A test fixture and its test pin assembly

Abstract

A test fixture and its test pin assembly, which are related to the terminal field and the semiconductor field. The test assembly of this solution includes a test board, a test bracket, and a test pin assembly. The test board and the test bracket are arranged opposite to each other in the first direction. The test bracket has a test position for installing the main board; the test pin assembly is detachably installed on the test board; the test pin assembly can be in contact connection with the component under test on the main board. During the test process of this test fixture, the main board is placed at the test position, and the entire test board moves in the direction close to the main board until the test pin assembly on the test board contacts the corresponding component under test to perform corresponding tests. Since the test pin assembly in the embodiment of the present application is detachably connected to the test board, if the test pin assembly is damaged, it can be replaced with a new test pin assembly, thereby reducing the maintenance cost of the entire test fixture.

Description

Technical Field

[0001] The present application relates to the field of semiconductor technology, and in particular to a test fixture and a test needle assembly thereof. Background Art

[0002] In order to ensure the performance of mobile phones, the existing technology uses a test fixture to test the motherboard of the mobile phone. The motherboard test includes the test point test and the board-to-board connector test. In the existing test fixture, the test pin and the test board are connected by a transition fit or interference fit. If the test pin is damaged, the entire test board needs to be replaced, which increases the maintenance cost. In addition, as the motherboard develops towards high-density miniaturization, and the test points and BTB connectors also develop towards miniaturization, the test fixture mold opening process requires a high degree of matching accuracy between the test pin and the test board, which increases the equipment cost accordingly.

[0003] Therefore, how to reduce the maintenance cost of the test fixture has become a technical problem that needs to be solved urgently by those skilled in the art. Summary of the invention

[0004] In order to solve the above problems, the present application provides a test fixture and a test needle assembly thereof to reduce the maintenance cost of the test fixture.

[0005] In the first aspect, the present application provides a test assembly, including a test board, a test bracket and a test pin assembly, wherein the test board and the test bracket are arranged relative to each other along a first direction, the test bracket has a test position for mounting a mainboard; the test pin assembly is detachably mounted on the test board; the test pin assembly can be in contact and connected with a component under test on the mainboard. During the test of the test fixture, the mainboard is placed in the test position, and the test board as a whole moves in a direction close to the mainboard until the test pin assembly on the test board contacts the corresponding component under test, so as to perform the corresponding test.

[0006] Since the test needle assembly in the embodiment of the present application is detachably connected to the test board, if the test needle assembly is damaged, it can be replaced with a new test needle assembly, thereby reducing the maintenance cost of the entire test fixture.

[0007] In some embodiments of the present application, the test pin assembly is directly or indirectly detachably connected to the test board. The direct detachable connection of the test pin assembly to the test board can simplify the installation structure; the indirect detachable connection of the test pin assembly to the test board can reduce the matching accuracy between the test pin assembly and the test board.

[0008] In some embodiments of the present application, the test board includes a mounting groove and a mounting base. The mounting base is disposed in the mounting groove and is detachably mounted on the test board through a first fastener. The test pin assembly is mounted in the sleeve hole of the mounting base. The test pin assembly is detachably mounted on the test board through the mounting base. During the processing, it is only necessary to ensure the fitting accuracy between the mounting base and the test pin assembly, which can reduce the processing accuracy of the test pin assembly. In addition, among the mounting base and the test pin assembly, the mounting base can be used as a non-wearable part compared with the test pin assembly, and its service life can be improved by adjusting its material.

[0009] In some embodiments of the present application, the mounting base includes a mounting block and a protective sleeve. Among them, the mounting block and the protective sleeve are arranged along a first direction, and a sleeve hole is formed in the middle of the two. By providing the protective sleeve, the test pin assembly can be protected to extend the service life of the test pin assembly.

[0010] In some embodiments of the present application, the test pin assembly is mounted in the sleeve hole and is mounted on the mounting block through a second fastener. Using the second fastener to mount the test pin assembly on the mounting block can fix the test pin assembly after it is installed in place, thereby reducing the difficulty of adjusting and installing the test pin assembly in place.

[0011] Second, embodiments of the present application also provide a test pin assembly, which can be applied to the test fixture in any of the above items; the test pin assembly includes a secondary outer sleeve, a support structure, a spring sheet micro-needle structure and a first elastic member. The secondary outer sleeve and the support structure can slide and cooperate along a first direction, and the support structure is exposed.

[0012] The spring sheet micro-needle structure is disposed inside the support structure and extends into the secondary outer sleeve to be in contact connection with the component to be measured.

[0013] The first elastic member is arranged in a compressed state between the support structure and the secondary outer sleeve to form a first floating structure.

[0014] In the test pin assembly of the embodiment of the present application, a first floating structure is formed between the secondary outer sleeve and the first elastic member. Therefore, during the test process of the test pin assembly, the secondary outer sleeve has a function of unilateral floating relative to the support structure, and the support structure has a function of unilateral floating relative to the fixed block. When the test pin assembly contacts the component to be measured, the contact posture between the spring sheet micro-needle structure and the component to be measured can be adjusted, thereby expanding the processing accuracy threshold of the test pin assembly on the premise of meeting the test requirements.

[0015] In some embodiments of the present application, the end face of the secondary outer sleeve exposing the support structure further includes a guiding portion to automatically adjust the contact posture between the secondary outer sleeve and the component to be measured. During the process of the secondary outer sleeve contacting the component to be measured, since the secondary outer sleeve is provided with a guiding portion, the contact posture between the secondary outer sleeve and the component to be measured can be adjusted, so that the secondary outer sleeve can be aligned with the component to be measured, thereby ensuring the reliability of the contact between the spring sheet micro-needle and the component to be measured.

[0016] In some embodiments of the present application, the guiding portion includes two first guiding portions which are arranged opposite to each other along the second direction, and the first guiding portion includes a first guiding surface. The two first guiding surfaces are arranged obliquely opposite to each other so as to have a tendency to guide towards the middle of the auxiliary outer sleeve. The second direction is perpendicular to the first direction. By providing the two first guiding portions, the contact posture of the auxiliary outer sleeve with the element to be measured in the third direction can be adjusted, thereby improving the reliability of the contact between the elastomeric micro-needle and the element to be measured in the third direction.

[0017] In some embodiments of the present application, the guiding portion includes two second guiding portions which are arranged opposite to each other along the third direction, and the second guiding portion includes a second guiding surface. The two second guiding surfaces are arranged obliquely opposite to each other so as to have a tendency to guide towards the middle of the auxiliary outer sleeve. Among them, the third direction, the second direction and the first direction are perpendicular to each other in pairs. Similarly, by providing the two second guiding portions, the reliability of the contact between the elastomeric micro-needle and the element to be measured in the second direction can be ensured.

[0018] In some embodiments of the present application, the auxiliary outer sleeve includes a first guiding hole extending along the first direction and a limiting sliding groove, and the first guiding hole is communicated with the limiting sliding groove; the first guiding hole is in sliding fit with the elastomeric micro-needle of the elastomeric micro-needle structure, and the limiting sliding groove is in sliding fit with the rubber core of the elastomeric micro-needle structure.

[0019] In some embodiments of the present application, the supporting structure includes a main outer sleeve, a fixing block and a limiting sleeve. Among them, the main outer sleeve and the limiting sleeve are butted to form an installation cavity, and all or part of the auxiliary outer sleeve, the first elastic member and the elastomeric micro-needle structure are installed in the installation cavity; the fixing block is arranged on the outer periphery of the main outer sleeve and the limiting sleeve, and the fixing block includes a first fastening hole for installing a second fastener.

[0020] In some embodiments of the present application, the fixing block is slidably sleeved on the outer periphery of the main outer sleeve and the limiting sleeve, and a second elastic member is arranged between the fixing block and the main outer sleeve, and the main outer sleeve and the second elastic member form a second floating structure. By providing the second floating structure, the machining accuracy threshold of the test needle assembly can be further improved. In addition, due to the existence of the second floating structure, the fixing block can be pressed down by a preset stroke so as to be compatible with the installation error of the entire test needle assembly. The preset stroke can be adaptively adjusted according to the material, size of the second elastic member and the installation requirements of the test fixture, and the present application will not describe it in detail.

