A spark avoidance circuit for a thermal measurement platform of low-energy high-intensity ion beams

Abstract

The present invention relates to a sparking avoidance circuit for a thermal measurement platform of a low-energy high-intensity ion beam, comprising: a first-level electrical device arranged on the ground potential surface, a second-level electrical device arranged on a high-voltage platform, and an ion source as a third-level electrical device; the first-level electrical device includes an AC power supply device, a first control cabinet, a first DC power supply cabinet, and a first-level DC load; the second-level electrical device includes a second control cabinet, a second DC power supply cabinet, a third DC power supply cabinet, and a second-level DC load; the AC power supply device supplies power to the first control cabinet, the first DC power supply cabinet, the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet; the first DC power supply cabinet supplies power to the first-level DC load; the second DC power supply cabinet supplies power to the second-level DC load; the third DC power supply cabinet supplies power to the ion source; the ion source is isolated from the second-level DC load; and the second-level DC load is isolated from the first-level DC load.

Description

Technical Field

[0001] The present invention relates to the technical field of accelerators, and particularly to a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform. Background Art

[0002] The development and application of particle accelerators have played an irreplaceable role in enabling humans to study the structure, interactions, and laws of motion of matter at the atomic nucleus level, and have made unique contributions to answering two fundamental long-term exploration questions regarding the basic structure of matter and the origin of the universe.

[0003] However, with the development of accelerators towards higher voltages, higher (particle beam) intensities, etc., the inventors of the present application have found in their research that some existing accelerators have the phenomenon of equipment damage caused by high-voltage sparking problems after the system runs. Therefore, it is necessary to redesign the circuits of these accelerator devices. Summary of the Invention

[0004] In view of the above problems, the purpose of the present invention is to provide a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform, which can effectively avoid the phenomenon of equipment damage caused by high voltage or high current in the low-energy high-intensity ion beam thermal measurement platform, and provide a reference for the electromagnetic compatibility design of the same type of accelerator devices.

[0005] To achieve the above purpose, the present invention adopts the following technical solutions:

[0006] In a first aspect, the present application provides a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform, including: a primary electrical device arranged on the ground potential surface, a secondary electrical device arranged on the high-voltage platform, and an ion source serving as a tertiary electrical device arranged on the beam tube;

[0007] The primary electrical device includes an AC power supply device, a first control cabinet, a first DC power supply cabinet, and primary DC loads distributed on the beam tube;

[0008] The secondary electrical device includes a second control cabinet, a second DC power supply cabinet, a third DC power supply cabinet, and secondary DC loads distributed on the beam tube;

[0009] The AC power supply device is used to provide AC power supply for the first control cabinet, the first DC power supply cabinet, the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet respectively;

[0010] The first DC power supply cabinet is used to rectify the input alternating current and provide DC power supply for the primary DC loads;

[0011] The second DC power cabinet is used to rectify the input alternating current and supply DC power to the secondary DC load.

[0012] The third DC power cabinet is used to rectify the input alternating current and supply DC power to the ion source.

[0013] The ion source and the secondary DC load are isolated by an electrical isolation device.

[0014] The secondary DC load and the primary DC load are isolated by an electrical isolation device.

[0015] In an implementation manner of the present application, the AC power supply device includes a power distribution cabinet, a first distribution box, a first high-voltage DC power supply, an isolation transformer, and a second distribution box.

[0016] The power distribution cabinet is connected to the first distribution box, and the first distribution box is used to supply AC power to the first control cabinet and the first DC power cabinet respectively.

[0017] The power distribution cabinet is connected to the first high-voltage DC power supply, and the first high-voltage DC power supply is used to provide a ground signal to the high-voltage platform, and the ground signal voltage of the high-voltage platform is higher than the voltage of the ground potential surface.

[0018] The power distribution cabinet is connected to the isolation transformer; the isolation transformer is connected to the second distribution box; the second distribution box is used to supply AC power to the second control cabinet, the second DC power cabinet, and the third DC power cabinet respectively.

[0019] In an implementation manner of the present application, the third DC power cabinet is connected to the second DC power cabinet; the ground signal voltage of the ion source as a three-level electrical device is higher than the ground signal voltage of the high-voltage platform.

