Aging test circuit, system, test control method, device and chip

Abstract

The application relates to an aging test circuit, a system, a test control method, a device and a chip. The circuit comprises a first power supply, a second power supply and N transformers to be tested, wherein N is an integer greater than 1. The positive and negative terminals of the first power supply are respectively connected to the input positive and negative terminals of the first transformer. The positive terminal of the second power supply is connected to the input positive terminal of the Nth transformer, and the negative terminal of the second power supply is connected to the output negative terminal of the Nth transformer. The output positive terminal of the transformer is connected to the input negative terminal of the same transformer. The input positive terminal of the ith transformer is connected to the input positive terminal of the (i-1)th transformer, and the input negative terminal of the ith transformer is connected to the output negative terminal of the (i-1)th transformer, wherein i is an integer from 2 to N.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of aging test of electrical equipment, and more particularly, to an aging test circuit, a test control method, a test control device, a chip, an aging test system and a computer storage medium. BACKGROUND

[0002] There are two basic types of DC transformers, namely, DC-DC converters with output voltage stabilization and "DC transformers" with output voltage adjustment according to input. The DC transformer is similar to the AC transformer, which converts one DC voltage into another or multiple DC voltages; through high-frequency chopping, transformer isolation, and high-frequency rectification, the conversion of one DC voltage to another or multiple DC voltages proportional to it can be achieved, which can be used for power transmission and voltage detection.

[0003] The performance of the DC transformer directly affects the operation of the load or other modules in the system. The most direct method to test the performance of the DC transformer is aging test. Through power aging test, some potential failure risks can be exposed in advance and optimized design, thereby ensuring the reliability of the entire DC transformer.

[0004] In the conventional technology, the topology of connecting the DC transformer between the high-voltage DC source and the load is used to perform the aging test on the DC transformer. However, when the DC transformer is aged for a long time by using the above topology, energy loss and large cost waste are caused due to the consumption of electric energy by the load. SUMMARY

[0005] An object of an embodiment of the present application is to provide an efficient aging test scheme for transformers.

[0006] According to a first aspect of an embodiment of the present application, an aging test circuit is provided, which includes a first power supply, a second power supply, and N transformers to be tested, N being an integer greater than 1.

[0007] The positive terminal and the negative terminal of the first power supply are respectively electrically connected to the input positive terminal and the input negative terminal of the first transformer; the positive terminal of the second power supply is electrically connected to the input positive terminal of the Nth transformer, and the negative terminal of the second power supply is electrically connected to the output negative terminal of the Nth transformer.

[0008] The output positive terminal of the transformer is electrically connected to the input negative terminal of the same transformer.

[0009] The input positive terminal of the i-th transformer is electrically connected to the input positive terminal of the (i-1)-th transformer, and the input negative terminal of the i-th transformer is electrically connected to the output negative terminal of the (i-1)-th transformer, where i is an integer from 2 to N.

[0010] Optionally, the first power supply is a constant voltage power supply, and the second power supply is a constant current power supply.

[0011] Optionally,

[0012] wherein V Imax is the maximum input voltage of the transformer, V Omin is the minimum output voltage of the transformer, V O is the first voltage output by the first power supply.

[0013] Optionally, the aging test circuit further comprises a first breaker and a second breaker:

[0014] wherein the first breaker is electrically connected between the first power supply and the first transformer; and the second breaker is electrically connected between the second power supply and the Nth transformer.

[0015] Optionally, the first power supply is a converter electrically connected between the first transformer and a power grid, and the second power supply is a converter electrically connected between the Nth transformer and the power grid.

[0016] According to a second aspect of the embodiments of the present application, a test control method is provided, which is applied to an aging test circuit, the aging test circuit comprising a first power supply, a second power supply, and N transformers to be tested, the N transformers being connected in series between the first power supply and the second power supply, the series connection being such that the input voltage of an i-th transformer is equal to the sum of the input voltage of an (i-1)-th transformer and the output voltage of the (i-1)-th transformer, N being an integer greater than 1, and i being an integer from 2 to N; the method comprising:

[0017] controlling the first power supply to output a first voltage to the first transformer;

[0018] starting the N transformers;

[0019] controlling the second power supply to output a first current;

[0020] obtaining a parameter value of a test parameter of the transformer;

[0021] obtaining an aging test result of a corresponding transformer according to the parameter value of the test parameter of the transformer.

