A differential crystal oscillator testing circuit and device

Abstract

The application belongs to the technical field of quartz crystal oscillators, and particularly relates to a differential crystal oscillator testing circuit and device, which comprises a power supply circuit, the power supply circuit comprises a power supply seat, and the power supply circuit is used for supplying power for the differential crystal oscillator testing circuit; a double-channel buffer, the double-channel buffer is connected with the power supply circuit, and the double-channel buffer is used for connecting the differential crystal oscillator; and an output circuit, the output circuit is connected with the power supply circuit and the double-channel buffer respectively, the output circuit comprises a connecting circuit, a frequency output circuit, a waveform output circuit and a signal selection circuit, the connecting circuit is connected with the double-channel buffer, and the frequency output circuit, the waveform output circuit and the signal selection circuit are connected with the connecting circuit respectively, so that the compatibility can be effectively improved, the testing efficiency is improved, and the testing requirements of users can be met.

Description

Technical Field

[0001] This invention relates to the field of quartz crystal oscillator technology, and in particular to a differential crystal oscillator testing circuit and device. Background Technology

[0002] With the rapid development of science and technology, the market demand for oscillators has also increased. In the field of quartz crystal oscillators, differential crystal oscillators have been widely used to meet user needs. A differential crystal oscillator is a high-end, miniaturized oscillator with an integrated chip, requiring no external circuitry; it can output the corresponding frequency simply by being powered on. The main output frequency signals of a differential crystal oscillator are three general-purpose differential signals: LVPECL (Low Voltage Positive ECL), LVDS (Low Voltage Diffeential Signaling), and HCSL (High-speed Current Steering Logic). It features high frequency, low voltage difference, and strong anti-interference capability.

[0003] Due to their miniaturization, high performance, and unique multi-output differential signal characteristics, the actual production process of differential crystal oscillators is cumbersome and complex, with numerous factors affecting their performance. Therefore, the testing in the final stage of differential crystal oscillator production is more rigorous than that for ordinary active crystals. During testing, the testing device uses two test boards to test the waveform and frequency signals of the differential crystal oscillator separately. Typically, one testing device can only test one type of differential crystal oscillator, resulting in poor compatibility. Furthermore, due to the miniaturization of differential crystal oscillators, material adhesion can occur during testing, affecting testing efficiency. Material adhesion refers to the phenomenon where the test probe is energized and presses against the differential crystal oscillator upon contact, and the crystal oscillator adheres to the probe as the test head moves upward after testing. Additionally, the pin definitions of differential crystal oscillators with voltage-controlled frequency functionality differ from those without, making commercially available testing devices incompatible with both.

[0004] Currently, commercially available differential crystal oscillator testing devices have complex testing procedures, high costs, and can only test a limited range of differential crystal oscillator specifications. Furthermore, their testing efficiency is low, failing to meet user needs. Therefore, it is necessary to design a differential crystal oscillator testing circuit and device to overcome the shortcomings of existing technologies. Summary of the Invention

[0005] The purpose of this invention is to provide a differential crystal oscillator test circuit and device, which aims to solve the technical problems of existing differential crystal oscillator test devices having complex test processes, high cost, limited range of testable differential crystal oscillator specifications, low test efficiency, and inability to meet user needs.

[0006] To achieve the above objectives, embodiments of the present invention provide a differential crystal oscillator test circuit, including a power supply circuit comprising a power supply socket for supplying power to the differential crystal oscillator test circuit; a dual-channel buffer connected to the power supply circuit for connecting the differential crystal oscillator; and an output circuit connected to both the power supply circuit and the dual-channel buffer, the output circuit comprising a connection circuit, a frequency output circuit, a waveform output circuit, and a signal selection circuit, wherein the connection circuit is connected to the dual-channel buffer, and the frequency output circuit, the waveform output circuit, and the signal selection circuit are respectively connected to the connection circuit.

[0007] Optionally, the connection circuit includes a connection chip, the input terminal of which is connected to the dual-channel buffer, and the output terminal of which is connected to the frequency output circuit, the waveform output circuit, and the signal selection circuit, respectively.

