A plug-in lighting test system and device

Abstract

The present invention discloses a plug-in lighting test system and device. The plug-in lighting test system includes a high-speed data connector dual-male wire fixing unit, a first plug-in mechanism, and a signal generating system. One end of the high-speed data connector dual-male wire fixing unit is electrically connected to the screen to be tested, and the other end is electrically connected to the signal generating system through the first plug-in mechanism; the first plug-in mechanism includes a connected first plug adapter and a plurality of first probes, the high-speed data connector dual-male wire fixing unit includes a plurality of high-speed data connector probes, the first probe end face is arranged relative to the high-speed data connector probe end face to make an on-off connection; the diameter of the plurality of first probes and the threshold value of the adjacent spacing match the diameter and adjacent spacing of the plurality of high-speed data connector probes. The present invention can reduce link impedance and improve signal recognition capability, thereby improving the yield and stability of screen lighting.

Description

Technical Field

[0001] The invention belongs to the technical field of screen detection, and in particular relates to a plug-in lighting test system and device. Background Art

[0002] LCD screens are increasingly used in electronic products. After production, LCD screens need to be inspected for compliance with usage requirements. This requires illuminating the terminal screen and performing high-frequency signal testing (FPD-LINK III). FPD-LINK III is a serial bus solution that supports full-duplex control for high-speed video data transmission and two-way control communication over a single differential link. FPD-LINK III uses bidirectional communication at low signal speeds and unidirectional communication at high signal speeds (higher frequencies are preferred). When the signal generation system first connects to the screen, low-speed bidirectional communication is used. Once the screen connection is confirmed, high-frequency unidirectional signal transmission is initiated to illuminate the product.

[0003] When the screen lights up, the screen needs to be placed on the test fixture, and the test contacts of the screen are electrically connected to the PCB fixing unit, and the PCB fixing unit is electrically connected to the signal generating system to realize the lighting test. In conventional testing machines, the PCB fixing unit and the signal generating system are electrically connected through the POGOPIN connector crimping. The spacing between adjacent probes on the PCB is 8mm, and the probe end face diameter is 1.3mm. The spacing between adjacent probes on the POGOPIN is 2mm, and the probe end face diameter is 0.6mm. The large difference between the PCB probe spacing and the POGOPIN probe spacing, and the large difference between the end face diameters of the two types of probes, result in high impedance peaks and poor signal recognition, affecting the dot screen test. Summary of the Invention

[0004] In view of all or part of the above-mentioned deficiencies in the prior art, the object of the present invention is to provide a plug-in lighting test system and device that can reduce link impedance, improve signal recognition capability, and thus improve the yield and stability of screen lighting.

[0005] In order to achieve the above-mentioned object of the invention, the present invention provides the following technical solutions:

[0006] In one aspect, the present invention provides a pluggable lighting test system, comprising a high-speed data connector dual-male wire fixing unit, a first pluggable mechanism, and a signal generating system. One end of the high-speed data connector dual-male wire fixing unit (HSD dual-male wire fixing unit) is electrically connected to the screen to be tested, and the other end is electrically connected to the signal generating system via the first pluggable mechanism. The first pluggable mechanism includes a first plug adapter and a plurality of first probes connected thereto. The high-speed data connector dual-male wire fixing unit includes a plurality of high-speed data connector probes (HSD probes), with the end faces of the first probes positioned opposite the end faces of the high-speed data connector probes to provide an on-off connection. The diameters and adjacent spacing thresholds of the plurality of first probes match those of the plurality of high-speed data connector probes. This matching does not necessarily require that the diameters and adjacent spacings of the plurality of first probes and the plurality of high-speed data connector probes be identical; it only requires that electrical connection between the first probes and the high-speed data connector probes be achieved. Preferably, the diameters of the end faces of the plurality of first probes are 0.4-0.8 mm, and the adjacent spacings are 1.5-2.5 mm. The diameter of the end faces of several of the high-speed data connector probes is 0.8-1.4 mm, and the adjacent spacing is 1.5-2.5 mm. The high-speed data connector double male line fixing unit can be selected from the commonly used high-speed data connector double male line fixing units on the market, and the adjacent spacing of the high-speed data connector probes thereon can be, for example, 1.5 mm, 2 mm or 2.5 mm.