[0022] Optionally, starting the j-th transformer comprises:

[0023] outputting a set control instruction to the j-th transformer; wherein j is an integer from 1 to N, and the control instruction comprises an instruction of setting the output voltage of the i-th transformer to the minimum output voltage of the j-th transformer.

[0024] Optionally, the controlling the first power supply to output the first voltage to the first transformer comprises:

[0025] controlling the first power supply to output a constant first voltage to the first transformer;

[0026] the controlling the second power supply to output the first current comprises:

[0027] controlling the second power supply to output a constant first current.

[0028] According to a third aspect of the embodiments of the present application, a test control device is provided, which is applied to an aging test circuit, the aging test circuit comprising a first power supply, a second power supply and N transformers to be tested, the N transformers being connected in series between the first power supply and the second power supply, the series connection making the input voltage of an i-th transformer equal to the sum of the input voltage of an (i-1)-th transformer and the output voltage of the (i-1)-th transformer, N being an integer greater than 1, and i being an integer from 2 to N; the test control device comprising:

[0029] a first power supply control module configured to control the first power supply to output a first voltage to the first transformer;

[0030] a transformer starting module configured to start the N transformers;

[0031] a second power supply control module configured to control the second power supply to output a first current;

[0032] a data acquisition module configured to acquire parameter values of test parameters of the transformers; and

[0033] a test output module configured to obtain an aging test result of a corresponding transformer according to the parameter values of the test parameters of the transformers.

[0034] According to a fourth aspect of the embodiments of the present application, a test control device is further provided for the aging test circuit according to the first aspect of the embodiments of the present application, the test control device comprising a memory and a processor, the memory storing a computer program, the computer program being configured to control the processor to perform the method according to the second aspect of the embodiments of the present application.

[0035] According to a fifth aspect of the embodiments of the present application, a chip is further provided, which comprises a housing, a processor packaged in the housing, and a plurality of pins led out of the housing and configured to be connected with external circuits, the processor being configured to run a computer program to implement the method according to the second aspect of the embodiments of the present application.

[0036] According to a sixth aspect of the embodiments of the present application, a computer storage medium is provided, which stores a computer program. The computer program, when executed by a processor, implements the method according to the second aspect of the present application.

[0037] According to a seventh aspect of the embodiments of the present application, an aging test system is provided, which comprises the test control device according to the third aspect or the fourth aspect of the embodiments of the present application, and the aging test circuit according to the first aspect of the embodiments of the present application.

[0038] An advantage of the embodiments of the present application is that the aging test circuit according to the embodiments of the present application connects N transformers between the first power supply and the second power supply according to the topology that the input voltage of a later transformer is equal to the sum of the input voltage of a former transformer and the output voltage of the former transformer. The energy loss of the test circuit structure during the aging test is only the self-loss of the power supply and the transformer as the aging test object, which is extremely small, thereby saving energy consumption.

[0039] Other features and advantages of the present application will become apparent from the following detailed description of illustrative embodiments thereof, which proceeds with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0040] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the application and, together with the description, serve to explain the principles of the application.

[0041] Figure 1 is a connection structure schematic diagram of an aging test circuit according to some embodiments;

[0042] Figure 2 is a connection structure schematic diagram of an aging test circuit according to some other embodiments;

[0043] Figure 3 is a flowchart schematic diagram of a test control method according to some embodiments;

[0044] Figure 4 is a block schematic diagram of a test control device according to some embodiments;

[0045] Figure 5 is a hardware structure schematic diagram of a test control device according to some other embodiments;

[0046] Figure 6 is a component structure schematic diagram of an aging test system according to some embodiments. DETAILED DESCRIPTION

[0047] Various exemplary embodiments of the present application will now be described in detail with reference to the accompanying drawings. Note that the relative arrangement of the components and steps illustrated in these embodiments, numerical expressions, and numerical values are merely examples, and do not limit the scope of the present application unless otherwise specifically stated.

