Microwave probe production section, welding, polishing special fixture and production method

Abstract

The application provides a special fixture for microwave probe production sectioning, welding and polishing and a production method, and belongs to the field of microwave technology, and comprises a base and a clamping unit arranged on the base, wherein the clamping unit comprises a sub-fixture, a cushion block and a pressing block; the sub-fixture is fixedly arranged on the base, and a microwave probe mounting groove is arranged on the sub-fixture; a positioning groove for positioning a coaxial cable of the microwave probe is arranged on the cushion block, and the depth of the positioning groove is smaller than the diameter of the coaxial cable; and the pressing block is fixedly arranged on the cushion block and used for pressing the coaxial cable and exposing a processing area of the coaxial cable. The special fixture for microwave probe production sectioning, welding and polishing is used for mounting the microwave probe on the special fixture when the microwave probe is produced, and the sectioning of the coaxial cable, the welding of the probe tip and the polishing process are carried out in batches and automatically with the aid of existing equipment, so that the production efficiency is improved, the product consistency and stability are higher than those of manual processing, and the product quality is improved.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of tooling, and particularly relates to a special fixture for cutting, welding and polishing of microwave probes and a production method. BACKGROUND

[0002] Microwave probes play an important role in each step of the life cycle of microwave chip products. At present, the main microwave probe production technology is mastered by foreign brands, which belongs to non-open content. Domestic semiconductor chip research and development units rely on imports for the microwave probes used in production and research. Compared with foreign countries, the domestic microwave probe field is in the initial stage of catching up. At present, the upper limit of the test frequency of domestic probe products is still 67GHz, and there is no mature production line, which cannot match the production capacity and product stability of foreign countries.

[0003] At present, the production process of microwave probes is manual processing. The coaxial cable on the microwave probe is cut, and the probe tip is welded and polished, which takes a long time and has low production capacity. Even skilled workers need more than one hour, and the product quality is unstable. SUMMARY

[0004] The embodiment of the application provides a special fixture for cutting, welding and polishing of microwave probes and a production method. The special fixture is adapted to the microwave probe, so as to facilitate batch and automatic production, and solves the problems of low production capacity and unstable quality of manual processing of microwave probes.

[0005] In a first aspect, to achieve the above object, the technical scheme adopted by the application is: a special fixture for cutting, welding and polishing of microwave probes is provided, comprising: a base and a clamping unit arranged on the base, the clamping unit comprising a sub-clamp, a pad and a pressing block; the sub-clamp is fixedly arranged on the base, and a microwave probe mounting groove is arranged on the sub-clamp; a positioning groove for positioning a coaxial cable of the microwave probe is arranged on the pad, and the depth of the positioning groove is less than the diameter of the coaxial cable; the pressing block is fixedly arranged on the pad and is used for pressing the coaxial cable and exposing a processing area of the coaxial cable.

[0006] In an implementable manner in combination with the first aspect, a limiting groove corresponding to the positioning groove is arranged on the lower surface of the pressing block, and the limiting groove is pressed on the coaxial cable.

[0007] In an implementable manner in combination with the first aspect, a heating rod is arranged in the pad.

[0008] In combination with the first aspect, in one feasible manner, the pad block is divided into an upper pad block and a lower pad block, the lower surface of the upper pad block is provided with an upper placement groove, and the upper surface of the lower pad block is provided with a lower placement groove corresponding to the upper placement groove, and the upper placement groove and the lower placement groove together form a placement hole for accommodating the heating rod.

[0009] In combination with the first aspect, in one achievable manner, a plurality of groups of the clamping units are arranged side by side on the base, and each of the clamping units is provided with a plurality of the microwave probe mounting grooves side by side.

[0010] In combination with the first aspect, in one practicable manner, it further includes a handle, wherein the handle is fixed on the base.

