A cutting and dotting method and device

Abstract

The application relates to the technical field of automatic equipment numerical control processing, in particular to a cutting and dotting method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: obtaining product information of a target batch product, wherein the product information comprises product parameters; obtaining target equipment sample product parameters and sample point position parameters, wherein the sample point position parameters are used for controlling the target equipment to realize point position operation on a sample product; obtaining a point position relative difference value according to the product parameters and the sample product parameters; and adjusting point position parameters of the target equipment to meet point position operation requirements of the target batch product based on the point position relative difference value. The method can improve cutting and dotting efficiency between different batch products, thereby improving enterprise production and testing efficiency.

Description

Technical Field

[0001] This application relates to the field of automation equipment technology, and in particular to a cutting machine marking method, apparatus, computer equipment, storage medium and computer program product. Background Technology

[0002] In modern industry, automated equipment has become an indispensable tool in production, enabling high-efficiency, high-quality manufacturing and enhancing enterprise competitiveness. However, when using automated equipment to produce and test products, the processing and testing points / processing points differ between different batches and specifications. This necessitates that companies reconfigure these points every time they change product batches, wasting considerable time and costs and reducing production and testing efficiency. Therefore, how to quickly switch points and improve the production and testing efficiency of automated equipment has become a pressing issue.

[0003] In related technologies, some solutions already exist to address the need to reset positioning when changing product batches. Some solutions use robotic arms or manual control for positioning adjustments, but these methods suffer from inconsistencies in operation and low adjustment accuracy, failing to meet the requirements of modern, high-efficiency production. Other solutions use image recognition technology to automatically identify products and adjust positioning, but these methods require photographing or scanning the products, have insufficient recognition rates, and require additional image processing hardware and software support, resulting in higher costs.

[0004] However, the current cutting machine marking method has the following technical problems:

[0005] The process of manually setting up points or using other image processing equipment to set up points is lengthy, and the accuracy of point adjustment is low, resulting in low efficiency and poor results. Summary of the Invention

[0006] Based on this, it is necessary to provide a cutting and marking method, device, computer equipment, computer-readable storage medium, and computer program product that can improve the cutting and marking efficiency between different batches of products, thereby improving the production and testing efficiency of enterprises, in order to address the above-mentioned technical problems.

[0007] Firstly, this application provides a method for marking points on a cutting machine. The method includes:

[0008] Obtain product information for the target batch of products, including product parameters;

[0009] Obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to operate the sample product at each location.

[0010] The relative difference between the locations is obtained based on the product parameters and the sample product parameters;

[0011] Based on the relative difference between the locations, the location parameters of the target device are adjusted to meet the location operation requirements of the target batch of products.

[0012] In one embodiment, after adjusting the location parameters of the target device to meet the location operation requirements of the target batch of products based on the relative difference between the locations, the method further includes:

[0013] Based on the relative difference between the points and the sample point parameters, the target point parameters of the target batch of products are obtained.

[0014] The target location parameters are added to the product parameter library using the product information as an identifier. The product parameter library is used to store the location parameters of the product or the relative difference between the locations, so that when switching the product to be tested, all location data can be generated with one click based on the sample location parameters and the relative difference between the locations.

[0015] In one embodiment, the product information further includes a product identifier, and after obtaining the product information for the target batch, the method further includes:

[0016] Extract the target product identifier of the target batch of products, and search the product parameter database based on the target product identifier;

[0017] If the product parameter library contains a target location parameter or a relative difference value of the target product that matches the target product identifier, then the target device is adjusted by calling the target location parameter or the relative difference value of the target product.

[0018] In one embodiment, obtaining the product information of the target batch of products includes:

[0019] The product data imported from external sources is obtained, and the product information is derived based on the extraction of the product data;

[0020] and / or;

[0021] The product images of the target batch of products are acquired, and the product images are processed based on a preset image measurement algorithm to obtain the product information;

[0022] and / or;

[0023] Obtain sample testing data of the target batch of products, and obtain product information based on the sample testing data.

[0024] In one embodiment, before obtaining the relative difference between locations based on the product parameters and the historical product parameters, the method further includes:

[0025] Obtain the first parameter specification of the point parameters;

[0026] Adjust the product parameters to conform to the first parameter specification.

[0027] In one embodiment, the point parameters include direction axis setting parameters, and the method further includes:

[0028] The direction axis setting parameters corresponding to different directions are stored in the associated direction axis coordinate address according to a preset mapping relationship;

[0029] When adjusting the point parameters, the relative difference between the point and the direction axis is added to the direction axis coordinate address.