[0008] Optionally, the waveform output circuit includes a first waveform output interface and a second waveform output interface, wherein the first waveform output interface is connected to the positive output terminal of the connection chip, and the second waveform output interface is connected to the negative output terminal of the connection chip.

[0009] Optionally, the frequency output circuit includes a differential signal synthesizer and a frequency output interface, wherein the input terminal of the differential signal synthesizer is connected to the output terminal of the connection chip, and the output terminal of the differential signal synthesizer is connected to the frequency output interface.

[0010] Optionally, the signal selection circuit includes a signal selection port, the first, third and fifth pins of the signal selection port are respectively connected to the connection chip, the second pin of the signal selection port is connected to the power supply circuit, the fourth pin of the signal selection port is unconnected, and the sixth pin of the signal selection port is grounded.

[0011] Optionally, the power supply circuit is also connected to an oscillation time test port, which is connected to the third pin of the power supply socket.

[0012] The present invention also provides a differential crystal oscillator testing device, including the aforementioned differential crystal oscillator testing circuit, comprising a test circuit board, a probe holder, an anti-material-carrying device, and a probe holder; the probe holder and the probe holder are respectively fixedly connected to the test circuit board, the test circuit board is fixed to the anti-material-carrying device, and the differential crystal oscillator testing circuit is disposed on the test circuit board.

[0013] Optionally, the probe holder includes a probe holder body and a fixing post. The probe holder body is provided with a probe limiting groove and a fixing groove. One end of the fixing post is fixed to the fixing groove, and the other end of the fixing post is fixed to the test circuit board.

[0014] Optionally, the probe holder includes a fixed base and a central block. The central block is fixed to the middle of the base and has six probe through holes. Fixing holes are provided on both sides of the base for fixed connection with the test circuit board.

[0015] Optionally, the anti-slip device includes an anti-slip seat, a movable pad disposed within the anti-slip seat, and an elastic member disposed between the movable pad and the anti-slip seat. The test circuit board is fixed to the upper end of the anti-slip seat, and a limiting groove is provided at the lower end of the anti-slip seat. The movable pad extends outward from the anti-slip seat through the limiting groove.

[0016] The differential crystal oscillator testing device and circuit provided in this invention have at least one of the following technical effects:

[0017] By incorporating the frequency output circuit and waveform output circuit into the differential crystal oscillator circuit, simultaneous testing of frequency and waveform is achieved, improving the testing efficiency of the crystal oscillator. Furthermore, by connecting the dual-channel buffer to the differential crystal oscillator and controlling the tri-state voltages of the first and second pins, it is possible to simultaneously test two different specifications of differential crystal oscillators—one with voltage-controlled frequency functionality and the other without—effectively improving compatibility. Additionally, by connecting the signal selection circuit to the connection circuit, users can test three different types of differential signals—LVPECL, LVDS, and HCSL—according to their needs, simplifying the differential crystal oscillator testing process and meeting user testing requirements. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the differential crystal oscillator test circuit provided in an embodiment of the present invention;

[0019] Figure 2 This is a schematic diagram of the structure of the test circuit board provided in an embodiment of the present invention;

[0020] Figure 3 This is a front view of the anti-material-slip device provided in an embodiment of the present invention;

[0021] Figure 4 This is a front view of the differential crystal oscillator testing device in normal state according to an embodiment of the present invention;

[0022] Figure 5 This is a front view of the differential crystal oscillator testing device under pressure provided in an embodiment of the present invention;

[0023] Figure 6 This is a front view of the probe holder provided in an embodiment of the present invention;

[0024] Figure 7 This is a top view of the probe holder provided in an embodiment of the present invention;

[0025] Figure 8 This is a schematic diagram of the probe holder provided in an embodiment of the present invention.