[0020] In an implementation manner of the present application, the ground potential surface, the high-voltage platform, and the ion source respectively correspond to a grounding bar for grounding connection of electrical devices at corresponding levels.

[0021] In an implementation manner of the present application, the high-voltage platform is connected to the corresponding grounding bar through a grounding wire.

[0022] The grounding bar corresponding to the ion source is connected to the stand for carrying the ion source through a grounding wire.

[0023] In an implementation manner of the present application, the grounding bar corresponding to the ion source and the grounding bar corresponding to the high-voltage platform are connected through an electromagnetic compatibility device.

[0024] In an implementation manner of the present application, the power distribution cabinet is connected to the ground potential surface through a filter for the power supply cable that supplies power to the first high-voltage DC power supply;

[0025] The power supply cable that supplies power to the first control cabinet by the first distribution box is connected to the ground potential surface through a filter;

[0026] The power supply cable that supplies power to the second control cabinet by the second distribution box is connected to the ground signal of the high-voltage platform through a filter.

[0027] In an implementation manner of the present application, the first distribution box supplies power to the DC power supplies of multiple first-level DC loads through a power distribution unit;

[0028] The second distribution box supplies power to the DC power supplies of multiple second-level DC loads through a power distribution unit;

[0029] A surge protector is integrated in the power distribution unit.

[0030] In an implementation manner of the present application, the first control cabinet is used to load magnetic rings on the control cables of the first DC power cabinet; the second control cabinet is used to load magnetic rings on the control cables of the second DC power cabinet.

[0031] In an implementation manner of the present application, the first control cabinet and the second control cabinet are interconnected through an optical fiber cable to perform the interaction of coordinated control signals.

[0032] Due to the adoption of the above technical solutions, the present invention has the following advantages: The arc ignition avoidance circuit for the low-energy high-current ion beam thermal measurement platform provided in the solution of the present invention application designs the circuit from the perspective of electromagnetic compatibility, and classifies the electrical equipment in the circuit into electrical equipment from the first level to the third level. Among them, the first-level electrical equipment includes AC power supply equipment, the first control cabinet, the first DC power cabinet, and the first-level DC load, and the second-level electrical equipment includes the second control cabinet, the second DC power cabinet, the third DC power cabinet, and the second-level DC load; the AC power supply equipment supplies power to the first control cabinet, the first DC power cabinet, the second control cabinet, the second DC power cabinet, and the third DC power cabinet; the first DC power cabinet supplies power to the first-level DC load; the second DC power cabinet supplies power to the second-level DC load; the third DC power cabinet supplies power to the ion source, and at the same time the ion source is isolated from the second-level DC load; the second-level DC load is isolated from the first-level DC load, which can effectively avoid the mutual crosstalk between signals caused by high voltage or high current of different-level electrical equipment, and can effectively avoid the phenomenon of arc ignition and equipment damage caused by high voltage or high current in the low-energy high-current ion beam thermal measurement platform, providing a reference for the electromagnetic compatibility design of the same type of accelerator device. Description of the Drawings

[0033] Figure 1 It is a schematic diagram of the electrical connection structure for the power distribution and wiring of a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform provided by an embodiment of the present application;

[0034] Figure 2 It is a schematic diagram of the grounding design of a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform in an embodiment of the present application. Detailed implementation manners

[0035] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the described embodiments of the present invention fall within the scope of protection of the present invention.

[0036] In view of the phenomenon that existing accelerators are damaged due to high-voltage sparking problems after operation, the present application correspondingly provides a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform, including: a first-level electrical device arranged on the ground potential surface, a second-level electrical device arranged on a high-voltage platform, and an ion source serving as a third-level electrical device arranged on a beam tube; the first-level electrical device includes an AC power supply device, a first control cabinet, a first DC power supply cabinet, and first-level DC loads distributed on the beam tube; the second-level electrical device includes a second control cabinet, a second DC power supply cabinet, a third DC power supply cabinet, and second-level DC loads distributed on the beam tube; the AC power supply device is used to supply AC power to the first control cabinet, the first DC power supply cabinet, the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet respectively; the first DC power supply cabinet is used to rectify the input alternating current and supply DC power to the first-level DC loads; the second DC power supply cabinet is used to rectify the input alternating current and supply DC power to the second-level DC loads; the third DC power supply cabinet is used to rectify the input alternating current and supply DC power to the ion source; the ion source is isolated from the second-level DC loads through an electrical isolation device; the second-level DC loads are isolated from the first-level DC loads through an electrical isolation device. The technical solution of the present application can effectively avoid the phenomenon of equipment damage caused by sparking due to circuit design based on electromagnetic compatibility.

