Processing method, system and medium for photovoltaic module deformation fault detection

Abstract

The application provides a kind of photovoltaic module deformation fault detection processing method, system and medium. The detection information of the detection point of the photovoltaic module to be detected is obtained;Wherein, detection point is respectively arranged at the position of four corners of the photovoltaic module to be detected;For each detection point, according to the detection information of the detection point and the reference information of the reference detection point, the deformation variable of the detection point is determined;Using grid algorithm, the photovoltaic module is grid processed, and based on the deformation variable of each detection point, the deformation detection processing is carried out on each grid vertex in the plane grid obtained after the grid processing of the photovoltaic module, to obtain the deformation variable of each grid vertex;The grid vertex with deformation variable greater than the preset deformation variable threshold is taken as the deformation fault point. Using the method provided by the application, the efficiency and accuracy of photovoltaic module deformation fault detection can be improved.

Description

Technical Field

[0001] This application relates to the field of data processing, and in particular to a processing method, system and medium for detecting deformation faults in photovoltaic modules. Background Technology

[0002] Photovoltaic modules are the core equipment in photovoltaic power plant power generation systems. When photovoltaic modules are deformed and fail, their stress concentration changes abruptly and their resistance to mechanical damage decreases. This makes it easy for problems such as cracks, microcracks, and fragments to occur inside the photovoltaic modules, thereby affecting the efficiency of light energy collection and conversion, and consequently affecting the system energy efficiency ratio of the photovoltaic power plant.

[0003] In the prior art, in order to solve this problem, a special mold is usually used to detect deformation failures of photovoltaic modules before they leave the factory. The photovoltaic module is visually inspected to see if it can fit completely with the special mold, so as to determine whether the curvature of the photovoltaic module meets the factory standard and prevent deformation failures of the photovoltaic module.

[0004] However, while existing deformation fault detection methods are convenient to use before leaving the factory, in actual application, the photovoltaic modules need to be removed from their mounting brackets before a special mold can be used for deformation fault detection. This is inconvenient and consumes a lot of manpower. At the same time, the deformation of photovoltaic modules during actual application is not easily detected by visual inspection. Relying on the experience of relevant personnel to judge whether a deformation fault has occurred makes the detection results inaccurate. Summary of the Invention

[0005] This application provides a method, system, and medium for detecting deformation faults in photovoltaic modules, in order to solve the problem of slow detection efficiency of photovoltaic module deformation in practical applications.

[0006] In a first aspect, this application provides a method for detecting deformation faults in photovoltaic modules, wherein the method is applied to a terminal; the method includes:

[0007] Obtain detection information of the detection points of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested;

[0008] For each detection point, the deformation of the detection point is determined based on the detection information of the detection point and the reference information of the reference detection point.

[0009] A grid algorithm is used to perform gridding on the photovoltaic module, and based on the deformation of each detection point, deformation detection is performed on each grid vertex in the planar grid obtained after the photovoltaic module is gridded to obtain the deformation of each grid vertex.

[0010] Mesh vertices with deformation values ​​greater than a preset deformation threshold are designated as deformation fault points.

[0011] In a preferred embodiment, determining the deformation of each detection point based on its detection information and reference information of a reference detection point includes:

[0012] For each detection point, the elevation difference between the elevation value in the detection information and the elevation value in the reference information is calculated, and the elevation difference is used as the deformation of the detection point.

[0013] In a preferred embodiment, the detection information further includes: distance value and angle; then, based on the deformation of each detection point, deformation detection processing is performed on each grid vertex in the planar grid obtained after the photovoltaic module is meshed, to obtain the deformation of each grid vertex, including:

[0014] For each detection point, the position coordinates of the detection point are determined based on the distance value and angle in the detection information of the detection point;

[0015] The planar mesh is mapped onto a coordinate system with the reference detection point as the origin, so as to obtain the position coordinates of each mesh vertex in the planar mesh;

[0016] For each of the grid vertices, a target detection point is determined that is in the same coordinate quadrant as the position coordinates of the grid vertex. The first distance and the second distance between the position coordinates of the grid vertex and the position coordinates of the target detection point and the origin are calculated respectively. The ratio of the first distance to the second distance and the deformation of the target detection point are multiplied, and the result of the multiplication is used as the deformation of the grid vertex.

[0017] In a preferred embodiment, the method further includes:

[0018] For each deformation fault point, determine the adjustment direction that matches the deformation of the deformation fault point;

[0019] Based on the adjustment direction, the deformation fault point is corrected and adjusted.

[0020] Secondly, this application provides a method for detecting deformation faults in photovoltaic modules, wherein the method is applied to a detection device; the method includes:

[0021] Obtain a detection processing request sent by a terminal associated with the detection device; the detection processing request includes: the identifier of the photovoltaic module to be detected;

[0022] Identify detection points associated with the identifier of the photovoltaic module to be tested; wherein the detection points are respectively set at the four corners of the photovoltaic module to be tested;

[0023] For each of the detection points, the following processing is performed:

[0024] The laser emitter in the detection device is triggered to emit a laser, so as to obtain the height value of the detection point according to the laser emission time and reception time; and the angle sensor in the detection device is triggered to collect the angle of the detection point relative to the reference detection point; and the electronic level in the detection device is triggered to collect the distance value of the detection point relative to the reference detection point.

[0025] Based on the height, angle, and distance values ​​of each detection point, detection information is generated and sent to the terminal for the terminal to perform deformation fault detection and processing.

[0026] Thirdly, this application provides a terminal, including:

[0027] The first transceiver module acquires detection information of the detection points of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested;

[0028] The determination module determines the deformation of each detection point based on the detection information of the detection point and the reference information of a reference detection point.

