An in-situ testing system

Abstract

This application provides an in-situ testing system, comprising: a light source including a Raman laser emitter, a heated laser emitter, and an X-ray emitter; an emission optical path for directing a first Raman test beam and a first heated test beam to a first position on the front side of the sample, and directing a second Raman test beam and a second heated test beam to a second position on the back side of the sample; the sample being located within a diamond anvil cell; a receiving optical path for directing a first Raman reflected beam, a first heated reflected beam, a second Raman reflected beam, and a second heated reflected beam to a spectrometer; a spectrometer for determining the pressure and temperature parameters of the front and back sides of the sample; and a detection device for receiving diffraction signals and determining the lattice parameters of the sample based on the diffraction signals. This in-situ testing system integrates Raman testing, heated laser testing, and X-ray testing into one unit, enabling the acquisition of pressure, temperature, and lattice parameters on both sides of the same sample location.

Description

Technical Field

[0001] This application belongs to the field of spectral testing, and in particular relates to an in-situ testing system. Background Technology

[0002] The synthesis, structure, and property analysis of samples under extreme temperature and pressure environments are important research areas in earth sciences, materials science, and condensed matter physics. For example, probing the pressure, temperature, and lattice parameters of samples under extreme temperature and pressure environments is of significant scientific value for understanding the stability of minerals deep within the Earth, the equation of state of materials, and the melting curves of substances. Existing detection methods generally involve separately probing the pressure, temperature, and lattice parameters of the sample.

[0003] However, the parameters of diamond anvil cell samples vary significantly with position under extreme temperature and pressure environments. For example, under ultra-high pressure (greater than 100 GPa), samples within a diamond anvil cell exhibit a pressure gradient of 2 GPa / μm. For micron-sized samples under ultra-high pressure conditions, the temperature gradient can reach 100 K / μm. Under these significant temperature and pressure gradients, the lattice parameters at different locations within the sample also differ considerably. If the pressure, temperature, and lattice parameters of the sample are measured separately, it is impossible to guarantee that the parameters at the same sample point will be obtained simultaneously, thus affecting the accuracy of the measurements. Summary of the Invention

[0004] In view of this, embodiments of this application provide an in-situ testing system that can simultaneously obtain pressure parameters, temperature parameters, and lattice parameters of the same sample point.

[0005] A first aspect of this application provides an in-situ testing system, comprising:

[0006] The light source includes a Raman laser emitter, a heated laser emitter, and an X-ray emitter, wherein the Raman laser emitter is used to emit Raman laser light, the heated laser emitter is used to emit heated laser light, and the X-ray emitter is used to emit X-ray light.

[0007] The emission optical path is used to split the Raman laser into a first Raman test beam and a second Raman test beam, split the heating laser into a first heating test beam and a second heating test beam, and direct the first Raman test beam and the first heating test beam toward a first position on the front side of the sample, and direct the second Raman test beam and the second heating test beam toward a second position on the back side of the sample; the sample is located in a diamond anvil cell; the first Raman test beam and the first heating test beam are reflected at the first position to obtain a first Raman reflected beam and a first heating reflected beam, respectively, and the second Raman test beam and the second heating test beam are reflected at the second position to obtain a second Raman reflected beam and a second heating reflected beam, respectively;

[0008] The receiving optical path is used to direct the first Raman reflected beam, the first heated reflected beam, the second Raman reflected beam, and the second heated reflected beam toward the spectrometer;

[0009] A spectrometer for determining pressure parameters of the front and back sides of the sample based on the first Raman reflected beam and the second Raman reflected beam, and for determining temperature parameters of the front and back sides of the sample based on the first heating reflected beam and the second heating reflected beam;

[0010] A detection device is used to receive the diffraction signal obtained after the X-rays diffract at the first position, and to determine the lattice parameters of the sample based on the diffraction signal.

[0011] In one embodiment, the emission optical path includes a beam splitter, a first adjustment optical path, a second adjustment optical path, a first focusing optical path, and a second focusing optical path. The beam splitter is used to split the Raman laser into a first Raman test beam and a second Raman test beam, and to split the heated laser into a first heated test beam and a second heated test beam. The first Raman test beam and the first heated test beam pass through the first adjustment optical path and the first focusing optical path sequentially and are directed toward the first position. The second Raman test beam and the second heated test beam pass through the second adjustment optical path and the second focusing optical path sequentially and are directed toward the second position.

