Accelerated test method, apparatus, electronic device, and storage medium

Abstract

Embodiments of the present application provide an accelerated test method, device, electronic equipment and storage medium. The method calculates a sub-acceleration coefficient corresponding to each sub-time period according to temperature data of each sub-time period in a prediction history period of a reference test area, and a preset accelerated test condition and a preset test acceleration model, so as to simulate real aging data of a device in each sub-time period in the reference test area. Then, the method calculates a corresponding test acceleration coefficient in a preset time period according to the sub-acceleration coefficient corresponding to each sub-time period, so that the test acceleration coefficient is more accurate. Therefore, based on the test acceleration coefficient and a preset use cycle number, a test cycle number is calculated, and the device to be tested is tested according to the test cycle number. The test result can more accurately predict the actual use result of the device to be tested in the reference test area, thereby improving the accuracy of the test result of the accelerated test.

Description

Technical Field

[0001] This invention relates to the field of accelerated testing technology, and in particular to an accelerated testing method, apparatus, electronic device, and storage medium. Background Technology

[0002] Existing accelerated aging tests typically calculate an equivalent ambient temperature and then conduct the test in an environment with that equivalent temperature. This simulates the aging process of equipment under constant temperature conditions. However, in actual use, the external environment is temperature-dependent. Therefore, the calculation of the acceleration factor in existing accelerated aging tests has significant deviations, leading to inaccurate test results.

[0003] Therefore, how to solve the low accuracy of test results in existing accelerated aging tests has become an urgent technical problem to be solved. Summary of the Invention

[0004] This invention provides an accelerated testing method, apparatus, electronic device, and storage medium, aiming to improve the accuracy of test results in accelerated aging tests of equipment.

[0005] In a first aspect, embodiments of the present invention provide an accelerated testing method, the accelerated testing method comprising:

[0006] Obtain temperature data for a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods.

[0007] Based on the preset acceleration test conditions, the preset test acceleration model and the temperature data corresponding to each of the sub-time periods, calculate the sub-acceleration coefficient corresponding to each of the sub-time periods.

[0008] Based on the sub-acceleration coefficients corresponding to each of the sub-time periods, calculate the test acceleration coefficients corresponding to the preset historical time periods;

[0009] The number of test cycles is calculated based on the preset number of usage cycles and the test acceleration coefficient;

[0010] In the environment corresponding to the preset accelerated test conditions, the device under test is subjected to accelerated testing based on the number of test cycles to obtain test results.

[0011] Secondly, embodiments of the present invention also provide a testing apparatus, the testing apparatus comprising:

[0012] The temperature data acquisition module is used to acquire temperature data of a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods.

[0013] The sub-acceleration coefficient calculation module is used to calculate the sub-acceleration coefficient corresponding to each sub-time period based on preset acceleration test conditions, preset test acceleration model and temperature data corresponding to each sub-time period.

[0014] The test acceleration coefficient calculation module is used to calculate the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods.

[0015] The test loop count calculation module is used to calculate the test loop count based on the preset number of use loops and the test acceleration coefficient;

[0016] The accelerated testing module is used to perform accelerated testing on the device under test in the environment corresponding to the preset accelerated testing conditions, based on the number of test cycles, so as to obtain the test results.

[0017] Thirdly, embodiments of the present invention also provide an electronic device, characterized in that the electronic device includes a processor, a memory, and a computer program stored in the memory and executable by the processor, wherein when the computer program is executed by the processor, it implements the testing method described above.

[0018] Fourthly, embodiments of the present invention also provide a computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program, which, when executed by a processor, causes the processor to implement the steps of the test method as described above.

[0019] This invention provides an accelerated testing method, apparatus, electronic device, and storage medium. The accelerated testing method includes acquiring temperature data of a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods; calculating a sub-acceleration coefficient corresponding to each sub-time period based on preset accelerated testing conditions, a preset accelerated testing model, and the temperature data corresponding to each sub-time period; calculating a test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficients corresponding to each sub-time period; calculating a test cycle number based on a preset number of usage cycles and the test acceleration coefficients; and performing accelerated testing on the device under test in the environment corresponding to the preset accelerated testing conditions, based on the number of test cycles, to obtain test results.