[0030] Secondly, this application also provides a cutting machine marking device. The device includes:

[0031] The product information module is used to obtain product information for the target batch of products, including product parameters.

[0032] The historical parameter module is used to obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to perform operations on the sample product at various locations.

[0033] The location difference module is used to obtain the relative difference between locations based on the product parameters and the sample product parameters.

[0034] The machine-marking module is used to adjust the point parameters of the target equipment to meet the point operation requirements of the target batch of products based on the relative difference of the points.

[0035] In one embodiment, after the cutting and marking module, the following is also included:

[0036] The current batch parameter module is used to obtain the target point parameters of the target batch of products based on the relative difference between the points and the sample point parameters.

[0037] The product parameter library module is used to add the target point parameters to the product parameter library using the product information as an identifier. The product parameter library is used to store the point parameters of the product or to store the relative differences between the points, so that when switching the product to be tested, all point data can be generated with one click based on the sample point parameters and the relative differences between the points.

[0038] In one embodiment, the product information further includes a product identifier, and after the product information module, it further includes:

[0039] The identifier retrieval module is used to extract the target product identifier of the target batch of products and perform a retrieval in the product parameter database based on the target product identifier.

[0040] The parameter calling module is used to adjust the target device by calling the target point parameter or the relative difference of the point of the target product if there is a target point parameter or the relative difference of the point of the target product that matches the target product identifier in the product parameter library.

[0041] In one embodiment, the product information module includes:

[0042] The external import module is used to acquire the product data imported from external sources and to obtain the product information based on the extraction of the product data;

[0043] and / or;

[0044] The visual recognition module is used to acquire product images of the target batch of products, process the product images based on a preset image measurement algorithm, and obtain the product information.

[0045] and / or;

[0046] The sample testing module is used to acquire sample testing data of the target batch of products and obtain product information based on the sample testing data.

[0047] In one embodiment, prior to the point difference module, the system further includes:

[0048] The parameter specification module is used to obtain the first parameter specification of the point parameters;

[0049] The specification adjustment module is used to adjust the product parameters to conform to the first parameter specification.

[0050] In one embodiment, the point parameters include direction axis setting parameters, and the device further includes:

[0051] The address mapping module is used to store the direction axis setting parameters corresponding to different directions to the associated direction axis coordinate addresses according to a preset mapping relationship;

[0052] The address parameter adjustment module is used to add the relative difference between the point and the direction axis to the direction axis coordinate address when adjusting the point parameter.

[0053] Thirdly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to implement the steps of a cutting and marking method as described in any embodiment of the first aspect.

[0054] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, implements the steps of a machine-cutting and marking method as described in any embodiment of the first aspect.

[0055] Fifthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements the steps of a cutting and marking method as described in any embodiment of the first aspect.

[0056] The aforementioned cutting and marking method, apparatus, computer equipment, storage medium, and computer program product, derived from the technical features in the proprietary patent, can achieve the following beneficial effects to address the technical problems in the background art:

[0057] Before the production and testing of the target batch of new products, product information for the target batch is obtained. The specific positioning requirements of the target batch are determined by the product parameters contained in the product information. Since the current parameters of the testing equipment are based on those of the previous historical batch, the historical product parameters of the previous batch, as well as the current positioning parameters of the target equipment, can be obtained. Using the historical and target product parameters, the positioning difference between the two can be calculated. This difference is then added to the historical positioning parameters to ultimately adjust the target equipment to the appropriate positioning for the next batch of products, achieving machine switching and marking. In implementation, this method utilizes the parameter difference between two batches of products to determine the parameters that need to be adjusted for each positioning point. This differs from existing technologies that require resetting the target equipment and manually marking each point from beginning to end, thus improving the efficiency of machine switching and marking and reducing unnecessary processes required for the target equipment. Attached Figure Description

[0058] Figure 1 This is a schematic diagram of the first process of a cutting and marking method in one embodiment;

[0059] Figure 2 This is a schematic diagram of the second process of a cutting machine marking method in another embodiment;

[0060] Figure 3 This is a schematic diagram of the third process of a cutting and marking method in another embodiment;

[0061] Figure 4 This is a schematic diagram of the fourth process of a cutting and marking method in another embodiment;

[0062] Figure 5 This is a schematic diagram of the fifth process of a cutting and marking method in another embodiment;

[0063] Figure 6 This is a schematic diagram of the sixth process of a cutting and marking method in another embodiment;