[0012] In one embodiment, the light source further includes a white light emitter, and the in-situ testing system further includes an image acquisition device. The white light emitter is used to emit a first white light test beam and a second white light test beam. The first white light test beam is reflected at the first position to obtain a first white light reflected beam, and the second white light test beam is reflected at the second position to obtain a second white light reflected beam. The receiving optical path is used to direct the first white light reflected beam and the second white light reflected beam toward the image acquisition device, and the image acquisition device is used to acquire an image of the sample.

[0013] In one embodiment, the in-situ testing system further includes a mirror assembly with two holes. The first Raman reflected beam and the first heated reflected beam emitted from the receiving light path enter the spectrometer through one of the holes, while the second Raman reflected beam and the second heated reflected beam emitted from the receiving light path enter the spectrometer through the other hole. The first white light reflected beam and the second white light reflected beam emitted from the receiving light path are reflected by the mirror assembly and then enter the image acquisition device.

[0014] In one embodiment, the white light emitter includes a first emitter and a second emitter, the first emitter being used to emit a first white light test beam, and the second emitter being used to emit a second white light test beam; the first white light test beam is directed toward the first position after passing through the first focusing optical path, and the second white light test beam is directed toward the second position after passing through the second focusing optical path.

[0015] In one embodiment, the first adjustment optical path includes a first attenuator, and the second adjustment optical path includes a second attenuator.

[0016] In one embodiment, the first focusing optical path includes a first focusing mirror and a first amorphous carbon reflector, and the second focusing optical path includes a second focusing mirror and a second amorphous carbon reflector; the X-rays are directed to the first position after passing through the first amorphous carbon reflector, and the diffraction signal enters the detection device after passing through the second amorphous carbon reflector; the X-rays reflected from the first position enter the receiving optical path after passing through the first amorphous carbon reflector and the first focusing mirror; the diffraction signal is also used to enter the receiving optical path after passing through the second amorphous carbon reflector and the second focusing mirror.

[0017] In one embodiment, the receiving optical path includes a first reflecting optical path and a second reflecting optical path. The first reflecting optical path is used to direct the first Raman reflected beam and the first heating reflected beam toward the spectrometer, and the second reflecting optical path is used to direct the second Raman reflected beam and the second heating reflected beam toward the spectrometer.

[0018] In one embodiment, the first reflected optical path includes a first confocal component, and the second reflected optical path includes a second confocal component.

[0019] In one embodiment, the first reflected optical path further includes a first filter, and the second reflected optical path further includes a second filter.

[0020] The beneficial effects of this application embodiment compared with the prior art are as follows: the first Raman test beam and the first heating test beam are directed to a first position on the front of the sample through the emission optical path, the second Raman test beam and the second heating test beam are directed to a second position on the back of the sample, and X-rays are directed to the first position of the sample. Then, the first Raman reflection beam, the first heating reflection beam, the second Raman reflection beam and the second heating reflection beam are directed to the spectrometer through the receiving optical path, and the diffraction signal of the sample is received by the detection device. Thus, the Raman test optical path, the heating laser test optical path and the X-ray test optical path can be integrated into one, and the pressure, temperature and lattice parameters of the same sample position can be obtained. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0022] Figure 1 This is a schematic diagram of an in-situ testing system provided in an embodiment of this application;

[0023] Figure 2 This is an optical path diagram of the in-situ testing system provided in the embodiments of this application. Detailed Implementation

[0024] In the following description, specific details such as particular system architectures and techniques are set forth for illustrative purposes and not for limitation, in order to provide a thorough understanding of the embodiments of this application. However, those skilled in the art will understand that this application may also be implemented in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, apparatuses, circuits, and methods have been omitted so as not to obscure the description of this application with unnecessary detail.

