A method, system, device and storage medium for testing an infrared circuit

Abstract

The application discloses a kind of infrared circuit test method, system, equipment and storage medium, applied to product detection technical field, comprising: send working instruction to infrared circuit to make infrared circuit for working condition;N times current detection is carried out at the set detection position of infrared circuit, and N current values are obtained;N is not less than 2 positive integer;Judge the difference between the maximum value and the minimum value in N current values whether it conforms to the set difference range;If yes, the average value of N current values is taken as the current test result of infrared circuit;If no, carry out multiple current detection at the set detection position, and based on each current value detected at the set detection position in the test process of the infrared circuit this time, determine the current test result of infrared circuit.The application of the scheme is conducive to obtaining accurate current test result, reducing the time of scheme, cost is lower, practicality is strong, and it is convenient for promotion.

Description

Technical Field

[0001] This invention relates to the field of product testing technology, and in particular to a testing method, system, device, and storage medium for infrared circuits. Background Technology

[0002] In daily life, smart devices such as mobile phones, tablets, televisions, and air conditioners make life more and more colorful. Although the internal circuits of smart devices are not exactly the same, they almost all use IR (Infrared Ray) circuits. In the process of producing these smart devices, it is necessary to test the parameters of the infrared circuits.

[0003] Currently, when testing the parameters of infrared circuits using production line testing fixtures, due to limitations in testing space and funding, there is often a lack of precise equipment, resulting in scattered and highly volatile data. Some testing methods involve taking the average of multiple tests, which can improve the accuracy to some extent, but the accuracy remains limited.

[0004] In conclusion, how to effectively improve the testing accuracy of infrared circuits and distinguish defective products is a technical problem that urgently needs to be solved by those skilled in the art. Summary of the Invention

[0005] The purpose of this invention is to provide a testing method, system, device, and storage medium for infrared circuits, so as to effectively improve the testing accuracy of infrared circuits and distinguish defective products.

[0006] To solve the above-mentioned technical problems, the present invention provides the following technical solution:

[0007] A testing method for infrared circuits, comprising:

[0008] Send a working command to the infrared circuit to put the infrared circuit into working state;

[0009] N current detections are performed at the designated detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2.

[0010] Determine whether the difference between the maximum and minimum values ​​of N current values ​​falls within a set range.

[0011] If so, the average of the N current values ​​will be taken as the current test result of the infrared circuit.

[0012] If not, multiple current detections are performed at the set detection position, and the current test result of the infrared circuit is determined based on the current values ​​detected at the set detection position during the test of this infrared circuit.

[0013] Preferably, determining whether the difference between the maximum and minimum values ​​among the N current values ​​conforms to a set difference range includes:

[0014] Judgment I max / I min Is Y true?

[0015] If so, then determine that the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range;

[0016] Otherwise, it is determined that the difference between the maximum and minimum values ​​among the N current values ​​does not meet the set difference range;

[0017] Among them, I max I represents the maximum value among the N obtained current values. min This represents the minimum value among the N current values ​​obtained, and Y represents the set precision threshold.

[0018] Preferably, the step of performing multiple current detections at the designated detection location and determining the current test result of the infrared circuit based on the current values ​​detected at the designated detection location during the current infrared circuit test includes:

[0019] K current measurements are performed at the designated detection location to obtain a set of detection results including K current values.

[0020] After obtaining a set of detection results including K current values, determine whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true;

[0021] If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit.

[0022] If the condition is not met, return to the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values;

[0023] Where K is a positive integer not less than 2, the function Max represents the maximum value in {M0, M1, ..., Mi}, the function Min represents the minimum value in {M0, M1, ..., Mi}, M0 represents the average value of the N current values ​​obtained; i represents the current execution number of the operation of performing K current detections at the set detection position, i is a positive integer; M1 represents the average value of the first group of detection results including K current values ​​obtained by performing K current detections at the set detection position; Mi represents the average value of the i-th group of detection results including K current values ​​obtained by performing K current detections at the set detection position.

[0024] Preferably, after obtaining a set of detection results including K current values, the method further includes:

[0025] when At that time, make a judgment Whether it is true or not, when When, then judge Is it valid?

[0026] If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit.

[0027] If the condition is not met, return to the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values;

[0028] Here, the function Ave represents the average value in {M0, M1, ..., Mi}.

[0029] Preferred options also include:

[0030] Before performing K current detections at the set detection position, it is determined whether the infrared circuit is in a working state.

[0031] If the system is in working condition, the operation described above is performed: performing K current detections at the set detection position to obtain a set of detection results including K current values.

[0032] If it is not in working state, a working command is sent to the infrared circuit again to make the infrared circuit in working state, and the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values ​​is performed.

