Probe fixture and probe carrier

Abstract

The present invention belongs to the technical field of wheel flaw detection equipment, and discloses a probe fixture, including a mounting clamp, an elastic adjustment mechanism, a probe frame and an elastic floating mechanism; the elastic adjustment mechanism is connected to the mounting clamp; a probe is installed on the probe frame, and the probe frame is connected to the elastic adjustment mechanism; the elastic floating mechanism is arranged between the elastic adjustment mechanism and the probe frame. The present invention can not only adapt to the problem of uneven wheel surface and / or adapt to the tread slope, so that the probe fits the wheel well, but also can adapt to wheels of different specifications. The present invention also discloses a probe carrier having the above-mentioned probe fixture.

Description

Technical Field

[0001] The invention belongs to the technical field of wheel flaw detection equipment, and in particular relates to a probe fixture and a probe carrier. Background Art

[0002] With the development of my country's high-speed railways, more and more EMUs and high-speed railways are put into operation. Therefore, regular flaw detection of wheelsets is one of the key measures to ensure the safety of EMU operation.

[0003] As a key component of the train, wheelsets need to be strictly inspected for quality. After each certain number of kilometers, the wheels of high-speed trains must be inspected using a highly automated ultrasonic inspection system to ensure the safety of the train.

[0004] Usually, an ultrasonic probe is needed for flaw detection. However, the probe cannot fit well on the wheel, so the detection effect is poor. Summary of the invention

[0005] In order to solve the above technical problems, the present invention discloses a probe fixture, which can not only adapt to the problem of uneven wheel surface and / or the slope of tread, so that the probe fits the wheel well, but also adapt to wheels of different specifications. The present invention also discloses a probe carrier having the above probe fixture.

[0006] The specific technical solutions of the present invention are as follows:

[0007] A probe fixture, comprising:

[0008] Install the cleat;

[0009] An elastic adjustment mechanism, wherein the elastic adjustment mechanism is connected to the mounting clamp;

[0010] a probe frame, on which a probe is mounted, and the probe frame is connected to the elastic adjustment mechanism; and

[0011] The elastic floating mechanism is arranged between the elastic adjustment mechanism and the probe frame.

[0012] The elastic floating mechanism can change the contact condition between the probe frame and the wheel according to the actual contact position when the probe frame contacts the wheel, thereby adapting to the uneven surface of the wheel and / or adapting to the tread slope to better meet the probe flaw detection effect; different wheels may have different size specifications, therefore, through the setting of the elastic adjustment mechanism, the probe frame can be adaptively adjusted according to the actual wheel size after contacting the wheel, thereby adapting to wheels of different sizes.

[0013] Preferably, the elastic adjustment mechanism comprises:

[0014] A seat body 1, wherein the seat body 1 is connected to the probe frame via a guide rail slider mechanism; and

[0015] Elastic member 1, wherein the elastic member 1 is arranged between the seat body 1 and the mounting clamping plate.

[0016] During actual use, the probe frame may move deflected, and the probe cannot form an effective fit with the wheel. Therefore, the probe frame needs to be limited accordingly. In this regard, the guide rail slider mechanism can provide a displacement basis for the seat body 1 and the mounting clamp to avoid the seat body 1 from moving deflected, and the elastic member 1 can continue to provide a stable elastic force after the seat body 1 and the mounting clamp produce relative displacement, thereby keeping the probe frame in stable contact with the wheel; in addition, the elastic member 1 can also provide vibration damping when the probe frame contacts the wheel.

[0017] Preferably, the elastic floating mechanism comprises:

[0018] A second seat body, wherein the second seat body is connected to the elastic adjustment mechanism;

[0019] A second elastic member, wherein the second elastic member is disposed between the second seat body and the probe frame; and

[0020] The support ear, one of the support ear and the probe frame is provided with a rotating pin, and the other is provided with a waist-shaped hole movably connected to the rotating pin, and the support ear is also connected to the second seat body.

[0021] In addition to satisfying the motion limit of the probe frame, the elastic adjustment mechanism can also achieve a corresponding vibration-absorbing effect, and the vibration-absorbing effect is achieved on the outside of the probe frame. Therefore, if it is necessary to further ensure the safety of the probe and avoid damage caused by rigid contact with the wheel, it is also necessary to absorb the vibration of the probe inside the probe frame. The elastic member 2 can achieve floating between the probe frame and the seat body 2. Since the elastic member 2 does not have a guiding component that cooperates with it, it allows the probe frame to swing within a certain range after contacting the wheel to avoid incomplete fit caused by uneven wheel surface and / or tread slope; in addition, the elastic member 2 can also be on the probe frame When contacting the wheel, it provides vibration damping; the movably connected waist-shaped hole and the turn pin can realize the motion limitation between the probe frame and the seat body 2, and the guide structure does not affect the deformation of the elastic part 2, that is, the deformation of the elastic part 2 does not necessarily occur in the axial direction of the elastic part 2. Therefore, the elastic part 2 can be used to realize multi-directional swinging of the probe frame to better fit the wheel. On this basis, since the rotation or linear displacement of the turn pin can only occur in the waist-shaped hole, the guide rail slider mechanism can better make the seat body 2 and the elastic adjustment mechanism move relative to each other in its guiding direction, so as to better achieve the purpose of secondary vibration damping on the basis of adapting to different wheel sizes and different wheel surfaces.

[0022] Preferably, the elastic floating mechanism further includes a spring seat;

[0023] Wherein, the spring seat is connected to the support ear and is located between the second seat body and the probe frame, and the second elastic member is connected between the spring seat and the probe frame; or

[0024] The spring seat is connected to the second seat body, the second elastic member is connected between the spring seat and the probe frame, and one of the ears is provided with a notch.

[0025] Due to the different types of probes, some probes are set perpendicular to the probe frame, and some probes are set inclined to the probe frame. Therefore, during the assembly process, due to the limited distance between the seat body 2 and the probe frame and the different angle setting methods, during the assembly process, the above distance cannot be reasonably applied to meet the assembly conditions of all probes. Therefore, the connection method of the elastic seat can be changed to meet the assembly of all probes, thereby avoiding the ears well.

