Method and apparatus for detecting product quality detection device, and electronic device

Abstract

The application discloses a product quality detection device detection method, device and electronic equipment. First image data of a first product is acquired by a first imaging unit, wherein the first product is processed by a first process node in a production device, and the first imaging unit corresponds to the first process node; a first detection result of the first product is generated according to the first image data and first detection information corresponding to the first process node, wherein the first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item; and the first detection result is sent to the production device, so that the production device discharges the first product from a production line in the case that the first detection result includes defects of the first product. In the foregoing manner, the occurrence of judgment errors can be reduced, the detection accuracy of the product is improved, and the flow of products with defects out of the factory is reduced.

Description

[0001] This application is a divisional application based on the invention patent application with application number 202410179632.2, application date February 18, 2024, applicant CATL, entitled "Detection method, device and electronic equipment for product quality testing equipment". Technical Field

[0002] This application relates to the field of visual inspection, and in particular to a method, apparatus and electronic equipment for product quality inspection. Background Technology

[0003] With the development of modern manufacturing, the manufacturing industry is moving towards intelligence and automation. In the process of production equipment operation, less and less human intervention is needed. In order to reduce the occurrence of product defects, quality inspection is usually required to reduce the number of defective products leaving the factory.

[0004] Currently, production quality inspection equipment is often used to visually inspect products before they leave the factory. However, due to differences in the technological level of different production equipment or changes in the specifications of the products, errors in judgment are very likely to occur during the operation of production quality inspection equipment. This results in insufficient accuracy in product quality inspection and easily leads to defective products leaving the factory. Summary of the Invention

[0005] This application provides a testing method, apparatus, and electronic equipment for product quality testing, which can reduce the occurrence of judgment errors, improve the testing accuracy of products, and help reduce the outflow of defective products from the factory.

[0006] In a first aspect, embodiments of this application provide a testing method for a product quality testing device, applied to the product quality testing device, the method comprising:

[0007] First image data of the first product is acquired through the first imaging unit, wherein the first product is obtained by processing the first process node in the production equipment, and the first imaging unit corresponds to the first process node;

[0008] Based on the first image data and the first detection information corresponding to the first process node, a first detection result of the first product is generated, wherein the first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item;

[0009] Send the first inspection result to the production equipment so that if the first inspection result includes the presence of a defect in the first product, the production equipment will remove the first product from the production line.

[0010] Based on this, during the product manufacturing process, the processing portion of the product at each process node in the production equipment can be inspected to determine whether there are defects in the processing portion of the product at each process node, which helps improve the inspection accuracy of the product. Taking the first process node as an example, the first image data of the first product is acquired through the first imaging unit. Next, based on the first inspection information corresponding to the first process node, the first inspection result of the first product is generated. Then, the first inspection result can be sent to the production equipment. If the first inspection result indicates that the first product has defects, the production equipment can promptly remove the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment besides the first process node. This helps reduce the occurrence of defective products in the finished product and reduces the outflow of defective products from the factory.

[0011] In some possible implementations of the first aspect, the first inspection item is used to indicate a first inspection portion in the first product, and the first inspection result includes whether the first inspection portion indicated by each first inspection item has a defect;

[0012] Based on the first image data and the first detection information corresponding to the first process node, a first detection result for the first product is generated, including:

[0013] Based on the first image data, the first collected data of the first product is determined, wherein the first collected data includes the collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one with the first detection item;

[0014] Based on the preset parameter range and the first collected data corresponding to each first detection item, determine whether there is a defect in the first detection part corresponding to each first detection item;

[0015] If there is a defect in the first inspection part corresponding to the first inspection item, the first inspection item is associated with a defect identifier to obtain the first inspection result of the first product, wherein the defect identifier is used to indicate that there is a defect in the first inspection part.

[0016] In some possible implementations of the first aspect, if the collected value of the first product parameter corresponding to the first test item does not match the preset parameter range corresponding to the first test item, it is determined that the first test part corresponding to the first test item has a defect.

[0017] In some possible implementations of the first aspect, acquiring first image data of the first product via the first imaging unit includes:

[0018] Obtain the parameter information set corresponding to the production equipment, wherein the parameter information set includes the working parameters of the first imaging unit;

[0019] Based on the node identifier of the first process node, the working parameters of the first imaging unit are obtained from the parameter information set, and the first imaging unit is configured according to the working parameters of the first imaging unit.

[0020] The first product is captured by the configured first imaging unit to obtain the first image data.

[0021] According to embodiments of this application, by providing a set of parameter information to the product quality inspection equipment, the equipment can configure the operating parameters of the imaging unit in conjunction with specific process nodes. Since the imaging unit itself requires adjustment of numerous operating parameters, and the operating parameters required for quality inspection differ between different imaging units, providing effective operating parameters to the vision inspection system helps to effectively manage the operating status of the imaging unit and reduce the risk of missed or incorrect inspections of defective products due to parameter changes or inactivated functions.

[0022] In some possible implementations of the first aspect, before capturing the first product through the configured first imaging unit to obtain the first image data, the method further includes:

[0023] The second product is captured by the configured first imaging unit to obtain second image data. The second product includes at least one second detection part, and the second detection part includes a first preset defect. Each first preset defect corresponds to a second detection item.

[0024] Based on the second image data, the second acquisition data of the second product is determined, wherein the second acquisition data includes the acquisition value of at least one second product parameter of the second product, and the second product parameter corresponds one-to-one with the second detection item;

[0025] Based on the preset parameter range and the second product parameter set corresponding to each second inspection item, determine whether there is a defect in each second inspection part, and obtain the second inspection result of the second product;

[0026] If the second detection result does not match the defect information of each second detection part, including the first preset defect, the first imaging unit is controlled to stop operating.

[0027] Based on this, after the operating parameters of the imaging unit are configured and before large-scale mass production, a second product with preset defects is provided to the first imaging unit. This allows the first imaging unit to acquire second image data, and the first data processing unit then verifies whether the second image data contains defects. This not only verifies the correctness of the operating parameters of the first imaging unit but also verifies the configuration information of the image recognition algorithm and defect judgment logic in the first data processing unit, thereby improving the reliability and accuracy of the imaging unit's acquisition of product data and its determination of product defects.

[0028] Among the possible implementations of the first aspect, the method also includes:

[0029] When the second detection result matches the defect information of each second detection part including the first preset defect, the first product is captured by the configured first imaging unit to obtain the first image data.

[0030] Based on this, the configuration information such as the image recognition algorithm and defect judgment logic in the first data processing unit can be verified to improve the reliability and accuracy of the imaging unit in collecting product data and judging whether the product has defects.

