Reliability testing methods, apparatus, computer equipment and storage media

Abstract

This application relates to a reliability testing method, apparatus, computer equipment, and storage medium. By providing a photovoltaic junction box sample that meets preset qualification conditions, the test area of ​​the sample is brought into contact with a test solution, and a test current is passed through the sample to perform an aging test for a preset duration. The sample after the aging test is then tested to determine whether it meets the qualification conditions. This method can assess the long-term reliability of the photovoltaic junction box under conditions of immersion in water or water wave impact.

Description

Technical Field

[0001] This application relates to the field of photovoltaic testing technology, and in particular to a reliability testing method, apparatus, computer equipment, and storage medium. Background Technology

[0002] The photovoltaic (PV) junction box is a key component of a PV module, responsible for transmitting the current generated by the PV cells. PV junction boxes typically contain one or more bypass diodes to prevent hot spot effects that could lead to power generation efficiency loss and module safety risks. Currently, most junction boxes are designed for ground-mounted power stations and rooftop distributed PV systems. Their covers and cable interfaces have poor sealing, resulting in poor long-term waterproofing. In humid climates with high rainfall, as well as in floating and offshore PV scenarios, there is a significant risk of waterproofing failure and water ingress into the junction box.

[0003] Currently, related technologies only test junction boxes in normal working environments to determine their test parameters in harsh working environments. There are no corresponding reliability testing methods for working environments such as (on water) offshore photovoltaic systems. Summary of the Invention

[0004] Therefore, it is necessary to provide a reliability testing method, apparatus, computer equipment, and storage medium that can evaluate the long-term reliability of photovoltaic junction boxes operating under conditions of immersion in water or impact from water waves.

[0005] A reliability testing method, applied to photovoltaic junction boxes, includes:

[0006] Provide a photovoltaic junction box sample to be tested, wherein the sample to be tested meets preset qualification conditions;

[0007] The test area of ​​the sample to be tested is brought into contact with the test solution, and a test current is passed through the sample to perform an aging test for a preset time.

[0008] The samples after aging tests are tested to determine whether the samples meet the qualification conditions.

[0009] In one embodiment, the step of contacting the test area of ​​the sample to be tested with the test solution and passing a test current through the sample to perform an aging test for a preset duration includes:

[0010] At a preset temperature, the sample to be tested is immersed in a solution at a preset depth, while an aging test is performed by continuously applying a test current to the sample for a first preset duration; or

[0011] At a preset temperature, the solution is continuously flowed over the surface of the sample, and the test current is continuously passed through the sample to be tested for an aging test according to a first preset time.

[0012] The test current is the rated current of the sample under test.

[0013] In one embodiment, the step of contacting the test area of ​​the sample to be tested with the test solution and passing a test current through the sample to perform an aging test for a preset duration further includes:

[0014] At a preset temperature, the sample to be tested is subjected to cyclic immersion for a first preset time period, while the rated current is applied during the cycle to perform an aging test; or

[0015] At a preset temperature, the sample to be tested is subjected to cyclic impact for a first preset time period, while the rated current is applied during the cycle.

[0016] In one embodiment, the step of cyclically immersing the sample to be tested within a first preset time period includes:

[0017] At a preset temperature, the sample to be tested is placed in a container of a preset depth, and the container is continuously filled with the solution so that the sample to be tested is immersed in the solution for a second preset time.

[0018] After the second preset time period, the solution is continuously drained to allow the soaked sample to dry for a third preset time period.

[0019] The sum of the second preset duration and the third preset duration is the total duration of each soaking cycle.

[0020] In one embodiment, the cyclic impact on the sample to be tested within a first preset time period includes:

[0021] At a preset temperature, the solution is continuously flowed over the surface of the sample to be tested, so that the sample to be tested is continuously impacted by the solution for the second preset time.

[0022] The sample to be tested, after being impacted by the solution, is allowed to stand for the third preset time period.

[0023] In one embodiment, the sample to be tested, which provides a photovoltaic junction box, includes:

[0024] Perform a visual inspection on the initial sample;

[0025] When the appearance of the initial sample meets the first preset condition, the initial sample is placed in a container and a solution is added until the solution covers the initial sample, and a test voltage is applied to the initial sample to perform a wet leakage test.