[0021] In some embodiments of the present application, the fixing hole of the fixing block sleeved on the outer periphery of the main outer sleeve and the limiting sleeve can be self-locked on the outer periphery of the limiting sleeve. The fixing structure of the fixing block can be simplified through the self-locking design.

[0022] In some embodiments of the present application, along the direction away from the limiting sleeve, the cross section of the fixing hole gradually becomes smaller.

[0023] In some embodiments of the present application, the fixed block and the main outer sleeve are of an integral structure. The integral structure of the fixed block and the main outer sleeve can simplify the installation of the test probe assembly.

[0024] In some embodiments of the present application, the main outer sleeve and the limiting sleeve are connected by a locking member. The main outer sleeve is provided with a first through hole, and the limiting sleeve is provided with a second through hole. The locking member sequentially passes through the first through hole and the second through hole to realize the connection between the main outer sleeve and the limiting sleeve.

[0025] In some embodiments of the present application, the limiting sleeve is of an integral structure or a split structure. When the limiting sleeve is of an integral structure, the structure of the test probe assembly is simplified; when the limiting sleeve is of a split structure, the assembly difficulty of the test probe assembly can be reduced.

[0026] In some embodiments of the present application, the elastomeric microprobe structure includes elastomeric microprobes, a rubber core, and a printed circuit board. Among them, the elastomeric microprobes are installed in the rubber core, and one end of the elastomeric microprobes exposed from the rubber core extends into the secondary outer sleeve. The other end of the elastomeric microprobes exposed from the rubber core is electrically connected to the printed circuit board. The elastomeric microprobe structure can adjust the elastomeric microprobes, the rubber core, and the printed circuit board to be applicable to different types of components under test.

[0027] In some embodiments of the present application, the elastomeric microprobes and the rubber core are integrally injection-molded, and the integral injection molding can reduce the assembly difficulty.

[0028] In some embodiments of the present application, the number of elastomeric microprobes is multiple. The printed circuit board includes multiple conductive contacts and multiple conductive holes. Among them, the conductive contacts are electrically connected to the corresponding conductive holes through the printed circuit board; the elastomeric microprobes are in contact connection with the corresponding conductive contacts.

[0029] In some embodiments of the present application, the elastomeric microprobe includes an elastomeric microprobe body, a connection end, a plug-in end, and a clamping portion. Among them, the plug-in end is located at one end of the elastomeric microprobe body away from the printed circuit board; the connection end is located at one end of the elastomeric microprobe body close to the printed circuit board; the clamping portion is arranged close to the connection end. By arranging the clamping portion, the clamping point of the elastomeric microprobe can be moved towards the direction close to the printed circuit board, thereby increasing the elastic deformation ability of the elastomeric microprobe, and thus the accuracy threshold of the test probe assembly can be expanded. Description of the Drawings

[0030] Figure 1 A schematic structural diagram of a mobile phone provided by the prior art;

[0031] Figure 2 A schematic diagram of a main board provided by the prior art;

[0032] Figure 3 A perspective view of a BTB connector provided by the prior art;

[0033] Figure 4 For Figure 3The front view of the BTB connector shown in

[0034] Figure 5 is Figure 3 The top view of the BTB connector shown in

[0035] Figure 6 is Figure 3 The left view of the BTB connector shown in

[0036] Figure 7 is the perspective view of a test fixture provided by the prior art;

[0037] Figure 8 is Figure 7 The perspective view of the test fixture shown in after hiding the test board;

[0038] Figure 9 is Figure 7 The front view of the test fixture shown in

[0039] Figure 10 is Figure 9 The cross-sectional view of the A-A section in

[0040] Figure 11 is Figure 7 The schematic diagram of the test pins of the test fixture shown in in test cooperation with the BTB connector;

[0041] Figure 12 is the perspective view of a test fixture provided by an embodiment of the present application;

[0042] Figure 13 is Figure 12 The perspective view of the test fixture shown in after hiding the test board;

[0043] Figure 14 is Figure 12 The front view of the test fixture shown in

[0044] Figure 15 is Figure 13 The cross-sectional view of the B-B section in

[0045] Figure 16 is Figure 15 The enlarged schematic diagram of part C in

[0046] Figure 17 is Figure 12 The left perspective view of the mounting base of the test fixture shown in

[0047] Figure 18 is Figure 12 The right perspective view of the mounting base of the test fixture shown in

[0048] Figure 19Schematic diagram of a test pin assembly provided by an embodiment of the present application;

[0049] Figure 20 is Figure 19 Stereogram of the test pin assembly shown in [reference] during the process of testing a BTB connector;

[0050] Figure 21 is Figure 19 Cross-sectional view of the test pin assembly shown in [reference] during the process of testing a BTB connector;

[0051] Figure 22 is Figure 19 Stereogram of the secondary outer sleeve of the test pin assembly shown in [reference];

[0052] Figure 23 is Figure 22 Left view of the secondary outer sleeve shown in [reference];

[0053] Figure 24 is Figure 22 Front view of the secondary outer sleeve shown in [reference];

[0054] Figure 25 is Figure 22 Bottom view of the secondary outer sleeve shown in [reference];

[0055] Figure 26 is Figure 22 Top view of the secondary outer sleeve shown in [reference];

[0056] Figure 27 is Figure 19 Stereogram of the main outer sleeve of the test pin assembly shown in [reference];

[0057] Figure 28 is Figure 27 Left view of the main outer sleeve shown in [reference];

[0058] Figure 29 is Figure 27 Bottom view of the main outer sleeve shown in [reference];

[0059] Figure 30 is Figure 27 Top view of the main outer sleeve shown in [reference];

[0060] Figure 31 is Figure 19 Stereogram of the fixing block of the test pin assembly shown in [reference];

[0061] Figure 32 is Figure 19 Stereogram of the limit sleeve of the test pin assembly shown in [reference];

[0062] Figure 33 is Figure 32 Left view of the limit sleeve shown in [reference];

[0063] Figure 34 The bottom view of the main jacket shown in Figure 32 ;

[0064] Figure 35 The top view of the main jacket shown in Figure 32 ;

[0065] Figure 36 The front view of the main jacket shown in Figure 32 ;

[0066] Figure 37 The sectional view of the D-D section shown in Figure 36 ;

[0067] Figure 38 The left view of the shrapnel micro-needle structure of the test needle assembly shown in Figure 19 ;

[0068] Figure 39 The sectional view of the E-E section shown in Figure 38 ;

[0069] Figure 40 The left view of the rubber core and the limit sleeve assembled together shown in Figure 19 ;

[0070] Figure 41 The sectional view of the F-F section shown in Figure 40 ;

[0071] Figure 42 The perspective view of the rubber core of the test needle assembly shown in Figure 19 ;

[0072] Figure 43 The left view of the rubber core shown in Figure 42 ;

[0073] Figure 44 The sectional view of the G-G section shown in Figure 43 ;

[0074] Figure 45 The schematic diagram of the rubber core assembled with the shrapnel micro-needle shown in Figure 44 ;

[0075] Figure 46 The perspective view of the shrapnel micro-needle of the test needle assembly shown in Figure 19 ;

[0076] Figure 47 The schematic diagram of the process of assembling the shrapnel micro-needle of the test needle assembly with the printed circuit board shown in Figure 19 ;

[0077] Figure 48 The Figure 19Stereogram of the printed circuit board of the test probe assembly shown in the figure;

[0078] Figure 49 is Figure 48 Left view of the printed circuit board shown in the figure;

[0079] Figure 50 is Figure 48 Right view of the printed circuit board shown in the figure.