[0020] By using the above method, based on the temperature data of each sub-time period in the reference test area within the predicted historical time period, as well as the preset accelerated test conditions and preset accelerated test model, the sub-acceleration coefficient corresponding to each sub-time period is calculated. This can simulate the actual aging data of the equipment in the reference test area within each sub-time period. Then, based on the sub-acceleration coefficient corresponding to each sub-time period, the test acceleration coefficient corresponding to the preset time period is calculated, making the test acceleration coefficient more accurate. Therefore, based on the test acceleration coefficient and the preset number of usage cycles, the number of test cycles is calculated, and the accelerated test is performed on the equipment under test according to the number of test cycles. The test results can more accurately predict the actual usage results of the equipment under test in the reference test area, thereby improving the accuracy of the accelerated test results. Attached Figure Description

[0021] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0022] Figure 1 This is a flowchart illustrating a first embodiment of an accelerated testing method provided in this application.

[0023] Figure 2 This is a flowchart illustrating a second embodiment of an accelerated testing method provided in this application.

[0024] Figure 3 This is a schematic diagram of the structure of a testing device provided in this application;

[0025] Figure 4 This is a schematic block diagram of the structure of an electronic device provided in an embodiment of this application.

[0026] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0027] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0028] The flowchart shown in the attached diagram is for illustrative purposes only and does not necessarily include all content and operations / steps, nor does it necessarily have to be performed in the order described. For example, some operations / steps can be broken down, combined, or partially merged, so the actual execution order may change depending on the actual situation.

[0029] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0030] Embodiments of this application provide an accelerated testing method, apparatus, electronic device, and storage medium. Based on temperature data from multiple sub-time periods within a preset historical time period in a reference test area, a sub-acceleration coefficient is calculated for each sub-time period. Then, a test acceleration coefficient corresponding to the preset historical time period is calculated based on each sub-acceleration coefficient, making the test acceleration coefficient more accurate. Therefore, the accelerated test results of the device more closely resemble the actual usage of the device in the reference test area, improving the accuracy of the accelerated test results.

[0031] Please refer to Figure 1 , Figure 1 This is a flowchart illustrating a first embodiment of an accelerated testing method provided in this application. The method can be applied to electronic devices.

[0032] like Figure 1 As shown, the accelerated testing method includes steps S101 to S105.

[0033] Step S101: Obtain temperature data of the reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods;

[0034] In this embodiment, the proposed solution calculates the acceleration factor of the accelerated aging test based on the actual ambient temperature of the reference test area, and then calculates the number of test cycles. Therefore, it is necessary to first obtain the historical ambient temperature data of the test area.

[0035] For example, the reference test area can be a region where the device under test may be used, such as a city or a mountainous area; or it can be a region with a special environment, such as a plateau, desert, or ocean. For example, assuming that the device under test may be sold to a certain region in the future, that region can be used as the reference test area, and temperature data of that region over a preset historical period can be obtained for accelerated aging testing.

[0036] In one embodiment, the sub-time periods of the preset historical time period are evenly distributed.

[0037] In one embodiment, within a preset historical time period, the sub-time periods are evenly set, and each sub-time period can be considered as a cycle.

[0038] For example, the preset historical time period can be a historical year, and the sub-time period can be each day within the historical year, that is, each 24-hour period is a sub-time period.

[0039] For example, the temperature data can be hourly temperature data within a preset historical time period, that is, the ambient temperature for each hour within a historical year.

[0040] Step S102: Based on the preset acceleration test conditions, the preset test acceleration model, and the temperature data corresponding to each of the sub-time periods, calculate the sub-acceleration coefficient corresponding to each of the sub-time periods;

[0041] In one embodiment, based on preset acceleration test conditions and temperature data corresponding to each sub-time period, the acceleration coefficient of each sub-time period is calculated by a predictive test acceleration model to obtain the sub-acceleration coefficient corresponding to each sub-time period.

[0042] For example, preset accelerated testing conditions may include test temperature, test time, etc.

[0043] In one embodiment, the preset test acceleration model can be a component temperature cycling test acceleration model or a solder joint temperature cycling test acceleration model.

[0044] The component temperature cycling test acceleration model is used to accelerate the testing of the whole machine / components of the equipment under test, and the solder joint temperature cycling test acceleration model is used to accelerate the testing of solder joints or bonding wires of active components in the equipment under test.

