A control method and apparatus for a temperature regulating device for a data room

By classifying the servers in the data center and dynamically evaluating the temperature control devices, the aging and reliability issues of the temperature control devices were resolved, thereby improving the reliability and efficiency of server operation.

CN118076066BActive Publication Date: 2026-02-06HANGYIN CONSUMER FINANCE CO LTD
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Patent Information

Application Number
CN202410212861.X
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-02-27
Publication Date
2026-02-06
Estimated Expiration
2044-02-27

AI Technical Summary

Technical Problem

Existing technologies fail to effectively consider the aging and operational reliability of temperature control devices in data center temperature regulation, resulting in insufficient server operational reliability.

Method used

By classifying servers into Class I and Class II, identifying abnormal and critical servers based on operating temperature and age, and combining the attenuation coefficient of the temperature regulation device with reliability assessment, the maximum temperature regulation rate is determined to achieve dynamic regulation.

Benefits of technology

It improves the operational reliability of servers in the data center, ensures the reliability and efficiency of temperature regulation, and adapts to the different needs of different servers.

✦ Generated by Eureka AI based on patent content.

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Patent Text Reader

Abstract

The application provides a control method of a temperature adjusting device for a data machine room, and belongs to the technical field of energy-saving temperature control devices, and specifically comprises the following steps: dividing the types of servers in the machine room into a first type of servers and a second type of servers according to the running data and types of the servers, and determining the temperature adjusting speed of the machine room by the highest temperature adjusting speed, an abnormal server and a compensation factor of a critical temperature server when it is determined that the temperature of the machine room needs to be adjusted according to the running temperatures of the first type of servers and the second type of servers, so that reliable adjustment of the temperature of the machine room and the safety of server operation are realized.
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Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of energy-saving temperature control devices, and particularly relates to a control method and equipment for a temperature regulating device for a data machine room. BACKGROUND

[0002] As the core infrastructure of a credit processing institution, the data machine room guarantees the safety and reliability of its operation, which is the top priority of operation and maintenance. In order to control the temperature of the data machine room, the existing technical solutions control the temperature of the data machine room through the construction of external heat dissipation devices, such as air conditioners, heat dissipation fans, etc. In the invention patent CN202210907179.3 "Air conditioner frequency control method, device, equipment and storage medium", CN202311079648.8 "Method, device, air conditioner and storage medium for controlling air conditioner", technical means are given on how to adjust the adjustment time and adjustment frequency of the temperature control device in combination with the indoor temperature, but the following problems are ignored:

[0003] With the aging of the temperature regulating device, the temperature regulating performance and operation reliability of the temperature regulating device will be attenuated to a certain extent, so if the temperature regulating rate cannot be determined in combination with the above factors, i.e., the attenuation of the temperature regulating performance and the operation reliability of the temperature regulating device, the operation reliability of the servers in the machine room cannot be guaranteed.

[0004] In view of the above technical problems, the application provides a control method and equipment for a temperature regulating device for a data machine room. SUMMARY

[0005] To achieve the purpose of the application, the application adopts the following technical solutions:

[0006] According to one aspect of the application, a control method for a temperature regulating device for a data machine room is provided.

[0007] A control method for a temperature regulating device for a data machine room, characterized in that it specifically comprises:

[0008] S1 classifies the types of servers in the machine room into a class of servers and a class of servers through the operation data and types of the servers, and determines the need for temperature regulation of the machine room according to the operation temperature of the class of servers and the class of servers, and enters the next step;

[0009] S2 determines the temperature abnormality degree of the abnormal server according to the operation temperature of the server, and determines the compensation factor of the abnormal server of the machine room in combination with the type and operation life of the abnormal server;

[0010] S3 determines the state evaluation quantity of the critical temperature server according to the running data of the server, and determines the compensation factor of the critical temperature server of the machine room in combination with the type and running life of the critical temperature server;

[0011] S4 obtains the decay coefficient of the temperature adjusting device, the aging temperature adjusting device, the reliability evaluation coefficient and the unreliable temperature adjusting device based on the running life and failure rate of the temperature adjusting device of the machine room, and determines the maximum temperature adjusting rate of the temperature adjusting device in combination with the running power of the temperature adjusting device, and determines the temperature adjusting rate of the machine room through the maximum temperature adjusting rate, the compensation factor of the abnormal server and the critical temperature server.

[0012] The beneficial effects of the present application are that:

[0013] 1. The types of servers are divided into one type of servers and two types of servers through running data and types, which not only considers the difference in importance caused by different types of servers, but also considers the difference in running data, thereby ensuring the reliability of the operation of the server with large data processing amount.

[0014] 2. The compensation factor of the abnormal server of the machine room is determined, which realizes the screening of the running temperature of the server of the machine room from the aspects of abnormal degree and type of running temperature, and fully considers the difference in running reliability of different types of abnormal servers, thereby ensuring the reliability of the operation of the server of the machine room.

[0015] 3. The compensation factor of the critical temperature server of the machine room is determined, which realizes the screening of the server with running temperature in the critical interval, further evaluates the demand for the temperature adjusting rate of the machine room from another angle, and fully considers the difference in running reliability of different types of critical servers, thereby ensuring the reliability of the operation of the server of the machine room.