[0064] Figure 7 This is a structural block diagram of a cutting machine marking device in one embodiment;

[0065] Figure 8 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0066] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0067] In related technologies, some solutions already exist to address the need to reset the positioning points when changing product batches. Some solutions use robotic arms or manual control for point adjustments, but these methods suffer from inconsistencies in operation and low adjustment precision, failing to meet the requirements of modern, high-efficiency production. For example, in various testing stages of display panel production, new products from different manufacturers, batches, and models are often encountered. The positions of the new panels and FPCs (flexible printed circuit boards) used in production often change, necessitating on-site resetting of equipment positioning points before product testing. Traditionally, this involves manually carrying the display panels from the front to the back of the equipment for positioning (because the sizes and dimensions of different product models vary, the coordinates of each gripping / fixing / detection position need to be reset; otherwise, the equipment may alarm or fall during transport). This is labor-intensive and time-consuming, averaging 4 hours per machine cut, with positioning taking up more than half of the total time, significantly reducing customer production efficiency.

[0068] Some solutions use image recognition technology to automatically identify products and adjust their locations, but these methods require taking pictures or scanning the products, have insufficient recognition rates, and require additional image processing hardware and software support, resulting in higher costs.

[0069] Based on this, this application provides a method for marking points on a cutting machine.

[0070] In one embodiment, such as Figure 1 As shown, a method for switching and marking points is provided. This embodiment illustrates the application of this method to a terminal. It is understood that this method can also be applied to a server, and further to a system including both a terminal and a server, and is implemented through interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0071] Step 102: Obtain product information for the target batch of products, including product parameters.

[0072] Product information can refer to information used to describe product specifications and other identification information, such as product number, product size, product batch, etc. In order to meet the parameter calculation requirements of the cutting machine marking in this solution, the product information must include at least product parameters, which may include the product's length and width dimensions, product thickness, etc.

[0073] For example, when a new batch of products needs to be produced or tested, the terminal can first obtain the product information of the target batch of products, and then understand the product parameters that the target batch of products needs to follow during processing by reading the product information.

[0074] Step 104: Obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to operate the sample product at each location.

[0075] Point parameters refer to the parameters used to control the target equipment during the processing or testing of products. Examples include the setting points of testing equipment used in a specific process, and the specific processing operations of that testing equipment. In automated equipment, multiple fixed points involved in product conveying or testing, such as product loading / unloading gripping points, product fixed positioning points, and product testing points, all require marking.

[0076] For example, after obtaining the product parameters of the target batch of products, in order to adjust the equipment position to conform to the current product parameters, the terminal can obtain the historical product parameters and historical position parameters used by the target equipment when processing the previous historical batch of products. In other embodiments, the historical product parameters are not limited to the parameters of the previous historical batch of products of the current target batch of products, but can also be the parameters of the first batch of products detected by the testing equipment or the parameters of a certain basic batch of products set by the system, so that this specific batch of products can be used as a sample product for unified reference.

[0077] Step 106: Obtain the relative difference between the locations based on the product parameters and the historical product parameters.

[0078] For example, after the terminal obtains product parameters and historical product parameters, it can calculate the coordinate differences between test points of the same process in the product parameters and historical product parameters one by one, thereby obtaining the relative differences between the points. In the calculation, the products of the target batch and the historical batch can be placed in the same coordinate system. Taking two test points of the same process as the calculation objects, a set of parameters is finally obtained. For example, point A {X: -5; Y: 2; Z: 1} can represent that the difference between point A corresponding to process A in the target batch and the historical batch is -5 units in the X-axis direction, 2 units in the Y-axis direction, and 1 unit in the Z-axis direction.

[0079] Step 108: Adjust the location parameters of the target device to meet the location operation requirements of the target batch of products based on the relative difference of the locations.

[0080] Among them, equipment switching parameters can refer to the parameters used to control the switching of the test equipment from the initial state to the test state of the target batch of products. That is, adjusting the parameters of each point in the entire system of the automated test equipment. It can include the specific parameters that the test equipment needs to follow during switching, such as the parameters of multiple points such as the loading and unloading gripping position, the product fixing position, and the product testing position.

[0081] For example, after obtaining the relative difference between locations, the terminal can determine the specific values ​​that the target device needs to change during the handover based on the relative difference. Thus, the terminal can generate device handover parameters according to preset instruction specifications.

[0082] In this way, the terminal can adjust the point parameters of the target device to meet the requirements of the processing point / test point of the target batch of products by switching device parameters.

