Processing method and device of flicker pulse, digital device and storage medium

Abstract

The application discloses a scintillation pulse processing method and device, a digital device and a storage medium. The processing method comprises the following steps: acquiring a function model corresponding to a scintillation pulse, wherein the function model is used to represent a pulse waveform of the scintillation pulse; presetting a plurality of threshold values, and performing multi-threshold sampling on the scintillation pulse based on the threshold values to obtain sampling data; determining a corresponding relationship table between pulse energy related to the threshold values and threshold duration; determining whether the scintillation pulse is a stacked pulse based on the sampling data and the corresponding relationship table; if yes, determining a pulse waveform of a component pulse constituting the scintillation pulse based on the sampling data and the function model. The application determines energy information of the scintillation pulse based on a simple calculation process through less sampling data, simplifies the calculation process, and completes the processing of the scintillation pulse under the condition of less calculation resources.

Description

Technical Field

[0001] This application relates to the field of data processing, and in particular to a method, apparatus, digitizing device, and storage medium for processing flicker pulses. Background Technology

[0002] In high-energy particle / ray detection, photon-counting CT detectors directly convert detected high-energy particles / rays, such as X-rays, into electrical signals. By calculating the energy of each X-ray photon, the count of photons with different energies can be obtained.

[0003] The higher the X-ray energy, the larger the pulse amplitude. The lower the X-ray energy, the smaller the pulse amplitude. Photon-counting CT detectors count photons not by directly acquiring the X-ray energy, but by acquiring the number of photons in each energy range. The energy range count can be obtained by first testing the relationship between pulse amplitude and pulse energy using a high-speed oscilloscope. A comparison threshold is set for the pulse amplitude T corresponding to the energy value E; pulses exceeding this threshold are considered to have energy greater than E, and pulses below this threshold are considered to have energy less than E.

[0004] In photon counting CT, the pulse peak values ​​T0, T1, T2, and T3 corresponding to four energies—25 keV, 50 keV, 75 keV, and 100 keV—are typically calculated first. The number of photons between T0 and T1, T1 and T2, T2 and T3, and those above T3 are then counted. This segmented energy photon counting is then achieved.

[0005] In existing technologies, a method can be used to count photons in segments by using a finite number of preset thresholds, but it cannot obtain the accurate energy of each photon, thus failing to achieve true photon counting. Furthermore, if the peak value of a pulse is at the critical point of the threshold, misjudgment of the photon energy segment may occur.

[0006] Furthermore, the photon counting CT detector detects a photon count of 10^9 cps / mm². Adjacent photon output pulses are highly likely to stack, resulting in a pileup phenomenon. One approach to address the pileup problem is to discard both photons involved in the pileup without attempting to distinguish and recover the two pulses. This is because after a pileup occurs, the pulses of the two photons merge into one, resulting in a larger energy pulse than usual, which can be discarded without participating in the counting. However, this approach clearly leads to inaccuracies in the counting of photons with different energies. Summary of the Invention

[0007] The technical problem to be solved by the embodiments of this application is how to accurately calculate the pulse energy generated by a single photon.

[0008] To address the aforementioned problems, this application discloses a method, apparatus, digitization device, and storage medium for processing flicker pulses.

[0009] According to a first aspect of this application, a method for processing flicker pulses is provided. The method includes: obtaining a function model corresponding to the flicker pulse, the function model being used to characterize the pulse waveform of the flicker pulse; presetting multiple thresholds, and performing multi-threshold sampling on the flicker pulse based on the thresholds to obtain sampled data; determining a correspondence table between pulse energy and threshold duration related to the thresholds; determining whether the flicker pulse is a stacked pulse based on the sampled data and the correspondence table; if so, determining the pulse waveform of a target pulse constituting the flicker pulse based on the sampled data and the function model.

[0010] According to some embodiments of this application, determining the correspondence table includes: acquiring multiple known pulses with known pulse energy; the known pulses are non-stacked pulses; performing multi-threshold sampling on the known pulses based on the threshold to determine a first time and a second time when the known pulses cross the threshold; determining the threshold duration based on the first time and the second time; and determining the correspondence table based on the multiple pulse energies and the multiple threshold durations.

[0011] According to some embodiments of this application, the correspondence table reflects the correspondence between the number of thresholds crossed by the known pulse, the pulse energy of the known pulse, and the first average threshold duration; the first average threshold duration includes the average value of the threshold durations corresponding to each threshold.

[0012] According to some embodiments of this application, the correspondence table reflects the correspondence between the threshold duration of the lowest threshold crossed by the known pulse and the pulse energy of the known pulse.

[0013] According to some embodiments of this application, the correspondence table reflects the correspondence between the threshold duration of the highest threshold crossed by the known pulse and the pulse energy of the known pulse.

[0014] According to some embodiments of this application, the correspondence table reflects the correspondence between the pulse energy of the known pulse and the second average threshold duration; the second average threshold duration includes the average value of the threshold durations corresponding to a preset number of thresholds crossed by the known pulse.

[0015] According to some embodiments of this application, determining whether the flashing pulse is a stacked pulse based on the sampled data and the correspondence table includes: determining a comparison threshold duration based on the sampled data; determining whether the ratio between the comparison threshold duration and the threshold duration in the correspondence table is less than a preset ratio based on the comparison threshold duration and the correspondence table; and determining that the flashing pulse is a stacked pulse if the ratio is greater than the preset ratio.

[0016] According to some embodiments of this application, the sampling data includes multiple first threshold-time pairs when the rising edge of the flashing pulse crosses multiple thresholds, and multiple second threshold-time pairs when the falling edge of the flashing pulse crosses multiple thresholds; the flashing pulse is composed of two target pulses stacked together; the step of determining the pulse waveform of the target pulse constituting the flashing pulse based on the sampling data and the function model includes: performing a fitting operation based on multiple first threshold-time pairs to determine a first expression of the function model to characterize the pulse waveform of the first target pulse; and performing a fitting operation based on multiple second threshold-time pairs to determine a second expression of the function model to characterize the pulse waveform of the second target pulse.

