Methods, devices, electronic equipment, and storage media for surface modeling of fast and slow shear waves

Abstract

This invention relates to a method, apparatus, electronic device, and storage medium for fast and slow shear wave surface modeling. The method involves: picking up the first arrival time of earthquakes within a preset offset range; dividing the first and second shear wave seismic data into identical ground grids; selecting multiple ground grids and determining the apparent first arrival velocity of each grid, thus determining the refracted wave offset range; determining the first shear wave refraction velocity and the first shear wave delay time at the shot and receiver points; determining the first shear wave surface velocity based on the surface data of the first shear wave seismic data; obtaining the first shear wave surface model based on the first shear wave correlation data and outputting the high-velocity top information of the shot and receiver points; determining the second shear wave refraction velocity and the second shear wave delay time at the shot and receiver points; and obtaining the second shear wave surface model based on the high-velocity top information of the shot and receiver points and the second shear wave correlation data. In other words, this invention achieves synchronous and coordinated establishment of a surface model using fast and slow shear waves.

Description

Technical Field

[0001] This invention relates to the field of geophysical exploration technology, and in particular to a method, apparatus, electronic device, and storage medium for fast and slow shear wave surface modeling. Background Technology

[0002] Pure shear wave seismic exploration is a technology that has just entered industrial testing. Traditional shear wave surface models mainly use the results of shear wave surface surveys and establish the surface model based on the inter-layer similarity coefficient; or they use first-arrival inversion and surface wave inversion to establish the surface model, which mainly focuses on the vertical polarization (SH), horizontal polarization (SV), TT, and RR) components of shear waves to establish the surface model.

[0003] However, there is currently a lack of technology for synchronously coordinating surface modeling of fast and slow shear waves, making it impossible to quickly and conveniently interpret and track the stratigraphic relationship between fast and slow shear wave seismic profiles. Summary of the Invention

[0004] The embodiments of the present invention provide a method, apparatus, electronic device and storage medium for surface modeling of fast and slow shear waves, so as to solve the problem that the prior art lacks a technology for synchronously coordinating surface modeling of fast and slow shear waves.

[0005] In a first aspect, embodiments of the present invention provide a method for surface modeling of fast and slow shear waves, comprising: picking the first arrival time of a first shear wave earthquake corresponding to first shear wave seismic data and the first arrival time of a second shear wave earthquake corresponding to second shear wave seismic data within a preset offset range, wherein the first shear wave is one of a fast shear wave and a slow shear wave, and the second shear wave is the other of a fast shear wave and a slow shear wave; dividing the first shear wave seismic data and the second shear wave seismic data into the same ground grid according to the observation system; selecting multiple ground grids, and determining the corresponding apparent first arrival velocity of the earthquake according to the offset of each selected ground grid and the first arrival time of the first shear wave earthquake or the first arrival time of the second shear wave earthquake, and determining the corresponding refracted wave offset range according to the apparent first arrival velocity of the earthquake; determining the first shear wave refraction velocity according to the first shear wave earthquake arrival time and the refracted wave offset range, and determining the first shear wave refraction velocity according to the first shear wave ground grid; and determining the first shear wave refraction velocity according to the first shear wave ground grid. The first shear wave delay time at the shot point and receiver point is determined based on the earthquake's first arrival time, the range of the refracted wave offset, and the first shear wave refraction velocity. The surface velocity of the first shear wave is determined based on the surface data corresponding to the first shear wave seismic data. Refraction inversion is performed based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and the high-velocity top information of the shot point and receiver point for the first shear wave surface model is output. The second shear wave refraction velocity is determined based on the earthquake's first arrival time and the range of the refracted wave offset, and the second shear wave delay time at the shot point and receiver point is determined based on the earthquake's first arrival time, the range of the refracted wave offset, and the second shear wave refraction velocity. Refraction inversion is performed based on the high-velocity top information of the shot point and receiver point, the second shear wave refraction velocity, and the second shear wave delay time to obtain the second shear wave surface model.

[0006] As an embodiment of the present invention, the step of determining the corresponding apparent earthquake velocity based on the offset of each selected ground grid and the first arrival time of the first or second shear wave earthquake, and determining the corresponding refracted wave offset range based on the apparent earthquake velocity, includes: determining that the slope of the linear fitting between the offset of each ground grid and the first or second arrival time of the first or second shear wave earthquake is the apparent earthquake velocity of the corresponding ground grid; determining the velocity range of the high-velocity layer closest to the surface; and determining the refracted wave offset range corresponding to the high-velocity layer velocity with the smallest difference from the apparent earthquake velocity.

[0007] As an embodiment of the present invention, after determining the first shear wave refraction velocity based on the first shear wave earthquake arrival time and the refracted wave offset range, the method further includes: smoothing the first shear wave refraction velocity; after determining the second shear wave refraction velocity based on the second shear wave earthquake arrival time and the refracted wave offset range, the method further includes: smoothing the second shear wave refraction velocity.

[0008] As an embodiment of the present invention, the formula for calculating the surface velocity of the first shear wave is as follows:

[0009]

[0010] Where N is the number of surface weathering layers, h i v is the thickness of the i-th weathered layer. i It is the velocity of the i-th weathering layer.

[0011] As an embodiment of the present invention, after determining the corresponding refractive wave offset range based on the apparent velocity of the earthquake arrival, the method further includes: outputting a corresponding refractive wave offset file, wherein the refractive wave offset file includes a ground grid number, ground grid east coordinates, ground grid north coordinates, a starting offset, and a ending offset, wherein the starting offset and the ending offset are used to determine the refractive wave offset range; the method of determining the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake and the refractive wave offset range includes: reading the starting offset and the ending offset from the refractive wave offset file; and determining the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake within the range of the starting offset and the ending offset.

[0012] As an embodiment of the present invention, the step of outputting the high-velocity top information of the shot point and the high-velocity top information of the receiver point of the first shear wave surface model includes: outputting the high-velocity top information file of the shot point and the high-velocity top information file of the receiver point of the first shear wave surface model, wherein the high-velocity top information file of the shot point includes the shot point station number and the high-velocity top elevation of the shot point, and the high-velocity top information file of the receiver point includes the receiver station number and the high-velocity top elevation of the receiver point; the step of performing refraction inversion based on the high-velocity top information of the shot point, the high-velocity top information of the receiver point, the second shear wave refraction velocity, and the second shear wave delay to obtain the second shear wave surface model includes: reading the high-velocity top elevation of the shot point and the high-velocity top elevation of the receiver point from the high-velocity top information file of the shot point and the high-velocity top information file of the receiver; and performing refraction inversion based on the high-velocity top elevation of the shot point, the high-velocity top elevation of the receiver, the second shear wave refraction velocity, and the second shear wave delay to obtain the second shear wave surface model.