[0016] 4. The temperature adjusting rate of the machine room is determined through the maximum temperature adjusting rate, the compensation factor of the abnormal server and the critical temperature server, which realizes the overall evaluation of the temperature adjusting rate from the actual situation of the temperature adjusting device, the demand of the abnormal server and the critical temperature server and the temperature adjusting demand of other servers, thereby ensuring the reliability of the temperature adjusting.

[0017] The further technical scheme is that the types of servers are divided into one type of servers and two types of servers through the running data and types of the servers of the machine room, and specifically includes:

[0018] determining whether the type of the server in the machine room belongs to a specific type, if yes, the server is divided into a type of server, if no, the next step is entered;

[0019] The processing data volume of the server is determined by the running data of the server in the machine room, and the server is divided into a type of server and a type of server by the processing data volume of the server.

[0020] Further technical solutions are that the abnormal server is determined according to the server whose running temperature exceeds the limit, and the temperature abnormality degree of the abnormal server is determined according to the deviation of the running temperature of the abnormal server from the highest running temperature limit value.

[0021] Further technical solutions are that the critical temperature server is determined according to the server whose running temperature is in a critical interval, and specifically, when the running temperature of the server is in the critical interval and it is determined that the server is in an ascending state by the running data and the heat dissipation mode of the server, the server is determined as a critical temperature server.

[0022] Further technical solutions are that the state evaluation quantity of the critical temperature server is determined according to the deviation of the running temperature of the critical temperature server from the temperature endpoint value of the critical interval and the rising rate of the running temperature of the critical server.

[0023] Further technical solutions are that the determination method of the temperature adjustment rate of the machine room is:

[0024] The recommended temperature adjustment rate of the machine room is determined by the highest temperature adjustment rate, the compensation factor of the abnormal server, and the compensation factor of the critical temperature server.

[0025] The running power of the server is determined by the running data of the server, and the server in a temperature rising state is determined in combination with the running temperature of the server, and whether the recommended temperature adjustment rate of the machine room meets the requirements is determined based on the number of the server in the temperature rising state and the deviation of the environmental temperature of the machine room from the set temperature of the machine room, if yes, the temperature adjustment rate of the machine room is determined by the recommended temperature adjustment rate of the machine room, if no, the next step is entered.

[0026] The temperature adjustment rate compensation quantity is determined based on the number of the server in the temperature rising state in the machine room and the deviation of the environmental temperature of the machine room from the set temperature of the machine room, and the temperature adjustment rate of the machine room is determined in combination with the recommended temperature adjustment rate of the machine room.

[0027] In a second aspect, the present application provides a computer device, comprising a memory and a processor connected in communication, and a computer program stored in the memory and capable of running on the processor, characterized in that the processor executes the computer program to perform the control method of the temperature regulating device for a data machine room.

[0028] Other features and advantages will be set forth in the descriptions that follow, and in part will be apparent from the description, or can be learned by practice of the application. The purposes and other advantages of the application will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.

[0029] To make the above objectives, features and advantages of the present application more obvious and easy to understand, the following preferred embodiments are specifically described below, and the accompanying drawings are referred to for a detailed description. BRIEF DESCRIPTION OF DRAWINGS

[0030] The above and other features and advantages of the present application will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings:

[0031] Figure 1 is a flowchart of a control method of a temperature regulating device for a data machine room;

[0032] Figure 2 is a flowchart of a method for determining the need for temperature regulation of a machine room according to the operating temperature of the first type of server and the second type of server;

[0033] Figure 3 is a flowchart of a method for determining the compensation factor of an abnormal server of a machine room;

[0034] Figure 4 is a flowchart of a method for determining the compensation factor of a critical temperature server;

[0035] Figure 5 is a flowchart of a method for determining the maximum temperature regulating rate of a temperature regulating device;

[0036] Figure 6 is a framework diagram of a computer storage medium. DETAILED DESCRIPTION

[0037] In order for those skilled in the art to better understand the technical solutions in the specification, the technical solutions in the specification will be clearly and completely described below in conjunction with the drawings in the specification. Obviously, the described embodiments are only some of the embodiments of the specification, not all. Based on the embodiments of the specification, all other embodiments obtained by those skilled in the art without creative labor should be within the scope of protection of the specification.

[0038] Applicants find that in the existing process of adjusting the temperature of the machine room, the temperature of the machine room is often adjusted only by a fixed adjustment rate and a fixed threshold value. However, the difference in the number of servers in the machine room in an abnormal temperature state or the number of servers in a critical operating temperature interval will have differentiated needs for the adjustment rate. Meanwhile, for different temperature adjustment devices, longer operating time or higher failure rate will affect the adjustment rate and adjustment reliability of the temperature adjustment device to a certain extent.