[0017] According to some embodiments of this application, the processing method further includes: integrating the first curve corresponding to the first expression to determine the first component energy value of the first target pulse; and integrating the second curve corresponding to the second expression to determine the second component energy value of the second target pulse.

[0018] According to some embodiments of this application, the processing method further includes: specifying the first component energy value and the second component energy value to participate in pulse counting and energy spectrum plotting.

[0019] According to a second aspect of this application, a processing apparatus for flicker pulses is provided. The processing apparatus includes: an acquisition module configured to acquire a function model corresponding to the flicker pulse, the function model being used to characterize the pulse waveform of the flicker pulse; a sampling module configured to preset multiple thresholds and perform multi-threshold sampling on the flicker pulse based on the thresholds to acquire sampling data; a determination module configured to determine a correspondence table between pulse energy and threshold duration related to the thresholds; a judgment module configured to determine whether the flicker pulse is a stacked pulse based on the sampling data and the correspondence table; and a calculation module configured to, when the flicker pulse is a stacked pulse, determine the pulse waveform of a target pulse constituting the flicker pulse based on the sampling data and the function model.

[0020] According to some embodiments of this application, in order to determine the correspondence table, the determining module is configured to: acquire multiple known pulses with known pulse energy; the known pulses are non-stacked pulses; perform multi-threshold sampling on the known pulses based on the threshold to determine a first time and a second time when the known pulses cross the threshold; determine the threshold duration based on the first time and the second time; and determine the correspondence table based on the multiple pulse energies and the multiple threshold durations.

[0021] According to some embodiments of this application, the correspondence table reflects the correspondence between the number of thresholds crossed by the known pulse, the pulse energy of the known pulse, and the first average threshold duration; the first average threshold duration includes the average value of the threshold durations corresponding to each threshold.

[0022] According to some embodiments of this application, the correspondence table reflects the correspondence between the threshold duration of the lowest threshold crossed by the known pulse and the pulse energy of the known pulse.

[0023] According to some embodiments of this application, the correspondence table reflects the correspondence between the threshold duration of the highest threshold crossed by the known pulse and the pulse energy of the known pulse.

[0024] According to some embodiments of this application, the correspondence table reflects the correspondence between the pulse energy of the known pulse and the second average threshold duration; the second average threshold duration includes the average value of the threshold durations corresponding to a preset number of thresholds crossed by the known pulse.

[0025] According to some embodiments of this application, in order to determine whether the flashing pulse is a stacked pulse based on the sampled data and the correspondence table, the determination module is configured to: determine a comparison threshold duration based on the sampled data; determine whether the ratio between the comparison threshold duration and the threshold duration in the correspondence table is less than a preset ratio based on the comparison threshold duration and the correspondence table; if the ratio is greater than the preset ratio, determine that the flashing pulse is a stacked pulse.

[0026] According to some embodiments of this application, the sampling data includes multiple first threshold-time pairs when the rising edge of the flashing pulse crosses multiple thresholds, and multiple second threshold-time pairs when the falling edge of the flashing pulse crosses multiple thresholds; the flashing pulse is composed of two target pulses stacked together; in order to determine the pulse waveform of the target pulse constituting the flashing pulse based on the sampling data and the function model, the calculation module is configured to: perform a fitting operation based on multiple first threshold-time pairs to determine a first expression of the function model to characterize the pulse waveform of the first target pulse; and perform a fitting operation based on multiple second threshold-time pairs to determine a second expression of the function model to characterize the pulse waveform of the second target pulse.

[0027] According to some embodiments of this application, the calculation module is further configured to: integrate the first curve corresponding to the first expression to determine the first component energy value of the first target pulse; and integrate the second curve corresponding to the second expression to determine the second component energy value of the second target pulse.

[0028] According to some embodiments of this application, the calculation module is further configured to: use the first component energy value and the second component energy value to participate in pulse counting and energy spectrum plotting.

[0029] According to a third aspect of this application, a processing apparatus is provided. The processing apparatus includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the processing method described above.

[0030] According to a fourth aspect of this application, a computer-readable storage medium is provided. The storage medium stores a computer program that, when executed by a processor, implements the steps of the processing method described above.

[0031] The processing method disclosed in this application can restore stacked pulses and perform accurate energy calculation and pulse counting on the restored pulses, avoiding the occurrence of partial pulse miscounting due to pulse stacking. Attached Figure Description

[0032] This application will be further described by way of exemplary embodiments, which will be described in detail with reference to the accompanying drawings. These embodiments are not limiting; in these embodiments, the same reference numerals denote the same structures, wherein:

[0033] Figure 1 This is an exemplary flowchart of a method for processing flashing pulses according to some embodiments of this application;

[0034] Figure 2This is an exemplary schematic diagram illustrating the relationship between a flashing pulse and a threshold according to some embodiments of this application;

[0035] Figure 3 This is an exemplary schematic diagram of the target triangle shown according to some embodiments of this application;

[0036] Figure 4 This is an exemplary block diagram of a data processing system for processing flicker pulses according to some embodiments of this application;

[0037] Figure 5 This is an exemplary functional block diagram of a data processing system for processing flicker pulses, according to some embodiments of this application. Detailed Implementation

[0038] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0039] It should be noted that when a component is said to be "fixed to" another component, it can be directly fixed to the other component or there may be an intervening component. When a component is said to be "connected to" another component, it can be directly connected to the other component or there may be an intervening component. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The terms “and / or” or “and / or” as used herein include any and all combinations of one or more of the associated listed items.

[0041] The following description, with reference to the accompanying drawings, illustrates some preferred embodiments of the present application. It should be noted that the following description is for illustrative purposes only and is not intended to limit the scope of protection of this application.