[0045] For example, the accelerated model for component temperature cycling testing can be the Coffin-Manson accelerated model, which is mainly used for accelerated testing of the whole machine / component. The Coffin-Manson accelerated model is an inverse power law model, in which the component life is inversely proportional to the power of the ambient temperature stress.

[0046] The mathematical expression for the Coffin-Manson accelerated model is as follows:

[0047]

[0048] Where AF is the acceleration coefficient, ΔTt is the temperature difference in the accelerated test, and ΔT o It is the temperature difference between the highest and lowest temperatures within each sub-time period.

[0049] For example, the accelerated model for solder joint temperature cycling test can be the NORRIS-LANZBERG accelerated model, which is mainly used to accelerate the testing of solder joints / bond lines of components. The NORRIS-LANZBERG accelerated model is suitable for analyzing the fatigue failure of solder joints caused by temperature cycling during repeated switching of the device.

[0050] The mathematical expression for the NORRIS-LANZBERG accelerated model is as follows:

[0051]

[0052] Among them, t t / t o It is the work cycle ratio, for example, it can be defined as 1 / 12, that is, the test time t. t It is 1 hour, the actual usage time is t. o It's 12 hours; T max，O It is the Calvin temperature of the highest junction temperature actually used by the component; T max，t It is the Calvin temperature at which the highest junction temperature is reached during component testing.

[0053] Step S103: Calculate the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods;

[0054] In one embodiment, calculating the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficients corresponding to each of the sub-time periods may include: calculating the harmonic mean of each of the sub-acceleration coefficients to obtain the test acceleration coefficient corresponding to the preset historical time period.

[0055] Understandably, the harmonic mean, also known as the reciprocal mean, is the reciprocal of the arithmetic mean of the reciprocals of all statistical variables in a population. The harmonic mean is a type of mean. However, the statistical harmonic mean differs from the mathematical mean; it is the reciprocal of the arithmetic mean of the reciprocals of the variables. Because it is calculated based on the reciprocals of the variables, it is also called the reciprocal mean.

[0056] The formula for calculating the harmonic mean is as follows:

[0057]

[0058] When calculating the test acceleration factor using the formula for the harmonic mean, n can represent the number of sub-time periods, and x... i H represents the sub-acceleration coefficient corresponding to the i-th sub-time period, and H represents the test acceleration coefficient.

[0059] Step S104: Calculate the number of test cycles based on the preset number of usage cycles and the test acceleration coefficient;

[0060] In one embodiment, calculating the number of test cycles based on a preset number of usage cycles and the test acceleration coefficient includes: dividing the number of usage cycles by the test acceleration coefficient to obtain the number of test cycles.

[0061] In one embodiment, the preset number of usage cycles can be calculated based on the total aging time. The number of cycles in the actual use of the device is calculated based on the single cycle period of the device and the total aging time. The number of usage cycles divided by the test acceleration coefficient is the number of test cycles for the accelerated test.

[0062] Among them, the total aging time L is required. o The total number of aging test cycles is calculated using the test acceleration factor AF, as follows:

[0063] Test = L o / AF

[0064] Where Test represents the total number of test loops for acceleration, and L represents the total number of loops. o AF represents the total aging time and the test acceleration factor.

[0065] For example, if the aging period is 10 years, and this application uses daily temperature data as the basis for calculating the acceleration factor, each day can be considered as a cycle, i.e., one cycle per day, 365 cycles per year. Therefore, the number of test cycles required for the aging test is:

[0066] Test = (10 years * 365 cycles / year) / Test acceleration factor

[0067] Where Test represents the number of test cycles, and 10 years * 365 cycles / year is the preset number of cycles to use.

[0068] Step S105: In the environment corresponding to the preset accelerated test conditions, based on the number of test cycles, perform accelerated testing on the device under test to obtain test results.

[0069] Understandably, accelerated life testing involves increasing test stress (such as thermal stress, electrical stress, mechanical stress, etc.) to induce the product to experience the same failures as under normal stress levels during long-term use in a short period of time, thus shortening the test cycle without changing the failure distribution of the test sample. Then, an accelerated life model is used to evaluate the reliability or life characteristics of the product under normal operating stress.