[0080] In the illustration, 100 - mobile phone, 110 - middle frame, 120 - main board, 130 - secondary board, 140 - connecting component, 150 - battery, 160 - display screen, 170 - rear cover;

[0081] 121 - BTB connector, 122 - test point, 1211 - socket, 1211a - first end face, 1211b - second end face, 1212 - slot, 1213 - terminal;

[0082] 200 - test fixture, 210 - test board, 220 - test bracket, 230 - test probe, 240 - test probe assembly;

[0083] 211 - installation groove, 212 - mounting base, 2121 - mounting block, 2122 - protective sleeve, 2121a - first fastener; 2121b - first positioning member; 212a - sleeve hole;

[0084] 221 - test position;

[0085] 2401 - secondary outer sleeve, 2402 - main outer sleeve, 2403 - fixing block, 2404 - limiting sleeve, 2405 - rubber core, 2406 - spring - loaded micro - needle, 2407 - printed circuit board, 2408 - first elastic member, 2409 - second elastic member, 2410 - locking member;

[0086] 240a - support structure, 240b - spring - loaded micro - needle structure;

[0087] 24011 - secondary outer sleeve body, 24012 - first limiting portion, 24013 - first guiding portion, 24014 - second guiding portion, 24015 - first transition portion, 2401a - first guiding hole, 2401b - limiting chute, 24013a - first guiding surface, 24014a - second guiding surface;

[0088] 24021 - main outer sleeve body, 24022 - second limiting portion, 24021a - first side surface, 24021b - second side surface, 2402a first through - hole, 2402b - second guiding hole, 2402c - first installation cavity;

[0089] 24031 - Fixed block body, 2403a - First fastening hole, 2403b - First positioning hole, 2403c - Fixing hole, 2403a1 - Second fastener, 2403b1 - Second positioning member;

[0090] 24041 - Limit sleeve body, 24042 - Third limiting part, 2404a - Second through hole, 2404b - First mounting hole, 2404c - Limit notch, 2404d - Second mounting hole;

[0091] 2405a - Limit hole, 2405b - Glue core body, 2405c - Fourth limiting part, 2405d - Fifth limiting part;

[0092] 2406a - Elastic micro - needle body, 2406b - Connection end, 2406c - Insertion end, 2406d - Clamping part;

[0093] 2407a - Third through hole, 2407b - Conductive contact, 2407b1 - First conductive contact, 2407b2 - Second conductive contact, 2407b3 - Third conductive contact, 2407b4 - Fourth conductive contact, 2407b5 - Fifth conductive contact, 2407b6 - Sixth conductive contact, 2407c - Conductive hole; 2407c1 - First conductive hole, 2407c2 - Second conductive hole, 2407c3 - Third conductive hole, 2407c4 - Fourth conductive hole, 2407c5 - Fifth conductive hole, 2407c6 - Sixth conductive hole. Detailed implementation mode

[0094] To enable those skilled in the art to understand the solution of this application more clearly, the application scenarios of the technical solution of this application will be described first below.

[0095] See Figure 1 , Figure 1 which shows a schematic diagram of a mobile phone.

[0096] The mobile phone 100 includes a middle frame 110, a main board 120, a secondary board 130, a connecting component 140, a battery 150, a display screen 160, and a rear cover 170. Among them, the main board 120, the secondary board 130, and the battery 150 are all arranged on the middle frame 110, and the connecting component 140 connects the main board 120 and the secondary board 130; the display screen 160, the middle frame 110, and the secondary board 130 are stacked and arranged along the thickness direction of the mobile phone 100. In addition to the above mobile phone 100, electronic devices such as tablet computers, desktop computers, laptops, notebook computers, ultra-mobile personal computers (UMPCs), handheld computers, netbooks, personal digital assistants (PDAs), wearable electronic devices, and smart watches are all provided with a main board 120. The embodiments of the present application are only exemplified by the mobile phone 100.

[0097] The secondary board 130 is used to integrate electronic components such as an antenna (such as a G antenna) radio frequency front end and a universal serial bus (USB) device. The secondary board 130 is connected to the main board 120 through the connecting component 140 to realize data and signal transmission between the secondary board 130 and the main board 120.

[0098] The connecting component 140 can be a flexible printed circuit (FPC), a wire, or an enameled wire.

[0099] The main board 120 can be integrated with a control chip, and the control chip includes but is not limited to an application processor (AP), a double data rate synchronous dynamic random access memory (DDR), and a universal flash storage (UFS), etc. It should be noted that both the main board 120 and the secondary board 130 can be rigid circuit boards, flexible circuit boards, or rigid-flex circuit boards. Both the main board 120 and the secondary board 130 include but are not limited to FR-4 dielectric boards, Rogers dielectric boards, or a hybrid dielectric board of FR-4 and Rogers. Among them, FR-4 is a code for a flame-retardant material grade, and the Rogers dielectric board is a high-frequency board.

[0100] See Figure 2, the main board 120 may be integrated with test points 122 and a Board to Board (BTB) connector 121. Among them, the test points 122 are used for testing the main board 120. During the testing process, the main board 120 is powered through the test points 122. It should be noted that the test points 122 can only be used for testing, have no effect on the actual use of the main board 120, and affect the layout area of the main board 120, and space needs to be reserved; the BTB connector 121 realizes the connection between electronic components (such as the battery 150, etc.) and / or the main board 120.

[0101] Please refer to Figures 3 to 6 , Figures 3 to 6 shows a schematic diagram of the BTB connector 121.

[0102] The illustrated BTB connector 121 includes a socket 1211, a slot 1212, and a plurality of terminals 1213. The socket 1211 includes a first end face 1211a and a second end face 1211b arranged oppositely. The first end face 1211a serves as the plugging end 2406c face to connect with other electronic components, and the second end face 1211b is pasted on the main board 120 to connect with the circuit of the main board 120; the slot 1212 is recessed inward from the first end face 1211a to be snap-connected with other electronic components; the plurality of terminals 1213 are arranged on the wall of the slot 1212.

[0103] To ensure the reliability of the performance of the main board 120, the main board 120 is usually tested using a test fixture 200 before assembly. Among them, the testing of the main board 120 usually includes the testing of the test points 122 and the testing of the BTB connector 121.

[0104] Refer to Figures 7 to 10 , Figures 7 to 10 shows a perspective view of a test fixture 200 testing the main board 120.

[0105] The test fixture 200 in the figure may include a test board 210, a test bracket 220, and test pins 230. Among them, the test board 210 and the test bracket 220 are arranged oppositely along the axial direction, and the test bracket 220 has a test position 221 for mounting the main board 120; the test pins 230 are fixed on the test board 210 along the first direction Z. During the test process of this test fixture 200, the main board 120 is placed at the test position 221, the entire test board 210 moves in the direction close to the main board 120, and the test pins 230 on the test board 210 contact the corresponding test points 122 and the BTB connector 121 to perform corresponding tests. Since the test pins 230 are connected to the test board 210 by transitional fit or interference fit, if the test pins 230 are damaged, the entire test board 210 needs to be replaced, increasing the maintenance cost; in addition, since the main board 120 is developing towards high density and miniaturization, and the test points 122 and the BTB connector 121 are also developing towards miniaturization, during the mold opening process of the test fixture 200, the matching accuracy requirements for the test pins 230 and the test board 210 are relatively high, correspondingly increasing the equipment cost. It should be noted that in the embodiments of the present application, the first direction Z corresponds to the thickness direction of the test board.

[0106] Specifically, during the test process of the test fixture 200 on the BTB connector 121, higher requirements are imposed on the test pins 230. Specifically, please refer to Figure 11 , during the test process of the BTB connector 121, multiple test pins 230 contact multiple terminals 1213 of the BTB connector 121 to test a certain terminal 1213. However, the number of terminals 1213 of the BTB connector 121 is relatively large, and the distance between adjacent terminals 1213 is relatively small, that is, the terminals 1213 of the BTB connector 121 are relatively concentrated. Therefore, in the case of testing the BTB connector 121, the test pins 230 corresponding to the test fixture 200 and the BTB connector 121 need to be arranged in a high density.

[0107] To solve the above problems, an embodiment of the present application discloses a test fixture 200, which may include a test board 210, a test bracket 220, and a test pin assembly 240. The test pin assembly 240 is detachably connected to the test board 210. If the test pin assembly 240 is damaged, only the test pin assembly 240 can be replaced, thereby reducing the maintenance cost. In addition, the test pin assembly 240 that can be detachably installed on the test board 210 has the function of single-sided floating. Therefore, when the test pin assembly 240 contacts the test point 122 or the BTB connector 121, the posture of contacting the test point 122 or the BTB connector 121 can be adjusted, thereby expanding the processing accuracy threshold of the test pin assembly 240 on the premise of meeting the test requirements.