[0029] The first processing module is used to perform meshing processing on the photovoltaic module using a meshing algorithm, and to perform deformation detection processing on each grid vertex in the planar mesh obtained after the photovoltaic module meshing processing based on the deformation of each detection point, so as to obtain the deformation of each grid vertex.

[0030] The first processing module is also used to identify mesh vertices with deformation values ​​greater than a preset deformation threshold as deformation fault points.

[0031] Fourthly, this application provides a testing device, comprising:

[0032] The second transceiver module is used to acquire a detection processing request sent by a terminal associated with the detection device; the detection processing request includes: the identifier of the photovoltaic module to be detected;

[0033] The second determining module is used to determine the detection point and reference detection point associated with the identifier of the photovoltaic module to be tested; wherein the detection points are respectively set at the four corners of the photovoltaic module to be tested;

[0034] The second processing module is used to trigger the laser emitter in the detection device to emit a laser, so as to obtain the height value of the detection point according to the laser emission time and reception time; and to trigger the angle sensor in the detection device to collect the angle of the detection point relative to the reference detection point; and to trigger the electronic level in the detection device to collect the distance value of the detection point relative to the reference detection point.

[0035] The second processing module is further configured to generate and send detection information to the terminal based on the height, angle and distance values ​​of each detection point, so that the terminal can perform deformation fault detection processing.

[0036] Fifthly, this application provides a processing system for detecting deformation faults in photovoltaic modules, the system comprising: a terminal, and multiple detection devices associated with the terminal;

[0037] The testing equipment is used to perform testing on photovoltaic modules according to the method described in the second aspect, and upload the testing information generated by the testing to the terminal.

[0038] The terminal is used to perform deformation fault detection processing on the detection information according to the method described in the first aspect.

[0039] In a sixth aspect, this application provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the method described in the first aspect and / or the method described in the second aspect.

[0040] In a seventh aspect, this application provides a computer program product including computer instructions, wherein the computer instructions, when executed by a processor, implement the method as described in the first aspect, and / or implement the method as described in the second aspect.

[0041] This application provides a method, system, and medium for detecting deformation faults in photovoltaic modules. The method acquires detection information from detection points on the photovoltaic module to be tested; these detection points are located at the four corners of the photovoltaic module. For each detection point, the deformation amount is determined based on the detection information and reference information of a reference detection point. A grid algorithm is used to grid the photovoltaic module, and based on the deformation amount of each detection point, deformation detection is performed on each vertex of the resulting planar grid to obtain the deformation amount of each vertex. Grid vertices with deformation amounts greater than a preset deformation threshold are identified as deformation fault points.

[0042] Compared to existing technologies, this application places the testing equipment on the photovoltaic module and uploads the testing information to a terminal in real time, enabling the terminal to detect and handle deformation faults in the photovoltaic module. In practical scenarios, this eliminates the need to remove the photovoltaic module from its on-site support to detect its curvature. Furthermore, the testing equipment can accurately measure the deformation at various points on the photovoltaic module, which is more precise than the previous method of manually visually inspecting whether the photovoltaic module fits the special mold to determine if a deformation fault has occurred. In addition, deformation fault detection and handling can be performed accurately and quickly without removing the photovoltaic module, improving the accuracy of deformation fault detection and ensuring the working efficiency of the photovoltaic module, thereby guaranteeing the power generation efficiency of the photovoltaic power station and improving the system energy efficiency ratio of the photovoltaic power station. Attached Figure Description

[0043] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0044] Figure 1 The network architecture diagram provided for this application;

[0045] Figure 2 This is a flowchart illustrating an embodiment of the photovoltaic module deformation fault detection method provided in this application.

[0046] Figure 3 This is a schematic diagram showing the positional relationship between the testing equipment and the photovoltaic modules;

[0047] Figure 4 A flowchart illustrating Embodiment 2 of the photovoltaic module deformation fault detection processing method provided in this application;

[0048] Figure 5 A schematic diagram of the terminal visual interface provided in this application;

[0049] Figure 6 A flowchart illustrating Embodiment 3 of the photovoltaic module deformation fault detection processing method provided in this application;

[0050] Figure 7 This is a schematic diagram of the structure of the terminal embodiment provided in this application;

[0051] Figure 8 This is a schematic diagram of the structure of the testing equipment provided in Embodiment 1 of this application;

[0052] Figure 9 This is a schematic diagram of the structure of the testing equipment provided in Embodiment 2 of this application.

[0053] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0054] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0055] In related technologies, deformation faults in photovoltaic (PV) modules are measured using specialized molds. This involves placing the PV modules into a mold before they leave the factory and visually inspecting whether they fit perfectly. This visual inspection helps determine if deformation faults exist, aiming to extend the module's lifespan and improve the system's energy efficiency ratio. However, this technology only detects deformation faults before the modules leave the factory. Once the modules are in use, they must be removed from their supports for measurement. This process is inefficient and disrupts the module's ability to collect and convert light energy, impacting the system's energy efficiency ratio. Furthermore, the results obtained through visual inspection are dependent on the technicians' experience, leading to inaccurate results.

[0056] Based on the above-mentioned technical problems, the inventive concept of this application is: how to design a processing method that can improve both processing efficiency and accuracy of deformation fault handling.

[0057] Figure 1 The network architecture diagram provided for this application is referenced. Figure 1 The network architecture includes: detection equipment 10, photovoltaic modules 11, and terminals 12.

[0058] Specifically, the testing device 10 can be a rotary high-precision laser testing device, which is placed at any position on the photovoltaic module 11 for testing the photovoltaic module 11. The testing device 10 and the terminal 12 can communicate based on network communication technology. The testing device 10 can upload the collected testing data of the photovoltaic module to the terminal 12 in real time or periodically, so that the terminal 12 can perform deformation fault detection and processing.