[0037] Please refer to Figure 1 In an embodiment of the present application, a spark avoidance circuit for a low-energy high-intensity ion beam thermal measurement platform is provided.

[0038] The low-energy high-intensity ion beam thermal measurement platform involved in the embodiments of the present application can be regarded as an accelerator device with low energy (for example, the energy obtained by ion acceleration is less than 100 MeV), high intensity (for example, the beam current is not less than 10 mA), and high voltage (for example, higher than 100 kV). It can be used to generate particle beam currents with required parameters for physical experiments, and collect, analyze, and process experimental data during the operation of the system.

[0039] As described in the background art, due to the high-voltage and high-beam-current attributes of the devices in the accelerator device, strong electromagnetic interference signals generated by arcing may exist between the devices, causing cross-talk between the devices and resulting in device damage. To this end, the present application is based on a hierarchical electrical circuit design to avoid cross-talk between devices at different levels.

[0040] Specifically, as Figure 1 , the arcing avoidance circuit for the low-energy high-intensity ion beam thermal measurement platform in the embodiments of the present application includes: a first-level electrical device arranged on the ground potential surface, a second-level electrical device arranged on the high-voltage platform, and an ion source serving as a third-level electrical device arranged on the beam tube.

[0041] For example, the ground potential surface can be, but is not limited to, a steel frame or platform and is connected to the true ground signal. The first-level electrical device is arranged on the ground potential surface, which means that the metal shell for electromagnetic shielding of the first-level electrical device is arranged on the ground potential surface, or the grounding signal of the first-level electrical device is connected to this ground potential surface. The second-level electrical device is arranged on the high-voltage platform, which means that the metal shell of the second-level electrical device is arranged on the high-voltage platform, or the grounding signal of the second-level electrical device is connected to this high-voltage platform, and this high-voltage platform can be connected to a high-voltage DC signal as the ground of the second-level electrical device. Similarly, the ion source of the third-level electrical device can be arranged on the corresponding stand of the third-level electrical device, and this stand serves as the ground of the third-level electrical device. In the embodiments of the present application, the ground potential surface is connected to the true ground signal and can be regarded as 0 V, while the ground of the high-voltage platform can be 200 kV higher than the ground potential surface, and the stand serving as the ground of the third-level device can be 40 kV higher than the high-voltage platform.

[0042] In the embodiments of the present application, the first-level electrical device includes an AC power supply device, a first control cabinet K1, a first DC power supply cabinet U1, and first-level DC loads distributed on the beam tube.

[0043] The second-level electrical device includes a second control cabinet K2, a second DC power supply cabinet U2, a third DC power supply cabinet U3, and second-level DC loads distributed on the beam tube.

[0044] Specifically, the AC power supply device is used to supply AC power to the first control cabinet K1, the first DC power supply cabinet U1, the second control cabinet K2, the second DC power supply cabinet U2, and the third DC power supply cabinet U3 respectively.

[0045] Further, as Figure 1 , an AC power supply device includes a power distribution cabinet, a first distribution box 1, a first high-voltage DC power supply (such as DC 200 kV), an isolation transformer, and a second distribution box 2.

[0046] Among them, the power distribution cabinet is connected to the first distribution box 1, and the first distribution box 1 is used to supply AC power to the first control cabinet K1 and the first DC power cabinet U1 respectively.

[0047] The power distribution cabinet is connected to the first high-voltage DC power supply, and the first high-voltage DC power supply is used to provide a ground signal to the high-voltage platform, and the ground signal voltage of the high-voltage platform is higher than the voltage of the ground potential surface.

