Test device and test system

Abstract

The present application relates to the field of hardware testing, and discloses a test device and a test system, including: a controller and a differential signal conversion circuit; in the technical solution provided by the present application, the controller determines the target communication protocol to be used through the test task information and the identity information of the device under test, and controls the output of the power supply unit of the differential signal conversion circuit according to the required voltage of the target communication protocol to ensure normal communication, so that the controller can communicate with different types of devices under test and expand the application range of the test device. At the same time, the differential signal is used to communicate with the device under test to further improve the reliability of data transmission. Compared with the existing technology, in the technical solution provided by the present application, the controller can use different communication protocols to communicate with different types of devices under test, and there is no need to replace the test device during the test process, which can effectively reduce the test cost and improve the test efficiency.

Description

Technical Field

[0001] The present application relates to the field of hardware testing, and in particular to a testing device and a testing system. Background Art

[0002] Automated testing is a method that uses automated tools to execute test cases and evaluate hardware performance. Automated testing is often used to improve testing efficiency, reduce testing time and costs, and ensure hardware performance and stability.

[0003] During testing, automated test equipment must communicate with the device under test (DUT) to send test signals and obtain feedback. Because different communication protocols require different communication levels, current automated test equipment often only uses a single, fixed protocol. This communication method has weak interference immunity and is incompatible with different types of DUTs. Testing different DUTs requires the use of multiple different test equipment, reducing test efficiency and significantly increasing testing costs.

[0004] Therefore, it can be seen that how to provide a testing device with high efficiency and low cost to more conveniently test different types of devices under test is a problem that those skilled in the art need to solve urgently. Summary of the Invention

[0005] The purpose of this application is to solve the problem in the prior art that a single test device cannot perform automated testing on different types of devices under test, resulting in the need for a large number of different test devices, which reduces test efficiency and increases test costs. Therefore, this application provides a test device and a test system to improve test efficiency and reduce the cost of test equipment.

[0006] In order to solve the above technical problems, the present application provides a testing device, which is characterized by comprising:

[0007] A controller and a differential signal conversion circuit; wherein the differential signal conversion circuit has a power supply circuit with adjustable output voltage;

[0008] The controller is used to obtain test task information, and determine the target communication protocol and the required voltage of the target communication protocol according to the test task information and the identity information of the device under test, thereby controlling the output of the power supply circuit according to the required voltage;

[0009] The controller is connected to the differential signal conversion circuit to send a test instruction to the differential signal conversion circuit, and obtains performance detection data of the device under test sent by the differential signal conversion circuit, so as to determine the performance of the device under test according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information;

[0010] The differential signal conversion circuit converts the test instruction into a differential test instruction to differentially communicate with the device under test.

[0011] Preferably, the differential signal conversion circuit includes a dual-power bus transceiver, a differential driving circuit and a differential receiving circuit;

[0012] The dual power bus transceiver is connected to the controller to obtain the test instruction and perform level conversion on the test instruction according to the required voltage;

[0013] The input end of the differential driving circuit is connected to the dual power bus transceiver to obtain the test instruction after level conversion and generate a differential test signal according to the test instruction;

[0014] The output end of the differential driving circuit is connected to the device under test to send the differential test signal to the device under test;

[0015] The input end of the differential receiving circuit is connected to the device under test to obtain differential performance detection data sent by the device under test, and convert the differential performance detection data into single-ended performance detection data;

[0016] The output end of the differential receiving circuit is connected to the controller to send the performance detection data to the controller.

[0017] Preferably, it also includes a controllable DC signal generating circuit;

[0018] The input end of the controllable DC signal generating circuit is connected to the controller to obtain the test instruction and generate a DC test signal according to the test instruction;

[0019] The output end of the controllable DC signal generating circuit is connected to the device under test to send the DC test signal to the device under test.

[0020] Preferably, the controllable DC signal generating circuit includes: a reference voltage circuit, a digital-to-analog conversion circuit and a voltage follower circuit;

[0021] The reference voltage circuit is connected to the digital-to-analog conversion circuit to supply power to the digital-to-analog conversion circuit;

[0022] The input end of the digital-to-analog conversion circuit is connected to the controller to obtain the test instruction;

[0023] The output end of the digital-to-analog conversion circuit is connected to the input end of the voltage follower circuit, and the output end of the voltage follower circuit is connected to the device under test.

