Automated factory testing methods, devices, equipment, and media for intelligent gateway LoRa base stations

Abstract

This invention provides an automated factory testing method, apparatus, equipment, and medium for smart gateway LoRa base stations. The method includes: processing data transmission and reception via an RS485 serial port to verify the accuracy of the transmitted and received information of the smart gateway LoRa base station under test; performing read / write processing on the EMMC module and verifying it; conducting dial-up tests on the communication components to verify the network status of the smart gateway LoRa base station under test; collecting and comparing the current values ​​of each interface of the ADC module; reading the frequency band values ​​of the RF module and comparing them with a preset qualified set; establishing communication between the RF module and the LoRa module under test, and performing communication tests on the LoRa module under test; and outputting an alarm signal when a test anomaly signal is detected. Furthermore, existing automated factory testing solutions for industrial smart gateway LoRa base stations rely too heavily on third-party testing equipment, increase human intervention, have high testing and maintenance costs, and are prone to human error.

Description

Technical Field

[0001] This invention relates to the field of industrial smart gateway testing technology, specifically to automated factory testing methods, devices, equipment, and media for smart gateway LoRa base stations. Background Technology

[0002] Traditional industrial smart gateway LoRa base station automated factory testing solutions primarily rely on spectrum analyzers to detect parameters such as transmit power and frequency offset, or directly use modules to transmit information to determine signal strength and pass / fail status. These solutions lack statistical analysis of the test results. However, this approach is overly dependent on third-party testing equipment, increasing human intervention. Such equipment is not only expensive, increasing testing costs, but also complex to operate and prone to human error. Furthermore, it occupies space, incurs high maintenance costs, and the distance and antenna of the LoRa RF test significantly affect human operation. The software version needs to be generated according to different frequency bands, leading to high maintenance costs, potential programming errors causing communication failures, and other uncontrollable factors, resulting in inaccurate test results. The failure to statistically analyze test items further hinders the factory testing of the industrial smart gateway LoRa base station.

[0003] In view of the above, this application is hereby submitted. Summary of the Invention

[0004] In view of this, the purpose of this invention is to provide an automated factory testing method, apparatus, equipment, and medium for smart gateway LoRa base stations. This effectively solves the problems of existing automated factory testing solutions for industrial smart gateway LoRa base stations that rely too heavily on third-party testing equipment, resulting in excessive human intervention. Such testing equipment is not only expensive, increasing testing costs, but also complex to operate and prone to human error. Furthermore, this equipment occupies space, has high maintenance costs, and the distance and antenna of the LoRa RF test significantly affect human operation. The software version needs to be generated according to different frequency bands, leading to high maintenance costs, potential programming errors causing communication failures, and other uncontrollable factors, resulting in inaccurate test results. The failure to statistically analyze test items also affects the factory testing of the entire industrial smart gateway LoRa base station.

[0005] This invention discloses an automated factory testing method for intelligent gateway LoRa base stations, comprising:

[0006] Data transmission and reception are performed on the RS485 serial port of the LoRa smart gateway base station to be tested in order to verify the accuracy of the transmission and reception information of the LoRa smart gateway base station to be tested.

[0007] The EMMC module of the LoRa smart gateway base station to be tested is read and written, and then verified.

[0008] A dial-up test is performed on the communication components of the LoRa base station to be tested in order to verify the network status of the LoRa base station to be tested.

[0009] The current value of each interface of the ADC module of the LoRa base station to be tested is collected and compared.

[0010] Read the frequency band value of the radio frequency module of the LoRa base station to be tested, and compare the frequency band value with a preset qualified set;

[0011] Establish communication between the radio frequency module and the LoRa module under test, and perform communication testing on the LoRa module under test;

[0012] When an abnormal test signal is detected, an alarm signal is output.

[0013] Preferably, the RS485 serial port of the LoRa smart gateway base station to be tested performs self-transmission and self-reception data processing, specifically as follows:

[0014] Send a preset fixed-length data to all RS485 serial ports of the LoRa smart gateway base station to be tested;

[0015] Receive data from all RS485 serial ports of the LoRa smart gateway base station to be tested;

[0016] When it is determined that the received data is consistent with the fixed-length data, a test pass signal is generated;

[0017] When it is determined that the received data is inconsistent with the fixed-length data, a test anomaly signal is generated.

