Interface adapter and method of designing the same

Abstract

The application discloses an interface adapter and a design method thereof. The objects to be tested in a product set to be tested are connected with a test device through the interface adapter. When the objects to be tested change, the switching and testing can be completed through a conditioning module, a matrix switch and an open module strip in the interface adapter, the purpose that one interface adapter device corresponds to multiple objects to be tested is realized, and the universality of the interface adapter is greatly improved. The matrix switch can quickly adjust the signals which need to be transformed, the test speed is ensured, and the universality of the interface is improved. The open module strip connects the signals which are not frequently transformed, the number of the required matrix switches is greatly reduced, the cost of manufacturing the interface adapter is reduced, the wiring on the open module strip is convenient for manual modification, and the subsequent adaptive adjustment according to the test task is facilitated, and the universality and the expandability of the adapter are further improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of signal detection, in particular to an interface adapter and a design method thereof. BACKGROUND

[0002] The interface adapter is located between the test equipment and the device to be tested, and is the signal hub between the two, which converges a large number of signals to be detected. The interface adapter mainly completes the distribution and conditioning of test signals, that is, the signals of each interface of the device to be tested are transmitted to the measuring instrument through different conditioning modules. Most measuring instruments are universal, but because the types and characteristics of the measured objects and test equipment signals are different, the interface adapter is generally special. If one device to be tested corresponds to one interface adapter, the types of interface adapters will be numerous, the test system will be large, and resources will be wasted. The existing interface adapter has low universality. SUMMARY

[0003] The main purpose of the present application is to provide an interface adapter and a design method thereof, which aims to solve the technical problem of low universality of the interface adapter.

[0004] To achieve the above purpose, the present application provides an interface adapter, comprising: a test end interface, a matrix switch, a conditioning module, an open module, and a test equipment end interface; wherein,

[0005] The input end of the conditioning module is connected with the test end interface, the output end of the conditioning module is connected with the test equipment end interface, and the conditioning module is used for coordinating the test end interface and the test equipment end interface.

[0006] The input end of the matrix switch is connected with the test end interface, the output end of the matrix switch is connected with the test equipment end interface, and the matrix switch is used for switching the signal channel.

[0007] The input end of the open module is connected with the test end interface, the output end of the open module is connected with the test equipment end interface, and the open module is used for connecting the pin of the test end interface and the test equipment end interface to the corresponding pinhole.

[0008] Optionally, it further comprises a universal slot.

[0009] The matrix switch, the conditioning module, the open module and the test end interface are respectively connected with the universal slot.

[0010] Optionally, it further comprises a power supply module; the power supply module is connected with the matrix switch, and is used for supplying power for the switch matrix.

[0011] Optionally, the matrix switch, the conditioning module and the open module strip are arranged in a case.

[0012] In addition, to achieve the above object, the application further provides a design method based on the interface adapter, comprising:

[0013] obtaining a test requirement of the set of products to be tested; wherein the set of products to be tested comprises a plurality of objects to be tested;

[0014] designing a conditioning module according to the test requirement, and connecting an input end of the conditioning module with the test end interface and connecting an output end of the conditioning module with the test equipment end interface;

[0015] designing a matrix switch according to the test requirement, and connecting an input end of the matrix switch with the test end interface and connecting an output end of the matrix switch with the test equipment end interface;

[0016] designing an open module strip according to the test requirement, and connecting an input end of the open module strip with the test end interface and connecting an output end of the open module strip with the test equipment end interface.

[0017] Optionally, the test requirement comprises signals to be conditioned in the test end interface, signal pins that remain unchanged when the objects to be tested change, and signal pins that change when the objects to be tested change.

[0018] Optionally, the step of designing a conditioning module according to the test requirement, and connecting an input end of the conditioning module with the test end interface and connecting an output end of the conditioning module with the test equipment end interface, comprises:

[0019] designing the conditioning module according to the signals to be conditioned in the test end interface;

[0020] connecting an input end of the conditioning module with the test end interface and connecting an output end of the conditioning module with the test equipment end interface.

[0021] Optionally, the step of designing a matrix switch according to the test requirement, and connecting an input end of the matrix switch with the test end interface and connecting an output end of the matrix switch with the test equipment end interface, comprises:

[0022] designing the matrix switch according to the signal pins that change when the objects to be tested change;

[0023] connecting an input end of the matrix switch with the test end interface and connecting an output end of the matrix switch with the test equipment end interface.