[0059] Photovoltaic module 11 specifically refers to solar cell module, which is one of the important components of photovoltaic power generation system. It can collect light energy and convert light energy into electrical energy.

[0060] The terminal 12 can be a device with massive data storage and processing capabilities, such as a server or mobile phone. Each terminal can be connected to multiple detection devices 10 and can perform parallel detection and processing on the detection information uploaded by multiple detection devices. In addition, the terminal 12 has a visual interface to display the detected deformation fault feedback and the corresponding handling measures on the visual interface.

[0061] The technical solution of this application will now be described in detail through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments.

[0062] Figure 2 This is a flowchart illustrating an embodiment of the photovoltaic module deformation fault detection method provided in this application. Figure 2 As shown, the processing method includes:

[0063] S201, Obtain the detection information of the detection points of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested.

[0064] It should be noted that the method described in this embodiment is specifically used on a processing device, which can be set on a terminal; and the photovoltaic module to be tested has a testing device. Optionally, the testing device is placed on the plane corresponding to the photovoltaic module, and four test points can be set near the four corners of the photovoltaic module. Correspondingly, a scale also needs to be set at the reference test point, and a corresponding scale needs to be set at each test point. Figure 3 This is a schematic diagram showing the positional relationship between the testing equipment and the photovoltaic modules, such as... Figure 3 As shown in the figure, 11 represents the photovoltaic module, 10 represents the testing equipment, and 301-305 represent the scales at the four testing points and the reference testing point positions, respectively.

[0065] In addition, it should be noted that the detection equipment mentioned in this embodiment can be a rotary high-precision laser detection device, which integrates laser ranging function, horizontal ranging function and angle measurement function.

[0066] Based on this, the testing equipment uses its integrated functions to measure the testing points to obtain the height values ​​of the four testing points.

[0067] It is worth mentioning that the center position of the testing equipment can be used as a reference testing point, and the height value of the testing point can also be obtained by using a scale set at the reference testing point; in addition, the testing equipment has pre-stored the identification of the photovoltaic module associated with it, as well as the length and width values ​​of the plane corresponding to the photovoltaic module.

[0068] After the testing equipment receives the testing and processing request sent by the terminal, it will parse the request to obtain the identifier of the photovoltaic module to be tested and the testing information of the testing point of the photovoltaic module to be tested corresponding to the identifier. Then, it will upload the detected information to the processing device in real time or periodically for processing.

[0069] S202, For each detection point, determine the deformation of the detection point based on the detection information of the detection point and the reference information of the reference detection point.

[0070] In this embodiment, the processing device determines the deformation of each detection point based on the height value of each detection point and the height value of a reference detection point.

[0071] Optionally, for each detection point, the elevation difference between the elevation value in the detection information and the elevation value in the reference information is calculated, and the elevation difference is used as the deformation of the detection point.

[0072] For example, suppose the locations of the detection points are points A, B, C and D, and the heights of these four detection points are h1, h2, h3 and h4, respectively. The corresponding reference detection point is assumed to be point O and its detection point height is h0.

[0073] Subsequently, the processing device calculates the differences between h1, h2, h3 and h4 and h0 respectively, so as to obtain the corresponding deformation of each detection point.

[0074] S203 employs a grid algorithm to perform gridding on the photovoltaic module, and based on the deformation of each detection point, performs deformation detection on each grid vertex in the planar grid obtained after the photovoltaic module is gridded, in order to obtain the deformation of each grid vertex.

[0075] In this embodiment, after obtaining the deformation of the detection point, the processing device also needs to obtain the deformation of each point on the photovoltaic module to be detected, thereby realizing the detection and processing of the photovoltaic module.

[0076] Optionally, the processing device calculates a first ratio of the length value to a preset grid unit value, and a second ratio of the width value to a preset grid unit value; the processing device performs equal division of the plane corresponding to the photovoltaic module in the length direction according to the first ratio, and simultaneously performs equal division of the plane corresponding to the photovoltaic module in the width direction according to the second ratio, to obtain the planar grid corresponding to the photovoltaic module.

[0077] The processing device first virtually divides the plane corresponding to the photovoltaic module into multiple grids. Specifically, the processing device calculates the first ratio of the length value of the photovoltaic module to the preset grid unit value to obtain the number of grids that should be divided in the length direction of the photovoltaic module. Similarly, the processing device calculates the second ratio of the width value of the photovoltaic module to the preset grid unit value to obtain the number of grids that should be divided in the width direction of the photovoltaic module.

[0078] Then, according to the first ratio and the second ratio, the photovoltaic module is divided into corresponding cells in the length and width directions, thereby obtaining the corresponding planar grid of the photovoltaic module.

[0079] Subsequently, based on the planar grid, the coordinates of the grid vertices of each planar grid can be obtained. At the same time, the processing device can combine the coordinates of each grid vertex with the position coordinates and deformation of the detection point to obtain the deformation of each grid vertex.

[0080] It should be noted that the processing device has a pre-set mesh algorithm, which is used to calculate the deformation of the mesh vertices in each planar mesh based on the deformation of the detection points. This mesh algorithm is set by those skilled in the art, but is not limited to other specific implementation methods.

[0081] S204, Mesh vertices with deformation values ​​greater than a preset deformation threshold are designated as deformation fault points.

[0082] It should be noted that the processing device stores deformation thresholds, which can be national standard deformation curvature values, and are used as the basis for judging whether a deformation fault has occurred.

[0083] In this embodiment, after the processing device obtains the deformation of each grid vertex on the grid plane, it compares the deformation of each grid vertex with a deformation threshold to determine whether the deformation of each grid vertex is greater than the preset deformation threshold, so as to determine whether a deformation fault has occurred at the current grid vertex location.