[0026] The resistance between the sample and the solution is obtained during the wet leakage current test. When the resistance meets a second preset condition, the initial sample is used as the sample to be tested.

[0027] In one embodiment, the step of testing the sample after the aging test to determine whether the sample meets the qualification conditions includes:

[0028] Perform a visual inspection on the samples after the aging test;

[0029] When the appearance of the sample meets the first preset condition, the sample is placed in a container and a solution is added until the solution covers the initial sample, and a test voltage is applied to the sample to perform a wet leakage test.

[0030] The resistance between the sample and the solution is obtained during the wet leakage current test. When the resistance meets the second preset condition, the sample to be tested is determined to meet the qualified condition.

[0031] A reliability testing device, applied to a photovoltaic junction box, includes:

[0032] The acquisition module is used to provide a sample of a photovoltaic junction box to be tested, wherein the sample meets preset qualification conditions;

[0033] The test module, connected to the acquisition module, is used to bring the test area of ​​the sample to be tested into contact with the test solution and to pass a test current into the sample to be tested for an aging test of a preset duration.

[0034] The verification module, connected to the testing module, is used to test the sample after the aging test and determine whether the sample meets the qualification conditions.

[0035] A computer device includes a memory and a processor, wherein the memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method described above.

[0036] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described above.

[0037] The aforementioned reliability testing method, apparatus, computer equipment, and storage medium provide a photovoltaic junction box sample that meets preset qualification conditions, bring the test area of ​​the sample into contact with a test solution, and pass a test current through the sample to perform an aging test for a preset duration. After the aging test, the sample is tested to determine whether it meets the qualification conditions, thus assessing the long-term reliability of the photovoltaic junction box under conditions of immersion in water or water wave impact. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 This is a flowchart of a reliability testing method according to one embodiment;

[0040] Figure 2 This is one of the specific flowcharts of the reliability testing method in step 104 of one embodiment;

[0041] Figure 3 This is a second detailed flowchart of the reliability testing method in step 104 of one embodiment;

[0042] Figure 4 This is the third detailed flowchart of the reliability testing method in step 104 of one embodiment;

[0043] Figure 5 This is the fourth detailed flowchart of the reliability testing method in step 104 of one embodiment;

[0044] Figure 6 This is a flowchart of the reliability testing method in step 402 of one embodiment;

[0045] Figure 7 This is a flowchart of the reliability testing method in step 502 of one embodiment;

[0046] Figure 8 This is a flowchart of the reliability testing method in step 102 of one embodiment;

[0047] Figure 9 This is a flowchart of the reliability testing method in step 106 of one embodiment;

[0048] Figure 10 This is a schematic diagram of the reliability testing device in one embodiment. Detailed Implementation

[0049] To facilitate understanding of this application, a more complete description will be provided below with reference to the accompanying drawings, which illustrate embodiments of the present application. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of this application will be thorough and complete.

[0050] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0051] It is understood that the terms "first," "second," etc., used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, without departing from the scope of this application, a first preset duration may be referred to as a second preset duration, and similarly, a second preset duration may be referred to as a first preset duration. Both the first preset duration and the second preset duration are preset durations, but they are not the same preset duration.

[0052] It is understood that the term "connection" in the following embodiments should be understood as "electrical connection," "communication connection," etc., if the connected circuits, modules, units, etc., have electrical signal or data transmission with each other.

[0053] When used herein, the singular forms of “a,” “an,” and “the” may also include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms “comprising / including” or “having,” etc., specify the presence of the stated features, wholes, steps, operations, components, parts, or combinations thereof, but do not preclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof. Meanwhile, the term “and / or” as used in this specification includes any and all combinations of the associated listed items.

[0054] Figure 1 Here is a flowchart of a reliability testing method according to one embodiment, with reference to... Figure 1 The reliability testing method of this embodiment is applied to photovoltaic junction boxes, and the reliability testing method includes steps 102 to 106.

[0055] Step 102: Provide a sample of the photovoltaic junction box to be tested, which meets the preset qualification conditions.