[0011] In a second aspect, an embodiment of the present invention further provides a method for producing a microwave probe, wherein the microwave probe is used to produce a special fixture for cutting, welding, and polishing, and the method comprises:

[0012] Fix the probe body on the microwave probe installation slot of the sub-fixture, and ensure that the coaxial cable is clamped horizontally in the positioning slot on the pad along its direction, and press the coaxial cable with a pressing block;

[0013] The fixture with the probe body fixed is sent to the machining center as a whole, and the coaxial cable pressed on the pad is cut along the axial direction to cut out the welding plane;

[0014] The fixture with the cut coaxial cable fixed thereon is sent as a whole to the placement machine, and the probe tip is placed on the welding plane;

[0015] Move the mounted microwave probe and fixture to the cutting machine as a whole, and cut off the redundant auxiliary part on the probe tip;

[0016] The sub-fixture together with the microwave probe is removed from the base and sent to a polishing machine to polish the working surface of the probe tip.

[0017] In combination with the second aspect, in one achievable manner, during the sectioning process, the rotation speed of the machining center is 5000 r / min and the feed speed is 0.1 mm / s.

[0018] In conjunction with the second aspect, in one achievable manner, during the mounting process, the heating temperature is controlled at 100° C. to 300° C.

[0019] In conjunction with the second aspect, in one practicable manner, during the polishing process, a sub-fixture equipped with a microwave probe is assembled onto the first tooling to polish the first working surface of the probe tip;

[0020] The sub-fixture is removed from the first fixture, assembled on the second fixture, and the second working surface of the probe tip is polished.

[0021] The special fixture and production method for cutting, welding and polishing of microwave probes provided by the present invention have the following beneficial effects compared with the existing technology: when using this set of special fixtures, the microwave probes are installed on the special fixtures during the production of microwave probes, and the cutting, probe tip welding and polishing processes of the coaxial cable are carried out in batches and automatically with the help of existing equipment. During the process of going through different processing steps, the microwave probes are always fixed on the sub-fixtures, and there is no need to remove the microwave probes, which reduces the intermediate links. This not only improves production efficiency, but also makes the product consistency and stability higher than manual processing, thereby improving product quality.

[0022] By using a special fixture, the present invention can use existing equipment such as machining centers, robots, and placement machines to achieve batch processing of coaxial cable cutting, probe tip welding, and grinding and polishing. It is suitable for automated production equipment and can effectively improve production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 Schematic diagram of the three-dimensional structure of the special fixture for cutting, welding and polishing the microwave probe provided in the embodiment of the present invention Figure 1 ;

[0024] Figure 2 Schematic diagram of the three-dimensional structure of the special fixture for cutting, welding and polishing the microwave probe provided in the embodiment of the present invention Figure 2 ;

[0025] Figure 3 A schematic diagram of the main structure of a special fixture for cutting, welding and polishing microwave probes provided in an embodiment of the present invention;

[0026] Figure 4 Schematic diagram of the three-dimensional structure of the sub-clamp provided in an embodiment of the present invention Figure 1 ;

[0027] Figure 5 Schematic diagram of the three-dimensional structure of the sub-clamp used in the embodiment of the present invention Figure 2 ;

[0028] Figure 6 Schematic diagram of the three-dimensional structure of the sub-clamp used in the embodiment of the present invention Figure 3 ;

[0029] Figure 7 is a schematic diagram of the three-dimensional structure of the sub-fixture equipped with a microwave probe;

[0030] Figure 8 A schematic diagram of the three-dimensional structure of a cushion block provided in an embodiment of the present invention;

[0031] Figure 9 A schematic diagram of the three-dimensional structure of an upper pad provided in an embodiment of the present invention (top view);

[0032] Figure 10 A schematic diagram of the three-dimensional structure of an upper spacer provided in an embodiment of the present invention (viewed from above);

[0033] Figure 11 A schematic diagram of the three-dimensional structure of a lower pad provided in an embodiment of the present invention (top view);

[0034] Figure 12 A schematic diagram of the three-dimensional structure of a lower pad provided in an embodiment of the present invention (viewed from above);

[0035] Figure 13 A schematic diagram of the three-dimensional structure of a pressing block provided in an embodiment of the present invention (viewed from above);