[0048] The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the scope of the application its application or uses.

[0049] Techniques, methods, and apparatus known to those of ordinary skill in the relevant art can not be discussed in detail herein, but should be considered part of the specification.

[0050] In all examples shown and discussed herein, any specific values should be interpreted as merely illustrative and not as a limitation. Thus, other examples of the exemplary embodiments can have different values.

[0051] Note that like numbers and letters refer to like elements throughout the several views of the drawings and, as such, no further discussions on the same shall be undertaken.

[0052] To improve the efficiency of the aging test of the DC transformer, see Figure 1 The embodiment of the present application provides a kind of aging test circuit of DC transformer. The aging test circuit includes first power supply, second power supply and the N transformers to be tested, wherein N is the integer greater than 1.

[0053] In some examples, the first power supply is a first DC power supply, the second power supply is a second DC power supply, and the transformer is a DC transformer.

[0054] DC power supply has positive and negative two electrodes, the potential of positive electrode is high, and the potential of negative electrode is low. When the two electrodes are connected with the circuit, a constant potential difference between the two ends of the circuit can be maintained, thereby forming a current from the positive electrode to the negative electrode in the external circuit. DC power supply is an energy conversion device that converts other forms of energy into electrical energy to supply the circuit to maintain the steady flow of current.

[0055] In the aging test circuit of the embodiment of the present application, see Figure 1As shown, N transformers are connected in series between the first power supply and the second power supply, the series connection makes the input voltage of the i-th transformer equal to the sum of the input voltage of the (i-1)-th transformer and the output voltage of the (i-1)-th transformer, i is an integer from 2 to N, wherein the input voltage of the first transformer is equal to the output voltage of the first power supply. For example, if the output voltage of the transformer is set to 1V, the output voltage of the first voltage is 700V, then the input voltage of the first transformer is 700V, the input voltage of the second transformer is 701V, the input voltage of the third transformer is 702V, and so on.

[0056] Optionally, the first power supply can be a converter electrically connected between the first transformer and the power grid, which can convert alternating current of the power grid into direct current output, or convert direct current into alternating current feedback to the power grid.

[0057] Optionally, the first power supply can also be a battery module.

[0058] Optionally, the first power supply can also be a constant voltage power supply to provide stable voltage output for the aging test circuit and improve test accuracy. For example, the first power supply can be a direct current power supply with voltage control components, or a direct current power supply output by a voltage stabilizer, etc.

[0059] In addition, the first power supply can also be other types of direct current power supplies as long as it can output the required amplitude of direct current voltage, which is not limited here.

[0060] During the aging test process, for the above series connection, as shown in the figure, Figure 1 the positive terminal S1+ and the negative terminal S1- of the first power supply can be electrically connected with the input positive terminal VI+ and the input negative terminal VI- of the first transformer, respectively.

[0061] Similarly, the second power supply can be a converter electrically connected between the N-th transformer and the power grid, or a battery module, etc.

[0062] In addition, the second power supply can be a constant current power supply to provide stable current output for the aging test circuit and improve test accuracy.

[0063] During the aging test process, for the above series connection, as shown in the figure, Figure 1 the positive terminal S2+ of the second power supply can be electrically connected with the input positive terminal VI+ of the N-th transformer, and the negative terminal S2- of the second power supply can be electrically connected with the output negative terminal VO- of the N-th transformer.

[0064] A DC transformer, also called DC-DC converter, converts one DC voltage to another DC voltage. A DC transformer can be implemented by high frequency chopper, transformer isolation, high frequency rectification to convert one DC voltage to another DC voltage or more DC voltages in proportion to it, which can be used in power transmission and voltage detection, etc. A DC transformer is generally composed of a control chip, an inductor, a diode, a triode, and a capacitor, such as a boost DC transformer, a buck DC transformer, a buck-boost DC transformer, etc.