[0031] In some possible implementations of the first aspect, after configuring the first imaging unit according to its operating parameters, the method further includes:

[0032] Send the operating parameters of the first imaging unit to the first monitoring device of the product quality testing equipment.

[0033] Based on this, by uploading the operating parameters of the first imaging unit to the first monitoring device in real time, the first monitoring device can control the operating parameters of the first imaging unit, thereby reducing the risk of missing defective products due to parameter changes or function failure.

[0034] In some possible implementations of the first aspect, after associating the first inspection item with a defect identifier to obtain the first inspection result of the first product, when a defect exists in the first inspection part corresponding to the first inspection item, the method further includes:

[0035] Send the first collected data and the first detection result to the production execution equipment;

[0036] Receive the third test result of the first product sent by the production execution equipment;

[0037] If the third inspection result of the first product is that the first product is defect-free, a first control message is sent to the production equipment so that the production equipment responds to the first control message and moves the first product to the second process node, wherein the second process node is the downstream process node of the first process node.

[0038] Based on this, the product quality inspection equipment sends the first inspection result and the first collected data to the production execution equipment, enabling the production execution equipment to obtain the re-inspection result of the first product. Especially when the first product is confirmed to be defect-free, the equipment can control the production equipment to transfer the first product to the second process node so that the second product can continue to be processed. Thus, products with incorrect inspection results can also be returned to the production line for further processing, reducing product waste and saving production costs. Moreover, the first product that has not been confirmed to be defect-free will not be returned to the production line, effectively reducing process waste and lowering the production risk of defective products.

[0039] In some possible implementations of the first aspect, after generating the first inspection result of the first product based on the first inspection information corresponding to the first process node, the method further includes:

[0040] Send the first collected data and the first detection result to the server so that the server can store the first detection result of the first product at the first process node.

[0041] Based on this, by storing the first collected data and the first detection result of the first product in a preset server, the storage duration of the first collected data and the first detection result can be easily adjusted to meet traceability requirements and reduce the occurrence of missed detections without traceable image data or detection results. Furthermore, the image data of product defects in the preset storage can also be used to optimize the algorithm model in the imaging unit and to expand the verification image library of the imaging unit.

[0042] In some possible implementations of the first aspect, after generating the first inspection result of the first product based on the first inspection information corresponding to the first process node, the method further includes:

[0043] Obtain the first detection results corresponding to the multiple first products processed at the first process node within a preset time period;

[0044] Based on multiple first detection results, determine the product defect rate corresponding to the first process node within the preset time period;

[0045] If the product defect rate exceeds a preset defect threshold, the acquisition of image data of the first product is stopped, and a second control message is sent to the production equipment so that the production equipment stops operating in response to the second control message.

[0046] Based on this, production quality inspection equipment can statistically analyze product defect rates, which is beneficial for timely reflection when problems occur at any stage of product quality inspection, controlling the shutdown of the problematic stage, controlling the quantity of defective products produced, and reducing the risk of defective products leaving the factory.

[0047] In some possible implementations of the first aspect, after generating the first inspection result of the first product based on the first inspection information corresponding to the first process node, the method further includes:

[0048] The first product is provided to the second monitoring device of the product quality testing equipment, so that the second monitoring device generates a fourth test result for the first product;

[0049] If the fourth detection result of the first product is inconsistent with the first detection result, the third control information sent by the second monitoring device is received, wherein the fourth detection result is detected by the second monitoring device;

[0050] In response to the third control information, the first imaging unit is controlled to stop acquiring image data.

[0051] Based on this, by randomly selecting process nodes in the production equipment, product inspection and corresponding imaging units of the process nodes are carried out. When a problem is detected in any process node or any link of the product quality inspection equipment, it can be reflected in time and the operation of the problematic link can be stopped. This is conducive to controlling the number of defective products produced and reducing the risk of defective products flowing out.

[0052] In some possible implementations of the first aspect, the production equipment includes multiple process nodes, and the product quality inspection equipment includes an imaging unit corresponding to each process node.

[0053] Before acquiring the first image data of the first product, the method also includes:

[0054] Obtain the Measurement System Analysis (MSA) guidance document set, which includes the MSA guidance document corresponding to each process node in the production equipment;

[0055] Based on the instructions in the MSA guidance document corresponding to each process node, determine the output channel of the processed product corresponding to each process node, the detection information corresponding to each process node, and the data output type of the detection results corresponding to the process node. The data output type is either measurement type or count type.

[0056] Image data collected by multiple imaging units from a test sample set is acquired. The test sample set includes multiple test samples, each test sample includes at least one third test item, and the multiple test samples include a first preset number of good products and a second preset number of defective products.

[0057] For each process node, based on the image data collected by the imaging unit, the detection result of each third detection item in each test sample is generated;

[0058] The accuracy of the product quality testing equipment is determined based on the test results of each third test item in each test sample and the reference results of each third test item in each test sample.

[0059] According to the embodiments of this application, since a guidance document based on MSA is generated for the product quality testing equipment, the product quality testing equipment can combine the MSA guidance document with a preset self-inspection cycle to test itself, thereby improving the reliability of the product quality testing equipment in practical applications.

[0060] Secondly, embodiments of this application provide a testing apparatus for a product quality testing device, the apparatus comprising:

[0061] The first imaging unit is used to acquire the first image data of the first product, wherein the first product is obtained by processing the first process node in the production equipment, and the first imaging unit is connected to the first process node.

[0062] The data processing unit is used to generate a first inspection result of the first product based on the first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item;

[0063] The sending unit is used to send a first inspection result to the production equipment so that if the first inspection result includes the presence of a defect in the first product, the production equipment will discharge the first product from the production line.

[0064] Based on this, during the product manufacturing process, the processing portion of the product at each process node in the production equipment can be inspected to determine whether there are defects in the processing portion of the product at each process node, which helps improve the inspection accuracy of the product. Taking the first process node as an example, the first image data of the first product is acquired through the first imaging unit. Next, based on the first inspection information corresponding to the first process node, the first inspection result of the first product is generated. Then, the first inspection result can be sent to the production equipment. If the first inspection result indicates that the first product has defects, the production equipment can promptly remove the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment besides the first process node. This helps reduce the occurrence of defective products in the finished product and reduces the outflow of defective products from the factory.

[0065] Thirdly, embodiments of this application provide an electronic device, including a processor, a memory, and a program or instructions stored in the memory and executable on the processor. When the program or instructions are executed by the processor, they implement the steps of the detection method of the product quality testing device as described in the first aspect or any implementable method of the first aspect.

[0066] Fourthly, embodiments of this application provide a readable storage medium storing a program or instructions, which, when executed by a processor, implement the steps of the detection method of the product quality testing equipment as described in the first aspect or any implementable embodiment of the first aspect.