[0042] Figure 1This is an exemplary flowchart of a flicker pulse processing method according to some embodiments of this application. In some embodiments, the flicker pulse processing method 100 can be executed by a data processing system 300. For example, the processing method 100 can be stored in a storage device (such as the built-in storage unit of the data processing system 300 or an external storage device) in the form of a program or instructions, which, when executed, can implement the processing method 100. Figure 1 As shown, the processing method 100 may include the following operations.

[0043] Step 110: Obtain the function model corresponding to the flashing pulse.

[0044] In some embodiments, the scintillation pulses can be acquired by a radiation detection device, such as a semiconductor detector, including a PN junction semiconductor detector, a lithium-drift semiconductor detector, a high-purity germanium semiconductor detector, a germanium-lithium semiconductor detector, a silicon-lithium semiconductor detector, a silicon microstrip semiconductor detector, a metal surface barrier semiconductor detector, etc. The semiconductor detector can directly convert detected high-energy particles (e.g., X-ray photons) into electrical signals, which are then output as scintillation pulses through electronic devices connected to the semiconductor detector.

[0045] It is known that the pulse waveform of any flicker pulse can be characterized by its shape. (Reference) Figure 2 , Figure 2 This is an exemplary schematic diagram of the pulse waveform of a flashing pulse according to some embodiments of this application. Figure 2 As shown, the flicker pulse waveform has a very narrow pulse width, including a rapidly rising edge and a rapidly falling edge. Simultaneously, the rise and fall times are extremely short. The flicker pulse waveform can be described by a mathematical function model, such as a double exponential function model, a Gaussian function model, or a Landau function model. Figure 2 The flicker pulse shown can be represented using a Gaussian function model:

[0046] (1)

[0047] In some embodiments, the function model can be determined based on prior information. For example, a large number of high-energy particles / rays generated by a radiation source can be collected using a digital oscilloscope to obtain a function model that corresponds to the pulse waveform of the test pulse. Alternatively, the pulse waveform of the scintillation pulse can be directly determined by collecting information from the scintillation pulse using a digital oscilloscope, and the pulse waveform of the scintillation pulse can be compared with a certain type of function model. If it matches, it can be used as the function model.

[0048] Step 120: Preset multiple thresholds, and perform multi-threshold sampling on the flashing pulse based on the thresholds to obtain sampling data.

[0049] In some embodiments, the plurality of thresholds can be used to compare with the amplitude of the flicker pulse to determine the time point at which the flicker pulse crosses the threshold. These time points and the corresponding thresholds form a threshold-time pair that constitutes the sampled data. Based on the form of the flicker pulse (electrical pulse), the threshold can be a voltage threshold or a current threshold. The intervals between the preset plurality of thresholds can also be equal or unequal. For example, the plurality of thresholds can form an arithmetic or geometric sequence, or the value of the threshold in the next term can be the sum of the values ​​of the two preceding terms. This application does not impose specific limitations.

[0050] See Figure 3 , Figure 3 This is a schematic diagram illustrating an exemplary relationship between a flashing pulse and a threshold, according to some embodiments of this application. Figure 3 It has been assumed that the scintillation pulses overlap, forming a stacked pulse (the scintillation pulse is formed by the superposition of the two pulses shown by the dashed line). Figure 3 As shown, the four voltage thresholds set include , , as well as ( During the rising phase, the rising edge of the scintillation pulse first crosses the voltage threshold from bottom to top. The corresponding jump time at this time is Subsequently, the rising edge of the scintillation pulse crosses the voltage threshold from bottom to top. The corresponding jump time is Similarly, the rising edge of the flash pulse occurs during the transition time. Crossing the voltage threshold from bottom to top During the jump time Crossing the voltage threshold from bottom to top During the falling phase, the falling edge of the scintillation pulse first crosses the voltage threshold from top to bottom. The corresponding jump time at this time is Subsequently, the falling edge of the scintillation pulse crosses the voltage threshold from top to bottom. The corresponding jump time at this time is Similarly, the falling edge of the flash pulse occurs during the transition time. Crossing the voltage threshold from top to bottom During the jump time Crossing the voltage threshold from top to bottom One voltage threshold can correspond to two transition times, forming two threshold-time pairs. All eight threshold-time pairs corresponding to the four thresholds can constitute the sampled data, represented as:

[0051] .

[0052] It should be noted that a flicker pulse may not be able to cross all thresholds. If the flicker pulse only crosses one threshold (i.e., the voltage threshold),... Then the sampled data can be If the flickering pulse crosses two thresholds (i.e., voltage thresholds) and Then the sampled data can be If the flickering pulse exceeds three thresholds (i.e., voltage thresholds)... , and Then the sampled data can be .

[0053] Step 130: Determine the correspondence table between the pulse energy and the threshold duration related to the threshold.

[0054] In some embodiments, to determine the correspondence table, multiple known pulses with known pulse energy (these known pulses are non-stacked pulses) can be obtained. Then, based on the threshold, these known pulses are subjected to multi-threshold sampling to determine the two time points at which the known pulses cross the threshold. The time interval between these two time points can be the duration of the threshold. The correspondence table can reflect the mapping relationship between the pulse energy of the pulse signal and the threshold duration under different thresholds.

[0055] In some embodiments, the multi-threshold sampling can be illustrated as in step 120 above, taking the example of a known pulse crossing a threshold. Assume the known pulse has crossed the threshold. Then its rising edge crosses The transition time can be called the first time, and its falling edge crosses... The transition time can be referred to as the second time. The time difference between the second time and the first time can be corresponding to a threshold. The threshold duration. The threshold durations for other thresholds are similar.