[0007] The present invention adopts a spacing between adjacent high-speed data connector probes on a high-speed data connector dual-male line fixing unit, and the spacing is much smaller than the spacing between adjacent probes on the original PCB fixing unit, making the structure between the probes more compact and reducing the impedance value of the link. In addition, the diameter difference between the high-speed data connector probe and the first probe is small, which further reduces the impedance value of the link, improves the signal recognition capability, and thus improves the yield and stability of the screen lighting. At the same time, the high-speed data connector dual-male line fixing unit and the signal generating system are connected by plugging and unplugging. On the one hand, the probe structure is optimized to reduce impedance. On the other hand, the screen can correspond to different signal generating systems to solve the problem that the test box in the signal generating system cannot automatically switch the dial code, thereby realizing more functional tests.

[0008] Of course, the spacing between the high-speed data connector probes and the first probes can be further reduced, as can the difference in their diameters, further reducing the impedance of the link. For example, the diameter of the end faces of several first probes is 0.5-0.7mm, and the spacing between adjacent probes is 1.8-2.2mm. The diameter of the end faces of several high-speed data connector probes is 1.0-1.2mm, and the spacing between adjacent probes is 1.8-2.2mm. This further reduces the impedance of the detection.

[0009] The high-speed data connector dual-male line fixing unit also includes a first high-speed data connector male head (first HSD male head), the high-speed data connector probe is embedded in the first high-speed data connector male head, and the first plugging and unplugging mechanism also includes a first shaped needle mold, which is mounted on the first plug adapter and the first probe is embedded in the first shaped needle mold. The shape of the first shaped needle mold matches the shape of the first high-speed data connector male head to facilitate plugging and unplugging.

[0010] The plug-in lighting test system also includes a second plug-in mechanism having the same structure as the first plug-in mechanism. The high-speed data connector dual-male line fixing unit is electrically connected to the screen under test via the second plug-in mechanism. The first and second plug-in mechanisms have the same structural configuration and can be used interchangeably, reducing costs.

[0011] The second plug-in mechanism includes a second plug adapter and a plurality of second probes connected to each other. The screen to be tested includes screen probes. The end faces of the second probes are arranged opposite to the end faces of the screen probes to form an on-off connection.

[0012] The screen to be tested also includes a screen male head, the screen probe is embedded in the screen male head, the second plug-in mechanism also includes a second profiling needle mold, the second profiling needle mold is installed on the second plug adapter, and the second probe is embedded in the second profiling needle mold.

[0013] The first plugging mechanism is connected to a first lifting mechanism that drives the first plugging mechanism to move up and down, thereby establishing or disconnecting the electrical connection between the first plugging mechanism and the dual-male wire fixing unit of the high-speed data connector. The first lifting mechanism enables automatic plugging and unplugging of the first plugging mechanism.

[0014] The first plugging and unplugging mechanism is further connected to a three-axis adjustment mechanism comprising an X-axis adjustment mechanism, a Y-axis adjustment mechanism, and a θ-axis adjustment mechanism, wherein the Y-axis adjustment mechanism is connected to the first lifting mechanism. The three-axis adjustment mechanism allows the position of the first plugging and unplugging mechanism to be adjusted to align the male connector of the first high-speed data connector with the dual male line fixing unit of the high-speed data connector, enabling accurate plugging and unplugging.

[0015] The present invention also provides a plug-in type lighting test device, comprising a plug-in type lighting test system in any of the above solutions.

[0016] The plug-in lighting test device further comprises a turntable, on which are provided a plurality of jigs for placing the screen to be tested, and the high-speed data connector double-male line fixing unit is mounted on the jigs.

[0017] Compared with the prior art, the present invention has at least the following beneficial effects: providing a plug-in lighting test system and device, which uses the spacing between adjacent high-speed data connector probes on the high-speed data connector double-male line fixing unit to make the structure between the probes more compact, which can reduce the impedance value of the link. In addition, the diameter difference between the high-speed data connector probe and the first probe is small, which further reduces the impedance value of the link, improves the signal recognition capability, and thus improves the yield and stability of the screen lighting. At the same time, by connecting the high-speed data connector double-male line fixing unit and the signal generating system in a plug-in manner, on the one hand, the impedance can be reduced by coordinating with the optimized setting of the probe structure, and on the other hand, the screen can be made to correspond to different signal generating systems to solve the problem that the test box in the signal generating system cannot automatically switch the dial code, thereby realizing more functional tests. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the specific embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 This is a schematic diagram of the link line in Example 2 of the present invention;