[0024] Preferably, it also includes a power supply control circuit;

[0025] The power supply control circuit includes a current detection circuit and a power switch circuit;

[0026] The current detection circuit is connected to both the device under test and the controller to obtain the operating current of the device under test and send the operating current to the controller;

[0027] The first end of the power switch circuit is connected to the power supply, the second end of the power switch circuit is connected to the device under test, and the control end of the power switch circuit is connected to the controller so as to shut down when receiving a shutdown signal sent by the controller; the shutdown signal is a signal generated by the controller when it detects that the operating current is greater than the current threshold.

[0028] Preferably, the power switch circuit includes a relay, a relay control circuit and a switch circuit;

[0029] The current detection circuit includes a differential operation circuit and a voltage follower circuit;

[0030] A first end of the normally open contact of the relay is connected to an input end of the differential operation circuit, a second end of the normally open contact of the relay is connected to the device under test to obtain the working current, and the relay coil is connected to the relay control circuit;

[0031] A first end of the switch circuit is connected to an input end of the relay control circuit, a second end of the switch circuit is grounded, and a control end of the switch circuit is connected to the controller;

[0032] The output end of the differential operation circuit is connected to the input end of the voltage follower circuit, and the output end of the voltage follower circuit is connected to the controller.

[0033] Preferably, it also includes a DC signal processing circuit;

[0034] The DC signal processing circuit includes a resistance attenuation circuit and an adder circuit;

[0035] The input end of the resistance attenuation circuit is connected to the device under test, and the output end of the resistance attenuation circuit is connected to the non-inverting input end of the adder circuit;

[0036] The inverting input terminal of the adder circuit is grounded, and the output terminal of the adder circuit is connected to the controller;

[0037] Preferably, it further comprises: an AC signal processing circuit;

[0038] The AC signal processing circuit includes: a hysteresis comparator circuit and a peak detection circuit;

[0039] The input end of the hysteresis comparator circuit is connected to the device under test, and the output end of the hysteresis comparator circuit is connected to the controller to obtain AC signal frequency information;

[0040] The input end of the peak detection circuit is connected to the device under test, and the output end of the peak detection circuit is connected to the controller to obtain AC signal amplitude information.

[0041] Preferably, it further includes a display unit;

[0042] The display unit is connected to the controller to obtain and display performance test results.

[0043] In order to solve the above technical problems, the present application also provides a testing system, including the above testing device.

[0044] The present application provides a test device, comprising: a controller and a differential signal conversion circuit; wherein the differential signal conversion circuit has a power supply circuit with an adjustable output voltage; the controller is used to obtain test task information, and determine the target communication protocol and the required voltage of the target communication protocol according to the test task information and the identity information of the device to be tested, thereby controlling the output of the power supply circuit according to the required voltage; the controller is connected to the differential signal conversion circuit to send a test instruction to the differential signal conversion circuit, and obtain the performance detection data of the device to be tested sent by the differential signal conversion circuit, so as to determine the performance of the device to be tested according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information; the differential signal conversion circuit converts the test instruction into a differential test instruction to differentially communicate with the device to be tested. It can be seen that in the technical solution provided by the present application, the controller determines the target communication protocol to be used through the test task information and the identity information of the device to be tested, and controls the output of the power supply unit of the differential signal conversion circuit according to the required voltage of the target communication protocol to ensure normal communication, so that the controller can communicate with different types of devices to be tested, thereby expanding the application range of the test device. At the same time, differential signals are used to communicate with the device under test, further improving the reliability of data transmission. Compared with the existing technology, the technical solution provided by this application allows the controller to use different communication protocols to communicate with different types of devices under test. There is no need to replace the test device during the test process, which can effectively reduce testing costs and improve testing efficiency.