[0048] One end of the isolation transformer is connected to the power distribution cabinet, and the other end of the isolation transformer is connected to the second distribution box 2; the second distribution box 2 is used to supply AC power to the second control cabinet K2, the second DC power cabinet U2, and the third DC power cabinet U3 respectively. The third DC power cabinet U3 is connected to the second DC power cabinet U2; the ground signal voltage of the ion source as a three-level electrical device is higher than the ground signal voltage of the high-voltage platform.

[0049] In the design of the power distribution line, further, the power supply cable for the first high-voltage DC power supply U1 by the power distribution cabinet is connected to the ground potential surface through a 20 A filter. The power supply cable for the first control cabinet K1 by the first distribution box 1 is connected to the ground potential surface through a 20 A filter. The power supply cable for the second control cabinet K2 by the second distribution box is connected to the ground signal of the high-voltage platform through a 10 A filter.

[0050] The first DC power cabinet U1 is used to rectify the input alternating current and supply DC power to the first-level DC load; the second DC power cabinet U2 is used to rectify the input alternating current and supply DC power to the second-level DC load; the third DC power cabinet U3 is used to rectify the input alternating current and supply DC power to the ion source.

[0051] Further, the primary DC load and the secondary DC load are distributed at different positions of the beam tube. The primary DC load and the secondary DC load can be multiple loads or have multiple identical loads. Different loads can be, but are not limited to, in one identical component. For example, the primary DC load can include: Q1 iron, Q2 iron, Q3 iron, dipole iron, solenoid, molecular pump, Faraday cup, etc. The secondary DC load can include wire tube, molecular pump, Faraday cup, etc. Among them, Q1 iron, Q2 iron, Q3 iron, dipole iron, and solenoid are used to generate specific required magnetic field signals, the molecular beam is used to create the required vacuum in the beam tube, and the Faraday cup is used to detect the particle beam current intensity in the beam tube at different positions. It is easy to understand that different DC loads require different DC power supplies for DC power supply. In this application, the DC power supply corresponding to the primary DC load is concentrated in the first DC power cabinet U1, and the DC power supply corresponding to the secondary DC load is concentrated in the second DC power cabinet U2.

[0052] In the embodiment of this application, the first distribution box can supply power to the DC power supplies of multiple primary DC loads through a power distribution unit (PDU); and the second distribution box can supply power to the DC power supplies of multiple secondary DC loads through a power distribution unit (PDU). At the same time, a surge protector can be integrated in the power distribution unit to avoid mutual crosstalk of the power signal lines.

[0053] In the embodiment of this application, a computer, working condition machine 1, working condition machine 2, and switch can be integrated in the first control cabinet K1. The first control cabinet K1 controls the power equipment in the first DC power cabinet based on the control cable. The first control cabinet K1 is used to load magnetic rings on the control cable of the first DC power cabinet U1. Similarly, the second control cabinet K2 controls the power equipment in the second DC power cabinet U2 based on the control cable. The second control cabinet K2 is used to load magnetic rings on the control cable of the second DC power cabinet U2. Here, loading magnetic rings on the control cable can serve as an anti-interference component in the electronic circuit, which can well avoid the influence of high-frequency noise caused by arcing on the control circuit, thereby avoiding abnormalities in the system functions.

[0054] In an embodiment of this application, since the first control cabinet K1 and the second control cabinet K2 need to cooperate in controlling the DC power supplies of different DC loads, and the first control cabinet K1 and the second control cabinet K2 belong to devices of different levels. To avoid interference between the two control cabinets caused by high-voltage and high-frequency electrical signals, it is designed here that the first control cabinet K1 and the second control cabinet K2 are connected to each other through an optical fiber cable, and coordinated control signal interaction is carried out based on optical signals, thereby avoiding electrical signal interference.

[0055] In the embodiments of the present application, an ion source, which can be, for example, an ECR ion source, is used to generate an ion beam of a required type and initial energy in a beam tube.

[0056] Generally understood, the ion source, the first-level DC load, and the second-level DC load can all be regarded as DC loads distributed on the beam tube, and the distributed regions and the corresponding ground signals are different. It is found in the research that the ion source is the load that is relatively most likely to generate arcing. When arcing occurs, the ion source is likely to generate interfering electromagnetic signals to the second-level DC load, and further, the second-level DC load generates interfering electromagnetic signals to the first-level DC load. Therefore, in the embodiments of the present application, the ion source and the second-level DC load are isolated by electrical isolation devices, such as isolation ceramics 1 and isolation ceramics 2; and the second-level DC load and the first-level DC load are isolated by an electrical isolation device (isolation ceramic 3), so as to avoid the interference of electrical signals between the loads.