[0020] Figure 2 Schematic diagram of the structure of the first contoured plug head or the second contoured plug head in Embodiments 1 and 2 of the present invention;

[0021] Figure 3 is a top view of the first contoured plug head or the second contoured plug head in Embodiments 1 and 2 of the present invention;

[0022] Figure 4 Schematic diagram of the exploded structure of the first contoured plug head or the second contoured plug head in Embodiments 1 and 2 of the present invention;

[0023] Figure 5 2 is a schematic structural diagram of a plug-in lighting test device in Example 3 of the present invention;

[0024] Figure 6 This is a structural diagram of the fixture, the first plugging and unplugging mechanism, and the high-speed data connector dual-male line fixing unit in Example 3 of the present invention;

[0025] Figure 7 This is a schematic diagram of the link line in Comparative Example 1.

[0026] Figure markings: 1-high-speed data connector dual male line fixing unit; 11-first high-speed data connector male head; 12-second high-speed data connector male head 2-first plug-in mechanism; 21-first plug adapter; 22-first profiling needle mold; 23-first probe; 24-first plug-in line; 25-test female head; 3-signal generating system; 31-test male head; 4-second plug-in mechanism; 41-second plug adapter; 42-second profiling needle mold; 43-second probe; 44-second plug-in line; 45-second high-speed data connector female head; 5-plug-in lighting test device; 51-turntable; 52-jig; 6-POGOPIN connector; 7-PCB fixing unit. DETAILED DESCRIPTION

[0027] The following will clearly and completely describe the technical solutions in the specific embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention. The plug-in lighting test system and device provided by the present invention mainly relate to the liquid crystal panel inspection and repair industry, such as AOI, gamma, EDID, etc.

[0028] Example 1

[0029] This embodiment provides a plug-in lighting test system. Figure 1 , including a high-speed data connector dual male line fixing unit 1, a first plug-in mechanism 2 and a signal generating system 3. The signal generating system 3 includes a power supply, a computer device PC connected to the power supply, and a test box. The computer device and the test box are connected to each other via a USB cable and an HDMI cable. The test box includes a test male connector 31. The male connectors in this embodiment are all high-speed data connector connectors. One end of the high-speed data connector dual male line fixing unit 1 is connected to the screen to be tested (i.e. Figure 1 The other end is electrically connected to the signal generating system 3 through the first plug-in mechanism 2.

[0030] The high-speed data connector dual-male wire fixing unit 1 includes a first high-speed data connector male connector 11 and a second high-speed data connector male connector 12. Four high-speed data connector probes are embedded within the first high-speed data connector male connector 11. Other embodiments may include more or fewer high-speed data connector probes, for example, eight. The four high-speed data connector probes are arranged in a square matrix, with the spacing between adjacent high-speed data connector probes (i.e., adjacent high-speed data connector probes on the sides of the square) being 2 mm, but can also be 1.5 mm or 2.5 mm, depending on actual needs.

[0031] Reference Figure 1-3The first plugging mechanism 2 includes a first plug adapter 21, a first profiling needle mold 22, a plurality of first probes 23, a first plugging cable 24, and a female test connector 25. The first plug adapter 21, the first profiling needle mold 22, and the plurality of first probes 23 form a first profiling plug connector. One end of the first plugging cable 24 is connected to the first profiling plug connector, and the other end is connected to the female test connector 25. The female connectors in this embodiment are all high-speed data connectors. The female test connector 25 is connected to the male test connector 31 on the test box.

[0032] The first profiling pin mold 22 is mounted on the first plug adapter 21. In a specific embodiment, the first profiling pin mold 22 is connected to the first plug adapter 21 via a first tapered step screw. The first profiling pin mold 22 has a first insertion hole, through which the first tapered step screw passes and is threadedly connected to the first plug adapter 21. A second elastic member is also disposed between the two tapered step screws. The specific structure of the first plugging mechanism 2 can be found in the applicant's Chinese patent application, application number CN202210360144.2.

[0033] Reference Figure 2-4 First probes 23 are embedded within the first contoured needle mold 22. In this embodiment, four first probes 23 are embedded within the first contoured needle mold 22. In other embodiments, more or fewer first probes 23 may be provided, for example, eight. The four first probes 23 are arranged in a square matrix, with the spacing between two adjacent first probes 23 (referring to two first probes 23 adjacent to the sides of the square) being 2 mm. This spacing can also be 1.5 mm, 2.5 mm, or other spacing depending on actual needs. The four high-speed data connector probes correspond to the four first probes 23 in a one-to-one arrangement. This allows the high-speed data connector probes to contact or separate from the first probes 23, achieving electrical connectivity.