[0084] When the deformation corresponding to a mesh vertex is determined to be greater than the preset deformation threshold, the mesh vertex corresponding to the deformation greater than the preset deformation threshold is regarded as a deformation fault point; conversely, when the deformation corresponding to a mesh vertex is determined to be less than or equal to the preset deformation threshold, the mesh vertex corresponding to the deformation less than or equal to the preset deformation threshold is regarded as a normal deformation mesh vertex.

[0085] Optionally, in this embodiment, after determining the deformation fault point, the processing device needs to feed back the deformation fault node on the visualization interface. Optionally, the processing device has a visualization interface, and can display the information of the deformation fault point on the visualization interface.

[0086] This embodiment specifically illustrates a method for detecting deformation faults in photovoltaic modules. The method involves acquiring detection information from detection points on the photovoltaic module to be tested. These detection points are located at the four corners of the photovoltaic module. For each detection point, the deformation amount is determined based on its detection information and reference information from a reference detection point. A grid algorithm is used to mesh the photovoltaic module, and based on the deformation amount of each detection point, deformation detection is performed on each vertex of the resulting planar grid to obtain the deformation amount of each vertex. Grid vertices with deformation amounts exceeding a preset deformation threshold are identified as deformation fault points. Compared to existing technologies, this application provides a method for facilitating on-site detection of deformation faults in photovoltaic modules, improving processing efficiency. Furthermore, by using data detected by the detection equipment and processing device to determine whether a deformation fault has occurred, the detection results are more accurate, which is beneficial for improving the power generation efficiency of photovoltaic power plants.

[0087] The following is combined Figure 4 This application further explains how to obtain the deformation of each grid vertex of the planar grid corresponding to the photovoltaic module. Figure 4 This is a flowchart illustrating Embodiment 2 of the photovoltaic module deformation fault detection processing method provided in this application, as shown below. Figure 4 As shown, the method includes:

[0088] S401, for each detection point, determine the position coordinates of the detection point based on the distance value and angle in the detection information of the detection point.

[0089] In this embodiment, after obtaining the planar mesh, the processing device also needs to obtain the deformation corresponding to the mesh vertex of each planar mesh. To this end, the processing device also needs to determine the position coordinates of each detection point and the position coordinates of the mesh vertex for subsequent processing.

[0090] Specifically, the processing device can refer to the detection point as the origin of the coordinate system and establish an intermediate coordinate system with this origin.

[0091] It is conceivable that the detection points will be evenly distributed across each quadrant of the Cartesian coordinate system, and then the position coordinates of the detection points can be obtained based on the detection information of each detection point.

[0092] For each detection point, the processing device calculates the product of the distance value of the detection point and the sine and cosine values ​​of the angle of the detection point to obtain the position coordinates of the detection point in the rectangular coordinate system.

[0093] It should be noted that the detection information uploaded by the detection equipment to the processing device also includes the distance and angle of the detection point relative to the detection equipment.

[0094] Specifically, based on the distance value of each detection point, which is the straight-line distance from the origin of the coordinate system, it is necessary to obtain the vertical distance of the detection point relative to the X-axis and Y-axis of the coordinate system in order to obtain the position coordinates of each detection point.

[0095] Furthermore, for each detection point, the processing device obtains the sine and cosine values ​​of the angle, and calculates the product of the distance value and the sine value to obtain the position coordinates of the detection point in the Y-axis direction; similarly, the processing device calculates the product of the distance value and the cosine value to obtain the position coordinates of the detection point in the X-axis direction.

[0096] Then, the processing device can obtain the position coordinates of each detection point by operating according to the above processing method.

[0097] After obtaining the location coordinates, the processing device can perform the following processing steps:

[0098] S402 maps the planar mesh to a coordinate system with the reference detection point as the origin, in order to obtain the position coordinates of each mesh vertex in the planar mesh.

[0099] In this embodiment, the processing device needs to obtain the position coordinates of each grid vertex in the planar grid.

[0100] Specifically, the processing device can map the planar mesh onto the Cartesian coordinate system mentioned in the previous steps, again using the reference detection point as the origin. This can be understood as the center of the planar mesh, with the center point as the origin, denoted as (0, 0). Correspondingly, the mesh vertices can be calculated according to the mesh unit length value. For example, taking a mesh vertex located in the first quadrant of the Cartesian coordinate system as an example, assuming the mesh unit length is 'a', and a certain mesh vertex is 5 meshes away from the origin along the X-axis and 4 meshes away along the Y-axis, then the position coordinates of this mesh vertex are (5a, 4a).

[0101] S403. For each grid vertex, determine the target detection point in the same coordinate quadrant as the grid vertex's position coordinates, and calculate the first distance and the second distance between the grid vertex's position coordinates, the target detection point's position coordinates and the origin, respectively. Then, multiply the ratio of the first distance to the second distance with the deformation of the target detection point, and use the result of the multiplication as the deformation of the grid vertex.

[0102] In this embodiment, the Cartesian coordinate system has four quadrants, and each quadrant contains one detection point. The deformation of each grid vertex is obtained by relying on its associated detection point.

[0103] Therefore, after obtaining the position coordinates of each grid vertex, the processing device also needs to determine the quadrant to which the position coordinates belong and identify the target detection point located in that quadrant.

[0104] Optionally, the sign of the coordinate values ​​can be used to determine the quadrant. For example, the X and Y coordinate values ​​in the first quadrant are both positive, the X coordinate value in the second quadrant is negative and the Y coordinate value is positive, the X coordinate value in the third quadrant is negative and the Y coordinate value is negative, and the X coordinate value in the fourth quadrant is positive and the Y coordinate value is negative. This can determine the quadrant in which each grid vertex is located, and also the target detection point located in that quadrant.