[0033] Preferably, sending a working command to the infrared circuit to put the infrared circuit into a working state includes:

[0034] A light-on command is sent to the infrared circuit to turn on the infrared lamps.

[0035] Preferred options also include:

[0036] When the current test result of the infrared circuit does not match the normal value range, determine whether the current test result is within the set polarity range;

[0037] If so, then the surface mount pin of the infrared circuit is incorrect;

[0038] If not, then the infrared circuit is determined to be faulty.

[0039] An infrared circuit testing system, comprising:

[0040] The instruction sending module is used to send working instructions to the infrared circuit to make the infrared circuit work.

[0041] The initial detection module is used to perform N current detections at the set detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2.

[0042] The first judgment module is used to determine whether the difference between the maximum and minimum values ​​among N current values ​​meets the set difference range.

[0043] If so, the result confirmation module is triggered. The result confirmation module is used to take the average of N current values ​​as the current test result of the infrared circuit.

[0044] If not, the repeat detection module is triggered. The repeat detection module is used to perform multiple current detections at the set detection position and determine the current test result of the infrared circuit based on the current values ​​detected at the set detection position during the current infrared circuit test.

[0045] An infrared circuit testing device, comprising:

[0046] Memory, used to store computer programs;

[0047] A processor for executing the computer program to implement the steps of the infrared circuit testing method as described above.

[0048] A computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the infrared circuit testing method described above.

[0049] By applying the technical solution provided in this embodiment of the invention, a working command is sent to the infrared circuit to activate it. This allows for current detection at a designated detection location, obtaining current values. Specifically, N current detections are performed to obtain N current values. After obtaining the N current values, the application determines whether the difference between the maximum and minimum values ​​falls within a set range. If it does, it indicates that the N current values ​​do not fluctuate significantly, and the average of these N values ​​can be calculated, providing a more accurate current test result. However, if the difference between the maximum and minimum values ​​does not fall within the set range, it indicates significant fluctuations in the N current values. Therefore, to improve accuracy, the application continues to perform multiple current detections at the designated detection location. The more detections performed, the more accurate the result. Based on the current values ​​detected at the designated detection location during this infrared circuit test, the current test result of the infrared circuit can be determined.

[0050] As can be seen, because multiple current measurements are performed when significant fluctuations are detected in N current values, the proposed solution yields more accurate current test results. If no significant fluctuations are observed in the N current values, an accurate current test result can be obtained directly, ensuring the efficiency of the proposed solution—that is, while maintaining the accuracy of the current test results, the solution is also time-efficient. Furthermore, the proposed solution does not require additional measuring instruments; it can be implemented simply by adjusting the test program, resulting in low cost, strong practicality, and ease of promotion. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 This is a flowchart illustrating the implementation of a testing method for an infrared circuit according to the present invention.

[0053] Figure 2 This is a schematic diagram of the surface mount pins of an infrared circuit in a specific application.

[0054] Figure 3 This is a schematic diagram of the structure of an infrared circuit testing system according to the present invention;

[0055] Figure 4 This is a schematic diagram of the structure of a test device for an infrared circuit according to the present invention; Detailed Implementation

[0056] The core of this invention is to provide a testing method for infrared circuits, which is beneficial for obtaining accurate current test results, reducing the time consumption of the test, and does not require the addition of special measuring instruments. It can be achieved simply by adjusting the test program, which is low in cost, highly practical, and easy to promote.

[0057] To enable those skilled in the art to better understand the present invention, the invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are merely some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0058] Please refer to Figure 1 , Figure 1 This is a flowchart illustrating an implementation method for testing an infrared circuit according to the present invention. The testing method for the infrared circuit may include the following steps:

[0059] Step S101: Send a working command to the infrared circuit to make the infrared circuit work.

[0060] Specifically, to test the operating current of the infrared circuit, it needs to be in an operational state. This is achieved by sending an operating command to the infrared circuit. Of course, the specific communication protocol for sending the operating command and the content of the command can be set and adjusted as needed, as long as the infrared circuit is in an operational state; this does not affect the implementation of the invention.

[0061] Step S102: Perform N current detections at the set detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2.

[0062] After the infrared circuit is put into operation, current detection can be performed at the set detection position of the infrared circuit to obtain the current flowing through the detection position. There are many specific current detection methods. For example, a simple and commonly used method is to set a sampling resistor in the circuit and then realize current detection based on the terminal voltage of the sampling resistor.

