Automatic Testing System and Method for Digital Load Capacity Hardware

Abstract

This invention provides an automated testing system and method for digital payload hardware that can cover board-level functional performance testing of various hardware products, has high testing efficiency, and generates traceable test records. The invention includes at least one functional testing device, which comprises a test fixture (1), a measurement and control device (2), a signal conversion device (3), a test backend (4), and a power supply. The signal conversion device includes a replaceable backplane adapter board (5) and a replaceable signal conversion board (6). The method includes the following steps: a) matching and replacing the backplane adapter board and signal conversion board according to test requirements, and powering on the system; b) placing the digital payload hardware product under test into the test fixture (1); c) sending a test command from the test backend, and the measurement and control device performing functional testing on the digital payload hardware product under test; d) repeating steps a to c after the test is completed. This invention can be applied to the field of testing technology.

Description

Technical Field

[0001] This invention relates to the field of testing technology, and in particular to an automatic testing system and method for digital load hardware. Background Technology

[0002] With the development of technology, the level of industrial automation is increasing. During the manufacturing process, automated equipment requires hardware testing of various devices to ensure performance meets design requirements. Currently, testing of digital payload hardware is typically done manually. However, this method is inefficient, data is difficult to archive and retrieve later, has low traceability, and requires a long debugging time. Therefore, manual testing clearly cannot meet the needs of large-scale mass production, debugging, and testing of digital payload hardware testing equipment. Thus, there is an urgent need to design automated testing equipment for hardware platforms to solve these problems. Simultaneously, the newly designed automated testing system covers the board-level functional performance testing needs of various hardware products, meeting the testing requirements of different digital payload hardware platforms, thereby improving versatility and reducing equipment costs. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a digital load hardware automatic test system that can cover board-level functional performance testing of various hardware products, has high testing efficiency, and forms traceable test records.

[0004] This invention also provides a method for automating the testing of digital payload hardware using the aforementioned testing system. This method is simple to operate, has a short testing time, and is highly efficient.

[0005] The technical solution adopted by the automatic testing system for digital payload hardware of the present invention is that the present invention includes at least one functional testing device, the functional testing device including...

[0006] A replaceable test fixture for mounting the digital payload hardware product under test;

[0007] A measurement and control device used for performance testing of digital payload hardware products under test;

[0008] A signal conversion device for connecting the digital payload hardware product under test on the test fixture to the measurement and control device and realizing signal conversion between the digital payload hardware product under test and the measurement and control device;

[0009] A test backend for communicating with the measurement and control device, sending signals to the measurement and control device, and receiving signals from the measurement and control device;

[0010] And a power supply for powering the entire digital payload hardware automated test system;

[0011] The signal conversion device includes a replaceable backplane adapter plate disposed at the test fixture end, a replaceable signal adapter plate disposed at the measurement and control device end, a first connector for connecting the backplane adapter plate and the signal adapter plate, and a second connector for connecting the backplane adapter plate and the digital load hardware product under test.

[0012] The test fixture is provided with a first sliding connection mechanism. The signal adapter board is mounted on an adapter board mounting module and is connected or disconnected from the backplane adapter board by being driven by the adapter board mounting module. The first sliding connection mechanism drives the digital payload hardware product under test to move toward the backplane adapter board and is connected through the second connector.

[0013] Furthermore, the functional testing equipment also includes a cabinet, and the test fixture and the signal conversion device are integrated as a whole and fitted into the cabinet in a drawer-like manner. The measurement and control device, the signal conversion device, the test backend, and the power supply are all installed on the cabinet.

[0014] Therefore, it is evident that the drawer-style arrangement of test fixtures in conjunction with the server rack is a relatively trendy design approach.

[0015] Furthermore, the test fixture includes a mounting base plate, a fixture bracket fixedly mounted on the mounting base plate, a product tray for supporting the digital payload hardware product under test and located above the fixture bracket, a cover plate disposed above the product tray, a handle, and a handle mounting portion fixedly engaged with the fixture bracket. The first sliding connection mechanism includes two sets of support sliders disposed inside the fixture bracket, a drag rail that slidably engages with the two sets of support sliders and is fixed to both sides of the product tray, and a connecting ear hinged to one end of the drag rail. The other end of the connecting ear is hinged to the end of the handle near the handle mounting portion. One end of the handle is connected via a first hinge. The handle mounting part is hinged to the fixture bracket, which has a slot. The back plate adapter plate is clamped in the slot. The mounting base plate has an adapter plate moving guide rail that slides with the adapter plate mounting module. The adapter plate moving guide rail has a locking positioning groove. The adapter plate mounting module has a manual locking device that cooperates with the locking positioning groove. When the adapter plate mounting module moves within the adapter plate moving guide rail, the signal adapter plate is connected or disconnected from the back plate adapter plate through the first connector. When the handle is opened or closed, the digital load hardware product under test is pulled by the first sliding connection mechanism and connected or disconnected from the back plate adapter plate.