[0057] Through the hierarchical electrical circuit design in the above embodiments of the present application, and the separation of strong and weak electricity to avoid crosstalk problems between different types of cables, and the mutual isolation of loads at different levels, further avoiding crosstalk between loads, thus avoiding interference between lines and protecting the equipment.

[0058] In the embodiments of the present application, it is found through research that the strong electromagnetic interference signals generated by high-voltage arcing can be further transmitted and eliminated through the design of the ground wire, thereby further protecting the equipment.

[0059] Specifically, in the embodiments of the present application, the first-level electrical equipment, the second-level electrical equipment, and the third-level electrical equipment respectively correspond to a grounding busbar.

[0060] Such as Figure 2As shown in the figure, the single-point grounding method is adopted. Three grounding buses (GND3, GND2, and GND1 respectively) are set for the 40 kV high-voltage platform, high-voltage stage, and ground potential surface. Equipment at different levels is connected to the corresponding grounding bus to avoid and mitigate the possibility of strong electromagnetic interference generated by high-voltage arcing crosstalking arbitrarily through the ground wire, achieving the goal of self-protection where arcing occurs and effectively avoiding equipment damage caused by high-voltage arcing. First, the grounding bus of the first-level ground potential surface is connected to the true ground through the grounding wire. The equipment on the ground potential surface is connected to the grounding bus of the ground potential surface, and electromagnetic compatibility components are installed at some positions. Secondly, the grounding bus of the second-level high-voltage platform is designed. The equipment on the high-voltage platform is connected to the grounding bus of the high-voltage platform. Among them, a low-impedance grounding wire is used to connect between the high-voltage platform and the 200 kV high-voltage power supply of the first-level ground potential surface, effectively avoiding the influence of strong electromagnetic interference generated by second-level high-voltage arcing on the first-level equipment. Finally, the grounding bus of the third-level 40 kV high-voltage platform is designed. The equipment on the 40 kV high-voltage platform is connected to the grounding bus of the 40 kV high-voltage platform. At the same time, grounding wires are led out near both ends of the 40 kV high-voltage platform and connected to the grounding bus of the third-level 40 kV high-voltage platform, effectively avoiding the influence of strong electromagnetic interference generated by third-level high-voltage arcing on second-level equipment and even backend equipment. A grounding wire with electromagnetic compatibility components installed in the middle is used to connect between the third level and the second level.

[0061] The arcing avoidance circuit for the low-energy high-intensity ion beam current thermal measurement platform provided in the embodiments of the present application above has also been verified by EMI experiments. After verification, the controllable interference signals are transmitted according to the designed routing of the scheme, effectively reducing the crosstalking problem between levels. At the same time, by controlling the signal transmission path, the situation where strong electromagnetic interference generated by high-voltage arcing damages equipment at all levels is avoided. In a test scenario, the platform can achieve the effect of continuous operation for three weeks without arcing.

[0062] In summary, the arc ignition avoidance circuit provided by the embodiment of the present application for the low-energy high-intensity ion beam thermal measurement platform is designed from the perspective of electromagnetic compatibility. The electrical equipment in the circuit is divided into first-level to third-level electrical equipment. Among them, the first-level electrical equipment includes an AC power supply device, a first control cabinet, a first DC power supply cabinet, and a first-level DC load. The second-level electrical equipment includes a second control cabinet, a second DC power supply cabinet, a third DC power supply cabinet, and a second-level DC load; the AC power supply device supplies power to the first control cabinet, the first DC power supply cabinet, the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet; the first DC power supply cabinet supplies power to the first-level DC load; the second DC power supply cabinet supplies power to the second-level DC load; the third DC power supply cabinet supplies power to the ion source, and at the same time, the ion source is isolated from the second-level DC load; the second-level DC load is isolated from the first-level DC load, which can effectively avoid the mutual crosstalk between signals caused by high voltage or high current in different-level electrical equipment, and can effectively avoid the phenomenon of equipment damage caused by arc ignition due to high voltage or high current in the low-energy high-intensity ion beam thermal measurement platform, providing a reference for the electromagnetic compatibility design of the same type of accelerator device.