[0105] In this embodiment, the processing device can calculate a first distance between the position coordinates of a grid vertex and the origin based on the distance formula between two points, and calculate a second distance between the position coordinates of the target detection point and the origin. This allows the determination of the ratio between the position coordinates of the target detection point and the grid vertex, i.e., the ratio of the first distance to the second distance.

[0106] This can be understood as follows: the deformation of the target detection point at its position is a certain value, and when the target detection point is translated to the position coordinates of the grid vertex, the proportion of the translation distance can be represented as the distance ratio.

[0107] In this embodiment, the processing device obtains the deformation of the grid vertex corresponding to the position coordinates of the grid vertex by calculating the product between the distance ratio and the deformation of the target detection point.

[0108] It is conceivable that, based on the aforementioned processing steps, the processing device can obtain the deformation of each grid vertex in the planar grid corresponding to the photovoltaic module.

[0109] Subsequently, the processing device can compare the deformation of each grid vertex with the deformation threshold to determine whether the photovoltaic module has a deformation fault, and if a deformation fault exists, the grid vertex with the deformation fault will be displayed on the visualization interface.

[0110] This embodiment specifically illustrates the process of obtaining the deformation of each grid vertex in the planar grid. This allows for the acquisition of the deformation of the entire photovoltaic module when measuring the deformation of some detection points, thereby improving the processing efficiency of photovoltaic module deformation fault detection. At the same time, the relevant grid algorithm can improve the accuracy of detection processing.

[0111] In one alternative implementation, the processing steps for obtaining and taking measures to address the grid vertices that have experienced deformation faults are explained. Specifically, for each deformation fault point, the processing device determines an adjustment direction that matches the deformation of the deformation fault point; based on the adjustment direction, the deformation fault point is corrected and adjusted.

[0112] It should be noted that the terminal has a pre-stored table of the relationship between the deformation range and the handling measures. This table is used as a basis for handling measures when a deformation fault occurs, and the specific implementation of this table includes, but is not limited to, those set by those skilled in the art.

[0113] Based on this, after the processing device identifies the faulty grid vertex, it determines the target deformation corresponding to that vertex. Then, it identifies the deformation range to which the target deformation belongs in a pre-stored deformation range reference table. This deformation reference table summarizes all possible deformation ranges for the photovoltaic module, with different deformation ranges corresponding to different deformation levels. Subsequently, it retrieves the corresponding processing measures from the aforementioned relationship table based on the deformation range. These processing measures include methods for adjusting deformation fault points, such as upward or downward adjustments. Specifically, the adjustment direction for deformation fault detection points can be displayed in the adjustment direction of the detection points, such as adjusting the direction of the detection points at the four corners of the photovoltaic module, thereby alleviating the deformation degree of the deformation fault detection points.

[0114] Figure 5 A schematic diagram of the terminal visual interface provided in this application, such as Figure 5 As shown, the terminal interface displays the adjustment direction for the points to be detected. The five arrows in the figure are a schematic diagram of the processing measures provided by the terminal, with the downward arrow indicating downward adjustment and the upward arrow indicating upward adjustment.

[0115] In addition, refer to Figure 5 As can be seen, the terminal display interface shows input boxes for detection points A#, B#, C#, D# and reference detection point O#, such as elevation input, distance and angle one-click input boxes, etc., meaning that the detection information of the detection points can be uploaded to the terminal by the detection equipment, or it can be manually entered. For example, when the network communication signal is poor, manual input can be used.

[0116] In this optional embodiment, the processing steps of obtaining relevant processing measures are specifically explained. Based on the accurate location of the deformation value of the deformation fault, corresponding solutions are provided. This avoids the situation of multiple processing caused by manual handling of deformation faults based on one's own experience value. While achieving high processing efficiency, it also ensures the service life of photovoltaic modules and the energy efficiency ratio of photovoltaic power generation system.

[0117] In another optional implementation, the terminal can also traverse the deformation of each grid vertex in the planar grid to determine the minimum and maximum deformation; based on the maximum and minimum deformation, the deformation is divided into deformation intervals of calibrated values, and each vertex in the plane is stored in the vertex set corresponding to the deformation interval according to each deformation interval; based on the correspondence table between deformation intervals and deformation intensity colors, the target deformation intensity color corresponding to each deformation interval is obtained, and each vertex in the vertex set corresponding to the deformation interval is assigned the target deformation intensity color to be displayed on the terminal's visualization interface.

[0118] This optional embodiment provides another way to display deformation faults, presenting them to relevant personnel in graphical form. Relevant personnel can determine the areas with larger deformations based on the color depth corresponding to the deformation. At the same time, the graphic can be mapped onto the photovoltaic module, thereby quickly identifying the areas with larger deformations. This enriches the application scenarios of the method provided in this application.

[0119] Figure 6 This is a flowchart illustrating Embodiment 3 of the photovoltaic module deformation fault detection processing method provided in this application, as shown below. Figure 6 As shown, the method includes:

[0120] S601, Obtain a detection processing request sent by a terminal associated with the detection equipment; the detection processing request includes: the identifier of the photovoltaic module to be tested.

[0121] It should be noted that the method provided in this embodiment is mainly used on the detection equipment side, and the execution subject of this embodiment can still be a processing device, and the processing device is applied to the detection equipment.

[0122] In this embodiment, the testing device and the terminal can communicate via network communication. It is conceivable that when the terminal needs to test a photovoltaic module, it will send a testing request to the testing device, and this request will include the identifier of the photovoltaic module to be tested.

[0123] S602, determine the detection points associated with the identifier of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested.