[0024] Optionally, the step of designing the open module strip according to the test requirements, and connecting the input end of the open module strip with the to-be-tested end interface, and connecting the output end of the open module strip with the test equipment end interface, comprises:

[0025] The development module strip is designed according to the signal pin that remains unchanged when the to-be-tested object changes;

[0026] The input end of the open module strip is connected with the to-be-tested end interface, and the output end of the open module strip is connected with the test equipment end interface.

[0027] The beneficial effects that can be achieved by the present application.

[0028] The interface adapter and the design method thereof provided by the embodiment of the present application comprise a to-be-tested end interface, a matrix switch, a conditioning module, an open module strip and a test equipment end interface; wherein the input end of the conditioning module is connected with the to-be-tested end interface, the output end of the conditioning module is connected with the test equipment end interface, and the conditioning module is used for coordinating the to-be-tested end interface and the test equipment end interface; the input end of the matrix switch is connected with the to-be-tested end interface, the output end of the matrix switch is connected with the test equipment end interface, and the matrix switch is used for switching a signal channel; the input end of the open module strip is connected with the to-be-tested end interface, the output end of the open module strip is connected with the test equipment end interface, and the open module strip is used for connecting the pin of the to-be-tested end interface and the pin of the test equipment end interface to corresponding pin holes. That is, the to-be-tested objects in the to-be-tested product set are connected with the test equipment through the interface adapter, when the to-be-tested objects change, only the conditioning module, the matrix switch and the open module strip in the interface adapter need to be switched and tested, the purpose that one interface adapter device corresponds to multiple to-be-tested objects is achieved, and the universality of the interface adapter is greatly improved; wherein the conditioning module can appropriately condition the test signal, so that the voltage range meets the input voltage requirement of the measuring instrument, and the normal test task is ensured; the matrix switch can quickly adjust the signal that needs to be transformed, the test speed is ensured, and the universality of the interface is improved; the open module strip connects the signals that do not often change, greatly reduces the number of required matrix switches, reduces the cost of manufacturing the interface adapter, and the wiring on the open module strip is convenient for manual modification and subsequent adaptive adjustment according to the test task, further improving the universality and expandability of the adapter. BRIEF DESCRIPTION OF DRAWINGS

[0029] Figure 1 A structural schematic diagram of the interface adapter provided by the embodiment of the present application is shown;

[0030] Figure 2A schematic diagram of a connection of an interface adapter provided by an embodiment of the present application is shown in the figure;

[0031] Reference numerals: 1, interface of a terminal to be tested; 2, interface of a test device; 3, conditioning module; 4, matrix switch; 5, open module.

[0032] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0033] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0034] It should be noted that all directionality indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present application are only used to explain the relative positional relationship, movement condition, etc. between components in a certain posture (as shown in the drawings), and if the certain posture changes, the directionality indications also change accordingly.

[0035] In the present application, unless otherwise explicitly specified and limited, the terms "connection", "fixation", etc. should be understood in a broad sense, for example, "fixation" can be fixed connection, or detachable connection, or integral; can be mechanical connection, or electrical connection; can be direct connection, or indirect connection through an intermediate medium; can be internal connection of two elements or interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0036] In addition, if the present application has descriptions involving "first", "second", etc., the descriptions of "first", "second", etc. are only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features limited by "first" and "second" can explicitly or implicitly include at least one of the features. In addition, the meaning of "and / or" appearing throughout the text includes three parallel solutions. Taking "A and / or B" as an example, it includes A solution, or B solution, or A and B solutions. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the fact that a person skilled in the art can realize it, and when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, and is not within the protection scope of the present application.

[0037] Referring to Figure 1 The embodiment of the present application provides an interface adapter, which is characterized by comprising a to-be-tested end interface 1, a matrix switch 4, a conditioning module 3, an open module strip 5 and a test equipment end interface 2; wherein the input end of the conditioning module 3 is connected with the to-be-tested end interface 1, the output end of the conditioning module 3 is connected with the test equipment end interface 2, and the conditioning module 3 is used for coordinating the to-be-tested end interface 1 and the test equipment end interface 2; the input end of the matrix switch 4 is connected with the to-be-tested end interface 1, the output end of the matrix switch 4 is connected with the test equipment end interface 2, and the matrix switch 4 is used for switching a signal channel; the input end of the open module strip 5 is connected with the to-be-tested end interface 1, the output end of the open module strip 5 is connected with the test equipment end interface 2, and the open module strip 5 is used for connecting the pin feet of the to-be-tested end interface 1 and the test equipment end interface 2 to corresponding pin holes.