[0013] As an embodiment of the present invention, the method further includes: performing reference plane static correction on the first shear wave surface model and the second shear wave surface model according to a predefined reference plane and filling velocity, respectively, to obtain the corresponding first shear wave seismic profile and second shear wave seismic profile.

[0014] Secondly, embodiments of the present invention provide a fast and slow shear wave surface modeling device, comprising: an initial arrival picking module, configured to pick up the initial arrival time of a first shear wave seismic data corresponding to a first shear wave seismic data and the initial arrival time of a second shear wave seismic data corresponding to a second shear wave seismic data within a preset offset range, wherein the first shear wave is one of a fast shear wave and a slow shear wave, and the second shear wave is the other of a fast shear wave and a slow shear wave; a grid division module, configured to divide the first shear wave seismic data and the second shear wave seismic data into the same ground grid according to the observation system; a first determination module, configured to select multiple ground grids, and determine the corresponding apparent initial arrival velocity of the seismic waves according to the offset of each selected ground grid and the initial arrival time of the first shear wave seismic waves or the initial arrival time of the second shear wave seismic waves, and determine the corresponding refracted wave offset range according to the apparent initial arrival velocity of the seismic waves; a second determination module, configured to determine the first shear wave refraction velocity according to the initial arrival time of the first shear wave seismic waves and the refracted wave offset range, and determine the first shear wave refraction velocity according to the initial arrival time of the first shear wave seismic waves. The system comprises the following modules: a first shear wave delay time for the shot point and receiver point determined by time, the refracted wave offset range, and the first shear wave refraction velocity; a third determining module for determining the first shear wave surface velocity based on surface data corresponding to the first shear wave seismic data; a surface modeling module for performing refraction inversion based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain a first shear wave surface model, and outputting the shot point high-velocity top information and receiver high-velocity top information of the first shear wave surface model; a second determining module for determining the second shear wave refraction velocity based on the first arrival time of the second shear wave seismic event and the refracted wave offset range, and determining the second shear wave delay time for the shot point and receiver point based on the first arrival time of the second shear wave seismic event, the refracted wave offset range, and the second shear wave refraction velocity; and a surface modeling module for performing refraction inversion based on the shot point high-velocity top information, receiver high-velocity top information, the second shear wave refraction velocity, and the second shear wave delay time to obtain a second shear wave surface model.

[0015] Thirdly, embodiments of the present invention provide an electronic device, including a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus; the memory is used to store computer programs; and the processor is used to implement the steps of the fast and slow shear wave surface modeling method described in any one of the first aspects when executing the program stored in the memory.

[0016] Fourthly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, characterized in that, when the computer program is executed by a processor, it implements the steps of the fast and slow shear wave surface modeling method described in any one of the first aspects.

[0017] The fast and slow shear wave surface modeling method, apparatus, electronic device, and storage medium provided in the embodiments of the present invention pick up the first arrival time of the first shear wave seismic data corresponding to the first shear wave seismic data and the first arrival time of the second shear wave seismic data corresponding to the second shear wave seismic data within a preset offset range, wherein the first shear wave is one of a fast shear wave and a slow shear wave, and the second shear wave is the other of a fast shear wave and a slow shear wave; the first shear wave seismic data and the second shear wave seismic data are divided into the same ground grid according to the observation system; multiple ground grids are selected, and the corresponding apparent first arrival velocity of the seismic waves is determined according to the offset of each selected ground grid and the first arrival time of the first shear wave seismic waves or the first arrival time of the second shear wave seismic waves, and the corresponding refracted wave offset range is determined according to the apparent first arrival velocity of the seismic waves; the first shear wave refraction velocity is determined according to the first arrival time of the first shear wave seismic waves and the refracted wave offset range, and the first shear wave delay time of the shot point and receiver point is determined according to the first arrival time of the first shear wave seismic waves, the refracted wave offset range, and the first shear wave refraction velocity; the first shear wave surface velocity is determined according to the surface data corresponding to the first shear wave seismic data; Refraction inversion is performed based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and the high-velocity top information of the shot point and the receiver point of the first shear wave surface model is output; the second shear wave refraction velocity is determined based on the first arrival time of the second shear wave earthquake and the range of the refracted wave offset, and the second shear wave delay time of the shot point and the receiver point is determined based on the first arrival time of the second shear wave earthquake, the range of the refracted wave offset, and the second shear wave refraction velocity; the high-velocity top information of the shot point and the high-velocity top information of the receiver point are then used to determine the second shear wave delay time; The second shear wave surface model is obtained by refraction inversion using information, the second shear wave refraction velocity, and the second shear wave delay. In other words, this embodiment of the invention first establishes a surface model based on fast or slow shear wave seismic data, and then uses the shot point elevation and receiver elevation output from the first-established surface model to establish another surface model. This achieves synchronous and coordinated establishment of surface models for fast and slow shear waves, and the thickness of the two surface models remains consistent, ensuring the model matching degree between the two, which is beneficial for the layer interpretation and tracking comparison of fast and slow shear wave seismic profiles. Attached Figure Description

[0018] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0019] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, those skilled in the art can obtain other drawings based on these drawings without creative effort.

[0020] Figure 1A flowchart illustrating a fast and slow shear wave surface modeling method provided in an embodiment of the present invention;

[0021] Figure 2 A flowchart illustrating another fast and slow shear wave surface modeling method provided in an embodiment of the present invention;

[0022] Figure 3 A flowchart illustrating another method for modeling fast and slow shear wave surface models provided in an embodiment of the present invention;

[0023] Figure 4a A plan view of refractive layering control points provided in an embodiment of the present invention;

[0024] Figure 4b An initial arrival time-distance map of a ground grid provided in an embodiment of the present invention;

[0025] Figure 4c This is a schematic diagram of the refracted wave offset range corresponding to a ground grid, provided in an embodiment of the present invention.

[0026] Figure 5a A schematic diagram of a fast shear wave delay provided in an embodiment of the present invention;

[0027] Figure 5b A schematic diagram of a slow shear wave delay provided in an embodiment of the present invention;

[0028] Figure 6a A schematic diagram of a fast shear wave surface model provided in an embodiment of the present invention;

[0029] Figure 6b A schematic diagram of a slow shear wave surface model provided in an embodiment of the present invention;

[0030] Figure 7a A schematic diagram of a fast shear wave seismic profile provided in an embodiment of the present invention;

[0031] Figure 7b A schematic diagram of a slow shear wave seismic profile provided in an embodiment of the present invention;

[0032] Figure 8 This is a schematic diagram of the structure of a fast and slow shear wave surface modeling device provided in an embodiment of the present invention;

[0033] Figure 9 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0034] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0035] Pure shear wave seismic exploration is a technology that has just entered industrial testing. Traditional shear wave surface models mainly use the results of shear wave surface surveys and establish the surface model based on the inter-layer similarity coefficient; or they use first-arrival inversion and surface wave inversion to establish the surface model, which mainly focuses on the vertical polarization (SH), horizontal polarization (SV), TT, and RR) components of shear waves to establish the surface model.