[0045] In addition, the present application also provides a testing system, including the above-mentioned testing device, with the same effect as above. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0047] Figure 1 A structural diagram of a testing device provided in an embodiment of the present application;

[0048] Figure 2 A structural diagram of a differential signal conversion circuit provided in an embodiment of the present application;

[0049] Figure 3 A structural diagram of a controllable DC signal generating circuit provided in an embodiment of the present application;

[0050] Figure 4 A structural diagram of a power supply control circuit provided in an embodiment of the present application;

[0051] Figure 5 A structural diagram of a DC signal processing circuit provided in an embodiment of the present application;

[0052] Figure 6 A structural diagram of an AC signal processing circuit provided in this application;

[0053] Figure 7 A structural diagram of a display device provided in an embodiment of the present application;

[0054] Figure 8 A structural diagram of another display device provided in an embodiment of the present application;

[0055] Figure 9 A structural diagram of a key circuit provided in an embodiment of the present application;

[0056] The figures are marked as follows: 1 is a controller, 2 is a differential signal conversion circuit, 3 is a dual-power bus transceiver, 4 is a differential drive circuit, 5 is a differential receiving circuit, 6 is a controllable DC signal generating circuit, 7 is a reference voltage circuit, 8 is a digital-to-analog conversion circuit, 9 is a voltage follower circuit, 10 is a power supply control circuit, 11 is a current detection circuit, 12 is a power switch circuit, 13 is a relay, 14 is a switch circuit, 15 is a relay control circuit, 16 is a DC signal processing circuit, 17 is a resistance attenuation circuit, 18 is an adder circuit, 19 is an AC signal processing circuit, 20 is a hysteresis comparator circuit, 21 is a peak detection circuit, 22 is a display interface circuit, 23 is a light-emitting diode display circuit, and 24 is a key circuit. DETAILED DESCRIPTION

[0057] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0058] The core of this application is to provide a testing device and a testing system to improve testing efficiency and reduce the cost of testing equipment.

[0059] To help those skilled in the art better understand the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. During the test process, an automated test device needs to communicate with the device under test (DUT) to send test signals to the DUT and obtain feedback signals. Because different communication protocols require different communication levels, current automated test devices are often only able to communicate with the DUT using a fixed communication protocol. This communication method has weak anti-interference capabilities and makes the automated test device incompatible with different types of DUTs. When testing different DUTs, multiple different test devices are required, resulting in reduced test efficiency and significantly increased testing costs. To address this technical problem, the present application provides a test device comprising a controller 1 and a differential signal conversion circuit 2. The controller 1 determines the target communication protocol to be used based on test task information and the identity information of the DUT, and controls the output of the power supply unit of the differential signal conversion circuit 2 according to the required voltage of the target communication protocol to ensure normal communication. This enables the controller 1 to communicate with different types of DUTs, expanding the application range of the test device. Furthermore, the use of differential signals to communicate with the DUT further improves the reliability of data transmission. Compared with the existing technology, in the technical solution provided by this application, the controller 1 can use different communication protocols to communicate with different types of devices under test. There is no need to replace the test device during the test process, which can effectively reduce the test cost and improve the test efficiency.

[0060] Figure 1 A structural diagram of a test device provided in an embodiment of the present application is shown in FIG. Figure 1 As shown, the test device includes: a controller 1 and a differential signal conversion circuit 2; wherein the differential signal conversion circuit 2 has a power supply circuit with adjustable output voltage; the controller 1 is used to obtain test task information, and determine the target communication protocol and the required voltage of the target communication protocol according to the test task information and the identity information of the device under test, thereby controlling the output of the power supply circuit according to the required voltage; the controller 1 is connected to the differential signal conversion circuit 2 to send a test instruction to the differential signal conversion circuit 2, and obtain performance detection data of the device under test sent by the differential signal conversion circuit 2, so as to determine the performance of the device under test according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information; the differential signal conversion circuit 2 converts the test instruction into a differential test instruction to differentially communicate with the device under test.

[0061] In a specific implementation, controller 1 pre-stores various bus communication protocols to facilitate data transmission based on specific scenarios. Common bus communication protocols include Universal Synchronous / Asynchronous Receiver / Transmitter (USART), I2C, Controller Area Network (CAN), and Serial Peripheral Interface (SPI). Controller 1 obtains the identity information of the device under test (DUT) and determines the corresponding communication mode based on this information. Specifically, a database can be pre-established to store the corresponding communication protocols for different types of DUTs. Alternatively, the DUT's identity information can be configured to reflect the type of communication protocol in the identity information, allowing controller 1 to determine the communication protocol by parsing the identity information. After obtaining the test task information, controller 1 determines the target communication protocol based on the test items and the identity information.