[0018] Preferably, the EMMC module of the LoRa base station to be tested is read / written and verified, specifically as follows:

[0019] When it is determined that the EMMC module of the LoRa base station to be tested is successfully mounted, a pre-written fixed file is created and MD5 verification is performed.

[0020] The fixed file is copied into the EMMC module, and it is determined whether the fixed file in the EMMC module is consistent with the fixed file.

[0021] If so, generate a test pass signal;

[0022] If not, generate a test abnormality signal.

[0023] Preferably, a dialing test is performed on the communication components of the LoRa base station of the smart gateway to be tested, specifically as follows:

[0024] Read the communication module information of the gateway of the communication component and perform identification and matching processing;

[0025] When it is determined that the communication module information is consistent with the preset information, a test pass signal is generated;

[0026] When it is determined that the communication module information is inconsistent with the preset information or the communication module information is not read, a test abnormality signal is generated;

[0027] Read the status value of the SIM card of the communication component and determine whether the status value exists;

[0028] If not, generate a test error signal;

[0029] When the status value is determined to exist, a ping to an external network is performed;

[0030] When the external network is successfully pinged, a test pass signal is generated;

[0031] A test error signal is generated when the external network fails to ping.

[0032] Preferably, the current value of each interface of the ADC module of the LoRa base station to be tested is collected and compared, specifically as follows:

[0033] Collect the current value of each interface of the ADC module of the LoRa base station to be tested;

[0034] Each current value is compared with a preset qualified threshold, and it is determined whether each current value reaches the preset qualified threshold.

[0035] If so, generate a test pass signal;

[0036] If not, generate a test anomaly signal and identify the unqualified ADC module interface and its corresponding current value.

[0037] Preferably, the frequency band value of the radio frequency module of the LoRa base station to be tested is read, and the frequency band value is compared with a preset qualified value, specifically as follows:

[0038] The values ​​of the first, second, and third interfaces of the radio frequency module are read and combined, and it is determined whether the combined value is a value in the preset qualified set, wherein the preset qualified set includes the 433 band, the 470 band, the 868 band, and the 915 band.

[0039] If so, generate a test pass signal;

[0040] If not, generate a test anomaly signal and read the specific frequency band of the current radio frequency module.

[0041] Preferably, communication is established between the RF module and the LoRa module under test, and communication testing is performed on the LoRa module under test, specifically as follows:

[0042] Sending and receiving preset packet data to the LoRa module under test, and reading the received signal value and transmitted signal value of each packet data;

[0043] The received signal value and transmitted signal value of each data packet are compared with a preset area value in turn to determine whether the received signal value and transmitted signal value are within the preset area value, and the number of received signal values ​​and transmitted signal values ​​within the preset area value is counted.

[0044] When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset area exceeds a preset judgment value, a test pass signal is generated.

[0045] When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset range does not exceed a preset judgment value, a test anomaly signal is generated, and the communication test is repeated.

[0046] This invention also discloses an automated factory testing device for intelligent gateway LoRa base stations, comprising:

[0047] The RS485 serial port detection unit is used to perform data transmission and reception processing on the RS485 serial port of the smart gateway LoRa base station under test, so as to verify the accuracy of the transmission and reception information of the smart gateway LoRa base station under test.

[0048] The EMMC module detection unit is used to read and write the EMMC module of the LoRa base station to be tested and to verify it.

[0049] The communication gateway detection unit is used to perform dial-up tests on the communication components of the LoRa base station to be tested, so as to verify the network status of the LoRa base station to be tested.

[0050] The ADC module detection unit is used to collect the current value of each interface of the ADC module of the LoRa base station to be tested, and perform comparison processing.

[0051] The radio frequency module detection unit is used to read the frequency band value of the radio frequency module of the LoRa base station to be tested, and compare the frequency band value with a preset qualified set.

[0052] The LoRa module detection unit is used to establish communication between the radio frequency module and the LoRa module under test, and to perform communication testing on the LoRa module under test.