[0026] Preferably, the probe frame is provided with a water nozzle for connecting to a water supply pipe; the bottom surface of the probe frame is provided with a water tank, and the water nozzle is connected to the water tank.

[0027] The water nozzle can provide a water source for the probe. At the same time, since a water tank is provided, it can make the coupling water flow between the probe and the wheel, thereby stably and continuously providing coupling water to the probe to better realize wheel flaw detection.

[0028] Probe carrier, comprising:

[0029] Support frame;

[0030] A movable plate 1, one end of which is rotatably connected to the support frame;

[0031] A second movable plate, one end of which is rotatably connected to the support frame; and

[0032] Power device 1, used for driving moving plate 1 and moving plate 2 to move toward or away from each other;

[0033] Wherein, a plurality of probe fixtures as described above are disposed on both the first movable plate and the second movable plate, and the probe fixtures are connected to the corresponding movable plates through their mounting clamps.

[0034] Since the wheel is a circular structure with an arc-shaped edge, it is different from a linear structure. The fitting of the wheel cannot be achieved through a one-time drive, because the fitting of the arc surface cannot be guaranteed, and if the wheel is fitted directly in a preset arc state, the tangent may be inconsistent, which may cause the probe to directly collide with the wheel and cause damage. Therefore, by performing a secondary drive for the fitting operation in the form of expansion and closure, the above-mentioned problem can be well avoided. Therefore, after the support frame stops moving, the movable plate 1 and the movable plate 2 are expanded to avoid this problem. The support frame can drive the probe to move to the position for detecting the wheel. When the support frame is in the appropriate position, the power device 1 is started to make the movable plate 1 and the movable plate 2 move away from each other, so that the probe frame of each probe fixture can better fit the wheel. After the detection is completed, the power device 1 repeatedly drives the movable plate 1 and the movable plate 2 to move toward each other and reset.

[0035] Preferably, it also includes:

[0036] The tread leans on the wheel, and the tread leans on the wheel and is connected to the support frame, and is used for fitting the wheel from above.

[0037] In the process of the support frame driving the probe fixture to move close to the wheel, the support frame cannot move indefinitely, that is, when the support frame moves to a preset position, it needs to stop moving. At this time, this problem can be well solved by setting a tread leaning wheel. When the tread leaning wheel fits the wheel, it means that the probe carrier has moved into place. Therefore, the probe carrier stops moving at this time, so that the power device 1 can start to unfold the moving plate 1 and the moving plate 2, so that the probe fixture starts to fit the wheel.

[0038] Preferably, it also includes:

[0039] An arc plate 1 arranged corresponding to the moving plate 1; and

[0040] Arc plate 2 is arranged corresponding to moving plate 2;

[0041] Wherein, a sliding plate mechanism is provided between the arc plate 1 and the moving plate 1, and between the arc plate 2 and the moving plate 2;

[0042] The arc plate 1 and arc plate 2 are located on the same side of the probe carrier, one part of the probe fixture is installed with the inner side probe of the wheel, which is arranged on the sliding plate mechanism, and the other part of the probe fixture is installed with the wheel tread probe, which is arranged on the other side of the probe carrier.

[0043] For some probes, they can fit the inner side of the wheel. Therefore, although some probes can fit the wheel tread after the support frame reaches the moving position and the movable plate 1 and the movable plate 2 are unfolded to each other, other probes cannot fit the inner side of the wheel. In other words, there is still a gap between this part of the probes and the inner side of the wheel, and thus it cannot meet the requirements of flaw detection well. Based on this, the sliding plate mechanism is used to drive this part of the probes to move so that this part of the probes fits the inner side of the wheel, which can better realize wheel flaw detection.

[0044] Preferably, the sliding plate mechanism comprises:

[0045] A slide plate, wherein the slide plate is arranged between the corresponding moving plate and the arc plate through a guide rod guide mechanism; and

[0046] Power device 2, used for driving the slide plate to move along the guide direction of the guide rod guide mechanism;

[0047] Wherein, a probe fixture is arranged on the slide plate.

[0048] The sliding plate mechanism drives the slide plate through power device 2 to drive the probe fixture, so that the probe on the probe fixture fits the inner side of the wheel. The guide rod guide mechanism is used to well determine the movement direction of the slide plate, thereby better meeting the probe fitting requirements and avoiding movement dislocation.

[0049] Preferably, the sliding plate mechanism further comprises:

[0050] The inner side leaning wheel is arranged on the skateboard, located between the corresponding moving plate and the arc plate, and is used for leaning against the inner side of the wheel.

[0051] When the probe contacts the inner side of the wheel, the power device 2 needs to stop moving. If the power device 2 continues to move, the wheel may be vibrated by force, which not only affects the flaw detection effect, but also easily causes damage to the probe. Therefore, the inner wheel can give a prompt to the sliding plate mechanism. That is to say, when the inner wheel contacts the inner side of the wheel, the relative distance between the inner wheel and the wheel can be detected by the sensor. When the distance reaches the threshold, the driving device 2 is triggered to stop moving, indicating that the skateboard has moved into place.

[0052] Preferably, it also includes:

[0053] Two clamping wheels are respectively arranged at the ends of the movable plate 1 and the movable plate 2 which are far away from each other and are used for clamping against the wheel rim.

[0054] When performing wheel flaw detection, the wheel may be in an unstable state, such as position offset, jumping, etc., which will affect the flaw detection operation and the flaw detection effect. When the clamping wheel fits the wheel, the relative distance between the clamping wheel and the wheel can be detected by the sensor. When the distance reaches the threshold, the driving device is triggered to stop and the sliding plate mechanism starts to move, so that the probe used to fit the inner side of the wheel moves to fit the inner side of the wheel; by fitting the wheel with two clamping wheels, the distance between each probe fixture and the wheel surface can be kept constant. In other words, in the process of rotating the wheel for flaw detection, the wheel is limited by the clamping wheel to avoid the situation where the wheel jumps and affects the wheel flaw detection, thereby better realizing wheel flaw detection.

[0055] Preferably, it also includes an intermediate leaning wheel, which is connected to the support frame and is used to fit the wheel from the inner side of the wheel.