[0056] In some embodiments, the correspondence table can reflect the correspondence between the number of thresholds crossed by the known pulse, the pulse energy of the known pulse, and the first average threshold duration. For example, the first average threshold duration can be the average of the threshold durations corresponding to all thresholds crossed by the known pulse. If the known pulse crosses only one threshold, the threshold duration corresponding to that threshold can be recorded. If the known pulse crosses multiple thresholds, the average of the threshold durations corresponding to each threshold can be recorded. Assume four thresholds are preset. , , as well as If the energy of a certain pulse is The known pulse only crossed There is only one threshold duration. Then, the corresponding relationship table can record: the number of times the threshold is crossed is 1. Pulse energy If the energy of a certain pulse is The known pulse crossed and The threshold durations corresponding to the two thresholds are respectively: and Then, the corresponding table can record that the number of times the threshold is crossed is 2. Pulse energy If the energy of a certain pulse is The known pulse crossed , and The threshold durations corresponding to the three thresholds are respectively: , and Then, the corresponding table can record that the number of times the threshold is crossed is 3. Pulse energy And so on, when the energy of a certain pulse is... The known pulse crossed , , as well as The threshold durations corresponding to the four thresholds are: , , and Then, the corresponding table can record that the number of times the threshold is crossed is 4. Pulse energy .

[0057] In some embodiments, the correspondence table can reflect the correspondence between the threshold duration of the lowest threshold crossed by the known pulse and the pulse energy of the known pulse. Similarly, for example, assume four preset thresholds. , , as well as If the energy of a certain pulse is The known pulse only crossed There is only one threshold duration. Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed and The threshold durations corresponding to the two thresholds are respectively: and Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed , and The threshold durations corresponding to the three thresholds are respectively: , and Then the corresponding relationship table can record: Pulse energy And so on, when the energy of a certain pulse is... The known pulse crossed , , as well as The threshold durations corresponding to the four thresholds are: , , and Then the corresponding relationship table can record: Pulse energy .

[0058] In some embodiments, the correspondence table can reflect the correspondence between the threshold duration of the highest threshold crossed by the known pulse and the pulse energy of the known pulse. Continuing the example above, assume that four thresholds are preset. , , as well as If the energy of a certain pulse is The known pulse only crossed There is only one threshold duration. Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed and The threshold durations corresponding to the two thresholds are respectively: and Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed , and The threshold durations corresponding to the three thresholds are respectively: , and Then the corresponding relationship table can record: Pulse energy And so on, when the energy of a certain pulse is... The known pulse crossed , , as well as The threshold durations corresponding to the four thresholds are: , , and Then the corresponding relationship table can record: Pulse energy .

[0059] In some embodiments, the correspondence table can reflect the correspondence between the pulse energy of the known pulse and the second average threshold duration. The second average threshold duration can be the average of the threshold durations corresponding to a preset number of thresholds crossed by the known pulse. For example, the thresholds can be odd-numbered thresholds, even-numbered thresholds, or intermediate values, etc. This application does not impose specific limitations. As an example, assume four preset thresholds. , , as well as The preset threshold is an odd-numbered sequence threshold. Then, if the energy of a certain pulse is... The known pulse only crossed There is only one threshold duration. Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed and The threshold durations corresponding to the two thresholds are respectively: and Then the corresponding relationship table can record: Pulse energy If the energy of a certain pulse is The known pulse crossed , and The threshold durations corresponding to the three thresholds are respectively: , and Then the corresponding relationship table can record: Pulse energy When the energy of a certain pulse is The known pulse crossed , , as well as The threshold durations corresponding to the four thresholds are: , , and Then the corresponding relationship table can record: Pulse energy .

[0060] Step 140: Determine whether the flashing pulse is a stacked pulse based on the sampled data and the corresponding relationship table.

[0061] It is known that the energy of photons captured by a radiation detection device is within a certain range, and the corresponding threshold duration exceeding a certain threshold is also within a range. Stacking can occur when a new photon enters before the radiation detection device has captured a photon that has not yet disappeared. The pulses generated by the two photons will then overlap, delaying the pulse end time. This is characterized by a larger pulse width, meaning a longer threshold duration than the normal threshold duration. Therefore, by comparing the threshold duration associated with the scintillation pulse with the threshold duration recorded in the corresponding table, it can be determined whether the scintillation pulse has experienced stacking, indicating a stacked pulse.

[0062] In some embodiments, the sampling data can be used to determine the duration of a comparison threshold. The duration of the comparison threshold can be determined based on the contents of the comparison table. For example, assuming the table reflects the correspondence between the number of thresholds crossed, pulse energy, and the duration of a first average threshold, the duration of the comparison threshold needs to be determined based on the number of thresholds crossed by the flicker pulse and their respective durations. For example, if the flicker pulse only crossed one threshold (i.e., the voltage threshold)... Then the sampled data is The comparison threshold duration is... If the flickering pulse crosses two thresholds (i.e., voltage thresholds) and Then the sampled data is The comparison threshold duration is... If the flickering pulse exceeds three thresholds (i.e., voltage thresholds)... , and ), then the sampled data is The comparison threshold duration is... If the flickering pulse exceeds four thresholds (i.e., voltage thresholds) , , and Then the sampled data is The comparison threshold duration is then:

[0063] .

[0064] When the correspondence table reflects the correspondence between the threshold duration of the lowest threshold crossed by the known pulse and the pulse energy of the known pulse, then the comparison threshold duration can be... (The flash pulse crosses a threshold), or (The flicker pulse crosses two thresholds), or (Flicker pulses exceeding 3 thresholds), or .

[0065] When the correspondence table reflects the correspondence between the threshold duration of the highest threshold crossed by the known pulse and the pulse energy of the known pulse, then the comparison threshold duration can be... (The flash pulse crosses a threshold), or (The flicker pulse crosses two thresholds), or (Flicker pulses exceeding 3 thresholds), or .

[0066] When the correspondence table reflects the relationship between a preset number of thresholds, pulse energy, and the duration of the second average threshold in the number of thresholds crossed, for example, if the preset number of thresholds is an odd-numbered threshold in the order of the thresholds crossed by the flash pulse, then the comparison threshold duration can be... (The flash pulse crosses a threshold), or (The flicker pulse crosses two thresholds), or (Flicker pulses exceeding 3 thresholds), or .