[0036] Figure 14 A schematic diagram of the three-dimensional structure of a first tool provided in an embodiment of the present invention;

[0037] Figure 15 A schematic side view of the first tooling provided in an embodiment of the present invention;

[0038] Figure 16 A schematic diagram of the working state of the microwave probe and the sub-fixture being installed on the first fixture;

[0039] Figure 17 A schematic diagram of the three-dimensional structure of the second tooling provided in an embodiment of the present invention;

[0040] Figure 18 A schematic side structural diagram of a second tool provided in an embodiment of the present invention;

[0041] Figure 19 Schematic diagram of the working state of the microwave probe and the sub-fixture installed on the second fixture;

[0042] Figure 20 Schematic diagram of the structure of the probe tip that needs to be welded in the present invention Figure 1 ;

[0043] Figure 21 Schematic diagram of the structure of the probe tip that needs to be welded in the present invention Figure 2 ;

[0044] Figure 22 for Figure 21 A schematic side view of the structure of the probe tip is shown;

[0045] Description of reference numerals:

[0046] 1. Base; 2. Pad; 21. Upper pad; 211. Positioning slot; 212. Upper placement slot; 22. Lower pad; 221. Lower placement slot; 23. Placement hole; 3. Sub-clamp; 31. Microwave probe mounting slot; 4. Press block; 41. Limiting slot; 5. Handle; 6. First tooling; 61. First limiting slope; 7. Second tooling; 71. Second limiting slope; 8. Microwave probe; 81. Coaxial cable; 82. Probe tip; 83. Welding plane; 84. First working surface; 85. Second working surface; 9. Auxiliary part. DETAILED DESCRIPTION

[0047] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0048] Please also refer to Figures 1 to 20 The special fixture for cutting, welding, and polishing microwave probes provided by the present invention is now described. The fixture comprises a base 1 and a clamping unit disposed on the base 1, the clamping unit comprising a sub-clamp 3, a cushion block 2, and a pressure block 4. The sub-clamp 3 is fixed to the base 1 and is provided with a microwave probe mounting groove 31. The cushion block 2 is provided with a positioning groove 211 for positioning the coaxial cable 81 of the microwave probe 8. The depth of the positioning groove 211 is less than the diameter of the coaxial cable 81. The pressure block 4 is fixed to the cushion block 2 and is used to compress the coaxial cable 81, exposing the processing area of ​​the coaxial cable 81.

[0049] The special fixture for cutting, welding and polishing the microwave probe 8 provided by the present invention has the following beneficial effects compared with the prior art: when using this set of special fixtures, when producing the microwave probe 8, the microwave probe 8 is installed on the special fixture, and the cutting of the coaxial cable 81, welding of the probe tip 82 and polishing processes are carried out in batches and automatically with the help of existing equipment. During the process of going through different processing steps, the microwave probe 8 is always fixed on the sub-fixture 3, and there is no need to remove the microwave probe 8, which reduces the intermediate links, not only improving production efficiency, but also making the product consistency and stability higher than manual processing, thereby improving product quality.

[0050] With the help of the special fixture adopted in the present invention, existing equipment such as machining centers, robots, and placement machines can be used to achieve batch processing of coaxial cable 81 cutting, probe tip 82 welding, and grinding and polishing. It is suitable for automated production equipment and can effectively improve production efficiency.

[0051] The upper surface of the base 1 is horizontal and is provided with threaded and dowel holes for positioning and securing the sub-clamp 3 and pad 2. The sub-clamp 3 and pad 2 also have corresponding threaded and dowel holes. The sub-clamp 3, pad 2, and pressure block 4 are all detachably connected using bolts. Due to the high precision required and to minimize machining errors caused by material deformation, the base 1 is made of steel.

[0052] The spacer 2 is made of ceramic, which has stable performance and is not prone to thermal deformation.