[0026] The following are the labeling elements in the figure:

[0027] 1. Power supply circuit; H3. Power supply socket; S1. Oscillation start-up time test port;

[0028] 2. Dual-channel buffer; 3. Output circuit; 31. Connection circuit;

[0029] U1, Connecting chip; 32, Frequency output circuit; U5, Differential signal synthesizer;

[0030] 33. Waveform output circuit; T1, first waveform output interface; T2, second waveform output interface;

[0031] 34. Signal selection circuit; H2. Signal selection port; 4. Test circuit board;

[0032] 41. Test probe; 42. First fixing hole; 43. Second fixing hole;

[0033] 44. Third fixing hole; 45. Fourth fixing hole; 5. Probe fixing seat;

[0034] 51. Fixed base; 511. Base fixing hole; 512. Square groove;

[0035] 52. Center block; 521. Probe through hole; 6. Anti-material-carrying device;

[0036] 61. Anti-material-carrying seat; 611. Nut; 612. Stud;

[0037] 62. Movable gasket; 621. Gasket boss; 622. Gasket connecting plate;

[0038] 623. Connecting post; 63. Elastic element; 7. Probe mounting base;

[0039] 71. Probe holder body; 711. Probe limiting groove; 712. Fixing groove;

[0040] 72. Fixed column. Detailed Implementation

[0041] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain embodiments of the present invention, and should not be construed as limiting the present invention.

[0042] In the description of the embodiments of the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the present invention.

[0043] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of embodiments of the present invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0044] In the embodiments of the present invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of the present invention according to the specific circumstances.

[0045] In one embodiment of the present invention, such as Figure 1 and Figure 2As shown, a differential crystal oscillator test circuit is provided, including a power supply circuit 1, a dual-channel buffer 2, and an output circuit 3. The power supply circuit 1 includes a power supply socket H3, which supplies power to the differential crystal oscillator test circuit. The power supply socket H3 supplies power to the test circuit board 4, where the supply voltage depends on the differential crystal oscillator; in this embodiment, the supply voltage is 3.3V. The dual-channel buffer 2 is connected to the power supply circuit 1 and is used to connect to the differential crystal oscillator. By connecting the dual-channel buffer 2 to the differential crystal oscillator, the tri-state voltages of the first and second pins of the differential crystal oscillator are controlled, thereby simultaneously enabling testing of both differential crystal oscillators with and without voltage-controlled frequency functions. The output circuit 3 is connected to both the power supply circuit 1 and the dual-channel buffer 2. The output circuit 3 includes a connection circuit 31, a frequency output circuit 32, a waveform output circuit 33, and a signal selection circuit 34. The connection circuit 31 is connected to the dual-channel buffer 2, and the frequency output circuit 32, waveform output circuit 33, and signal selection circuit 34 are connected to the connection circuit 31. By setting up a frequency output circuit 32 and a waveform output circuit 33 in the differential crystal oscillator circuit, simultaneous testing of frequency and waveform can be achieved, improving the testing efficiency of the crystal oscillator. Furthermore, by setting up a dual-channel buffer 2 connected to the differential crystal oscillator, the tri-state voltages of the first and second pins of the differential crystal oscillator can be controlled, thus simultaneously enabling testing of two different specifications of differential crystal oscillators: one with voltage-controlled frequency function and the other without. Additionally, by setting up a signal selection circuit 34 connected to the connection circuit 31, users can test three different types of differential signals—LVPECL, LVDS, and HCSL—according to their needs, simplifying the differential crystal oscillator testing process and meeting user testing requirements.