[0056] Optionally, the method for preparing the photovoltaic junction box sample includes: attaching the junction box to a small glass plate in the order of positive and negative electrodes, and connecting the junction boxes with a busbar. For example, three junction boxes can be connected together, and silicone is used to cover and seal the surface of the busbar. The preset qualification conditions may include: whether the appearance of the sample is qualified, and whether the resistance of the sample under test in a wet leakage current test is qualified. Optionally, when the box body of the sample under test does not show deformation or discoloration, and the test resistance is greater than 2000MΩ, the sample under test can be judged to be qualified.

[0057] It is understandable that the value of the test resistance in the preset qualification conditions can be adjusted according to the type and concentration of the solution. Optionally, in order to ensure more accurate test resistance, a constant temperature device can be added during the test to reduce the influence of solution temperature changes on the test resistance, thereby improving the accuracy of sample qualification judgment.

[0058] Step 104: The test area of ​​the sample to be tested is brought into contact with the test solution, and a test current is passed through the sample to perform an aging test for a preset duration.

[0059] The area to be tested can be a part of the sample or the entire sample; no specific limitation is made here.

[0060] Optionally, the test solution can be water or a saline solution with a concentration of 10-50 g / L, and the test current is the rated current of the sample under test. The aging test can be performed in 1000-hour increments to simulate the working environment of the photovoltaic junction box sample on water or at sea. It is understood that the concentration of the test solution and the preset duration of the aging test can be tightened as needed. The saline concentration here simulates the salinity range of visible sea areas, and the tightened test simulates a more severe marine testing environment.

[0061] The test current applied to the sample under test can be selected based on the state of the diode connected to the sample under test in the photovoltaic junction box. When the diode is forward conducting, a forward current is applied, and when the diode is reverse cut off, a reverse voltage is applied.

[0062] Step 106: Test the sample after the aging test to determine whether the sample meets the qualification conditions.

[0063] Among them, the detection of the sample after aging test may include: detecting the appearance of the sample and performing a wet leakage test on the sample. When the box body of the sample after aging test does not show deformation or discoloration, and the test resistance of the wet leakage test is greater than 2000 MΩ, it can be determined that the sample to be tested is qualified. The relevant description of the qualification conditions can be referred to the above description and will not be elaborated here. It can be understood that when the sample still meets the qualification conditions after aging test, it can be determined that the sample has long-term reliability in the working environment of immersion in water or under the impact of water waves; if not, it means that the sample is damaged in the working environment of immersion in water or under the impact of water waves.

[0064] The reliability test method provided in this embodiment can evaluate the long-term reliability of the photovoltaic junction box in the working environment of immersion in water or under the impact of water waves by providing a sample to be tested of a photovoltaic junction box that meets the preset qualification conditions, contacting the area to be tested of the sample to be tested with a test solution, and passing a test current through the sample to be tested for an aging test for a preset duration, and then detecting the sample after the aging test to determine whether the sample to be tested meets the qualification conditions.

[0065] Figure 2 It is a specific flowchart of step 104 in an embodiment. Refer to Figure 2 , step 104 includes sub-step 202.

[0066] Step 202: Immerse the sample to be tested in a solution with a preset depth at a preset temperature, and at the same time continuously pass a test current through the sample to be tested for an aging test according to the first preset duration.

[0067] Optionally, immerse the sample to be tested in water with a depth of 0.5 m - 2 m or in a saline solution with a concentration of 10 - 50 g / L, and at the same time pass a test current and continue for 1000 h for an aging test.

[0068] Among them, the preset temperature is room temperature, for example, it can be 10°C - 30°C, the first preset duration is a single duration for aging the sample to be tested, which can be 1000 h, and the test current is the rated current of the sample to be tested, so as to simulate the working environment of the photovoltaic junction box sample in water or at sea.

[0069] In one of the embodiments, at room temperature, immerse the sample to be tested in water with a depth of 1 m, and at the same time pass the rated current and continue for 1000 h for an aging test.

[0070] In one of the embodiments, at room temperature, immerse the sample to be tested in a saline solution with a depth of 1 m and a concentration of 35 g / L, and at the same time pass the rated current and continue for 1000 h for an aging test.

[0071] Figure 3Here is a flowchart of step 104 in one embodiment, see reference. Figure 3 Step 104 also includes sub-step 302.

[0072] Step 302: At a preset temperature, the solution is continuously flowed over the surface of the sample, and at the same time, a test current is continuously applied to the sample to be tested for aging test according to a first preset time.