[0062] It is understandable that in order for the interface of the controller 1 to output signals of different communication protocols, it is necessary to change the signal level through an external power supply. In this embodiment, in order to expand the range of signal levels that the interface can provide, a variable power supply circuit can be used to provide the interface level. In a specific implementation, an adaptive power supply circuit is selected to power the interface conversion circuit to provide different power levels according to the communication protocol type and interface requirements. First, based on the communication protocol and interface requirements that need to be supported, an adaptive power supply circuit with corresponding functions and parameters is selected. Ensure that the model of the selected adaptive power supply circuit can support the required signal level and communication rate and has the appropriate interface type and pin definition. And according to the requirements of different communication protocols, the power pins of the dual-power bus transceiver 3 are reasonably configured. By adjusting the power supply voltage and current, the signal level and amplitude can be controlled to meet the specifications of different protocols. Furthermore, in order to improve the security and reliability of the signal channel, it is necessary to use a differential signal conversion circuit 2 to convert the single-ended signal into a differential signal.

[0063] The differential signal conversion circuit 2 is a circuit that amplifies the difference between two input signals and converts it into a single output. This circuit is typically used to suppress common-mode noise and enhance a signal's anti-interference capabilities, making it important in many applications. The differential signal conversion circuit 2 receives two signals as inputs, and the difference between these two signals is considered the effective input signal. The circuit's output is an amplified version of the difference between the two input signals. This circuit design eliminates the effects of common-mode signals and improves signal anti-interference capabilities. The differential signal conversion circuit 2 has a wide range of applications in high-speed digital signal processing, analog-to-digital converters (ADCs), and digital-to-analog converters (DACs). For example, in high-speed digital signal processing, the differential signal conversion circuit 2 can convert digital signals into differential outputs to reduce the impact of electromagnetic interference (EMI) and improve signal transmission quality and stability. Furthermore, the differential signal conversion circuit 2 can also perform conversions using a single-ended to differential circuit (i.e., a differential driver circuit 4) or a differential to single-ended circuit (i.e., a differential receiver circuit 5) to meet the needs of various signal processing and transmission requirements. These conversion methods can be achieved through appropriate circuit design and configuration to ensure signal integrity and stability.

[0064] The present embodiment provides a test device, comprising a controller and a differential signal conversion circuit; wherein the differential signal conversion circuit has a power supply circuit with an adjustable output voltage; the controller is used to obtain test task information, and determine the target communication protocol and the target communication protocol's required voltage according to the test task information and the identity information of the device under test, thereby controlling the output of the power supply circuit according to the required voltage; the controller is connected to the differential signal conversion circuit to send a test instruction to the differential signal conversion circuit, and obtain the performance detection data of the device under test sent by the differential signal conversion circuit, so as to determine the performance of the device under test according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information; the differential signal conversion circuit converts the test instruction into a differential test instruction to differentially communicate with the device under test. It can be seen that in the technical solution provided by the present application, the controller determines the target communication protocol to be used through the test task information and the identity information of the device under test, and controls the output of the power supply unit of the differential signal conversion circuit according to the required voltage of the target communication protocol to ensure normal communication, thereby enabling the controller to communicate with different types of devices under test, thereby expanding the application range of the test device. At the same time, the differential signal is used to communicate with the device under test, further improving the reliability of data transmission. Compared with the existing technology, in the technical solution provided by this application, the controller can use different communication protocols to communicate with different types of devices under test. There is no need to replace the test device during the test process, which can effectively reduce the test cost and improve the test efficiency.

[0065] Figure 2 A structural diagram of a differential signal conversion circuit provided in an embodiment of the present application is shown in FIG. Figure 2 As shown, the differential signal conversion circuit 2 includes a dual-power bus transceiver 3, a differential driving circuit 4 and a differential receiving circuit 5; the dual-power bus transceiver 3 is connected to the controller 1 to obtain test instructions and perform level conversion on the test instructions according to the required voltage; the input end of the differential driving circuit 4 is connected to the dual-power bus transceiver 3 to obtain the test instructions after level conversion and generate a differential test signal according to the test instructions; the output end of the differential driving circuit 4 is connected to the device under test to send the differential test signal to the device under test; the input end of the differential receiving circuit 5 is connected to the device under test to obtain differential performance detection data sent by the device under test and convert the differential performance detection data into single-ended performance detection data; the output end of the differential receiving circuit 5 is connected to the controller 1 to send the performance detection data to the controller 1.