[0046] Specifically, in another embodiment of the invention, such as Figure 1 and Figure 2As shown, the connection circuit 31 includes a connection chip U1. The input terminal of the connection chip U1 is connected to the dual-channel buffer 2. The output terminal of the connection chip U1 is connected to the frequency output circuit 32, the waveform output circuit 33, and the signal selection circuit 34, respectively. The first pin of the connection chip U1 is connected to the sixth pin of the dual-channel buffer 2, and the second pin of the connection chip U1 is connected to the third pin of the dual-channel buffer 2. When the differential crystal oscillator has a voltage-controlled frequency function, the first pin of the connection chip U1 receives the voltage-controlled voltage, and the second pin receives the enable voltage. When the differential crystal oscillator does not have a voltage-controlled frequency function, the first pin of the connection chip U1 receives the enable voltage, and the second pin is in a high-impedance state. The third pin of the connection chip U1 is grounded. The fourth pin of the connection chip U1 is connected to one end of a fourth resistor R4, and the other end of the fourth resistor R4 is connected to the waveform output circuit 33 and the frequency output circuit 32, respectively. The fifth pin of the connection chip U1 is connected to one end of a third resistor R3, and the other end of the third resistor R3 is connected to the waveform output circuit 33 and the frequency output circuit 32, respectively. The other end of the third resistor R3 is also connected to one end of the first resistor R1, and the other end of the fourth resistor R4 is also connected to one end of the second resistor R2. The other end of the first resistor R1 is connected to the other end of the second resistor R2, and the other end of the first resistor R1 is also connected to the signal selection circuit 34. The resistance values ​​of the first resistor R1, the second resistor R2, the third resistor R3, and the fourth resistor R4 are adjusted according to actual needs to perform impedance matching for the differential crystal oscillator test circuit. In this embodiment, the resistance values ​​of the first resistor R1 and the second resistor R2 are 50 ohms. The sixth pin of the connection chip U1 is connected to the power supply circuit 1.

[0047] Specifically, in another embodiment of the invention, such as Figure 1 and Figure 2 As shown, the waveform output circuit 33 includes a first waveform output interface T1 and a second waveform output interface T2. The first waveform output interface T1 is connected to the positive output terminal of the connection chip U1, and the second waveform output interface T2 is connected to the negative output terminal of the connection chip U1. Specifically, the first waveform output interface T1 is connected to the other end of the fourth resistor R4; the second waveform output interface T2 is connected to the other end of the third resistor R3. A positive voltage signal is output from the fourth pin of the connection chip U1, passes through the fourth resistor R4, and reaches the first waveform output interface T1. A negative voltage signal is output from the fifth pin of the connection chip U1, passes through the third resistor R3, and reaches the second waveform output interface T2. Differential probes are connected to both the first waveform output interface T1 and the second waveform output interface T2. When a positive voltage signal reaches the first waveform output interface T1 and a negative voltage signal reaches the second waveform output interface T2, the differential probes capture and measure the positive and negative voltage signals. The differential probes are connected to an oscilloscope to capture and measure the waveform signals.

[0048] Specifically, in another embodiment of the invention, such as Figure 1 and Figure 2 As shown, the frequency output circuit 32 includes a differential signal synthesizer U5 and a frequency output interface RF1. The input terminal of the differential signal synthesizer U5 is connected to the output terminal of the connection chip U1, and the output terminal of the differential signal synthesizer U5 is connected to the frequency output interface RF1. Specifically, the first pin of the differential signal synthesizer U5 is connected to the power supply circuit 1, and the second pin of the differential signal synthesizer U5 is grounded. The third pin of the differential signal synthesizer U5 is connected to the other end of the fourth resistor R4, inputting a positive differential signal into the differential signal synthesizer U5. The fourth pin of the differential signal synthesizer U5 is connected to the other end of the third resistor R3, inputting a negative differential signal into the differential signal synthesizer U5. The fifth pin of the differential signal synthesizer U5 is connected to the frequency output interface RF1, outputting a frequency signal. The positive and negative differential signals are input into the differential signal synthesizer U5. The differential signal synthesizer U5 synthesizes and amplifies the differential signals. The positive and negative differential signals are amplified and output as a frequency signal through the differential signal synthesizer U5. The frequency signal is then output to the frequency output interface RF1. The frequency output interface RF1 is an SMA interface. The frequency output interface RF1 is used to connect to the frequency counter, and the frequency counter reads the frequency signal.