[0036] However, there are currently no corresponding fast S&W surface models and slow S&W surface models for seismic data, meaning there is a lack of technology for synchronously coordinating surface modeling of fast and slow S&W waves, making it impossible to quickly and conveniently interpret and track and compare the stratigraphic layers of fast and slow S&W seismic profiles.

[0037] To address the aforementioned technical problems, the technical concept of this invention is as follows: First, a fast shear wave surface model or a slow shear wave surface model is established based on the refraction and inversion of fast shear wave seismic data or slow shear wave seismic data. Then, another surface model is established using the shot point elevation and receiver elevation output from the first-established surface model. The two models have the same depth, ensuring the model matching degree between the two, which is beneficial for the stratigraphic interpretation and tracking comparison of fast shear wave seismic profiles and slow shear wave seismic profiles.

[0038] Figure 1 This is a flowchart illustrating a fast and slow shear wave surface modeling method provided in an embodiment of the present invention. The executing entity is a fast and slow shear wave surface modeling device, or an electronic device equipped with such a device. Figure 1 As shown, this fast and slow shear wave surface modeling method includes:

[0039] Step S101: Pick the first arrival time of the first shear wave earthquake corresponding to the first shear wave earthquake data and the first arrival time of the second shear wave earthquake corresponding to the second shear wave earthquake data within the preset offset range.

[0040] In this embodiment, the first shear wave is one of a fast shear wave and a slow shear wave, and the second shear wave is the other of a fast shear wave and a slow shear wave. This embodiment is illustrated using the example of the first shear wave being a fast shear wave and the second shear wave being a slow shear wave.

[0041] Specifically, fast and slow SCH waves are caused by the splitting of SCH waves due to underground fissures. One type propagates at a fast speed, while the other propagates at a slow speed, and their propagation directions are inconsistent. Fast and slow SCH wave seismic data are obtained through seismic data processing, recorded at specific time intervals (sampling rate) from underground, on a shot-by-shot basis. Offset refers to the distance between the shot point and the receiver point. The preset offset range can be determined based on the actual maximum and minimum offsets. Generally, the larger value of the preset offset range should be less than or equal to the actual maximum offset, and the smaller value of the preset offset range should be greater than or equal to the actual minimum offset. In this step, the maximum and minimum offsets are first specified, and then the first arrival times of each shot of the fast SCH wave seismic data and the first arrival times of each shot of the slow SCH wave seismic data are picked according to the specified offset range.

[0042] In some embodiments, after step S101, the method further includes: outputting a first shear wave seismic arrival file and a second shear wave seismic arrival file, respectively. Specifically, the arrival times of each shot of fast shear wave seismic data are output or stored in file format, and the arrival times of each shot of slow shear wave seismic data are output or stored in file format.

[0043] Step S102: Divide the first shear wave seismic data and the second shear wave seismic data into the same ground grid according to the observation system.

[0044] In this step, the same ground grid is defined for both fast and slow shear wave seismic data according to the observation system.

[0045] Step S103: Select multiple ground grids, and determine the corresponding apparent velocity of the earthquake based on the offset distance of each selected ground grid and the first arrival time of the first or second shear wave earthquake, and determine the corresponding range of the refracted wave offset distance based on the apparent velocity of the earthquake.

[0046] In this step, ground grids are selected at different locations in space, and the first arrival and offset of earthquakes within each ground grid are extracted to obtain the apparent velocity of the first arrival of earthquakes within that ground grid. The first arrival can be either the first arrival time corresponding to fast SWC data or slow SWC data, and can be read from the corresponding fast SWC or slow SWC first arrival files. Then, based on the apparent velocity of the first arrival of earthquakes within each ground grid, a custom offset range for refraction analysis is defined for each ground grid, i.e., the refraction wave offset range. When calculating the refraction wave offset range for multiple ground grids, several refraction layer control points can be selected. First, the refraction wave offset range corresponding to the refraction layer control points is calculated based on their first arrival and offset. Then, the refraction offset range of other ground grids between the refraction layer control points is obtained through linear interpolation.

[0047] In some embodiments, step S103, which involves determining the corresponding apparent earthquake velocity based on the offset of each selected ground grid and the first or second shear wave earthquake arrival time, and determining the corresponding refracted wave offset range based on the apparent earthquake velocity, includes: determining that the slope of the linear fit between the offset of each ground grid and the first or second shear wave earthquake arrival time is the apparent earthquake velocity of the corresponding ground grid; determining the velocity range of the high-velocity layer closest to the surface; and determining the refracted wave offset range corresponding to the high-velocity layer velocity with the smallest difference from the apparent earthquake velocity.

[0048] Specifically, based on the slope of the linear fit between the first arrival and offset of the earthquake corresponding to the ground grid, the apparent velocity of the first arrival of the earthquake within the ground grid is estimated. Then, based on the range of velocities of the high-velocity layer closest to the surface, the offset range of the refracted wave corresponding to the high-velocity layer velocity closest to the apparent velocity is selected. Generally, geological structures are divided into the surface, low-velocity layer (or weathered layer, surface layer), and high-velocity layer (or rock layer) from top to bottom. The offset range of the refracted wave at the top interface of the high-velocity layer can be determined. Then, for each ground grid, an arbitrarily determined offset range of the refracted wave is determined that is smaller than the offset range of the refracted wave at the top interface of that high-velocity layer.

[0049] In some embodiments, after step S103, the method further includes: outputting a corresponding refracted wave offset file, wherein the refracted wave offset file includes a ground grid number, ground grid east coordinates, ground grid north coordinates, starting offset and ending offset, wherein the starting offset and ending offset are used to determine the range of the refracted wave offset.

[0050] Specifically, after determining the refracted wave offset range of the selected ground grid, all relevant data of the selected ground grid are output as an offset text file. The relevant data includes: grid number, grid east coordinate, grid north coordinate, starting offset, and ending offset.

[0051] Step S104: Determine the first shear wave refraction velocity based on the first shear wave earthquake arrival time and the refracted wave offset range, and determine the first shear wave delay time at the shot point and receiver point based on the first shear wave earthquake arrival time, the refracted wave offset range, and the first shear wave refraction velocity.

[0052] In this step, during the establishment of the fast shear wave surface model, the refraction velocity of the fast shear wave is calculated by the interchange velocity analysis method based on the first arrival time of the fast shear wave earthquake and the range of the refracted wave offset. Then, using the first arrival time of the fast shear wave earthquake, the range of the refracted wave offset, and the fast shear wave refraction velocity, the delay time is calculated using the Gauss-Seidel method to obtain the fast shear wave delay time for all shot points and receiver points.