[0067] Fifthly, embodiments of this application provide a computer program product, wherein instructions in the computer program product, when executed by a processor of an electronic device, cause the electronic device to perform the steps of the detection method of the product quality inspection device as described in the first aspect or any implementable embodiment of the first aspect.

[0068] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, specific embodiments of this application are given below. Attached Figure Description

[0069] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of the embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this application. In the drawings:

[0070] Figure 1 This is a schematic flowchart of a testing method for a product quality testing device provided in an embodiment of this application;

[0071] Figure 2 This is a schematic flowchart of a testing method for another product quality testing equipment provided in an embodiment of this application;

[0072] Figure 3 This is a schematic diagram of the structure of a testing device for a product quality testing equipment provided in an embodiment of this application;

[0073] Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0074] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0075] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used in the description of this application is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms "comprising" and "having" and any variations thereof in the description, claims and foregoing drawings of this application are intended to cover non-exclusive inclusion.

[0076] The terms "first," "second," etc., used in the specification, claims, or accompanying drawings of this application are used to distinguish different objects, not to describe a specific order or hierarchy. In the description of the embodiments of this application, "a plurality of" means two or more, unless otherwise explicitly specified.

[0077] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of this application. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0078] With the development of modern manufacturing, the manufacturing industry is moving towards intelligence and automation. In the process of production equipment operation, less and less human intervention is needed. In order to reduce the occurrence of product defects, quality inspection is usually required to reduce the number of defective products leaving the factory.

[0079] Currently, production quality inspection equipment is often used to visually inspect products before they leave the factory. However, due to differences in the technological level of different production equipment or changes in the specifications of the products, errors in judgment are very likely to occur during the operation of production quality inspection equipment. This results in insufficient accuracy in product quality inspection and easily leads to defective products leaving the factory.

[0080] In related technologies, to improve the accuracy of product quality inspection, manual inspection is often used to test each product individually or by sampling before it leaves the factory. However, as the quality requirements of the product manufacturing process become increasingly stringent and the product structure becomes increasingly sophisticated, manual inspection not only places a great deal of work pressure on the inspectors, but may also lead to problems such as incomplete inspection and low work efficiency, resulting in high labor costs.

[0081] Based on the above considerations, in order to reduce the occurrence of judgment errors, improve the accuracy of product inspection, and help reduce the outflow of defective products from the factory, this application provides a detection method, apparatus, and electronic device for product quality inspection equipment. Specifically, the production quality inspection equipment acquires first image data of a first product through a first imaging unit, wherein the first product is processed by a first process node in the production equipment; based on the first image data and the first detection information corresponding to the first process node, a first detection result of the first product is generated, wherein the first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item; the first detection result is sent to the production equipment so that if the first detection result indicates that the first product is defective, the production equipment will discharge the first product from the production line.

[0082] Based on this, during the production process, if the first inspection result indicates that the first product is defective, the production equipment can promptly remove the first product from the production line. This reduces the risk of defective products being further processed by other process nodes in the production equipment besides the first process node, which helps to reduce the occurrence of defective products in the finished products and reduce the outflow of defective products from the factory.

[0083] The technical solutions described in the embodiments of this application are applicable to the production and manufacturing of products such as batteries and vehicles based on physical manufacturing processes.

[0084] The following will describe in detail the testing methods, apparatus, and electronic equipment of the product quality testing equipment provided in the embodiments of this application, with reference to the accompanying drawings.

[0085] Figure 1 This is a schematic flowchart of a testing method for a product quality testing equipment provided in this application embodiment. The testing method for the product quality testing equipment can be applied to product quality testing equipment, combined with... Figure 1 As shown, the testing method of the product quality testing equipment includes steps 101 to 103.

[0086] Step 101: Acquire first image data of the first product through the first imaging unit, wherein the first product is obtained by processing the first process node in the production equipment, and the first imaging unit corresponds to the first process node;

[0087] Step 102: Generate a first detection result for the first product based on the first image data and the first detection information corresponding to the first process node, wherein the first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item;

[0088] Step 103: Send the first inspection result to the production equipment so that if the first inspection result includes the presence of a defect in the first product, the production equipment will remove the first product from the production line.

[0089] The above steps will be described below with reference to specific embodiments.

[0090] Firstly, regarding step 101 above, the production equipment may include multiple process nodes, and the first process node can be any one of the process nodes in the production equipment. The product quality inspection equipment may include imaging units corresponding to each process node.

[0091] For example, production equipment can be used to manufacture industrial products. One example is electrode manufacturing equipment, which produces electrodes by separately mixing positive and negative electrode materials, followed by coating, rolling, and electrode slitting. Another example is electrode assembly manufacturing equipment, which aligns, winds, or stacks electrodes and separators to obtain battery cells. These cells are then encapsulated and injected with electrolyte to produce electrode assemblies. Specific examples of production equipment and the industrial products it produces are not listed here.

[0092] The production equipment may include one or more process nodes, where "multiple" means two or more. For example, the number of process nodes may be multiple. Taking electrode assembly fabrication equipment as an example, multiple process nodes may include processes such as winding, stacking, welding, drying, liquid injection, sealing, etc. It is understood that the process nodes listed above are merely examples and not intended as specific process limitations for processing electrode assemblies.

[0093] In some embodiments, the number of imaging units in the detection method of the product quality inspection equipment can be one or more. Optionally, the imaging units are configured to correspond one-to-one with process nodes, thus the number of imaging units can be determined in conjunction with the number of process nodes. The product quality inspection equipment may also include a data processing unit, which analyzes the image data acquired by the imaging units to generate inspection results for the products produced at each process node. The data processing unit may be, but is not limited to, a processor or similar device with data processing capabilities.

[0094] The first product is obtained by processing at the first process node in the production equipment. Based on this, the first imaging unit can acquire images of the first product to obtain first image data. Optionally, the first image data may include one or more images. The image type may be an RGB image, a grayscale image, an infrared image, a line scan image, etc. The type of image is not limited here.

[0095] Next, in step 102 above, a first detection result of the first product is generated based on the first image data and the first detection information corresponding to the first process node. The first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item.

[0096] Optionally, the product quality inspection equipment can pre-store a dataset of inspection information, which may include the inspection items corresponding to each process node and the preset parameter ranges corresponding to the inspection items.

[0097] For example, the processed product at each process node may include one or more inspection items. For instance, at the process node for aligning the positive and negative electrodes, the inspection items may include preset inspection items such as the spacing between the tabs, the height of the tabs, and the presence of wrinkles between the positive and negative electrodes and the separator. Correspondingly, the preset parameter ranges are preset tab spacing range, preset tab height range, presence of wrinkles, etc. The inspection items corresponding to each process node are not listed here.