[0063] When performing current detection at the designated detection position of the infrared circuit, N current detections are required to ensure the accuracy of the results. Therefore, after executing step S102, N current values ​​can be obtained, where N is a positive integer not less than 2. Ideally, the N current values ​​should be consistent, indicating that the infrared circuit is in a stable operating state. However, in practical applications, due to interference, fluctuations in the operating state of the infrared circuit itself, errors introduced by the current detection stage, and other factors, the N current values ​​obtained may fluctuate.

[0064] The detection position set in step S102 is specifically the circuit position in the infrared circuit. It can be set according to the actual circuit, but generally speaking, a position on the circuit that can effectively detect the working current of the infrared circuit will be selected.

[0065] Step S103: Determine whether the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range; if yes, proceed to step S104; otherwise, proceed to step S105.

[0066] Step S104: Take the average value of N current values ​​as the current test result of the infrared circuit.

[0067] This application takes into account that if the obtained N current values ​​are not too dispersed, that is, the fluctuation is low, it can be said that the infrared circuit is currently in a stable working state. Therefore, the average value of the N current values ​​can be directly used as the current test result of the infrared circuit, which is a more accurate current test result. Through the obtained current test result, it is possible to accurately determine whether the infrared circuit is normal.

[0068] In order to determine whether the N current values ​​fluctuate significantly, the solution in this application uses the maximum and minimum values ​​among the N current values. Specifically, it can be determined whether the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range.

[0069] It should be noted that there are multiple ways to measure the difference between the maximum and minimum values ​​among N current values. For example, a simple way is to subtract the maximum and minimum values ​​among the N current values ​​and determine whether the difference exceeds the set difference range.

[0070] For example, in one specific embodiment of the present invention, step S103 may specifically include:

[0071] Judgment I max / I min Is Y true?

[0072] If so, then determine that the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range;

[0073] Otherwise, it is determined that the difference between the maximum and minimum values ​​among the N current values ​​does not meet the set difference range;

[0074] Among them, I max I represents the maximum value among the N obtained current values. min This represents the minimum value among the N current values ​​obtained, and Y represents the set precision threshold.

[0075] In this implementation, considering that the operating current values ​​vary for different infrared circuits, directly subtracting the maximum and minimum values ​​from the N current values ​​would require operators to set the appropriate range of differences based on the actual situation. However, using a ratio would allow for a more versatile range of differences.

[0076] In this implementation, Y is used to set the difference range, I max / I min It is a value greater than or equal to 1, meaning that the range of difference set in this implementation is from 1 to Y. If I max / I min <Y indicates the maximum value I among the N current values. max The minimum value I among N current values min The difference between them is low, meaning the difference between the maximum and minimum values ​​of the N current values ​​falls within the set range, and the fluctuation of the N current values ​​is small. Conversely, if I max / I min If it exceeds Y, it indicates that the maximum value I among the N current values ​​is... max The minimum value I among N current values min The difference between the values ​​is large, which means that the difference between the maximum and minimum values ​​of the N current values ​​does not meet the set difference range, and the fluctuation of the N current values ​​is large.

[0077] In this implementation, a precision threshold Y is used to set the difference range. It can be seen that Y should be a value greater than or equal to 1. The lower the value of Y, the more stringent the conditions for triggering step S104, which is more conducive to ensuring the accuracy of the current test results of the infrared circuit obtained in step S104. Of course, this also increases the probability of needing to continue current detection, meaning the execution time of the scheme will increase. In practical applications, Y is usually set to a value slightly greater than 1.

[0078] It should also be noted that judging I max / I min To determine whether 1 / Y < I, we can transform the formula to check if 1 / Y < I. min / Imax To determine whether a condition is true or false, if Y is a value greater than or equal to 1, then 1 / Y is a value between 0 and 1. In other words, if the condition is for I... min / I max The range of difference is set to 1 / Y to 1, and the lower Y is set, the better it is to ensure the accuracy of the current test results.

[0079] S105: Perform multiple current detections at the set detection positions, and determine the current test results of the infrared circuit based on the current values ​​detected at the set detection positions during this infrared circuit test.

[0080] If the difference between the maximum and minimum values ​​among the N current values ​​does not conform to the set difference range, i.e., exceeds the set difference range, it indicates that the fluctuation of these N current values ​​is large. If the average value is directly taken, the accuracy of the current test result cannot be guaranteed. Therefore, in order to ensure the accuracy of the current test result, the solution of this application will continue to perform multiple current measurements at the set detection positions, and then determine the current test result of the infrared circuit based on the current values ​​measured at the set detection positions during this infrared circuit test.