[0025] It should be understood that, when used in this specification and the appended claims, the term "comprising" indicates the presence of the described features, integrals, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0026] It should also be further understood that the term “and / or” as used in this application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0027] Furthermore, in the description of this application, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0028] In extreme temperature and pressure environments, the parameters of a sample change significantly with position. To obtain the parameters of a sample at the same location, this application provides an in-situ testing system. A first Raman test beam and a first heating test beam are directed towards a first position on the front side of the sample via an emission optical path, while a second Raman test beam and a second heating test beam are directed towards a second position on the back side of the sample. The temperature and pressure parameters of the sample are determined based on the reflected beams. X-ray diffraction is generated at the first position, and the lattice parameters of the sample are determined based on the diffraction signal. Therefore, the temperature, pressure, and lattice parameters of the same sample point can be obtained.

[0029] The in-situ testing system provided in the embodiments of this application will be described by way of example below.

[0030] like Figure 1 and Figure 2 As shown, the in-situ testing system provided in this application embodiment includes a light source 10, an emitting optical path 20, a receiving optical path 30, a spectrometer 40, and a detection device 50.

[0031] The light source 10 includes a Raman laser emitter 11, a heated laser emitter 12, and an X-ray emitter 13. The Raman laser emitter 11 emits Raman laser light, the heated laser emitter 12 emits heated laser light, and the X-ray emitter 13 emits X-rays. The Raman laser emitted by the Raman laser emitter 11 can have a wavelength of 532 nm, and the heated laser emitted by the heated laser emitter 12 can have a wavelength of 1064 nm. The X-rays can be micro-beam (less than 2 micrometers) X-rays.

[0032] The emission optical path 20 is used to split the Raman laser into a first Raman test beam and a second Raman test beam, split the heating laser into a first heating test beam and a second heating test beam, and direct the first Raman test beam and the first heating test beam toward a first position on the front side of the sample, and direct the second Raman test beam and the second heating test beam toward a second position on the back side of the sample. After reflection at the first position, the first Raman test beam and the first heating test beam become a first Raman reflected beam and a first heating reflected beam, respectively; after reflection at the second position, the second Raman test beam and the second heating test beam become a second Raman reflected beam and a second heating reflected beam, respectively. The sample is located within a diamond anvil cell, in an environment with a pressure greater than 100 GPa, a temperature greater than 1000 K, a pressure gradient greater than 1 GPa / μm, and a temperature gradient of 100 K / μm. The sample can move in any direction within the diamond anvil cell, and its position within the diamond anvil cell can be adjusted by regulating the XYZ three-dimensional adjustment device on the diamond anvil.

[0033] The receiving optical path 30 is used to direct the first Raman reflected beam, the first heated reflected beam, the second Raman reflected beam, and the second heated reflected beam toward the spectrometer 40.

[0034] The spectrometer 40 is used to determine the pressure parameters of the front and back sides of the sample based on the first Raman reflected beam and the second Raman reflected beam, and to determine the temperature parameters of the front and back sides of the sample based on the first heating reflected beam and the second heating reflected beam.

[0035] The detection device 50 is used to receive the diffraction signal obtained after X-rays diffract at the first position, and to determine the lattice parameters of the sample based on the diffraction signal.

[0036] In the above embodiments, the first Raman test beam and the first heating test beam are directed towards a first position on the front of the sample via an emission optical path, the second Raman test beam and the second heating test beam are directed towards a second position on the back of the sample, and X-rays are directed towards the first position of the sample. The first Raman reflected beam, the first heating reflected beam, the second Raman reflected beam, and the second heating reflected beam are then received by a spectrometer, and the diffraction signal of the sample is detected by a detection device. Thus, the Raman test optical path, the heating laser test optical path, and the X-ray test optical path can be integrated into one, and the pressure, temperature, and lattice parameters at the same sample position can be obtained.

[0037] like Figure 2 As shown, in one embodiment, the emitting optical path 20 includes a beam splitter 21, a first adjustment optical path 22, a second adjustment optical path 23, a first focusing optical path 24, and a second focusing optical path 25. The beam splitter 21 is used to split the Raman laser into a first Raman test beam and a second Raman test beam, and to split the heated laser into a first heated test beam and a second heated test beam. The first Raman test beam and the first heated test beam sequentially pass through the first adjustment optical path 22 and the first focusing optical path 24 towards a first position. The second Raman test beam and the second heated test beam sequentially pass through the second adjustment optical path 23 and the second focusing optical path 25 towards a second position.