[0108] To facilitate the reader's understanding of the test fixture 200 and the test pin assembly 240 in the embodiments of the present application, the following is an introduction with reference to the accompanying drawings:

[0109] Referring to Figures 12 to 15 , the test fixture 200 in some embodiments of the present application may include a test board 210, a test bracket 220, and a test pin assembly 240. Among them, the test board 210 and the test bracket 220 are arranged opposite to each other in the first direction Z. The test bracket 220 has a test position 221 for mounting the main board 120; the test pin assembly 240 is detachably mounted on the test board 210 along the axial direction. During the test process of this test fixture 200, the main board 120 is placed at the test position 221, and the entire test board 210 moves in the direction close to the main board 120 until the test pin assembly 240 on the test board 210 contacts the corresponding test point 122 and / or the BTB connector 121 to perform corresponding tests.

[0110] Since the test pin assembly 240 in the embodiments of the present application is detachably connected to the test board 210, if the test pin assembly 240 is damaged, it can be replaced with a new test pin assembly 240, thereby reducing the maintenance cost of the entire test fixture 200. It should be noted that in the embodiments of the present application, the first direction Z corresponds to the thickness direction of the test board.

[0111] The above-mentioned test pin assembly 240 can be detachably mounted on the test board 210 by means of threaded connection. Specifically, an external thread is provided on the outer periphery of the test pin assembly 240, and an internal thread matching the above external thread is provided on the test board 210. The test pin assembly 240 is detachably connected to the test board 210 through the cooperation of the external thread and the internal thread.

[0112] The test pin assembly 240 can also be slidably mounted on the test board 210 and positioned by a fastener. Specifically, as Figures 16 to 18As shown in the figure, the test board 210 includes a mounting groove 211 and a mounting base 212. Among them, the test pin assembly 240 is arranged on the mounting base 212. The mounting base 212 is slidably mounted in the mounting groove 211 along the first direction Z and is detachably mounted on the test board 210 through a first fastener 2121a. The test pin assembly 240 is detachably mounted on the test board 210 through the mounting base 212. During the processing, it is only necessary to ensure the matching accuracy between the mounting base 212 and the test pin assembly 240, which can reduce the processing accuracy of the test pin assembly 240. In addition, among the mounting base 212 and the test pin assembly 240, the mounting base 212 can be used as a non-wearing part compared with the test pin assembly 240, and its service life can be improved by adjusting its material. Further, in order to improve the mounting accuracy between the mounting base 212 and the test board 210, a first positioning member 2121b can also be included between the mounting base 212 and the test board 210. The initial positioning between the mounting base 212 and the test board 210 is realized through the first positioning member 2121b, and then the detachable connection between the mounting base 212 and the test board 210 is realized through the first fastener 2121a.

[0113] The shape of the mounting groove 211 matches that of the mounting base 212 to limit the movement of the mounting base 212 in other directions. For example, when the shape of the mounting groove 211 is a rectangular structure, the part of the test pin assembly 240 that cooperates with the mounting groove 211 is also a rectangular structure. On the one hand, it can limit the movement of the test pin assembly 240 in the second direction and the third direction, and on the other hand, it can ensure the matching accuracy between the mounting base 212 and the test board 210. Among them, the first direction Z, the second direction, and the third direction are perpendicular to each other in pairs. It should be noted here that the first direction Z corresponds to the thickness direction of the test board 210, and the second direction X and the third direction Z can be any directions perpendicular to the first direction Z. For example, the second direction X can correspond to the length direction of the test board 210, and the third direction Z can correspond to the width direction of the test board 210; or the second direction X corresponds to the width direction of the test board 210, and the third direction Z can correspond to the length direction of the test board 210. In the rectangular coordinate system, the length direction of the test board 210 corresponds to the length of the test board 210, the width direction of the test board 210 corresponds to the width of the test board 210, and the thickness direction of the test board 210 corresponds to the thickness of the test board 210.

[0114] In the embodiment of the present application, the mounting base 212 may include a mounting block 2121 and a protective sleeve 2122. Among them, the mounting block 2121 and the protective sleeve 2122 are arranged along the first direction Z, and a sleeve hole 212a for mounting the test pin assembly 240 is formed in the middle of the two. During the process of mounting the test pin assembly 240 on the test board 210, first mount the mounting base 212 in the mounting groove 211, and then mount the test pin assembly 240 in the sleeve hole 212a. It can be used to protect the test pin assembly 240 and extend the service life of the test pin assembly 240.

[0115] In the embodiment of the present application, the test pin assembly 240 can be installed on the mounting block 2121 through the second fastener 2403a1. In order to further improve the matching accuracy between the test pin assembly 240 and the mounting seat 212, a second positioning member 2403b1 can also be provided between the test pin assembly 240 and the mounting block 2121. The preliminary positioning of the test pin assembly 240 and the mounting block 2121 is realized through the second positioning member 2403b1, and then the installation of the test pin assembly 240 and the mounting block 2121 is realized through the second fastener 2403a1. Installing the test pin assembly 240 on the mounting block 2121 by using the second fastener 2403a1 can make the test pin assembly 240 be fixed after being installed in place, thereby reducing the difficulty of adjusting and installing the test pin assembly 240 in place.

[0116] It should be noted that in some other embodiments of the present application, the mounting seat 212 may not be provided between the test pin assembly 240 and the test board 210, that is, the test pin assembly 240 is directly detachably connected to the test board 210 through the second fastener 2403a1. Further, in order to improve the installation accuracy between the test pin assembly 240 and the test board 210, a second positioning member 2403b1 can also be provided between the test pin assembly 240 and the test board 210 to achieve preliminary positioning.

[0117] The above-mentioned test pin assembly 240 can be used for testing a certain test point 122, can also be used for testing several test points 122, and can also be used for testing the BTB connector 121. The above-mentioned certain test point 122, several test points 122 and the BTB connector 121 can all be used as the elements to be tested. The structure of the test pin assembly 240 will be specifically introduced below with reference to the drawings.

[0118] Combined with Figure 12 See Figures 19 to 21 Figure 19 (a) is a perspective view of a test pin assembly provided by an embodiment of the present application; Figure 19 (b) is an exploded view of a test pin assembly provided by an embodiment of the present application; Figure 20 (a) is a perspective view of the test pin assembly shown in Figure 19 before testing the BTB connector; Figure 20 (a) is a perspective view of the test pin assembly shown in Figure 19 after testing the BTB connector; Figure 21 (a) is a cross-sectional view of the test pin assembly shown in Figure 19 before testing the BTB connector; Figure 21 (b) is a cross-sectional view of the test pin assembly shown in Figure 19 before testing the BTB connector.

[0119] ​The illustrated test probe assembly 240 includes a secondary outer sleeve 2401, a primary outer sleeve 2402, a fixing block 2403, a limiting sleeve 2404, a rubber core 2405, a spring probe 2406, a printed circuit board 2407 (Printed Circuit Board, PCB), a first elastic member 2408, a second elastic member 2409, and a locking member 2410, where:

[0120] The secondary outer sleeve 2401 passes through the primary outer sleeve 2402 and is slidably engaged with the primary outer sleeve 2402 along the first direction Z.

[0121] The primary outer sleeve 2402, the fixing block 2403, and the limiting sleeve 2404 form a support structure 240a of the test probe assembly 240, which is used to support other components and achieve a detachable connection between the test probe assembly 240 and the test board 210; wherein, the primary outer sleeve 2402 and the limiting sleeve 2404 are butted to form an installation cavity to support other components (all or part of the secondary outer sleeve 2401, the rubber core 2405, the spring probe 2406, the printed circuit board (Printed Circuit Board, PCB) 2407, and the first elastic member 2408); the fixing block 2403 is slidably sleeved on the outer peripheries of the primary outer sleeve 2402 and the limiting sleeve 2404 along the first direction Z; the fixing block 2403 may include a first fastening hole 2403a for installing a second fastener 2403a1, and the fixing block 2403 may further include a second positioning member 2403b1 and a first positioning hole 2403b, and through the first fastening hole 2403a and / or the first positioning hole 2403b, a detachable connection between the test probe assembly 240 and the test board 210 is achieved.

