understand that all or part of the steps in the methods of the above embodiments can be implemented by a program instructing related hardware. This program is stored in a storage medium and includes several instructions to cause a device (which may be a microcontroller, chip, etc.) or processor to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, a portable hard drive, a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0101] Those skilled in the art will understand that the above embodiments are specific examples of implementing the present invention, and in practical applications, various changes in form and detail may be made without departing from the spirit and scope of the present invention.

Claims

1. A method of calibrating a local oscillator leakage, characterized by, The method comprises: acquiring a feedback signal of a transmitted signal; the transmitted signal is converted based on a service signal and a pre-input special sequence signal; the pre-input special sequence signal is a special sequence signal generated by a longest linear shift register sequence; determining a channel parameter of the service signal through the feedback signal and the special sequence signal; acquiring a local oscillator leakage value of the service signal according to the channel parameter; calibrating the service signal according to the local oscillator leakage value.

2. The method of calibrating local oscillator leakage according to claim 1, wherein, Before the acquiring of the feedback signal of the transmitted signal, the method further comprises: confirming that a temperature change of a chip generating the service signal exceeds a preset threshold.

3. The method of calibrating local oscillator leakage according to claim 2, wherein, The determining of the channel parameter of the service signal through the feedback signal and the special sequence signal comprises: multiplying the feedback signal and the special sequence signal to obtain a time delay value of the service signal; determining the channel parameter according to the time delay value.

4. The method of calibrating local oscillator leakage according to claim 3, wherein, Before the multiplying of the feedback signal and the special sequence signal to obtain the time delay value of the service signal, the method further comprises: inputting the special sequence signal into a plurality of time delay devices to obtain a plurality of time-delayed special sequence signals; the multiplying of the feedback signal and the special sequence signal to obtain the time delay value of the service signal comprises: multiplying the feedback signal and the plurality of time-delayed special sequence signals respectively to obtain a plurality of time delay values of the service signal; calculating an average value of the plurality of time delay values and an average value of squares of the plurality of time delay values to obtain the time delay value of the service signal.

5. The method of calibrating local oscillator leakage according to claim 3, wherein, Before the determining of the channel parameter according to the time delay value, the method further comprises: acquiring a direct current value of the feedback signal and a direct current value of the transmitted signal; the determining of the channel parameter according to the time delay value comprises: determining the channel parameter according to the direct current value of the feedback signal, the direct current value of the transmitted signal and the time delay value.

6. The method of calibrating local oscillator leakage according to claim 5, wherein, The acquiring of the local oscillator leakage value of the service signal according to the channel parameter comprises: acquiring the local oscillator leakage value of the service signal according to the direct current value of the feedback signal, the direct current value of the transmitted signal and the channel parameter.

7. The method of calibration of local oscillator leakage according to any one of claims 1 to 6, characterized in that, After the calibrating of the service signal according to the local oscillator leakage value, the method further comprises: confirming whether the temperature change of the chip generating the service signal exceeds the preset threshold; in the case that the temperature change of the chip generating the service signal exceeds the preset threshold, repeatedly executing the method.

8. A device for calibrating a local oscillator leakage, characterized in that The method comprises: a signal acquisition module, configured to acquire a feedback signal of a transmitted signal; the transmitted signal is converted based on a service signal and a pre-input special sequence signal; the pre-input special sequence signal is a special sequence signal generated by a longest linear shift register sequence; a determination module, configured to determine a channel parameter of the service signal through the feedback signal and the special sequence signal; a data acquisition module, configured to acquire a local oscillator leakage value of the service signal according to the channel parameter; a calibration module, configured to calibrate the service signal according to the local oscillator leakage value.

9. An electronic device, comprising: The method comprises: at least one processor; and a memory connected in communication with the at least one processor; wherein The memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the method of calibrating a local oscillator leakage as claimed in any one of claims 1 to 7.

10. A computer readable storage medium storing a computer program, characterized in that, The computer program, when executed by a processor, implements the method of calibrating a local oscillator leakage as claimed in any one of claims 1 to 7.

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