[0083] The above-described cutting and marking method can achieve the following beneficial effects in solving the technical problems mentioned in the background art:

[0084] Before the production and testing of the target batch of new products, product information for the target batch is obtained. The specific positioning requirements of the target batch are determined by the product parameters contained in the product information. Since the current parameters of the testing equipment are based on those of the previous historical batch, the historical product parameters of the previous batch and the current historical position parameters of the target equipment can be obtained. Using the historical and target product parameters, the position difference between them can be calculated. This position difference is then added to the historical position parameters to ultimately adjust the target equipment to the appropriate positions for the next batch of products, achieving machine switching and marking. In implementation, this method utilizes the parameter differences between two batches of products to determine the parameters that need to be adjusted for each position. This differs from existing technologies that require resetting the target equipment and manually marking each position from beginning to end, thus improving the efficiency of machine switching and marking and reducing unnecessary processes required for the target equipment.

[0085] In one embodiment, such as Figure 2 As shown, step 108 includes:

[0086] Step 202: Based on the relative difference between the points and the sample point parameters, obtain the target point parameters for the target batch of products.

[0087] For example, after obtaining the point difference and historical point parameters, the terminal can obtain the target point parameters that need to be set when the target equipment is used to process the target batch of products, based on the mathematical relationship between the parameters.

[0088] Step 204: Add the target location parameters to the product parameter library using the product information as an identifier. The product parameter library is used to store the location parameters of the product, or to store the difference between the location parameters of the relevant batch of products and historical products. When switching the product to be tested, all location data can be generated with one click based on the parameter difference.

[0089] The product parameter library can refer to a database used to store product parameters of different historical batches of products. In the application, each set of product parameters can be configured with corresponding index information to enable retrieval within the database.

[0090] For example, after obtaining the target location parameters, the terminal can use product information as an identifier, i.e., index information, to add the target location parameters to the product parameter library.

[0091] In this embodiment, a product parameter library including different historical batches of products is established on the terminal, which facilitates the direct recall of products from historical batches when processing products of the same specifications, thus helping to improve the efficiency of machine switching and marking.

[0092] In one embodiment, such as Figure 3As shown, after step 102, the following steps are also included:

[0093] Step 302: Extract the target product identifier of the target batch of products, and search the product parameter database based on the target product identifier.

[0094] Product information may also include product identification.

[0095] For example, after obtaining product information of the target batch of products, the terminal extracts the target product identifier from the product information and searches for it in the product parameter database.

[0096] Step 304: If the product parameter library contains a target location parameter or a relative difference value of the target product that matches the target product identifier, then the target device is adjusted by calling the target location parameter or the relative difference value of the target product.

[0097] For example, during the search, if the terminal finds a target location parameter in the product parameter library that matches the target product identifier, it can directly call the target location parameter to control the target device to adjust to the location operation requirements that meet the target product.

[0098] In this embodiment, searching the product parameter library facilitates the direct retrieval of pre-stored target point parameters, reducing calculation steps between different batches of products and thus improving the efficiency of machine switching and point marking. In other embodiments, when the product parameter library stores the point parameter differences between relevant batches of products and historical products, searching the product parameter library allows direct retrieval of pre-stored point parameter differences, enabling one-click generation of all point data based on these differences. These point differences can be the point parameters of the first batch of products detected by the testing equipment or the difference between the point parameters of a certain basic batch of products set by the system and the target batch of products.

[0099] In one embodiment, such as Figure 4 As shown, step 102 includes:

[0100] Step 402: Obtain the product data imported from the outside, and obtain the product information based on the extraction of the product data.

[0101] Product data can refer to data associated with the target batch of products, such as product data sheets and product manuals.

[0102] For example, the terminal can obtain product data imported from outside, and obtain product information by identifying and extracting specific terms from the product data.

[0103] And / or step 404: Obtain product images of the target batch of products, process the product images based on a preset image measurement algorithm, and obtain the product information.

[0104] Among them, the product images can be images of the target batch of products that have been taken in advance on a specific shooting platform. Since the target batch of products can be referenced by shooting with a specific shooting platform, the accuracy of the measurement can be guaranteed to a certain extent.

[0105] For example, the terminal can acquire product images of the target batch of products and process the product images using a preset image measurement algorithm to obtain product information.

[0106] And / or step 406: Obtain sample test data of the target batch of products, and obtain the product information based on the sample test data.

[0107] For example, the terminal can directly obtain sample test data of the target batch of products and obtain product information through the sample test data.