[0053] The abnormal alarm unit is used to output an alarm signal when it is determined that a test abnormal signal has been generated.

[0054] The present invention also discloses an automated factory testing device for a smart gateway LoRa base station, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements the automated factory testing method for a smart gateway LoRa base station as described above.

[0055] The present invention also discloses a readable storage medium storing a computer program, which can be executed by the processor of the device where the storage medium is located to implement the automated factory testing method for smart gateway LoRa base stations as described in any of the above claims.

[0056] In summary, the automated factory testing method, apparatus, equipment, and medium for smart gateway LoRa base stations provided in this embodiment utilize simple tooling to directly connect to attenuators to test LoRa signal values, replacing a spectrum analyzer. Three GPIO pins on the RF board are provided to assign values ​​for frequency band identification. Only one software firmware is required to be compatible with multi-band devices. Preset value inputs and test threshold settings are used for judgment and automated testing, simplifying the testing process, shortening testing time, reducing development and software version maintenance costs, minimizing the impact of human operation, and making test results more reliable and accurate. This addresses the problem that existing automated factory testing solutions for industrial smart gateway LoRa base stations rely too heavily on third-party testing equipment, leading to excessive human intervention. Such equipment is not only expensive, increasing testing costs, but also complex to operate and prone to human error. Furthermore, it occupies space, incurs high maintenance costs, and the distance and antenna of LoRa RF testing significantly impact human operation. The software version needs to be generated according to different frequency bands, resulting in high maintenance costs, potential programming errors leading to communication failures, and other uncontrollable factors, further compromising test accuracy. The lack of statistical analysis of test items also hinders the factory testing of the entire industrial smart gateway LoRa base station. Attached Figure Description

[0057] Figure 1 This is a flowchart illustrating the automated factory testing method for a smart gateway LoRa base station provided in an embodiment of the present invention.

[0058] Figure 2 This is a schematic diagram of the LoRa base station topology of the industrial intelligent gateway provided in an embodiment of the present invention.

[0059] Figure 3This is a schematic diagram of the 485 serial port fixture for the LoRa base station of the industrial intelligent gateway provided in this embodiment of the invention.

[0060] Figure 4 This is a schematic diagram of the ADC structure of the LoRa base station for the industrial intelligent gateway provided in an embodiment of the present invention.

[0061] Figure 5 This is a schematic diagram of the radio frequency board structure of the LoRa base station for the industrial intelligent gateway provided in this embodiment of the invention.

[0062] Figure 6 This is a schematic diagram of the industrial intelligent gateway LoRa base station and the LoRa module to be tested provided in an embodiment of the present invention.

[0063] Figure 7 This is a schematic diagram of the structure of the intelligent gateway LoRa base station automated factory testing device provided in an embodiment of the present invention. Detailed Implementation

[0064] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention. Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to represent selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0065] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0066] This invention discloses an automated factory testing method, apparatus, equipment, and medium for intelligent gateway LoRa base stations, which at least partially addresses the shortcomings of existing technologies.

[0067] Please see Figures 1 to 2 The first embodiment of the present invention provides an automated factory testing method for a smart gateway LoRa base station, which can be executed by an automated factory testing device for a smart gateway LoRa base station (hereinafter referred to as the factory testing device), specifically, by one or more processors within the factory testing device, to achieve the following steps:

[0068] S101, perform self-transmission and self-reception data processing on the RS485 serial port of the smart gateway LoRa base station to be tested, so as to verify the accuracy of the transmission and reception information of the smart gateway LoRa base station to be tested.

[0069] In this embodiment, the factory testing equipment can be a user terminal device (such as a smartphone, smart computer, or other smart device), which can establish a communication connection with the cloud gateway to achieve data interaction.

[0070] Currently available automated factory testing solutions for industrial smart gateway LoRa base stations rely too heavily on third-party testing equipment, increasing human intervention. This equipment is not only expensive, increasing testing costs, but also complex to operate and prone to human error. Furthermore, it occupies space, has high maintenance costs, and the distance and antenna of LoRa RF testing significantly affect human operation. Software versions need to be generated according to different frequency bands, leading to high maintenance costs, potential programming errors causing communication failures, and other uncontrollable factors, resulting in inaccurate test results. The failure to statistically analyze test items also negatively impacts the factory testing of the entire industrial smart gateway LoRa base station.