[0098] In some embodiments, the product quality inspection equipment may include image recognition algorithms, verification logic, etc., configured for each process node. Each imaging unit in the quality inspection equipment may include an industrial camera with high image stability, high transmission capability, and strong anti-interference capability. Specifically, for example, a camera based on a charge-coupled device (CCD) or complementary metal-oxide-semiconductor (CMOS) chip may be used.

[0099] As a specific embodiment, the first imaging unit corresponds to the first process node. Before the first product, processed by the first process node, enters the next process node, the first imaging unit can acquire the first image data of the first product.

[0100] For a first product obtained by processing a first process node in a production equipment, the product quality inspection equipment can find the first inspection information in the dataset of inspection information based on the node identifier of the first process node. The first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item.

[0101] Based on this, the product quality inspection equipment can identify relevant information about the first product in the first image data, and analyze whether the first product has defects by combining each first inspection item and the preset parameter range corresponding to each first inspection item. After the first imaging unit completes the inspection of each first inspection item of the first product, the first inspection result of the first product can be obtained, which may include the inspection result corresponding to each first inspection item.

[0102] The detection result for each first detection item can be: the detection part corresponding to the first detection item has a defect; or the detection part corresponding to the first detection item has no missing items; or, if the imaging unit has not acquired the image data of the detection part corresponding to the first detection item and cannot detect the detection part corresponding to the first detection item, the detection result for the detection part corresponding to the first detection item is empty. Optionally, if the detection part corresponding to the first detection item cannot be detected, it can be assumed by default that the detection part corresponding to the first detection item has a defect, in order to reduce the transmission of data in case of missed detections.

[0103] Next, in step 103, after the product quality inspection equipment obtains the first inspection result of the first product, it can send the first inspection result to the production equipment. This allows the production equipment to determine whether the first product has a defect upon receiving the first inspection result. It can be understood that if any of the first inspection items has a defect in its corresponding inspection section, it indicates that the first product is defective. Furthermore, to reduce the risk of defective products being continuously processed on the production line, if the inspection result of the inspection section corresponding to the first inspection item is empty, the production equipment can remove the first product from the production line, thereby reducing the risk of missed defective product inspections.

[0104] According to an embodiment of this application, the first imaging unit corresponds to a first process node. The first imaging unit acquires first image data of the first product after processing at the first process node and generates a first detection result for the first product based on the target detection information corresponding to the first process node. Based on this, during product manufacturing, the processed portion of the product at each process node can be inspected to determine whether defects exist in that portion, thus improving the inspection accuracy. If defects exist in the processed portion of the product at a process node, the product can be promptly removed from the production line, reducing the risk of defective products being further processed by other process nodes on the production equipment. This helps reduce the number of defective products in the finished product and the outflow of defective products from the factory. Simultaneously, since the imaging unit can inspect the processed portion of the product at each process node, the detection accuracy of visual inspection can be effectively improved, reducing manual inspection and lowering labor costs.

[0105] In some embodiments of this application, step 101 described above is still involved, in which the first image data of the first product is acquired through the first imaging unit. Further details can be found in the following steps:

[0106] Obtain the parameter information set corresponding to the production equipment, wherein the parameter information set includes the working parameters of the first imaging unit;

[0107] Based on the node identifier of the first process node, the working parameters of the first imaging unit are obtained from the parameter information set, and the first imaging unit is configured according to the working parameters of the first imaging unit.

[0108] The first product is captured by the configured first imaging unit to obtain the first image data.

[0109] Specifically, the parameter information set corresponding to the production equipment can include the operating parameters of the imaging unit corresponding to each process node. This parameter information set can be pre-stored in the product quality inspection equipment.

[0110] For the first process node, the product quality inspection equipment can obtain the operating parameters of the first imaging unit from the parameter information set based on the node identifier of the first process node, and configure the first imaging unit according to the operating parameters of the first imaging unit, so that the first imaging unit can collect the first image data of the first product processed by the first process node based on the operating parameters. Among them, the operating parameters of the first imaging unit include, for example, camera parameters, function activation parameters, etc., which will not be listed one by one here.

[0111] For example, there are different production bases, different production equipment within those bases, and each piece of equipment produces different product models. Based on this, staff can analyze the testing requirements of each production base and each piece of equipment for different product models to generate a set of parameter information for the generated equipment.

[0112] After configuring the first imaging unit according to its operating parameters, the first product can be photographed using the configured first imaging unit to obtain the first image data.

[0113] According to embodiments of this application, by providing a set of parameter information to the product quality inspection equipment, the equipment can configure the operating parameters of the imaging unit in conjunction with specific process nodes. Since the imaging unit itself requires adjustment of numerous operating parameters, and the operating parameters required for quality inspection of different imaging units vary, providing effective operating parameters to the production quality inspection equipment helps to effectively manage the operating status of the imaging unit and reduce the risk of missed or incorrect inspections of defective products due to parameter changes or inactivated functions.

[0114] Optionally, after configuring the first imaging unit according to the operating parameters of the first imaging unit, the method further includes: sending the operating parameters of the first imaging unit to the first monitoring device of the product quality inspection equipment.

[0115] By uploading the operating parameters of the first imaging unit to the first monitoring device in real time, the first monitoring device can control the operating parameters of the first imaging unit, thereby reducing the risk of missing defective products due to parameter changes or inactive functions.

[0116] In some embodiments, before capturing the first product through the configured first imaging unit to obtain the first image data, the method further includes:

[0117] The second product is captured by the configured first imaging unit to obtain second image data. The second product includes at least one second detection part, and the second detection part includes a first preset defect. Each first preset defect corresponds to a second detection item.

[0118] Based on the second image data, the second acquisition data of the second product is determined, wherein the second acquisition data includes the acquisition value of at least one second product parameter of the second product, and the second product parameter corresponds one-to-one with the second detection item;

[0119] Based on the preset parameter range and the second product parameter set corresponding to each second inspection item, determine whether there is a defect in each second inspection part, and obtain the second inspection result of the second product;

[0120] If the second detection result does not match the defect information of each second detection part, including the first preset defect, the first imaging unit is controlled to stop operating.

[0121] Specifically, after the working parameters of the first imaging unit in the first imaging unit are configured, and before it is officially put into use, a second product can be provided to the first imaging unit so that the first imaging unit can collect the second image data of the second product based on the working parameters.