[0056] The inner supporting wheel can realize radial positioning of the wheel. However, the on-track state of the wheel is uncertain at this time. If there is an angle between the plane where the side of the wheel is located and the plane where the side of the track is located, some probes will not be able to fit well on the wheel. Therefore, on the basis that the sliding plate mechanism can promote the movement of the skateboard, the middle supporting wheel is used to form a fulcrum, which is more conducive to the fit between the probe and the wheel. In other words, the middle supporting wheel and the coordinated tread supporting wheel can achieve the effect of axial positioning while radially positioning the wheel, so as to better meet the requirements of flaw detection.

[0057] Preferably, in the probe on the inner side of the wheel, the symmetry line between the arc plate 1 and the arc plate 2 is used as the reference line, including:

[0058] At least one pair of phased array probes, wherein the two probes in any pair of phased array probes are arranged opposite to each other and are located on both sides of the reference line, the torsion angle of the phased array probe is 0°, the transmitting angle and the receiving angle are -20° to 20°, and the sound beam of the phased array probe is 45° to the inner side of the wheel;

[0059] At least one pair of 60° oblique probes, wherein the two probes in any pair of 60° oblique probes are arranged back to back and located on both sides of the reference line, and the twist angle of the 60° oblique probes is 5° to 35°;

[0060] At least one pair of 70° angle probes, with the two probes in any pair of 70° angle probes being arranged opposite to each other and located on both sides of the reference line; and

[0061] A plurality of constant super probes, some of which are located on one side of the baseline, and another portion of which are located on the other side of the baseline, and the constant super probes point to the center of the wheel.

[0062] The layout of the probes on the inner side of the wheel will affect the actual flaw detection effect. Therefore, these probes need to be arranged reasonably. This layout method is not a simple combination. It is necessary to consider the position of the probe to achieve comprehensive coverage. Different from some probe layouts in the current prior art, the above layout method can not only improve the reliability of comprehensive flaw detection, but also effectively save the layout space of the probes and increase the flaw detection range to simultaneously meet the upper and lower chamfer defects, axial defects, and radial defects on the outer side of the wheel.

[0063] Preferably, in the wheel tread probe, the symmetry line between the arc plate 1 and the arc plate 2 is used as the reference line, including:

[0064] At least two pairs of phased array probes, the two probes in any pair of phased array probes are arranged opposite to each other and located on both sides of the reference line, the transmitting angle and receiving angle of each phased array probe are 10° to 40°, and the twist angle is 5° to 35°; and

[0065] A plurality of constant super probes, some of which are located on one side of the baseline, and another portion of which are located on the other side of the baseline, and the constant super probes point to the center of the wheel.

[0066] Similar to the layout of the probes on the inner side of the wheel, the layout of the probes on the wheel tread can not only improve the reliability of comprehensive flaw detection, but also effectively save the layout space of the probes and increase the flaw detection range, so as to simultaneously meet the requirements of detecting the inner and outer circumferential and radial defects of the spoke plate on the wheel tread and the internal circumferential and axial defects of the rim part.

[0067] Compared with the prior art, the present invention can not only prevent the probe in the probe fixture from having a poor fitting effect due to the uneven wheel surface and / or tread slope, but can also adapt to wheels of different specifications. In addition, the present invention also realizes secondary vibration damping when the wheels are in contact; the present invention can realize the automatic fitting of the wheel tread probe and the wheel inner side probe, thereby realizing automation and accuracy of flaw detection, and effectively improving flaw detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0068] Figure 1 A schematic diagram of a probe fixture for setting a normal super probe in an embodiment of the present invention;

[0069] Figure 2 for Figure 1 Right view of;

[0070] Figure 3 for Figure 1 Schematic diagram of the other direction;

[0071] Figure 4 A schematic diagram of a probe fixture for setting a phased array probe in an embodiment of the present invention;

[0072] Figure 5for Figure 3 A front view of

[0073] Figure 6 for Figure 4 A schematic diagram of another direction;

[0074] Figure 7 is a schematic diagram of a probe carrier in an embodiment of the present invention;

[0075] Figure 8 for Figure 7 A front view of

[0076] Fig. 9 for Figure 7 Bottom view of

[0077] Fig.10 It is a schematic diagram of the arrangement of the slide plate in an embodiment of the present invention;

[0078] Fig.11 for Fig.10 Schematic diagram of the other direction;

[0079] Fig.12 A schematic diagram of a tread support wheel and an intermediate support wheel for positioning a wheel in an embodiment of the present invention;

[0080] Fig.13 for Figure 7 A schematic diagram of another direction;

[0081] Fig.14 Schematic diagram of the layout of the wheel inner side probe in an embodiment of the present invention;

[0082] Fig.15 for Fig.14 Schematic diagram of the layout of the phased array probe;

[0083] Fig.16 for Fig.15 A top view of

[0084] Fig.17 for Fig.14 Schematic diagram of the layout of the Zhongchangchao probe;

[0085] Fig.18 for Fig.17 A top view of

[0086] Fig.19 for Fig.14 Schematic diagram of the arrangement of the mid-angle 60° probe;

[0087] Fig. 20 for Fig.19 A top view of

[0088] Fig.21 for Fig.14Schematic diagram of the arrangement of the mid-angle 70° probe;

[0089] Fig. 22 for Fig.21 A top view of

[0090] Fig.23 Schematic diagram of the layout of the wheel tread probe in an embodiment of the present invention;

[0091] Fig.24 for Fig.23 Schematic diagram of the position of the phased array probe;

[0092] Fig.25 for Fig.23 Schematic diagram of the medium PE mode;

[0093] Fig.26 for Fig.23 Schematic diagram of the PC mode;

[0094] Fig. 27 for Fig.23 Schematic diagram of the Zhongchangchao probe detecting the internal circumferential and axial defects of the rim, web and transition zone;

[0095] Fig.28 for Fig.23 Schematic diagram of the Zhongchangchao probe detecting the internal circumferential and axial defects of the rim;

[0096] Fig.29 for Fig.28 Top view of the .