[0073] The test current is the rated current of the sample under test.

[0074] Optionally, water or saline solution with a concentration of 10-50 g / L is continuously flowed over the surface of the sample to be tested, subjecting it to water flow impact. The water flow rate is 10 ml / min to 110 L / min, and a rated current is applied simultaneously for 1000 hours to conduct an aging test.

[0075] In one embodiment, the sample to be tested is subjected to a water flow impact at room temperature, with a water flow rate of 100 L / min, while a rated current is applied, for 1000 h to conduct an aging test.

[0076] In one embodiment, at room temperature, a 35 g / L salt solution is continuously flowed over the surface of the sample to be tested to create a water flow impact at a flow rate of 100 L / min, while a rated current is applied simultaneously for 1000 h to conduct an aging test.

[0077] Figure 4 Here is a flowchart of step 104 in one embodiment, see reference. Figure 4 Step 104 also includes sub-step 402.

[0078] Step 402: At a preset temperature, the sample to be tested is immersed in a cycle for a first preset time, while a rated current is applied during the cycle to perform an aging test.

[0079] Optionally, the sample to be tested is placed in a tank with a depth of 0.5m-2m, and the tank is filled with water or salt water (with the same concentration range as the salt water concentration mentioned above) for 40 minutes. Then the water or salt water is drained for 20 minutes. The soaking and non-soaking time is a total of 60 minutes, which constitutes one cycle. A total of 1000 cycles are performed. During this period, the rated current is applied to conduct an aging test to simulate the working environment of the photovoltaic junction box sample at high and low tides at sea.

[0080] Figure 5 Here is a flowchart of step 104 in one embodiment, see reference. Figure 5 Step 104 also includes sub-step 502.

[0081] Step 502: At a preset temperature, the sample to be tested is subjected to cyclic impact for a first preset time period, while a rated current is applied during the cycle.

[0082] The cyclic impact test within the first preset duration can be understood as subjecting the test sample to continuous impact from the aforementioned water or salt water for one consecutive preset time period, and then exempting the test sample from the impact from the aforementioned water or salt water for another consecutive preset time period. This continuous preset time period followed by another consecutive preset time period constitutes one cycle, and the test is repeated in multiple cycles. Optionally, the test sample is subjected to continuous impact from the aforementioned water or salt water for 40 minutes, followed by 20 minutes without impact, for a total of 60 minutes, constituting one cycle. A total of 1000 cycles are performed, during which a rated current is applied for aging testing to simulate the photovoltaic junction box sample operating in a marine environment during high and low tides.

[0083] Figure 6 Here is a flowchart of step 402 in one embodiment, see reference. Figure 6 Step 402 includes sub-steps 602 to 604.

[0084] Step 602: At a preset temperature, place the sample to be tested into a container of a preset depth and continuously fill the container with solution so that the sample to be tested is immersed in the solution for a second preset time.

[0085] The preset depth is 0.5m-2m, the solution is water or salt water of the same concentration as above, and the second preset time is the soaking time of the sample to be tested in one cycle, which can be 40min.

[0086] Step 604: After the second preset time, the solution is continuously vented to allow the soaked sample to dry for the third preset time.

[0087] The sum of the second preset duration and the third preset duration is the total duration of each soaking cycle.

[0088] The third preset duration is the time to soak the sample in one cycle and then drain it, which can be 20 minutes.

[0089] In one embodiment, at room temperature, the sample to be tested is placed in a 1m deep tank, the tank is filled with water for 40 minutes, and then the water is drained for 20 minutes; the soaking and non-soaking time is a total of 60 minutes, which constitutes one cycle, and a total of 1000 cycles are performed, during which the rated current is applied to carry out the aging test.

[0090] In one embodiment, at room temperature, the test sample is placed in a 1m deep tank, and the tank is filled with 35g / L salt water for 40 minutes. Then the water is drained for 20 minutes. The total soaking and non-soaking time is 60 minutes, which constitutes one cycle. A total of 1000 cycles are performed, during which the rated current is applied to conduct an aging test.

[0091] Figure 7 Here is a flowchart of step 502 in one embodiment, see reference. Figure 7 Step 502 includes sub-steps 702 to 704.