[0122] The second product includes preset defects, each of which corresponds to a second detection item. Optionally, the second detection item may be consistent with the first detection item, or partially consistent with the first detection item. Optionally, based on the preset defects of the second product, the validity of the computational logic in the first data processing unit can be determined. Furthermore, the failure of the light source system and grayscale algorithm can be determined using film. Additionally, the failure of key defect identification in the product quality inspection equipment can also be determined using the second product.

[0123] The product quality inspection equipment determines the second acquisition data of the second product based on the second image data. The second acquisition data includes the acquisition value of at least one second product parameter of the second product, and the second product parameter corresponds one-to-one with the second inspection item. Next, the preset parameter range and the second product parameter set corresponding to each second inspection item determine whether there is a defect in each second inspection part, and obtain the second inspection result of the second product. If the second inspection result does not match the defect information of each second inspection part including the preset defect, the equipment controls the first imaging unit to stop operating.

[0124] It is understandable that, when the second detection result matches the defect information of each second detection part including the first preset defect, the first product is captured by the configured first imaging unit to obtain the first image data.

[0125] According to an embodiment of this application, after the operating parameters of the imaging unit are configured and before large-scale mass production, a second product with preset defects is provided to the first imaging unit, enabling the first imaging unit to acquire second image data. The first data processing unit then verifies whether the second image data contains defects. Based on this, not only can the correctness of the operating parameters of the first imaging unit be verified, but also the configuration information such as the image recognition algorithm and defect judgment logic in the first data processing unit can be verified, thereby improving the reliability and accuracy of the imaging unit in acquiring product data and determining whether the product contains defects.

[0126] In some embodiments of this application, a first detection item is used to indicate a first detection portion in a first product, and a first detection result includes whether the first detection portion indicated by each first detection item has a defect;

[0127] Continuing with step 102 above, the first test result of the first product is generated based on the first test information corresponding to the first process node. For details, please refer to steps 201 to 203.

[0128] Step 201: Based on the first image data, determine the first collected data of the first product, wherein the first collected data includes the collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one with the first detection item;

[0129] Step 202: Based on the preset parameter range corresponding to each first detection item and the first collected data, determine whether there is a defect in the first detection part corresponding to each first detection item;

[0130] Step 203: If there is a defect in the first inspection part corresponding to the first inspection item, associate the first inspection item with a defect identifier to obtain the first inspection result of the first product, wherein the defect identifier is used to indicate that there is a defect in the first inspection part.

[0131] Specifically, the product quality inspection equipment may include a data processing unit, which can analyze the image data acquired by the imaging unit. For each product processed at each process node, the data processing unit can be pre-configured with corresponding image recognition algorithms and verification logic. It is understood that products processed at different process nodes are different, and the computational logic used in the imaging unit corresponding to each process node may differ. Optionally, the computational logic used in the imaging unit corresponding to each process node can be determined in conjunction with the specific process node corresponding to the imaging unit.

[0132] As a specific example, for a first product processed by a first process node, the first image data can be analyzed to determine the first acquired data of the first product. The first acquired data includes the acquired value of at least one first product parameter, and each first product parameter corresponds one-to-one with a first detection item. For example, continuing with the process node where the positive and negative electrodes are aligned, the acquired values ​​of the first product parameters are the spacing between the tabs, the tab height, and whether wrinkles exist between the positive and negative electrodes and the separator. Optionally, if wrinkles exist between the positive and negative electrodes, the acquired value can be 1; if no wrinkles exist, the acquired value can be 0.

[0133] After obtaining the first collection data of the first product, it is possible to determine whether there is a defect in the first inspection part corresponding to each first inspection item based on the preset parameter range corresponding to each first inspection item in the first inspection information. If there is a defect in the first inspection part, the first inspection item is associated with a defect identifier, thereby producing the first inspection result of the first product.

[0134] For example, a defect identifier is used to indicate that there is a defect in the first inspection part. That is, there is a one-to-one correspondence between the defect identifier and the first inspection item, and different first inspection items correspond to different defect identifiers in the first inspection parts.

[0135] If a defect is detected in the first detection part, the first detection item is associated with the defect identifier of the first detection part corresponding to the first detection item.

[0136] Based on this, after the production equipment receives the first inspection result of the first product, it can directly detect whether the first inspection result includes a defect mark, and if the first inspection result includes a defect mark, the first product is discharged from the production line.

[0137] According to the embodiments of this application, when a defect is detected in the first detection part corresponding to the first detection item, by establishing a defect identifier associated with the first detection item, the production equipment can easily identify whether the first product needs to be discharged from the production line after receiving the first detection result, thereby improving the reliability of screening out defective products.

[0138] Specifically, if the collected value of the first product parameter corresponding to the first test item does not match the preset parameter range corresponding to the first test item, it is determined that there is a defect in the first test part corresponding to the first test item.

[0139] Continuing with the example of the alignment process for positive and negative electrodes, the first inspection item can be the tab spacing, with a preset parameter range of a preset tab spacing range. If the spacing between the tabs is within the preset tab spacing range, then the first inspection portion corresponding to the first inspection item has no defects; if the spacing between the tabs is not within the preset tab spacing range, then the first inspection portion corresponding to the first inspection item has defects. The first inspection item can also be the tab height, with a preset parameter range of a preset tab height range. If the tab height is within the preset tab height range, then the first inspection portion corresponding to the first inspection item has no defects; if the tab height is not within the preset tab height range, then the first inspection portion corresponding to the first inspection item has no defects. The inspection items for each process node are not listed here individually.

[0140] According to the embodiments of this application, each first detection item can be quickly and accurately identified, and it can be determined whether the first product has defects.

[0141] In some embodiments, the production equipment may also discharge the first product from the production line if it does not receive the first test result of the first product within a preset time range, wherein the preset time range is determined according to the processing speed of the first process node.

[0142] For example, each imaging unit can communicate with the production equipment. The communication method between the imaging unit and the production equipment can be wired or wireless, and there is no specific limitation here.

[0143] In the production equipment, the time consumed by each process node in processing one product can be estimated, thereby determining the average processing time for each process node. Correspondingly, the time interval at which each imaging unit sends detection results to the production equipment can be consistent with the average processing time. In some embodiments, the longer the average processing time, the longer the time interval between the imaging unit sending detection results to the production equipment.

[0144] Optionally, the preset time range can be (t+a1, t+a2), where t is the average processing time for processing one product at a process node, and a1 and a2 are preset positive numbers, with a1 being less than a2.

[0145] Next, the embodiments of this application will be described in conjunction with the first imaging unit. Specifically, based on the communicable connection between the first imaging unit and the production equipment, the first imaging unit can send the first detection result of the first product to the production equipment. Taking the first process node as an example, the average time consumed in processing one first product at the first process node is 5 seconds. Based on this, the preset time range corresponding to the first imaging unit is (5+a1, 5+a2). If the production equipment does not receive the first detection result within the time range of (5+a1, 5+a2) after receiving the first detection result of the previous first product, the production equipment can directly discharge the first product from the production line.