[0097] In the figure: 100-probe fixture; 1-Changchao probe; 2-phased array probe; 3-mounting clamp; 4-probe frame; 5-seat body one; 6-elastic part one; 7-guide rail; 8-slider; 9-seat body two; 10-elastic part two; 11-support ear; 12-rotation pin; 13-waist hole; 14-spring seat; 15-notch; 16-support frame; 17-moving plate one; 18-moving plate two; 19-expansion and retraction cylinder one; 20-expansion and retraction cylinder two; 21-tread support wheel; 22-arc plate one; 23-arc plate two; 24-slide plate; 25-power equipment two; 26-guide rod; 27-inner support wheel; 28-opening; 29-arc guide rail; 30-adjustment plate; 31-holding support wheel; 32-water nozzle; 33-water tank; 34-anti-wear nail; 35-middle support wheel. DETAILED DESCRIPTION

[0098] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention is further described in detail below in conjunction with specific implementation methods.

[0099] When inspecting a wheel, the wheel is usually placed on a predetermined track, and an inspection device is set up on the track, so that the wheel can be inspected at a predetermined position using the inspection device. Generally speaking, when the wheel is located on the predetermined track, the inspection device moves the probe carrier through its driving mechanism, and the probe carrier carries the probe fixture 100 to the wheel, and then through a series of power equipment, the probe on the probe carrier is accurately and stably attached to the wheel surface, so that the wheel is inspected using the probe. It should be noted that these probes are generally ultrasonic probes, including a normal ultrasonic probe 1 and a phased array probe 2. This embodiment is mainly used for wheel flange, spoke plate, and wheel rim inspection, and the attached wheel surface refers to the wheel tread and the inner side of the wheel.

[0100] like Figure 1 to Figure 6 As shown, a probe clamp 100 includes a mounting plate 3, an elastic adjustment mechanism, a probe frame 4 and an elastic floating mechanism; the elastic adjustment mechanism is connected to the mounting plate 3; a probe is installed on the probe frame 4, and the probe frame 4 is connected to the elastic adjustment mechanism; the elastic floating mechanism is arranged between the elastic adjustment mechanism and the probe frame 4.

[0101] When the probe frame 4 carries the probe to fit the wheel surface, the elastic floating mechanism first realizes contact vibration reduction. If the wheel surface is uneven and / or there is a tread slope, the probe frame 4 will be deflected relative to the wheel so that the probe can fit well on the wheel surface. In this process, since wheels have different sizes, the elastic adjustment mechanism can achieve self-adaptation so that the probe fixture 100 can fit wheels of various specifications, thereby expanding the scope of use and reducing the cost of use.

[0102] Further, the elastic adjustment mechanism includes a seat body 5 and an elastic member 6; the seat body 5 is connected to the probe frame 4 through a guide rail and slider mechanism; the elastic member 6 is arranged between the seat body 5 and the mounting clamp plate 3. In this embodiment, the guide rail and slider mechanism includes a guide rail 7 and a slider 8, the guide rail 7 is arranged on the seat body 5, and the slider 8 is arranged on the mounting clamp plate 3. Through the sliding cooperation of the guide rail 7 and the slider 8, there is a corresponding sliding guide between the seat body 5 and the mounting clamp plate 3. The elastic member 6 has two, which are respectively located on both sides of the guide rail 7.

[0103] Furthermore, the elastic floating mechanism includes a seat body 29, an elastic member 210 and a support ear 11; the seat body 29 is connected to the probe frame 4; the elastic member 210 is arranged between the seat body 29 and the probe frame 4; one of the support ear 11 and the probe frame 4 is provided with a rotating pin 12, and the other is provided with a waist-shaped hole 13 movably connected to the rotating pin 12, and the support ear 11 is also connected to the seat body 29; the straight line where the long diameter of the waist-shaped hole 13 is located is parallel to the guiding direction of the guide rail 7. The seat body 29 is specifically connected to the seat body 1 and is located at the lower end of the seat body 15. Since the probe frame 4 is a rectangular structure, an elastic member 210 is connected to the four corners of the probe frame 4, so that when the probe frame 4 carries the probe to contact the wheel surface, it can better adapt to the uneven wheel surface and / or tread slope, and also better achieve the purpose of vibration reduction. Figure 1 and Figure 4 As shown, if the wheel surface is uneven and / or there is a tread slope, the probe frame 4 moves up and down, swings forward and backward and left and right through the waist hole 13, the rotating pin 12, and the elastic member 10 to ensure that the probe frame 4 carries the probe and fits the wheel surface. In other words, the probe frame is limited within a certain range by the lug and the rotating pin, and the elastic member 2 allows the probe frame to float within the limited range, which not only achieves a primary vibration damping, but also enables the probe frame to adapt to the wheel arc in the circumferential direction of the wheel, and can also reduce the deviation of the normal line tangent to the probe and the wheel from the wheel center caused by the change in wheel diameter. At the same time, due to the setting of the rotating pin, the probe frame can adapt to the tread arc of wheels of different models in the axial direction of the wheel. On the basis of the elastic adjustment mechanism, the probe frame as a whole can only move along the guide rail direction relative to the mounting clamp. In this embodiment, the elastic member 1 is a tension spring, so the elastic member 1 has a pre-tension force, so the slider is always located at the limit position of the slide rail due to the action of the elastic member 1, thereby providing a secondary vibration damping for the probe frame, and also enabling the probe frame to fit more stably on the wheel surface.

[0104] Since the arrangement of the normal super probe 1 and the phased array probe 2 on the probe frame 4 is different, generally the normal super probe 1 is perpendicular to the upper surface of the probe frame 4, and the phased array probe 2 is inclined to the upper surface of the probe frame 4, the arrangement of the elastic member 10 is different for different probes. Figure 1 and Figure 2As shown, the elastic floating mechanism also includes a spring seat 14. When the probe fixture 100 is provided with the Changchao probe 1, the spring seat 14 is located between the seat body 9 and the probe frame 4, and at the same time, the spring seat 14 is connected to the inner side of the lug 11. Since there is an inclination angle between the phased array probe 2 and the probe frame 4, and according to the specific setting conditions, the inclination angle should be in the direction of a side lug, if the phased array probe 2 is set in the same way as the Changchao probe 1, the phased array probe 2 will not be able to be installed on the probe frame 4. It is known that no matter what kind of probe is used, a joint needs to be provided, so the joint should also avoid the spring seat 14 and the lug 11. Therefore, when assembling the phased array probe 2 according to the inclination angle, it is best to extend the phased array probe 2 by opening a notch 15 in a side lug. As shown in FIG. Figure 4 and Figure 5 As shown, when the phased array probe 2 is arranged on the probe frame 4, the spring seat 14 is connected to the inner side or the outer side of the seat body 9. Such an arrangement can firstly avoid assembly interference between the phased array probe 2 and the spring seat 14 and the lug. At the same time, in order to further avoid the phased array probe 2, the lug 11 on one side of the phased array probe 2 that is tilted and extends out of the probe frame 4 can be provided with a notch 15.

