A method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurements

Abstract

The present invention discloses an electric field calculation method for an atomic gas chamber based on Rydberg atom electric field measurement in the field of atomic measurement devices, comprising the following steps: S1: Construct a model of an electric field loading device, and calculate the electric field strength E between the electrode plates through the electric field calculation formula E = U / d in a uniform electric field; S2: Calculate the polarization charge density P of the glass atomic gas chamber under the action of the electric field; S3: Calculate the polarization charge Q2 in the glass material; S4: Combine steps S2 and S3 to calculate the electric field strength E0 generated by the polarization charge Q2 of the glass material; S5: Subtract the electric field strength E0 generated by the polarization charge Q2 of the glass material from the electric field strength E between the electrode plates to obtain the precise electric field strength E1 inside the glass atomic gas chamber. The beneficial effect of the present invention is that by calculating the electric field strength between the electrode plates and the electric field strength generated by the polarization charge in the atomic gas chamber material, and subtracting the two, the precise electric field strength inside the atomic gas chamber can be obtained.

Description

Technical Field

[0001] The invention relates to the technical field of quantum measurement devices, and in particular to a method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement. Background Art

[0002] Electric field measurement based on Rydberg atoms is currently a hot research direction. Power grid companies have begun to conduct in-depth research and are working to apply this high-precision measurement method to electric field measurements in traditional power systems as soon as possible.

[0003] Current measurements are mainly based on a solution that uses a combination of electrode plates and glass atomic gas chambers. The electrode plates are used to introduce voltage, and the glass atomic gas chamber is used to hold atoms for electric field measurement. The glass atomic gas chamber filled with gas atoms is placed between the electrode plates loaded with voltage. The dual-use laser irradiation and voltage work together to achieve voltage measurement by observing the spectrum.

[0004] With the gradual development of Rydberg electric field measurement technology, its high accuracy, high measurement sensitivity and wide measurement range have opened up new ideas for the future development of new power systems. Therefore, in order to apply Rydberg atomic electric field measurement to new power systems, practical engineering application problems must be considered, and using measurement data to invert the electric field is one of the difficulties.

[0005] At present, various electric field measurement methods based on Rydberg atoms use different electric field loading methods and electric field measurement devices. The electric field measurement approximately assumes that the electric field at the center of the glass cesium bubble between the electrode plates is the loaded electric field, and ignores the influence of the glass atom gas chamber on the electric field. The simple E=U / d is used to calculate the electric field strength, which is greatly different from the actual electric field value.

[0006] To this end, we propose a method for calculating the electric field inside an atomic gas chamber based on the electric field measurement of Rydberg atoms. Summary of the invention

[0007] In view of the above-mentioned deficiencies in the prior art, the present invention provides a method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement.

[0008] In order to achieve the above-mentioned object of the invention, the technical solution adopted by the present invention is:

[0009] A method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement comprises the following steps:

[0010] S1: construct an electric field loading model, which includes two spaced electrode plates and a glass atomic gas chamber placed between the two electrode plates. The electric field strength E between the electrode plates is calculated by the electric field calculation formula in a uniform electric field: E=U / d, where U is the potential difference between the two electrode plates and d is the electric displacement distance between the two electrode plates.

[0011] S2: Calculate the polarization charge density P of the glass atomic gas cell under the action of the electric field;

[0012] S3: Calculate the polarization charge Q2 in the glass material of the glass atom gas cell in step S2;

[0013] S4: combining steps S2 and S3 to calculate the electric field strength E0 generated by the polarization charge Q2 of the glass material of the glass atom gas cell;

[0014] S5: Subtract the electric field strength E between the electrode plates from the electric field strength E0 generated by the polarization charge Q2 of the glass material to obtain the precise electric field strength E1 in the glass atomic gas chamber.