[0053] In some embodiments, after determining the first shear wave refraction velocity based on the first arrival time of the first shear wave earthquake and the refracted wave offset range in step S104, the method further includes: smoothing the first shear wave refraction velocity. Specifically, a smoothing radius R is defined, and the fast shear wave refraction velocity is smoothed using R. The new smoothed velocity at each point is equal to the sum of the velocities of all points within the smoothing radius centered on that point, divided by the number of these points, to obtain the average value.

[0054] Step S105: Determine the surface velocity of the first shear wave based on the surface data corresponding to the first shear wave seismic data.

[0055] Specifically, the surface data corresponding to the fast shear wave data are processed to obtain the average surface velocity of the fast shear wave. The surface data mainly includes: shot point (sensor point) station number, east coordinate, north coordinate, surface elevation, first layer velocity, first layer thickness, second layer velocity, second layer thickness, and third layer velocity.

[0056] In some embodiments, the surface velocity of the first shear wave is calculated using formula (1):

[0057]

[0058] Where N is the number of surface weathering layers, h i v is the thickness of the i-th weathered layer. i It is the velocity of the i-th weathering layer.

[0059] Step S106: Perform refraction inversion based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and output the high-speed top information of the shot point and the high-speed top information of the receiver point of the first shear wave surface model.

[0060] In this step, refraction inversion is performed based on the fast shear wave surface velocity, fast shear wave refraction velocity, and fast shear wave delay times at all shot points and receiver points obtained above, to obtain the fast shear wave surface model M1, and the high-speed top information of the shot point and the high-speed top information of the receiver point of the fast shear wave surface model M1 are output respectively.

[0061] In some embodiments, the step S106 of outputting the shot point high-velocity top information and receiver high-velocity top information of the first shear wave surface model includes: outputting the shot point high-velocity top file and receiver high-velocity top file of the first shear wave surface model, wherein the shot point high-velocity top information file includes the shot point station number and the shot point high-velocity top elevation, and the receiver high-velocity top information file includes the receiver station number and the receiver high-velocity top elevation.

[0062] Specifically, the high-speed top file of the shot point and the high-speed top file of the receiver point are output respectively. The high-speed top file of the shot point is in the format of: shot point station number, high-speed top elevation; the high-speed top file of the receiver point is in the format of: receiver station number, high-speed top elevation.

[0063] Step S107: Determine the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake and the range of the refracted wave offset distance, and determine the second shear wave delay time at the shot point and receiver point based on the first arrival time of the second shear wave earthquake, the range of the refracted wave offset distance, and the second shear wave refraction velocity.

[0064] In this step, during the establishment of the slow shear wave surface model, based on the first arrival time of the slow shear wave earthquake and the range of refracted wave offset obtained in step S103, the refraction velocity of the slow shear wave is obtained by using the interchange velocity analysis method. Then, using the first arrival time of the slow shear wave earthquake, the range of refracted wave offset, and the refraction velocity of the slow shear wave, the Gauss-Seidel method is used to calculate the delay time, thereby obtaining the delay time of the slow shear wave at all shot points and receiver points.

[0065] In some embodiments, determining the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake and the range of the refracted wave offset distance in step S107 includes: reading the initial offset distance and the final offset distance from the refracted wave offset distance file; and determining the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake within the range of the initial offset distance and the final offset distance. Specifically, the refracted wave offset distance file output in step S103 is read, and the relevant data in the refracted wave offset distance file is used as the offset distance data for the refraction analysis of slow shear wave earthquake data. The interchange velocity analysis method is used to analyze the slow shear wave refraction velocity to obtain the slow shear wave refraction velocity.

[0066] In some embodiments, after determining the refraction velocity of the second shear wave based on the first arrival time of the second shear wave earthquake and the refracted wave offset range in step S107, the method further includes: smoothing the refraction velocity of the second shear wave. Specifically, the refraction velocity of the slow shear wave is also smoothed using a smoothing radius R.

[0067] Step S108: Perform refraction inversion based on the high-speed top information of the shot point, the high-speed top information of the receiver point, the refraction velocity of the second shear wave, and the delay time of the second shear wave to obtain the surface model of the second shear wave.

[0068] In this step, refraction inversion calculations are performed based on the obtained high-velocity top information of the shot point and receiver, the slow shear wave refraction velocity, and the slow shear wave delay time at the shot point and receiver. This yields the surface velocity corresponding to the slow shear wave surface model, resulting in the slow shear wave surface model M2. It should be noted that when obtaining the slow shear wave surface model M2, the high-velocity top information of the shot point and receiver output from the fast shear wave surface model M1 is directly used, ensuring that the two established surface models have consistent thicknesses and are matched.

[0069] In some embodiments, step S108 includes: reading the high-speed top elevations of the shot point and the receiver point from the high-speed top file of the shot point and the high-speed top file of the receiver point, respectively; and performing refraction inversion based on the high-speed top elevations of the shot point and the receiver point, the second shear wave refraction velocity, and the second shear wave delay time to obtain the second shear wave surface model. Specifically, the high-speed top file of the shot point and the high-speed top file of the receiver point from step S106 are directly read, and the surface velocity corresponding to the slow shear wave surface model is calculated by inversion based on the slow shear wave refraction velocity and the slow shear wave delay time of the shot point and the receiver point, to obtain the surface model M2 of the slow shear wave.

[0070] It should be noted that the first shear wave can also be a slow shear wave and the second shear wave can be a fast shear wave. In this embodiment, a slow shear wave surface model can be established first based on the slow shear wave seismic data, and the high-velocity tops of the shot point and receiver point corresponding to the slow shear wave surface model can be output. Then, a fast shear wave surface model can be established based on the high-velocity tops of the shot point and receiver point and the fast shear wave seismic data.