[0105] In order to better use this embodiment, the probe frame 4 is provided with a water nozzle 32 for connecting to a water supply pipe; the bottom surface of the probe frame 4 is provided with a water tank 33, and the water nozzle 32 is connected to the water tank 33. By providing the water nozzle 32 and the water tank 33, a stable water film is formed between the probe and the surface of the wheel to be attached, which effectively improves the coupling effect between the probe and the wheel. In particular, when the probe is a phased array probe 2, in order to avoid motion interference between the water supply pipe and the probe, a water pipe groove is provided at the spring seat 14, so that the water supply pipe can be connected to the water nozzle 32 through the water pipe groove limiter. It is known that only after the water supply pipe is connected to the water nozzle 32, can coupling water be provided to the probe during the flaw detection process. The water supply pipe used for flaw detection is generally a hose. Since the hose itself has a certain deformation ability and can move simultaneously with the probe, on the basis of setting a water pipe groove, the water outlet end of the water supply pipe can be limited. This not only ensures the movement synchronization between the water supply pipe and the probe, but also avoids the separation of the water supply pipe and the water nozzle 32 due to movement.

[0106] In addition, anti-wear nails 34 are provided on the bottom surface of the probe frame 4. The anti-wear nails 34 are made of carbon steel with relatively high hardness, which can effectively slow down the wear speed of the ultrasonic probe.

[0107] It is known that the probe is connected to the probe carrier through the probe fixture 100, and the probe carrier is driven to move by the driving mechanism of the detection device, so that the probe frame 4 carrying the probe fits the wheel surface. Figure 7 to Figure 11As shown, a probe carrier comprises a support frame 16, a movable plate 17, a movable plate 18 and a power device 1; one end of the movable plate 17 is rotatably connected to the support frame 16; one end of the movable plate 18 is rotatably connected to the support frame 16; the power device 1 is used to drive the movable plate 17 and the movable plate 18 to move toward or away from each other; the movable plate 17 and the movable plate 18 are both provided with a plurality of probe fixtures 100 as described above, and the probe fixtures 100 are connected to the corresponding movable plates through their mounting clamps 3.

[0108] The movement of the probe carrier carrying the probe fixture 100 is achieved by driving the support frame 16 to move through the driving mechanism. The ends of the movable plate 17 and the movable plate 2 18 that are close to each other are rotatably connected to the support frame 16. The power device 1 has two, namely, the unfolding and retracting cylinder 19 and the unfolding and retracting cylinder 2 20. The unfolding and retracting cylinder 19 and the unfolding and retracting cylinder 2 20 act synchronously. The unfolding and retracting cylinder 19 is used to drive the movable plate 17, and the unfolding and retracting cylinder 2 20 is used to drive the movable plate 2 18. This embodiment is explained through the action connection between the unfolding and retracting cylinder 19 and the movable plate 17, and thus the action connection between the unfolding and retracting cylinder 2 20 and the movable plate 2 18 can be determined without any doubt. Figure 8 As shown, when the extension cylinder 19 is in the extended state, the movable plate 17 rotates counterclockwise, so that the probe frame 4 is close to the wheel surface. After the flaw detection is completed, the extension cylinder 19 switches to the retracted state, that is, the movable plate 17 rotates clockwise to reset. However, under the action of the driving mechanism, the probe carrier is away from the wheel.

[0109] Further, such as Figure 8 and Fig.13 , and further includes a tread wheel 21, which is connected to the support frame 16 and is used to fit the wheel from above the wheel. When the tread wheel 21 fits the wheel, the driving mechanism stops moving, and the power device can be driven to start, so that the probe fixture 100 starts to fit the wheel. Therefore, through the setting of the tread wheel 21, the driving mechanism can be well linked, so as to better meet the purpose of fitting the probe to the wheel.

[0110] In this embodiment, it also includes an arc plate 1 22 corresponding to the movable plate 1 17, and an arc plate 2 23 corresponding to the movable plate 2 18; a sliding plate mechanism is provided between the arc plate 1 22 and the movable plate 1 17, and between the arc plate 2 23 and the movable plate 2 18; the arc plate 1 22 and the arc plate 2 23 are located on the same side of the probe carrier, wherein a part of the probe fixture 100 is provided on the sliding plate mechanism, and another part of the probe fixture 100 is provided on the other side of the probe carrier. This embodiment is explained by the sliding plate mechanism provided between the arc plate 1 22 and the movable plate 1 17, and thus the effect of the sliding plate mechanism between the arc plate 2 23 and the movable plate 2 18 can be determined without doubt.