[0066] The dual-power bus transceiver features configurable level shifting, tri-state outputs, and VCC (Volt Current Condenser: the circuit's supply voltage) isolation. This accommodates varying communication voltage requirements between controller 1 and the device under test (DUT). Currently, it can accommodate any voltage node between 1.65 and 5.5V, compatible with popular communication voltages of 1.8V, 2.5V, 3.3V, and 5V. The differential driver converts the dual-power bus transceiver's traditional signal into a differential signal. The differential receiver performs the opposite function, converting the differential signal into a single positive (or negative) voltage signal (traditional signal).

[0067] The test device provided in this application includes a general working mode and an extended working mode. When in the general working mode, the controller 1 communicates with the device under test in a differential manner, such as Figure 2 As shown, the test channels have a total of 16 transmit and receive channels, including 8 transmit channels (4 differential transmit signals and 4 traditional transmit signals); and 8 receive channels (4 differential receive signals and 4 traditional receive signals). In extended operating mode, the device under test connects to the reserved expansion interface in the differential conversion multi-channel communication circuit. This mode maintains compatibility with all functions in general mode while adding additional communication channels, adjusting wiring requirements based on actual needs. Through the internal control protocol of controller 1, a maximum of 256 communication channels can be transmitted and received: 128 transmit channels (64 differential transmit signals and 64 traditional transmit signals); and 128 receive channels (64 differential receive signals and 64 traditional receive signals). This meets the multi-channel communication testing requirements of various products.

[0068] Figure 3 This is a structural diagram of a controllable DC signal generating circuit provided in an embodiment of the present application, such as Figure 3As shown, the input end of the controllable DC signal generating circuit 6 is connected to the controller 1 to obtain test instructions and generate a DC test signal according to the test instructions; the output end of the controllable DC signal generating circuit 6 is connected to the device under test to send the DC test signal to the device under test. In a specific implementation, the controllable DC signal generating circuit 6 includes: a reference voltage circuit 7, a digital-to-analog conversion circuit 8, and a voltage follower circuit 9; the reference voltage circuit 7 is connected to the digital-to-analog conversion circuit 8 to provide power to the digital-to-analog conversion circuit 8; the input end of the digital-to-analog conversion circuit 8 is connected to the controller 1 to obtain test instructions; the output end of the digital-to-analog conversion circuit 8 is connected to the input end of the voltage follower circuit 9, and the output end of the voltage follower circuit 9 is connected to the device under test. The digital-to-analog conversion circuit 8 uses the AD5542 chip, which is a 16-bit voltage output digital-to-analog converter. The output range of the digital-to-analog conversion circuit 8 is from 0V to the reference voltage value. While ensuring the stability of the reference voltage circuit 7, the controller 1 inputs relevant instructions to the output circuit of the digital-to-analog conversion circuit 8 to control the digital-to-analog conversion circuit 8 to output a controllable DC signal. After the follower voltage is stabilized and the driving capability is improved, the signal is divided into three paths to the device under test for testing.

[0069] During the specific testing process, it is also necessary to monitor the working current of the device under test in real time to prevent the device from malfunctioning and causing danger and economic losses.

[0070] On the basis of the above embodiment, the testing device further includes a power supply control circuit 10; Figure 4 This is a structural diagram of a power supply control circuit provided in an embodiment of the present application, such as Figure 4 As shown, the power supply control circuit 10 includes a current detection circuit 11 and a power switch circuit 12; the current detection circuit 11 is connected to both the device under test and the controller 1 to obtain the operating current of the device under test and send the operating current to the controller 1; the first end of the power switch circuit 12 is connected to the power supply, the second end of the power switch circuit 12 is connected to the device under test, and the control end of the power switch circuit 12 is connected to the controller 1 to shut down when receiving the shutdown signal sent by the controller 1; the shutdown signal is a signal generated by the controller 1 when it detects that the operating current is greater than the current threshold.