[0039] In order to solve the above technical problems, the applicant adopts the following technical solutions:

[0040] First, according to the amount and type of business data processed by the server, the server is divided into a class of servers and a class of servers according to the importance of the different;

[0041] The running temperature abnormality is regarded as an abnormal server, and the determination of the temperature adjustment factor required by the abnormal server in the machine room is carried out through the abnormality degree of the abnormal server, the number of the first class of servers and the second class of servers;

[0042] The running temperature in the critical interval and in the temperature rising state is regarded as a critical temperature server, and the determination of the temperature adjustment factor required by the critical temperature server in the machine room is carried out through the running state of the critical temperature server, the number of the first class of servers and the second class of servers;

[0043] The determination of the temperature control device with low stability and the aging temperature control device is carried out by using the operating time and failure rate of the different temperature control devices in the machine room, so as to determine the highest temperature adjustment rate of the temperature control device in the machine room, and the determination of the temperature adjustment rate is carried out through the highest temperature adjustment rate and the temperature adjustment factor required by the abnormal server and the critical temperature server.

[0044] The following will be described in detail from examples 1-3. Example 1

[0045] In order to solve the above problems, according to one aspect of the present application, as shown in Figure 1 A control method for a temperature adjustment device of a data machine room is provided, characterized in that it specifically comprises:

[0046] S1 divides the types of servers in the machine room into a class of servers and a class of servers through the operating data and types of the servers, and determines that the temperature adjustment of the machine room is required according to the operating temperature of the first class of servers and the second class of servers, and enters the next step;

[0047] In one possible embodiment, the running data and type of the server in the machine room in step S1 are used to divide the server into a first type and a second type, which specifically includes:

[0048] It is determined whether the type of the server in the machine room is a specific type. If yes, the server is divided into the first type. If no, the next step is entered.

[0049] The processing data volume of the server is determined based on the running data of the server in the machine room, and the server is divided into the first type and the second type based on the processing data volume.

[0050] In another possible embodiment, the running data and type of the server in the machine room in step S1 are used to divide the server into a first type and a second type, which specifically includes:

[0051] When the type of the server in the machine room is a specific type or the running power of the server is greater than a preset power, the server is divided into the first type. If not, the server is divided into the second type.

[0052] In one possible embodiment, as shown in FIG. 1, step S1 includes determining whether the running temperature of the first type and the second type of servers needs to be adjusted, which specifically includes: Figure 2

[0053] The abnormal server whose running temperature exceeds the limit in the first type and the second type of servers is determined based on the running temperature of the first type and the second type of servers. It is determined whether the temperature of the machine room needs to be adjusted based on the number of the abnormal servers. If yes, it is determined that the temperature of the machine room needs to be adjusted. If no, the next step is entered.

[0054] The critical server whose running temperature is in a critical interval in the first type and the second type of servers is determined based on the running temperature of the first type and the second type of servers. It is determined whether the temperature of the machine room needs to be adjusted based on the number of the critical servers and the number of the abnormal servers. If yes, it is determined that the temperature of the machine room needs to be adjusted. If no, the next step is entered.

[0055] The average of the running temperature of the first type of servers is obtained, and the temperature adjustment demand of the first type of servers in the machine room is determined based on the number of the critical servers and the number of the abnormal servers in the first type of servers.

[0056] ​obtaining the mean value of the running temperature of the second type servers, and combining the number of critical servers and the number of abnormal servers in the second type servers to determine the temperature adjustment demand of the second type servers in the computer room;

[0057] determining the temperature adjustment demand of the computer room by the temperature adjustment demand of the first type servers, the temperature adjustment demand of the second type servers, the number of servers and the mean value of the running temperature, and determining whether the temperature adjustment of the computer room is needed by the temperature adjustment demand of the computer room.

[0058] In one possible embodiment, the determination of the need for the temperature adjustment of the computer room according to the running temperature of the first type servers and the second type servers in the step S1 specifically includes:

[0059] determining the abnormal servers whose running temperature exceeds the limit and the critical servers whose running temperature is in the critical interval by the running temperature of the first type servers and the second type servers;

[0060] determining the temperature adjustment demand of the computer room by the number of critical servers and the number of abnormal servers in the first type servers, and the number of critical servers and the number of abnormal servers in the second type servers, and determining whether the temperature adjustment of the computer room is needed by the temperature adjustment demand of the computer room.

[0061] It should be noted that the temperature adjustment demand of the computer room ranges from 0 to 1, and when the temperature adjustment demand of the computer room is greater than a preset value, it is determined that the temperature adjustment of the computer room is needed.

[0062] In the embodiment, the types of servers are divided into the first type servers and the second type servers by the running data and the types, which not only considers the difference in importance caused by the different types of servers, but also considers the difference in running data, so as to ensure the reliability of the running of the servers with large amount of processing data.

[0063] S2 determining the temperature abnormality degree of the abnormal servers according to the running temperature of the servers, and determining the compensation factor of the abnormal servers in the computer room in combination with the type and the running life of the abnormal servers;

[0064] It can be understood that the abnormal servers in the step S2 are determined according to the servers whose running temperature exceeds the limit, and the temperature abnormality degree of the abnormal servers is determined according to the deviation of the running temperature of the abnormal servers from the highest running temperature limit value.