[0071] The surface modeling method for fast and slow shear waves provided in this invention involves picking the first arrival time of a first shear wave seismic data and the first arrival time of a second shear wave seismic data within a preset offset range. The first shear wave is either a fast or slow shear wave, and the second shear wave is the other. The method divides the first and second shear wave seismic data into identical ground grids according to the observation system. Multiple ground grids are selected, and the corresponding apparent first arrival velocity is determined based on the offset of each selected ground grid and the first or second shear wave seismic arrival time. The corresponding refracted wave offset range is then determined based on the apparent first arrival velocity. The first shear wave refraction velocity is determined based on the first shear wave seismic arrival time and the refracted wave offset range. The first shear wave delay time at the shot point and receiver point is determined based on the first shear wave seismic arrival time, the refracted wave offset range, and the first shear wave refraction velocity. Finally, the surface velocity of the first shear wave is determined based on the surface data corresponding to the first shear wave seismic data. Refraction inversion is performed based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and the high-velocity top information of the shot point and the receiver point of the first shear wave surface model is output; the second shear wave refraction velocity is determined based on the first arrival time of the second shear wave earthquake and the range of the refracted wave offset, and the second shear wave delay time of the shot point and the receiver point is determined based on the first arrival time of the second shear wave earthquake, the range of the refracted wave offset, and the second shear wave refraction velocity; the high-velocity top information of the shot point, The high-velocity top information of the receiver point, the refraction velocity of the second shear wave, and the delay of the second shear wave are used to perform refraction inversion to obtain the surface model of the second shear wave. That is, in this embodiment of the invention, a fast shear wave or slow shear wave surface model is first established, and then the surface model of the slow shear wave or fast shear wave is inverted based on the high-velocity top information of the shot point and the high-velocity top information of the receiver point output by the previously established surface model. This ensures that the fast shear wave surface model and the slow shear wave surface model have a high degree of matching and that their thickness models are consistent, which is beneficial for the layer interpretation and tracking comparison of the fast shear wave seismic profile and the slow shear wave seismic profile.

[0072] Based on the above embodiments, Figure 2 A flowchart illustrating another fast and slow shear wave surface modeling method provided in this embodiment of the invention is shown below. Figure 2 As shown, this fast and slow shear wave surface modeling method includes:

[0073] Step S201: Pick the first arrival time of the first shear wave earthquake corresponding to the first shear wave earthquake data and the first arrival time of the second shear wave earthquake corresponding to the second shear wave earthquake data within the preset offset range.

[0074] The first transverse wave is one of the fast transverse wave and the slow transverse wave, and the second transverse wave is the other of the fast transverse wave and the slow transverse wave.

[0075] Step S202: Divide the first shear wave seismic data and the second shear wave seismic data into the same ground grid according to the observation system.

[0076] Step S203: Select multiple ground grids, and determine the corresponding apparent velocity of the earthquake based on the offset distance of each selected ground grid and the first arrival time of the first or second shear wave earthquake, and determine the corresponding range of the refracted wave offset distance based on the apparent velocity of the earthquake.

[0077] Step S204: Determine the first shear wave refraction velocity based on the first shear wave earthquake arrival time and the refracted wave offset range, and determine the first shear wave delay time at the shot point and receiver point based on the first shear wave earthquake arrival time, the refracted wave offset range, and the first shear wave refraction velocity.

[0078] Step S205: Determine the surface velocity of the first shear wave based on the surface data corresponding to the first shear wave seismic data.

[0079] Step S206: Perform refraction inversion based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and output the high-speed top information of the shot point and the high-speed top information of the receiver point of the first shear wave surface model.

[0080] Step S207: Determine the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake and the range of the refracted wave offset distance, and determine the second shear wave delay time at the shot point and receiver point based on the first arrival time of the second shear wave earthquake, the range of the refracted wave offset distance, and the second shear wave refraction velocity.

[0081] Step S208: Based on the high-speed top information of the shot point, the high-speed top information of the receiver point, the refraction velocity of the second shear wave, and the delay time of the second shear wave, a refraction inversion is performed to obtain the surface model of the second shear wave.

[0082] Step S209: Based on the predefined reference plane and filling velocity, perform reference plane static correction on the first shear wave surface model and the second shear wave surface model respectively to obtain the corresponding first shear wave seismic profile and second shear wave seismic profile.

[0083] The implementation methods of steps S201-S208 in the embodiments of the present invention are similar to those of steps S101-S108 in the above embodiments, and will not be described again here.

[0084] The difference from the above embodiments is that, in order to further improve the layer interpretation and tracking comparability of fast shear wave seismic profiles and slow shear wave seismic profiles, in this embodiment, the first shear wave surface model and the second shear wave surface model are statically corrected according to a predefined reference plane and filling velocity to obtain the corresponding first shear wave seismic profile and second shear wave seismic profile.

[0085] Specifically, after obtaining the fast shear wave surface model M1 and the slow shear wave surface model M2, the reference surface and filling velocity are defined uniformly. The static correction of the reference surface is calculated using the fast shear wave surface model M1 and the slow shear wave surface model M2, respectively. Then, seismic processing is performed to obtain the fast shear wave seismic profile and the slow shear wave seismic profile, respectively.

[0086] The fast and slow shear wave surface modeling method provided in this invention performs static calibration on the first and second shear wave surface models according to a predefined reference plane and filling velocity, respectively, to obtain corresponding first and second shear wave seismic profiles. This achieves static calibration of the two surface models using the same reference plane and filling velocity based on the synchronous and coordinated establishment of fast and slow shear wave surface models, which is more conducive to the layer interpretation and tracking comparison of fast and slow shear wave seismic profiles.

[0087] Based on the above embodiments, Figure 3 This is a flowchart illustrating another method for modeling fast and slow shear wave surface models provided in an embodiment of the present invention. Figure 4a This is a plan view of refractive layering control points provided in an embodiment of the present invention. Figure 4b This invention provides a ground grid first-arrival time-distance map as an embodiment of the invention. Figure 4c This is a schematic diagram of the refracted wave offset range corresponding to a ground grid, provided in an embodiment of the present invention. Figure 5a This is a schematic diagram of a fast shear wave delay provided in an embodiment of the present invention. Figure 5b A schematic diagram of a slow shear wave delay provided in an embodiment of the present invention; Figure 6a This is a schematic diagram of a fast shear wave surface model provided in an embodiment of the present invention. Figure 6b A schematic diagram of a slow shear wave surface model provided in an embodiment of the present invention; Figure 7a This is a schematic diagram of a fast shear wave seismic profile provided in an embodiment of the present invention. Figure 7b This is a schematic diagram of a slow shear wave seismic profile provided in an embodiment of the present invention. To further understand the embodiments of the present invention, it is now combined with... Figures 3-7b The following is an example of establishing a fast and slow shear wave surface model for a certain work area through synchronous coordination.

[0088] Step S301: Pick the first arrival time of fast shear wave earthquakes corresponding to fast shear wave earthquake data and the first arrival time of slow shear wave earthquakes corresponding to slow shear wave earthquake data within the preset offset range.

[0089] Specifically, a maximum offset of 1500 meters is specified, and the first arrival times of each shot of fast and slow shear wave seismic data within an offset of 0-1500 meters are picked up to generate fast shear wave and slow shear wave seismic first arrival data files.

[0090] Step S302: Divide the fast shear wave seismic data and slow shear wave seismic data into the same ground grid according to the observation system.