[0070] In one embodiment, corresponding preset accelerated test conditions are set for different test objects, and the device under test is placed in the environment corresponding to the preset accelerated test conditions to perform accelerated loop test until the accelerated test is completed for a certain number of test loops, and the test result of the accelerated test is obtained.

[0071] This invention provides an accelerated testing method. The method calculates a sub-acceleration coefficient for each sub-time period based on temperature data from a reference test area within a predicted historical time period, as well as preset accelerated testing conditions and a preset accelerated testing model. This simulates the actual aging data of the device in the reference test area within each sub-time period. Then, based on the sub-acceleration coefficients for each sub-time period, a test acceleration coefficient for the preset time period is calculated, making the test acceleration coefficient more accurate. Therefore, based on this test acceleration coefficient and a preset number of usage cycles, the number of test cycles is calculated, and accelerated testing is performed on the device under test according to the number of test cycles. The test results can more accurately predict the actual usage results of the device under test in the reference test area, thereby improving the accuracy of the accelerated testing results.

[0072] Please refer to Figure 2 , Figure 2 This is a flowchart illustrating a second embodiment of an accelerated testing method provided in this application.

[0073] like Figure 2 As shown, in this embodiment, based on the above... Figure 1 In the illustrated embodiment, step S102 specifically includes:

[0074] Step S201: Determine the test temperature difference based on the preset accelerated test conditions;

[0075] In one embodiment, different acceleration test conditions need to be set for different test objects when conducting accelerated testing experiments.

[0076] For example, for the whole machine, the accelerated test conditions can be set to -25℃ to 75℃, and the dwell time for high and low temperature tests is 1 hour each, with a test temperature difference of 100℃.

[0077] For example, for component solder joints / bonds, accelerated testing conditions can be set to high-temperature full-load operation, -25℃ to 75℃. However, the active component temperature rise during normal operation is 21.42℃, so under the high-temperature testing conditions (75℃), the highest junction temperature of the component is 96.42℃.

[0078] Step S202: Calculate and determine the maximum temperature difference data corresponding to each of the sub-time periods based on the temperature data corresponding to each sub-time period;

[0079] In one embodiment, the highest and lowest temperatures of each sub-time period are determined based on the temperature data of each sub-time period, and the maximum temperature difference within each sub-time period is calculated.

[0080] In one embodiment, the step of calculating and determining the maximum temperature difference data corresponding to each of the sub-time periods based on the temperature data corresponding to each sub-time period includes: determining the highest and lowest ambient temperatures within the sub-time period based on the temperature data corresponding to the sub-time period; and calculating the maximum temperature difference data corresponding to the sub-time period based on the highest and lowest ambient temperatures.

[0081] In one embodiment, a preset test acceleration model calculates the acceleration coefficient of each sub-time period based on the maximum temperature difference data corresponding to each sub-time period. That is, it fits the temperature stress of each sub-time period corresponding to each test cycle under the test environment. Thus, the test conditions simulated based on the acceleration coefficients corresponding to each sub-time period are closer to the actual use conditions, thereby making the acceleration test results more accurate.

[0082] Step S203: Based on the preset test acceleration model, the test temperature difference, and the maximum temperature difference data corresponding to each of the sub-time periods, calculate the sub-acceleration coefficient corresponding to each of the sub-time periods.

[0083] In one embodiment, different preset test acceleration models are used to calculate the acceleration coefficient for different test objects. For accelerated testing of whole machine components, the Coffin-Manson acceleration model can be used, and for component solder joints / bonding wires, the NORRIS-LANZBERG acceleration model can be used.

[0084] For example, for accelerated testing of complete machine components, the accelerated testing conditions are -25℃ to 75℃, and the dwell time for high and low temperature tests is 1 hour each. Assuming the service life of the equipment under test is 10 years, the hourly temperature data in Table 1 below serves as an example:

[0085] Table 1: First hourly temperature data for the reference test area

[0086]

[0087]

[0088] For example, the Coffin-Manson acceleration model is used to accelerate the simulation of the entire system components. Taking the acceleration factor on the first day as an example:

[0089] AF1=[100 / 35.2]^2.65=15.9013

[0090] Following this logic, after calculating the daily acceleration coefficient, the harmonic mean of the daily acceleration coefficients can be calculated, resulting in a total acceleration coefficient of AF = 11.4038.