[0092] Step 702: At a preset temperature, the solution is continuously flowed over the surface of the sample to be tested, so that the sample to be tested is continuously impacted by the solution for a second preset time.

[0093] Step 704: Allow the sample to stand after being impacted by the solution for a third preset time period.

[0094] The solution is water or saline solution of the above concentration. The second preset time is 40 min, which represents the duration of the solution continuously flowing over the surface of the sample in one cycle. The third preset time is 20 min, which represents the duration of the sample after being impacted by the solution being left to stand in one cycle.

[0095] In one embodiment, at room temperature, the sample to be tested was subjected to water flow impact for 40 minutes at a water flow rate of 100 L / min; then left to stand (without impact) for 20 minutes. The total duration of water flow impact and no impact was 1 hour, constituting one cycle. A total of 1000 cycles were performed, during which a rated current was applied for aging testing.

[0096] In one embodiment, at room temperature, the sample to be tested was subjected to a saline flow shock for 40 minutes, with a saline concentration of 35 g / L and a water flow rate of 100 L / min; then left to stand (without shock) for 20 minutes. The water flow shock and no shock were combined for 1 hour, constituting one cycle. A total of 1000 cycles were performed, during which a rated current was applied for aging testing.

[0097] Figure 8 Here is a flowchart of step 102 in one embodiment, see reference. Figure 8 Step 102 includes sub-steps 802 to 806.

[0098] 802. Perform a visual inspection on the initial sample.

[0099] Optionally, the initial sample can be visually inspected or its appearance can be observed on a monitor; no specific limitations are made here.

[0100] 804. When the appearance of the initial sample meets the first preset condition, the initial sample is placed in a container and a solution is added until the solution covers the initial sample. A test voltage is then applied to the initial sample to perform a wet leakage test.

[0101] The first preset condition is that the sample box is not deformed. When the initial sample box is normal, it is placed in the container and the above solution is added. Then, a test voltage is applied to the initial sample to perform a wet leakage test.

[0102] Optionally, the initial sample can be subjected to a wet leakage current test according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the sample model. The 62790 standard is the IEC standard for photovoltaic junction boxes. This standard sets out the performance requirements and tests for junction boxes used in ground power stations and residential rooftop applications. Since the marine environment is more severe, qualified products tested under this standard have better waterproof performance.

[0103] 806. Obtain the resistance between the sample and the solution during the wet leakage current test. When the resistance meets the second preset condition, the initial sample is used as the sample to be tested.

[0104] The resistance between the sample and the solution is the insulation resistance. The second preset condition is that the insulation resistance is greater than 2000MΩ. The instrument used to test the resistance can be an insulation resistance tester, which is not specifically limited here.

[0105] Optionally, the allowable range of the insulation resistance threshold of the second preset condition can be selected according to the type and concentration of the solution, and the second preset condition can be adjusted accordingly.

[0106] Figure 9 Here is a flowchart of step 106 in one embodiment, see reference. Figure 9 Step 106 includes sub-steps 902 to 906.

[0107] Step 902: Perform an appearance inspection on the sample after the aging test.

[0108] Step 904: When the appearance of the sample meets the first preset condition, the sample is placed in a container and a solution is added until the solution covers the initial sample, and a test voltage is applied to the sample to perform a wet leakage test.

[0109] Step 906: Obtain the resistance between the sample and the solution during the wet leakage current test. When the resistance meets the second preset condition, the sample to be tested is determined to meet the qualification condition.

[0110] The first and second preset conditions are the same as the judgment preset conditions of the sample to be tested, and the test methods are also the same, in order to determine whether the sample to be tested still meets the qualified conditions after aging test (simulating water or marine environment operation), thereby determining whether the sample has long-term reliability in working under water immersion or water wave impact environment.

[0111] The reliability testing method described above is further explained below with reference to optional embodiments:

[0112] Test sample preparation: The junction boxes were glued to the glass plate in the order of positive and negative terminals, and the three junction boxes were connected together with the busbar. The surface of the busbar was then covered with silicone to fix and seal it.

[0113] Implementation Case 1:

[0114] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0115] S2: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0116] S3: Electrical Aging Test: Immerse the test sample in 1m deep water at room temperature while applying the rated current for 1000h.