[0038] In the embodiment, the interface adapter is a signal hub between a test equipment and a to-be-tested object, and converges a large amount of to-be-tested signals. The function of the interface adapter is to transmit the signals of each interface of the to-be-tested object to a measuring instrument through different conditioning modules, so that the problem of mismatch between the interface of the to-be-tested object and the test equipment can be solved. The interface adapter comprises the to-be-tested end interface 1, the test equipment end interface 2, the matrix switch 4, the conditioning module 3 and the open module strip 5.

[0039] The to-be-tested end interface 1 is an interface connected with each to-be-tested object. The to-be-tested products needing to perform a test task collectively comprise a plurality of to-be-tested objects. The interface model of each to-be-tested object can be different from the interface model of the test equipment. The to-be-tested end interface 1 can be connected with the interface adapter, and then the to-be-tested signal can be transmitted to the test equipment, so that the universality of the adapter is improved.

[0040] The test equipment end interface 2 is an interface connected with the test equipment. The test equipment is connected with the interface adapter through the test equipment end interface 2, and receives the to-be-tested signal from the to-be-tested object to perform a test task. The test equipment end interface is composed of a mass interconnection structure, and the module strip thereof is configurable. The mass interconnection solution is mainly aimed at the mass connector of the GPIB, PXI and VXI system test equipment. The mass interconnection solution is used for conveniently managing a wire harness. The mass interconnection solution provides a modular solution for the rapid connection between a test instrument and a to-be-tested equipment, has recognized reliability, and can meet the performance requirements of the electronic test industry. The mass interconnection structure is composed of six parts, which are a signal connection I / O, an adapter outer frame, a receiver outer frame, various signal modules, a vertical hinge support and an adapter end to-be-tested clamp.

[0041] The conditioning module 3 refers to a component for coordinating the difference between the to-be-tested object and the test equipment performance, the input end of which is connected with the to-be-tested end interface 1, and the output end of which is connected with the test equipment end interface 2. The main function is to appropriately condition the test signal, so that the voltage range meets the input voltage requirement of the measuring instrument, and also includes isolation, filtering and other functions, to ensure the normal performance of the test task.

[0042] The matrix switch 4 is an important component of the interface adapter, the input end of which is connected with the to-be-tested end interface 1, and the output end of which is connected with the test equipment end interface 2. It can quickly realize the routing and switching of different test signals, undertake the task of controlling the signal flow direction, and can realize automatic testing and improve the versatility of the adapter. The main uses of the matrix switch 4 can be divided into two types: the first type is to multiplex some expensive hardware resources in the test equipment, and the matrix switch 4 plays the role of short-circuiting the test equipment end interface pins; the second type is to quickly switch the connection relationship between the to-be-tested end interface 1 and the test equipment end interface 2 pins, in order to improve the test efficiency.

[0043] The open module strip 5 refers to a device that can lead out the pins of the to-be-tested end interface 1 and the pins of the test equipment end interface 2 to the corresponding pin holes to realize pin connection. The wiring efficiency is between directly connecting the pins of the to-be-tested end interface 1 and the pins of the test equipment end interface 2 and connecting them through the matrix switch 4. When the number of pins to be connected is small, short wires can be used for direct connection, and when the number of pins to be connected is large, a simple circuit board can be designed to be inserted on the open module strip 5. Moreover, the wiring on the open module strip 5 is easy for human to modify and easy for subsequent adaptive adjustment according to the test task, which improves the versatility and expandability of the adapter.

[0044] In other embodiments, a wiring board similar to a traditional conditioning board card can be used, and a wiring port is reserved on the empty board to replace the open module strip 5. This way has more wiring space and is easier to operate, but if there are multiple wiring boards, the wires between them may not change. The connection can be relieved by punching holes on the wiring board. That is, when multiple wiring boards need to be interconnected, a through hole can be reserved at a fixed position on the wiring board to avoid the wiring confusion caused by too many interconnections between different wiring boards. Moreover, when initially sorting out the wiring requirements, it is necessary to try to reduce the interconnection between non-adjacent wiring boards.