[0122] The rubber core 2405, the spring probe 2406, and the PCB 2407 form a spring probe structure 240b of the test probe assembly 240, and this spring probe structure 240b is installed in the installation cavity; wherein, the rubber core 2405 connects the spring probe 2406 and the PCB 2407 and is arranged in the installation cavity; one end of the spring probe 2406 that exposes the rubber core 2405 extends into the secondary outer sleeve 2401 and is in contact connection with the component to be measured when the secondary outer sleeve 2401 is in the retracted state; the PCB 2407 is fixed to the limiting sleeve 2404 and the primary outer sleeve 2402 through the locking member 2410.

[0123] The first elastic member 2408 is in a compressed state between the secondary outer sleeve 2401 and the limiting sleeve 2404.

[0124] The second elastic member 2409 is in a compressed state between the primary outer sleeve 2402 and the fixing block 2403.

[0125] See Figure 20 and Figure 21, in the embodiments of the present application, taking the DUT including the BTB connector 121 as an example, the testing process of the test pin assembly 240 is specifically introduced. As Figure 20 (a) and Figure 21 (a) show, before the test, the test pin assembly 240 has not contacted the first end face 1211a of the BTB connector 121. The secondary outer sleeve 2401 abuts against the main outer sleeve 2402 under the action of the first elastic member 2408; the fixing block 2403 abuts against the limiting sleeve 2404 under the action of the second elastic member 2409; one end of the spring needle 2406 exposed from the glue core 2405 does not contact the terminal 1213 of the BTB connector 121. The test pin assembly 240 continues to move in the direction closer to the BTB connector 121. The secondary outer sleeve 2401 contacts the first end face 1211a of the BTB connector 121 first compared with the spring needle 2406, and the acting force between the two overcomes the elastic force of the first elastic member 2408, so that the secondary outer sleeve 2401 does not continue to move in the direction closer to the BTB connector 121 following the test pin assembly 240, while the remaining components of the test pin assembly 240 continue to move in the direction closer to the BTB connector 121 until the spring needle 2406 contacts the terminal 1213 of the BTB connector 121, as Figure 20 (b) and Figure 21 (b) show.

[0126] It can be seen that in the test pin assembly 240 of the embodiments of the present application, a first floating structure is formed between the secondary outer sleeve 2401 and the first elastic member 2408, and a second floating structure is formed between the main outer sleeve 2402 and the second elastic member 2409. Therefore, during the testing process of the test pin assembly 240, the secondary outer sleeve 2401 has the function of unilateral floating relative to the main outer sleeve 2402, and the main outer sleeve 2402 has the function of unilateral floating relative to the fixing block 2403. When the test pin assembly 240 contacts the BTB connector 121, the contact posture between the spring needle 2406 and the BTB connector 121 can be adjusted, thereby expanding the processing precision threshold of the test pin assembly 240 on the premise of meeting the test requirements.

[0127] To facilitate the adjustment of the contact posture between the elastic micro-needles 2406 and the BTB connector 121, the end face of the secondary outer sleeve 2401 exposed from the main outer sleeve 2402 may further include a guiding portion. During the process of the secondary outer sleeve 2401 contacting the first end face 1211a of the BTB connector 121, since the secondary outer sleeve 2401 is provided with the guiding portion, the contact posture between the secondary outer sleeve 2401 and the BTB connector 121 can be adjusted, so that the secondary outer sleeve 2401 can be aligned with the BTB connector 121, thereby ensuring the reliability of the contact between the elastic micro-needles 2406 and the terminals 1213 of the BTB connector 121. In addition, since there is a first floating structure between the secondary outer sleeve 2401 and the first elastic member 2408, therefore, after positioning by the secondary outer sleeve 2401 and pressing down, the elastic micro-needles 2406 contact the component under test for testing. The elastic micro-needles 2406 have a certain elasticity, which can better protect the main board.

[0128] It should be noted that the above BTB connector 121 is introduced as an example. The BTB can also be a test point as the component under test. When the component under test is a test point, the above description can be referred to.

[0129] Combined Figures 19 to 21 , see Figures 22 to 26 , in some embodiments of the present application, the secondary outer sleeve 2401 may include a first guiding hole 2401a extending along the first direction Z and a limiting sliding groove 2401b. The first guiding hole 2401a is communicated with the limiting sliding groove 2401b. The limiting sliding groove 2401b is located on the end face of the secondary outer sleeve 2401 located in the main outer sleeve 2402 compared with the first guiding hole 2401a; the first guiding hole 2401a is in sliding fit with the elastic micro-needles 2406, and the limiting sliding groove 2401b is in sliding fit with the rubber core 2405. The shape of the limiting sliding groove 2401b matches the external shape of the rubber core 2405, so that the limiting sliding groove 2401b of the secondary outer sleeve 2401 can move relative to the rubber core 2405. When the cross-section of the limiting sliding groove 2401b is a rectangular structure, the external shape of the rubber core 2405 is also a rectangular structure; when the cross-section of the limiting sliding groove 2401b is a circular structure, the external shape of the rubber core 2405 is also a circular structure.

[0130] It should be noted that the number and arrangement of the first guiding holes 2401a correspond to the elastic micro-needles 2406. When the number of the elastic micro-needles 2406 is multiple, the number of the first guiding holes 2401a is multiple, and the first guiding holes 2401a correspond to the elastic micro-needles 2406 one by one; when the elastic micro-needles 2406 are arranged in two rows, the first guiding holes 2401a are also arranged in two rows. Of course, the number of the first guiding holes 2401a can also be more than the number of the elastic micro-needles 2406.

[0131] The secondary outer sleeve 2401 of the embodiment of the present application may include a first limit chute 2401b, a secondary outer sleeve body 24011, a first limiting portion 24012, two first guiding portions 24013, two second guiding portions 24014, and a first transition portion 24015. Among them, the first limiting portion 24012, the first transition portion 24015, and the secondary outer sleeve body 24011 are arranged in sequence along the first direction Z. The first limiting portion 24012 is located within the main outer sleeve 2402 to prevent the secondary outer sleeve 2401 from detaching from the main outer sleeve 2402; part or all of the secondary outer sleeve body 24011 can extend out of and retract into the main outer sleeve 2402; the first transition portion 24015 realizes the transitional connection between the first limiting portion 24012 and the secondary outer sleeve body 24011 to reduce the collision during the process of the secondary outer sleeve body 24011 extending out of and retracting into the main outer sleeve 2402; the two first guiding portions 24013 are arranged oppositely along the second direction X on the end face of the secondary outer sleeve body 24011 that is exposed from the main outer sleeve 2402, and the first guiding portion 24013 includes a first guiding surface 24013a, and the two first guiding surfaces 24013a are arranged obliquely opposite to each other to have a tendency to guide towards the middle of the secondary outer sleeve 2401; the two second guiding portions 24014 are arranged oppositely along the third direction Z on the end face of the secondary outer sleeve body 24011 that is exposed from the main outer sleeve 2402, and the second guiding portion 24014 includes a second guiding surface 24014a, and the two second guiding surfaces 24014a are arranged obliquely opposite to each other to have a tendency to guide towards the middle of the secondary outer sleeve 2401.

[0132] Further, the two first guiding portions 24013 correspond to the two edges in the length direction of the socket 1211 of the BTB connector 121 to improve the alignment of the secondary outer sleeve 2401 with the socket 1211 of the BTB connector 121 in the third direction Z, and further improve the alignment of the secondary outer sleeve 2401 with the terminal 1213 of the BTB connector 121 in the third direction Z; the two second guiding portions 24014 correspond to the slots 1212 of the BTB connector 121 to improve the alignment of the secondary outer sleeve 2401 with the terminal 1213 of the BTB connector 121 in the second direction X.