[0065] During the aging test, as shown in FIG. 1, for each of the N transformers, the output positive terminal VO+ of the transformer needs to be electrically connected to the input negative terminal VI- of the same transformer. For the i-th transformer in the N transformers, where i is an integer from 2 to N, the input positive terminal VI+ of the i-th transformer is electrically connected to the input positive terminal VI+ of the (i-1)-th transformer, and the input negative terminal VI- of the i-th transformer is electrically connected to the output negative terminal VO- of the (i-1)-th transformer. Figure 1 As shown in FIG. 2, the aging test circuit electrically connects 3 transformers between a first power supply and a second power supply. In the aging test circuit, the positive terminal S1+ and the negative terminal S1- of the first power supply are respectively electrically connected to the input positive terminal VI+ and the input negative terminal VI- of the 1st transformer; the positive terminal S2+ of the second power supply is electrically connected to the input positive terminal VI+ of the 3rd transformer, and the negative terminal S2- of the second power supply is electrically connected to the output negative terminal VO- of the 3rd transformer; the output positive terminal VO+ of each transformer is electrically connected to the input negative terminal VI- of itself; the input positive terminal VI+ of the 2nd transformer is electrically connected to the input positive terminal VI+ of the 1st transformer, and the input negative terminal VI- of the 2nd transformer is electrically connected to the output negative terminal VO- of the 1st transformer; the input positive terminal VI+ of the 3rd transformer is electrically connected to the input positive terminal VI+ of the 2nd transformer, and the input negative terminal VI- of the 3rd transformer is electrically connected to the output negative terminal VO- of the 2nd transformer.

[0066] Figure 1 In some embodiments, as shown in FIG. 3, the aging test circuit can further include a first breaker and a second breaker. The first breaker, as a switch to control the output voltage of the first power supply, is electrically connected between the first power supply and the 1st transformer. The second breaker, as a switch to control the output current of the second power supply, is electrically connected between the second power supply and the Nth transformer.

[0067] In some embodiments, as shown in FIG. 3, the aging test circuit can further include a first breaker and a second breaker. The first breaker, as a switch to control the output voltage of the first power supply, is electrically connected between the first power supply and the 1st transformer. The second breaker, as a switch to control the output current of the second power supply, is electrically connected between the second power supply and the Nth transformer. Figure 2

[0068] ​​The above circuit breaker refers to a switching device capable of closing, carrying and breaking the current under normal circuit conditions and capable of closing, carrying and breaking the current under abnormal circuit conditions within a specified time. The aging test circuit sets the circuit breaker, which not only facilitates circuit control, but also quickly cuts off the circuit in the event of a circuit failure or abnormality, ensuring safe operation. Based on the aging test circuit shown in Figure 1 and Figure 2 , the topology is formed in which the input voltage of the latter DC transformer is equal to the sum of the input voltage of the former DC transformer and the output voltage of the former DC transformer. Through the aging test circuit, aging tests can be simultaneously performed on N DC transformers, improving the efficiency of aging tests.

[0069] In addition, based on the aging test circuit shown in Figure 1 and Figure 2 , the energy loss during aging test is only the self-loss of the DC power supply and the DC transformer as the aging test object, without load loss, with minimal loss, thereby saving energy consumption.

[0070] In some embodiments, as many transformers as possible can be electrically connected between the first power supply and the second power supply, thereby achieving the highest aging test efficiency. In these embodiments, the number N of transformers can be obtained according to the maximum input voltage of the transformer, the minimum output voltage of the transformer and the first voltage output by the first power supply, and the number N of transformers can be represented as:

[0071]

[0072] where V Imax is the maximum input voltage of the transformer, V Omin is the minimum output voltage of the transformer, and V O is the first voltage output by the first power supply. The first voltage output by the first power supply is the input voltage of the first transformer. Taking a DC transformer as an example, when the minimum output voltage of the DC transformer is 1V, N = V Imax -V O . At this time, for example, the maximum input voltage V I,ax of the DC transformer is 750V, and the first voltage V O output by the first DC power supply is 700V, then 50 DC transformers can be electrically connected between the first DC power supply and the second DC power supply for simultaneous aging test, maximizing the utility of the topology shown in Figure 1 .