[0067] In some embodiments, based on the comparison threshold duration and the correspondence table, it can be determined whether the flicker pulse is a stacked pulse by whether a first ratio between the comparison threshold duration and the threshold duration in the correspondence table is less than a preset ratio. For example, the first ratio between the comparison threshold duration and each related threshold duration in the correspondence table can be determined iteratively. If the first ratio is large, that is, the comparison threshold duration of the flicker pulse is significantly correlated with the threshold duration determined by non-stacked pulses in the correspondence table, and the error exceeds the range of the threshold duration of normal pulses, then the flicker pulse can be identified as a stacked pulse. In some embodiments, the preset ratio used to define the "error range" can be 1.05, 1.1, 1.15, 1.2, 1.25, 1.3, etc. In some embodiments, the preset ratio can be 1.2. When it is determined that the flicker pulse is a stacked pulse, the processing method 100 can proceed to step 150.

[0068] Step 150: Determine the pulse waveform of the target pulse constituting the flashing pulse based on the sampled data and the function model.

[0069] It is known that a stacked pulse is typically formed by stacking two pulses. It is generally believed that the rising edge of a stacked pulse mainly originates from the preceding pulse, and the falling edge mainly originates from the following pulse. Therefore, based on the sampled data, functions can be fitted to the rising and falling edges of the flashing pulse to determine their respective mathematical expressions to characterize their pulse waveforms.

[0070] Assuming the flicker pulse crosses all four preset thresholds, the sampled data obtained from multi-threshold sampling is: The threshold-time pair generated when the rising edge of the flash pulse crosses the threshold (which can also be called the first threshold-time pair in this application, i.e.) This can be used to perform a fitting operation to determine a first expression of the function model, used to characterize the pulse waveform of the first target pulse stacked to form a flashing pulse. The threshold-time pair generated when the falling edge of the flashing pulse crosses a threshold (also referred to in this application as a second threshold-time pair, i.e.) This can be used to perform a fitting operation to determine a second expression of the function model, characterizing the pulse waveform of the second target pulse that forms a flashing pulse. The fitting operation can be implemented based on least squares, interpolation, or polishing. For example, existing computational algorithms / software can be invoked to perform curve fitting based on multiple data pairs. Multiple data points are input into the computational algorithm / software to directly obtain the function expression of the threshold correction function model. For example, determining... middle , and The value of is used to determine the first expression and the second expression. The first curve corresponding to the first expression can be used to characterize the pulse waveform of the first target pulse, while the second curve corresponding to the second expression can be used to characterize the pulse waveform of the second target pulse.

[0071] It is understandable that restoring the stacked pulses is for more accurate photon counting, which requires determining the energy values ​​of the two target pulses. For example, the first curve can be integrated to determine the first energy value of the first target pulse, and the second curve can be integrated to determine the second energy value of the second target pulse. Integration can be performed using methods such as Newton's integration, Riemann integration, or numerical integration. After determining the energy values, the energy range of the first and second energy values ​​can be determined (e.g., the pulse energy range corresponding to a certain energy address). At this point, the number of pulses corresponding to that energy address of the target pulse can be incremented by one to complete the pulse counting.

[0072] In some embodiments, when the flicker pulses are determined to be non-stacked pulses, a fitting operation can be performed based on the sampled data to determine the target expression of the function model. Similarly, it can be determined based on the least squares method, interpolation method, or polishing method. middle , and The value of is determined. Once determined, the target expression can be obtained. The target curve corresponding to the target expression can be used to characterize the pulse waveform of the scintillation pulse. Integrating the target curve determines the target energy value of the scintillation pulse.

[0073] In some embodiments, the sampled data can be used to determine a target threshold duration for the flicker pulse. The target threshold duration can be the same as or similar to the comparison threshold duration, and can be determined based on the contents of the comparison table. The target threshold duration can be the same as the comparison threshold duration, distinguishing between stacked and non-stacked flicker pulses. In some embodiments, the target threshold duration can be compared with each related threshold duration in the correspondence table to determine a second ratio. When the second ratio is less than a preset ratio, the target threshold duration is considered to be close to the threshold duration associated with the second ratio, within the error range of that threshold duration. That is, the flicker pulse is similar to the known pulse corresponding to that threshold duration, for example, in terms of pulse waveform, energy, etc. In this case, the pulse energy value corresponding to that threshold duration in the comparison table can be used as the target energy value of the flicker pulse. In some embodiments, the preset ratio can be 1.05, 1.1, 1.15, 1.2, 1.25, 1.3, etc. In some embodiments, the preset ratio can be 1.2.

[0074] Those skilled in the art will understand that, within a finite range, the pulse energy and threshold duration have a linear relationship. Therefore, the pulse energy and threshold duration in the correspondence table can be used to determine a relationship function. For example, the relationship function can be determined as follows: The pulse energy in the corresponding table can be used as... The threshold duration can be used as The expression for the relationship function is determined by substituting the values ​​into the equation. The target threshold duration can be substituted into the expression for the relationship function to determine the target energy value of the flash pulse.

[0075] In some embodiments, after determining the target energy value of the scintillation pulse, the energy range in which the target energy value lies can be determined (e.g., the pulse energy range corresponding to a certain energy address). The number of pulses corresponding to that energy address can then be incremented by one. After performing stacking determination, pulse restoration (if stacked pulses), and energy determination on a large number of scintillation pulses, energy spectrum plotting can be performed.

[0076] It should be noted that the above-mentioned Figure 1 The descriptions of the various steps in this specification are for illustrative purposes only and do not limit the scope of this specification. Those skilled in the art can, under the guidance of this specification, [perform certain tasks / activities]. Figure 1 Various modifications and changes have been made to the steps described herein. However, these modifications and changes remain within the scope of this specification.

[0077] The processing method disclosed in this application can restore stacked pulses and perform accurate energy calculation and pulse counting on the restored pulses, avoiding the occurrence of partial pulse miscounting due to pulse stacking.

[0078] Figure 4 This is an exemplary block diagram of a data processing system according to some embodiments of this specification. This data processing system can distinguish pulse signals. For example... Figure 4 As shown, the data processing system 400 may include an acquisition module 410, a sampling module 420, a determination module 430, a judgment module 440, and a calculation module 450.