[0091] Then, since the total aging time is 10 years, and it cycles once a day, the total number of cycles required for accelerated testing is:

[0092] Test = (10 years * 365 cycles / year) / 11.4038 = 320 cycles

[0093] When performing accelerated life testing, it is necessary to test 320 temperature cycles in non-operating mode under cyclic temperature testing conditions of -25℃ to 75℃.

[0094] For example, for accelerated testing of component solder joints / bond wires, the accelerated testing conditions are: an active component temperature rise of 21.42℃ during normal operation, high-temperature full-load operation, -25℃ to 75℃. Under the high-temperature testing conditions (75℃), the highest junction temperature of the component is 96.42℃ (depending on the thermal strategy). t With t o The ratio is defined as 1:4 based on the test frequency and product operating frequency, i.e., the test time t t It is 6 hours, actual usage time t o It's 24 hours.

[0095] Assuming the device under test has a lifespan of 10 years, let's take the hourly temperature data in Table 2 below as an example:

[0096] Table 2: Second Hourly Temperature Data Table for Reference Test Area

[0097]

[0098]

[0099] For example, using the NORRIS LANZBERG acceleration model, an accelerated simulation of active component soldering / bonding is performed. Taking the acceleration factor on the first day as an example: AF1=(121.42 / 49.66)^2.65*(1 / 4)^0.136*e^(2185*(1 / (63.1+273.15)-1 / (75+21.42+273.15)).

[0100] 15)))=15.90

[0101] Following this logic, after calculating the daily acceleration coefficient, the harmonic mean of the daily acceleration coefficients can be calculated, resulting in a total acceleration coefficient of AF = 11.17.

[0102] Then, since the total aging time is 10 years, the total number of test cycles required is:

[0103] Test = (10 years * 365 cycles / year) / 11.17 = 327

[0104] When performing accelerated life testing, the system needs to operate at full load under high temperature conditions ranging from -25℃ to 75℃, requiring 327 temperature cycles for accelerated testing.

[0105] The accelerated testing method provided in this application is based on the calculation of the acceleration factor of the accelerated experimental model at real ambient temperature, which can improve the accuracy of equipment lifespan calculation and the accuracy of accelerated test results.

[0106] Please see Figure 3 , Figure 3 This is a schematic diagram of a testing device provided in this application, which is used to execute the aforementioned accelerated testing method. The testing device can be configured in a server.

[0107] like Figure 3 As shown, the testing device 300 includes: a temperature data acquisition module 301, a sub-acceleration coefficient calculation module 302, a test acceleration coefficient calculation module 303, a test cycle count calculation module 304, and an additional test module 305.

[0108] Temperature data acquisition module 301 is used to acquire temperature data of a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods.

[0109] The sub-acceleration coefficient calculation module 302 is used to calculate the sub-acceleration coefficient corresponding to each sub-time period based on preset acceleration test conditions, preset test acceleration model and temperature data corresponding to each sub-time period.

[0110] The test acceleration coefficient calculation module 303 is used to calculate the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods.

[0111] The test cycle count calculation module 304 is used to calculate the test cycle count based on the preset number of use cycles and the test acceleration coefficient;

[0112] The accelerated testing module 305 is used to perform accelerated testing on the device under test in the environment corresponding to the preset accelerated testing conditions, based on the number of test cycles, so as to obtain the test results.

[0113] In one embodiment, the sub-acceleration coefficient calculation module 302 is further configured to determine the test temperature difference based on the preset acceleration test conditions; calculate the maximum temperature difference data corresponding to each of the sub-time periods based on the temperature data corresponding to each of the sub-time periods; and calculate the sub-acceleration coefficient corresponding to each of the sub-time periods based on the preset test acceleration model, the test temperature difference, and the maximum temperature difference data corresponding to each of the sub-time periods.

[0114] In one embodiment, the sub-acceleration coefficient calculation module 302 is further configured to determine the highest and lowest ambient temperatures within the sub-time period based on the temperature data corresponding to the sub-time period; and to calculate the maximum temperature difference data corresponding to the sub-time period based on the highest and lowest ambient temperatures.

[0115] In one embodiment, the test acceleration coefficient calculation module 303 is further configured to calculate the harmonic mean of each of the sub-acceleration coefficients to obtain the test acceleration coefficient corresponding to the preset historical time period.