[0038] Since the Raman laser and the heating laser share the same beam splitter, the first Raman test beam and the first heating test beam share the first adjustment optical path and the first focusing optical path, and the second Raman test beam and the second heating test beam share the second adjustment optical path and the second focusing optical path, it can be ensured that the positions of the first Raman test beam and the first heating test beam on the sample coincide, and the positions of the second Raman test beam and the second heating test beam on the sample coincide, thus improving the test accuracy.

[0039] In one embodiment, the Raman laser emitted by the Raman laser emitter 11 passes sequentially through two total reflection mirrors M1 and then towards a semi-transparent mirror M2. After being transmitted through the semi-transparent mirror M2, it passes through another total reflection mirror M1, and is then reflected by the total reflection mirror M1 before reaching the beam splitter 21. The heated laser emitted by the heated laser emitter 12 is reflected by the total reflection mirror M1 and then towards the semi-transparent mirror M2. After being reflected by the semi-transparent mirror M2, it passes through the total reflection mirror M1, and is then reflected by the total reflection mirror M1 before reaching the beam splitter 21. The beam splitter 21 is a semi-transparent beam splitter prism BS1, which splits the beam into two beams. The semi-transparent beam splitter prism BS1 can be a hexahedral prism or composed of two trihedral prisms.

[0040] In one embodiment, the first adjustment optical path 22 includes a first attenuator WP. u The second adjustment optical path 23 includes a second attenuator WP. d This allows for the adjustment of the laser intensity of the first Raman test beam and the second Raman test beam directed at the sample, as well as the adjustment of the laser intensity of the first heating test beam and the second heating test beam directed at the sample, thereby reducing damage to the sample and spectrometer during the testing process and ensuring reasonable laser intensity requirements.

[0041] In one embodiment, the first adjustment optical path 22 further includes a beam splitter BS1. u And the total reflection mirror M1 u The second adjustment optical path 23 also includes a beam splitter BS1. d And the total reflection mirror M1 d The first Raman test beam or the first heated test beam passes sequentially through the first attenuator WP. u Beam splitter BS1 d And the total reflection mirror M1 u Then it enters the first focusing optical path 24. The second Raman test beam or the second heated test beam passes sequentially through the second attenuator WP. d Beam splitter BS1 d And the total reflection mirror M1 d Then it enters the second focusing optical path 25. Beam splitter BS1 u The test intensities of the first Raman test beam and the second Raman test beam, as well as the beam splitter BS1, can be further adjusted. d The intensity of the first and second heating test beams directed at the sample can be further adjusted.

[0042] In one embodiment, the first focusing optical path 24 includes a first focusing mirror L1. u And the first amorphous carbon material reflector M4 u The second focusing optical path 25 includes a second focusing mirror L1. d And the second amorphous carbon material reflector M4d The first Raman test beam or the first heated test beam emitted from the first adjusting optical path 22 passes through the first focusing lens L1. u The projectile then hits the first amorphous carbon reflector M4. u The first amorphous carbon material reflector M4 u After reflection, it is directed toward the first position. The second Raman test beam or the second heated test beam emitted from the second adjustment optical path 23 passes through the second focusing lens L1. d The second amorphous carbon reflector M4 was then fired. d The second amorphous carbon material reflector M4 d It is reflected and then directed to the second position.

[0043] X-rays pass through the first amorphous carbon reflector M4 u The light is then directed towards the first position, and the diffracted signal passes through the second amorphous carbon mirror M4. d The sample then enters the detection device 50, where it is imaged. The detection device 50 determines the lattice parameters at the first position of the sample based on the diffraction peaks of the diffraction signal, thereby obtaining the unit cell volume of the sample. The X-rays reflected from the first position pass through the first amorphous carbon reflector M4. u and the first focusing lens L1 u The light then enters the receiving optical path 30; the diffraction signal is also used to reflect the light through the second amorphous carbon mirror M4. d and the second focusing lens L1 d The X-rays then enter the receiving optical path 30. The X-rays and diffraction signals entering the receiving optical path can then enter the spectrometer 40, allowing for further analysis of the sample based on the X-rays emitted by the X-ray emitter and the X-rays reflected by the sample.