[0133] In some other embodiments of the present application, the secondary outer sleeve 2401 may further include a secondary outer sleeve body 24011, a first limiting portion 24012, and two first guiding portions 24013. Among them, the first limiting portion 24012 and the secondary outer sleeve body 24011 are arranged in sequence along the first direction Z. The first limiting portion 24012 is located within the main outer sleeve 2402 to limit the detachment of the secondary outer sleeve 2401 from the main outer sleeve 2402; part or all of the secondary outer sleeve body 24011 can extend out of and retract into the main outer sleeve 2402; the two first guiding portions 24013 are oppositely arranged along the second direction X on the end face of the secondary outer sleeve body 24011 that exposes the main outer sleeve 2402, and the first guiding portion 24013 includes a first guiding surface 24013a. The two first guiding surfaces 24013a are arranged obliquely relative to each other to have a tendency to guide towards the middle of the secondary outer sleeve 2401.

[0134] The above is the introduction of the structure of the rubber core 2405. The following specifically introduces the structure of the support structure 240a with reference to the accompanying drawings. Figures 19 to 22 , see Figures 27 to 37 In the support structure 240a of the embodiment of the present application, the docked main outer sleeve 2402, the limiting sleeve 2404, and the fixing block 2403 are in sliding fit, so that the main outer sleeve 2402 and the second elastic member 2409 form a second floating structure. By setting the second floating structure, the processing precision threshold of the test probe assembly 240 can be further improved. In addition, due to the existence of the second floating structure, the fixing block 2403 can be pressed down by a preset stroke to accommodate the installation error of the entire test probe assembly 240. This preset stroke can be adaptively adjusted according to the material and size of the second elastic member 2409 and the installation requirements of the test fixture, and the present application does not describe it in detail.

[0135] Combined with Figures 19 to 22 , see Figures 27 to 30 In the main outer sleeve 2402 of the embodiment of the present application, it includes a first through hole 2402a, a second guiding hole 2402b, and a first installation cavity 2402c. Among them, the first through hole 2402a is used to realize the connection between the main outer sleeve 2402 and the limiting sleeve 2404; the first limiting portion 24012, the first elastic member 2408, and the spring probe 2406 of the secondary outer sleeve 2401 are installed in the first installation cavity 2402c; the secondary outer sleeve body 24011 of the secondary outer sleeve 2401 is matched with the second guiding hole 2402b.

[0136] Specifically, the shape of the second guiding hole 2402b matches the outer shape of the secondary outer sleeve body 24011 of the secondary outer sleeve 2401 so that the secondary outer sleeve body 24011 can slide within the second guiding hole 2402b. When the cross-section of the secondary outer sleeve body 24011 is rectangular, the cross-section of the second guiding hole 2402b is also rectangular; when the cross-section of the secondary outer sleeve body 24011 is circular, the cross-section of the second guiding hole 2402b is also circular. Similarly, the shape of the first installation cavity 2402c matches the outer shape of the first limiting portion 24012.

[0137] In the embodiments of the present application, the main outer sleeve 2402 is connected to the limiting sleeve 2404 by installing a locking member 2410 on the first through hole 2402a. Or in some other embodiments of the present invention, the main outer sleeve 2402 is threadedly connected to the limiting sleeve 2404. Specifically, an external thread is provided at the portion where the main outer sleeve 2402 cooperates with the limiting sleeve 2404, and an internal thread is provided at the portion where the limiting sleeve 2404 cooperates with the main outer sleeve 2402. The connection between the main outer sleeve 2402 and the limiting sleeve 2404 is achieved through the cooperation of the internal thread and the external thread; or an internal thread is provided at the portion where the main outer sleeve 2402 cooperates with the limiting sleeve 2404, and an external thread is provided at the portion where the limiting sleeve 2404 cooperates with the main outer sleeve 2402. The connection between the main outer sleeve 2402 and the limiting sleeve 2404 is achieved through the cooperation of the internal thread and the external thread.

[0138] The main outer sleeve 2402 in the embodiments of the present application may further include a main outer sleeve body 24021 and a second limiting portion 24022. Among them, the main outer sleeve body 24021 and the second limiting portion 24022 are arranged in sequence along the first direction Z, and the cross-section of the second limiting portion 24022 is larger than the cross-section of the main outer sleeve body 24021 for limiting the second elastic member 2409.

[0139] In order to reduce the processing difficulty and improve the installation efficiency, the peripheral surface of the main outer sleeve body 24021 of the embodiments of the present application includes a first side surface 24021a and a second side surface 24021b. The first side surface 24021a and the second side surface 24021b form the entire peripheral surface of the main outer sleeve body 24021. Among them, the first side surface 24021a is a plane, and the second side surface 24021b is a cylindrical surface. The first through hole 2402a is provided on the first side surface 24021a with a planar structure. On the one hand, it can reduce the processing difficulty of the first through hole 2402a, and on the other hand, it can achieve the purpose of preventing misassembly and improve the assembly efficiency.

[0140] Combined Figure 12 、 Figures 19 to 22 See Figure 31, in the embodiment of the present application, the fixing block 2403 is slidably matched with the main outer sleeve 2402 and the limiting sleeve 2404. Specifically, the fixing block 2403 may include a first fastening hole 2403a, a first positioning hole 2403b, and a fixing hole 2403c. Among them, the first fastening hole 2403a is used to mount the test needle assembly 240 on the test board 210; the first positioning hole 2403b is used to preliminarily position the test needle assembly 240 on the test board 210; the fixing hole 2403c is located in the middle of the fixing block 2403 for mounting the main outer sleeve 2402.

[0141] The shape of the above-mentioned fixing hole 2403c matches the shape of the main outer sleeve 2402. The cross-section of the fixing hole 2403c can be a rectangular, circular, elliptical or other structure. In order to limit the rotation of the main outer sleeve 2402 relative to the fixing hole 2403c, the fixing hole 2403c is a non-rotary body structure. For example, the cross-section of the fixing hole 2403c is a combination of a curve and a straight line.

[0142] Furthermore, along the direction away from the limiting sleeve 2404, the cross-section of the fixing hole 2403c gradually becomes smaller to achieve the self-locking of the fixing block 2403 with the limiting sleeve 2404 or the main outer sleeve 2402.

[0143] It should be noted that in some other embodiments of the present application, the fixing block 2403 may include a first fastening hole 2403a, and the installation of the test needle assembly 240 on the test board 210 is achieved through the first fastening hole 2403a; in some other embodiments of the present application, the fixing block 2403 may include a first fastening hole 2403a and a first positioning hole 2403b. The first fastening hole 2403a is used to mount the test needle assembly 240 on the test board 210; the first positioning hole 2403b is used to preliminarily position the test needle assembly 240 on the test board 210. In the above two technical solutions, it can be understood that the fixing block 2403 and the main outer sleeve 2402 are of an integral structure.

[0144] In the embodiment of the present application, the fixing block 2403 may include a fixing block main body 24031. The fixing hole 2403c is located in the middle of the fixing block main body 24031, and the first fastening hole 2403a and the first positioning hole 2403b are distributed on two opposite edges of the fixing block 2403.

[0145] Combined Figures 19 to 22 , see Figures 32 to 37 , in the embodiment of the present application, the limiting sleeve 2404 includes a second through hole 2404a and a first mounting hole 2404b. Among them, the first mounting hole 2404b extends along the first direction Z for mounting the elastic micro-needle structure 240b, and the second through hole 2404a is used to connect with the main outer sleeve 2402.

[0146] Further, the above-mentioned limiting sleeve 2404 may further include a second mounting hole 2404d. Among them, the second mounting hole 2404d and the first mounting hole 2404b are arranged along the first direction Z. Among them, the cross-section of the first mounting hole 2404b is larger than that of the second mounting hole 2404d to facilitate the positioning of the elastic sheet micro-needle structure 240b.

[0147] The limiting sleeve 2404 may further include a limiting notch 2404c. The limiting notch 2404c is provided on the end face of the limiting sleeve 2404 away from the main outer sleeve 2402 to position the PCB 2407. The shape of the limiting notch 2404c is adapted to the shape of the PCB 2407 that does not cooperate with the limiting notch 2404c. In the figure, the limiting notch 2404c is an inclined surface, and the corresponding PCB 2407 is also an inclined surface structure.