[0108] In this embodiment, the terminal can select multiple methods to obtain product information, thereby improving the flexibility of product information acquisition.

[0109] In one embodiment, such as Figure 5 As shown, step 106 includes:

[0110] Step 502: Obtain the first parameter specification of the point parameters.

[0111] Among them, parameter specifications can refer to data that specifies the format of parameters, such as the data encoding used by the parameters and the precision of the parameters' digits.

[0112] For example, the terminal can obtain the first parameter specification of the location parameters by identification.

[0113] Step 504: Adjust the product parameters to conform to the first parameter specification.

[0114] For example, the terminal can adjust the product parameters to conform to the format of the first parameter specification of the point parameters.

[0115] In this embodiment, the parameter format specification adjustment steps are set. By adjusting the format specification, the terminal can process product parameters from different sources, which helps to improve the flexibility of the machine cutting and marking method.

[0116] In one embodiment, such as Figure 6 As shown, the method further includes:

[0117] Step 602: Store the direction axis setting parameters corresponding to different directions to the associated direction axis coordinate address according to the preset mapping relationship.

[0118] Among them, the point parameters may include the direction axis setting parameters. The direction axis can refer to the direction axis that matches different processing directions on the test equipment. It can be an orthogonal direction axis or a direction axis with a special included angle.

[0119] For example, the terminal can pre-create directional axis coordinate addresses corresponding to the number of directional axes available in the testing equipment, and establish a corresponding mapping relationship. Subsequently, the terminal can store the directional axis setting parameters corresponding to different directions into the associated directional axis coordinate addresses according to the preset mapping relationship.

[0120] Step 604: When adjusting the point parameters, add the relative difference between the point and the direction axis to the direction axis coordinate address.

[0121] For example, when adjusting the point parameters, the terminal can add the relative difference between the points corresponding to the direction axis to the direction axis coordinate address, thereby recording the coordinate adjustment process through a specific storage address.

[0122] In this embodiment, the address storage space corresponding to the direction axis is created through a preset mapping relationship, which helps to improve the stability of device control.

[0123] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0124] Based on the same inventive concept, this application also provides a cutting machine marking device for implementing the cutting machine marking method described above. The solution provided by this device is similar to the solution described in the above method. Therefore, the specific limitations of one or more embodiments of the cutting machine marking device provided below can be found in the limitations of the cutting machine marking method above, and will not be repeated here.

[0125] In one embodiment, such as Figure 7 As shown, a cutting machine marking device is provided, comprising:

[0126] The product information module is used to obtain product information for the target batch of products, including product parameters.

[0127] The historical parameter module is used to obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to perform operations on the sample product at various locations.

[0128] The location difference module is used to obtain the relative difference between locations based on the product parameters and the sample product parameters.

[0129] The machine-marking module is used to adjust the point parameters of the target equipment to meet the point operation requirements of the target batch of products based on the relative difference of the points.

[0130] In one embodiment, after the cutting and marking module, the following is also included:

[0131] The current batch parameter module is used to obtain the target point parameters of the target batch of products based on the relative difference between the points and the sample point parameters.

[0132] The product parameter library module is used to add the target point parameters to the product parameter library using the product information as an identifier. The product parameter library is used to store the point parameters of the product or to store the relative differences between the points, so that when switching the product to be tested, all point data can be generated with one click based on the sample point parameters and the relative differences between the points.

[0133] In one embodiment, the product information further includes a product identifier, and after the product information module, it further includes:

[0134] The identifier retrieval module is used to extract the target product identifier of the target batch of products and perform a retrieval in the product parameter database based on the target product identifier.

[0135] The parameter calling module is used to adjust the target device by calling the target point parameter or the relative difference of the point of the target product if there is a target point parameter or the relative difference of the point of the target product that matches the target product identifier in the product parameter library.

[0136] In one embodiment, the product information module includes:

[0137] The external import module is used to acquire the product data imported from external sources and to obtain the product information based on the extraction of the product data;

[0138] and / or;

[0139] The visual recognition module is used to acquire product images of the target batch of products, process the product images based on a preset image measurement algorithm, and obtain the product information.

[0140] and / or;

[0141] The sample testing module is used to acquire sample testing data of the target batch of products and obtain product information based on the sample testing data.

[0142] In one embodiment, prior to the point difference module, the system further includes:

[0143] The parameter specification module is used to obtain the first parameter specification of the point parameters;

[0144] The specification adjustment module is used to adjust the product parameters to conform to the first parameter specification.