[0065] In one possible embodiment, as Figure 3As shown, the method for determining the compensation factor of the abnormal server in the machine room in step S2 is:

[0066] S21 obtains the number of abnormal servers, and determines the number compensation factor of the abnormal servers in the machine room through the number of abnormal servers and the proportion of the number of servers in the machine room;

[0067] S22 obtains the temperature abnormality degree of the abnormal servers, determines the temperature abnormality setting amount of the abnormal servers through the running time of the abnormal servers, and regards the abnormal servers with the temperature abnormality degree greater than the temperature abnormality setting amount as serious abnormal servers, and determines whether the number compensation factor can be used as the compensation factor of the abnormal servers through the number of serious abnormal servers and the severity of the abnormal servers, if yes, proceeds to the next step, if no, proceeds to step S24;

[0068] S23 obtains the number of a type of servers in the abnormal servers and the number of a type of servers in the serious abnormal servers through the types of the abnormal servers and the serious abnormal servers, and determines whether the number compensation factor can be used as the compensation factor of the abnormal servers through the number of a type of servers in the abnormal servers and the number of a type of servers in the serious abnormal servers, if yes, determines the compensation factor of the abnormal servers through the number compensation factor, if no, proceeds to step S24;

[0069] S24 determines the compensation factor of a type of servers in the abnormal servers based on the number of a type of servers in the abnormal servers and the temperature abnormality degree, and the number of a type of servers in the serious abnormal servers and the temperature abnormality degree;

[0070] S25 determines the compensation factor of a type of servers in the abnormal servers based on the number of a type of servers in the abnormal servers and the temperature abnormality degree, and the number of a type of servers in the serious abnormal servers and the temperature abnormality degree, and determines the compensation factor of the abnormal servers in combination with the compensation factor of a type of servers and the number compensation factor.

[0071] In another possible embodiment, the method for determining the compensation factor of the abnormal server in step S1 is:

[0072] Obtain the temperature abnormality degree of the abnormal servers, determine the temperature abnormality setting amount of the abnormal servers through the running time of the abnormal servers, and regard the abnormal servers with the temperature abnormality degree greater than the temperature abnormality setting amount as serious abnormal servers;

[0073] determining a number compensation factor of the abnormal servers in the machine room through the number of the abnormal servers and the proportion of the number of the servers in the machine room, and the number of the serious abnormal servers and the proportion of the number of the servers in the machine room;

[0074] determining a corrected number of the abnormal servers of a certain type through the number of the abnormal servers of a certain type and the number of the serious abnormal servers of a certain type, and when the corrected number of the abnormal servers of a certain type is less than a preset server number:

[0075] determining a compensation factor of the abnormal servers through the number compensation factor of the abnormal servers in the machine room and the corrected number of the abnormal servers of a certain type;

[0076] when the corrected number of the abnormal servers of a certain type is not less than a preset server number:

[0077] determining a compensation factor of the abnormal servers of a certain type based on the number of the abnormal servers of a certain type and the temperature abnormality degree, and the number of the serious abnormal servers of a certain type and the temperature abnormality degree;

[0078] determining a compensation factor of the abnormal servers of a second type based on the number of the abnormal servers of a second type and the temperature abnormality degree, and the number of the serious abnormal servers of a second type and the temperature abnormality degree, and determining the compensation factor of the abnormal servers in combination with the compensation factor of the servers of a certain type and the number compensation factor.

[0079] In the embodiment, by determining the compensation factor of the abnormal servers in the machine room, the screening of the problems of the running temperature of the servers in the machine room from the aspects of the abnormality degree and the type of the running temperature is realized, and the difference in the running reliability of the machine room caused by the different types of the abnormal servers is fully considered, so that the running reliability of the servers in the machine room is ensured.

[0080] S3 determining a state evaluation quantity of the critical temperature servers according to the running data of the servers, and determining a compensation factor of the critical temperature servers in the machine room in combination with the type of the critical temperature servers and the running life;

[0081] It can be understood that the critical temperature servers are determined according to the servers whose running temperature is in the critical interval, and specifically, when the running temperature of the servers is in the critical interval and the servers are determined to be in the rising state through the running data and the heat dissipation mode of the servers, the servers are determined to be the critical temperature servers.

[0082] Further, the state evaluation quantity of the critical temperature server is determined according to the deviation of the operating temperature of the critical temperature server from the temperature end point value of the critical interval and the rising rate of the operating temperature of the critical server.

[0083] In one possible embodiment, the method for determining the compensation factor of the critical temperature server in step S3 is as follows:

[0084] The number of the critical temperature servers is obtained, and the comprehensive basic compensation factor of the critical temperature servers in the computer room is determined according to the number of the critical temperature servers, the proportion of the number of the servers in the computer room, and the average value of the state evaluation quantities of the critical temperature servers.

[0085] The state evaluation quantity of the critical temperature server is obtained, the state abnormality setting quantity of the critical temperature server is determined according to the operating life of the critical temperature server, and the critical temperature server with the state evaluation quantity less than the state abnormality setting quantity is regarded as a serious critical server.

[0086] When the number of a type of server in the serious critical servers of the critical temperature servers is greater than a preset number threshold or when the number of a type of server in the serious critical servers is not greater than the preset number threshold but the number of a type of server in the critical temperature servers is greater than a second preset number threshold:

[0087] The compensation factor of a type of server of the critical temperature servers is determined according to the number and the state evaluation quantity of a type of server in the critical temperature servers and the number and the state evaluation quantity of a type of server in the serious critical servers.

[0088] The compensation factor of a type of server of the critical temperature servers is determined according to the number and the state evaluation quantity of a type of server in the critical temperature servers and the number and the state evaluation quantity of a type of server in the serious critical servers, and the compensation factor of the critical temperature servers is determined in combination with the compensation factor of the type of server and the number compensation factor.