[0016] Furthermore, a cover plate mounting claw for mounting the cover plate is provided on the handle mounting part. The cover plate mounting claw, the handle mounting part, and the handle are connected as a whole by a first hinge shaft. A first guide limiting groove and a second guide limiting groove are respectively provided on the handle mounting part and the handle for the first hinge shaft to pass through and move within them. A third guide limiting groove is also provided on the handle mounting part. A second hinge shaft is provided on the cover plate mounting claw, and the second hinge shaft is engaged in the third guide limiting groove.

[0017] In addition, a cooling fan for cooling the tested digital payload hardware product is provided on the cover plate, which is made of transparent material.

[0018] More specifically, the number of signal adapter boards is two.

[0019] Furthermore, the backplane adapter plate is fixed in the slot by a quick-locking pin, and the other end of the signal adapter plate is connected to the test instrument.

[0020] Specifically, the measurement and control device is a PXIe measurement and control device, the test backend is an industrial computer, and both the first connector and the second connector are VPX connectors.

[0021] In addition, the functional testing equipment is a signal processing board testing equipment, a baseband processing board testing equipment, and / or a general processing board testing equipment.

[0022] The beneficial effects of the present invention are as follows: In the system of the present invention, the test fixture in the functional test equipment is used to load the digital payload hardware product under test and is replaceable; the measurement and control device is used to perform performance testing on the digital payload hardware product under test; the signal conversion device is used to connect the digital payload hardware product under test on the test fixture to the measurement and control device and realize the signal conversion between the digital payload hardware product under test and the measurement and control device; the test background is used to communicate with the measurement and control device, send signals to the measurement and control device and receive signals from the measurement and control device; and the power supply is used to supply power to the entire digital payload hardware automatic test system.

[0023] The signal conversion device includes a replaceable backplane adapter plate disposed at the test fixture end, a replaceable signal adapter plate disposed at the measurement and control device end, a first connector for connecting the backplane adapter plate and the signal adapter plate, and a second connector for connecting the backplane adapter plate and the digital load hardware product under test.

[0024] The test fixture is provided with a first sliding connection mechanism. The signal adapter board is mounted on an adapter board mounting module and is connected or disconnected from the backplane adapter board by being driven by the adapter board mounting module. The first sliding connection mechanism drives the digital payload hardware product under test to move toward the backplane adapter board and is connected through the second connector.

[0025] As can be seen from the above solution, the functional testing equipment, consisting of a test fixture, a measurement and control device, a test backend, a signal conversion device, and a power supply, or an automated testing system consisting of at least one functional testing device, can avoid human intervention, ensure test accuracy, and prevent errors between products. The automated testing system greatly improves testing efficiency; after testing, the test time has been shortened to at least one-twentieth of the original time. The measurement and control device and the test backend automatically record test data, including complete records of test data, images, waveforms, etc., and the test data is uploaded to the system for easy tracking and retrieval, forming a traceable test record. Furthermore, the backplane adapter board and signal adapter board in the signal conversion device can be quickly replaced according to different products under test, enabling one system to test different products and cover the board-level functional performance testing of multiple different hardware products, greatly reducing product development costs.

[0026] Furthermore, the testing method of the aforementioned automated testing system for digital payload hardware includes the following steps:

[0027] a. According to the test requirements of the digital load hardware product under test, match and replace the backplane adapter board and signal adapter board of the signal adapter device, and power on the system.

[0028] b. Place the digital payload hardware product under test into the test fixture;

[0029] c. The test backend sends a test command to the measurement and control device, and the measurement and control device performs functional tests on the digital load hardware product under test in the test fixture.

[0030] d. After the test is completed, the test fixture is opened, the tested product is taken out, and the untested product is placed into the test fixture. Steps a to c are repeated.

[0031] As can be seen from the above scheme, the above testing system can realize fully automated performance testing. The method is simple to operate, has a short testing time, and is highly efficient. Attached Figure Description

[0032] Figure 1 This is a simplified system block diagram of the functional testing equipment;

[0033] Figure 2 This is a first-view structural diagram of the functional testing equipment in the open state;

[0034] Figure 3 This is a second-view structural diagram of the functional testing equipment in the open state;

[0035] Figure 4 This is a schematic diagram of the functional testing equipment in the closed state;

[0036] Figure 5 This is a schematic diagram of the exploded structure of the test fixture;

[0037] Figure 6 This is a simplified structural diagram of the test fixture in the open state from a first-view perspective;

[0038] Figure 7 This is a simplified structural diagram of the test fixture in the open state from a second perspective;

[0039] Figure 8 This is a simplified structural diagram of the test fixture in the closed state;

[0040] Figure 9 This is a simplified structural diagram of the manual locking device.