[0081] There are several ways to implement step S105. For example, a simple approach is to set a fixed number of detection cycles. That is, when executing step S105, a fixed number of current detections are performed at the set detection location. The average of these fixed number of detected current values ​​and the N current values ​​obtained in step S102 is then calculated to obtain the current test result of the infrared circuit. It is understandable that, to ensure a relatively accurate current test result, the fixed number of cycles described here should be set relatively large; that is, a sufficient number of current detections need to be performed at the set detection location to guarantee the accuracy of the obtained current test result.

[0082] Furthermore, in one specific embodiment of the present invention, step S105 may specifically include:

[0083] Perform K current measurements at the set detection location to obtain a set of detection results including K current values;

[0084] After obtaining a set of detection results including K current values, determine whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true;

[0085] If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit.

[0086] If the condition is not met, return to the operation of performing K current detections at the set detection location to obtain a set of detection results including K current values;

[0087] Where K is a positive integer not less than 2, the function Max represents the maximum value in {M0, M1, ..., Mi}, the function Min represents the minimum value in {M0, M1, ..., Mi}, M0 represents the average value of the N current values ​​obtained; i represents the current execution number of the operation of performing K current detections at the set detection position, i is a positive integer; M1 represents the average value of the first group of detection results including K current values ​​obtained after performing K current detections at the set detection position; Mi represents the average value of the i-th group of detection results including K current values ​​obtained after performing K current detections at the set detection position.

[0088] This implementation takes into account that when performing step S105, multiple current detections need to be performed at the set detection position. As described above, if a fixed number of detections is set, although a relatively accurate current test result can be obtained, it requires a sufficient number of detections. This is not conducive to ensuring the execution efficiency of the infrared circuit test scheme of this application, that is, it is impossible to obtain the current test result efficiently and quickly.

[0089] In this embodiment, when performing multiple current measurements at the set detection location, a multi-round detection design is adopted. The specific number of rounds required depends on whether a relatively accurate current test result has been obtained. In other words, in this embodiment, when executing step S105, multiple current measurements are performed at the set detection location, but instead of a fixed number of measurements, a dynamic number of measurements is used. This approach effectively ensures both the accuracy of the current test results and the execution efficiency of the proposed solution.

[0090] Specifically, when executing step S105, the first round of detection is performed. That is, when executing step S105, K current measurements are first performed at the set detection location, and the first set of detection results is obtained. In this embodiment, the first set of detection results and each set of detection results obtained in subsequent rounds include K current values.

[0091] After obtaining the first group of detection results including K current values, the average value of these K current values ​​is denoted as M1, and the average value of the N current values ​​obtained in step S102 is denoted as M0.

[0092] At this point, it is necessary to determine whether Max{M0, M1} / Min{M0, M1} < Y is true. Max{M0, M1} represents the maximum value between M0 and M1, and Min{M0, M1} represents the minimum value between M0 and M1.

[0093] Similar to the judgment in step S103, if Max{M0, M1} / Min{M0, M1}<Y is true, it means that after K current detections, the results of these K current detections are not significantly different from the results of the previous N current detections. Therefore, the average value of each current value detected at the set detection position during this infrared circuit test can be taken as the current test result of the infrared circuit. The "test process" for this infrared circuit refers to the entire process from step S101 to step S105; that is, each current value detected at the set detection position during this infrared circuit test is the same as the current values ​​detected at the set detection position throughout the entire process.

[0094] For example, in one implementation, for ease of calculation, N = K. In this example, (M0 + M1) / 2 can be used as the current test result of the infrared circuit. Of course, when N ≠ K, in this example, it is necessary to sum the N current values ​​obtained in step S102 and the K current values ​​obtained in step S105, and then divide by (N + K). For ease of description, the following text of this application will use N = K as an example.

[0095] If Max{M0, M1} / Min{M0, M1} < Y is not true, it means that after performing K current measurements, the results of these K measurements still differ significantly from the results of the previous N measurements. Taking the average at this point cannot guarantee the accuracy of the current test results. Therefore, it is necessary to continue current measurement, i.e., return to the operation of "performing K current measurements at the set detection location to obtain a set of detection results including K current values". In this example, this is the second round of detection, i.e., performing K current measurements again at the set detection location, resulting in the second set of detection results. The second set of detection results also includes K current values, and the average of the K current values ​​in the second set of detection results is denoted as M2.

[0096] At this point, it's necessary to determine whether Max{M0, M1, M2} / Min{M0, M1, M2} < Y holds true. If it does, it means that a relatively accurate current test result can be obtained based on the current 2K+N current values. Therefore, the average value of each current value detected at the set detection position during this infrared circuit test can be used as the current test result of the infrared circuit. In this example, (M0+M1+M2) / 3 is used as the current test result of the infrared circuit.