[0079] The acquisition module 410 can be used to acquire the function model corresponding to the scintillation pulse as shown in step 110 above. The acquisition module 410 can determine the function model based on prior information. For example, by using a digital oscilloscope to collect data on a large number of high-energy particles / rays generated by a radiation source, the function model conforming to the pulse waveform of the corresponding test pulse can be obtained. Alternatively, by using a digital oscilloscope to collect information on the scintillation pulse, the pulse waveform of the scintillation pulse can be directly determined, and by comparing whether the pulse waveform of the scintillation pulse conforms to a certain type of function model, if it does, it can be used as the function model.

[0080] The sampling module 420 can be used to preset multiple thresholds as shown in step 120 above, and perform multi-threshold sampling on the flicker pulse based on the thresholds to obtain sampling data. The multiple thresholds can be used to compare with the amplitude of the flicker pulse to determine the time point when the flicker pulse crosses the threshold. These time points and the corresponding thresholds together form the threshold-time pairs, which constitute the sampling data. Based on the manifestation form of the flicker pulse (electrical pulse), the threshold can be a voltage threshold or a current threshold. The intervals between the preset multiple thresholds can also be equal or unequal.

[0081] The determining module 430 can be used to determine a correspondence table between pulse energy and threshold duration related to the threshold, as shown in step 130 above. To determine the correspondence table, the determining module 430 can acquire multiple known pulses with known pulse energy (these known pulses are non-stacked pulses), and then perform multi-threshold sampling on these known pulses based on the threshold to determine two time points when the known pulse crosses the threshold. The time interval between these two time points can be the threshold duration. The correspondence table determined by the determining module 430 can reflect the correspondence between the number of thresholds crossed by the known pulses, the pulse energy of the known pulses, and the first average threshold duration. The correspondence table determined by the determining module 430 can reflect the correspondence between the threshold duration of the lowest threshold crossed by the known pulses and the pulse energy of the known pulses. The correspondence table determined by the determining module 430 can reflect the correspondence between the threshold duration of the highest threshold crossed by the known pulses and the pulse energy of the known pulses. The correspondence table determined by the determining module 430 can reflect the correspondence between the pulse energy of the known pulses and the second average threshold duration. The second average threshold duration can be the average of the threshold durations corresponding to a preset number of thresholds that a known pulse has crossed.

[0082] The determination module 440 can be used to determine whether the flashing pulse is a stacked pulse based on the sampled data and the correspondence table as shown in step 140 above. The determination module 440 can use the sampled data to determine a comparison threshold duration. The comparison threshold duration can be determined based on the contents included in the comparison table. The determination module 440 can determine whether the flashing pulse is a stacked pulse by determining whether a first ratio between the comparison threshold duration and the threshold duration in the correspondence table is less than a preset ratio. If the first ratio is large, greater than the preset ratio, the determination module 440 can determine that the flashing pulse is a stacked pulse.

[0083] The calculation module 450 can be used to determine the pulse waveform of the target pulse constituting the flashing pulse based on the sampled data and the function model as shown in step 150 above. The calculation module 450 can perform a fitting operation based on a first threshold-time pair generated when the rising edge of the flashing pulse crosses a threshold to determine a first expression of the function model, used to characterize the pulse waveform of the first target pulse stacked to form the flashing pulse. The calculation module 450 can perform a fitting operation based on a second threshold-time pair generated when the falling edge of the flashing pulse crosses a threshold to determine a second expression of the function model, used to characterize the pulse waveform of the second target pulse stacked to form the flashing pulse. The first curve corresponding to the first expression can be used to characterize the pulse waveform of the first target pulse, and the second curve corresponding to the second expression can be used to characterize the pulse waveform of the second target pulse. The calculation module 450 can also integrate the first curve to determine a first component energy value of the first target pulse, and integrate the second curve to determine a second component energy value of the second target pulse.

[0084] For further descriptions of the above modules, please refer to the flowchart section of this application, for example, Figure 1 .

[0085] It should be understood that Figure 4 The systems and modules shown can be implemented in various ways. For example, in some embodiments, the systems and modules can be implemented in hardware, software, or a combination of both. The hardware portion can be implemented using dedicated logic; the software portion can be stored in memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated hardware. Those skilled in the art will understand that the methods and systems described above can be implemented using computer-executable instructions and / or included in processor control code, for example, on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The systems and modules of this specification can be implemented not only with hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, or programmable hardware devices such as field-programmable gate arrays, programmable logic devices, etc., but also with software, for example, executed by various types of processors, or with a combination of the aforementioned hardware circuits and software (e.g., firmware).

[0086] It should be noted that the above description of the modules is for convenience only and should not be construed as limiting this specification to the embodiments described. It is understood that those skilled in the art, after understanding the principles of the system, may arbitrarily combine the modules or construct subsystems connected to other modules without departing from these principles. For example, modules may share a single storage module, or each module may have its own separate storage module. Such modifications are all within the scope of this specification.

[0087] Figure 5 This is an exemplary block diagram of a processing device according to some embodiments of this application. The processing device 500 may include any components used to implement the system described in the embodiments of this application. For example, the processing device 500 may be implemented using hardware, software programs, firmware, or a combination thereof. For example, the processing device 500 may implement a data processing system 400. For convenience, only one processing device is shown in the figure; however, the computing functions described in the embodiments of this application can be implemented in a distributed manner by a set of similar platforms to distribute the system's processing load.

[0088] In some embodiments, the processing device 500 may include a processor 510, a memory 520, an input / output component 530, and a communication port 540. In some embodiments, the processor (e.g., CPU) 510 may execute program instructions as one or more processors. In some embodiments, the memory 520 includes different forms of program memory and data memory, such as a hard disk, read-only memory (ROM), random access memory (RAM), etc., for storing a wide variety of data files processed and / or transmitted by a computer. In some embodiments, the input / output component 530 may be used to support input / output between the processing device 500 and other components. In some embodiments, the communication port 540 may be connected to a network for data communication. Exemplary processing devices may include program instructions executed by the processor 510 stored in read-only memory (ROM), random access memory (RAM), and / or other types of non-transitory storage media. The methods and / or processes of the embodiments of this specification may be implemented as program instructions. The processing device 500 may also receive programs and data disclosed in this application via network communication.