[0049] Specifically, in another embodiment of the invention, such as Figure 1 and Figure 2As shown, the signal selection circuit 34 includes a signal selection port H2. The first, third, and fifth pins of signal selection port H2 are connected to the connection chip U1, the second pin of signal selection port H2 is connected to the power supply circuit 1, the fourth pin of signal selection port H2 is unconnected, and the sixth pin of signal selection port H2 is grounded. By connecting signal selection port H2 to the output terminal of connection chip U1, the two pins of signal selection port H2 are electrically connected, thereby selecting the differential crystal oscillator output signal type test to be performed on the current test circuit board. According to the user's actual test requirements, based on the required output signal type, the corresponding signal selection port H2 is selected to choose the output signal type of the differential crystal oscillator to be tested, and the pins of the output signal type selection port are electrically connected. Specifically, the first, third, and fifth pins of signal selection port H2 are connected to the other end of the first resistor R1. The second pin of signal selection port H2 is connected to a Vterm connection terminal, the fourth pin of signal selection port H2 is unconnected, and the sixth pin of signal selection port H2 is grounded. By connecting the first, third, and fifth pins of the signal selection port H2 to the output of the connection chip U1, the user can electrically connect the two pins through the signal selection port H2 to select the differential crystal oscillator output signal type to be tested by the differential crystal oscillator test circuit. When the first and second pins are electrically connected, the differential crystal oscillator with the output signal type LVPECL is tested; when the third and fourth pins are electrically connected, the differential crystal oscillator with the output signal type LVDS is tested; and when the fifth and sixth pins are electrically connected, the differential crystal oscillator with the output signal type HCSL is tested.

[0050] Specifically, in another embodiment of the invention, such as Figure 1 and Figure 2As shown, the first pin of power supply socket H3 is grounded, the second pin of power supply socket H3 is connected to a 3.3V terminal, the third pin of power supply socket H3 is connected to a VCC terminal, the fourth, fifth, sixth, and seventh pins of power supply socket H3 are connected to the dual-channel buffer 2, and the eighth pin of power supply socket H3 is connected to the signal selection circuit 34. The fourth pin of power supply socket H3 is connected to the second pin of dual-channel buffer 2, connecting to one channel input terminal of dual-channel buffer 2. The sixth pin of power supply socket H3 is connected to the fifth pin of dual-channel buffer 2, connecting to the other channel input terminal of dual-channel buffer 2. The fifth pin of power supply socket H3 is connected to the first pin of dual-channel buffer 2, connecting to one channel enable terminal of dual-channel buffer 2. The sixth pin of power supply socket H3 is connected to the fifth pin of dual-channel buffer 2, connecting to the other channel enable terminal of dual-channel buffer 2. Furthermore, the power supply circuit 1 is also connected to the oscillation time test port S1, which is connected to the third pin of the power supply base H3, thereby serving as a reference voltage for testing the oscillation time of the differential crystal oscillator. The oscillation time test is completed in conjunction with the VCC terminal.

[0051] The present invention also provides a differential crystal oscillator testing device, such as... Figures 1 to 8 As shown, a differential crystal oscillator test circuit, including a test circuit board 4, a probe holder 5, an anti-material-carrying device 6, and a probe holder 7, is mounted on the test circuit board 4. The probe holder 5 and probe holder 7 are fixedly connected to the test circuit board 4, and the test circuit board 4 is fixed to the anti-material-carrying device 6. The probe holder 7 includes a probe holder body 71 and a fixing post (not shown). The probe holder body 71 is provided with a probe limiting groove 711 and a fixing groove 712. One end of the fixing post is fixed to the fixing groove 712, and the other end of the fixing post is fixed to the test circuit board 4. One end of the differential probe is connected to an oscilloscope, and the other end of the differential probe is connected to the test circuit board 4. The differential probe is snapped into the probe limiting groove 711. The user can obtain the waveform signal of the differential crystal oscillator by electrically connecting the differential probe to the test circuit board 4.

[0052] Specifically, the probe holder 5 includes a fixed base 51 and a center block 52. The center block 52 is fixed in the middle of the base and has six probe through holes 521. The fixed base 51 has base fixing holes 511 on both sides for fixed connection with the test circuit board 4.