[0091] Specifically, the same ground grid is defined for both fast and slow shear wave seismic data according to the observation system, with a grid size of 5 meters * 40 meters.

[0092] Step S303: Select multiple ground grids, determine the corresponding apparent velocity of the earthquake first arrival based on the offset distance and earthquake first arrival time of each selected ground grid, determine the corresponding refracted wave offset distance range based on the apparent velocity of the earthquake first arrival, and output the corresponding refracted wave offset distance file.

[0093] Specifically, refraction layering control points are selected at different locations in space, such as... Figure 4a The white dots represent refraction layer control points; that is, at these points (ground grids), the offset range used for refraction analysis is selected. The first arrival and offset of earthquakes within the ground grid are extracted. Based on the apparent velocity of the first arrival of earthquakes within this ground grid, the offset range for refraction analysis is defined. Figure 4a Taking the refracted wave offset distance of the third white point in the image as an example, Figure 4b The image shows the initial arrival time-distance map of this ground grid. The apparent velocity within the solid line offset range is 370 m / s, and the apparent velocity within the dashed line offset range is 960 m / s. Since the velocity of the shear wave high-velocity layer in this area is mainly between 900 m / s and 1000 m / s, the minimum offset distance for this control point is selected as 640 m, and the maximum offset distance is 1260 m. Figure 4c As shown, the refracted wave offset range of this ground grid is defined within the range of 640m-1260m. Other ground grids (such as...) Figure 4a The range of refracted wave offset distances (between the white dots in the grid) is obtained by linear interpolation based on the offset distances of these control points.

[0094] Output all relevant data from the selected ground grid as a text file containing refracted wave offsets, in the following format:

[0095]

[0096] Step S304: Determine the fast shear wave refraction velocity based on the first arrival time of the fast shear wave earthquake and the range of the refracted wave offset distance, smooth the fast shear wave refraction velocity, and determine the fast shear wave delay time at the shot point and receiver point based on the smoothed fast shear wave refraction velocity.

[0097] Specifically, based on the first arrival times of fast shear waves within the refracted wave offset range defined in step 303 for different ground grids, refraction velocity analysis is performed to obtain the fast shear wave refraction velocity. The fast shear wave refraction velocity is then smoothed with a smoothing radius of 1000 meters. Finally, the Gauss-Seidel method is used to calculate the delay time, obtaining the fast shear wave delay times for all shot and receiver points, such as... Figure 5a As shown.

[0098] Step S305: Determine the fast shear wave surface velocity based on the surface data corresponding to the fast shear wave seismic data.

[0099] Specifically, organize the surface data corresponding to the fast shear wave data, and obtain the average surface velocity of the fast shear wave according to formula (1).

[0100] Step S306: Perform refraction inversion based on the fast shear wave refraction velocity, fast shear wave delay time, and fast shear wave surface velocity to obtain the fast shear wave surface model, and output the high-speed top file of the shot point and the high-speed top file of the receiver point of the fast shear wave surface model.

[0101] Specifically, the surface velocity of the fast shear wave obtained in step 305, the refraction velocity of the fast shear wave obtained in step 304, and the delay time are used for refraction inversion to obtain the surface model M1 of the fast shear wave, as shown below. Figure 6a As shown, the high-speed top data files of the shot point and the high-speed top data files of the receiver point for the fast shear wave surface model are output respectively.

[0102] Step S307: Read the starting offset and ending offset from the refracted wave offset file, determine the slow shear wave refraction velocity based on the first arrival time of the slow shear wave earthquake within the range of the starting offset and ending offset, smooth the slow shear wave refraction velocity, and determine the slow shear wave delay time of the shot point and receiver point based on the smoothed slow shear wave refraction velocity.

[0103] Specifically, slow shear wave seismic data is selected, and the refracted wave offset text file output in step 303 is read. The relevant data in this offset text file is used as the offset data for the refraction analysis of the slow shear wave seismic data. Refraction velocity analysis is performed on the slow shear wave seismic data to obtain the refraction velocity of the slow shear wave. The refraction velocity of the slow shear wave is smoothed using a smoothing radius R. Then, the Gauss-Seidel method is used to calculate the delay time, obtaining the delay time of the slow shear wave at all shot points and receiver points, such as... Figure 5b As shown.

[0104] Step S308: Read the high-speed top elevation of the shot point and the high-speed top elevation of the receiver point from the high-speed top file of the shot point and the high-speed top file of the receiver point respectively. Perform refraction inversion based on the high-speed top elevation of the shot point, the high-speed top elevation of the receiver point, the slow shear wave refraction rate and the slow shear wave delay time to obtain the slow shear wave surface model.

[0105] Specifically, the high-speed top files of the shot point and the receiver point output in step 306 are read respectively. Combined with the refraction velocity and delay time of the slow shear wave obtained in step 307, the surface velocity corresponding to the surface model of the slow shear wave is calculated by inversion, and the surface model M2 of the slow shear wave is obtained, as shown below. Figure 6b As shown.

[0106] Step S309: Based on the predefined reference plane and filling velocity, perform reference plane static correction on the fast shear wave surface model and the slow shear wave surface model respectively to obtain the corresponding fast shear wave seismic profile and slow shear wave seismic profile.

[0107] Specifically, a unified reference surface and filling velocity were defined. Static correction of the reference surface was calculated using fast shear wave surface model M1 and slow shear wave surface model M2, respectively. Then, seismic processing was performed to obtain fast shear wave seismic profiles and slow shear wave seismic profiles, as shown below. Figure 7a and Figure 7b As shown.

[0108] In summary, the embodiments of the present invention establish fast shear wave surface models and slow shear wave surface models respectively using the refraction inversion method based on the first arrival data of fast and slow shear waves and the surface data of fast shear waves. This ensures that the fast and slow shear wave surface models have high matching and consistent thickness models, thereby improving the correlation between fast and slow shear wave seismic data and facilitating the processing and interpretation of stratigraphic correlation. Therefore, it has wide applicability and versatility.

