A parameter determination method for a power electronic device derating test platform

By calculating the actual operating voltage and current ratio of power electronic devices, selecting the power electronic components for the derating test platform, determining the DC voltage, AC voltage, and heat sink level, and building the derating test platform, the problem of low accuracy of test results for high-power power electronic devices in existing technologies is solved, achieving more comprehensive evaluation and cost reduction.

CN116466163BActive Publication Date: 2026-05-29SOUTHEAST UNIV
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
SOUTHEAST UNIV
Filing Date
2023-04-19
Publication Date
2026-05-29

AI Technical Summary

Technical Problem

Existing technologies cannot effectively reflect the operating status of power electronic devices in high-power power electronic devices, resulting in reduced accuracy of test results and failure to meet various testing requirements.

Method used

By calculating the actual operating voltage and current ratio of power electronic devices, the rated voltage level of power electronic devices for derating test platforms is selected. Based on equal voltage and current ratios, the actual operating voltage and current values ​​of power semiconductor devices in derating test platforms are calculated. Based on these values, the derating design for DC voltage, AC voltage, and heat sink level is determined, and a simulation and experimental test platform is built.

Benefits of technology

This enables a more comprehensive and accurate evaluation of the technical solutions for high-power power electronic devices, reflecting the operating status of the devices and reducing the hardware cost and safety risks of the experimental platform.

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Abstract

The application discloses a kind of power electronic device derating test platform parameter determination method and device.The technical scheme is according to the actual working point of power semiconductor device of power electronic device under rated power and its rated parameter, the voltage ratio and current ratio of power semiconductor device are calculated, the rated voltage grade of power electronic device for derating test platform is selected, based on equal voltage ratio and current ratio, the working point of power semiconductor device of derating test platform is obtained;And around the operating characteristics of power semiconductor device of derating test platform, the derating design of direct-current voltage grade, alternating-current voltage grade and radiator grade is completed.The application realizes the derating matching of derating test platform and actual power electronic device in power semiconductor device, direct-current voltage grade, alternating-current voltage grade and radiator grade, and more accurately and comprehensively reflects the operating characteristics of high-power power electronic device.
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