[0045] Although the matrix switch 4 can quickly switch the signal routing channel, when the number of test signals is large, all signals need to pass through the matrix switch 4, which will increase the number of matrix switches 4, greatly increasing the manufacturing cost of the universal adapter, and in the case of limited volume of the adapter case, the limited matrix switch 4 cannot meet the test requirements of the test product set containing a large number of different types of test objects, and the universality is poor; but after setting the open module 5, the signal pins that do not change when changing the test object can be connected through the open module 5, while the signal pins that change frequently when changing the test object are connected through the matrix switch 4, ensuring the speed of signal switching, and thus ensuring the test speed; and the number of matrix switches 4 can be greatly reduced, various different interface types of test objects involved can be used, improving the universality of the adapter; further, the layout problem and the change complexity problem caused by a large number of wires in the adapter case are also avoided.

[0046] In actual use, the number of matrix switches 4, conditioning modules 3 and open modules 5 can be determined according to specific use requirements, and the specific method is as follows:

[0047] 1. The number of analog signals that need to be conditioned simultaneously is N, each conditioning module 3 can condition an analog signal simultaneously, and the number of conditioning modules 3 required n is: n = N / an (rounded up).

[0048] 2. The number of analog signals that change frequently is M (digital signals such as serial bus, 1553B, 1394B bus, etc., generally do not change the route through the traditional matrix switch), and the number of signals that each matrix switch 4 can simultaneously input is am, then the number of matrix switches 4 required m is: m = M / am (rounded up).

[0049] 3. The number of signals that do not change is P (including part of the analog signal and the digital signal), and each open module 5 can support ap input and output, then the number of open modules 5 required p is: p = P / ap (rounded up).

[0050] As an optional implementation, it further includes a universal slot (not shown in the figure); the matrix switch 4, the conditioning module 3, the open module 5 and the test terminal interface 1 are respectively connected with the universal slot.

[0051] In this embodiment, the matrix switch 4, the conditioning module 3 and the open module 5 are respectively connected with the universal slot; the test terminal interface 1 is fixedly connected with the corresponding universal slot. The positions of the matrix switch 4, the conditioning module 3 and the open module 5 on the universal slot can be adjusted according to the actual wiring condition, so that the internal layout of the adapter is more adaptive and the space is more tidy.

[0052] As an optional embodiment, a power supply module (not shown in the figure) is further included; the power supply module is connected with the matrix switch 4, and is used for supplying power for the matrix switch 4.

[0053] In the embodiment, the power supply module is connected with the matrix switch 4, and is used for supplying power for the matrix switch 4 when the matrix switch 4 performs signal switching and other operations.

[0054] As an optional embodiment, the matrix switch, the conditioning module and the open module strip are arranged in a case (not shown in the figure).

[0055] In the embodiment, the matrix switch 4, the conditioning module 3 and the open module strip 5 are arranged in the case of the adapter, and the positions in the case can be adjusted according to actual line connection conditions.

[0056] Based on the same inventive concept as the above embodiment, the embodiment of the application provides a design method of an interface adapter, including: obtaining a test requirement of a set of to-be-tested products; wherein the set of to-be-tested products includes a plurality of to-be-tested objects; designing a conditioning module 3 according to the test requirement, and connecting an input end of the conditioning module 3 with a to-be-tested end interface 1 and connecting an output end of the conditioning module 3 with a test equipment end interface 2; designing a matrix switch 4 according to the test requirement, and connecting an input end of the matrix switch 4 with the to-be-tested end interface 1 and connecting an output end of the matrix switch 4 with the test equipment end interface 2; and designing an open module strip 5 according to the test requirement, and connecting an input end of the open module strip 5 with the to-be-tested end interface 1 and connecting an output end of the open module strip 5 with the test equipment end interface 2.