[0109] Figure 8 This is a schematic diagram of a fast and slow shear wave surface modeling device provided in an embodiment of the present invention, as shown below. Figure 8 As shown, the device 800 includes:

[0110] The first arrival picking module 801 is used to pick up the first arrival time of the first shear wave earthquake corresponding to the first shear wave earthquake data and the first arrival time of the second shear wave earthquake corresponding to the second shear wave earthquake data within a preset offset range, wherein the first shear wave is one of a fast shear wave and a slow shear wave, and the second shear wave is the other of a fast shear wave and a slow shear wave; the grid division module 802 is used to divide the first shear wave earthquake data and the second shear wave earthquake data into the same ground grid according to the observation system; the first determination module 803 is used to select multiple ground grids, and determine the corresponding earthquake first arrival apparent velocity according to the offset of each selected ground grid and the first shear wave earthquake first arrival time or the second shear wave earthquake first arrival time, and determine the corresponding refracted wave offset range according to the earthquake first arrival apparent velocity; the second determination module 804 is used to determine the first shear wave refraction velocity according to the first shear wave earthquake first arrival time and the refracted wave offset range, and determine the first shear wave refraction velocity according to the first shear wave earthquake first arrival time, the refracted wave offset range, and the first shear wave refraction velocity according to the first shear wave earthquake first arrival time and the second shear wave earthquake first arrival time within a preset offset range, and determine the corresponding refracted wave offset range ... The first shear wave delay time at the shot point and receiver point is determined by the shear wave refraction velocity; the third determining module 805 is used to determine the surface velocity of the first shear wave based on the surface data corresponding to the first shear wave seismic data; the surface modeling module 806 is used to perform refraction inversion based on the first shear wave refraction velocity, the first shear wave delay time, and the first shear wave surface velocity to obtain the first shear wave surface model, and output the high-velocity top information of the shot point and the high-velocity top information of the receiver point of the first shear wave surface model; the second determining module 804 is also used to determine the second shear wave refraction velocity based on the first arrival time of the second shear wave seismic event and the range of the refracted wave offset, and to determine the second shear wave delay time at the shot point and receiver point based on the first arrival time of the second shear wave seismic event, the range of the refracted wave offset, and the second shear wave refraction velocity; the surface modeling module 806 is also used to perform refraction inversion based on the high-velocity top information of the shot point, the high-velocity top information of the receiver point, the second shear wave refraction velocity, and the second shear wave delay time to obtain the second shear wave surface model.

[0111] As an embodiment of the present invention, the first determining module 803 is specifically used to: determine the slope of the linear fitting of the offset distance of each ground grid and the first arrival time of the first shear wave earthquake or the first arrival time of the second shear wave earthquake as the apparent velocity of the earthquake arrival of the corresponding ground grid; determine the velocity range of the high-velocity layer closest to the surface; and determine the refracted wave offset distance range corresponding to the high-velocity layer velocity with the smallest difference from the apparent velocity of the earthquake arrival.

[0112] As an embodiment of the present invention, the second determining module 804 is further configured to: smooth the first transverse wave refraction velocity; and smooth the second transverse wave refraction velocity.

[0113] As an embodiment of the present invention, the formula for calculating the surface velocity of the first shear wave is as follows:

[0114]

[0115] Where N is the number of surface weathering layers, h i v is the thickness of the i-th weathered layer. i It is the velocity of the i-th weathering layer.

[0116] As an embodiment of the present invention, the first determining module 803 is further configured to: output a corresponding refracted wave offset file, wherein the refracted wave offset file includes a ground grid number, ground grid east coordinates, ground grid north coordinates, a starting offset, and a ending offset, wherein the starting offset and the ending offset are used to determine the range of the refracted wave offset; the second determining module 804 is specifically configured to: read the starting offset and the ending offset from the refracted wave offset file; and determine the second shear wave refraction velocity based on the first arrival time of the second shear wave earthquake within the range of the starting offset and the ending offset.

[0117] As an embodiment of the present invention, the surface modeling module 806 is specifically used for: outputting the shot point high-speed top file and the receiver high-speed top file of the first shear wave surface model, wherein the shot point high-speed top information file includes the shot point station number and the shot point high-speed top elevation, and the receiver high-speed top information file includes the receiver station number and the receiver high-speed top elevation; reading the shot point high-speed top elevation and the receiver high-speed top elevation from the shot point high-speed top file and the receiver high-speed top file respectively; and performing refraction inversion based on the shot point high-speed top elevation, the receiver high-speed top elevation, the second shear wave refraction velocity, and the second shear wave delay time to obtain the second shear wave surface model.

[0118] As an embodiment of the present invention, the surface modeling module 806 is further configured to: perform reference surface static correction on the first shear wave surface model and the second shear wave surface model according to a predefined reference surface and filling speed, respectively, to obtain the corresponding first shear wave seismic profile and the second shear wave seismic profile.

[0119] The fast and slow shear wave surface modeling device provided in this embodiment of the invention has a similar implementation principle and technical effect to the above embodiments, and will not be described again here.

[0120] like Figure 9 As shown, this embodiment of the invention provides an electronic device, including a processor 901, a communication interface 902, a memory 903, and a communication bus 904, wherein the processor 901, the communication interface 902, and the memory 903 communicate with each other via the communication bus 904.

[0121] Memory 903 is used to store computer programs;

[0122] In one embodiment of the present invention, when the processor 901 executes the program stored in the memory 903, it implements the steps of the ground fast and slow shear wave surface modeling method provided in any of the foregoing method embodiments.

[0123] The electronic device provided in this embodiment of the invention has a similar implementation principle and technical effect to the above embodiments, and will not be described again here.

[0124] The aforementioned memory 903 can be an electronic memory such as flash memory, EEPROM (Electrically Erasable Programmable Read-Only Memory), EPROM, hard disk, or ROM. Memory 903 has storage space for program code used to perform any of the method steps described above. For example, the storage space for program code may include individual program codes for implementing the various steps in the methods described above. This program code can be read from or written to one or more computer program products. These computer program products include program code carriers such as hard disks, optical discs (CDs), memory cards, or floppy disks. Such computer program products are typically portable or fixed storage units. The storage unit may have storage segments or storage spaces arranged similarly to memory 903 in the aforementioned electronic device. The program code may be compressed, for example, in a suitable form. Typically, the storage unit includes programs for performing the method steps according to embodiments of the invention, i.e., code that can be read by a processor such as 901, which, when run by the electronic device, causes the electronic device to perform the various steps in the methods described above.

[0125] Embodiments of the present invention also provide a computer-readable storage medium. The computer-readable storage medium stores a computer program, which, when executed by a processor, implements the steps of the ground-fast and slow shear wave surface modeling method as described above.

[0126] The computer-readable storage medium may be included in the device / apparatus described in the above embodiments; or it may exist independently and not assembled into the device / apparatus. The computer-readable storage medium carries one or more programs that, when executed, implement the method according to the embodiments of the present invention.