[0089] For ease of understanding, only one processor is illustrated in Figure 6. However, it should be noted that the processing device 500 in the embodiments of this specification may include multiple processors. Therefore, the operations and / or methods described in the embodiments of this specification, implemented by one processor, may also be implemented jointly or independently by multiple processors. For example, if, in this specification, the processor of the processing device 500 executes steps A and B, it should be understood that steps A and B may also be executed jointly or independently by two different processors of the processing device 500 (e.g., the first processor executes step A, the second processor executes step B, or the first and second processors jointly execute steps A and B).

[0090] The scintillation pulse processing method provided in this application can be specifically used in photon detection and is applicable to various fields, such as medical imaging technology, high-energy physics, lidar, autonomous driving, precision analysis, and optical communication. In a specific example, the scintillation pulse processing method, apparatus, device, and storage medium provided in this application can be applied to photon counting CT. In a photon counting CT system, photon data can be acquired using the scheme described in the embodiments of this application, and then image reconstruction can be performed.

[0091] The basic concepts have been described herein. It is obvious that the detailed disclosure above is merely illustrative and does not constitute a limitation of this specification. Although not explicitly stated herein, various modifications, improvements, and corrections may be made to this specification by those skilled in the art. Such modifications, improvements, and corrections are suggested in this specification and therefore remain within the spirit and scope of the exemplary embodiments described herein.

[0092] Furthermore, this specification uses specific terms to describe embodiments thereof. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of this specification. Therefore, it should be emphasized and noted that references to "an embodiment," "one embodiment," or "an alternative embodiment" in different locations throughout this specification do not necessarily refer to the same embodiment. Moreover, certain features, structures, or characteristics in one or more embodiments of this specification can be appropriately combined.

[0093] Furthermore, those skilled in the art will understand that various aspects of this specification can be described and illustrated in several patentable ways or situations, including any new and useful combination of processes, machines, products, or substances, or any new and useful improvements thereof. Accordingly, various aspects of this specification can be implemented entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. All of the above hardware or software may be referred to as a “data block,” “module,” “engine,” “unit,” “component,” or “system.” Furthermore, various aspects of this specification may be represented as a computer product located on one or more computer-readable media, including computer-readable program code.

[0094] Computer storage media may contain a propagated data signal containing computer program code, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, and suitable combinations thereof. Computer storage media can be any computer-readable medium other than a computer-readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program code located on the computer storage medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, RF, or similar media, or any combination of the above media.

[0095] The computer program code required for the operation of each part of this manual can be written in any one or more programming languages, including object-oriented programming languages ​​such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB.NET, Python, etc.; conventional procedural programming languages ​​such as C, Visual Basic, Fortran 3003, Perl, COBOL 3002, PHP, ABAP; dynamic programming languages ​​such as Python, Ruby, and Groovy; or other programming languages. This program code can run entirely on the user's computer, or as a standalone software package on the user's computer, or partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the latter case, the remote computer can be connected to the user's computer through any network, such as a local area network (LAN) or wide area network (WAN), or connected to an external computer (e.g., via the Internet), or in a cloud computing environment, or used as a service such as Software as a Service (SaaS).

[0096] Furthermore, unless expressly stated in the claims, the order of processing elements and sequences, the use of numbers and letters, or other names described in this specification are not intended to limit the order of the processes and methods described herein. Although various examples have been discussed in the foregoing disclosure of some embodiments of the invention that are currently considered useful, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments; rather, the claims are intended to cover all modifications and equivalent combinations that conform to the spirit and scope of the embodiments described herein. For example, while the system components described above can be implemented using hardware devices, they can also be implemented solely using software solutions, such as installing the described system on existing servers or mobile devices.

[0097] Similarly, it should be noted that, in order to simplify the description disclosed herein and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of embodiments in this specification may sometimes combine multiple features into a single embodiment, drawing, or description thereof. However, this method of disclosure does not imply that the subject matter of this specification requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of a single embodiment disclosed above.

[0098] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of range in some embodiments of this specification are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

[0099] For each patent, patent application, patent application publication, and other material such as articles, books, specifications, publications, and documents referenced in this specification, the entire contents of which are incorporated herein by reference. This excludes historical application documents that are inconsistent with or conflict with the content of this specification, as well as documents that limit the broadest scope of the claims in this specification (currently or subsequently appended to this specification). It should be noted that in the event of any inconsistency or conflict between the descriptions, definitions, and / or terminology used in the supplementary materials to this specification and the content of this specification, the descriptions, definitions, and / or terminology used in this specification shall prevail.

[0100] Finally, it should be understood that the embodiments described in this specification are merely illustrative of the principles of the embodiments described herein. Other variations may also fall within the scope of this specification. Therefore, alternative configurations of the embodiments described herein are intended to be illustrative rather than limiting, and should be considered consistent with the teachings of this specification. Accordingly, the embodiments described herein are not limited to those explicitly introduced and described herein.

Claims

1. A method of processing a flicker pulse, characterized by, The processing method comprises: acquiring a function model corresponding to the scintillation pulse, the function model being used to represent a pulse waveform of the scintillation pulse; presetting a plurality of threshold values, and performing multi-threshold sampling on the scintillation pulse based on the threshold values to acquire sampling data; determining a corresponding relationship table between pulse energy and threshold duration related to the threshold values; based on the sampling data, determining a contrast threshold duration; and determining whether a ratio between the contrast threshold duration and a threshold duration in the corresponding relationship table is greater than a preset ratio; if the ratio is greater than the preset ratio, determining that the scintillation pulse is a stacked pulse, and determining a pulse waveform of a target pulse constituting the scintillation pulse based on the sampling data and the function model.