[0146] According to the embodiments of this application, since the imaging unit and the production equipment follow a unified linkage standard, if the production equipment does not receive the detection result within a preset time range, it will discharge the first product from the production line by default, thereby reducing the risk of defective products flowing out due to reasons such as loss of communication signals.

[0147] In some embodiments of this application, the product quality inspection equipment can also be connected to the production execution equipment. The production execution equipment can record and track the operating data generated by the production equipment in real time, and can also control the operation of the production equipment. Optionally, the production execution equipment can be implemented based on a manufacturing execution system (MES).

[0148] Specifically, if there is a defect in the first inspection part corresponding to the first inspection item, after associating the first inspection item with a defect identifier and obtaining the first inspection result of the first product, the product quality inspection equipment can also: send the first collected data and the first inspection result to the production execution equipment; receive the third inspection result of the first product sent by the production execution equipment; if the third inspection result of the first product is that the first product is defect-free, send the first control information to the production equipment so that the production equipment responds to the first control information and moves the first product to the second process node, wherein the second process node is the downstream process node of the first process node.

[0149] For example, in some embodiments, if the first product is defective, after the production equipment removes the first product from the production line, other testing equipment can re-inspect the first product to obtain a third testing result. Optionally, the other testing equipment may refer to another imaging unit, testing equipment that requires manual operation, or manual visual inspection. There are no specific limitations on the specific method of obtaining the third testing result.

[0150] After receiving the third inspection result, if the third inspection result for the first product indicates that the first product is defect-free, the production execution equipment can send first control information to the production equipment. This causes the production equipment to respond to the first control information and move the first product to a second process node, where the second process node is a downstream process node of the first process node. It can be understood that the second process node is a process node following the first process node.

[0151] When the production equipment receives the first control information, it can move the first product to the second process node so that the second process node can continue to process the first product.

[0152] According to the embodiments of this application, the product quality inspection equipment sends a first inspection result and first collected data to the production execution equipment, enabling the production execution equipment to obtain the re-inspection result of the first product. In particular, if the first product is confirmed to be defect-free, the production equipment can control the production equipment to transfer the first product to the second process node so that the second product can continue to be processed. Thus, products with incorrect inspection results can also be returned to the production line for further processing, reducing product waste and saving production costs. Moreover, the first product that has not been confirmed to be defect-free will not be returned to the production line, effectively reducing process waste and lowering the production risk of defective products.

[0153] In some embodiments, after generating a first detection result for a first product based on the first detection information corresponding to a first process node, the method further includes: sending first collected data and the first detection result to a server so that the server stores the first detection result of the first product at the first process node.

[0154] For example, the product quality testing equipment can also directly communicate with the server and send the first collected data and the first test result of the first product to the preset server for storage.

[0155] Optionally, after receiving the first collected data and the first test result of the first product, the production execution equipment may store the first collected data and the first test result of the first product to the server.

[0156] Based on this, by storing the first collected data and the first detection result of the first product in a preset server, the storage duration of the first collected data and the first detection result can be easily adjusted to meet traceability requirements and reduce the occurrence of missed detections without traceable image data or detection results. Furthermore, the image data of product defects in the preset storage can also be used to optimize the algorithm model in the imaging unit and to expand the verification image library of the imaging unit.

[0157] In some embodiments, after generating a first inspection result for the first product based on the first inspection information corresponding to the first process node, the product quality inspection equipment may further perform the following steps:

[0158] The system acquires the first detection results corresponding to multiple first products processed at the first process node within a preset time period; based on the multiple first detection results, it determines the product defect rate corresponding to the first process node within the preset time period; if the product defect rate is greater than a preset defect threshold, it stops acquiring image data of the first product and sends second control information to the production equipment so that the production equipment stops operating in response to the second control information.

[0159] Specifically, the product quality inspection equipment can perform statistical analysis on the first inspection results within a preset time period. For example, for multiple consecutively received first inspection results, it can determine whether the product has a defect based on whether each first inspection result includes a defect identifier. Based on this, the production control unit can count the number of defective products within the preset time period, thereby obtaining the product defect rate corresponding to the first process node within the preset time period.

[0160] When the product defect rate exceeds the preset defect threshold, the image recognition and other algorithms configured in the product quality inspection equipment may malfunction due to logical errors, or there may be operational errors at the first process node. Logical errors can easily lead to unreliable inspection results for the first product, resulting in good products being misdiagnosed as defective. Operational errors at the first process node can easily cause defects in the first product, meaning that defective products are more likely to be produced.

[0161] To reduce misjudgments and the production quantity of defective products, the product quality inspection equipment can stop collecting image data of the first product and stop the operation of the first process node. This allows workers to inspect the first imaging unit and the first process node. Optionally, if an error occurs in the calculation logic, workers can optimize the calculation logic. For example, they can check whether the visual inspection has logical loopholes and whether it is compatible with different product processes and material fluctuations. If there is an operational error in the first process node, the process node can be debugged.

[0162] Optionally, the product quality inspection equipment can also acquire the defect identifier associated with the first inspection item in each first inspection result, thereby determining the defect rate of each first inspection item and providing the defect rate of each first inspection item to the staff, which helps to improve the efficiency of staff in inspecting production equipment or product quality inspection equipment.

[0163] According to the embodiments of this application, the production quality inspection equipment statistically analyzes the product defect rate, which is beneficial for timely reflection when problems occur at any stage of product quality inspection, controlling the shutdown of the problematic stage, controlling the quantity of defective products produced, and reducing the risk of defective products flowing out.

[0164] Meanwhile, as staff promptly inspect the operational logic within the imaging unit and adjust the logic specifications in a timely manner when logical loopholes are found, the operational logic in the production quality inspection equipment can be continuously optimized and updated.

[0165] In some embodiments, after generating the first inspection result of the first product based on the first inspection information corresponding to the first process node, the production quality inspection equipment may further perform the following steps:

[0166] The first product is provided to the second monitoring device of the product quality inspection equipment, so that the second monitoring device generates a fourth inspection result for the first product; if the fourth inspection result of the first product is inconsistent with the first inspection result, the third control information sent by the second monitoring device is received, wherein the fourth inspection result is detected by the second monitoring device; in response to the third control information, the first imaging unit is controlled to stop acquiring image data.

[0167] For example, the second monitoring device can refer to another imaging unit, a detection device that needs to be operated manually, or a manual visual inspection. There are no specific restrictions on the specific method of detection of the second monitoring device.