[0071] The power switch circuit 12 includes a relay 13, a relay control circuit 15 and a switch circuit 14; the current detection circuit 11 includes a differential operation circuit and a voltage follower circuit; the first end of the normally open contact of the relay 13 is connected to the input end of the differential operation circuit, and the second end of the normally open contact of the relay 13 is connected to the device to be tested to obtain the working current, and the relay 13 coil is connected to the relay control circuit 15; the first end of the switch circuit 14 is connected to the input end of the relay control circuit 15, the second end of the switch circuit 14 is grounded, and the control end of the switch circuit 14 is connected to the controller 1; the output end of the differential operation circuit is connected to the input end of the voltage follower circuit, and the output end of the voltage follower circuit is connected to the controller 1.

[0072] Controller 1 controls power switch circuit 12, providing VCC3 to the device under test. During power supply, the controller detects the current status in real time to determine whether the device under test is operating normally. If the returned value is abnormal, the power supply is quickly cut off to ensure personnel safety. VCC1 and VCC2 are the bipolar power supplies for power switch circuit 12, VCC3 supplies power to the device under test, and VCC4 supplies power to relay 13.

[0073] like Figure 4 As shown, the current detection circuit 11 consists of a differential operation circuit and a voltage follower circuit. This circuit can measure current when the input voltage is within the range of VCC1 and VCC2. The differential operation circuit amplifies the voltage difference across the sampling resistor at VCC3, performs voltage following, and collects the information after low-pass filtering. The power switch circuit 12 consists of a relay 13, a relay control circuit 15, and a switch circuit 14. A specific signal applied to the input of switch circuit 14 activates or deactivates relay 13. When relay 13 is activated, VCC3 supplies power to the device under test. When relay 13 is deactivated, the power supply is cut off, thereby controlling the power supply to the device under test.

[0074] Figure 5 This is a structural diagram of a DC signal processing circuit provided in an embodiment of the present application, such as Figure 5 As shown, the DC signal processing circuit 16 includes a resistance attenuation circuit 17 and an adder circuit 18; the input end of the resistance attenuation circuit 17 is connected to the device under test, and the output end of the resistance attenuation circuit 17 is connected to the non-inverting input end of the adder circuit 18; the inverting input end of the adder circuit 18 is grounded, and the output end of the adder circuit 18 is connected to the controller 1.

[0075] like Figure 5As shown, DC signal processing circuit 16 consists of a resistor attenuation circuit 17 and an adder circuit 18. The left side shows the DC signal output by the device under test. After adjusting the attenuation ratio to output a suitable value, it is combined with the voltage of adder circuit 18 to detect any voltage value between (+VCC) and (-VCC). The right side, controller 1 collects the output value and can infer the magnitude of the DC signal input to the device under test.

[0076] Figure 6 This is a structural diagram of an AC signal processing circuit provided in this application, such as Figure 6 As shown, the AC signal processing circuit 19 includes: a hysteresis comparator circuit 20 and a peak detection circuit 21; the input end of the hysteresis comparator circuit 20 is connected to the device under test, and the output end of the hysteresis comparator circuit 20 is connected to the controller 1 to obtain AC signal frequency information; the input end of the peak detection circuit 21 is connected to the device under test, and the output end of the peak detection circuit 21 is connected to the controller 1 to obtain AC signal amplitude information.

[0077] like Figure 6 As shown, the AC signal processing circuit 19 includes a hysteresis comparator circuit 20 and a peak detection circuit 21. The AC signal processing circuit 19 splits one AC signal input from the device under test into two paths, and uses the hysteresis comparator circuit 20 to detect the frequency information of the AC signal, and uses the peak detection circuit 21 to obtain the amplitude information of the AC signal.

[0078] In this embodiment, a hysteresis comparator circuit 20 is used to prevent the comparator from having a long delay time and being unable to meet actual output oscillation requirements. The characteristic of this comparator is that when the input signal gradually increases or decreases, it has two unequal thresholds, and its transmission characteristics have the shape of a "hysteresis" curve. It has the characteristics of high precision, high speed, and low power consumption. It can quickly respond to changes in the input signal and output a corresponding signal. Since the DC bias of the AC signal is zero, the negative voltage itself can damage the single chip. Therefore, the hysteresis comparator circuit 20 is added to output a binary 1 for signals greater than zero and a binary 0 for signals less than zero.