[0097] Conversely, if Max{M0, M1, M2} / Min{M0, M1, M2}<Y does not hold, then a third round of K current detections needs to be performed. The principle is the same as above and will not be repeated here.

[0098] In this implementation, 'i' represents the current execution number, or execution round, of the operation of performing K current detections at the set detection position. It can be understood that when step S105 is first entered, i = 1, meaning the first round of detection is performed. It can be seen that in this implementation, after one or more rounds of detection, due to the gradual increase in samples, the average value of each current value detected at the set detection position during the infrared circuit test tends to stabilize, which helps ensure the accuracy of the current test results.

[0099] Furthermore, in one specific embodiment of the present invention, after obtaining a set of detection results including K current values, the process may further include:

[0100] when At that time, make a judgment Whether it is true or not, when When, then judge Is it valid?

[0101] If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit.

[0102] If the condition is not met, return to the operation of performing K current detections at the set detection location to obtain a set of detection results including K current values;

[0103] Here, the function Ave represents the average value in {M0, M1, ..., Mi}.

[0104] In the aforementioned implementation, the accuracy of the current test results is improved by determining whether to continue with the next K rounds of current detection based on whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y holds true.

[0105] This implementation takes into account that, if When the difference between Ave{M0, M1, ..., Mi} is not significant, it also indicates that the average value of each current value detected at the set detection position during the infrared circuit test has become stable, and a relatively accurate current test result can be obtained.

[0106] Therefore, in this implementation method, calculations are performed. Understandably, if Need to judge Is it true? If it is true, then it means... Since the difference between Ave{M0, M1, ..., Mi} is not significant, the average value of each current value detected at the set detection position during this infrared circuit test can be used as the current test result of the infrared circuit. When N = K, (M0 + M1 + ... + Mi) / (i + 1) is calculated, and the calculated value is used as the current test result of the infrared circuit.

[0107] if This is a judgment Is it true? If it is true, then it means... Since the difference between Ave{M0, M1, ..., Mi} is not significant, the average value of each current value detected at the set detection position during this infrared circuit test can be used as the current test result of the infrared circuit. When N = K, (M0 + M1 + ... + Mi) / (i + 1) is calculated, and the calculated value is used as the current test result of the infrared circuit.

[0108] It can be seen that, in addition to judging whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true in the above implementation, this embodiment adds two judgment conditions, which is beneficial to improving the execution efficiency of the infrared circuit test scheme of this application. That is, in some cases, the current detection can be completed as soon as possible and accurate current test results can be obtained.

[0109] In one specific embodiment of the present invention, it may further include:

[0110] Before performing K current detections at a set detection location, determine whether the infrared circuit is in working condition.

[0111] If in working condition, the operation will be performed to conduct K current detections at the set detection location to obtain a set of detection results including K current values;

[0112] If it is not in working state, a working command is sent to the infrared circuit to make the infrared circuit in working state, and the operation of performing K current detections at the set detection position is performed to obtain a set of detection results including K current values.

[0113] As described above, the solution in this application requires the infrared circuit to be in a working state. This implementation takes into account that, for some infrared circuits, after a working command is sent, the infrared circuit will enter the working state and remain in the working state for a certain period of time, after which the infrared circuit will exit the working state. In some cases, the execution time of step S105 may be relatively long.

[0114] In this implementation, before performing K current detections at a set detection location, it is determined whether the infrared circuit is in working condition. That is, before each round of K current detections, it is first determined whether the infrared circuit is in working condition. If it is not in working condition, a working command can be sent to the infrared circuit again to make it enter working condition, which helps to ensure the normal implementation of the solution.

[0115] Furthermore, there are various ways to determine whether an infrared circuit is in a working state. For example, in one scenario, the infrared circuit enters a working state after receiving a working command, and the duration of this working state is a fixed value T. Another example is based on the characteristics of a programmable power supply, where the time required to sample 10 current values ​​is 0.6 seconds. That is, when performing 10 consecutive current measurements at the set detection position of the infrared circuit, the time taken is 0.6 seconds. In this example, by counting the current number of measurements, it can be determined whether the infrared circuit is in a working state.

[0116] In one specific embodiment of the present invention, step S102 may specifically include:

[0117] Send a light-on command to the infrared circuit to turn on the infrared lights.

[0118] In practical applications, infrared circuits typically include power supply circuits, switching circuits, infrared lamps, and other devices. This implementation takes into account that for a typical infrared circuit, the infrared lamp being lit indicates that the infrared circuit is in a working state. Therefore, a lamp-lighting command can be sent to the infrared circuit to light up the infrared lamp, thus enabling the infrared circuit to enter a working state.