2. The treatment method according to claim 1, characterized in that, The determination of the corresponding relationship table comprises: acquiring a plurality of known pulses with known pulse energies; the known pulses are non-stacked pulses; performing multi-threshold sampling on the known pulses based on the threshold values to determine first time and second time when the known pulses cross the threshold values; determining the threshold duration based on the first time and the second time; determining the corresponding relationship table based on a plurality of pulse energies and a plurality of threshold durations.

3. The treatment method according to claim 2, characterized in that, The corresponding relationship table reflects a corresponding relationship among a number of threshold values crossed by the known pulses, the pulse energy of the known pulses, and a first average threshold duration; the first average threshold duration comprises an average value of the threshold durations corresponding to each threshold value.

4. The treatment method of claim 2, wherein The corresponding relationship table reflects a corresponding relationship between the threshold duration of the lowest threshold value crossed by the known pulses and the pulse energy of the known pulses.

5. The treatment method of claim 2, wherein The corresponding relationship table reflects a corresponding relationship between the threshold duration of the highest threshold value crossed by the known pulses and the pulse energy of the known pulses.

6. The treatment method of claim 2, wherein The corresponding relationship table reflects a corresponding relationship between the pulse energy of the known pulses and a second average threshold duration; the second average threshold duration comprises an average value of the threshold durations corresponding to a preset number of threshold values crossed by the known pulses.

7. The treatment method of claim 1, wherein The sampling data comprises a plurality of first threshold-time pairs when rising edges of the scintillation pulse cross a plurality of threshold values, and a plurality of second threshold-time pairs when falling edges of the scintillation pulse cross a plurality of threshold values; The scintillation pulse is stacked by two target pulses; The determination of the pulse waveform of the target pulse constituting the scintillation pulse based on the sampling data and the function model comprises: performing a fitting operation based on the plurality of first threshold-time pairs to determine a first expression of the function model to represent a pulse waveform of a first target pulse; performing a fitting operation based on the plurality of second threshold-time pairs to determine a second expression of the function model to represent a pulse waveform of a second target pulse.

8. The treatment method according to claim 7, characterized in that, The processing method further comprises: integrating a first curve corresponding to the first expression to determine a first constituent energy value of the first target pulse; integrating a second curve corresponding to the second expression to determine a second constituent energy value of the second target pulse.

9. The treatment method according to claim 8, characterized in that, The processing method further comprises: The first and second constituent energy values are designated to participate in pulse counting and energy spectrum plotting.

10. A device for processing a flicker pulse, characterized by The processing device comprises: an acquisition module configured to acquire a function model corresponding to the scintillation pulse, the function model being used to represent a pulse waveform of the scintillation pulse; a sampling module configured to preset a plurality of thresholds and perform multi-threshold sampling on the scintillation pulse based on the thresholds to acquire sampling data; a determination module configured to determine a correspondence table between pulse energy and threshold duration related to the thresholds; a judgment module configured to determine a comparison threshold duration based on the sampling data, and determine whether a ratio between the comparison threshold duration and a threshold duration in the correspondence table is greater than a preset ratio; a calculation module configured to, if the ratio is greater than the preset ratio, determine that the scintillation pulse is a stacked pulse, and determine a pulse waveform of a target pulse constituting the scintillation pulse based on the sampling data and the function model.

11. The processing device of claim 10, wherein, To determine the correspondence table, the determination module is configured to: acquire a plurality of known pulses with known pulse energies; the known pulses are non-stacked pulses; perform multi-threshold sampling on the known pulses based on the thresholds, and determine a first time and a second time at which the known pulses cross the thresholds; determine the threshold duration based on the first time and the second time; determine the correspondence table based on a plurality of pulse energies and a plurality of threshold durations.

12. The processing device of claim 11, wherein, The correspondence table reflects a correspondence between a number of thresholds crossed by the known pulses, the pulse energy of the known pulses, and a first average threshold duration; the first average threshold duration includes an average value of the threshold durations corresponding to each threshold.

13. The processing device of claim 11, wherein, The correspondence table reflects a correspondence between the threshold duration of the lowest threshold crossed by the known pulses and the pulse energy of the known pulses.

14. The processing device of claim 11, wherein, The correspondence table reflects a correspondence between the threshold duration of the highest threshold crossed by the known pulses and the pulse energy of the known pulses.

15. The processing device of claim 11, wherein, The correspondence table reflects a correspondence between the pulse energy of the known pulses and a second average threshold duration; the second average threshold duration includes an average value of the threshold durations corresponding to a preset number of thresholds crossed by the known pulses.

16. The processing device of claim 10, wherein, The sampling data includes a plurality of first threshold-time pairs when rising edges of the scintillation pulse cross a plurality of thresholds, and a plurality of second threshold-time pairs when falling edges of the scintillation pulse cross a plurality of thresholds; The scintillation pulse is stacked by two target pulses; to determine the pulse waveform of the target pulse constituting the scintillation pulse based on the sampling data and the function model, the calculation module is configured to: perform a fitting operation based on the plurality of first threshold-time pairs to determine a first expression of the function model to represent a pulse waveform of a first target pulse; perform a fitting operation based on the plurality of second threshold-time pairs to determine a second expression of the function model to represent a pulse waveform of a second target pulse.

17. The processing device of claim 16, wherein, The calculation module is further configured to: integrate the first curve corresponding to the first expression to determine a first constituent energy value of the first target pulse; integrate the second curve corresponding to the second expression to determine a second constituent energy value of the second target pulse.

18. The processing device of claim 17, wherein, The computing module is further configured to: participate in pulse counting and energy spectrum drawing by using the first constituent energy value and the second constituent energy value.

19. A processing device, comprising: comprise: a memory, a processor, and a computer program stored in the memory and executable on the processor, and the computer program, when executed by the processor, implements the steps of the processing method according to any one of claims 1-9.

20. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, and the computer program, when executed by a processor, implements the steps of the processing method according to any one of claims 1-9.

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