[0015] Since the relative dielectric constant of glass is greater than 1, polarization will occur inside the glass material placed in the electric field, and the polarized charges will be redistributed in the medium to form an electric field in the opposite direction of the external electric field, thereby weakening the external electric field value. The electric field strength E0 generated by the polarized charges in the glass material is calculated by this method, and then the electric field strength E0 generated by the polarized charges in the glass material is subtracted from the electric field strength E between the electrode plates to obtain the precise electric field strength inside the glass atomic gas chamber. Based on the Rydberg electric field measurement process, the atomic gas chamber can be designed not only as glass material, but also as other transparent materials. The electric field strength inside the atomic gas chamber can be accurately calculated by the formula derived in this method through the relative dielectric constant of the material and the designed atomic gas chamber thickness. This method solves the problem of the influence of the atomic gas chamber material on the electric field, and proposes a general calculation method that can accurately calculate the electric field value inside the atomic gas chamber when the atomic gas chamber material and size are changed, thereby improving the measurement accuracy.

[0016] Further defined, the calculation method of the polarization charge density P in step S2 is: P = ε r ε0E;

[0017] Among them, ε r is the relative dielectric constant of the glass material, and ε0 is the capacitance in a vacuum.

[0018] It is further defined that the calculation formula of the glass polarization charge Q2 in step S3 is: Q2 = P*2πrht;

[0019] The glass atom gas cell is cylindrical, wherein r is the radius of the glass atom gas cell, h is the height of the glass atom gas cell, and t is the wall thickness of the glass atom gas cell.

[0020] It is further defined that the surface of the glass atomic gas cell is a closed curved surface. The electric field strength E0 generated by the polarization charge of the glass material is calculated using Gauss's theorem. The model of Gauss's theorem is:

[0021]

[0022] Where s is the area of ​​the selected closed surface, Q1 is the free charge in the glass material;

[0023] Combine step S2 and step S3 to calculate the electric field strength E0:

[0024]

[0025] It is further defined that the calculation method of the accurate electric field strength E1 in step S5 is:

[0026]

[0027] The beneficial effect of the present invention is that the electric field strength inside the atomic gas chamber can be accurately obtained by calculating the electric field strength between the electrode plates and the electric field strength generated by the polarized charges in the atomic gas chamber material and subtracting the two. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the electric field loading model of the present invention;

[0029] Figure 2 It is the electric field distribution diagram at the center plane position of the plate;

[0030] Figure 3 Schematic diagram of the electric field relationship between the atomic gas chamber and the electrode plate.

[0031] The symbols of the components are as follows:

[0032] Electrode plate 1, atomic gas chamber 2. DETAILED DESCRIPTION

[0033] The specific implementation modes of the present invention are described below so that those skilled in the art can understand the present invention. However, it should be clear that the present invention is not limited to the scope of the specific implementation modes. For those of ordinary skill in the art, as long as various changes are within the spirit and scope of the present invention as defined and determined by the attached claims, these changes are obvious, and all inventions and creations utilizing the concept of the present invention are protected.

[0034] Example:

[0035] like Figure 1-Figure 3 As shown, a method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement includes the following steps:

[0036] S1: construct an electric field loading model, which includes two spaced electrode plates 1 and a glass atomic gas chamber 2 placed between the two electrode plates 1, and calculate the electric field strength E between the electrode plates 1 by using the electric field calculation formula in a uniform electric field: E=U / d;

[0037] S2: Calculate the polarization charge density P of the glass atom gas cell 2 under the action of the electric field, P = ε r ε0E;

[0038] S3: Calculate the polarization charge Q2 in the glass material of the glass atom gas cell 2 in step S2, Q2 = P*2πrht;

[0039] S4: The surface of the glass atomic gas chamber 2 is a closed curved surface. The electric field intensity E0 generated by the polarization charge Q2 of the glass material is calculated using Gauss's theorem. The model of Gauss's theorem is:

[0040]

[0041] Combine step S2 and step S3 to calculate the electric field strength E0:

[0042]

[0043] S5: Subtract the electric field strength E between the electrode plates from the electric field strength E0 generated by the polarization charge Q2 of the glass material to obtain the precise electric field strength E1 in the glass atom gas chamber 2.