[0111] Furthermore, the sliding plate mechanism includes a slide plate 24 and a power device 25; the slide plate 24 is arranged between the corresponding moving plate and the arc plate through a guide rod 26 guide mechanism; the power device 25 is used to drive the slide plate 24 to move along the guide direction of the guide rod 26 guide mechanism; and a probe fixture 100 is arranged on the slide plate 24. Since the slide plate 24 and the corresponding moving plate are connected, the probe fixture 100 arranged on the slide plate 24 can be considered to be arranged on the moving plate. The guide rod 26 guide mechanism includes a plurality of guide rods 26, and the axes of the plurality of guide rods 26 are parallel. As for the arc plate 22 and the moving plate 17, the guide rod 26 is arranged between the two, and the slide plate 24 is arranged between the arc plate 22 and the moving plate 17, and slides with the guide rod 26. When the power device 1 is driven into place, the power device 25 is started to push the slide plate 24 to slide from the arc plate 22 toward the moving plate 17, so that the probe on the slide plate 24 fits well on the inner side of the wheel, thereby meeting the requirements for wheel flaw detection. Based on this, Figure 7 and Fig.13 As shown, the sliding plate mechanism also includes an inner side supporting wheel 27, and the inner side supporting wheel 27 is arranged on the slide plate 24, between the corresponding moving plate and the arc plate, and is used to abut against the inner side of the wheel. At the same time, a sensor 1 is provided on one side of the inner side supporting wheel 27, which is used to detect the relative position between the inner side supporting wheel 27 and the wheel, and the sensor 1 is communicatively connected with the power device 2 25. It can be seen that since the probe carrier is relatively long, the abutment accuracy can be improved by setting a plurality of inner side supporting wheels 27. In the process of the inner side supporting wheel 27 abutting against the wheel, the sensor 1 constantly detects the relative distance between the inner side supporting wheel 27 and the wheel. Therefore, when the threshold is reached, the power device 2 25 can be triggered to stop the action, and at this time, the probe on the slide plate 24 is in contact with the inner side of the wheel. It should be noted that the same arc plate 1 22 and arc plate 2 23 are provided on both sides of the probe carrier, as shown in FIG. Figures 9 to 11As shown, a sliding plate mechanism is provided between the front arc plate and the movable plate, that is, a part of the probe fixture 100 is provided on the front side, and no sliding plate mechanism is provided between the rear slide plate 24 and the movable plate, that is, another part of the fixture is provided on the rear arc plate. For the front side, an opening 28 is provided on the slide plate 24, and the probe fixture 100 can slide on the edge of the opening 28, so that the position can be adjusted along the radial direction of the arc plate. For the rear side, an arc-shaped guide rail 29 is provided on the movable plate, and an adjustment plate 30 is slidably connected to the arc track, and the plane where the adjustment plate 30 is located is perpendicular to the plane where the movable plate is located. The probe fixture 100 on this side is adjustably provided on the adjustment plate 30, so that the probe fixture 100 on this side can adjust the relative position on the probe carrier by sliding the adjustment plate 30 on the arc-shaped guide rail 29, and can also adjust the front and rear displacement by sliding on the adjustment plate 30. It is known that the probe fixture 100 can also be fixedly set on the probe carrier. Of course, compared with this embodiment, this setting method has the defect that it cannot adapt to the actual flaw detection scheme and has great limitations. It should also be noted that in this embodiment, in the technical solution of using sensors to cooperate with power equipment, the power equipment stops the action through sensor feedback, which means that the power equipment stops at the threshold position and stays at the threshold position, indicating that the movement is in place and maintained, rather than the power equipment receiving the sensor feedback signal and resetting.

[0112] Therefore, compared with the prior art, this embodiment has the diversity of flaw detection and can realize flaw detection in various positions of the wheel at the same time, so that a part of the probes can fit well to the wheel tread, and based on the sliding plate mechanism, another part of the probes can fit well to the inner side of the wheel, thereby ensuring the accuracy of flaw detection.

[0113] During the flaw detection process, the wheel may roll. Therefore, if the wheel can be further positioned, it will be more conducive to accurate flaw detection. Therefore, in this embodiment, Figure 8 As shown, it also includes two clamping wheels 31, which are respectively arranged at the ends of the movable plate 1 17 and the movable plate 2 18 away from each other, and are used to abut against the wheel rim. A sensor 2 is provided on one side of the clamping wheel 31, which is used to detect the relative position between the clamping wheel 31 and the wheel. The sensor 2 is connected to the sliding plate mechanism and is connected to the power device 1. The following is explained by the clamping wheel 31 arranged on the movable plate 1 17. At the same time, the working mode of the clamping wheel 31 arranged on the movable plate 2 18 can also be determined without doubt. After the power device 1 is started, the clamping wheel 31 moves under the drive of the movable plate 1 17 until it abuts against the wheel. During this process, the sensor 2 constantly detects the relative distance between the clamping wheel 31 and the wheel. After reaching the threshold, the power device 1 is triggered to stop moving. Therefore, the wheel can be stopped at a determined position by the two clamping approaches.

[0114] like Fig.12 and Fig.13 As shown, in this embodiment, in order to better achieve wheel positioning, an intermediate leaning wheel 35 is also included, and the intermediate leaning wheel 35 is connected to the support frame 16 and is used to fit the wheel from the inner side of the wheel. In other words, during the movement of the driving mechanism, the axial positioning of the wheel is achieved through the intermediate leaning wheel 35, so that it can cooperate with the tread leaning wheel 21 to make the wheel meet the positioning requirements in both the radial and axial directions. At this time, by holding the leaning wheel 31 to abut against the wheel, the probe fitting requirement can be better met. Similarly, the relative distance between the intermediate leaning wheel and the inner side of the wheel can be detected by setting a third sensor, so as to meet the motion control requirements.

[0115] Therefore, in this embodiment, the driving mechanism drives the support frame 16 to move, and the tread support wheel 21 and the middle support wheel 35 contact the wheel. At this time, the driving mechanism stops moving, and then the power equipment is started, so that the clamping wheel 31 clamps the wheel to prevent the wheel from rotating, jumping or displacing, etc., so that the distance between the probe fixture 100 and the wheel is constant, and at the same time, the probe not set on the sliding plate mechanism can also fit the wheel tread well. Then the sliding plate mechanism moves, so that the probe set on the slide plate 24 fits the inner side of the wheel. When the inner side support wheel 27 contacts the wheel, the slide plate 24 stops moving. At this time, the probe set on the slide plate 24 is fitted on the inner side of the wheel, so that all probes can fit the wheel surface well, so that high-precision flaw detection can be performed when the wheel is stable.