[0089] When the number of a type of server in the serious critical servers is not greater than the preset number threshold and the number of a type of server in the critical temperature servers is not greater than the second preset number threshold:

[0090] The compensation factor of the critical temperature servers in the computer room is determined according to the comprehensive basic compensation factor of the critical temperature servers in the computer room, the number of a type of server in the serious critical servers, and the number of a type of server in the critical temperature servers.

[0091] In another possible embodiment, as shown in FIG. 6, the method for determining the compensation factor of the critical temperature servers in the computer room is as follows:Figure 4 The method for determining the compensation factor of the critical temperature server in step S3 is as follows:

[0092] S31 Obtain the number of the critical temperature servers, and determine the comprehensive basic compensation factor of the critical temperature servers in the computer room according to the number of the critical temperature servers, the proportion of the number of the servers in the computer room, and the average of the state evaluation quantity of the critical temperature servers.

[0093] S32 Obtain the state evaluation quantity of the critical temperature servers, determine the state abnormality setting quantity of the critical temperature servers according to the service life of the critical temperature servers, and take the critical temperature servers with the state evaluation quantity less than the state abnormality setting quantity as the serious critical servers.

[0094] S33 Determine the compensation factor of the one-type servers of the critical temperature servers according to the number and the state evaluation quantity of the one-type servers of the critical temperature servers, and the number and the state evaluation quantity of the one-type servers of the serious critical servers, and determine whether the compensation factor of the one-type servers of the critical temperature servers is greater than a preset value, if yes, proceed to the next step, and if no, determine the compensation factor of the critical temperature servers according to the compensation factor of the one-type servers of the critical temperature servers and the comprehensive basic compensation factor.

[0095] S34 Determine the compensation factor of the two-type servers of the critical temperature servers according to the number and the state evaluation quantity of the two-type servers of the critical temperature servers, and the number and the state evaluation quantity of the two-type servers of the serious critical servers, and determine the compensation factor of the critical temperature servers in combination with the compensation factor of the one-type servers and the comprehensive basic compensation factor.

[0096] In the embodiment, the compensation factor of the critical temperature servers in the computer room is determined, so that the servers with the operating temperature in the critical interval are screened, the demand for the temperature adjustment rate of the computer room is further evaluated from another angle, and the difference in the operation reliability of different types of critical servers is fully considered, so that the operation reliability of the servers in the computer room is ensured.

[0097] S4 Obtain the attenuation coefficient of the temperature adjustment device, the aging temperature adjustment device, the reliability evaluation coefficient and the unreliable temperature adjustment device according to the service life and the failure rate of the temperature adjustment device of the computer room, and determine the highest temperature adjustment rate of the temperature adjustment device in combination with the operation power of the temperature adjustment device, and determine the temperature adjustment rate of the computer room according to the highest temperature adjustment rate, the compensation factors of the abnormal servers and the critical temperature servers.

[0098] In one possible embodiment, as shown in Figure 5 The method for determining the maximum temperature adjustment rate of the temperature adjustment device in step S4 is:

[0099] S41 Determine the attenuation coefficient of the temperature adjustment device based on the service life and working hours of the temperature adjustment device in the computer room, and determine the aged temperature adjustment device using the attenuation coefficient; determine the reliability evaluation coefficient of the temperature adjustment device based on the failure rate and service life of the temperature adjustment device in the computer room, and determine the unreliable temperature adjustment device using the reliability evaluation coefficient;

[0100] S42 Determine the maximum stable temperature adjustment rate of the computer room by the rated operating power of different temperature adjustment devices in the computer room, and determine whether the maximum stable temperature adjustment rate of the computer room can be used as the maximum temperature adjustment rate based on the number of unreliable temperature adjustment devices and the number of aged temperature adjustment devices in the computer room, if yes, go to the next step, if no, go to step S44;

[0101] S43 Determine whether the maximum stable temperature adjustment rate of the computer room can be used as the maximum temperature adjustment rate based on the reliability evaluation coefficient and number of unreliable temperature adjustment devices, and the aging coefficient and number of aged temperature adjustment devices in the computer room, if yes, use the maximum stable temperature adjustment rate of the computer room as the maximum temperature adjustment rate, if no, go to step S44;

[0102] S44 Determine the reliability adjustment evaluation amount of the computer room by the reliability evaluation coefficient and number of unreliable temperature adjustment devices, and the reliability evaluation coefficient and number of temperature adjustment devices in the computer room; determine the attenuation adjustment evaluation amount of the computer room by the aging coefficient and number of aged temperature adjustment devices, and the aging coefficient and number of temperature adjustment devices in the computer room;

[0103] S45 Determine the maximum temperature adjustment rate of the computer room based on the attenuation adjustment evaluation amount, reliability adjustment evaluation amount and the maximum stable temperature adjustment rate of the computer room.

[0104] In one possible embodiment, the method for determining the temperature adjustment rate of the computer room in step S4 is:

[0105] Determine the recommended temperature adjustment rate of the computer room by the maximum temperature adjustment rate, the compensation factor of the abnormal server, and the compensation factor of the critical temperature server;

[0106] The determination of the temperature adjustment rate of the machine room is made based on the number of the servers in the temperature rising state in the machine room and the deviation amount of the ambient temperature of the machine room from the set temperature of the machine room, and the determination of the temperature adjustment rate of the machine room is made in combination with the recommended temperature adjustment rate of the machine room.