[0079] Peak detection circuit 21 captures the extreme values ​​of the voltage signal at its input. A positive peak detector captures the most positive point in the input signal. For conventional AC signals, the amplitude after attenuation or gain processing also varies with the scale. Therefore, collecting the amplitude alone allows for faster determination of the signal's accuracy.

[0080] On the basis of the above embodiment, the testing device further includes a display unit; the display unit is connected to the controller 1 to obtain and display the performance test results. Figure 7 This is a structural diagram of a display device provided in an embodiment of the present application. Figure 8 This is a structural diagram of another display device provided in an embodiment of the present application, such as Figure 7 and Figure 8 As shown, the display device includes a thin film transistor (TFT) display screen interface circuit 22 and a light emitting diode display circuit 23, which are used to display the performance test results sent by the controller 1 for easy viewing by management personnel.

[0081] In addition, the test device provided in the embodiment of the present application also includes a human-computer interaction circuit, so that the management personnel can input control instructions to the test device through the human-computer interaction circuit and control the working status of the test device. Figure 9 This is a structural diagram of a key circuit provided in an embodiment of the present application, such as Figure 9 As shown, by using the key circuit 24 as a human-computer interaction circuit and the key circuit 24 as the input part of the entire device, the device can start automatic testing by simply pressing it, thereby eliminating the risk of the tester contacting the device under test.

[0082] In addition, the present application also provides a test system, including the test device described above. The test device includes: a controller and a differential signal conversion circuit; wherein the differential signal conversion circuit has a power supply circuit with an adjustable output voltage; the controller is used to obtain test task information, and determine the target communication protocol and the target communication protocol's required voltage according to the test task information and the identity information of the device under test, thereby controlling the output of the power supply circuit according to the required voltage; the controller is connected to the differential signal conversion circuit to send a test instruction to the differential signal conversion circuit, and obtain the performance detection data of the device under test sent by the differential signal conversion circuit, so as to determine the performance of the device under test according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information; the differential signal conversion circuit converts the test instruction into a differential test instruction to differentially communicate with the device under test. It can be seen that in the technical solution provided by the present application, the controller determines the target communication protocol to be used through the test task information and the identity information of the device under test, and controls the output of the power supply unit of the differential signal conversion circuit according to the required voltage of the target communication protocol to ensure normal communication, so that the controller can communicate with different types of devices under test, expanding the application range of the test device. At the same time, differential signals are used to communicate with the device under test, further improving the reliability of data transmission. Compared with the existing technology, the technical solution provided by this application allows the controller to use different communication protocols to communicate with different types of devices under test. There is no need to replace the test device during the test process, which can effectively reduce testing costs and improve testing efficiency.

[0083] The above is a detailed introduction to a test device and a test system provided by the present application. The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part description. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of this application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

[0084] It should also be noted that, in this specification, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.

Claims

1. A testing device, characterized in that: include: A controller (1) and a differential signal conversion circuit (2); wherein the differential signal conversion circuit (2) has a power supply circuit with an adjustable output voltage; The controller (1) is used to obtain test task information, and determine a target communication protocol and a required voltage of the target communication protocol according to the test task information and identity information of the device to be tested, thereby controlling the output of the power supply circuit according to the required voltage; The controller (1) is connected to the differential signal conversion circuit (2) to send a test instruction to the differential signal conversion circuit (2), and obtain the performance detection data of the device under test sent by the differential signal conversion circuit (2), so as to determine the performance of the device under test according to the performance detection data; wherein the test instruction is an instruction generated according to the target communication protocol and the test task information; The differential signal conversion circuit (2) converts the test instruction into a differential test instruction to differentially communicate with the device to be tested.