[0053] Since there are many types of microwave probes 8 and their structures are also different, the sub-clamp 3 provided by the present invention is mainly aimed at the positioning of the production of 40A series microwave probes 8. The sub-clamp 3 is provided with multiple microwave probe mounting grooves 31 arranged side by side to ensure that the coaxial cable 81 extends along the direction of the finished product and is horizontally inserted into the positioning groove 211 to ensure that the coaxial cable 81 is parallel to the base 1. In addition, the probe tip 82 is parallel to the base 1 to avoid deformation of the coaxial cable 81. The sub-clamp 3 is made of steel to reduce stress and deformation. The production fixtures of other types of microwave probes 8 can adopt the concept of the special fixture provided by the present invention and be improved according to the structure of the microwave probe 8.

[0054] In some embodiments, as Figures 1 to 3 、 Figures 8 to 13 As shown, the lower surface of the pressing block 4 is provided with a limiting groove 41 corresponding to the positioning groove 211, and the limiting groove 41 is pressed tightly on the coaxial cable 81. The positioning groove 211 and the limiting groove 41 are connected to form a limiting hole for limiting the coaxial cable 81, so that the coaxial cable 81 can be pressed tightly during cutting.

[0055] Among them, the depth of the positioning groove 211 does not exceed the radius of the coaxial cable 81, so that the cross-sectional surface of the coaxial cable 81 is exposed outside the positioning groove 211. The positioning groove 211 and the limit groove 41 are preferably circular structures to adapt to the external dimensions of the coaxial cable 81 to prevent the risk of displacement of the coaxial cable 81.

[0056] For example, a semicircular groove with a diameter of 0.86 mm is provided on the upper surface of the spacer 2 to accommodate the coaxial cable 81 to be cut. A semicircular groove with a diameter of 0.86 mm is provided on the lower surface of the pressing block 4 to assist in fixing the coaxial cable 81.

[0057] In some embodiments, as Figures 1 to 3 、 Figures 8 to 12 As shown, a heating rod is provided in the pad 2. When the probe tip 82 is mounted, it needs to be heated to a certain temperature to ensure the welding effect.

[0058] In some embodiments, as Figures 1 to 3 、 Figures 8 to 12As shown, the pad 2 is divided into an upper pad 21 and a lower pad 22. The lower surface of the upper pad 21 is provided with an upper placement groove 212, and the upper surface of the lower pad 22 is provided with a lower placement groove 221 corresponding to the upper placement groove 212. The upper placement groove 212 and the lower placement groove 221 together form a placement hole 23 for accommodating the heating rod.

[0059] For example, the aperture of the placement hole 23 is 8.1 mm to accommodate the placement of the heating rod.

[0060] In some embodiments, as Figures 1 to 3 As shown, a plurality of groups of clamping units are arranged side by side on the base 1 , and each clamping unit is provided with a plurality of microwave probe mounting grooves 31 side by side.

[0061] In some embodiments, as Figures 1 to 3 As shown, the clamp further comprises a handle 5, which is fixed on the base 1 to facilitate the transportation and placement of the entire clamp. In this embodiment, two handles 5 are fixed on opposite sides of the base 1 using bolts.

[0062] After assembly, the special fixture is as follows: Figures 1 to 3 As shown, the heating rod is installed in the installation hole 23. Since the heating rod, thermocouple and temperature controller are all accessories that can be purchased on the market, and the heating system they form is relatively simple, they are not considered as invention points and are not listed in this article.

[0063] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0064] Based on the same inventive concept, the present embodiment further provides a method for producing a microwave probe 8, wherein the microwave probe 8 is used to produce a special fixture for cutting, welding, and polishing. The method comprises:

[0065] Step 1: Fix the probe body to the microwave probe mounting slot 31 of the sub-clamp 3, and ensure that the coaxial cable 81 is clamped horizontally in the positioning slot 211 on the pad 2 along its direction, and press the coaxial cable 81 with the pressing block 4 (see Figures 1 to 3 、 Figure 7 shown);

[0066] Step 2: Send the fixture with the probe body fixed to the machining center as a whole, cut the coaxial cable 81 pressed on the pad 2 along the axial direction, and cut out the welding plane 83 ( Figure 3 The direction of the arrow is the cutting direction);

[0067] Step 3: Send the fixture with the cut coaxial cable 81 fixed to the placement machine, and mount the probe tip 82 on the welding plane 83;

[0068] Step 4: Move the mounted microwave probe 8 and the fixture to a cutting machine and cut off the redundant auxiliary portion 9 (such as Figure 20 The midpoint line c is a cutting line, and the probe tip 82 is fixed on the coaxial cable 81);

[0069] Step 5: Remove the sub-fixture 3 together with the microwave probe 8 from the base 1 and place them on a polishing machine to polish the working surface of the probe tip 82 .