[0041] Figure 10 This is a diagram showing the connection relationship between the digital load board debugging connector and the instrument. Detailed Implementation

[0042] like Figures 1 to 10 As shown, the present invention includes at least one functional testing device, the functional testing device including...

[0043] 1. A replaceable test fixture for mounting the digital payload hardware product under test;

[0044] 2. Measurement and control device for performance testing of digital payload hardware products under test;

[0045] A signal transfer device 3 is used to connect the digital payload hardware product under test on the test fixture 1 to the measurement and control device 2 and to realize the signal transfer between the digital payload hardware product under test and the measurement and control device 2.

[0046] Test backend 4 is used to communicate with the measurement and control device 2, send signals to the measurement and control device 2, and receive signals from the measurement and control device 2;

[0047] And a power supply for powering the entire digital payload hardware automated test system;

[0048] The signal conversion device 3 includes a replaceable backplane adapter 5 disposed at one end of the test fixture 1, a replaceable signal adapter 6 disposed at one end of the measurement and control device 2, a first connector 7 for connecting the backplane adapter 5 and the signal adapter 6, and a second connector 8 for connecting the backplane adapter 5 and the digital load hardware product under test.

[0049] The test fixture 1 is provided with a first sliding connection mechanism. The signal adapter board 6 is mounted on an adapter board mounting module 9 and is driven by the adapter board mounting module 9 to connect or disconnect with the backplane adapter board 5. The first sliding connection mechanism drives the digital load hardware product under test to move toward the backplane adapter board 5 and connects with it through the second connector 8.

[0050] The functional testing equipment also includes a cabinet 10. The test fixture 1 and the signal conversion device 3 are integrated as a drawer on the cabinet 10. The measurement and control device 2, the signal conversion device 3, the test backend 4, and the power supply are all installed on the cabinet 10.

[0051] The test fixture 1 includes a mounting base plate 11, a fixture bracket 12 fixedly mounted on the mounting base plate 11, a product tray 13 for supporting the digital payload hardware product under test and located above the fixture bracket 12, a cover plate 14 disposed above the product tray 13, a handle 15, and a handle mounting part 16 fixedly engaged with the fixture bracket 12. A plurality of product positioning posts 36 are provided on the product tray 13. The first sliding connection mechanism includes two sets of support slider groups 17 disposed inside the fixture bracket 12, a drag slide rail 18 that is slidably engaged with the two sets of support slider groups 17 and fixed to both sides of the product tray 13, and a connecting ear 19 hinged to one end of the drag slide rail 18. The other end of the connecting ear 19 is hinged to one end of the handle 15 near the handle mounting part 16. One end of the handle 15 is hinged to the handle mounting part 16 through a first hinge point 29. The fixture bracket 12 is provided with a slot 20, and the back plate adapter plate 5 is clamped in the slot 20. The mounting base plate 11 is provided with a connection to the adapter plate 16. The adapter plate mounting module 9 has a sliding guide rail 21 for sliding engagement with the adapter plate. The adapter plate moving guide rail 21 is provided with a locking and positioning groove 22. The adapter plate mounting module 9 is provided with a manual locking device 23 that engages with the locking and positioning groove 22. The manual locking device 23 includes a drive rod 32, a positioning locking rod 33, and a moving guide rod 34. The positioning locking rod 33 and the moving guide rod 34 are of equal length. One end of the drive rod 32 has two holes along its length. The positioning locking rod 33 and the moving guide rod 34 are rotatably engaged with one of the holes. The positioning locking rod 33 is located at the outermost end of the drive rod 34. The adapter plate mounting module 9 has a guide slot hole 35. The moving guide rod 34 is fitted into the guide slot hole 35, and the positioning locking rod 33 is located outside and below the guide slot hole 35. The signal adapter board 6 is mounted on the adapter board mounting module 9. The adapter board mounting module slides with the adapter board moving guide rail on the mounting base plate. During the sliding process, the connector on the signal adapter board connects with the connector on the backplane adapter board to conduct electrical signals, thereby testing the product under test at the rear of the backplane adapter board. The manual locking device enables the adapter board mounting module and the adapter board to move smoothly and stably, ensuring the stable and reliable connection between the signal adapter board and the backplane adapter board. During the movement of the manual locking device, the positioning locking rod engages with the locking positioning groove on the adapter board moving guide rail, while the moving guide rod is located in the guide groove hole. When the drive rod is manually swung, the positioning locking rod acts as a hinge point. Utilizing the lever principle, the moving guide rod drives the adapter board mounting module to move accordingly, thereby connecting or disconnecting the signal adapter board and the backplane adapter board, realizing the quick connection or disconnection of the signal adapter board. This facilitates the rapid replacement of the signal adapter board and the backplane adapter board, improving efficiency.When the adapter board mounting module 9 moves within the adapter board moving guide rail 21, the signal adapter board 6 is connected or disconnected from the backplane adapter board 5 through the first connector 7. As the handle 15 is opened or closed, the digital load hardware product under test is pulled by the first sliding connection mechanism and is connected or disconnected from the backplane adapter board 5.