[0034] The diameter of the four first probes 23 and the threshold of the adjacent spacing match the diameter and adjacent spacing of the four high-speed data connector probes. In this embodiment, the diameter of the end faces of the four first probes 23 is 0.6 mm, and the diameter of the end faces of the four high-speed data connector probes is 1.1 mm. The end faces here refer to the surfaces on the first probes 23 and the high-speed data connector probes that are used for contacting electrical connections. According to actual needs, the diameter of the end face of the first probe 23 can also be 0.4 mm or 0.8 mm, etc., and the diameter of the end face of the high-speed data connector probe can also be 0.8 mm or 1.4 mm, etc. The diameter of the end face of the high-speed data connector probe is smaller than the probe diameter on the traditional PCB fixing unit, and the spacing between adjacent high-speed data connector probes is smaller than the spacing between adjacent probes on the traditional PCB fixing unit. This can improve the contact stability between the high-speed data connector probe and the first probe 23, reduce the link impedance, and improve the signal recognition capability, thereby improving the yield and stability of the screen lighting.

[0035] Example 2

[0036] The current lighting test machine has two specific mechanical actions to connect the test circuit in series. Figure 1 The plug-in lighting test system further includes a second plug-in mechanism 4. In this embodiment, the second plug-in mechanism 4 has the same structure as the first plug-in mechanism 2, and the high-speed data connector double-male line fixing unit 1 is electrically connected to the screen to be tested, that is, the product, through the second plug-in mechanism 4. Figure 1 and Figure 2 The second plugging mechanism 4 is structured as follows: it includes a second plug adapter 41, a second profiling needle mold 42, a plurality of second probes 43, a second plugging cable 44, and a second high-speed data connector female connector 45. The second plug adapter 41, the second profiling needle mold 42, and the plurality of second probes 43 form a second profiling plugging head. One end of the second plugging cable 44 is connected to the second profiling plugging head, and the other end is connected to the second high-speed data connector female connector 45.

[0037] The second high-speed data connector female head 45 is connected to the second high-speed data connector male head 12 on the high-speed data connector dual male line fixing unit 1. The second profiling needle mold 42 is installed on the second plug adapter 41. In a specific embodiment, the second profiling needle mold 42 has the same structure as the first profiling needle mold 22. Figure 2-4 Second probes 43 are embedded in the second profiling needle mold 42. Four second probes 43 are embedded within the second profiling needle mold 42. In other embodiments, more or fewer second probes, such as eight, may be provided. The four second probes 43 are arranged in a square matrix. The spacing between two adjacent second probes 43 (i.e., two adjacent second probes 43 on the sides of the square) is 2 mm, but can also be 1.5 mm or 2.5 mm, depending on actual needs.

[0038] The screen to be tested includes a male screen connector, which has four screen probes embedded within it. In other embodiments, more or fewer screen probes, such as eight, may be provided. The four screen probes are arranged in a square matrix, with the spacing between two adjacent screen probes (referring to two screen probes adjacent to the sides of the square) being 2 mm, but can also be 1.5 mm or 2.5 mm, depending on actual needs. The end faces of the four screen probes correspond to the end faces of the four second probes 43 and are arranged relative to each other. This allows the end faces of the screen probes to contact or separate from the end faces of the second probes 43, thereby achieving electrical connection.

[0039] The first plug-in mechanism 2 is connected to a first lifting mechanism, which drives the first plug-in mechanism 2 to perform lifting motion, and is used to establish or disconnect the electrical connection between the first plug-in mechanism 2 and the high-speed data connector double-male line fixing unit 1, thereby realizing automatic plug-in and pull-out. In other embodiments, the plug-in and pull-out method can be manual plug-in and pull-out. The first plug-in mechanism 2 is also connected to a three-axis adjustment mechanism, which includes a connected X-axis adjustment mechanism, a Y-axis adjustment mechanism, and a θ-axis adjustment mechanism, and the Y-axis adjustment mechanism is connected to the first lifting mechanism. It is convenient to adjust the first plug-in mechanism 2 in multiple directions to complete the electrical connection with the first high-speed data connector male head 11. The second plug-in mechanism 4 can also be connected to a second lifting mechanism and a three-axis adjustment mechanism, and the settings are the same and will not be repeated, so as to complete the electrical connection with the screen male head.