[0053] Furthermore, the bottom of the fixed base 51 is provided with a square groove 512, which is located below the center block 52, and the length and width of the square groove 512 match the center block 52. The depth of the square groove 512 is 1mm.

[0054] Both the probe holder 5 and the probe holder 7 are made of POM material, which has excellent insulation and high mechanical properties.

[0055] In another embodiment of the invention, such as Figures 3 to 7 As shown, the anti-slip device 6 includes an anti-slip seat 61, a movable pad 62 disposed within the anti-slip seat 61, and an elastic member 63 disposed between the movable pad 62 and the anti-slip seat 61. A test circuit board 4 is fixed to the upper end of the anti-slip seat 61, and a limiting groove (not shown) is provided at the lower end of the anti-slip seat 61. The movable pad 62 extends outward from the anti-slip seat 61 through the limiting groove. Test probes 41 are fixed on the test circuit board 4. The test probes 41 sequentially pass through the probe holder 5 and the anti-slip seat 61 and extend to the movable pad 62. The probe holder 5 fixes multiple test probes 41 at different positions, enabling electrical connection between the test probes 41 and the test circuit board 4.

[0056] This invention fixes the test circuit board 4 to the anti-carrying device 6. During the test, under the action of the external testing machine, the test circuit board 4 is pressed down, and the movable pad 62 retracts into the anti-carrying seat 61. At this time, the test probe 41 will pass through the movable pad 62 and make an electrical connection with the contact of the differential crystal oscillator. After the test is completed, the external testing machine controls the test circuit board 4 to move upward, and the movable pad 62 extends outward from the anti-carrying seat 61, separating the differential crystal oscillator that is in contact with the test probe 41, preventing the differential crystal oscillator and the test probe 41 from moving upward at the same time. This can effectively avoid the phenomenon of material carrying, and effectively improve the testing efficiency and production efficiency.

[0057] The movable gasket 62 includes a gasket boss 621 and a gasket connecting plate 622. The gasket connecting plate 622 is disposed at both ends of the gasket boss 621. The gasket connecting plate 622 abuts against the inner bottom of the anti-slip seat 61. The gasket boss 621 is connected to the limiting groove and extends to the outside of the bottom of the anti-slip seat 61. The gasket boss 621 is provided with several boss through holes (not shown in the figure). The test probe 41 passes through the boss through holes.

[0058] After the test circuit board 4 is pressed down, the pad connecting plate 622 and the pad boss 621 move upwards into the anti-slip seat 61, causing the elastic element 63 to deform and enter a compressed state. At this time, the test probe 41 passes through the boss through hole and is exposed outside the bottom of the anti-slip seat 61, thus enabling the test probe 41 to make an electrical connection with the differential crystal oscillator. When the test circuit board 4 moves upwards, the elastic element 63 returns to its natural state, the pad connecting plate 622 abuts against the bottom inside of the anti-slip seat 61, and the pad boss 621 extends outwards from the limiting slot to the bottom outside of the anti-slip seat 61. The limiting slot limits the outward extension length of the pad boss 621 to prevent the pad boss 621 from popping out too far. The test probe 41 exposed outside the bottom of the anti-slip seat 61 is covered by the movable pad 62 through the boss through hole, isolating the test probe 41 from the differential crystal oscillator, preventing material from being carried, and also preventing the test probe 41 from being subjected to external wear.

[0059] In another embodiment of the invention, such as Figures 2 to 5 As shown, a plurality of first fixing holes 42 are provided on one side of the test circuit board 4. The first fixing holes 42 are located on the upper and lower sides of the test probe 41 and are used to fix them to the anti-material-carrying device 6. A plurality of second fixing holes 43 are also provided on one side of the test circuit board 4. The second fixing holes 43 are located between the first fixing holes 42 and are used to fix them to the probe mounting base 5. The test circuit board 4 is also provided with a third fixing hole 44. The third fixing hole 44 is located in the middle of the test circuit board 4 and is used to fix it to the differential probe. A plurality of fourth fixing holes 45 are provided on the other side of the test circuit board 4 and are used to fix it to the external testing machine.