[0073] Referring to Figure 3As shown, the embodiment of the present application provides a test control method, which is applied to an aging test circuit, the aging test circuit comprising a first power supply, a second power supply and N transformers to be tested, the N transformers being connected in series between the first power supply and the second power supply, the series connection being such that the input voltage of the i th transformer is equal to the sum of the input voltage of the (i-1) th transformer and the output voltage of the (i-1) th transformer, N being an integer greater than 1, and i being an integer from 2 to N.

[0074] The method can be implemented by a test control device, which as a kind of host computer, controls the aging test circuit to automatically execute the aging test according to instructions without manual operation, thereby saving test cost. Figure 3 As shown, the method can comprise the following steps S3100-S3500:

[0075] In step S3100, the first power supply is controlled to output a first voltage to the first transformer.

[0076] In this step S3100, the test control device can control the first power supply to output a constant first voltage to the first transformer, so as to improve the stability and accuracy of the test.

[0077] In step S3200, the N transformers are started.

[0078] In some examples, the N transformers can be started sequentially after the first power supply outputs the first voltage, so as to improve the stability of the input voltage of the transformer in the test.

[0079] In this step S3200, the test control device can send a control instruction to each of the N transformers in turn after controlling the first power supply to output the first voltage, so as to start the N transformers sequentially. Figure 1 For example, the test control device can start the first DC transformer after controlling the first DC power supply to output the first voltage, start the second DC transformer after the first DC transformer is started to output voltage, start the third DC transformer after the second DC transformer is started to output voltage, and so on, until the start of the N DC transformers is completed.

[0080] In some embodiments, the starting of the j th transformer in this step S3200 can comprise outputting a set control instruction to the j th transformer; wherein the control instruction comprises an instruction to set the output voltage of the i th transformer to the minimum output voltage of the j th transformer, j being an integer from 1 to N. In these embodiments, the transformer is set to output at the minimum output voltage, which can connect as many transformers as possible between the first power supply and the second power supply, thereby maximizing the effectiveness of the topology. Figure 1 As shown, the topology structure plays the maximum effectiveness.

[0081] Step S3300: controlling the second power supply to output the first current.

[0082] In some examples, the second power supply can be controlled to output the first current after the Nth transformer is started, so that the N transformers are outputted with the constant first current after all the N transformers are started. In this step S3300, the test control device can control the second power supply to output the constant first current, so as to improve the stability and accuracy of the test.

[0083] Step S3400: obtaining the parameter value of the test parameter of the transformer.

[0084] In some examples, the parameter value of the test parameter of the transformer can be obtained after the second power supply outputs the first current, so as to improve the accuracy of the test.

[0085] In this step S3400, the test parameter of the DC transformer includes, but is not limited to, conversion efficiency, high-voltage side voltage accuracy, low-voltage side voltage accuracy, low-voltage side current accuracy, phase shift angle, and switch tube temperature.

[0086] The conversion efficiency of the DC transformer refers to the ratio of the output power to the input power. The voltage accuracy refers to the ratio of the measured value to the actual value. The phase shift angle refers to the phase change angle. The switch tube (switching triode) has the function of completing the circuit breaking and switching, and is widely used in various switching circuits.

[0087] Step S3500: obtaining the aging test result of the corresponding transformer according to the parameter value of the test parameter of the transformer.

[0088] In this step S3500, the test control device can obtain the parameter value of each DC transformer corresponding to each test parameter, and obtain the aging test result of the DC transformer according to the parameter value of the test parameter of each DC transformer.

[0089] In this step S3500, obtaining the aging test result of the corresponding DC transformer according to the parameter value of the test parameter of the DC transformer can further include the following steps S2501-S2503:

[0090] Step S3501: calculating the parameter value of the test parameter corresponding to each DC transformer according to the first current value outputted by the second DC power supply.