[0148] The function of the above-mentioned limiting sleeve 2404 has two aspects. The first aspect is to cooperate with the main outer sleeve 2402 to form a mounting cavity to limit the movement of the elastic sheet micro-needle structure 240b in the first direction Z. The second aspect is to limit the movement of the fixing block 2403 along the first direction Z. Correspondingly, the limiting sleeve 2404 may include a limiting sleeve main body 24041 and a third limiting portion 24042. Among them, the second through hole 2404a is provided on the limiting sleeve main body 24041 to realize the connection between the limiting sleeve 2404 and the main outer sleeve 2402; the third limiting portion 24042 is enclosed by the main outer sleeve 2402 to limit the movement of the fixing block 2403.

[0149] In the figure, the limiting sleeve main body 24041 and the third limiting portion 24042 are of an integral structure; in some embodiments of the present application, the limiting sleeve main body 24041 and the third limiting portion 24042 are of a split structure. Correspondingly, the third limiting portion 24042 is sleeved on the outer periphery of the limiting sleeve main body 24041, or the limiting sleeve main body 24041 is sleeved on the outer periphery of the third limiting portion 24042. The third limiting portion 24042 is provided with a fourth through hole (not shown in the figure). The locking member 2410 passes through the second through hole 2404a and the fourth through hole to realize the connection between the third limiting portion 24042 and the limiting sleeve main body 24041.

[0150] After the main outer sleeve 2402 and the limiting sleeve 2404 are assembled, the locking member 2410 passes through the first through hole 2402a, the second through hole 2404a and the fourth through hole in sequence to simultaneously realize the connection of the main outer sleeve 2402, the limiting sleeve main body 24041 and the third limiting portion 24042. By adopting this structural method, the relative rotation can be restricted by changing the external structures of the main outer sleeve 2402, the limiting sleeve main body 24041 and the third limiting portion 24042. The movement of the main outer sleeve 2402, the limiting sleeve main body 24041 and the third limiting portion 24042 in the first direction Z can be restricted by the locking member 2410, which has the advantages of simple structure and convenient assembly.

[0151] The above-mentioned second via hole 2404a is located on the hole wall of the first mounting hole 2404b, and the first mounting hole 2404b mainly corresponds to the PCB 2407 of the spring probe structure 240b. The second mounting hole 2404d mainly corresponds to the rubber core 2405 of the spring probe structure 240b.

[0152] For the specific structure of the spring probe structure 240b described in the embodiments of the present application, please refer to Figures 19 to 21 , and refer to Figures 36 to 50 .

[0153] The function of the spring probe structure 240b in the embodiments of the present application is to connect the component to be measured, and it may include a rubber core 2405, spring probes 2406 and a PCB 2407. The rubber core 2405 is used for the electrical connection between the spring probes 2406 and the PCB 2407. The rubber core 2405 mainly corresponds to the second mounting hole 2404d of the limiting sleeve 2404. The rubber core 2405 includes a limiting hole 2405a extending along the first direction Z, and the spring probes 2406 are arranged in the limiting hole 2405a to limit the movement of the spring probes 2406 in the first direction Z, the second direction X and the third direction Z. The rubber core 2405 restricts the movement of the spring probes 2406 in the above-mentioned directions through its own elastic deformation.

[0154] One end of the spring probe 2406 close to the PCB 2407 is in contact connection with the conductive contact 2407b of the PCB 2407; the end of the spring probe 2406 far from the PCB 2407 extends into the sub outer sleeve 2401 to be in contact connection with the component to be measured.

[0155] The rubber core 2405 in the embodiments of the present application is used to position the spring probes 2406 and insulate the spring probes 2406 from other components (such as the spring probes 2406, the main body 24041 of the limiting sleeve, the main outer sleeve 2402 and the sub outer sleeve 2401, etc.). Specifically, the rubber core 2405 includes a rubber core main body 2405b, a fourth limiting portion 2405c and a fifth limiting portion 2405d. Among them, the fourth limiting portion 2405c, the rubber core main body 2405b and the fifth limiting portion 2405d are arranged along the first direction Z. Among them, the fourth limiting portion 2405c is used to cooperate with the first mounting hole 2404b, the rubber core main body 2405b cooperates with the second mounting hole 2404d, and the fifth limiting portion 2405d cooperates with the limiting sliding groove 2401b of the sub outer sleeve 2401.

[0156] The limiting hole 2405a of the rubber core 2405 penetrates through the fourth limiting portion 2405c, the rubber core main body 2405b and the fifth limiting portion 2405d along the first direction Z, and the number of the limiting holes 2405a is adapted to the number of the spring probes 2406. The following will introduce the structure of the spring probes 2406 in combination with Figure 46 :

[0157] The above-mentioned elastic sheet micro-needle 2406 may include an elastic sheet micro-needle body 2406a, a connection end 2406b, and a plug-in end 2406c. Among them, the plug-in end 2406c is located at one end of the elastic sheet micro-needle body 2406a away from the PCB 2407, and the connection end 2406b is located at one end of the elastic sheet micro-needle body 2406a close to the PCB 2407. After the elastic sheet micro-needle 2406 is installed in place in the limit hole 2405a of the rubber core 2405, both the plug-in end 2406c and the connection end 2406b are exposed from the rubber core 2405.

[0158] In order to improve the connection stability between the elastic sheet micro-needle 2406 and the limit hole 2405a, the elastic sheet micro-needle 2406 in the embodiment of the present application further includes a clamping portion 2406c provided on the elastic sheet micro-needle body 2406a, and the clamping portion 2406c is provided close to the connection end 2406b. So that the clamping point between the elastic sheet micro-needle 2406 and the limit hole 2405a is close to the connection end 2406b, the distance between the plug-in end 2406c and the clamping point is increased, and further the elastic deformation ability of the plug-in end 2406c is increased, and the precision threshold of the test needle assembly 240 is further improved.

[0159] The above-mentioned clamping portion 2406c may be at least one protrusion protruding from the side of the elastic sheet micro-needle 2406. The protrusion may be a rectangular protrusion, a tooth-shaped protrusion, etc. As long as the structure that can be clamped on the hole wall of the limit hole 2405a to increase the clamping strength can be understood as the clamping portion 2406c.

[0160] It should be noted that in the embodiment of the present application, the rubber core 2405 and the elastic sheet micro-needle 2404 may also be integrally injection-molded. Using integral injection-molding can simplify the assembly efficiency of the elastic sheet micro-needle 2404 and the rubber core.

[0161] The connection end 2406b of the elastic sheet micro-needle 2406 in the embodiment of the present application is in contact connection with the conductive contact 2407b of the PCB 2407, and is led out through a wire under the action of the PCB 2407. The following combination Figures 19 to 21 , and Figures 47 to 50 introduces the structure of the PCB 2407:

[0162] The PCB 2407 includes a third via 2407a, a conductive contact 2407b, and a conductive hole 2407c. Among them, the locking member 2410 fixes the PCB 2407 on the limit sleeve 2404 through the third via 2407a; the conductive contact 2407b is electrically connected to the connection end 2406b of the elastic sheet micro-needle 2406 through contact; the conductive hole 2407c is connected to the corresponding conductive contact 2407b and is led out through a wire (not shown in the figure).

[0163] The third via 2407a corresponds to the second via 2404a and the first via 2402a described above. The locking member 2410 passes through the first via 2402a, the second via 2404a, and the third via 2407a in sequence, and the locking connection of the main outer sleeve 2402, the limiting sleeve 2404, and the PCB 2407 can be realized at one time.