[0071] Specifically, step S101 includes: sending preset fixed-length data to all RS485 serial ports of the LoRa smart gateway base station to be detected;

[0072] Receive data from all RS485 serial ports of the LoRa smart gateway base station to be tested;

[0073] When it is determined that the received data is consistent with the fixed-length data, a test pass signal is generated;

[0074] When it is determined that the received data is inconsistent with the fixed-length data, a test anomaly signal is generated.

[0075] Specifically, in this embodiment, the entire interface of the industrial smart gateway LoRa base station under test, such as... Figure 2 As shown; this industrial intelligent gateway LoRa base station can execute test cases via its RS232 serial port debugging port, network port, and local storage. The accuracy of transmitted and received information is verified through the self-transmission and reception of the industrial intelligent gateway LoRa base station's RS485 serial port. Since RS485 is a half-duplex bus, when simultaneously transmitting and receiving data on all serial ports, the A and B ports of RS485-1, 485-2, 485-3, and 485-4 need to be connected in pairs to create a fixture as shown. Figure 3As shown; first, data of a fixed length set by the test case is sent to all serial ports through the test case; second, data is received by all serial ports through the test case; finally, the received data is compared with the sent data to verify whether they are consistent. If they are consistent, the 485 serial port test is deemed to have passed; otherwise, the communication of the specific 485 serial port number is deemed to be abnormal.

[0076] S102, perform read / write processing on the EMMC module of the LoRa base station to be tested, and verify it;

[0077] Specifically, step S102 includes: when it is determined that the EMMC module of the LoRa base station to be detected is successfully mounted, a pre-written fixed file is created and MD5 verification is performed;

[0078] The fixed file is copied into the EMMC module, and it is determined whether the fixed file in the EMMC module is consistent with the fixed file.

[0079] If so, generate a test pass signal;

[0080] If not, generate a test abnormality signal.

[0081] Specifically, in this embodiment, the EMMC of the LoRa base station of the industrial smart gateway is read, written, and verified. First, it is checked whether the EMMC is successfully mounted. If the mounting is successful, its storage capacity is read; otherwise, the mounting is considered to have failed. Second, a fixed file with the content written is created and its MD5 check is performed. Finally, after the mounting is determined to be successful, this file is copied to the EMMC path through test cases to check whether the file is written to the EMMC. If the writing is successful, the MD5 value of this file is read and verified with the original file. If they match, the result is determined to be that the EMMC file read / write is successful; otherwise, the EMMC file read / write is considered to have failed.

[0082] S103, Perform a dialing test on the communication components of the LoRa base station to be tested to verify the network status of the LoRa base station to be tested.

[0083] Specifically, step S103 includes: reading the communication module information of the gateway of the communication component and performing identification and matching processing;

[0084] When it is determined that the communication module information is consistent with the preset information, a test pass signal is generated;

[0085] When it is determined that the communication module information is inconsistent with the preset information or the communication module information is not read, a test abnormality signal is generated;

[0086] Read the status value of the SIM card of the communication component and determine whether the status value exists;

[0087] If not, generate a test error signal;

[0088] When the status value is determined to exist, a ping to an external network is performed;

[0089] When the external network is successfully pinged, a test pass signal is generated;

[0090] A test error signal is generated when the external network fails to ping.

[0091] Specifically, in this embodiment, the communication module and SIM card of the LoRa base station of the industrial smart gateway are identified through dial-up testing, and the network ping is checked for normal operation. First, the communication module information of the gateway is read through test cases to determine whether the communication module is identified and matched, and whether the read communication module information is consistent with the information set in the test cases: if they are consistent, the communication module is identified successfully; if they are inconsistent, the communication module is considered to be faulty and the currently used communication module information is output; if the information cannot be read, the communication module identification is considered to have failed. Second, the status value of the SIM card is read through test cases to determine whether the SIM card is identified successfully. If the status of the SIM card is found to be present, the SIM card is identified successfully; otherwise, the SIM card identification is considered to have failed. Finally, if the SIM card is identified successfully, an external network is pinged. If the ping is successful, the dial-up is considered to have succeeded; otherwise, the dial-up is considered to have failed.