[0052] The handle mounting portion 16 is provided with a cover plate mounting claw 24 for mounting the cover plate 14. The cover plate mounting claw 24, the handle mounting portion 16 and the handle 15 are connected as a whole by a first hinge shaft 25. The handle mounting portion 16 and the handle 15 are respectively provided with a first guide limiting groove 26 and a second guide limiting groove 27 for the first hinge shaft 25 to pass through and move within it. The handle mounting portion 16 is also provided with a third guide limiting groove 30. The cover plate mounting claw 24 is provided with a second hinge shaft 31, which is engaged in the third guide limiting groove 30.

[0053] Here, the handle mounting part 16 is fixed to the fixture bracket 12, and one end of the handle is hinged to the handle mounting part 16. The first guide limiting groove 26 on the handle mounting part 16 and the second guide limiting groove 27 on the handle cooperate. The cover plate mounting claw achieves the closing and opening of the cover plate through two movable connection points formed by the first hinge shaft 25 in the first guide limiting groove 26 and the second guide limiting groove 27 and the second hinge shaft 31 in the third guide limiting groove 30. When the handle is pressed down, the handle moves along the handle and the handle. When the first hinge point 29 of the handle mounting part 16 rotates, the first hinge shaft 25, which is engaged in the first guide limiting groove 26 and the second guide limiting groove 27, and the second hinge shaft 31, which is engaged in the third guide limiting groove 30, together drive the cover plate mounting claw and the handle to press down together, so that the cover plate can be tightly closed on the product to be tested. When the handle is pulled up, the cover plate mounting claw will follow the upward movement and be opened at the same time. In addition, a hinge point and a connecting ear are provided on the periphery of the position where the handle and the handle mounting part 16 are hinged. The device is hinged together via connecting ears. When the handle is pressed down, the connecting ears drive the drag rail 18, which moves the product tray towards the back panel adapter plate. After the handle is pressed down, the connector on the product under test on the product tray becomes conductive with the connector on the back panel adapter plate. When the handle is pulled up, the connecting ears drive the drag rail, which moves the product tray away from the back panel adapter plate. After the handle is pulled up, the connector on the product under test on the product tray disengages from the connector on the back panel adapter plate. Through the cooperation of the handle mounting part 16 and the handle, the handle, cover plate, and product tray can move simultaneously. The product tray moves the product under test, and thus, the action of one component realizes the linkage of three devices. When the cover plate is closed, the product tray drives the product under test to become conductive with the back panel adapter plate. When the cover plate is opened, the product tray drives the product under test to become disconnected from the back panel adapter plate. This ensures the reliability and safety of the test, and also greatly reduces the structural complexity and cost of the equipment.

[0054] A cooling fan 28 for cooling the digital payload hardware under test is provided on the cover plate 14, which is made of transparent material. Making the cover plate transparent allows operators to observe the entire process of the product under test connecting to the backplane adapter board during operation. If any abnormality is detected, operation can be stopped immediately to avoid damage to the product and the backplane adapter board. The cooling fan provides rapid heat dissipation for the product under test, preventing performance degradation during testing. Two signal adapter boards 6 are provided. The adapter board mounting module can accommodate two signal adapter boards simultaneously, satisfying both single-board and double-board application scenarios, thus improving the applicability of the invention. The backplane adapter board 5 is fixed in the slot 20 by a quick-locking pin (not shown in the attached drawings), and the other end of the signal adapter board 6 is connected to the testing instrument. The measurement and control device 2 is a PXIe measurement and control device, the test backend 4 is an industrial computer, and both the first connector 7 and the second connector 8 are VPX connectors.

[0055] The test method of the above-mentioned automated test system for digital payload hardware includes the following steps:

[0056] a. According to the test requirements of the digital load hardware product under test, match and replace the backplane adapter board and signal adapter board of the signal adapter device, and power on the system.

[0057] b. Place the digital payload hardware product under test into the test fixture 1;

[0058] c. The test backend sends a test command to the measurement and control device, and the measurement and control device performs functional tests on the digital load hardware product under test in the test fixture.