[0124] Specifically, after parsing the identifier of the photovoltaic module to be tested in the testing request, the processing device will determine that the detection points associated with the identifier of the photovoltaic module are usually set at the four corners of the photovoltaic module to be tested, and the setting positions of different photovoltaic modules to be tested have a certain deviation.

[0125] S603, triggers the laser emitter in the detection device to emit a laser to obtain the height value of the detection point based on the laser emission time and reception time; triggers the angle sensor in the detection device to collect the angle of the detection point relative to the reference detection point; and triggers the electronic level in the detection device to collect the distance value of the detection point relative to the reference detection point.

[0126] It should be noted that, in addition to communicating with the terminal, the testing equipment also has a laser emitter, an electronic level, and an angle sensor for detecting the test points.

[0127] Specifically, once the processing device identifies the detection points associated with the photovoltaic module to be tested, it will trigger the internal laser emitter to emit laser light. At the same time, the detection equipment will rotate using its rotation function so that all detection points can be scanned by the laser.

[0128] Subsequently, the processing device can calculate the difference between the arrival time and the emission time based on the time it takes for the laser to reach each detection point; then, it can obtain the height value of each detection point by utilizing the propagation speed of the laser; at the same time, the processing device will trigger its internal angle sensor and electronic level to detect each detection point in order to obtain the angle and distance values ​​of each detection point relative to the reference detection point.

[0129] The reference test point is set for each photovoltaic module to be tested, and the reference test point is located at the center of the test point.

[0130] S604 generates and sends detection information to the terminal based on the height, angle, and distance values ​​of each detection point, so that the terminal can perform deformation fault detection and processing.

[0131] In this embodiment, when the processing device obtains the height, angle and distance values ​​of each detection point, it will generate detection information based on these values ​​and send the detection information to the terminal for the terminal to perform deformation fault detection processing.

[0132] In this embodiment, the specific processing steps of the detection equipment are explained in detail. Compared with the existing technology that uses visual inspection to determine whether photovoltaic modules have deformed, this embodiment uses more accurate detection equipment, which can improve the accuracy of detection.

[0133] Figure 7 This is a schematic diagram of the structure of the terminal embodiment provided in this application, as shown below. Figure 7 As shown, the processing device includes: a first transceiver module 701, a first determination module 702, and a first processing device 703.

[0134] The first transceiver module 701 acquires the detection information of the detection points of the photovoltaic module to be tested; the detection points are respectively set at the four corners of the photovoltaic module to be tested; the determination module 702 determines the deformation of each detection point based on the detection information of the detection point and the reference information of the reference detection point; the first processing module 703 is used to perform grid processing on the photovoltaic module using a grid algorithm, and based on the deformation of each detection point, to perform deformation detection processing on each grid vertex in the planar grid obtained after the photovoltaic module is gridded, so as to obtain the deformation of each grid vertex; the first processing module 703 is also used to identify grid vertices with deformation greater than a preset deformation threshold as deformation fault points.

[0135] Optionally, the first determining module 702 is specifically used for:

[0136] For each detection point, the elevation difference between the elevation value in the detection information and the elevation value in the reference information is calculated, and the elevation difference is used as the deformation of the detection point.

[0137] Optionally, the first processing module 703 is specifically used for:

[0138] For each detection point, determine its position coordinates based on the distance and angle values ​​in the detection information;

[0139] The planar mesh is mapped onto a coordinate system with the reference detection point as the origin to obtain the position coordinates of each mesh vertex in the planar mesh.

[0140] For each grid vertex, identify the target detection point that is in the same coordinate quadrant as the position coordinate of the grid vertex;

[0141] Calculate the first distance and the second distance between the position coordinates of the grid vertices and the position coordinates of the target detection points and the origin, respectively, to obtain the distance ratio of the first distance to the second distance;

[0142] The distance ratio is multiplied by the deformation of the target detection point, and the result of the multiplication is used as the deformation of the mesh vertices.

[0143] Optionally, the first processing module 703 is specifically used for:

[0144] For each deformation fault point, determine the adjustment direction that matches the deformation of the deformation fault point;

[0145] Based on the adjustment direction, the deformation fault points are corrected and adjusted.

[0146] In this embodiment, the specific implementation principle and beneficial effects of the processing device are similar to those of the method provided in the foregoing embodiments, and will not be repeated here.

[0147] The following is combined Figure 8 The structure of the testing equipment provided in this application will be further described. Figure 8 This is a schematic diagram of the structure of the testing equipment provided in Embodiment 1 of this application, as shown below. Figure 8 As shown, the processing device 800 includes: a second transceiver module 801, a second determination module 802, and a second processing module 803.

[0148] The second transceiver module 801 is used to acquire a detection processing request sent by a terminal associated with the detection equipment. The detection processing request includes the identifier of the photovoltaic module to be tested. The second determination module 802 is used to determine the detection point and reference detection point associated with the identifier of the photovoltaic module to be tested. The detection points are respectively set at the four corners of the photovoltaic module to be tested. The second processing module 803 is used to trigger the laser emitter in the detection equipment to emit a laser, so as to obtain the height value of the detection point according to the laser emission time and reception time; and to trigger the angle sensor in the detection equipment to collect the angle of the detection point relative to the reference detection point; and to trigger the electronic level in the detection equipment to collect the distance value of the detection point relative to the reference detection point. The second processing module 803 is also used to generate and send detection information to the terminal according to the height value, angle and distance value of each detection point, so that the terminal can perform deformation fault detection processing.

[0149] In this embodiment, the specific implementation principle and beneficial effects of the processing device are similar to those of the method provided in the foregoing embodiments, and will not be repeated here.