[0092] S104, Collect the current value of each interface of the ADC module of the LoRa base station to be tested, and perform comparison processing;

[0093] Specifically, step S104 includes: collecting the current value of each interface of the ADC module of the LoRa base station to be tested;

[0094] Each current value is compared with a preset qualified threshold, and it is determined whether each current value reaches the preset qualified threshold.

[0095] If so, generate a test pass signal;

[0096] If not, generate a test anomaly signal and identify the unqualified ADC module interface and its corresponding current value.

[0097] Specifically, in this embodiment, each of the four terminals of the ADC interface of the industrial smart gateway LoRa base station is connected to a resistor via the positive terminal of the power supply and is then tooled, such as... Figure 4As shown; a 12V DC power supply is connected in parallel with four fixed resistors (depending on the current value set in the test case). The current value of each resistor is compared with the current value collected by the MCU to determine whether it is successful. If the current value collected by the MCU is within the threshold set in the test case, it is considered to pass; otherwise, the specific ADC interface and its current value are identified as failing.

[0098] S105, Read the frequency band value of the radio frequency module of the smart gateway lora base station to be tested, and compare the frequency band value with a preset qualified set;

[0099] Specifically, step S105 includes: reading the values ​​of the first interface, the second interface and the third interface of the radio frequency module, combining them, and determining whether the combined value is a value in the preset qualified set, wherein the preset qualified set includes the 433 frequency band, the 470 frequency band, the 868 frequency band and the 915 frequency band;

[0100] If so, generate a test pass signal;

[0101] If not, generate a test anomaly signal and read the specific frequency band of the current radio frequency module.

[0102] Please see Figure 5 Specifically, in this embodiment, frequency band identification is achieved by bringing out three GPIO pins from the RF board of the LoRa base station of the industrial smart gateway and setting them to a high-impedance state (0) by default, and then pulling their state value down to 1 using a resistor. First, Figure 5 GPIO_1 is used for hardware identification of frequency bands on the RF board. When its status value is 1, it indicates the current frequency band, providing a clear view of the RF board's frequency band. Figure 5 The image shows the 868 frequency band; secondly, Figure 5 GPIO_2 in the code is used to distinguish between high and low frequencies. Low frequencies are set to 0, and high frequencies to 1, for example... Figure 5 The values ​​shown are 915 and 868 at higher frequencies; again, Figure 5 GPIO_3 is used to set the respective frequency band for high and low frequencies. When GPIO_2 is 0 and GPIO_3 is 1, the radio frequency is determined to be in the 433 MHz band; when GPIO_2 is 0 and GPIO_3 is 0, the radio frequency is determined to be in the 470 MHz band; when GPIO_2 is 1 and GPIO_3 is 0, the radio frequency is determined to be in the 915 MHz band; when GPIO_2 is 1 and GPIO_3 is 1, the radio frequency is determined to be in the 868 MHz band. Figure 5 The result shows the 868 frequency band. Finally, the combined values ​​of GPIO_2 and GPIO_3 are read through the test case and compared with the test case settings to determine whether it is the 433, 470, 868 or 915 frequency band. If they match, the test case passes; otherwise, it fails and the specific frequency band corresponding to the current determination value is read.

[0103] S106, establish communication between the RF module and the LoRa module under test, and perform communication test on the LoRa module under test;

[0104] Specifically, step S106 includes: sending and receiving preset packet data to the LoRa module to be tested, and reading the received signal value and the transmitted signal value of each packet data;

[0105] The received signal value and transmitted signal value of each data packet are compared with a preset area value in turn to determine whether the received signal value and transmitted signal value are within the preset area value, and the number of received signal values ​​and transmitted signal values ​​within the preset area value is counted.

[0106] When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset area exceeds a preset judgment value, a test pass signal is generated.

[0107] When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset range does not exceed a preset judgment value, a test anomaly signal is generated, and the communication test is repeated.