[0057] In the embodiment, before starting a test task, the test requirement of the set of to-be-tested products needs to be analyzed in combination with existing test resources, the set of to-be-tested products includes a plurality of to-be-tested objects, and the to-be-tested end interface 1 of each to-be-tested object can have multiple types. The conditioning module 3, the matrix switch 4 and the open module strip 5 are designed according to the test requirement, and the input ends of the conditioning module 3, the matrix switch 4 and the open module strip 5 are respectively connected with the to-be-tested end interface 1, and the output ends of the conditioning module 3, the matrix switch 4 and the open module strip 5 are respectively connected with the test equipment end interface 2.

[0058] As an optional embodiment, the test requirement includes: a signal to be conditioned in the to-be-tested end interface 1, a signal pin that remains unchanged when the to-be-tested object changes, and a signal pin that changes when the to-be-tested object changes.

[0059] In the embodiment, the signals to be conditioned, the signal pins that remain unchanged when the object to be tested changes, and the signal pins that change when the object to be tested changes are analyzed according to the interface condition and the type of the test equipment interface 2, etc.

[0060] As an optional implementation, the step of designing the conditioning module 3 according to the test requirement and connecting the input end of the conditioning module 3 with the object-to-be-tested interface 1 and connecting the output end of the conditioning module 3 with the test equipment interface 2 comprises: designing the conditioning module 3 according to the signals to be conditioned in the object-to-be-tested interface 1; connecting the input end of the conditioning module 3 with the object-to-be-tested interface 1 and connecting the output end of the conditioning module 3 with the test equipment interface 2.

[0061] In the embodiment, the conditioning module 3 is designed to appropriately condition the signals that need to be conditioned in the test requirement, so that the voltage range of the signals meets the input voltage requirement of the measuring instrument, thereby coordinating the difference between the object to be tested and the test equipment performance; after the design is completed, the input end of the conditioning module 3 is connected with the object-to-be-tested interface 1 and the output end is connected with the test equipment interface 2, so as to ensure the normal performance of the test task.

[0062] As an optional implementation, the step of designing the matrix switch 4 according to the test requirement and connecting the input end of the matrix switch 4 with the object-to-be-tested interface 1 and connecting the output end of the matrix switch 4 with the test equipment interface 2 comprises: designing the matrix switch 4 according to the signal pins that change when the object to be tested changes; connecting the input end of the matrix switch 4 with the object-to-be-tested interface 1 and connecting the output end of the matrix switch 4 with the test equipment interface 2.

[0063] In the embodiment, the matrix switch 4 is designed according to the signal pins that frequently change when the object to be tested changes in the test requirement; the frequently changed signal pins are connected through the matrix switch 4, so as to ensure the speed of signal switching; after the design is completed, the input end of the matrix switch 4 is connected with the object-to-be-tested interface 1 and the output end is connected with the test equipment interface 2, so as to quickly realize the routing and switching of different test signals and improve the universality of the adapter.

[0064] As an optional embodiment, the step of designing the open module strip 5 according to the test requirement, and connecting the input end of the open module strip 5 with the to-be-tested interface 1 and connecting the output end of the open module strip 5 with the test equipment interface 2 comprises: designing the open module strip 5 according to the signal pin that remains unchanged when the to-be-tested object changes; connecting the input end of the open module strip 5 with the to-be-tested interface 1 and connecting the output end of the open module strip 5 with the test equipment interface 2.

[0065] In the embodiment, the open module strip 5 is designed according to the signal pin that remains basically unchanged when the to-be-tested object changes in the test requirement, and after the design is completed, the input end of the open module strip 5 is connected with the to-be-tested interface 1 and the output end is connected with the test equipment interface 2; the setting of the open module strip 5 ensures the adaptation degree to different types of interfaces, and can also reduce the number of matrix switches 4 to a certain extent, reduces the manufacturing cost of the adapter, at the same time, the wiring on the open module strip 5 is convenient for manual modification and adaptive adjustment according to the test task, and improves the universality and expandability of the adapter. As shown in Figure 2 The open module strip 5 is arranged in parallel on the universal slot, the universal slot collects the corresponding pins of the two end faces of the adapter, and the structures connected on the two sides are different, for example, the left side is connected with the test machine box and the right side is connected with the to-be-tested product, and the signals on the open module strip 5 have four connection modes:

[0066] Mode A: for the test resource that needs to be reused, the matrix switch for returning the signal to the test machine box.

[0067] Mode B: switching of the interfaces in the same universal slot.