[0044] Among them, U is the potential difference between the two electrode plates 1, d is the electric displacement distance between the two electrode plates 1; ε r is the relative dielectric constant of the glass material, ε0 is the capacitance in a vacuum; the glass atom gas cell is cylindrical, wherein r is the radius of the glass atom gas cell 2, h is the height of the glass atom gas cell 2, and t is the wall thickness of the glass atom gas cell 2; s is the area of ​​the selected closed surface, and Q1 is the free charge in the glass material.

[0045] Since the relative dielectric constant of glass is greater than 1, polarization will occur inside the glass material placed in the electric field, and the polarized charges will be redistributed in the medium to form an electric field in the opposite direction of the external electric field, thereby weakening the external electric field value. The electric field strength E0 generated by the polarized charges in the glass material is calculated by this method, and then the electric field strength E0 generated by the polarized charges in the glass material is subtracted from the electric field strength E between the electrode plates 1 to obtain the precise electric field strength inside the glass atomic gas chamber 2. Based on the Rydberg electric field measurement process, the atomic gas chamber can be designed not only as a glass material, but also as other transparent materials. The formula derived in this method can be used to accurately calculate the electric field strength inside the atomic gas chamber through the relative dielectric constant of the material and the designed atomic gas chamber thickness. The method solves the problem of the influence of the atomic gas chamber material on the electric field, and proposes a general calculation method that can accurately calculate the electric field value inside the atomic gas chamber when the atomic gas chamber material and size are changed, thereby improving the measurement accuracy.

Claims

1. A method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement, characterized in that: The steps include: S1: constructing an electric field loading model, the electric field loading model comprising two spaced electrode plates (1) and a glass atomic gas chamber (2) disposed between the two electrode plates (1), and calculating the electric field intensity E between the electrode plates (1) by using an electric field calculation formula in a uniform electric field: E=U / d, where U is the potential difference between the two electrode plates (1), and d is the electric displacement distance between the two electrode plates (1); S2: Calculate the polarization charge density P of the glass atom gas cell (2) under the action of the electric field; S3: Calculate the polarization charge Q2 in the glass material of the glass atom gas cell (2) in step S2; S4: Calculate the electric field strength E0 generated by the polarized charge Q2 by combining steps S2 and S3; S5: Subtract the electric field strength E between the electrode plates (1) from the electric field strength E0 generated by the polarization charge Q2 of the glass material to obtain the precise electric field strength E1 in the glass atom gas chamber (2).

2. The method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement according to claim 1, characterized in that: The calculation method of the polarization charge density P in step S2 is: P = ε r ε0E; where ε r is the relative dielectric constant of the glass material, and ε0 is the capacitance in a vacuum.

3. The method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement according to claim 2, characterized in that: The calculation formula of the glass polarization charge Q2 in step S3 is: Q2 = P*2πrht; The glass atom gas chamber (2) is cylindrical, wherein r is the radius of the glass atom gas chamber (2), h is the height of the glass atom gas chamber (2), and t is the wall thickness of the glass atom gas chamber (2).

4. The method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement according to claim 3, characterized in that: The surface of the glass atom gas chamber (2) is a closed curved surface. The electric field intensity E0 generated by the polarization charge of the glass material is calculated using Gauss's theorem. The model of Gauss's theorem is: Where s is the area of ​​the selected closed surface, Q1 is the free charge in the glass material; Combine step S2 and step S3 to calculate the electric field strength E0:

5. The method for calculating the electric field in an atomic gas chamber based on Rydberg atomic electric field measurement according to claim 4, characterized in that: The calculation method of the accurate electric field strength E1 in step S5 is:

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