[0044] In one embodiment, the first focusing optical path 24 further includes a semi-transparent and semi-reflective mirror M3. u The second focusing optical path 25 also includes a semi-transparent and semi-reflective mirror M3. d The first Raman test beam or the first heating test beam emitted from the first adjustment optical path 22 is directed toward the semi-transparent and semi-reflective mirror M3. u The semi-transparent, semi-reflective M3 u After reflection, it is directed towards the first focusing lens L1 u The second Raman test beam or the second heating test beam emitted from the second adjustment optical path 23 is directed towards the semi-transparent and semi-reflective mirror M3. d The semi-transparent, semi-reflective M3 d After reflection, it is directed towards the first focusing lens L1 d .

[0045] In one embodiment, the receiving optical path 30 includes a first reflecting optical path 31 and a second reflecting optical path 32. The first reflecting optical path 31 is used to direct a first Raman reflected beam and a first heating reflected beam toward the spectrometer 40, and the second reflecting optical path 32 is used to direct a second Raman reflected beam and a second heating reflected beam toward the spectrometer 40, so that the spectrometer 40 receives the first Raman reflected beam and the first heating reflected beam reflected at a first position, and receives the second Raman reflected beam and the second heating reflected beam reflected at a second position, so as to analyze the front and back sides of the sample respectively.

[0046] In one embodiment, the first reflected optical path 31 includes a first confocal component, and the second reflected optical path 32 includes a second confocal component. For example, the first reflected optical path 31 includes a confocal system CS. u The second reflected optical path 32 includes a confocal system CS d Thus, it can be used through the confocal system CS u The first Raman reflected beam and the first heated reflected beam are filtered, and the light passes through the confocal system CS. d The second Raman reflected beam and the second heated reflected beam are filtered to reduce signal interference.

[0047] In one embodiment, the first reflected optical path 31 includes a first filter, and the second reflected optical path 32 includes a second filter. For example, the first reflected optical path 31 includes two filters nf, used to filter out the heating laser with a wavelength of 1064 nm and the Raman laser with a wavelength of 532 nm, respectively. The second reflected optical path includes two filters nf, used to filter out the heating laser with a wavelength of 1064 nm and the Raman laser with a wavelength of 532 nm, respectively.

[0048] In one embodiment, the first reflected light path 31 further includes a beam splitter BS2. u Two total reflection mirrors M1 u Focusing lens L2 u And beam splitter BS3. The first Raman reflected beam and the first heated reflected beam emitted from the first focusing optical path 24 pass through beam splitter BS2. u After transmission, it enters the confocal system CS u From the confocal system CS u After being launched, it passes through the total reflection mirror M1 u Reflected into focusing lens L2 u From focusing lens L2 u After exiting the emission chamber, the light passes through two filters (nf) in sequence, and then through the total reflection mirror (M1). u After reflection, the light enters the beam splitter BS3, and exits from the beam splitter BS3 into the spectrometer 40. The second reflected light path 32 also includes the beam splitter BS2. d Two total reflection mirrors M1d Focusing lens L2 d And beam splitter BS3. The second Raman reflected beam and the second heated reflected beam emitted from the second focusing beam path 25 pass through beam splitter BS2. d After transmission, it enters the confocal system CS d From the confocal system CS d After being launched, it passes through the total reflection mirror M1 d Reflected into focusing lens L2 d From focusing lens L2 d After exiting the emission chamber, the light passes through two filters (nf) in sequence, and then through the total reflection mirror (M1). d After reflection, it enters the beam splitter BS3, and after exiting the beam splitter BS3, it enters the spectrometer 40.

[0049] In one embodiment, the light source further includes a white light emitter 14, and the in-situ testing system further includes an image acquisition device 60. The white light emitter 14 emits a first white light test beam and a second white light test beam, which illuminate a first position on the front side and a second position on the back side of the sample, respectively. The first white light test beam is reflected at the first position to obtain a first white light reflected beam, and the second white light test beam is reflected at the second position to obtain a second white light reflected beam. The receiving optical path 30 directs the first and second white light reflected beams toward the image acquisition device 60, which acquires an image of the sample, thereby obtaining a clear image of the sample.