[0119] In one specific embodiment of the present invention, it may further include:

[0120] When the current test result of the infrared circuit does not match the normal value range, determine whether the current test result is within the set polarity range.

[0121] If so, then the surface mount pin of the infrared circuit is incorrect;

[0122] If not, then the infrared circuit is faulty.

[0123] In traditional infrared circuit testing methods, the low accuracy makes it impossible to distinguish between faults within the infrared circuit itself and errors in the surface-mount pins. For example... Figure 2 This diagram illustrates the surface mount pin configuration of an infrared circuit in a specific application. The correct placement requires pin 2 to be located in the lower right corner. However, during the actual placement process, workers or machines may rotate the pins by 90°, 180°, or 270°, resulting in incorrect pin placement. This is also known as IR polarity reversal. When the IR circuit's surface mount pins are incorrect, the infrared lamp section is effectively short-circuited, while pins 1, 3, and 4 within the internal infrared circuit remain connected. This means the entire infrared circuit is connected. The difference from a normal infrared circuit is that after sending a working command, the circuit will lack the conduction impedance of the infrared lamp.

[0124] For example, in a specific scenario, the normal operating current range of an infrared circuit is 55mA ± 10mA. If a surface mount pin error occurs, the detected operating current of the infrared circuit will be 95mA ± 10mA. In traditional solutions, due to low testing accuracy, whether it's a surface mount pin error or a fault in the infrared circuit itself, the result may fall within the 95mA ± 10mA range. Even with a normally functioning infrared circuit, the test result may still be within this range.

[0125] In this application's solution, because the current test results of the infrared circuit can be accurately obtained, it is possible to accurately distinguish between surface-mount pin errors and inherent faults in the infrared circuit. Specifically, when the current test result of the infrared circuit conforms to the normal value range, for example, if the current test result of the infrared circuit conforms to the normal value range of 55mA±10mA, then the infrared circuit test can be determined to have passed. If it does not conform to the normal value range, it can be determined whether it is within a set polarity reversal range, for example, setting 95mA±10mA as the polarity reversal range in the above example. If the current test result of the infrared circuit conforms to the set polarity reversal range of 95mA±10mA, then it can be determined that the surface-mount pin of the infrared circuit is faulty. That is, the solution of this application can effectively distinguish between IR polarity reversal.

[0126] By applying the technical solution provided in this embodiment of the invention, a working command is sent to the infrared circuit to activate it. This allows for current detection at a designated detection location, obtaining current values. Specifically, N current detections are performed to obtain N current values. After obtaining the N current values, the application determines whether the difference between the maximum and minimum values ​​falls within a set range. If it does, it indicates that the N current values ​​do not fluctuate significantly, and the average of these N values ​​can be calculated, providing a more accurate current test result. However, if the difference between the maximum and minimum values ​​does not fall within the set range, it indicates significant fluctuations in the N current values. Therefore, to improve accuracy, the application continues to perform multiple current detections at the designated detection location. The more detections performed, the more accurate the result. Based on the current values ​​detected at the designated detection location during this infrared circuit test, the current test result of the infrared circuit can be determined.

[0127] As can be seen, because multiple current measurements are performed when significant fluctuations are detected in N current values, the proposed solution yields more accurate current test results. If no significant fluctuations are observed in the N current values, an accurate current test result can be obtained directly, ensuring the efficiency of the proposed solution—that is, while maintaining the accuracy of the current test results, the solution is also time-efficient. Furthermore, the proposed solution does not require additional measuring instruments; it can be implemented simply by adjusting the test program, resulting in low cost, strong practicality, and ease of promotion.

[0128] Corresponding to the above method embodiments, this invention also provides a testing system for infrared circuits, which can be referred to in conjunction with the above.

[0129] See also Figure 3 The testing system for this infrared circuit may include:

[0130] The instruction sending module 301 is used to send working instructions to the infrared circuit to make the infrared circuit work.

[0131] The initial detection module 302 is used to perform N current detections at a set detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2.

[0132] The first judgment module 303 is used to determine whether the difference between the maximum and minimum values ​​among N current values ​​meets the set difference range.

[0133] If so, the result confirmation module 304 is triggered. The result confirmation module 304 is used to take the average of N current values ​​as the current test result of the infrared circuit.

[0134] If not, the repeat detection module 305 is triggered. The repeat detection module 305 is used to perform multiple current detections at the set detection position and determine the current test result of the infrared circuit based on the current values ​​detected at the set detection position during the test of the infrared circuit.

[0135] In one specific embodiment of the present invention, the first determination module 303 includes:

[0136] The first judgment unit is used to judge I. max / I min Is Y true?