[0060] In another embodiment of the invention, such as Figures 1 to 8 As shown, the upper end of the anti-slip base 61 is provided with a screw hole (not shown), and a stud 612 is screwed into the screw hole. The stud 612 passes through the test circuit board 4, and the test circuit board 4 is screwed to the stud 612 by a nut 611, and fixed to the upper end of the anti-slip base 61. The test circuit board 4 is located between the anti-slip base 61 and the nut 611. Further, the gasket connecting plate 622 is provided with a connecting post 623. One end of the elastic member 63 is sleeved on the connecting post 623, and the other end of the elastic member 63 is sleeved on the stud 612 that passes through the screw hole and extends into the interior of the anti-slip base 61. In this way, the test circuit board 4 can be stably installed on the anti-slip base 61, preventing loosening during the pressing process, which could lead to poor contact between the differential crystal oscillator and the test probe 41.

[0061] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A differential crystal oscillator test circuit, comprising: The utility model relates to a differential crystal oscillator test circuit, including: Power supply circuit, the power supply circuit includes power supply seat, and the power supply circuit is used for power supply for differential crystal oscillator test circuit; Double -channel buffer, double -channel buffer is connected with the power supply circuit, and the double -channel buffer is used for connecting differential crystal oscillator; Output circuit, output circuit is connected with power supply circuit and double -channel buffer respectively, and the output circuit includes connecting circuit, frequency output circuit, waveform output circuit and signal selection circuit, connecting circuit is connected with double -channel buffer, and frequency output circuit, waveform output circuit and signal selection circuit are connected with connecting circuit respectively; The connecting circuit includes connecting chip, the input end of connecting chip is connected with the double -channel buffer, and the output end of connecting chip is connected with frequency output circuit, waveform output circuit and signal selection circuit respectively; The waveform output circuit includes first waveform output interface and second waveform output interface, and the first waveform output interface is connected with the positive output end of connecting chip, and the second waveform output interface is connected with the negative output end of connecting chip; The frequency output circuit includes differential signal synthesizer and frequency output interface, and the input end of differential signal synthesizer is connected with the output end of connecting chip, and the output end of differential signal synthesizer is connected with frequency output interface; The signal selection circuit includes signal selection port, and the first pin, third pin and fifth pin of signal selection port are connected with connecting chip respectively, and the second pin of signal selection port is connected with power supply circuit, and the fourth pin of signal selection port is empty, and the sixth pin of signal selection port is grounded.

2. The differential crystal oscillator test circuit of claim 1, wherein, The power supply circuit is also connected with a start -up time test port, and the start -up time test port is connected with the third pin of the power supply seat.

3. A differential crystal oscillator testing apparatus comprising the differential crystal oscillator testing circuit according to claim 1 or 2, characterized in that, It includes test circuit board, probe fixing base, anti-material device and probe fixing base;The probe fixing base and the probe fixing base are fixedly connected with the test circuit board respectively, and the test circuit board is fixed to the anti-material device, and the differential crystal oscillator test circuit is arranged on the test circuit board.

4. The differential crystal oscillator testing apparatus of claim 3, wherein, The probe fixing base includes a probe seat body and a fixing column, the probe seat body is provided with a probe limiting groove and a fixing groove, one end of the fixing column is fixed to the fixing groove, and the other end of the fixing column is fixed to the test circuit board.

5. The differential crystal oscillator testing apparatus of claim 3, wherein, The probe fixing base includes a fixing base and a center block, the center block is fixed to the middle part of the base, the center block is provided with six probe through holes, and the two sides of the base are provided with fixing holes for fixedly connected with the test circuit board.

6. The differential crystal oscillator testing apparatus of claim 3, wherein, The anti-material device includes an anti-material seat, a movable gasket arranged in the anti-material seat and an elastic member arranged between the movable gasket and the anti-material seat, the test circuit board is fixed to the upper end of the anti-material seat, the lower end of the anti-material seat is provided with a limiting clamping groove, and the movable gasket extends to the outside of the anti-material seat through the limiting clamping groove.

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