Dynamic compensation method for full closed loop control of grating ruler based driver of wafer scriber
By combining full closed-loop control with dynamic compensation methods for rotary encoder and grating ruler signals, the problem of decreased Y-axis accuracy in the dicing machine was solved, achieving high-precision and reliable cutting results and extending the equipment's lifespan.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- JIANGSU JCA ELECTRONICS TECH CO LTD
- Filing Date
- 2022-08-16
- Publication Date
- 2026-05-29
AI Technical Summary
The Y-axis motion accuracy of existing dicing machines decreases over time, leading to a reduction in cutting quality. This can cause loss of control, especially when the grating ruler signal is poor or subject to electromagnetic interference, thus affecting the accuracy requirements of wafer production.
A fully closed-loop control method is adopted, which combines the signals from the motor rotary encoder and the grating ruler to monitor the position difference and compare it with the factory compensation table of the laser interferometer for dynamic compensation. The accuracy and rigidity are ensured by calculation through computer terminal and verification through microscope.
It improves the accuracy and reliability of the dicing machine, extends its service life, and ensures that high-precision cutting can still be maintained in the event of grating ruler failure or interference.
Smart Images

Figure CN117631608B_ABST