[0050] Specifically, the image acquisition device 60 may include two cameras, and the first white light reflected beam enters the camera after passing through the first reflected light path 31. u The second white light reflected beam enters the camera after passing through the second reflected light path 32. d Two cameras can be used to observe images of the front and back of the sample respectively.

[0051] In one embodiment, the in-situ testing system further includes a mirror assembly with two holes. A first Raman reflected beam and a first heated reflected beam emitted from the receiving light path 30 enter the spectrometer 40 through one hole, while a second Raman reflected beam and a second heated reflected beam emitted from the receiving light path 30 enter the spectrometer 40 through the other hole. A first white light reflected beam and a second white light reflected beam emitted from the receiving light path 30 are reflected by the mirror assembly and then enter the image acquisition device 60. Therefore, the spectrum reflected from the sample partially enters the spectrometer and partially enters the camera, allowing for simultaneous observation of the sample using the camera and analysis of the sample's temperature, pressure, and lattice parameters using the spectrometer.

[0052] In one embodiment, the reflector assembly is a dual-pinhole reflector DM, which can be a metal reflector. The first Raman reflected beam and the first heated reflected beam emitted from the first reflected light path 31 enter the spectrometer 40 through one of the holes in the dual-pinhole reflector DM. The second Raman reflected beam and the second heated reflected beam emitted from the second reflected light path 32 enter the spectrometer 40 through the other hole. The first white light reflected beam emitted from the first reflected light path 31 and the second white light reflected beam emitted from the second reflected light path 32 are reflected by areas outside the two holes of the dual-pinhole reflector DM and then enter the corresponding cameras. Therefore, only one spectrometer is needed to analyze both the front and back sides of the sample, saving on the number of spectrometers and reducing system costs.

[0053] In one embodiment, a coating is provided on the side of the reflector assembly away from the spectrometer. The coating is composed of X-ray sensitive phosphor. X-rays or diffraction signals entering the receiving light path illuminate the reflector assembly, and the image after X-ray or diffraction signal illumination can be observed by a camera, thereby enabling further analysis of the sample.

[0054] In one embodiment, the white light emitter 14 includes a first emitter and a second emitter. The first emitter is used to emit a first white light test beam, and the second emitter is used to emit a second white light test beam. The first white light test beam is directed to a first position after passing through a first focusing optical path 24, and the second white light test beam is directed to a second position after passing through a second focusing optical path 25.

[0055] Specifically, the first white light test beam emitted by the first transmitter passes through the beam splitter BS2 on the first reflected optical path 31. u After reflection, the light enters the first focusing optical path 24 and is then directed towards the first position. The second white light test beam emitted by the second emitter passes through BS2 on the second reflection optical path 32. d After reflection, the light enters the second focusing optical path 25 and is then directed to the second position. Therefore, the first white light test beam, the first Raman test beam, and the first heating test beam share the first focusing optical path 24, while the second white light test beam, the second Raman test beam, and the second heating test beam share the second focusing optical path 25. This allows for simultaneous white light testing, Raman spectroscopy testing, and heating spectroscopy testing of the same position on both the front and back sides of the sample, achieving precise detection of the sample.

[0056] The in-situ testing system provided in this application integrates double-sided heated laser testing, double-sided Raman testing, and X-ray diffraction testing. It can test the same location of a sample in a diamond anvil cell under extreme temperature and pressure conditions to obtain the sample's pressure parameters, temperature parameters, and lattice parameters.