[0116] In one embodiment, the preset test acceleration model is a component temperature cycling test acceleration model or a solder joint temperature cycling test acceleration model.

[0117] In one embodiment, the test cycle count calculation module 304 is further configured to divide the number of cycles used by the test acceleration coefficient to obtain the number of test cycles.

[0118] In one embodiment, the sub-time periods of the preset historical time period are evenly distributed.

[0119] It should be noted that those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the above-described apparatus and modules can be referred to the corresponding processes in the aforementioned accelerated testing method embodiments, and will not be repeated here.

[0120] The apparatus provided in the above embodiments can be implemented as a computer program, which can be used in, for example... Figure 4 It runs on the electronic device shown.

[0121] Please see Figure 4 , Figure 4 This is a schematic block diagram of the structure of an electronic device provided in an embodiment of this application.

[0122] See Figure 4 The electronic device includes a processor 401, a memory 402, and a network interface 403 connected via a data bus. The memory 402 may include a non-volatile storage medium and internal memory.

[0123] The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions that, when executed, cause the processor 401 to perform any kind of accelerated testing method.

[0124] The processor 401 provides computing and control capabilities to support the operation of the entire electronic device.

[0125] The internal memory provides an environment for the execution of computer programs in non-volatile storage media. When the computer program is executed by the processor 401, the processor 401 can execute any kind of accelerated testing method.

[0126] This network interface 403 is used for network communication, such as sending assigned tasks. Those skilled in the art will understand that... Figure 4 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the electronic device to which the present application is applied. The specific electronic device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0127] It should be understood that processor 401 can be a Central Processing Unit (CPU), but it can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among these, the general-purpose processor can be a microprocessor or any conventional processor.

[0128] In one embodiment, the processor 401 is configured to run a computer program stored in a memory to perform the following steps:

[0129] Obtain temperature data for a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods.

[0130] Obtain temperature data for a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods.

[0131] Based on the preset acceleration test conditions, the preset test acceleration model and the temperature data corresponding to each of the sub-time periods, calculate the sub-acceleration coefficient corresponding to each of the sub-time periods.

[0132] Based on the sub-acceleration coefficients corresponding to each of the sub-time periods, calculate the test acceleration coefficients corresponding to the preset historical time periods;

[0133] The number of test cycles is calculated based on the preset number of usage cycles and the test acceleration coefficient;

[0134] In the environment corresponding to the preset accelerated test conditions, the device under test is subjected to accelerated testing based on the number of test cycles to obtain test results.

[0135] In one embodiment, when the processor 401 calculates the sub-acceleration coefficient corresponding to each sub-time period based on preset acceleration test conditions, a preset test acceleration model, and temperature data corresponding to each sub-time period, it is configured to:

[0136] The test temperature difference is determined based on the preset accelerated test conditions;

[0137] The maximum temperature difference data corresponding to each sub-time period is determined by calculating the temperature data corresponding to each sub-time period.

[0138] Based on the preset test acceleration model, the test temperature difference, and the maximum temperature difference data corresponding to each of the sub-time periods, the sub-acceleration coefficient corresponding to each of the sub-time periods is calculated respectively.

[0139] In one embodiment, when the processor 401 performs the calculation based on the temperature data corresponding to each of the sub-time periods to determine the maximum temperature difference data corresponding to each of the sub-time periods, it is configured to:

[0140] Based on the temperature data corresponding to the sub-time period, determine the highest and lowest ambient temperatures within the sub-time period;

[0141] Based on the highest and lowest ambient temperatures, calculate the maximum temperature difference data corresponding to the sub-time period.

[0142] In one embodiment, when the processor 401 calculates the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods, it is configured to:

[0143] Calculate the harmonic mean of each of the sub-acceleration coefficients to obtain the test acceleration coefficient corresponding to the preset historical time period.

[0144] In one embodiment, the preset test acceleration model is a component temperature cycle test acceleration model or a solder joint temperature cycle test acceleration model.

[0145] In one embodiment, when the processor 401 calculates the number of test loops based on a preset number of usage loops and the test acceleration coefficient, it is configured to:

[0146] The number of test cycles is obtained by dividing the number of cycles used by the test acceleration coefficient.