[0091] The first current value is different in different working states. The working states include the charging state and the discharging state.

[0092] Step S3502: comparing the parameter value of the test parameter corresponding to each DC transformer with the preset parameter value corresponding to the DC transformer, and obtaining a comparison result.

[0093] The preset parameter values ​​are those when the DC transformer has not undergone aging tests.

[0094] Step S3503: Determine whether the DC transformer has aged based on the comparison results.

[0095] Specifically, if the test parameter value of the DC transformer is the same as the preset parameter value of the DC transformer, it is determined that the DC transformer has not aged; if the test parameter value of the DC transformer is different from the preset parameter value of the DC transformer, it is determined that the DC transformer has aged and should be stopped from use immediately.

[0096] Based on the above steps S3100 to S3500, it can be seen that, based on Figure 1 and Figure 2 The aging test circuit shown can be controlled by a test control device that communicates with the DC power supply and DC transformer of the aging test circuit via a bus. The device can then send control commands to the DC power supply and DC transformer to automatically complete the test and improve test efficiency.

[0097] See Figure 4 As shown, this application embodiment provides a test control device 4000, which is applied to an aging test circuit. The aging test circuit includes a first power supply, a second power supply, and N transformers to be tested. The N transformers are connected in series between the first power supply and the second power supply, such that the input voltage of the i-th transformer is equal to the sum of the input voltage of the (i-1)-th transformer and the output voltage of the (i-1)-th transformer. N is an integer greater than 1, and i is an integer from 2 to N. For example, this aging test circuit is... Figure 1 or Figure 2 The aging test circuit shown.

[0098] The device may include: a first power control module 4100, a transformer starting module 4200, a second power control module 4300, a data acquisition module 4400, and a test output module 4500.

[0099] The first power control module 4100 is used to control the first power supply to output the first voltage to the first transformer.

[0100] The transformer starting module 4200 is used to start N transformers.

[0101] The second power supply control module 4300 is used to control the second power supply to output the first current.

[0102] The data acquisition module 4400 is used to obtain the parameter values ​​of the transformer's test parameters.

[0103] The test output module 4500 is used to obtain the aging test results of the corresponding transformer based on the parameter values ​​of the transformer's test parameters.

[0104] See Figure 5 As shown in the illustration, this application also provides a test control device 5000, which may include a processor 5100 and a memory 5200. The test control device 5000 may be a portable computer, desktop computer, industrial control computer, etc. The processor 5100 may be a central processing unit (CPU), microprocessor (MCU), etc. The memory 5200 may include, for example, ROM (read-only memory), RAM (random access memory), or non-volatile memory such as a hard disk.

[0105] See Figure 6 As shown in the illustration, this application also provides an aging test system 6000, which may include a test control device 6100 and an aging test circuit 6200. The test control device 6100 can be connected to... Figure 4 The test control device 4000 shown has the same or similar structure and can also be used with... Figure 5 The test control device 5000 shown has the same or similar structure, and is not limited here. The aging test circuit 6200 is as follows... Figure 1 and Figure 2 As shown, it may include a first DC power supply, a second DC power supply, and N DC transformers.

[0106] This application also provides a chip that includes a processor packaged within a housing and multiple pins for connecting to external circuitry. The processor runs a computer program to implement the test control method described in any of the foregoing embodiments. The chip can employ any packaging structure to encapsulate the processor and other circuitry within the housing and introduce multiple pins; no limitation is made herein.

[0107] In this embodiment of the application, a computer storage medium is also provided, on which a computer program is stored, and when the computer program is executed by a processor, it implements the test control method as described in any of the foregoing embodiments.

[0108] This invention can be a system, method, and / or computer program product. A computer program product may include a computer-readable storage medium having computer-readable program instructions loaded thereon for causing a processor to implement various aspects of the invention.