[0040] Example 3

[0041] A plug-in lighting test device 5 includes a plug-in lighting test system provided in Example 2.

[0042] Combine Figure 1 And refer to Figure 5 The plug-in lighting test device 5 also includes a turntable 51, on which are mounted several jigs 52 for placing the screen to be tested. The high-speed data connector dual-male wire fixing unit 1 is mounted on the jigs 52. Each jig 52 corresponds to a plug-in lighting test system, but this does not limit each jig 52 to corresponding to the same signal generating system 3. It can be distinguished that each jig 52 corresponds to the same second plug-in mechanism 4 and the same high-speed data connector dual-male wire fixing unit 1, but does not correspond to the same signal generating system 3 and the same first plug-in mechanism 2.

[0043] Combine Figure 1 And refer to Figure 6 The second plug-in mechanism 4 and the high-speed data connector dual male line fixing unit 1 are installed under the fixture 52 and rotate with the rotation of the turntable 51. The first plug-in mechanism 2 and the signal generating system 3 do not rotate with the rotation of the turntable 51. The second high-speed data connector male connector 12 on the high-speed data connector dual male line fixing unit 1 is connected to the second high-speed data connector female connector 45 on the second plug-in mechanism 4, and the test male connector 31 on the test box is connected to the test female connector 25 on the first plug-in mechanism 2. The following describes the operation method of the plug-in lighting test system and device provided by the present invention in combination with Examples 2 and 3. The specific operation steps (not limited to the operation sequence) are as follows:

[0044] The LCD screen to be tested, or the product, is transported by the transport mechanism to a jig 52 on the turntable 51. The second three-axis adjustment mechanism is used to adjust the X-axis, Y-axis, and θ-axis positions of the second plug-in mechanism 4. The second lifting mechanism then raises the second plug-in mechanism 4. The second probe 43 is inserted into the male connector of the screen, where it contacts the screen probe, completing the first mechanical action. The first three-axis adjustment mechanism is used to adjust the X-axis, Y-axis, and θ-axis positions of the first plug-in mechanism 2. The first lifting mechanism then raises the first plug-in mechanism 2. The first probe 23 is inserted into the male connector of the first high-speed data connector 11, where it contacts the high-speed data connector probe, completing the second mechanical action. The test circuits are connected in series, completing the screen lighting test.

[0045] After the lighting test, the jig 52, under the action of the rotation of the turntable 51, enters the next station for further testing. At this time, the first contoured needle mold 22 of the first plug-in mechanism 2 is removed from the first high-speed data connector male connector 11, so that the high-speed data connector dual male line fixing unit 1 rotates along with the screen to be tested and the jig 52. After the jig 52 and the screen enter the next station, the next station is equipped with a second first plug-in mechanism and a second signal generating system. The second signal generating system is used to complete a different type of test. The first plug-in mechanism corresponding to the next station is plugged into the high-speed data connector dual male line fixing unit 1 and connected to the corresponding signal generating system of the station, completing the second type of test of the screen to be tested.

[0046] Comparative Example 1

[0047] A lighting test device, based on embodiment 3, combined with Figure 1 And refer to Figure 7 The first plug-in mechanism 2 is replaced with a POGO pin connector 6, and the high-speed data connector dual male line fixing unit 1 is replaced with a PCB fixing unit 7. The plug-in connection between the first plug-in mechanism 2 and the high-speed data connector dual male line fixing unit 1 is changed to a POGO pin crimping method for the PCB. The probes on the POGO pin connector 6 have a diameter of 0.6 mm and a spacing of 2 mm between adjacent probes. The probes on the PCB fixing unit 7 have a diameter of 1.3 mm and a spacing of 8 mm between adjacent probes.

[0048] Specifically, Example 3 uses a high-speed data connector with form-fitting plugging, a high-speed data connector with dual male lines, and a high-speed data connector with form-fitting plugging. Comparative Example 1 uses a high-speed data connector with form-fitting plugging, and PCB POGO pin crimping. Impedance and waveform tests were performed on Example 3 and Comparative Example 1.

[0049] Test results:

[0050] The impedance diagram using the "high-speed data connector contoured plug-in screen + PCB-POGOPIN crimping method" has an uneven transition, an impedance peak of 125R, and a messy waveform. It is not easy to distinguish between high and low levels, which is not conducive to signal recognition, that is, it is not conducive to high-frequency signal transmission, and thus is not conducive to point-to-screen.