[0164] The conductive contact 2407b is electrically connected to the corresponding spring probe 2406. In the figure, the number of spring probes 2406 is eight; the number of conductive contacts 2407b is six, namely the first conductive contact 2407b1, the second conductive contact 2407b2, the third conductive contact 2407b3, the fourth conductive contact 2407b4, the fifth conductive contact 2407b5, and the sixth conductive contact 2407b6; the number of conductive holes 2407c is six, namely the first conductive hole 2407c1, the second conductive hole 2407c2, the third conductive hole 2407c3, the fourth conductive hole 2407c4, the fifth conductive hole 2407c5, and the sixth conductive hole 2407c6; under the action of the PCB 2407, the first conductive contact 2407b1 is electrically connected to the first conductive hole 2407c1, the second conductive contact 2407b2 is electrically connected to the second conductive hole 2407c2, the third conductive contact 2407b3 is electrically connected to the third conductive hole 2407c3, the fourth conductive contact 2407b4 is electrically connected to the fourth conductive hole 2407c4, the fifth conductive contact 2407b5 is electrically connected to the fifth conductive hole 2407c5, and the sixth conductive contact 2407b6 is electrically connected to the sixth conductive hole 2407c6. The first conductive contact 2407b1 and the fourth conductive contact 2407b4 penetrate through the PCB 2407 in the thickness direction of the PCB 2407. On the first surface of the PCB 2407, the second conductive contact 2407b2 and the third conductive contact 2407b3 are located between the first conductive contact 2407b1 and the fourth conductive contact 2407b4; on the second surface of the PCB 2407, the fifth conductive contact 2407b5 and the sixth conductive contact 2407b6 are located between the first conductive contact 2407b1 and the fourth conductive contact 2407b4.

[0165] The number of the above conductive contacts 2407b and conductive holes 2407c is adjusted according to the structure of the spring probe 2406, and the number of the spring probes 2406 is determined according to the number of the components to be measured. When the component to be measured includes the BTB connector 121, the number of the terminals 1213 in the BTB connector 121 is eight, and the corresponding number of the spring probes 2406 is eight. Of course, the above structure is only an example, and other numbers of spring probes 2406 are also within the protection scope of the embodiments of the present application.

[0166] It should be noted that the above-mentioned test probe assembly 240 of the present application can be adapted to different models of battery BTB connectors by adjusting the structure of the shrapnel micro-needle structure 240b, such as 0-16 pin battery BTB connectors.

[0167] It should be understood that in the present application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that there can be three relationships. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural.

[0168] As described above, the above embodiments are only used to illustrate the technical solutions of the present application, rather than limiting them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A test needle assembly, characterized in that, the test needle assembly can be applied to a test fixture; the test needle assembly includes a secondary outer sleeve, a support structure, a leaf spring micro-needle structure, and a first elastic member. The secondary outer sleeve and the support structure are slidably engaged along a first direction, and the support structure is exposed; the leaf spring micro-needle structure is disposed inside the support structure and extends into the secondary outer sleeve to contact and connect with a component to be tested; the first elastic member is arranged in a compressed state between the support structure and the secondary outer sleeve to form a first floating structure; and the leaf spring micro-needle structure is in contact and connection with the component to be tested when the secondary outer sleeve is in a retracted state; the support structure includes a main outer sleeve, a fixing block, and a limiting sleeve. Among them, the main outer sleeve and the limiting sleeve are butted to form an installation cavity, and all or part of the secondary outer sleeve, the first elastic member, and the leaf spring micro-needle structure are installed in the installation cavity; the fixing block is disposed on the outer periphery of the main outer sleeve and the limiting sleeve, and the fixing block includes a first fastening hole for installing a second fastener.

2. The test needle assembly according to claim 1, characterized in that, the end face of the secondary outer sleeve exposing the support structure further includes a guiding portion to automatically adjust the contact posture between the secondary outer sleeve and the component to be tested.

3. The test needle assembly according to claim 2, characterized in that, the guiding portion includes two first guiding portions, which are arranged opposite to each other along a second direction, and the first guiding portion includes a first guiding surface. The two first guiding surfaces are arranged obliquely opposite to each other to have a tendency to guide towards the middle of the secondary outer sleeve. The second direction is perpendicular to the first direction.

4. The test needle assembly according to claim 3, characterized in that, the guiding portion includes two second guiding portions, which are arranged opposite to each other along a third direction, and the second guiding portion includes a second guiding surface. The two second guiding surfaces are arranged obliquely opposite to each other to have a tendency to guide towards the middle of the secondary outer sleeve. Among them, the third direction, the second direction, and the first direction are perpendicular to each other in pairs.

5. The test needle assembly according to claim 3, characterized in that, the secondary outer sleeve includes a first guiding hole and a limiting sliding groove extending along the first direction. The first guiding hole is communicated with the limiting sliding groove; the first guiding hole is slidably engaged with the leaf spring micro-needle of the leaf spring micro-needle structure, and the limiting sliding groove is slidably engaged with the rubber core of the leaf spring micro-needle structure.

6. The test needle assembly according to claim 1, characterized in that, the fixing block is slidably sleeved on the outer periphery of the main outer sleeve and the limiting sleeve, and a second elastic member is disposed between the fixing block and the main outer sleeve. The main outer sleeve and the second elastic member form a second floating structure.

7. The test needle assembly according to claim 6, characterized in that, the fixing hole of the fixing block sleeved on the outer periphery of the main outer sleeve and the limiting sleeve can be self-locked on the outer periphery of the limiting sleeve.

8. The test needle assembly according to claim 7, characterized in that, along the direction away from the limiting sleeve, the cross-section of the fixing hole gradually becomes smaller.

9. The test needle assembly according to claim 1, characterized in that, The fixed block and the main outer sleeve are of an integral structure.

10. The test pin assembly according to claim 1, characterized in that, the main outer sleeve and the limit sleeve are connected by a locking member. The main outer sleeve is provided with a first through hole, and the limit sleeve is provided with a second through hole. The locking member sequentially passes through the first through hole and the second through hole to realize the connection between the main outer sleeve and the limit sleeve.

11. The test pin assembly according to claim 1, characterized in that, the limit sleeve is of an integral structure or a split structure.

12. The test pin assembly according to claim 1, characterized in that, the elastomeric micro-needle structure includes elastomeric micro-needles, a glue core and a printed circuit board. Among them, the elastomeric micro-needles are installed on the glue core, and one end thereof protruding from the glue core extends into the sub-outer sleeve. The other end of the elastomeric micro-needle protruding from the glue core is electrically connected to the printed circuit board.

13. The test pin assembly according to claim 12, characterized in that, the elastomeric micro-needles and the glue core are integrally injection-molded.

14. The test pin assembly according to claim 12, characterized in that, the number of the elastomeric micro-needles is multiple. The printed circuit board includes a plurality of conductive contacts and a plurality of conductive holes. Among them, the conductive contacts are electrically connected to the corresponding conductive holes through the printed circuit board; the elastomeric micro-needles are in contact connection with the corresponding conductive contacts.

15. The test pin assembly according to claim 12, characterized in that, the elastomeric micro-needle includes an elastomeric micro-needle body, a connection end, a plug-in end and a clamping portion. Among them, the plug-in end is located at one end of the elastomeric micro-needle body far from the printed circuit board; the connection end is located at one end of the elastomeric micro-needle body close to the printed circuit board; the clamping portion is arranged close to the connection end.

16. A test fixture, characterized in that, it includes a test board, a test bracket and a test pin assembly. The test board and the test bracket are arranged opposite to each other along a first direction. The test bracket has a test position for installing a main board; the test pin assembly is detachably installed on the test board; the test pin assembly can be in contact connection with the component to be tested on the main board; the test pin assembly is the test pin assembly according to any one of claims 1 to 15.

17. The test fixture according to claim 16, characterized in that, the test pin assembly is directly or indirectly detachably connected to the test board.

18. The test fixture according to claim 17, characterized in that, the test board includes an installation groove and an installation seat. The installation seat is arranged in the installation groove and is detachably installed on the test board through a first fastener; the test pin assembly is installed in the sleeve hole of the installation seat.

19. The test fixture according to claim 18, characterized in that, the installation seat includes an installation block and a protective sleeve. Among them, the installation block and the protective sleeve are arranged along the first direction, and a sleeve hole is formed in the middle of the two.

20. The test fixture according to claim 19, characterized in that, the test pin assembly is installed in the sleeve hole and is installed on the installation block through a second fastener.

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