[0109] Computer readable storage media can be tangible storage media which can retain and store instructions for use by an instruction execution device. Computer readable storage media can be, for example, but is not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of computer readable storage media include the following: a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), a static random access memory (SRAM), a portable compact disc read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanically encoded device such as punch-cards or raised structures in a groove having instructions recorded thereon, and any suitable combination of the foregoing. A computer readable storage medium, as used herein, is not to be construed as being transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission media (e.g., light pulses passing through a fiber-optic cable), or electrical signals transmitted through a wire.

[0110] Computer readable program instructions described herein can be downloaded to respective computing / processing devices from a computer readable storage medium or to an external computer or external storage device via a network, for example, the Internet, a local area network, a wide area network and / or a wireless network. The network can comprise copper transmission cables, optical transmission fibers, wireless transmission, routers, firewalls, switches, gateway computers and / or edge servers. A network adapter card or network interface in each computing / processing device receives computer readable program instructions from the network and forwards the computer readable program instructions for storage in a computer readable storage medium within the respective computing / processing device.

[0111] Computer readable program instructions for carrying out operations of the present application can be assembler instructions, instruction-set-architecture (ISA) instructions, machine instructions, machine dependent instructions, microcode, firmware instructions, state-setting data, or either source code or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer readable program instructions can execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or the connection can be made to an external computer (for example, through the Internet using an Internet Service Provider). In some embodiments, electronic circuitry including, for example, programmable logic circuitry, field-programmable gate array (FPGA), or programmable logic array (PLA) can execute the computer readable program instructions by utilizing state information of the computer readable program instructions to personalize the electronic circuitry, in order to perform aspects of the present application.

[0112] The computer readable program instructions can also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable apparatus or other device to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide processes for implementing the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0113] These computer readable program instructions can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions / acts specified in the flowchart and / or block diagram block or blocks. These computer readable program instructions can also be stored in a computer readable storage medium that can include random access memory (RAM), read only memory (ROM), electrically erasable programmable read only memory (EEPROM), flash memory or nonvolatile memory, or a suitable combination of the different types of computer readable storage media. The computer readable program instructions can also be downloaded to a computer, other programmable data processing apparatus, or other device from a computer readable storage medium or to an external computer or external storage device via a data signal that can be transmitted for example via a wired medium or a wireless medium such as the Internet or Wireless Application Protocol (WAP) signaling.

[0114] The computer readable program instructions can also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus or other device to produce a computer implemented process such that the instructions which execute on the computer, other programmable data processing apparatus, or other device implement the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0115] The computer readable program instructions can also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus or other device to produce a computer implemented process such that the instructions which execute on the computer, other programmable data processing apparatus, or other device implement the functions / acts specified in the flowchart and / or block diagram block or blocks.

[0116] Embodiments of the present application have been described above, and the description is intended to be illustrative, and not restrictive, of the disclosed embodiments. Many modifications and variations of the disclosed embodiments are possible in light of the above teachings. It is therefore to be understood that within the scope of the disclosed embodiments, modifications and variations of the disclosed embodiments can be practiced. It is also to be understood that the specific order or hierarchy of steps in the processes disclosed is an illustration of exemplary processes. Based upon the description and illustrations provided herein, those skilled in the art will understand that changes can be made to the order of steps in the processes and that many of the individual steps can be modified or eliminated. Additionally, the description and illustrations provided herein are not meant to limit the scope of the disclosed embodiments. The scope of the disclosed embodiments is limited only by the claims.

Claims

1. An aging test circuit, characterized in that, It includes a first power source, a second power source, and N transformers to be tested, where N is an integer greater than 1; Wherein, the positive and negative terminals of the first power supply are electrically connected to the corresponding positive and negative input terminals of the first transformer, respectively; the positive terminal of the second power supply is electrically connected to the positive input terminal of the Nth transformer, and the negative terminal of the second power supply is electrically connected to the negative output terminal of the Nth transformer. The positive output terminal of the transformer is electrically connected to the negative input terminal of the same transformer; The positive input terminal of the i-th transformer is electrically connected to the positive input terminal of the (i-1)-th transformer, and the negative input terminal of the i-th transformer is electrically connected to the negative output terminal of the (i-1)-th transformer, where i is an integer from 2 to N, such that the input voltage of the i-th transformer is equal to the sum of the input voltage of the (i-1)-th transformer and the output voltage of the (i-1)-th transformer. in, V Imax V is the maximum input voltage of the transformer. Omin V is the minimum output voltage of the transformer. O The first voltage is the output voltage of the first power supply.