[0127] According to embodiments of the present invention, the computer-readable storage medium may be a non-volatile computer-readable storage medium, such as including, but not limited to: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In the present invention, the computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0128] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0129] The above description is merely a specific embodiment of the present invention, enabling those skilled in the art to understand or implement the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A method of modeling a fast and slow shear wave surface layer, characterized by, The method comprises the following steps: picking up first shear wave seismic first break time corresponding to first shear wave seismic data and second shear wave seismic first break time corresponding to second shear wave seismic data in a preset offset distance range, wherein the first shear wave is one of fast shear wave and slow shear wave, and the second shear wave is the other one of fast shear wave and slow shear wave; dividing the same ground grid for the first shear wave seismic data and the second shear wave seismic data according to an observation system; selecting a plurality of ground grids, and determining corresponding seismic first break apparent velocity according to the offset distance of each selected ground grid and the first shear wave seismic first break time or the second shear wave seismic first break time, and determining corresponding refraction wave offset distance range according to the seismic first break apparent velocity; determining first shear wave refraction velocity according to the first shear wave seismic first break time and the refraction wave offset distance range, and determining first shear wave delay time of shot point and receiver according to the first shear wave seismic first break time, the refraction wave offset distance range and the first shear wave refraction velocity; determining first shear wave surface velocity according to surface data corresponding to the first shear wave seismic data; performing refraction inversion according to the first shear wave refraction velocity, the first shear wave delay time and the first shear wave surface velocity to obtain a first shear wave surface model, and outputting shot point high-velocity top information and receiver high-velocity top information of the first shear wave surface model; determining second shear wave refraction velocity according to the second shear wave seismic first break time and the refraction wave offset distance range, and determining second shear wave delay time of shot point and receiver according to the second shear wave seismic first break time, the refraction wave offset distance range and the second shear wave refraction velocity; performing refraction inversion according to the shot point high-velocity top information, the receiver high-velocity top information, the second shear wave refraction velocity and the second shear wave delay time to obtain a second shear wave surface model.

2. The method of claim 1, wherein, The method further comprises the following steps after determining the corresponding seismic first break apparent velocity according to the offset distance of each selected ground grid and the first shear wave seismic first break time or the second shear wave seismic first break time, and determining the corresponding refraction wave offset distance range according to the seismic first break apparent velocity: determining the linear fitting slope of the offset distance of each ground grid and the first shear wave seismic first break time or the second shear wave seismic first break time as the seismic first break apparent velocity of the corresponding ground grid; determining the high-velocity layer velocity range closest to the ground surface, and determining the refraction wave offset distance range corresponding to the high-velocity layer velocity with the smallest difference value from the seismic first break apparent velocity.

3. The method of claim 1, wherein, The method further comprises the following steps after determining the first shear wave refraction velocity according to the first shear wave seismic first break time and the refraction wave offset distance range: performing smoothing processing on the first shear wave refraction velocity. The method further comprises the following steps after determining the second shear wave refraction velocity according to the second shear wave seismic first break time and the refraction wave offset distance range: performing smoothing processing on the second shear wave refraction velocity.

4. The method of claim 1, wherein, The calculation formula of the first shear wave surface velocity is as follows: where N is the number of weathered layers in the surface layer, h i is the thickness of the i-th weathered layer, v i is the velocity of the i-th weathered layer.

5. The method according to any one of claims 1 to 4, characterized in that, The method further comprises the following steps after determining the corresponding refraction wave offset distance range according to the seismic first break apparent velocity: output the corresponding refracted wave offset distance file, the refracted wave offset distance file includes ground grid number, ground grid east coordinate, ground grid north coordinate, start offset distance and end offset distance, the start offset distance and the end offset distance are used to determine the refracted wave offset distance range; the second shear wave refracted velocity is determined according to the second shear wave seismic first arrival time and the refracted wave offset distance range, comprising: read the start offset distance and the end offset distance in the refracted wave offset distance file; the second shear wave refracted velocity is determined according to the second shear wave seismic first arrival time in the start offset distance and the end offset distance range.

6. The method according to any one of claims 1 to 4, characterized in that, the shot point high point information and the receiver point high point information of the first shear wave surface model are output, comprising: output the shot point high point file and the receiver point high point file of the first shear wave surface model, the shot point high point information file includes shot point pile number, shot point high point elevation, and the receiver point high point information file includes receiver point pile number, receiver point high point elevation; the second shear wave surface model is obtained by refracted inversion according to the shot point high point information, the receiver point high point information, the second shear wave refracted velocity and the second shear wave delay time, comprising: respectively read the shot point high point elevation and the receiver point high point elevation in the shot point high point file and the receiver point high point file; the second shear wave surface model is obtained by refracted inversion according to the shot point high point elevation, the receiver point high point elevation, the second shear wave refracted velocity and the second shear wave delay time.

7. The method according to any one of claims 1 to 4, characterized in that, the method further comprises: according to the pre-defined datum surface and filling velocity, the first shear wave surface model and the second shear wave surface model are respectively subjected to datum surface static correction, and the corresponding first shear wave seismic section and the second shear wave seismic section are obtained.

8. A device for modeling a fast and slow shear wave surface layer, characterized by, comprising: the first arrival picking module is used for picking up the first shear wave seismic first arrival time corresponding to the first shear wave seismic data and the second shear wave seismic first arrival time corresponding to the second shear wave seismic data, wherein the first shear wave is one of fast shear wave and slow shear wave, and the second shear wave is the other one of fast shear wave and slow shear wave; the grid division module is used for dividing the same ground grid according to the observation system for the first shear wave seismic data and the second shear wave seismic data; the first determination module is used for selecting a plurality of ground grids, and determining the corresponding seismic first arrival apparent velocity according to the offset distance of each selected ground grid and the first shear wave seismic first arrival time or the second shear wave seismic first arrival time, and determining the corresponding refracted wave offset distance range according to the seismic first arrival apparent velocity; the second determination module is used for determining the first shear wave refracted velocity according to the first shear wave seismic first arrival time and the refracted wave offset distance range, and determining the first shear wave delay time of the shot point and the receiver point according to the first shear wave seismic first arrival time, the refracted wave offset distance range and the first shear wave refracted velocity; the third determination module is used for determining the first shear wave surface velocity according to the surface data corresponding to the first shear wave seismic data; The surface layer modeling module is configured to perform refraction inversion according to the first S-wave refraction velocity, the first S-wave moveout and the first S-wave surface layer velocity to obtain a first S-wave surface layer model, and output shot high-velocity top information and receiver high-velocity top information of the first S-wave surface layer model. The second determining module is further configured to determine a second S-wave refraction velocity according to the second S-wave first arrival time and the refraction wave offset range, and determine a second S-wave moveout of the shot and the receiver according to the second S-wave first arrival time, the refraction wave offset range and the second S-wave refraction velocity. The surface layer modeling module is further configured to perform refraction inversion according to the shot high-velocity top information, the receiver high-velocity top information, the second S-wave refraction velocity and the second S-wave moveout to obtain a second S-wave surface layer model.

9. An electronic device, comprising: The device comprises a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus. The memory is configured to store a computer program. The processor is configured to execute the program stored in the memory to implement the steps of the fast and slow S-wave surface layer modeling method in any one of claims 1-7.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the fast and slow S-wave surface layer modeling method in any one of claims 1-7.

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