[0107] The determination of the temperature adjustment rate of the machine room is made based on the number of the servers in the temperature rising state in the machine room and the deviation amount of the ambient temperature of the machine room from the set temperature of the machine room, and the determination of the temperature adjustment rate of the machine room is made in combination with the recommended temperature adjustment rate of the machine room.

[0108] In the embodiment, the determination of the temperature adjustment rate of the machine room is made by the highest temperature adjustment rate and the compensation factor of the abnormal servers and the critical temperature servers, so that the overall evaluation of the temperature adjustment rate is realized from the actual situation of the temperature adjustment device, the requirements of the abnormal servers and the critical temperature servers and the temperature adjustment requirements of other servers, and the reliability of the temperature adjustment is ensured. Embodiment 2

[0109] In another aspect, the present application provides a computer device, comprising a memory and a processor connected in communication, and a computer program stored on the memory and capable of running on the processor, characterized in that the processor executes the computer program to perform the above-mentioned control method of the temperature adjustment device for a data machine room.

[0110] The above-mentioned control method of the temperature adjustment device for a data machine room specifically comprises:

[0111] The servers in the machine room are divided into a first type of servers and a second type of servers according to the running data and types of the servers in the machine room;

[0112] The temperature abnormality degree of the abnormal servers is obtained, the temperature abnormality setting amount of the abnormal servers is determined according to the running life of the abnormal servers, and the abnormal servers with a temperature abnormality degree greater than the temperature abnormality setting amount are regarded as serious abnormal servers;

[0113] The number compensation factor of the abnormal servers in the machine room is determined according to the number of the abnormal servers and the proportion of the number of the servers in the machine room, and the proportion of the number of the serious abnormal servers and the number of the servers in the machine room;

[0114] The correction quantity of the first type of server in the abnormal server is determined by the number of the first type of server in the abnormal server and the number of the first type of server in the severely abnormal server. The compensation factor of the first type of server in the abnormal server is determined based on the number of the first type of server in the abnormal server and the degree of temperature anomaly, and the number of the first type of server in the severely abnormal server and the degree of temperature anomaly.

[0115] The compensation factor for the second type of servers in the abnormal servers is determined based on the number and temperature abnormality of the second type of servers in the abnormal servers and the number and temperature abnormality of the second type of servers in the severely abnormal servers. The compensation factor for the abnormal servers is determined by combining the compensation factor for the first type of servers and the quantity compensation factor.

[0116] The attenuation coefficient, aging temperature control device, reliability assessment coefficient, and unreliable temperature control device are obtained based on the operating years and failure rate of the temperature control device in the computer room. The maximum temperature control rate of the temperature control device is determined by combining the operating power of the temperature control device. The temperature control rate of the computer room is determined by the maximum temperature control rate and the compensation factor of abnormal servers. Example 3

[0117] On the other hand, such as Figure 6 As shown, the present invention provides a computer storage medium storing a computer program, which, when executed in a computer, causes the computer to execute the above-described control method for a temperature regulation device for a data center.

[0118] The control method for a temperature regulation device in a data center, as described above, specifically includes:

[0119] The servers are classified into Class I and Class II servers based on their operating data and type in the computer room.

[0120] The degree of temperature anomaly in the abnormal server is obtained, the temperature anomaly set value of the abnormal server is determined by the number of years the abnormal server has been in operation, and the abnormal server with a temperature anomaly degree greater than the temperature anomaly set value is identified as a severely abnormal server.

[0121] The number of abnormal servers in the data center is determined by the number of abnormal servers and their proportion in the data center, as well as the number of severely abnormal servers and their proportion in the data center.

[0122] determination of the compensation factor of the one-class servers in the abnormal servers based on the number of the one-class servers in the abnormal servers and the temperature abnormality degree, and the number of the one-class servers in the serious abnormal servers and the temperature abnormality degree;

[0123] determination of the compensation factor of the two-class servers in the abnormal servers based on the number of the two-class servers in the abnormal servers and the temperature abnormality degree, and the number of the two-class servers in the serious abnormal servers and the temperature abnormality degree, and determination of the compensation factor of the abnormal servers in combination with the compensation factor of the one-class servers and the number compensation factor;

[0124] obtaining the number of the critical temperature servers, and determining a comprehensive basic compensation factor of the critical temperature servers in the computer room based on the number of the critical temperature servers, and the proportion of the number of the servers in the computer room, and the average of the state evaluation quantities of the critical temperature servers;

[0125] obtaining the state evaluation quantity of the critical temperature servers, determining a state abnormality setting quantity of the critical temperature servers based on the running age of the critical temperature servers, and taking the critical temperature servers with the state evaluation quantity less than the state abnormality setting quantity as serious critical servers;

[0126] when the number of the one-class servers in the serious critical servers is greater than a preset number threshold, or when the number of the one-class servers in the serious critical servers is not greater than the preset number threshold but the number of the one-class servers in the critical temperature servers is greater than a second preset number threshold:

[0127] determination of the compensation factor of the one-class servers in the critical temperature servers based on the number of the one-class servers in the critical temperature servers and the state evaluation quantity, and the number of the one-class servers in the serious critical servers and the state evaluation quantity;

[0128] determination of the compensation factor of the two-class servers in the critical temperature servers based on the number of the two-class servers in the critical temperature servers and the state evaluation quantity, and the number of the two-class servers in the serious critical servers and the state evaluation quantity, and determination of the compensation factor of the critical temperature servers in combination with the compensation factor of the one-class servers and the number compensation factor;

[0129] when the number of the one-class servers in the serious critical servers is not greater than the preset number threshold and the number of the one-class servers in the critical temperature servers is not greater than the second preset number threshold:

[0130] determining the compensation factor of the critical temperature servers of the machine room through the comprehensive base compensation factor of the critical temperature servers of the machine room, the number of the one type of servers in the critical servers and the number of the one type of servers in the critical temperature servers;

[0131] obtaining the decay coefficient of the temperature adjusting device of the machine room and the aging temperature adjusting device, the reliability evaluation coefficient and the unreliable temperature adjusting device according to the running time and the failure rate of the temperature adjusting device of the machine room, and determining the highest temperature adjusting rate of the temperature adjusting device in combination with the running power of the temperature adjusting device, and determining the temperature adjusting rate of the machine room through the highest temperature adjusting rate, the compensation factors of the abnormal servers and the critical temperature servers.

[0132] Each of the embodiments in the specification is described in a progressive manner, and the same and similar parts between the embodiments can be referred to each other. Each of the embodiments focuses on the difference from other embodiments. In particular, for the device, equipment and non-volatile computer storage medium embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the part of the method embodiments.

[0133] The above describes specific embodiments of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recited in the claims can be performed in an order different than the order in the embodiments and still achieve the desired result. In addition, the processes depicted in the figures do not necessarily require the particular order shown or sequential order to achieve the desired results. In certain implementations, multitasking and parallel processing can be advantageous or possible.

[0134] The above only describes one or more embodiments of the specification and does not limit the specification. One or more embodiments of the specification can have various changes and variations for those skilled in the art. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of one or more embodiments of the specification shall be included in the scope of the claims of the specification.

Claims

1. A control method for a temperature conditioning device for a data room, characterized in that, Specifically comprising: The server types are divided into a first type and a second type according to the running data and types of the servers in the computer room, and when it is determined that the temperature adjustment of the computer room is needed according to the running temperatures of the first type and the second type, the next step is entered; The temperature abnormality degree of an abnormal server is determined according to the running temperature of the server, and the compensation factor of the abnormal server in the computer room is determined in combination with the type and running time of the abnormal server; The state evaluation quantity of a critical temperature server is determined according to the running data of the server, and the compensation factor of the critical temperature server in the computer room is determined in combination with the type and running time of the critical temperature server; The attenuation coefficient of the temperature adjustment device in the computer room is determined according to the running time and working hours of the temperature adjustment device, and the aged temperature adjustment device is determined by using the attenuation coefficient; the reliability evaluation coefficient of the temperature adjustment device in the computer room is determined according to the failure rate and running time of the temperature adjustment device, and the unreliable temperature adjustment device is determined by using the reliability evaluation coefficient; the maximum temperature adjustment rate of the temperature adjustment device is determined in combination with the running power of the temperature adjustment device, and the temperature adjustment rate of the computer room is determined by the maximum temperature adjustment rate, the compensation factors of the abnormal server and the critical temperature server.

2. The control method of a temperature adjusting apparatus for a data room according to claim 1, wherein The server types are divided into a first type and a second type according to the running data and types of the servers in the computer room, and when it is determined that the temperature adjustment of the computer room is needed according to the running temperatures of the first type and the second type, the next step is entered; When the type of the server in the computer room is a specific type or the running power of the server is greater than a preset power, the server is divided into the first type, and if not, the server is divided into the second type.

3. The control method of a temperature adjustment device for a data machine room according to claim 1, wherein It is determined that the temperature adjustment of the computer room is needed, specifically comprising: The abnormal server whose running temperature is out of limit and the critical server whose running temperature is in a critical interval are determined in the first type and the second type according to the running temperatures of the first type and the second type; The temperature adjustment demand of the computer room is determined according to the number of critical servers and the number of abnormal servers in the first type and the number of critical servers and the number of abnormal servers in the second type, and whether the temperature adjustment of the computer room is needed is determined according to the temperature adjustment demand of the computer room.

4. The control method of a temperature adjusting apparatus for a data room according to claim 3, wherein The temperature adjustment demand of the computer room is in a range of 0 to 1, and when the temperature adjustment demand of the computer room is greater than a preset value, it is determined that the temperature adjustment of the computer room is needed.

5. The control method of a temperature adjusting apparatus for a data room according to claim 1, wherein The abnormal server is determined according to the server whose running temperature is out of limit, and the temperature abnormality degree of the abnormal server is determined according to the deviation of the running temperature of the abnormal server from a maximum running temperature limit value.