[0059] d. After the test is completed, the test fixture is opened, the tested product is taken out, and the untested product is placed into the test fixture. Steps a to c are repeated.

[0060] The specific process of the above steps is as follows:

[0061] After replacing the backplane adapter board and / or signal adapter board, power on the system.

[0062] Pulling handle 15 causes it to press down, which in turn moves the sliding rail 18 via connecting lug 19. The sliding rail 18 then moves the product tray towards the backplate adapter plate 5. When the product tray 13 reaches the backplate adapter plate 5, the connector on the product under test connects with the connector on the backplate adapter plate 5, achieving electrical conductivity. Simultaneously, the first hinge shaft 25 causes the cover plate mounting claw 24 to press down, covering the product under test to prevent accidents during testing and ensure smooth and accurate testing. When handle 15 is pulled up, the above actions are reversed, and the cover plate opens, removing the product tray from the backplate adapter plate. When different... If the product needs replacement, the backplane adapter board can be replaced. On the other side of the backplane adapter board, push the adapter board mounting module 9 into the adapter board moving guide rail 21. When the positioning locking rod 33 reaches the clamping positioning groove 22, the positioning locking rod 33 is clamped in the clamping positioning groove 22. Under the action of the drive rod 32, the moving guide rod 34 pushes the adapter board mounting module 9 to continue moving towards the backplane adapter board until the connector on the signal adapter board 6 connects and conducts electricity with the connector on the backplane adapter board. When the signal adapter board needs to be replaced, reverse the operation and pull the adapter board mounting module out of the adapter board moving guide rail 21 to replace the signal adapter board.

[0063] In this embodiment, the automated testing system for digital payload hardware includes four functional testing devices: one signal processing board testing device, two baseband processing board testing devices, and one general-purpose processing board testing device. In this embodiment, a BF beamforming board is used as an example of the digital payload hardware product under test for detailed explanation. Here, the test items for the signal processing board testing device are mainly described.

[0064] In this embodiment, replacing the backplane adapter board 5 and signal adapter board 6 in the signal adapter device only takes 5 minutes. The mounting holes of the backplane adapter board PCBA and backplane adapter board assembly in the backplane adapter board 5 are asymmetrically designed to avoid reverse or incorrect installation. A dedicated grounding terminal is provided at the rear end of the cabinet 10, and an anti-static wrist plug and anti-static wrist hook are provided at the front end of the cabinet. The cover 14 is made of transparent material and is closed during testing to prevent operators from contacting the inside of the product. During operation, employees can observe the entire process of the product under test mating with the backplane connector and can stop the operation at any time if any abnormality is found.

[0065] In this invention, the power supply adopts 220V / AC, and the power of a single device is <3000W. The AC power supply is connected to the contactor through the recorder, the air switch, and the emergency stop button at the front of the cabinet controls the on and off of the contactor; the terminal block distributes the AC power to the power supply, the chassis, the computer, the monitor, and other electrical equipment.

[0066] The electronic connection circuit diagram in this invention is as follows.

[0067] The signal processing board test system's backplane signal conversion consists of three boards: Signal Adapter Board 1, Signal Adapter Board 2, and Backplane Adapter Board. Signal Adapter Board 1 and Signal Adapter Board 2 connect to NI instruments via cables on their left sides, and connect to the dedicated backplane adapter board via 6U VPX connectors on their right sides. One side of the backplane adapter board interfaces with the two adapter boards, and the other side interfaces with the DUT (Device Under Test). Different board models require different dedicated backplane adapter boards. Signal Adapter Board 1's main function is to convert LVDS signals, GTH signals, and convert device clock signals, as well as generate the system clock. Signal Adapter Board 2's main function is to convert LVTTL signals and provide power. These signals connect to the backplane adapter board via VPX connectors. The backplane adapter board's main function is to connect the backplane signals of the DUT to Signal Adapter Board 1 and Signal Adapter Board 2. Additionally, the GTH signal must form a loopback on the backplane adapter board. The remaining GTH signals are loop-tested on the backplane adapter board. Since the number of GTH transmitters and receivers on the BF beamboard is inconsistent, a high-speed switch is needed to switch the signals, enabling multiple transmitters to receive a single receiver. LVDS signals need to be connected to NI's PXIe-6569 for LVDS signal transmission and reception. The BF beamboard has a total of 28 pairs of LVDS signal lines. The debug connector has four JTAG ports and four UART ports. JTAG1, JTAG2, and JTAG3 share the same programmer. After switching, the JTAG signals are connected to the three JTAG ports of the debug connector. The C7A100T2's JTAG ports use a separate programmer for program downloading. The four UART ports are connected to the PXIe-7820 digital reconfigurable I / O module via wiring. The connection relationship between the BF beamboard debug connector and the instrument is as follows: Figure 7 As shown. Data interaction between the board under test and the NI instrument is conducted through GTH. The GTH interface card PXIe-6591 has 8 channels of TX and 8 channels of RX, output by two Mini-SAS ports. Here, one Mini-SAS port is used for data interaction.