[0108] Specifically, in this embodiment, the LoRa signal value test of the industrial smart gateway LoRa base station is performed by attenuating the signal by 60dB using an attenuator to filter out other signal interference, connecting the base station and the module tooling for communication. Figure 6 As shown. First, configure the LoRa module to be tested to communicate normally with the RF board of the smart gateway LoRa base station and assemble it into a fixture. One fixture is provided for each frequency band for testing. Second, connect the two ends of the attenuator to the antenna connector of the smart gateway LoRa base station and the antenna connector of the LoRa module to be tested in the corresponding frequency band, respectively. The attenuation amount is determined according to the actual situation. Third, transmit and receive 15 data packets using the test case. Read the transmitted and received signal values ​​of each packet and compare them with the threshold set in the test case to determine whether they are within the threshold range set in the test case. Then, count the 15 packets. If more than 7 packets are within the threshold range set in the test case, the test is considered passed; otherwise, it is considered failed. Finally, if it is considered failed, continue the test in the same way. The number of tests is set to 3.

[0109] S106: When a test abnormality signal is detected, an alarm signal is output.

[0110] In summary, existing technologies primarily rely on spectrum analyzers to directly detect specific frequency offsets and transmit power to determine pass / fail status. The proposed automated factory testing method for smart gateway LoRa base stations utilizes a hardware interface with tooling fixtures for fixed-value input and comparison with predetermined values ​​to determine pass / fail status. The smart gateway LoRa base station and module are directly connected via an attenuator, and signal values ​​are compared with predetermined values ​​during transmission and reception to determine pass / fail status. Simply put, compared to existing technologies, the proposed automated factory testing method for smart gateway LoRa base stations achieves automated factory testing and statistical analysis of test results. It uses simple tooling fixtures to directly connect to the attenuator to test LoRa signal values, replacing a spectrum analyzer. Three GPIO pins on the RF board are used to assign values ​​for frequency band identification, and only one software firmware is needed to be compatible with multi-band devices. By inputting predetermined values ​​and setting test thresholds for judgment and automating the test, the testing process is simplified, testing time is shortened, development and software version maintenance costs are reduced, and the impact of human operation is minimized, resulting in more reliable and accurate test results. The automated factory testing method for the intelligent gateway LoRa base station makes factory testing simpler and more convenient, reduces factory testing costs, improves factory testing efficiency and the traceability and controllability of test results, and realizes automated factory testing through statistical analysis of results.

[0111] Please see Figure 7 The second embodiment of the present invention provides an automated factory testing device for a smart gateway LoRa base station, comprising:

[0112] The RS485 serial port detection unit 201 is used to perform data transmission and reception processing on the RS485 serial port of the smart gateway LoRa base station under test, so as to verify the accuracy of the transmission and reception information of the smart gateway LoRa base station under test.

[0113] The EMMC module detection unit 202 is used to read and write the EMMC module of the LoRa base station to be tested and to verify it.

[0114] The communication gateway detection unit 203 is used to perform dialing tests on the communication components of the smart gateway lora base station to be tested, so as to verify the network status of the smart gateway lora base station to be tested.

[0115] The ADC module detection unit 204 is used to collect the current value of each interface of the ADC module of the LoRa base station to be tested, and perform comparison processing.

[0116] The radio frequency module detection unit 205 is used to read the frequency band value of the radio frequency module of the smart gateway LoRa base station to be tested, and compare the frequency band value with a preset qualified set.

[0117] Lora module detection unit 206 is used to establish communication between the radio frequency module and the Lora module under test, and to perform communication testing on the Lora module under test.

[0118] The abnormal alarm unit 207 is used to output an alarm signal when it is determined that a test abnormal signal has been generated.

[0119] A third embodiment of the present invention provides an automated factory testing device for a smart gateway LoRa base station, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor. When the processor executes the computer program, it implements the automated factory testing method for a smart gateway LoRa base station as described above.

[0120] The fourth embodiment of the present invention provides a readable storage medium storing a computer program that can be executed by the processor of the device where the storage medium is located, so as to implement the automated factory testing method for smart gateway LoRa base stations as described in any of the above embodiments.