[0168] Product quality testing equipment can randomly determine a target process node from one or more process nodes included in the production equipment. When the target process node is the first node, the production quality testing equipment can provide the first product to the second monitoring equipment of the product quality testing equipment.

[0169] The second monitoring device can re-inspect the first product and generate a fourth inspection result. It is understood that the second monitoring device pre-stores a dataset of inspection information, which may include the inspection items corresponding to each process node and the preset parameter ranges for those items.

[0170] The second monitoring device can obtain the first detection information from the dataset of detection information, and determine the detection result of the first product, i.e., the fourth detection result, based on the first detection items included in the first detection information and the preset parameter range corresponding to each first detection item.

[0171] If the fourth test result of the first product is inconsistent with the first test result, the second monitoring device can send a third control message to the product quality testing device. Upon receiving the third control message from the second monitoring device, the product quality testing device can control the first imaging unit to stop acquiring image data in response to the third control message.

[0172] If the fourth inspection result of the first product is inconsistent with the first inspection result, it may be due to a flaw in the computational logic of the product quality inspection equipment. Errors in the computational logic can easily lead to unreliable inspection results for products processed at the first target process node, potentially causing good products to be misdiagnosed as defective. Alternatively, it could be due to an operational error at the first process node, which could easily result in defects in the products processed at the first target process node, i.e., the production of defective products.

[0173] According to the embodiments of this application, by randomly selecting process nodes in the production equipment, product inspection and the corresponding imaging unit of the process node are carried out for inspection. When a problem is detected in any link of the process node or product quality inspection equipment, it can be reflected in time and the operation of the problematic link can be stopped. This is beneficial to control the number of defective products produced and reduce the risk of defective products flowing out.

[0174] In some embodiments, the second monitoring device can also acquire the first N products processed by the production equipment after the production equipment is initialized, and perform detection on the N products according to the second preset detection parameters to generate N sixth detection results corresponding to the N products, where N is a positive integer; if the N sixth detection results include products with defects, the production equipment can be controlled to stop running.

[0175] Specifically, production equipment initialization refers to configuring the production parameters for each process node within the production equipment. Once the production parameters for each process node are configured, the initialization of the production equipment is complete.

[0176] After the production equipment is initialized but before it is put into operation, a second monitoring device can be used to inspect the first N products processed by the production equipment to determine whether the production equipment has been initialized normally. Optionally, in this embodiment, N is a positive integer, and the specific value of N is not limited.

[0177] If all N products show no defects according to the N sixth inspection results, production can continue. However, if N products are identified as defective based on the N sixth inspection results, the second monitoring device can stop the equipment. Next, a risk assessment of the production equipment is needed to reduce the risk of producing too many defective products.

[0178] According to the embodiments of this application, verifying whether the production equipment can produce normally before it is put into large-scale production helps to reduce the risk of producing too many defective products, thereby saving production costs.

[0179] In some embodiments of this application, in order to further improve the accuracy of product quality inspection, the product quality inspection device may also perform steps 301 to 306 before acquiring the first image data of the first product.

[0180] Step 301: Obtain the Measurement System Analysis (MSA) guidance document set, wherein the MSA guidance document set includes the MSA guidance document corresponding to each process node in the production equipment;

[0181] Step 302: Based on the instructions in the MSA guidance document corresponding to each process node, determine the output channel of the processed product corresponding to each process node, the detection information corresponding to each process node, and the data output type of the detection result corresponding to the process node. The data output type is either measurement type or count type.

[0182] Step 303: Acquire image data collected by multiple imaging units on the test sample set respectively. The test sample set includes multiple test samples, each test sample includes at least one third test item, and the multiple test samples include a first preset number of good products and a second preset number of defective products.

[0183] Step 304: For each process node, based on the image data acquired by the imaging unit, generate the detection result for each third detection item in each test sample;

[0184] Step 305: Determine the detection accuracy of the product quality testing equipment based on the detection results of each third detection item in each test sample and the reference results of each third detection item in each test sample.

[0185] For example, the MSA guidance document set includes the MSA guidance document corresponding to each process node in the production equipment.

[0186] Different production bases, different production equipment within production bases, and different process nodes within each production equipment—based on this, staff can analyze each production base and each production equipment, and generate corresponding Measurement Systems Analysis (MSA) guidance documents for each process node.

[0187] In the MSA guidance document, the instruction information corresponding to each process node in the MSA guidance document includes, for example, determining the equipment identifier of the production equipment, determining the processed product output channel corresponding to each process node in the production equipment, the detection information corresponding to each process node, and the data output type of the detection results corresponding to the process node.

[0188] Each process node can correspond to one or more output channels. Process nodes include, for example, pairing, ultrasonic, soft connection, and housing insertion nodes. The housing insertion process node may include output channels.

[0189] After the product quality testing equipment performs the above actions according to the instructions, a test sample can be provided to the product quality testing equipment, and the product quality testing equipment will test the test sample to determine whether the product quality testing equipment can perform the test normally.

[0190] The test samples provided to the product quality testing equipment may include a first preset number of good products and a second preset number of defective products, wherein...

[0191] The first preset number of good products can also include products with different good product grades. For example, 10 good products with the highest good product grade and 15 good products with the second best good product grade. The products with the highest good product grade are defect-free, while the products with the second best good product grade have defects, but the defects do not affect the classification of the products as good products.

[0192] The second preset number of defective products can also include products with different severity levels, for example, 10 defective products of the highest severity level and 15 defective products of the third severity level. The highest severity level corresponds to products with a large number of defects, and the defects are obvious. The second severity level corresponds to products with fewer defects, but the existing defects still classify the product as defective.

[0193] After acquiring image data in each imaging unit, the product quality inspection equipment can generate test results for each third test item in each sample based on the image data. The equipment can then combine and summarize the results for each third test item and compare them one-to-one with the reference results for each third test item in each sample to determine the accuracy of the test results and, based on this, establish the equipment's accuracy rate.

[0194] Understandably, if the detection accuracy of the product quality testing equipment is greater than the preset accuracy threshold, the product quality testing equipment can be used in actual product testing scenarios.

[0195] If the detection accuracy is less than or equal to the preset accuracy threshold, the product quality testing equipment needs to be readjusted. Only after the detection accuracy of the product quality testing equipment is greater than the preset accuracy threshold can it be put into actual product testing scenarios.

[0196] According to the embodiments of this application, since a guidance document based on MSA is generated for the product quality testing equipment, the product quality testing equipment can combine the MSA guidance document with a preset self-inspection cycle to test itself, thereby improving the reliability of the product quality testing equipment in practical applications.