6. The control method of a temperature adjusting apparatus for a data room according to claim 1, wherein The compensation factor of the abnormal server in the computer room is determined by the following method: obtaining the temperature abnormality degree of the abnormal server, determining the temperature abnormality setting quantity of the abnormal server through the running time of the abnormal server, and taking the abnormal server with the temperature abnormality degree greater than the temperature abnormality setting quantity as a serious abnormal server; determining the number compensation factor of the abnormal server in the machine room through the number of the abnormal server and the proportion of the number of the server in the machine room, the number of the serious abnormal server and the proportion of the number of the server in the machine room; when the corrected number of the one-type server of the abnormal server is less than the preset server number: determining the compensation factor of the abnormal server through the number compensation factor of the abnormal server in the machine room and the corrected number of the one-type server of the abnormal server; when the corrected number of the one-type server of the abnormal server is not less than the preset server number: determining the compensation factor of the one-type server of the abnormal server based on the number and the temperature abnormality degree of the one-type server of the abnormal server, and the number and the temperature abnormality degree of the one-type server of the serious abnormal server; determining the compensation factor of the two-type server of the abnormal server based on the number and the temperature abnormality degree of the two-type server of the abnormal server, and the number and the temperature abnormality degree of the two-type server of the serious abnormal server, and determining the compensation factor of the abnormal server in combination with the compensation factor of the one-type server and the number compensation factor.

7. The control method of a temperature adjusting apparatus for a data room according to claim 1, wherein The critical temperature server is determined according to the server with the running temperature in the critical interval, and specifically, when the running temperature of the server is in the critical interval and the server is determined to be in the rising state through the running data and the heat dissipation mode of the server, the server is determined to be the critical temperature server.

8. The control method of a temperature adjustment device for a data machine room according to claim 1, wherein The state evaluation quantity of the critical temperature server is determined according to the deviation of the running temperature of the critical temperature server from the temperature endpoint value of the critical interval and the rising rate of the running temperature of the critical server.

9. The control method of a temperature adjustment device for a data machine room according to claim 1, wherein, The method for determining the compensation factor of the critical temperature server is: S31 obtains the number of the critical temperature server, and determines the comprehensive basic compensation factor of the critical temperature server in the machine room through the number of the critical temperature server and the proportion of the number of the server in the machine room, and the average of the state evaluation quantities of the critical temperature server; S32 obtains the state evaluation quantity of the critical temperature server, determines the state abnormality setting quantity of the critical temperature server through the running time of the critical temperature server, and takes the critical temperature server with the state evaluation quantity less than the state abnormality setting quantity as a serious critical server; S33 determines the compensation factor of the category one server of the critical temperature server based on the number and state evaluation of the category one server in the critical temperature server and the number and state evaluation of the category one server in the serious critical server, and judges whether the compensation factor of the category one server of the critical temperature server is greater than a preset value, if yes, proceeds to the next step, if not, determines the compensation factor of the critical temperature server through the compensation factor of the category one server of the critical temperature server and the comprehensive basic compensation factor; S34 determines the compensation factor of the category two server of the critical temperature server based on the number and state evaluation of the category two server in the critical temperature server and the number and state evaluation of the category two server in the serious critical server, and determines the compensation factor of the critical temperature server in combination with the compensation factor of the category one server and the comprehensive basic compensation factor.

10. The control method of a temperature adjustment device for a data machine room according to claim 1, wherein, The method for determining the maximum temperature regulation rate of the temperature regulation device is: S41 determines the attenuation coefficient of the temperature regulation device of the computer room based on the running time and working hours of the temperature regulation device of the computer room, and determines the aged temperature regulation device by using the attenuation coefficient; determines the reliability evaluation coefficient of the temperature regulation device of the computer room based on the failure rate and running time of the temperature regulation device of the computer room, and determines the unreliable temperature regulation device by using the reliability evaluation coefficient; S42 determines the maximum stable temperature regulation rate of the computer room by the rated operating power of the different temperature regulation devices of the computer room, and determines whether the maximum stable temperature regulation rate of the computer room can be taken as the maximum temperature regulation rate based on the number of the unreliable temperature regulation devices and the number of the aged temperature regulation devices of the computer room, if yes, proceeds to the next step, if not, proceeds to step S44; S43 determines whether the maximum stable temperature regulation rate of the computer room can be taken as the maximum temperature regulation rate based on the reliability evaluation coefficient and number of the unreliable temperature regulation devices, the attenuation coefficient and number of the aged temperature regulation devices of the computer room, if yes, takes the maximum stable temperature regulation rate of the computer room as the maximum temperature regulation rate, if not, proceeds to step S44; S44 determines the reliability regulation evaluation of the computer room by the reliability evaluation coefficient and number of the unreliable temperature regulation devices, the reliability evaluation coefficient and number of the temperature regulation devices of the computer room; determines the attenuation regulation evaluation of the computer room by the attenuation coefficient and number of the aged temperature regulation devices, the attenuation coefficient and number of the temperature regulation devices of the computer room; S45 determines the maximum temperature regulation rate of the computer room based on the attenuation regulation evaluation, the reliability regulation evaluation and the maximum stable temperature regulation rate of the computer room.

11. A computer device comprising: Memory and a processor of a communication connection, and a computer program stored on the memory and capable of running on the processor, characterized in that the processor, when running the computer program, performs the control method of the temperature regulating device for a data machine room according to any one of claims 1-10.

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