[0117] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0118] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0119] S6: Electrical Aging Test: Immerse the test sample in water at a depth of 1m at room temperature, and simultaneously apply the rated current for 1000h.

[0120] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0121] S8: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0122] Implementation Case 2:

[0123] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0124] S2: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is considered to meet the qualification conditions when the insulation resistance is greater than 2000MΩ.

[0125] S3: Electrical Aging Test: Immerse the test sample in a 1m deep salt water solution (concentration 35g / L) at room temperature, and simultaneously apply the rated current for 1000h.

[0126] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0127] S5: Wet leakage current: The test sample is tested for wet leakage current in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is greater than 2000MΩ to be considered as qualified.

[0128] S6: Electrical Aging Test: Immerse the test sample in a 1m deep salt water solution (concentration 35g / L) at room temperature, and simultaneously apply the rated current for 1000h.

[0129] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0130] S8: Wet leakage current: The wet leakage current test shall be performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V or 2000V depending on the product model. The sample is qualified if the insulation resistance is greater than 2000MΩ.

[0131] Implementation Case 3:

[0132] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0133] S2: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0134] S3: Electrical Aging Test: The test sample is subjected to water flow impact at room temperature with a water flow rate of 100L / min, and the rated current is applied simultaneously for 1000h.

[0135] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0136] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0137] S6: Electrical Aging Test: The test sample is subjected to water flow impact at room temperature with a water flow rate of 100L / min, and the rated current is applied simultaneously for 1000h.

[0138] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0139] S8: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0140] Implementation Case 4:

[0141] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0142] S2: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0143] S3: Electrical Aging Test: The test sample is subjected to a salt water flow impact (concentration 35g / L) at room temperature with a water flow rate of 100L / min, while the rated current is applied for 1000h.

[0144] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0145] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0146] S6: Electrical Aging Test: The test sample is subjected to a salt water flow impact (concentration 35g / L) at room temperature with a water flow rate of 100L / min, while the rated current is applied for 1000h.

[0147] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0148] S8: Wet leakage current: The wet leakage current test shall be performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V or 2000V depending on the product model. The sample is qualified if the insulation resistance is greater than 2000MΩ.

[0149] Implementation Case 5:

[0150] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0151] S2: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0152] S3: Electrical Aging Test: At room temperature, place the test sample into a tank 1m deep, fill the tank with water for 40 minutes, and then drain the water for 20 minutes; soaking and not soaking together for a total of 60 minutes constitutes one cycle, and a total of 1000 cycles are performed.

[0153] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0154] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0155] S6: Electrical Aging Test: At room temperature, place the test sample into a tank 1m deep, fill the tank with water for 40 minutes, and then drain the water for 20 minutes; soaking and not soaking together for a total of 60 minutes constitutes one cycle, and a total of 1000 cycles are performed.

[0156] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0157] S8: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0158] Implementation Case 6:

[0159] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0160] S2: Wet leakage current: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0161] S3: Electrical Aging Test: At room temperature, place the test sample into a tank to a depth of 1m, fill the tank with salt water (concentration 35g / L) for 40min, then drain the water for 20min; soaking and not soaking together for a total of 60min constitutes one cycle, and a total of 1000 cycles are performed.

[0162] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0163] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0164] S6: Electrical Aging Test: At room temperature, place the test sample into a tank to a depth of 1m, fill the tank with salt water (concentration 35g / L) for 40min, then drain the water for 20min; soaking and not soaking together for a total of 60min constitutes one cycle, and a total of 1000 cycles are performed.

[0165] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0166] S8: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0167] Implementation Case 7:

[0168] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0169] S2: Wet leakage current test: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0170] S3: Electrical Aging Test: At room temperature, the test sample is subjected to water flow impact for 40 minutes at a water flow rate of 100 L / min; no impact for 20 minutes. The water flow impact and no impact together last for 1 hour, which is one cycle. A total of 1000 cycles are performed, during which the rated current is applied.

[0171] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0172] S5: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is considered to be greater than 2000MΩ to be qualified.

[0173] S6: Electrical Aging Test: At room temperature, the test sample is subjected to water flow impact for 40 minutes at a water flow rate of 100L / min; no impact for 20 minutes. The water flow impact and no impact together last for 1 hour, which is one cycle. A total of 1000 cycles are performed, during which the rated current is applied.