[0150] In one optional embodiment, the structure of the detection device provided in this application will be further described. Figure 9 This is a schematic diagram of the structure of the testing equipment provided in Embodiment 2 of this application, as shown below. Figure 9 As shown, the testing device 10 comprises: a high-precision short-range laser module 101, a data acquisition and processing module 102, a high-precision angle sensor module 103, an electronic level module 104, a human-machine interface 105, and a precision rotary indexing base 106.

[0151] The high-precision short-range laser module 101 consists of a laser emitter and a rangefinder. The laser emitter emits millimeter-level high-precision visible laser light and, in conjunction with a scale, measures the height and distance values ​​of the reference detection point and the detection point. The high-precision short-range laser module 101 is connected to the data acquisition and processing module 102 to send the measured distance values ​​for data processing.

[0152] The data acquisition and processing module 102 is connected to the high-precision short-range laser module 101, the high-precision angle sensor module 103, the electronic level module 104, and the human-machine interface 105, respectively, for data processing, analysis, and output, so as to send the acquired data to the terminal, so that the terminal can use the method in any of the aforementioned embodiments to perform deformation fault detection and processing.

[0153] The high-precision angle sensor module 103 is connected to the rotary high-precision laser inspection equipment to measure the relative angle between the reference inspection point and the inspection point, and is connected to the data acquisition and processing module to send the angle value.

[0154] The electronic level module 104 is mounted on the high-precision short-range laser module 101 and connected to the data acquisition and processing module 102. It is used to calibrate the level accuracy of the high-precision short-range laser module 101, making it easier to adjust the level accuracy and improve the accuracy of the processing system.

[0155] The precision rotary indexing base 106 is the base of the testing equipment 10. It has built-in high-precision bearings and a rotating shaft. The indexing plate is mainly used to calibrate whether the angle of the high-precision angle sensor module 103 is accurate.

[0156] The human-machine interface 105 is connected to the data acquisition and processing module 102 and is used to display the measured values ​​and facilitate human-machine interaction.

[0157] This embodiment specifically illustrates the structure and implementation principle of the testing equipment.

[0158] In one optional embodiment, this application provides a photovoltaic module deformation fault detection processing system, the system including a terminal and multiple detection devices associated with the terminal; wherein the detection devices are used to perform detection processing on the photovoltaic module and upload the detection information generated by the detection processing to the terminal; the corresponding terminal is used to perform deformation fault detection processing on the detection information according to the method provided in any of the preceding embodiments.

[0159] The present invention also provides a computer-readable storage medium storing computer-executable instructions, which, when executed by at least one processor of a processing device, implement the processing method mentioned in the above embodiments.

[0160] The present invention also provides a computer program product, including computer instructions, wherein the computer instructions, when executed by a processor, implement the processing methods provided by the various embodiments described above.

[0161] In the several embodiments provided by this invention, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple modules or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces, or indirect coupling or communication connection between devices or modules, and may be electrical, mechanical, or other forms.

[0162] The modules described above as separate components may or may not be physically separate. Similarly, the components shown as modules may or may not be physical modules; they may be located in one place or distributed across multiple network modules. Some or all of the modules can be selected to achieve the purpose of this embodiment, depending on actual needs.

[0163] Furthermore, the functional modules in the various embodiments of the present invention can be integrated into one processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The integrated module can be implemented in hardware or in the form of hardware plus software functional modules.

[0164] The integrated modules described above, implemented as software functional modules, can be stored in a computer-readable storage medium. These software functional modules, stored in a storage medium, include several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute some steps of the methods provided in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0165] In the embodiments of the network device or terminal device described above, it should be understood that the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in this invention can be directly manifested as being executed by a hardware processor, or executed by a combination of hardware and software modules within the processor.

[0166] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for detecting deformation faults in photovoltaic modules, characterized in that, The method is applied to a terminal; therefore, the method includes: Obtain detection information of the detection points of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested; For each detection point, the deformation of the detection point is determined based on the detection information of the detection point and the reference information of the reference detection point. The photovoltaic module is meshed using a grid algorithm. Based on the deformation of each detection point, deformation detection processing is performed on each grid vertex in the planar grid obtained after the photovoltaic module is meshed, so as to obtain the deformation of each grid vertex; Mesh vertices with deformation values ​​greater than a preset deformation threshold are designated as deformation fault points. The step of determining the deformation of the detection point based on the detection information of the detection point and the reference information of the reference detection point includes: For each detection point, the elevation difference between the elevation value in the detection information and the elevation value in the reference information is calculated, and the elevation difference is used as the deformation of the detection point. The detection information also includes: distance value and angle; then, based on the deformation of each detection point, deformation detection processing is performed on each grid vertex in the planar grid obtained after the photovoltaic module is meshed, to obtain the deformation of each grid vertex, including: For each detection point, the position coordinates of the detection point are determined based on the distance value and angle in the detection information of the detection point; The planar mesh is mapped onto a coordinate system with the reference detection point as the origin, so as to obtain the position coordinates of each mesh vertex in the planar mesh; For each of the grid vertices, a target detection point is determined that is in the same coordinate quadrant as the position coordinates of the grid vertex. The first distance and the second distance between the position coordinates of the grid vertex and the position coordinates of the target detection point and the origin are calculated respectively. The ratio of the first distance to the second distance and the deformation of the target detection point are multiplied, and the result of the multiplication is used as the deformation of the grid vertex.

2. The method according to claim 1, characterized in that, Also includes: For each deformation fault point, determine the adjustment direction that matches the deformation of the deformation fault point; Based on the adjustment direction, the deformation fault point is corrected and adjusted.