[0137] If so, the first determining unit is triggered to determine whether the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range.

[0138] Otherwise, the second determining unit is triggered to determine whether the difference between the maximum and minimum values ​​among the N current values ​​does not meet the set difference range.

[0139] Among them, I max I represents the maximum value among the N obtained current values. min This represents the minimum value among the N current values ​​obtained, and Y represents the set precision threshold.

[0140] In one specific embodiment of the present invention, the duplicate detection module 305 includes:

[0141] The execution unit is used to perform K current detections at a set detection location to obtain a set of detection results including K current values.

[0142] The second judgment unit is used to determine whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true whenever a set of detection results including K current values ​​is obtained;

[0143] If true, the calculation unit is triggered. The calculation unit is used to take the average value of each current value detected at the set detection position during the test of the infrared circuit as the current test result of the infrared circuit.

[0144] If the condition is not met, the execution unit is triggered to return to the operation of performing K current detections at the set detection location to obtain a set of detection results including K current values.

[0145] Where K is a positive integer not less than 2, the function Max represents the maximum value in {M0, M1, ..., Mi}, the function Min represents the minimum value in {M0, M1, ..., Mi}, M0 represents the average value of the N current values ​​obtained; i represents the current execution number of the operation of performing K current detections at the set detection position, i is a positive integer; M1 represents the average value of the first group of detection results including K current values ​​obtained after performing K current detections at the set detection position; Mi represents the average value of the i-th group of detection results including K current values ​​obtained after performing K current detections at the set detection position.

[0146] In one specific embodiment of the present invention, the second judgment unit in the repeat detection module 305 is further used for;

[0147] Whenever a set of detection results including K current values ​​is obtained, when At that time, make a judgment Whether it is true or not, when When, then judge Is it valid?

[0148] If true, the calculation unit is triggered to take the average value of each current value detected at the set detection position during the infrared circuit test as the current test result of the infrared circuit.

[0149] If the condition is not met, the execution unit is triggered to return to the operation of performing K current detections at the set detection location to obtain a set of detection results including K current values.

[0150] Here, the function Ave represents the average value in {M0, M1, ..., Mi}.

[0151] In one specific embodiment of the present invention, a circuit state determination module is further included, used for...

[0152] Before performing K current detections at a set detection location, determine whether the infrared circuit is in working condition.

[0153] If in working condition, the operation will be performed to conduct K current detections at the set detection location to obtain a set of detection results including K current values;

[0154] If it is not in working state, a working command is sent to the infrared circuit to make the infrared circuit in working state, and the operation of performing K current detections at the set detection position is performed to obtain a set of detection results including K current values.

[0155] In one specific embodiment of the present invention, the instruction sending module 301 is specifically used for:

[0156] Send a light-on command to the infrared circuit to turn on the infrared lights.

[0157] In one specific embodiment of the present invention, a fault type determination module is further included, used for:

[0158] When the current test result of the infrared circuit does not match the normal value range, determine whether the current test result is within the set polarity range.

[0159] If so, then the surface mount pin of the infrared circuit is incorrect;

[0160] If not, then the infrared circuit is faulty.

[0161] Corresponding to the above methods and system embodiments, this invention also provides an infrared circuit testing device and a computer-readable storage medium, which can be referred to in conjunction with the above.

[0162] See also Figure 4 The testing equipment for this infrared circuit may include:

[0163] Memory 401 is used to store computer programs;

[0164] Processor 402 is configured to execute a computer program to implement the steps of the infrared circuit testing method as described in any of the above embodiments.

[0165] A computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the testing method for the infrared circuit as described in any of the above embodiments. The computer-readable storage medium referred to herein includes random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disks, removable disks, CD-ROMs, or any other form of storage medium known in the art.

[0166] It should also be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0167] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0168] This article uses specific examples to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the technical solutions and core ideas of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made to the present invention without departing from the principles of the present invention, and these improvements and modifications also fall within the protection scope of the present invention.

Claims

1. A testing method for infrared circuits, characterized in that, include: Send a working command to the infrared circuit to put the infrared circuit into working state; N current detections are performed at the designated detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2. Determine whether the difference between the maximum and minimum values ​​of N current values ​​falls within a set range. If so, the average of the N current values ​​will be taken as the current test result of the infrared circuit. If not, multiple current detections are performed at the set detection position, and the current test result of the infrared circuit is determined based on the current values ​​detected at the set detection position during the test of this infrared circuit. The process of performing multiple current measurements at the designated detection location and determining the current test result of the infrared circuit based on the current values ​​measured at the designated detection location during this infrared circuit test includes: K current measurements are performed at the designated detection location to obtain a set of detection results including K current values. After obtaining a set of detection results including K current values, determine whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true; If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit. If the condition is not met, return to the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values; Where K is a positive integer not less than 2, the function Max represents the maximum value in {M0, M1, ..., Mi}, the function Min represents the minimum value in {M0, M1, ..., Mi}, M0 represents the average value of the N current values ​​obtained; i represents the current execution number of the operation of performing K current detections at the set detection position, i is a positive integer; M1 represents the average value of the first group of detection results including K current values ​​obtained by performing K current detections at the set detection position; Mi represents the average value of the i-th group of detection results including K current values ​​obtained by performing K current detections at the set detection position; Y represents the set accuracy threshold.