[0174] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0175] S8: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0176] Implementation Case 8:

[0177] S1: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0178] S2: Wet leakage current: The wet leakage current test is performed on the test sample in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The test sample is deemed to meet the qualification condition if the insulation resistance is greater than 2000MΩ.

[0179] S3: Electrical Aging Test: The test sample was subjected to a salt water flow impact for 40 minutes at room temperature (concentration 35g / L) with a water flow rate of 100L / min; no impact for 20 minutes. The water flow impact and no impact together lasted for 1 hour, which constituted one cycle. A total of 1000 cycles were performed, during which the rated current was applied.

[0180] S4: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0181] S5: Wet leakage current: The test sample is tested for wet leakage current in accordance with IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The insulation resistance is greater than 2000MΩ to be considered as qualified.

[0182] S6: Electrical Aging Test: The test sample was subjected to a salt water flow impact for 40 minutes at room temperature (concentration 35g / L) with a water flow rate of 100L / min; no impact for 20 minutes. The water flow impact and no impact together lasted for 1 hour, which constituted one cycle. A total of 1000 cycles were performed, during which the rated current was applied.

[0183] S7: Visual inspection: Visually inspect the appearance of the test sample to check for any abnormalities.

[0184] S8: Wet leakage current test: Perform wet leakage current test on the test sample according to IEC 62790. The test voltage can be selected from 1000V, 1500V, or 2000V depending on the product model. The sample is considered qualified if the insulation resistance is greater than 2000MΩ.

[0185] Figure 10 This is a schematic diagram of the reliability testing device in one embodiment, with reference to... Figure 10This reliability testing device, applied to photovoltaic junction boxes, includes an acquisition module 100, a testing module 200, and a verification module 300.

[0186] The acquisition module 100 is used to provide a sample of a photovoltaic junction box to be tested, which meets the preset qualification conditions.

[0187] The test module 200, connected to the acquisition module 100, is used to bring the test area of ​​the sample to be tested into contact with the test solution and to pass a test current through the sample to perform an aging test for a preset duration.

[0188] The verification module 300, connected to the test module 200, is used to test the samples after aging tests and determine whether the samples meet the qualification conditions.

[0189] In this embodiment, each module is used to execute Figure 1 For details of each step in the corresponding embodiment, please refer to the documentation. Figure 1 as well as Figure 1 The relevant descriptions in the corresponding embodiments will not be repeated here.

[0190] The reliability testing device provided in this embodiment provides a photovoltaic junction box sample that meets preset qualification conditions through the acquisition module 100; the test module 200 connected to the acquisition module 100 is used to bring the test area of ​​the sample into contact with the test solution and pass a test current to the sample for aging test for a preset duration; the verification module 300 connected to the test module 200 is used to test the sample after the aging test and determine whether the sample meets the qualification conditions, so as to evaluate the long-term reliability of the photovoltaic junction box in the environment of immersion in water or water wave impact.

[0191] The division of the modules in the above-described reliability testing device is for illustrative purposes only. In other embodiments, the reliability testing device may be divided into different modules as needed to complete all or part of the functions of the above-described reliability testing device.

[0192] Specific limitations regarding the reliability testing apparatus can be found in the limitations of the reliability testing methods described above, and will not be repeated here. Each module in the aforementioned reliability testing apparatus can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in the computer device in hardware form, or stored in the memory of the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0193] This application also provides a computer device, including a memory and a processor. The memory stores a computer program, and when the computer program is executed by the processor, the processor performs the steps of the method as described in the above embodiments.

[0194] This application also provides a computer-readable storage medium storing a computer program thereon, the computer program being executed by a processor using the steps of the method described in the above embodiments.

[0195] The reliability testing method, reliability testing device, computer equipment, and storage medium provided in the above embodiments are applied to photovoltaic junction boxes and can evaluate the long-term reliability of photovoltaic junction boxes working in environments of immersion in water or impact by water waves. They have significant economic value and practical application value.

[0196] Any references to memory, storage, databases, or other media used in this application may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM), which is used as external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM).

[0197] In the description of this specification, references to terms such as "some embodiments," "other embodiments," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative descriptions of the above terms do not necessarily refer to the same embodiments or examples.