[0057] The above-described embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. An in-situ testing system, characterized in that, include: The light source includes a Raman laser emitter, a heated laser emitter, and an X-ray emitter, wherein the Raman laser emitter is used to emit Raman laser light, the heated laser emitter is used to emit heated laser light, and the X-ray emitter is used to emit X-ray light. The emission optical path is used to split the Raman laser into a first Raman test beam and a second Raman test beam, split the heating laser into a first heating test beam and a second heating test beam, and direct the first Raman test beam and the first heating test beam toward a first position on the front side of the sample, and direct the second Raman test beam and the second heating test beam toward a second position on the back side of the sample; the sample is located in a diamond anvil cell; the first Raman test beam and the first heating test beam are reflected at the first position to obtain a first Raman reflected beam and a first heating reflected beam, respectively, and the second Raman test beam and the second heating test beam are reflected at the second position to obtain a second Raman reflected beam and a second heating reflected beam, respectively; The receiving optical path is used to direct the first Raman reflected beam, the first heated reflected beam, the second Raman reflected beam, and the second heated reflected beam toward the spectrometer; A spectrometer for determining pressure parameters of the front and back sides of the sample based on the first Raman reflected beam and the second Raman reflected beam, and for determining temperature parameters of the front and back sides of the sample based on the first heating reflected beam and the second heating reflected beam; A detection device is used to receive the diffraction signal obtained after the X-rays diffract at the first position, and to determine the lattice parameters of the sample based on the diffraction signal; The emission optical path includes a beam splitter, a first adjustment optical path, a second adjustment optical path, a first focusing optical path, and a second focusing optical path. The beam splitter is used to split the Raman laser into a first Raman test beam and a second Raman test beam, and to split the heated laser into a first heated test beam and a second heated test beam. The first Raman test beam and the first heated test beam pass through the first adjustment optical path and the first focusing optical path in sequence and are directed toward the first position. The second Raman test beam and the second heated test beam pass through the second adjustment optical path and the second focusing optical path in sequence and are directed toward the second position.

2. The in-situ testing system as described in claim 1, characterized in that, The light source further includes a white light emitter, and the in-situ testing system further includes an image acquisition device. The white light emitter is used to emit a first white light test beam and a second white light test beam. The first white light test beam is reflected at the first position to obtain a first white light reflected beam, and the second white light test beam is reflected at the second position to obtain a second white light reflected beam. The receiving optical path is used to direct the first white light reflected beam and the second white light reflected beam toward the image acquisition device, and the image acquisition device is used to acquire an image of the sample.

3. The in-situ testing system as described in claim 2, characterized in that, The in-situ testing system also includes a mirror assembly with two holes. The first Raman reflected beam and the first heated reflected beam emitted from the receiving light path enter the spectrometer through one of the holes, while the second Raman reflected beam and the second heated reflected beam emitted from the receiving light path enter the spectrometer through the other hole. The first white light reflected beam and the second white light reflected beam emitted from the receiving light path are reflected by the mirror assembly and then enter the image acquisition device.

4. The in-situ testing system as described in claim 2, characterized in that, The white light emitter includes a first emitter and a second emitter. The first emitter is used to emit the first white light test beam, and the second emitter is used to emit the second white light test beam. The first white light test beam is directed toward the first position after passing through the first focusing optical path, and the second white light test beam is directed toward the second position after passing through the second focusing optical path.

5. The in-situ testing system as described in claim 1, characterized in that, The first adjustment optical path includes a first attenuator, and the second adjustment optical path includes a second attenuator.

6. The in-situ testing system as described in claim 1, characterized in that, The first focusing optical path includes a first focusing mirror and a first amorphous carbon reflector, and the second focusing optical path includes a second focusing mirror and a second amorphous carbon reflector. The X-rays are directed towards the first position after passing through the first amorphous carbon reflector, and the diffraction signal enters the detection device after passing through the second amorphous carbon reflector. The X-rays reflected from the first position enter the receiving optical path after passing through the first amorphous carbon reflector and the first focusing mirror. The diffraction signal is also used to enter the receiving optical path after passing through the second amorphous carbon reflector and the second focusing mirror.

7. The in-situ testing system as described in claim 1, characterized in that, The receiving optical path includes a first reflecting optical path and a second reflecting optical path. The first reflecting optical path is used to direct the first Raman reflected beam and the first heating reflected beam toward the spectrometer, and the second reflecting optical path is used to direct the second Raman reflected beam and the second heating reflected beam toward the spectrometer.

8. The in-situ testing system as described in claim 7, characterized in that, The first reflected optical path includes a first confocal component, and the second reflected optical path includes a second confocal component.

9. The in-situ testing system as described in claim 7, characterized in that, The first reflected optical path further includes a first filter, and the second reflected optical path further includes a second filter.

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