2. The aging test circuit according to claim 1, characterized in that, The first power supply is a constant voltage power supply, and the second power supply is a constant current power supply.

3. The aging test circuit according to claim 1, characterized in that, The aging test circuit also includes a first circuit breaker and a second circuit breaker: The first circuit breaker is electrically connected between the first power source and the first transformer; the second circuit breaker is electrically connected between the second power source and the Nth transformer.

4. The aging test circuit according to any one of claims 1 to 3, characterized in that, The first power source is a converter electrically connected between the first transformer and the power grid, and the second power source is a converter electrically connected between the Nth transformer and the power grid.

5. A test control method, characterized in that, The method is applied to an aging test circuit, which includes a first power supply, a second power supply, and N transformers to be tested. The N transformers are connected in series between the first power supply and the second power supply, such that the input voltage of the i-th transformer is equal to the sum of the input voltage of the (i-1)-th transformer and the output voltage of the (i-1)-th transformer, where N is an integer greater than 1 and i is an integer from 2 to N. The method includes: Control the first power source to output the first voltage to the first transformer; Start N transformers; Control the second power supply to output the first current; Obtain the parameter values ​​of the test parameters of the transformer; Based on the parameter values ​​of the transformer's test parameters, obtain the aging test results of the corresponding transformer; in, V Imax V is the maximum input voltage of the transformer. Omin V is the minimum output voltage of the transformer. O The first voltage is the output voltage of the first power supply.

6. The method according to claim 5, characterized in that, Starting the j-th transformer includes: Output a set control command to the j-th transformer; where j is an integer from 1 to N, and the control command includes a command to set the output voltage of the i-th transformer to the minimum output voltage of the j-th transformer.

7. The method according to claim 5, characterized in that, The control of the first power source to output a first voltage to the first transformer includes: Control the first power source to output a constant first voltage to the first transformer; The control of the second power supply to output the first current includes: Control the second power supply to output a constant first current.

8. A test control device, characterized in that, This is applied to an aging test circuit, which includes a first power supply, a second power supply, and N transformers to be tested. The N transformers are connected in series between the first power supply and the second power supply. The series connection is such that the input voltage of the i-th transformer is equal to the sum of the input voltage of the (i-1)-th transformer and the output voltage of the (i-1)-th transformer, where N is an integer greater than 1 and i is an integer from 2 to N. The test control device includes: The first power supply control module is used to control the first power supply to output a first voltage to the first transformer; A transformer starting module, used to start N transformers; The second power supply control module is used to control the second power supply to output the first current. A data acquisition module is used to acquire the parameter values ​​of the test parameters of the transformer; and, The test output module is used to obtain the aging test results of the corresponding transformer based on the parameter values ​​of the test parameters of the transformer. in, V Imax V is the maximum input voltage of the transformer. Omin V is the minimum output voltage of the transformer. O The first voltage is the output voltage of the first power supply.

9. A test control device, characterized in that, It includes a memory and a processor, the memory storing a computer program for controlling the processor to operate in order to perform the test control method according to any one of claims 5-7.

10. A chip, characterized in that, The chip includes a housing, a processor encapsulated within the housing, and a plurality of pins extending from the housing for connection to external circuitry. The processor is used to run a computer program to implement the test control method as described in any one of claims 5 to 7.

11. A computer storage medium, characterized in that, The computer storage medium stores a computer program, which, when executed by a processor, implements the test control method as described in any one of claims 5 to 7.

12. An aging test system, characterized in that, It includes the test control device as described in claim 8 or 9, and the aging test circuit as described in any one of claims 1 to 4.

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