[0116] It should be noted that since wheels are key components of the running system of locomotives and vehicles, the internal state of the wheels and the cracks on the surface are directly related to driving safety. With the rapid development of railway speed-up and the large-scale operation of high-speed EMUs, higher requirements are placed on the quality of wheels. Therefore, in order to ensure the quality of wheelsets and ensure the safety of train driving, it is necessary to conduct regular flaw detection on the wheel rims and spokes. The most effective method for wheel flaw detection is ultrasonic testing. The principle is that if there are defects such as pores, cracks, delamination (gas in the defects) or inclusions in the medium, that is, the wheel, when the ultrasonic wave propagates to the interface between the medium and the defect, it will be fully or partially reflected. The reflected ultrasonic wave is received by the probe, and the depth, position and shape of the defect in the workpiece can be judged according to the changing characteristics of the waveform. The advantages of ultrasonic flaw detection are large detection thickness, high sensitivity, fast speed, low cost, harmlessness to the human body, and the ability to locate and quantify defects, which is suitable for non-destructive flaw detection of rims and spokes. Due to the special shape of the wheel rim, the complex structure of the spoke area and the long distance from the tread surface, a large number of probes are required to detect the entire rim spoke area, and strict requirements are placed on the probe layout, especially for online detection, which has greater space constraints.

[0117] Therefore, the layout of the probe is particularly important for the entire detection process and the effectiveness of the flaw detection results, such as Fig.14As shown, in this embodiment, in the probe on the inner side of the wheel, the symmetry line between the arc plate 1 22 and the arc plate 2 23 is used as the reference line, including at least one pair of phased array probes, at least one pair of 60° oblique probes, at least one pair of 70° oblique probes, and multiple constant super probes; the two probes in any pair of phased array probes are arranged oppositely and located on both sides of the reference line, the torsion angle of the phased array probe is 0°, the transmission angle and the receiving angle are -20° to 20°, and the sound beam of the phased array probe is 45° to the inner side of the wheel; the two probes in any pair of 60° oblique probes are arranged oppositely and located on both sides of the reference line, and the torsion angle of the 60° oblique probe is 5° to 35°; the two probes in any pair of 70° oblique probes are arranged oppositely and located on both sides of the reference line; a part of the constant super probes are located on one side of the reference line, and another part of the constant super probes are located on the other side of the reference line, and the constant super probes point to the center of the wheel. It should be known that for a wheel, it has a rolling circle, and the torsion angle is the angle between the transmission angle or the receiving angle and the rolling circle. 12# and 13# are phased array probes; 14# and 15# are 60° oblique probes; 16# and 17# are 70° oblique probes; 10# and #11 are constant wave probes, specifically T / R longitudinal wave straight probes. Fig.16 As shown, in this embodiment, the phased array probe can be connected to the probe fixture 100 by using a wedge with a 45° slope, so that after the probe is attached to the inner side of the wheel, a 45° angle is formed between the sound beam of the phased array probe and the inner side of the wheel, thereby better meeting the flaw detection requirements of the phased array probe. In addition, it should be noted that in the probe on the inner side of the wheel, the phased array probe uses a transverse fan scanning method for flaw detection. Fig.15 and Fig.16 As shown in the figure, the phased array probes are located at -15 to -20 mm below the tread reference line on the inner side of the rim, and mainly detect the lower chamfer, outer side, upper chamfer, tread and inside of the rim. Fig.17 and Fig.18 As shown in the figure, the normal probe is located at -10 to -30 mm below the tread reference line, and is mainly used to detect circumferential and radial defects inside the rim; the oblique probe is placed at -11 mm below the tread reference line. When installing the probe, a torsion angle is provided for the probe to emit the sound beam to the outside of the wheel. Fig.19 and 20 As shown in the figure, the 60° angle probe mainly detects radial defects on the top of the rim, such as Fig.21 and Fig. 22 As shown in the figure, the 70° inclined probe is mainly used to detect radial defects on the inner side of the rim.

[0118] like Fig.23 and Fig.24As shown, the wheel tread probes include at least two pairs of phased array probes and multiple constant probes; the two probes in any pair of phased array probes are arranged opposite to each other and are located on both sides of the reference line, and the emission angle and receiving angle of each phased array probe are 10° to 40°, and the twist angle is 5° to 35°; some of the constant probes are located on one side of the reference line, and other parts of the constant probes are located on the other side of the reference line, and the constant probes point to the center of the wheel. Fig.23 and Fig.24 As shown, P11, P21, P31, and P41 are phased array probes. The rolling circle is used as the radial reference, and the distance above the radial reference is positive, and the distance below the radial reference is negative. P11 and P21 are a pair of phased array probes, which are -3 to 8 mm away from the radial reference and are mainly used to detect circumferential and radial defects on the inner side of the spoke; P31 and P41 are a pair of phased array probes, which are 1 to 10 mm away from the radial reference and are mainly used to detect circumferential and radial defects on the inner side of the spoke; each pair of phased array probes is set to a self-transmitting and self-receiving mode (PE mode) and a transmitting and receiving mode (PC mode), where, as shown in FIG. Fig.25 As shown in the figure, the PE mode mainly detects radial defects inside and outside the spoke; Fig.26 As shown in the figure, the PC mode mainly detects circumferential defects on the inner and outer sides of the spoke. Conventional TR probes are set on both sides of the rolling circle, with an axial distance of -10 to 40 mm from the rolling circle. T11, T21, T31, T41, and T51 are conventional probes, specifically T / R longitudinal wave straight probes, such as Fig. 27 As shown, T11, T21, and T31 detect internal circumferential and axial defects of the rim, spoke plate, and transition zone; Fig.28 and Fig.29 As shown, T41 and T51 detect the internal circumferential and axial defects of the rim part.

[0119] The PC mode is explained as follows: in each pair of probes, the transmitting angle of the transmitting probe and the receiving angle of the receiving probe are the same, and the torsion angles are the same. In the transmitting probe on one side and the receiving probe on the other side, one transmits a signal and the other receives a signal, forming a V-shaped ultrasonic path for transmission and reception.

[0120] In each pair of wheel tread probes, each pair of phased array probes is 160 to 370 mm apart, and can detect positions closer to and farther from the tread. Since the two phased array probes in the same pair have opposite twist angles, the inner and outer sides of the spoke can be detected separately.

[0121] As for T11, T21, T31, T41, and T51, their transmitting paths point from the probe to the center of the wheel, and their receiving paths are in the opposite direction, that is, their detection paths overlap with the radial direction of the wheel. When there is a circumferential defect in the wheel spoke, when the transmitting signal propagates to the circumferential defect, due to the reflection of the defect on the ultrasonic wave, the ultrasonic wave will be reflected back to the probe along the original path, and the circumferential defect will be detected. Therefore, defects at the rim and the junction of the rim and the spoke can be detected at close range; at the same time, circumferential defects in the spoke area, above the spoke plate holes, and on the detection radius without spoke plate holes can also be detected. And because these part of the constant super probes are located on both sides of the rolling circle, these probes can detect circumferential defects in the position areas distributed on both sides of the rolling circle plane without the obstruction of the spoke plate holes.