[0068] LVDS signals are transmitted and received by PXIE-6569, connected to backplane adapter card 1 via SR240M-SR240M cable, with a portion of the signal connected to the front adapter board after an adapter. GTH signals are transmitted and received by PXIE-6591R, connected to backplane adapter card 1 via MINI-SAS cable. Clock signals are emitted by PXIE-5654, connected to backplane adapter card 1 via RF cable. These signals are connected to the backplane adapter board via the VPX interface of adapter card 1. LVTTL signals are transmitted and received by PXIE-7822, connected to backplane adapter card 2 via SHC68-C68-RDIO2 cable, with one SHC68-C68-RDIO2 cable connected to the front adapter board. A programmable DC power supply RMX4120 is connected to backplane adapter card 2 via a power cable. These signals are connected to the backplane adapter board via the VPX interface of adapter card 2.

[0069] The ADC signal is emitted from two PXIE-5654s, passing through an RF filter and an RF shielded cable before connecting to an RF multiplexer. After passing through the RF multiplexer, it connects to a PXI-2596 via an RF shielded cable. The signal is then output from the PXI-2596 RF multiplexer and connected to the front panel, before finally connecting to the product via an RF shielded cable. The host's USB cable connects to the FPGA downloader via the front panel.

[0070] The DAC signal generated by the DUT is connected to the front panel via an RF shielded cable, then to the RF multiplexer PXI-2596 via another RF shielded cable, and finally input to the high-performance vector signal analyzer module PXIE-5668R via another RF shielded cable.

[0071] The CAN interface card PXIe-8510 / 6 is connected to the front panel via cable TRC-8542; the RS422 / 485 interface card PXIe-8431 / 16 is connected to the front panel via cable SHC68-C68-D3; and the 12-channel analog acquisition card PXIe-6363 is connected to the front panel via cable SHC68-68-EPM. The front panel is connected to the DUT via a DB25 cable. The industrial DIO interface card PXIe-7820 is connected to the DUT via a level converter card.

[0072] Specifically, in this embodiment, the test items for the signal processing board mainly include: ADC and DAC performance testing, and interface testing between devices such as FPGA, CPU, and DSP, as well as with various types of memory. Details are as follows:

[0073] During ADC testing, an NI instrument-grade analog signal source, PXIe 5654, is used to generate signal excitation and clock. An external filter is added, and the signal is connected to the multi-channel AD port of the signal processing board via an RF switch, PXIe 2596. The signal processing board under test acquires the AD port signal and transmits the acquired data to the PXIe-6591 through the GTH port. The test software, written in LabVIEW, directly obtains the sampled data received by the GTH by calling the hardware API. Finally, the AD performance parameters are tested using an FFT-based ADC measurement software toolkit on the host computer.

[0074] During DAC testing, the PXIe-6591 transmits the required single-tone signal data to the FPGA on the signal processing board via GTH. The FPGA controls the corresponding DAC channel to output the signal. The signal is then input to the high-performance vector signal analyzer module PXIe-5668R via the RF switch PXIe 2596. The PXIe-5668R acquires and analyzes the signal and outputs the test results.

[0075] When testing the channel isolation of ADCs and DACs, it includes the ADC with all other ADCs and DACs, and the DAC with all other DACs and ADCs. The test scheme principle is similar to the ADC and DAC parameter measurement method, but the test control flow is different:

[0076] While enabling a specific ADC to receive excitation, sampling data from other ADC channels needs to be transmitted sequentially via the LVDS interface. Simultaneously, the PXIe 5668 vector analyzer sequentially acquires data from the DAC channels. Using the host computer's signal processing functions, the isolation between this ADC channel and all other channels is calculated, and the same processing is performed on the other ADC channels. The DAC channels are processed similarly.

[0077] When testing FPGA peripherals, including DDR, Flash, SSD, clock frequency, etc., the testing method is to communicate with the FPGA board under test through the GTH signal, control it to test the peripherals one by one, and upload the test results to the host computer.

[0078] FPGA interconnect signal testing primarily involves GTH, LVDS, and LVTTL. Interconnect signals are tested by writing test programs for the DUT (Device Under Test) FPGA. GTH utilizes IBERT IP, and test results are saved as a CSV file. LVDS and LVTTL are compared and transmitted by generating PRBS or specific frame sequences on the FPGA. Temperature data is acquired using the XADC within the FPGA. Data from the FPGA on the DUT board is transmitted to the test software via GTH, where the software performs data analysis and generates a report.