[0063] In several embodiments provided by the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the above division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed mutual coupling, direct coupling, or communication connection can be through some interfaces, indirect coupling, or communication connection of devices or units, and can be in electrical, mechanical, or other forms.

[0064] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A spark avoidance circuit for a thermal measurement platform of a low-energy high-intensity ion beam, characterized in that, Comprising: A first-level electrical device disposed on the ground potential surface, a second-level electrical device disposed on the high-voltage platform, and an ion source serving as a third-level electrical device disposed on the beam tube; The first-level electrical device includes an AC power supply device, a first control cabinet, a first DC power supply cabinet, and first-level DC loads distributed on the beam tube; The second-level electrical device includes a second control cabinet, a second DC power supply cabinet, a third DC power supply cabinet, and second-level DC loads distributed on the beam tube; The AC power supply device is used to supply AC power to the first control cabinet, the first DC power supply cabinet, the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet respectively; The first DC power supply cabinet is used to rectify the input AC power and supply DC power to the first-level DC loads; The second DC power supply cabinet is used to rectify the input AC power and supply DC power to the second-level DC loads; The third DC power supply cabinet is used to rectify the input AC power and supply DC power to the ion source; The ion source is isolated from the second-level DC loads by an electrical isolation device; The second-level DC loads are isolated from the first-level DC loads by an electrical isolation device; The ground potential surface, the high-voltage platform, and the ion source respectively correspond to a grounding bus for grounding connection of electrical devices at corresponding levels; The high-voltage platform is connected to the corresponding grounding bus by a grounding wire; The grounding bus corresponding to the ion source is connected to the pedestal for carrying the ion source by a grounding wire; The grounding bus corresponding to the ion source is connected to the grounding bus corresponding to the high-voltage platform through an electromagnetic compatibility device.

2. The arc suppression circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 1, wherein The AC power supply device includes a power distribution cabinet, a first distribution box, a first high-voltage DC power supply, an isolation transformer, and a second distribution box; The power distribution cabinet is connected to the first distribution box, and the first distribution box is used to supply AC power to the first control cabinet and the first DC power supply cabinet respectively; The power distribution cabinet is connected to the first high-voltage DC power supply, and the first high-voltage DC power supply is used to provide a ground signal to the high-voltage platform, and the ground signal voltage of the high-voltage platform is higher than the voltage of the ground potential surface; The power distribution cabinet is connected to the isolation transformer; the isolation transformer is connected to the second distribution box; the second distribution box is used to supply AC power to the second control cabinet, the second DC power supply cabinet, and the third DC power supply cabinet respectively.

3. The sparking avoidance circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 2, wherein The third DC power supply cabinet is connected to the second DC power supply cabinet; the ground signal voltage of the ion source serving as a third-level electrical device is higher than the ground signal voltage of the high-voltage platform.

4. The arc suppression circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 3, wherein, The power supply cable for the power distribution cabinet to supply power to the first high-voltage DC power supply is connected to the ground potential surface through a filter; The power supply cable for the first distribution box to supply power to the first control cabinet is connected to the ground potential surface through a filter; The power supply cable for the second distribution box to supply power to the second control cabinet is connected to the ground signal of the high-voltage platform through a filter.

5. The arc suppression circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 3, characterized in that, The first distribution box supplies DC power to the DC power supplies of multiple first-level DC loads through a power distribution unit; The second distribution box supplies DC power for the DC power supplies of multiple secondary DC loads through a power distribution unit; A surge protector is integrated in the power distribution unit.

6. The arc strike avoidance circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 3, characterized in that, The first control cabinet is used to load ferrite beads on the control cables of the first DC power cabinet; the second control cabinet is used to load ferrite beads on the control cables of the second DC power cabinet.

7. The arc suppression circuit for the low-energy high-intensity ion beam thermal measurement platform according to claim 6, wherein The first control cabinet and the second control cabinet are interconnected through an optical fiber cable to exchange coordinated control signals.

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