[0122] It should also be noted that the above-mentioned various probes are arranged in a staggered manner through the tread reference line and the rolling circle reference line, which also effectively avoids the path interference of the sound beam emission and reception, thereby ensuring the flaw detection effect.

[0123] The above are only preferred embodiments of the present invention. It should be noted that the above preferred embodiments should not be regarded as limiting the present invention, and the protection scope of the present invention should be based on the scope defined by the claims. For ordinary technicians in this technical field, several improvements and modifications can be made without departing from the spirit and scope of the present invention, and these improvements and modifications should also be regarded as the protection scope of the present invention.

Claims

1. A probe carrier, characterized in that: include: Support frame; A movable plate 1, one end of which is rotatably connected to the support frame; A second movable plate, one end of which is rotatably connected to the support frame; as well as Power device 1, used for driving moving plate 1 and moving plate 2 to move toward or away from each other; Wherein, a plurality of probe fixtures are arranged on the movable plate 1 and the movable plate 2, and the probe fixtures are connected to the corresponding movable plates through their mounting clamps; Also includes: An arc plate 1 arranged corresponding to the moving plate 1; and Arc plate 2 is arranged corresponding to moving plate 2; Wherein, a sliding plate mechanism is provided between the arc plate 1 and the moving plate 1, and between the arc plate 2 and the moving plate 2; The arc plate 1 and arc plate 2 are located on the same side of the probe carrier, one part of the probe fixture is installed with the inner side probe of the wheel, which is arranged on the sliding plate mechanism, and the other part of the probe fixture is installed with the wheel tread probe, which is arranged on the other side of the probe carrier.

2. The probe carrier according to claim 1, characterized in that: Also includes: The tread leans on the wheel, and the tread leans on the wheel and is connected to the support frame, and is used for fitting the wheel from above.

3. The probe carrier according to claim 1, characterized in that: The probe fixture comprises: Install the cleat; An elastic adjustment mechanism, wherein the elastic adjustment mechanism is connected to the mounting clamp; a probe frame, on which a probe is mounted, and the probe frame is connected to the elastic adjustment mechanism; and An elastic floating mechanism, wherein the elastic floating mechanism is arranged between the elastic adjustment mechanism and the probe frame; The elastic adjustment mechanism comprises: A seat body 1, wherein the seat body 1 is connected to the probe frame via a guide rail slider mechanism; and Elastic member 1, the elastic member 1 is arranged between the seat body 1 and the mounting clamping plate; The elastic floating mechanism comprises: A second seat body, wherein the second seat body is connected to the elastic adjustment mechanism; A second elastic member, wherein the second elastic member is disposed between the second seat body and the probe frame; and A support ear, wherein one of the support ear and the probe frame is provided with a rotating pin, and the other is provided with a waist-shaped hole movably connected to the rotating pin, and the support ear is also connected to the second seat body; The elastic floating mechanism also includes a spring seat; Wherein, the spring seat is connected to the support ear and is located between the second seat body and the probe frame, and the second elastic member is connected between the spring seat and the probe frame; or The spring seat is connected to the second seat body, the second elastic member is connected between the spring seat and the probe frame, and one of the ears is provided with a notch.

4. The probe carrier according to claim 3, characterized in that: The probe frame is provided with a water nozzle for connecting to a water supply pipe; the bottom surface of the probe frame is provided with a water tank, and the water probe carrier nozzle is connected to the water tank.

5. The probe carrier according to claim 1, characterized in that: The sliding plate mechanism comprises: A slide plate, wherein the slide plate is arranged between the corresponding moving plate and the arc plate through a guide rod guide mechanism; and Power device 2, used for driving the slide plate to move along the guide direction of the guide rod guide mechanism; Wherein, a probe fixture is arranged on the slide plate.

6. The probe carrier according to claim 5, characterized in that: The sliding plate mechanism further comprises: The inner side leaning wheel is arranged on the skateboard, located between the corresponding moving plate and the arc plate, and is used for leaning against the inner side of the wheel.

7. The probe carrier according to claim 1, characterized in that: Also includes: Two clamping wheels are respectively arranged at the ends of the movable plate 1 and the movable plate 2 which are far away from each other and are used for clamping against the wheel rim.

8. The probe carrier according to claim 5, characterized in that: Also includes: The middle leaning wheel is connected to the support frame and is used for fitting the wheel from the inner side of the wheel.

9. The probe carrier according to claim 1, characterized in that: In the probe on the inner side of the wheel, the symmetry line between the arc plate 1 and the arc plate 2 is used as the reference line, including: At least one pair of phased array probes, wherein the two probes in any pair of phased array probes are arranged opposite to each other and are located on both sides of the reference line, the torsion angle of the phased array probe is 0°, the transmitting angle and the receiving angle are -20° to 20°, and the sound beam of the phased array probe is 45° to the inner side of the wheel; At least one pair of 60° oblique probes, wherein the two probes in any pair of 60° oblique probes are arranged back to back and located on both sides of the reference line, and the twist angle of the 60° oblique probes is 5° to 35°; At least one pair of 70° angle probes, with the two probes in any pair of 70° angle probes being arranged opposite to each other and located on both sides of the reference line; and A plurality of constant super probes, some of which are located on one side of the baseline, and another portion of which are located on the other side of the baseline, and the constant super probes point to the center of the wheel.

10. The probe carrier according to claim 1, characterized in that: In the wheel tread probe, the symmetry line between arc plate 1 and arc plate 2 is used as the reference line, including: At least two pairs of phased array probes, the two probes in any pair of phased array probes are arranged opposite to each other and located on both sides of the reference line, the transmitting angle and receiving angle of each phased array probe are 10° to 40°, and the twist angle is 5° to 35°; and A plurality of constant super probes, some of which are located on one side of the baseline, and another portion of which are located on the other side of the baseline, and the constant super probes point to the center of the wheel.

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