[0070] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0071] During the cutting process, the rotation speed of the machining center is 5000r / min, the feed speed is 0.1mm / s, and the feed is moved from one end of the coaxial cable 81 to the other end, so that the upper part of the coaxial cable 81 can be cut off. Figure 3 The arrow in the middle shows the feed direction.

[0072] During the placement process, the entire fixture, after sectioning the coaxial cable 81, is placed on the workbench of a precision placement machine (with a travel range of 150 mm x 100 mm and a heated tip). Solder paste is applied using the dip process, and the placement program is edited for placement. During placement, the fixture heating auxiliary temperature is set to 100°C to 300°C (e.g., 120°C, 200°C, or 250°C). After soldering the probe tip 82, the entire fixture is moved to a laser cutting machine for cutting. The yellow arrow indicates the laser processing direction.

[0073] During the polishing process, the sub-fixture 3 equipped with the microwave probe 8 is assembled on the first fixture 6, and the first working surface 84 (such as Figures 14 to 16 Remove the sub-fixture 3 from the first fixture 6 and assemble it onto the second fixture 7, polishing the second working surface 85 of the probe tip 82 (as shown); Figures 17 to 19 ). Among them, see Figures 20 to 21 In the figure, the first working surface 84 is defined as the upper surface of the probe tip 82, and the second working surface 85 is defined as the lower surface of the probe tip. A first fixture 6 is used to create a first chamfer on the first working surface 84 of the probe tip. A sub-fixture is fixed to the second fixture 7 to create a second chamfer at the tip of the second working surface 85 of the probe tip. The first chamfer is aligned with the inclination angle of the first fixture, and the second chamfer is aligned with the inclination angle of the second fixture. The sub-fixture, which connects to the probe tip, does not need to be disassembled and reassembled when polishing different inclined surfaces. This avoids assembly errors and manual errors during disassembly and assembly, ensuring the quality of microwave probe processing.

[0074] The purpose of designing the first tooling 6 and the second tooling 7 is to: during the polishing process, there is no need to remove the microwave probe 8 from the sub-clamp 3, to ensure that the processing position of the probe tip 82 in each process does not change, to reduce the assembly error and the error of the tooling itself generated during the disassembly and reinstallation of the microwave probe 8, and the cumulative error caused by the polishing of the microwave probe 8. At the same time, it also reduces the additional working hours in the intermediate links of assembly and disassembly; the structures of the first tooling 6 and the second tooling 7 are designed according to the structural dimensions of the produced microwave probe 8 and the position of the working surface that needs to be polished.

[0075] In this embodiment, the first tool 6 has a first limiting inclined surface 61 (eg, Figure 15 As shown in the figure (a), the sub-clamp 3 is fixed on the first limiting inclined surface 61 by bolts, and the effect after assembly is as follows Figure 16 As shown, the assembly is then mounted on a polishing machine or a grinding machine, and the tool is fed 0.15 mm after contact to perform a first chamfering process on the first working surface 84 of the probe tip 82. The angle of the first chamfer is 140°, forming the long side a (as shown in FIG. Figures 20 to 22 shown).

[0076] The second fixture 7 has a second limiting inclined surface 71 (eg, Figure 18 As shown in the middle angle b), the sub-clamp 3 is fixed on the second limiting inclined surface 71 by bolts, and the effect after assembly is as follows Figure 19 As shown, the assembly is then mounted on a polishing machine or a grinding machine, and the tool is fed 0.05 mm after contact to perform a second chamfering of the second working surface 85 of the probe tip 82. The second chamfer is 145°, and the width of the second chamfer is smaller than the width of the first chamfer, forming a short side b (as shown in FIG. Figures 20 to 22 After completion, the microwave probe 8 can be removed from the sub-clamp 3.