3. A method for detecting deformation faults in photovoltaic modules, characterized in that, The method is applied to testing equipment; The method includes: Obtain a detection processing request sent by a terminal associated with the detection device; the detection processing request includes: the identifier of the photovoltaic module to be detected; Identify detection points associated with the identifier of the photovoltaic module to be tested; wherein the detection points are respectively set at the four corners of the photovoltaic module to be tested; For each of the detection points, the following processing is performed: The laser emitter in the detection device is triggered to emit a laser, so as to obtain the height value of the detection point according to the laser emission time and reception time; and the angle sensor in the detection device is triggered to collect the angle of the detection point relative to the reference detection point; and the electronic level in the detection device is triggered to collect the distance value of the detection point relative to the reference detection point. Based on the height, angle, and distance values ​​of each detection point, detection information is generated and sent to the terminal for deformation fault detection processing. The terminal performs the following deformation fault detection processing: For each detection point, the elevation difference between the elevation value in the detection information and the elevation value in the reference information of a reference detection point is calculated, and this elevation difference is used as the deformation of the detection point; a grid algorithm is used to perform gridding processing on the photovoltaic module to obtain a planar grid; for each detection point, the position coordinates of the detection point are determined based on the distance and angle values ​​in the detection information; the planar grid is mapped onto... In a coordinate system with the reference detection point as the origin, the position coordinates of each grid vertex in the planar grid are obtained; for each grid vertex, a target detection point in the same coordinate quadrant as the position coordinates of the grid vertex is determined, and the first distance and the second distance between the position coordinates of the grid vertex, the position coordinates of the target detection point and the origin are calculated respectively. The ratio of the first distance to the second distance and the deformation of the target detection point are multiplied, and the result of the multiplication is used as the deformation of the grid vertex; grid vertices with deformation greater than a preset deformation threshold are designated as deformation fault points.

4. A terminal, characterized in that, include: The first transceiver module acquires detection information of the detection points of the photovoltaic module to be tested; wherein, the detection points are respectively set at the four corners of the photovoltaic module to be tested; The determination module determines the deformation of each detection point based on the detection information of the detection point and the reference information of a reference detection point. The first processing module is used to perform meshing processing on the photovoltaic module using a meshing algorithm, and to perform deformation detection processing on each grid vertex in the planar mesh obtained after the photovoltaic module meshing processing based on the deformation of each detection point, so as to obtain the deformation of each grid vertex. The first processing module is also used to identify mesh vertices with deformation values ​​greater than a preset deformation threshold as deformation fault points; The determination module is used to calculate the elevation difference between the elevation value in the detection information and the elevation value in the reference information for each detection point, so as to use the elevation difference as the deformation of the detection point; The detection information also includes: distance value and angle; the first processing module is used to determine the position coordinates of each detection point based on the distance value and angle in the detection information of the detection point; The planar mesh is mapped onto a coordinate system with the reference detection point as the origin, so as to obtain the position coordinates of each mesh vertex in the planar mesh; For each of the grid vertices, a target detection point is determined that is in the same coordinate quadrant as the position coordinates of the grid vertex. The first distance and the second distance between the position coordinates of the grid vertex and the position coordinates of the target detection point and the origin are calculated respectively. The ratio of the first distance to the second distance and the deformation of the target detection point are multiplied, and the result of the multiplication is used as the deformation of the grid vertex.

5. A testing device, characterized in that, include: The second transceiver module is used to acquire detection processing requests sent by terminals associated with the detection device; The detection processing request includes: the identifier of the photovoltaic module to be detected; The second determining module is used to determine the detection point and reference detection point associated with the identifier of the photovoltaic module to be tested; wherein the detection points are respectively set at the four corners of the photovoltaic module to be tested; The second processing module is used to trigger the laser emitter in the detection device to emit a laser, so as to obtain the height value of the detection point according to the laser emission time and reception time; and to trigger the angle sensor in the detection device to collect the angle of the detection point relative to the reference detection point; and to trigger the electronic level in the detection device to collect the distance value of the detection point relative to the reference detection point. The second processing module is further configured to generate and send detection information to the terminal based on the height, angle, and distance values ​​of each detection point, so that the terminal can perform deformation fault detection processing, and the terminal can perform the following deformation fault detection processing: for each detection point, calculate the elevation difference between the elevation value in the detection information and the elevation value in the reference information of the reference detection point, so as to use the elevation difference as the deformation of the detection point; use a grid algorithm to perform gridding processing on the photovoltaic module to obtain a planar grid; for each detection point, determine the position coordinates of the detection point based on the distance value and angle in the detection information; and set the planar grid to the required values. The planar mesh is mapped onto a coordinate system with the reference detection point as the origin to obtain the position coordinates of each mesh vertex. For each mesh vertex, a target detection point is determined that is in the same coordinate quadrant as the position coordinates of the mesh vertex. The first distance and the second distance between the position coordinates of the mesh vertex and the position coordinates of the target detection point and the origin are calculated respectively. The ratio of the first distance to the second distance and the deformation of the target detection point are multiplied, and the result of the multiplication is used as the deformation of the mesh vertex. Mesh vertices with deformation greater than a preset deformation threshold are identified as deformation fault points.

6. A processing system for detecting deformation faults in photovoltaic modules, characterized in that, The system includes: a terminal, and multiple detection devices associated with the terminal; The detection equipment is used to perform detection processing on photovoltaic modules according to the method described in claim 3, and upload the detection information generated by the detection processing to the terminal; The terminal is used to perform deformation fault detection processing on the detection information according to the method described in any one of claims 1-2.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the method as described in any one of claims 1 to 2, and / or to implement the method as described in claim 3.

8. A computer program product, characterized in that, It includes computer instructions, which, when executed by a processor, implement the method as claimed in any one of claims 1 to 2, and / or implement the method as claimed in claim 3.

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