[0068] Mode C: for the test requirement of the to-be-tested product end, such as self-checking, the signal of the to-be-tested product end is short-circuited.

[0069] Mode D: interface switching in different universal slots, that is, cross-slot connection.

[0070] The above is only a preferred embodiment of the present application, and does not limit the patent scope of the present application, and any equivalent structure or equivalent process transformation using the content of the specification and drawings of the present application, or direct or indirect application in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. An interface adapter, characterized by It comprises a to-be-tested terminal interface, a matrix switch, a conditioning module, an open module, a testing device terminal interface and a universal slot, the matrix switch, the conditioning module, the open module and the to-be-tested terminal interface are connected with the universal slot respectively; wherein, the input end of the conditioning module is connected with the to-be-tested terminal interface, the output end of the conditioning module is connected with the testing device terminal interface, and the conditioning module is used for coordinating the to-be-tested terminal interface and the testing device terminal interface; the input end of the matrix switch is connected with the to-be-tested terminal interface, the output end of the matrix switch is connected with the testing device terminal interface, and the matrix switch is used for switching a signal channel; the input end of the open module is connected with the to-be-tested terminal interface, the output end of the open module is connected with the testing device terminal interface, and the open module is used for connecting the pin of the to-be-tested terminal interface and the testing device terminal interface to the corresponding pin hole; the signal pin unchanged when the to-be-tested object is changed can be connected through the open module, and the signal pin frequently changed when the testing object is changed is connected through the matrix switch; the open module is arranged in parallel on the universal slot, the universal slot comprises corresponding pins of two end faces of an adapter, and the signals on the open module have four connection modes: mode A: the matrix switch for returning the signal to the testing cabinet for the testing resource needing to be reused; mode B: the interface switching in the same universal slot; mode C: the signal short circuit of the to-be-tested product end for the testing demand of the to-be-tested product end; mode D: the interface switching in different universal slots.

2. The interface adapter of claim 1, wherein, It also comprises a power supply module; the power supply module is connected with the matrix switch and is used for supplying power for the matrix switch.

3. The interface adapter of claim 1, wherein, The matrix switch, the conditioning module and the open module are arranged in a cabinet.

4. A design method of an interface adapter based on any one of claims 1 to 3, characterized in that, It comprises: obtaining the testing demand of a to-be-tested product set; wherein the to-be-tested product set comprises a plurality of to-be-tested objects; designing the conditioning module according to the testing demand, connecting the input end of the conditioning module with the to-be-tested terminal interface and connecting the output end of the conditioning module with the testing device terminal interface; designing the matrix switch according to the testing demand, connecting the input end of the matrix switch with the to-be-tested terminal interface and connecting the output end of the matrix switch with the testing device terminal interface; designing the open module according to the testing demand, connecting the input end of the open module with the to-be-tested terminal interface and connecting the output end of the open module with the testing device terminal interface.

5. The design method of claim 4, wherein, The testing demand comprises the signal to be conditioned in the to-be-tested terminal interface, the signal pin unchanged when the to-be-tested object is changed and the signal pin changed when the to-be-tested object is changed.

6. The design method of claim 5, wherein, The step of designing the conditioning module according to the testing demand, connecting the input end of the conditioning module with the to-be-tested terminal interface and connecting the output end of the conditioning module with the testing device terminal interface comprises: designing the conditioning module according to the signal to be conditioned in the to-be-tested terminal interface; The input end of the conditioning module is connected with the to-be-tested end, and the output end of the conditioning module is connected with the testing device end.

7. The design method of claim 5, wherein, The step of designing the matrix switch according to the testing requirement, and connecting the input end of the matrix switch with the to-be-tested end and connecting the output end of the matrix switch with the testing device end comprises: designing the matrix switch according to the signal pin which changes with the to-be-tested object; connecting the input end of the matrix switch with the to-be-tested end and connecting the output end of the matrix switch with the testing device end.

8. The design method of claim 5, wherein, The step of designing the open module according to the testing requirement, and connecting the input end of the open module with the to-be-tested end and connecting the output end of the open module with the testing device end comprises: designing the open module according to the signal pin which remains unchanged when the to-be-tested object changes; connecting the input end of the open module with the to-be-tested end and connecting the output end of the open module with the testing device end.

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