[0145] In one embodiment, the point parameters include direction axis setting parameters, and the device further includes:

[0146] The address mapping module is used to store the direction axis setting parameters corresponding to different directions to the associated direction axis coordinate addresses according to a preset mapping relationship;

[0147] The address parameter adjustment module is used to add the relative difference between the point and the direction axis to the direction axis coordinate address when adjusting the point parameter.

[0148] The modules in the aforementioned cutting and marking device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the operations corresponding to each module.

[0149] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 8As shown, the computer device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The input / output interface is used for exchanging information between the processor and external devices. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a cutting and marking method. The display unit is used to form a visually visible image and can be a display screen, projection device, or virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0150] Those skilled in the art will understand that Figure 8 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0151] In one embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0152] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0153] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0154] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of related data must comply with the relevant laws, regulations and standards of the relevant countries and regions.

[0155] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0156] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0157] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for marking points on a cutting machine, characterized in that, The method includes: Obtain product information for the target batch of products, including product parameters; Obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to operate the sample product at each location. The relative difference between the locations is obtained based on the product parameters and the sample product parameters; Based on the relative difference between the points, the point parameters of the target equipment are adjusted to meet the point operation requirements of the target batch of products. After adjusting the location parameters of the target device to meet the location operation requirements of the target batch of products based on the relative difference of the locations, the method further includes: Based on the relative difference between the points and the sample point parameters, the target point parameters of the target batch of products are obtained. The target point parameters are added to the product parameter library using the product information as an identifier. The product parameter library is used to store the point parameters of the product or to store the relative differences between the points, so that when switching the product to be tested, all point data can be generated with one click based on the sample point parameters and the relative differences between the points. The product information also includes a product identifier. After obtaining the product information for the target batch, the following is also included: Extract the target product identifier of the target batch of products, and search the product parameter database based on the target product identifier; If the product parameter library contains a target location parameter or a relative difference value of the target product that matches the target product identifier, then the target device is adjusted by calling the target location parameter or the relative difference value of the target product. The point parameters include direction axis setting parameters, and the method further includes: The direction axis setting parameters corresponding to different directions are stored in the associated direction axis coordinate address according to a preset mapping relationship; When adjusting the point parameters, the relative difference between the point and the direction axis is added to the direction axis coordinate address.

2. The method according to claim 1, characterized in that, The product information obtained for the target batch of products includes: Obtain externally imported product data, and extract the product information based on the product data; and / or; The product images of the target batch of products are acquired, and the product images are processed based on a preset image measurement algorithm to obtain the product information; and / or; Obtain sample testing data of the target batch of products, and obtain product information based on the sample testing data.

3. The method according to claim 1, characterized in that, Before obtaining the relative difference between locations based on the product parameters and the sample product parameters, the method further includes: Obtain the first parameter specification of the point parameters; Adjust the product parameters to conform to the first parameter specification.

4. A marking device for a cutting machine, characterized in that, The device includes: The product information module is used to obtain product information for the target batch of products, including product parameters. The historical parameter module is used to obtain the sample product parameters and sample location parameters of the target device. The sample location parameters are used to control the target device to perform operations on the sample product at various locations. The location difference module is used to obtain the relative difference between locations based on the product parameters and the sample product parameters. The machine marking module is used to adjust the point parameters of the target equipment to meet the point operation requirements of the target batch of products based on the relative difference of the points. Following the cutting machine marking module, it also includes: The current batch parameter module is used to obtain the target point parameters of the target batch of products based on the relative difference between the points and the sample point parameters. The product parameter library module is used to add the target point parameters to the product parameter library using the product information as an identifier. The product parameter library is used to store the point parameters of the product or to store the relative difference of the points, so that when switching the product to be tested, all point data can be generated with one click based on the sample point parameters and the relative difference of the points. The product information also includes a product identifier, and after the product information module, it further includes: The identifier retrieval module is used to extract the target product identifier of the target batch of products and perform a retrieval in the product parameter database based on the target product identifier. The parameter calling module is used to call the target point parameter or the relative difference of the point of the target product to adjust the target device if there is a target point parameter or the relative difference of the point of the target product that matches the target product identifier in the product parameter library. The point parameters include direction axis setting parameters, and the device further includes: The address mapping module is used to store the direction axis setting parameters corresponding to different directions to the associated direction axis coordinate addresses according to a preset mapping relationship; The address parameter adjustment module is used to add the relative difference between the point and the direction axis to the direction axis coordinate address when adjusting the point parameter.

5. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 3.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 3.

7. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 3.

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