[0198] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0199] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these modifications and improvements all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A reliability testing method applied to photovoltaic junction boxes, characterized in that, include: Provide a photovoltaic junction box sample to be tested, wherein the sample to be tested meets preset qualification conditions; At a preset temperature, the test area of ​​the sample to be tested is brought into contact with the test solution to simulate the water working environment of the sample to be tested in water immersion and water draining cycle immersion or cycle impact. During the cycle immersion or cycle impact, a test current is passed to the sample to be tested for a preset time aging test. The test current is the rated current of the sample to be tested. The test sample after the aging test is tested to determine whether the test sample meets the qualified conditions. The preset qualification conditions include: the qualification conditions of the appearance of the sample to be tested and the qualification conditions of the resistance of the sample to be tested in wet leakage current test.

2. The reliability testing method according to claim 1, characterized in that, The test area of ​​the sample to be tested is brought into contact with the test solution, and a test current is passed through the sample to perform an aging test for a preset duration. The method also includes: The sample to be tested is subjected to cyclic immersion for a first preset time period, while the rated current is applied during the cycle to perform an aging test; or The sample to be tested is subjected to cyclic impact for a first preset time period, while the rated current is applied during the cycle.

3. The reliability testing method according to claim 2, characterized in that, The step of cyclically immersing the sample to be tested within a first preset time period includes: The sample to be tested is placed in a container of a preset depth, and the container is continuously filled with the test solution so that the sample to be tested is immersed in the test solution for a second preset time. After the second preset time period, the test solution is continuously vented to allow the soaked sample to dry for a third preset time period. The sum of the second preset duration and the third preset duration is the total duration of each soaking cycle.

4. The reliability testing method according to claim 2, characterized in that, The step of subjecting the sample to be tested to cyclic impact for a first preset time period includes: The test solution is continuously flowed over the surface of the sample to be tested, so that the sample to be tested is continuously impacted by the test solution for a second preset time. The sample to be tested, after being impacted by the test solution, is allowed to stand for a third preset time period.

5. The reliability testing method according to claim 1, characterized in that, The sample to be tested, which provides a photovoltaic junction box, includes: Perform a visual inspection on the initial sample; When the appearance of the initial sample meets the first preset condition, the initial sample is placed in a container and a test solution is added until the test solution covers the initial sample, and a test voltage is applied to the initial sample to perform a wet leakage test. The resistance between the initial sample and the test solution is obtained during the wet leakage current test. When the resistance meets a second preset condition, the initial sample is used as the sample to be tested.

6. The reliability testing method according to claim 1, characterized in that, The step of testing the sample after aging to determine whether the sample meets the qualification conditions includes: Perform a visual inspection on the samples to be tested after the aging test; When the appearance of the sample to be tested meets the first preset condition, the sample to be tested is placed in a container and a test solution is added until the test solution covers the sample to be tested, and a test voltage is applied to the sample to be tested to perform a wet leakage test. The resistance between the sample to be tested and the test solution is obtained during the wet leakage current test. When the resistance meets the second preset condition, the sample to be tested is determined to meet the qualification condition.

7. A reliability testing device, applied to a photovoltaic junction box, characterized in that, include: The acquisition module is used to provide a sample of a photovoltaic junction box to be tested, wherein the sample meets preset qualification conditions; The test module, connected to the acquisition module, is used to bring the test area of ​​the sample to be tested into contact with the test solution at a preset temperature to simulate the water working environment of the sample to be tested in a water immersion or cyclic impact of water immersion and water draining, and to pass a test current to the sample to be tested during the cyclic immersion or cyclic impact to perform an aging test for a preset duration, wherein the test current is the rated current of the sample to be tested. The verification module, connected to the testing module, is used to test the sample to be tested after the aging test and determine whether the sample to be tested meets the qualification conditions. The preset qualification conditions include: the qualification conditions of the appearance of the sample to be tested and the qualification conditions of the resistance of the sample to be tested in wet leakage current test.

8. A computer device, characterized in that, The method includes a memory and a processor, wherein the memory stores a computer program that, when executed by the processor, causes the processor to perform the steps of the method as described in any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method as described in any one of claims 1 to 6.

Images