[0079] During FPGA backplane signal testing, this test falls under the category of FPGA interface signal testing on the backplane. The test method is similar to FPGA interconnection tests, involving calling the FPGA test program on the board and transmitting the test results to the test system via the LVDS interface. The difference lies in:

[0080] • The backplane GTH interface forms a loop through the backplane adapter board for self-loop testing;

[0081] • LVDS, LVTTL, CAN, and SPI signals are connected to the maximum signal envelope board via the backplane adapter board to communicate with the test system for testing.

[0082] If necessary, use the NI PXIe-6591 high-speed GTH board to connect to the GTH interface of the signal processing board via the backplane.

[0083] The 422 interface is used to communicate with the ACTEL chip on the DUT board to control it to load the FPGA. The functionality of the FPGA after loading is checked to determine if the bit file is correctly loaded into the FPGA and takes effect. The LabVIEW FPGA board is used to simulate the SelectMAP interface in Slave mode and interface with the ACTEL chip to verify the correctness of the loading timing. The LabVIEW FPGA board is used to simulate the SelectMAP interface in Master mode to configure the FPGA board. After the configuration is completed, the Done signal is checked to determine if the FPGA loading interface is working correctly.

[0084] During ACTEL backplane signal testing, a 422 interface is used to communicate with the ACTEL chip on the DUT board to control its output signals. A LabVIEW FPGA board is used to acquire the signals and determine whether the signal logic and timing are correct. The LabVIEW FPGA board is used to generate corresponding signals to the ACTEL chip, and the status of the ACTEL chip is read through the 422 interface to determine whether the signals are received correctly.

[0085] CPU peripheral testing is performed by controlling the CPU via a 422 controller to perform peripheral tests and read the test results.

[0086] During instruction interface testing, the PXIe-7820 LabVIEW FPGA board is used to generate the required pulse signals and the negative voltage level required for the pulses. Through the level conversion circuit, OC instructions and remote control matrix instructions that meet the requirements are generated.

[0087] During analog signal testing, the PXIe-6363 analog signal acquisition unit is used to acquire analog signals from 0 to 5V.

[0088] In addition, the testing items of the baseband processing board testing equipment mainly include interface testing between devices such as FPGA, CPU, and DSP, as well as with various types of memory; the testing items of general processing boards mainly include: power supply voltage, current, ripple, and power-on timing testing, vector signal generation and analysis, capacitor and inductor testing on the board, and open / short circuit testing of backplane pins.

[0089] This invention aims to provide a universal and systematized automated testing system that covers the different board-level functional testing needs of dozens of products currently offered by the Institute of Communications. The system requires sufficient flexibility and reconfigurability, with modular and platform-based testing hardware and flexible, reconfigurable testing software. Multiple Device Under Tests (DUTs) will be categorized according to their system type, sharing a single testing platform, testing resources, and test fixtures. Different pinboards will be installed within the test fixtures to meet the testing requirements of different DUTs, and the carrier boards can be quickly replaced. A shared testing software platform allows for flexible configuration and loading of different test cases for different DUTs.