[0051] The impedance diagram of the "High-Speed ​​Data Connector (HSD) Profiling Plug Screen + High-Speed ​​Data Connector (HSD) Profiling Plug High-Speed ​​Data Connector Dual Male Line Fixing Unit" exhibits a smooth transition, maintaining impedance at approximately 90R. The waveform is stable, making it easy to distinguish between high and low levels, facilitating signal recognition and, in turn, high-frequency signal transmission, thereby improving screen yield and stability. It can be seen that using the plug-in lighting test system and device provided in this embodiment for LCD screen lighting testing can optimize the impedance of the crimping link and improve the crimping lighting yield and stability.

[0052] The above embodiments are only intended to help understand the method and core concept of the present invention. It should be noted that, without departing from the principles of the present invention, a number of improvements and modifications may be made to the present invention by those skilled in the art, and such improvements and modifications also fall within the scope of protection of the claims of the present invention.

Claims

1. A plug-in lighting test system, characterized in that: The invention comprises a high-speed data connector dual-male line fixing unit (1), a first plug-in mechanism (2) and a signal generating system (3), wherein one end of the high-speed data connector dual-male line fixing unit (1) is electrically connected to a screen to be tested, and the other end is electrically connected to the signal generating system (3) via the first plug-in mechanism (2); the first plug-in mechanism (2) comprises a first plug adapter (21) and a plurality of first probes (23) connected to each other; the high-speed data connector dual-male line fixing unit (1) comprises a plurality of high-speed data connector probes, and the end faces of the first probes (23) are arranged opposite to the end faces of the high-speed data connector probes to make an on-off connection; the diameters and the thresholds of the adjacent spacings of the plurality of first probes (23) match the diameters and the adjacent spacings of the plurality of high-speed data connector probes.

2. The plug-in lighting test system according to claim 1, characterized in that: The high-speed data connector dual-male line fixing unit (1) further comprises a first high-speed data connector male head (11), wherein the high-speed data connector probe is embedded in the first high-speed data connector male head (11), and the first plugging and unplugging mechanism (2) further comprises a first profiling needle mold (22), wherein the first profiling needle mold (22) is mounted on the first plug adapter (21), and the first probe (23) is embedded in the first profiling needle mold (22).

3. The plug-in lighting test system according to claim 1, characterized in that: The plug-in lighting test system further comprises a second plug-in mechanism (4), the second plug-in mechanism (4) having the same structure as the first plug-in mechanism (2), and the high-speed data connector double-male line fixing unit (1) is electrically connected to the screen to be tested via the second plug-in mechanism (4).

4. The plug-in lighting test system according to claim 3, characterized in that: The second plug-in mechanism (4) comprises a second plug adapter (41) and a plurality of second probes (43) connected to each other. The screen to be tested comprises a screen probe. The end face of the second probe (43) is arranged opposite to the end face of the screen probe to form an on-off connection.

5. The plug-in lighting test system according to claim 4, characterized in that: The screen to be tested further comprises a screen male connector, the screen probe is embedded in the screen male connector, the second plug-in mechanism (4) further comprises a second shaped needle mold (42), the second shaped needle mold (42) is mounted on the second plug adapter (41), and the second probe (43) is embedded in the second shaped needle mold (42).

6. The plug-in lighting test system according to claim 1, characterized in that: The first plugging mechanism (2) is connected to a first lifting mechanism, and the first lifting mechanism drives the first plugging mechanism (2) to perform lifting motion, so as to establish or disconnect an electrical connection between the first plugging mechanism (2) and the high-speed data connector double-male line fixing unit (1).

7. The plug-in lighting test system according to claim 6, characterized in that: The first plug-in mechanism (2) is also connected to a three-axis adjustment mechanism, the three-axis adjustment mechanism comprising an X-axis adjustment mechanism, a Y-axis adjustment mechanism and a θ-axis adjustment mechanism that are connected, and the Y-axis adjustment mechanism is connected to the first lifting mechanism.

8. A plug-in lighting test device, characterized in that: A plug-in lighting test system comprising any one of claims 1 to 7.

9. The plug-in lighting test device according to claim 8, characterized in that: The plug-in lighting test device (5) further comprises a turntable (51), on which are provided a plurality of jigs (52) for placing the screen to be tested, and the high-speed data connector double-male line fixing unit (1) is mounted on the jigs (52).

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