[0121] Exemplary examples show that the computer program described in the third and fourth embodiments of the present invention can be divided into one or more modules, which are stored in the memory and executed by the processor to complete the present invention. The one or more modules can be a series of computer program instruction segments capable of performing specific functions, which describe the execution process of the computer program in the automated factory testing equipment for implementing smart gateway LoRa base stations. For example, the apparatus described in the second embodiment of the present invention.

[0122] The processor referred to can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor. This processor is the control center of the automated factory testing method for the smart gateway LoRa base station, connecting various parts of the method via various interfaces and lines.

[0123] The memory can be used to store the computer programs and / or modules. The processor, by running or executing the computer programs and / or modules stored in the memory and calling the data stored in the memory, realizes various functions of the intelligent gateway LoRa base station automated factory testing method. The memory may mainly include a program storage area and a data storage area. The program storage area may store the operating system, at least one application program required for a function (such as sound playback function, text conversion function, etc.), etc.; the data storage area may store data created according to the use of the mobile phone (such as audio data, text message data, etc.). In addition, the memory may include high-speed random access memory, and may also include non-volatile memory, such as hard disk, memory, plug-in hard disk, smart media card (SMC), secure digital card (SD) card, flash card, at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0124] If the implemented module is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the above embodiments of the present invention can also be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording media, USB flash drives, portable hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signals, telecommunication signals, and software distribution media, etc. It should be noted that the content included in the computer-readable medium can be appropriately added or removed according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electrical carrier signals and telecommunication signals.

[0125] It should be noted that the device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Furthermore, in the accompanying drawings of the device embodiments provided by this invention, the connection relationships between modules indicate that they have communication connections, which can be specifically implemented as one or more communication buses or signal lines. Those skilled in the art can understand and implement this without any creative effort.

[0126] The above are merely preferred embodiments of the present invention. The scope of protection of the present invention is not limited to the above embodiments. All technical solutions that fall within the scope of the present invention are within the scope of protection of the present invention.

Claims

1. An automated factory testing method for intelligent gateway LoRa base stations, characterized in that, include: Data transmission and reception are performed on the RS485 serial port of the LoRa smart gateway base station to be tested in order to verify the accuracy of the transmission and reception information of the LoRa smart gateway base station to be tested. The EMMC module of the LoRa smart gateway base station to be tested is read and written, and then verified. A dial-up test is performed on the communication components of the LoRa base station to be tested in order to verify the network status of the LoRa base station to be tested. The current value of each interface of the ADC module of the LoRa base station to be tested is collected and compared. Read the frequency band value of the radio frequency module of the LoRa base station to be tested, and compare the frequency band value with a preset qualified set; Establish communication between the radio frequency module and the LoRa module under test, and perform communication testing on the LoRa module under test; When a test anomaly signal is detected, an alarm signal is output. In this method, a simple tooling fixture is used to directly connect the attenuator to test the LoRa signal value instead of a spectrum analyzer. The two ends of the attenuator are connected to the antenna connector of the smart gateway LoRa base station and the antenna connector of the LoRa module to be tested for communication in the corresponding frequency band, respectively. The intelligent gateway LoRa base station and module are directly connected through an attenuator and send and receive information, using signal values ​​and predetermined values ​​to determine whether to pass.

2. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, The RS485 serial port of the LoRa smart gateway to be tested performs self-transmission and self-reception data processing, specifically as follows: Send a preset fixed-length data to all RS485 serial ports of the LoRa smart gateway base station to be tested; Receive data from all RS485 serial ports of the LoRa smart gateway base station to be tested; When it is determined that the received data is consistent with the fixed-length data, a test pass signal is generated; When it is determined that the received data is inconsistent with the fixed-length data, a test anomaly signal is generated.

3. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, The EMMC module of the LoRa base station to be tested is read and written, and then verified, specifically as follows: When it is determined that the EMMC module of the LoRa base station to be tested is successfully mounted, a pre-written fixed file is created and MD5 verification is performed. The fixed file is copied into the EMMC module, and it is determined whether the fixed file in the EMMC module is consistent with the fixed file. If so, generate a test pass signal; If not, generate a test abnormality signal.

4. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, The communication components of the LoRa base station of the smart gateway to be tested are subjected to a dial-up test, specifically as follows: Read the communication module information of the gateway of the communication component and perform identification and matching processing; When it is determined that the information of the communication module is consistent with the preset information, a test pass signal is generated; When it is determined that the communication module information is inconsistent with the preset information or the communication module information is not read, a test abnormality signal is generated; Read the status value of the SIM card of the communication component and determine whether the status value exists; If not, generate a test error signal; When the status value is determined to exist, a ping to an external network is performed; When the external network is successfully pinged, a test pass signal is generated; A test error signal is generated when the external network fails to ping.

5. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, The current value of each interface of the ADC module of the LoRa base station to be tested is collected and compared, specifically as follows: Collect the current value of each interface of the ADC module of the LoRa base station to be tested; Each current value is compared with a preset qualified threshold, and it is determined whether each current value reaches the preset qualified threshold. If so, generate a test pass signal; If not, generate a test anomaly signal and identify the unqualified ADC module interface and its corresponding current value.

6. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, The frequency band value of the radio frequency module of the LoRa base station to be tested is read, and the frequency band value is compared with a preset qualified value. Specifically: The values ​​of the first, second, and third interfaces of the radio frequency module are read and combined, and it is determined whether the combined value is a value in the preset qualified set, wherein the preset qualified set includes the 433 band, the 470 band, the 868 band, and the 915 band. If so, generate a test pass signal; If not, generate a test anomaly signal and read the specific frequency band of the current radio frequency module.

7. The automated factory testing method for intelligent gateway LoRa base stations according to claim 1, characterized in that, Establish communication between the RF module and the LoRa module under test, and perform communication testing on the LoRa module under test, specifically as follows: Sending and receiving preset packet data to the LoRa module under test, and reading the received signal value and transmitted signal value of each packet data; The received signal value and transmitted signal value of each data packet are compared with a preset area value in turn to determine whether the received signal value and transmitted signal value are within the preset area value, and the number of received signal values ​​and transmitted signal values ​​within the preset area value is counted. When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset area exceeds a preset judgment value, a test pass signal is generated. When it is determined that the number of received signal values ​​and transmitted signal values ​​within the preset range does not exceed a preset judgment value, a test anomaly signal is generated, and the communication test is repeated.

8. An automated factory testing device for intelligent gateway LoRa base stations, characterized in that, include: The RS485 serial port detection unit is used to perform data transmission and reception processing on the RS485 serial port of the smart gateway LoRa base station under test, so as to verify the accuracy of the transmission and reception information of the smart gateway LoRa base station under test. The EMMC module detection unit is used to read and write the EMMC module of the LoRa base station to be tested and to verify it. The communication gateway detection unit is used to perform dial-up tests on the communication components of the LoRa base station to be tested, so as to verify the network status of the LoRa base station to be tested. The ADC module detection unit is used to collect the current value of each interface of the ADC module of the LoRa base station to be tested, and perform comparison processing. The radio frequency module detection unit is used to read the frequency band value of the radio frequency module of the LoRa base station to be tested, and compare the frequency band value with a preset qualified set. The LoRa module detection unit is used to establish communication between the radio frequency module and the LoRa module under test, and to perform communication testing on the LoRa module under test. An abnormal alarm unit is used to output an alarm signal when it is determined that a test abnormality signal has been generated; In this method, a simple tooling fixture is used to directly connect the attenuator to test the LoRa signal value instead of a spectrum analyzer. The two ends of the attenuator are connected to the antenna connector of the smart gateway LoRa base station and the antenna connector of the LoRa module to be tested for communication in the corresponding frequency band, respectively. The intelligent gateway LoRa base station and module are directly connected through an attenuator and send and receive information, using signal values ​​and predetermined values ​​to determine whether to pass.

9. Automated factory testing equipment for intelligent gateway LoRa base stations, characterized in that: The method includes a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor executes the computer program to implement the automated factory testing method for a smart gateway LoRa base station as described in any one of claims 1 to 7.

10. A readable storage medium, characterized in that, The device contains a computer program that can be executed by the processor of the device where the storage medium is located, to implement the automated factory testing method for smart gateway LoRa base stations as described in any one of claims 1 to 7.

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