[0090] Finally, it should be emphasized that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A digital payload hardware automatic test system comprising at least one functional test device, characterized in that, The functional test equipment comprises a replaceable test fixture (1) for loading the digital payload hardware product to be tested; a test and control device (2) for testing the performance of the digital payload hardware product to be tested; a signal switching device (3) for connecting the digital payload hardware product on the test fixture (1) with the test and control device (2) and realizing signal switching between the digital payload hardware product and the test and control device (2); a test background (4) for communicating with the test and control device (2), sending signals to the test and control device (2) and receiving signals from the test and control device (2); and a power supply for supplying power to the entire digital payload hardware automatic test system; the signal switching device (3) comprises a replaceable backboard switching board (5) arranged at the end of the test fixture (1), a replaceable signal switching board (6) arranged at the end of the test and control device (2), a first connector (7) for connecting the backboard switching board (5) with the signal switching board (6), and a second connector (8) for connecting the backboard switching board (5) with the digital payload hardware product to be tested; a first sliding connection mechanism is arranged on the test fixture (1), the signal switching board (6) is arranged on a switching board mounting module (9) and is driven to realize connection or disconnection with the backboard switching board (5) through the switching board mounting module (9), and the first sliding connection mechanism drives the digital payload hardware product to move to the backboard switching board (5) and realize connection through the second connector (8); The test fixture (1) comprises a mounting base plate (11), a fixture support (12) fixedly arranged on the mounting base plate (11), a product tray (13) for supporting a digital load hardware product to be tested and located above the fixture support (12), a cover plate (14) arranged above the product tray (13), a handle (15) and a handle mounting portion (16) fixedly matched with the fixture support (12), the first sliding connection mechanism comprises two groups of support sliding block groups (17) arranged on the inner side of the fixture support (12), a dragging sliding rail (18) slidingly matched with the two groups of support sliding block groups (17) respectively and fixedly arranged on the two sides of the product tray (13), and a connecting lug (19) hingedly connected with one end of the dragging sliding rail (18), the other end of the connecting lug (19) is hingedly connected with one end of the handle (15) close to the handle mounting portion (16), one end of the handle (15) is hingedly matched with the handle mounting portion (16) through a first hinge point (29), a clamping groove (20) is arranged on the fixture support (12), the back plate adapter plate (5) is clamped and matched in the clamping groove (20), an adapter plate moving guide rail (21) slidingly matched with the adapter plate mounting module (9) is arranged on the mounting base plate (11), the adapter plate moving guide rail (21) is provided with a clamping and positioning groove (22), a manual locking device (23) matched with the clamping and positioning groove (22) is arranged on the adapter plate mounting module (9), when the adapter plate mounting module (9) moves in the adapter plate moving guide rail (21), the signal adapter plate (6) is connected or disconnected with the back plate adapter plate (5) through the first connector (7), when the handle (15) is opened or closed, the digital load hardware product to be tested is pulled by the first sliding connection mechanism and connected or disconnected with the back plate adapter plate (5); The manual locking device (23) comprises a driving rod (32), a positioning locking rod (33) and a moving guide rod (34), the positioning locking rod (33) and the moving guide rod (34) are equal in length, one end of the driving rod (32) is respectively provided with two holes in the length direction, the positioning locking rod (33) and the moving guide rod (34) are respectively rotationally matched with one of the holes, the positioning locking rod (33) is arranged at the outermost end of the driving rod (32), a guide groove hole (35) is arranged on the adapter plate mounting module (9), the moving guide rod (34) is sleeved in the guide groove hole (35), and the positioning locking rod (33) is located outside and below the guide groove hole (35).

2. The digital payload hardware automated test system of claim 1, wherein: The functional test equipment further comprises a cabinet (10), the test fixture (1) and the signal adapter device (3) are drawer-type matched on the cabinet (10) as a whole, the measurement and control device (2), the signal adapter device (3), the test background (4) and the power supply are arranged on the cabinet (10).

3. The digital payload hardware automated test system of claim 1, wherein: The handle mounting portion (16) is provided with a cover plate mounting claw (24) for mounting the cover plate (14), the cover plate mounting claw (24), the handle mounting portion (16) and the handle (15) are connected as a whole through a first hinge shaft (25), the handle mounting portion (16) and the handle (15) are respectively provided with a first guide limiting slot (26) and a second guide limiting slot (27) for the first hinge shaft (25) to pass through and move in, the handle mounting portion (16) is further provided with a third guide limiting slot (30), the cover plate mounting claw (24) is provided with a second hinge shaft (31), the second hinge shaft (31) is fitted in the third guide limiting slot (30).

4. The digital payload hardware automated test system of claim 3, wherein: The cover plate (14) is provided with a cooling fan (28) for cooling the measured digital payload hardware product, and the cover plate (14) is made of transparent material.

5. The digital payload hardware automatic testing system of claim 1, wherein: The number of the signal adapter plates (6) is two.

6. The digital payload hardware automatic testing system of claim 1, wherein: The back plate adapter plate (5) is fixed in the clamping groove (20) through a quick lock pin, and the other end of the signal adapter plate (6) is connected with a test instrument.

7. The digital payload hardware automatic testing system of claim 1, wherein: The measurement and control device (2) is a PXIe measurement and control device, the test background (4) is an industrial computer, and the first connector (7) and the second connector (8) are both VPX connectors.

8. The digital payload hardware automatic testing system of claim 1, wherein: The functional test equipment is a signal processing board test equipment, a baseband processing board test equipment and / or a general processing board test equipment.

9. A method of testing a digital payload hardware automatic test system as claimed in claim 1, characterized by, The method comprises the following steps: a. According to the test requirements of the measured digital payload hardware product, the back plate adapter plate and the signal adapter plate of the signal adapter device are matched and replaced, and the system is powered on; b. The measured digital payload hardware product is placed into the test fixture (1); c. The test background sends a test command to the measurement and control device, and the measurement and control device performs functional test on the measured digital payload hardware product in the test fixture; d. After the test is completed, the test fixture is opened, the tested product is taken out, and the untested product is placed into the test fixture, and steps a-c are repeated.

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