2. The testing device according to claim 1, characterized in that The differential signal conversion circuit (2) comprises a dual-power bus transceiver (3), a differential drive circuit (4) and a differential receiving circuit (5); The dual power bus transceiver (3) is connected to the controller (1) to obtain the test instruction and perform level conversion on the test instruction according to the required voltage; The input end of the differential driving circuit (4) is connected to the dual power bus transceiver (3) to obtain the test instruction after level conversion and generate a differential test signal according to the test instruction; The output end of the differential driving circuit (4) is connected to the device under test to send the differential test signal to the device under test; The input end of the differential receiving circuit (5) is connected to the device under test to obtain differential performance detection data sent by the device under test, and convert the differential performance detection data into single-ended performance detection data; The output end of the differential receiving circuit (5) is connected to the controller (1) to send the single-ended performance detection data to the controller (1).

3. The testing device according to claim 1, wherein: Also included is a controllable DC signal generating circuit (6); The input end of the controllable DC signal generating circuit (6) is connected to the controller (1) to obtain the test instruction and generate a DC test signal according to the test instruction; The output end of the controllable DC signal generating circuit (6) is connected to the device under test to send the DC test signal to the device under test.

4. The testing device according to claim 3, characterized in that The controllable DC signal generating circuit (6) comprises: a reference voltage circuit (7), a digital-to-analog conversion circuit (8) and a voltage follower circuit (9); The reference voltage circuit (7) is connected to the digital-to-analog conversion circuit (8) to supply power to the digital-to-analog conversion circuit (8); The input end of the digital-to-analog conversion circuit (8) is connected to the controller (1) to obtain the test instruction; The output end of the digital-to-analog conversion circuit (8) is connected to the input end of the voltage follower circuit (9), and the output end of the voltage follower circuit (9) is connected to the device to be tested.

5. The testing device according to claim 1, wherein: Also includes a power supply control circuit (10); The power supply control circuit (10) includes a current detection circuit (11) and a power switch circuit (12); The current detection circuit (11) is connected to both the device under test and the controller (1) to obtain the operating current of the device under test and send the operating current to the controller (1); The first end of the power switch circuit (12) is connected to the power supply, the second end of the power switch circuit (12) is connected to the device under test, and the control end of the power switch circuit (12) is connected to the controller (1) so as to shut down upon receiving a shutdown signal sent by the controller (1); The shutdown signal is a signal generated by the controller (1) when it detects that the operating current is greater than a current threshold.

6. The testing device according to claim 5, characterized in that: The power switch circuit (12) includes a relay (13), a relay control circuit (15) and a switch circuit (14); The current detection circuit (11) includes a differential operation circuit and a voltage follower circuit; The first end of the normally open contact of the relay (13) is connected to the input end of the differential operation circuit, the second end of the normally open contact of the relay (13) is connected to the device under test to obtain the working current, and the coil of the relay (13) is connected to the relay control circuit (15); A first end of the switch circuit (14) is connected to an input end of the relay control circuit (15), a second end of the switch circuit (14) is grounded, and a control end of the switch circuit (14) is connected to the controller (1); The output end of the differential operation circuit is connected to the input end of the voltage follower circuit, and the output end of the voltage follower circuit is connected to the controller (1).

7. The testing device according to claim 1, characterized in that Also included is a DC signal processing circuit (16); The DC signal processing circuit (16) includes a resistance attenuation circuit (17) and an adder circuit (18); The input end of the resistance attenuation circuit (17) is connected to the device under test, and the output end of the resistance attenuation circuit (17) is connected to the non-inverting input end of the adder circuit (18); The inverting input terminal of the adder circuit (18) is grounded, and the output terminal of the adder circuit (18) is connected to the controller (1).

8. The testing device according to claim 7, characterized in that: Also includes: AC signal processing circuit (19); The AC signal processing circuit (19) includes: a hysteresis comparator circuit (20) and a peak detection circuit (21); The input end of the hysteresis comparator circuit (20) is connected to the device to be tested, and the output end of the hysteresis comparator circuit (20) is connected to the controller (1) to obtain AC signal frequency information; The input end of the peak detection circuit (21) is connected to the device to be tested, and the output end of the peak detection circuit (21) is connected to the controller (1) to obtain AC signal amplitude information.

9. The testing device according to claim 1, characterized in that: Also included is a display unit; The display unit is connected to the controller (1) to obtain and display performance test results.

10. A testing system, characterized in that: A test device comprising any one of claims 1 to 9.

Images