[0147] In one embodiment, the sub-time periods of the preset historical time period are evenly distributed.

[0148] The embodiments of this application also provide a computer-readable storage medium storing a computer program, the computer program including program instructions, and the processor executing the program instructions to implement any of the accelerated testing methods provided in the embodiments of this application.

[0149] The computer-readable storage medium can be an internal storage unit of the electronic device described in the foregoing embodiments, such as a hard disk or memory of the electronic device. Alternatively, the computer-readable storage medium can be an external storage device of the electronic device, such as a plug-in hard disk, smart media card (SMC), secure digital card (SD), flash card, etc., equipped on the electronic device.

[0150] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A testing method, characterized in that, include: Obtain temperature data for a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods. The maximum temperature difference data corresponding to each sub-time period is determined by calculating the temperature data corresponding to each sub-time period. Based on the preset acceleration test conditions, the preset test acceleration model, and the maximum temperature difference data corresponding to each of the sub-time periods, calculate the sub-acceleration coefficient corresponding to each of the sub-time periods. Based on the sub-acceleration coefficients corresponding to each of the sub-time periods, calculate the test acceleration coefficients corresponding to the preset historical time periods; The number of test cycles is calculated based on the preset number of usage cycles and the test acceleration coefficient; In the environment corresponding to the preset accelerated test conditions, the device under test is subjected to accelerated testing based on the number of test cycles to obtain test results.

2. The test method according to claim 1, characterized in that, The calculation of the sub-acceleration coefficient corresponding to each sub-time period based on preset acceleration test conditions, preset test acceleration model, and maximum temperature difference data corresponding to each sub-time period includes: The test temperature difference is determined based on the preset accelerated test conditions; Based on the preset test acceleration model, the test temperature difference, and the maximum temperature difference data corresponding to each of the sub-time periods, the sub-acceleration coefficient corresponding to each of the sub-time periods is calculated respectively.

3. The test method according to claim 2, characterized in that, The step of calculating and determining the maximum temperature difference data corresponding to each of the sub-time periods based on the temperature data corresponding to each sub-time period includes: Based on the temperature data corresponding to the sub-time period, determine the highest and lowest ambient temperatures within the sub-time period; Based on the highest and lowest ambient temperatures, calculate the maximum temperature difference data corresponding to the sub-time period.

4. The test method according to claim 1, characterized in that, The calculation of the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods includes: Calculate the harmonic mean of each of the sub-acceleration coefficients to obtain the test acceleration coefficient corresponding to the preset historical time period.

5. The test method according to claim 1, characterized in that, The preset test acceleration model is either a component temperature cycle test acceleration model or a solder joint temperature cycle test acceleration model.

6. The test method according to claim 1, characterized in that, The calculation of the number of test cycles based on the preset number of usage cycles and the test acceleration coefficient includes: The number of test cycles is obtained by dividing the number of cycles used by the test acceleration coefficient.

7. The test method according to claim 1, characterized in that, The sub-time periods of the preset historical time period are evenly distributed.

8. A testing device, characterized in that, include: The temperature data acquisition module is used to acquire temperature data of a reference test area within a preset historical time period; the preset historical time period includes multiple sub-time periods. The sub-acceleration coefficient calculation module is used to calculate and determine the maximum temperature difference data corresponding to each sub-time period based on the temperature data corresponding to each sub-time period. The sub-acceleration coefficient calculation module is also used to calculate the sub-acceleration coefficient corresponding to each sub-time period based on preset acceleration test conditions, preset test acceleration model and the maximum temperature difference data corresponding to each sub-time period. The test acceleration coefficient calculation module is used to calculate the test acceleration coefficient corresponding to the preset historical time period based on the sub-acceleration coefficient corresponding to each of the sub-time periods. The test loop count calculation module is used to calculate the test loop count based on the preset number of use loops and the test acceleration coefficient; The accelerated testing module is used to perform accelerated testing on the device under test in the environment corresponding to the preset accelerated testing conditions, based on the number of test cycles, so as to obtain the test results.

9. An electronic device, characterized in that, The electronic device includes a processor, a memory, and a computer program stored in the memory and executable by the processor, wherein when the computer program is executed by the processor, it implements the test method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, causes the processor to perform the steps of the test method as described in any one of claims 1 to 7.

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