2. The testing method for infrared circuits according to claim 1, characterized in that, The determination of whether the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range includes: Judgment I max / I min Is Y true? If so, then determine that the difference between the maximum and minimum values ​​among the N current values ​​meets the set difference range; Otherwise, it is determined that the difference between the maximum and minimum values ​​among the N current values ​​does not meet the set difference range; Among them, I max I represents the maximum value among the N obtained current values. min This represents the minimum value among the N current values ​​obtained, and Y represents the set precision threshold.

3. The testing method for infrared circuits according to claim 2, characterized in that, After obtaining a set of detection results including K current values, the following is also included: when At that time, make a judgment Whether it is true or not, when When, then judge Is it valid? If true, the average value of each current value detected at the set detection position during the infrared circuit test will be taken as the current test result of the infrared circuit. If the condition is not met, return to the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values; Here, the function Ave represents the average value in {M0, M1, ..., Mi}.

4. The testing method for infrared circuits according to claim 2, characterized in that, Also includes: Before performing K current detections at the set detection position, it is determined whether the infrared circuit is in a working state. If the system is in working condition, the operation described above is performed: performing K current detections at the set detection position to obtain a set of detection results including K current values. If it is not in working state, a working command is sent to the infrared circuit to make the infrared circuit in working state, and the operation of performing K current detections at the set detection position to obtain a set of detection results including K current values ​​is performed.

5. The testing method for infrared circuits according to claim 1, characterized in that, Sending a working command to the infrared circuit to activate the infrared circuit includes: A light-on command is sent to the infrared circuit to turn on the infrared lamps.

6. The testing method for infrared circuits according to any one of claims 1 to 5, characterized in that, Also includes: When the current test result of the infrared circuit does not match the normal value range, determine whether the current test result is within the set polarity range; If so, then the surface mount pin of the infrared circuit is incorrect; If not, then the infrared circuit is determined to be faulty.

7. A testing system for infrared circuits, characterized in that, include: The instruction sending module is used to send working instructions to the infrared circuit to make the infrared circuit work. The initial detection module is used to perform N current detections at the set detection position of the infrared circuit to obtain N current values; N is a positive integer not less than 2. The first judgment module is used to determine whether the difference between the maximum and minimum values ​​among N current values ​​meets the set difference range. If so, the result confirmation module is triggered. The result confirmation module is used to take the average of N current values ​​as the current test result of the infrared circuit. If not, the repeated detection module is triggered. The repeated detection module is used to perform multiple current detections at the set detection position and determine the current test result of the infrared circuit based on the current values ​​detected at the set detection position during the test of the infrared circuit. The duplicate detection module includes: The execution unit is used to perform K current detections at a set detection location to obtain a set of detection results including K current values. The second judgment unit is used to determine whether Max{M0, M1, ..., Mi} / Min{M0, M1, ..., Mi}<Y is true whenever a set of detection results including K current values ​​is obtained; If true, the calculation unit is triggered. The calculation unit is used to take the average value of each current value detected at the set detection position during the test of the infrared circuit as the current test result of the infrared circuit. If the condition is not met, the execution unit is triggered to return to the operation of performing K current detections at the set detection location to obtain a set of detection results including K current values. Where K is a positive integer not less than 2, the function Max represents the maximum value in {M0, M1, ..., Mi}, the function Min represents the minimum value in {M0, M1, ..., Mi}, M0 represents the average value of the N current values ​​obtained; i represents the current execution number of the operation of performing K current detections at the set detection position, i is a positive integer; M1 represents the average value of the first group of detection results including K current values ​​obtained after performing K current detections at the set detection position; Mi represents the average value of the i-th group of detection results including K current values ​​obtained after performing K current detections at the set detection position; Y represents the set accuracy threshold.

8. A testing device for infrared circuits, characterized in that, include: Memory, used to store computer programs; A processor for executing the computer program to implement the steps of the testing method for infrared circuits as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the testing method for infrared circuits as described in any one of claims 1 to 6.

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