[0077] By using this set of special fixtures, the coaxial cable 81 cutting, probe tip 82 welding and polishing processes in the production of microwave probes 8 can be mass-produced and automated with the help of existing equipment, thereby improving production efficiency. At the same time, the product consistency and stability are also higher than those of manual processing.

[0078] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A method for producing a microwave probe, using a microwave probe to produce a special fixture for cutting, welding, and polishing, characterized in that: The method comprises: Fix the probe body on the microwave probe mounting groove (31) of the sub-clamp (3), and ensure that the coaxial cable (81) is clamped horizontally along its direction in the positioning groove (211) on the pad (2), and the coaxial cable (81) is pressed tightly with the pressing block (4); The fixture with the probe body fixed thereon is sent as a whole to a machining center, and the coaxial cable (81) pressed against the pad (2) is cut along the axial direction to obtain a welding plane (83); The fixture with the cut coaxial cable (81) fixed thereon is sent as a whole to a placement machine, and the probe tip (82) is placed on the welding plane (83); The mounted microwave probe (8) and the fixture are moved as a whole to a cutting machine, and the redundant auxiliary portion (9) on the probe tip (82) is cut off; The sub-clamp (3) together with the microwave probe (8) is removed from the base (1) and sent to a polishing machine to polish the working surface of the probe tip (82); The special fixture for cutting, welding and polishing microwave probe production comprises: a base (1) and a clamping unit arranged on the base (1), wherein the clamping unit comprises a sub-clamp (3), a cushion block (2) and a pressing block (4); the sub-clamp (3) is fixed on the base (1), and the sub-clamp (3) is provided with a microwave probe mounting groove (31); the cushion block (2) is provided with a positioning groove (211) for positioning a coaxial cable (81) of the microwave probe (8), and the depth of the positioning groove (211) is less than the diameter of the coaxial cable (81); the pressing block (4) is fixed on the cushion block (2) and is used to press the coaxial cable (81) and expose the processing area of ​​the coaxial cable (81).

2. The method for producing a microwave probe according to claim 1, wherein: The lower surface of the pressing block (4) is provided with a limiting groove (41) corresponding to the positioning groove (211), and the limiting groove (41) is pressed tightly on the coaxial cable (81).

3. The method for producing a microwave probe according to claim 1, wherein: A heating rod is provided in the cushion block (2).

4. The method for producing a microwave probe according to claim 3, wherein: The pad (2) is divided into an upper pad (21) and a lower pad (22); the lower surface of the upper pad (21) is provided with an upper placement groove (212); the upper surface of the lower pad (22) is provided with a lower placement groove (221) corresponding to the upper placement groove (212); the upper placement groove (212) and the lower placement groove (221) together form a placement hole (23) for accommodating the heating rod.

5. The method for producing a microwave probe according to claim 1, wherein: A plurality of groups of the clamping units are arranged side by side on the base (1), and each of the clamping units is provided with a plurality of the microwave probe mounting grooves (31) arranged side by side.

6. The method for producing a microwave probe according to claim 1, wherein: It also includes a handle (5), which is fixed on the base (1).

7. The method for producing a microwave probe according to claim 1, wherein: During the cutting process, the rotation speed of the machining center is 5000 r / min and the feed speed is 0.1 mm / s.

8. The method for producing a microwave probe according to claim 1, wherein: During the mounting process, the heating temperature is controlled at 100℃~300℃.

9. The method for producing a microwave probe according to claim 1, wherein: During the polishing process, the sub-fixture (3) equipped with the microwave probe (8) is assembled on the first fixture (6) to polish the first working surface (84) of the probe tip (82); The sub-fixture (3) is removed from the first fixture (6), assembled on the second fixture (7), and the second working surface (85) of the probe tip (82) is polished.

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