[0197] To more clearly describe the embodiments of this application, Figure 2 This is a schematic flowchart of a testing method for another product quality testing equipment provided in this application embodiment, combined with... Figure 2 As shown, the testing method of the product quality testing equipment may include steps 401 to 412.

[0198] Step 401: Obtain the parameter information set corresponding to the production equipment;

[0199] Specifically, the parameter information set includes the operating parameters of the first process node, including the first imaging unit.

[0200] Step 402: Based on the node identifier of the first process node, obtain the working parameters of the first imaging unit from the parameter information set, and configure the first imaging unit according to the working parameters of the first imaging unit.

[0201] Step 403: The first imaging unit acquires the second image data of the second product based on the operating parameters;

[0202] The second product includes at least one second inspection part, and the second inspection part includes preset defects, wherein each preset defect corresponds to one second inspection item.

[0203] Step 404: Determine the second collected data of the second product based on the second image data;

[0204] Step 405: Based on the preset parameter range and the second product parameter set corresponding to each second inspection item, determine whether there is a defect in each second inspection part, and obtain the second inspection result of the second product;

[0205] Step 406: If the second detection result matches the defect information of each second detection part including the preset defect, the first imaging unit acquires the first image data of the first product after processing at the first process node.

[0206] Step 407: Determine the first collected data of the first product based on the first image data;

[0207] The first collected data includes the collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one with the first detection item;

[0208] Step 408: Based on the preset parameter range and first collected data corresponding to each first inspection item, determine whether there is a defect in the first inspection part corresponding to each first inspection item. If there is a defect in the first inspection part corresponding to the first inspection item, associate the first inspection item with a defect identifier to obtain the first inspection result of the first product.

[0209] The defect identifier is used to indicate that there is a defect in the first inspection section.

[0210] Step 409: Send the first test result to the production equipment;

[0211] Step 410: Send the first collected data and the first detection result to the production execution equipment;

[0212] Step 411: If the first inspection result indicates that the first product is defective, the production equipment will discharge the first product from the production line.

[0213] Optionally, if the production equipment does not receive the first test result of the first product within a preset time range, the first product will also be discharged from the production line.

[0214] Step 412: The production execution equipment receives the first test result of the first product at the first process node;

[0215] Step 413: The production execution equipment obtains the third inspection result of the first product, and if the third inspection result includes that the first product is free of defects, it sends the first control information to the production equipment.

[0216] Step 414: In response to the first control information, the production equipment moves the first product to the second process node so that the second process node can process the first product.

[0217] According to the embodiments of this application, the first imaging unit corresponds to the first process node. Based on this, during the product manufacturing process, the processed parts of the product at each process node can be inspected to determine whether there are defects in the processed parts of the product at each process node, which is beneficial to improving the inspection accuracy of the product. Taking the first process node as an example, after the first imaging unit obtains the first inspection result, it can send the first inspection result to the production equipment. If the first inspection result includes the presence of defects in the first product, the production equipment can promptly remove the first product from the production line, thereby reducing the risk of defective products continuing to be processed by other process nodes in the production equipment besides the first process node. This is beneficial to reducing the occurrence of defective products in the finished product and reducing the outflow of defective products from the factory. At the same time, since the imaging unit can inspect the processed parts of the product at each process node, it can effectively improve the inspection accuracy of visual inspection, reduce manual inspection, and help reduce labor costs.

[0218] Figure 3 This is a schematic diagram of the structure of a testing device for a product quality testing equipment provided in this application embodiment, combined with... Figure 3 As shown, the detection device of the product quality inspection equipment includes: an imaging unit 310, a data processing unit 320, and a transmission unit 330.

[0219] The first imaging unit 310 is used to acquire the first image data of the first product, wherein the first product is obtained by processing the first process node in the production equipment, and the first imaging unit 310 is connected to the first process node.

[0220] The data processing unit 320 is used to generate a first inspection result of the first product based on the first inspection information corresponding to the first process node, wherein the first inspection information includes at least one first inspection item and a preset parameter range corresponding to each first inspection item;

[0221] The sending unit 330 is used to send a first inspection result to the production equipment so that if the first inspection result includes the presence of a defect in the first product, the production equipment will discharge the first product from the production line.

[0222] In some embodiments, a first test item is used to indicate a first test portion in a first product, and a first test result includes whether the first test portion indicated by each first test item has a defect;

[0223] The data processing unit 320 is further configured to determine first collected data of the first product based on the first image data, wherein the first collected data includes the collected value of at least one first product parameter of the first product, and the first product parameter corresponds one-to-one with the first detection item;

[0224] The data processing unit 320 is also used to determine whether there is a defect in the first detection part corresponding to each first detection item based on the preset parameter range and the first collected data corresponding to each first detection item;

[0225] The data processing unit 320 is further configured to associate the first inspection item with a defect identifier to obtain the first inspection result of the first product when there is a defect in the first inspection part corresponding to the first inspection item, wherein the defect identifier is used to indicate that there is a defect in the first inspection part.

[0226] In some embodiments, the data processing unit 320 is further configured to determine that there is a defect in the first detection part corresponding to the first detection item when the collected value of the first product parameter corresponding to the first detection item does not match the preset parameter range corresponding to the first detection item.

[0227] In some embodiments, the apparatus further includes:

[0228] The acquisition module is used to acquire the parameter information set corresponding to the production equipment, wherein the parameter information set includes the working parameters of the first imaging unit 310;

[0229] The data processing unit 320 is also used to obtain the working parameters of the first imaging unit 310 from the parameter information set according to the node identifier of the first process node, and configure the first imaging unit 310 according to the working parameters of the first imaging unit 310.

[0230] The data processing unit 320 is also used to capture the first product through the configured first imaging unit 310 to obtain first image data.

[0231] In some embodiments, the data processing unit 320 is further configured to capture the second product through the configured first imaging unit 310 to obtain second image data, wherein the second product includes at least one second detection part, the second detection part includes a first preset defect, wherein each first preset defect corresponds to a second detection item;

[0232] The data processing unit 320 is further configured to determine second acquisition data of the second product based on the second image data, wherein the second acquisition data includes acquisition values ​​of at least one second product parameter of the second product, and the second product parameter corresponds one-to-one with the second detection item;

[0233] The data processing unit 320 is also used to determine whether there is a defect in each second inspection part based on the preset parameter range and the second product parameter set corresponding to each second inspection item, and to obtain the second inspection result of the second product;

[0234] The data processing unit 320 is also configured to control the first imaging unit 310 to stop operating if the second detection result does not match the defect information of each second detection part, including the first preset defect.

[0235] In some embodiments, the data processing unit 320 is further configured to capture the first product by the configured first imaging unit 310 to obtain first image data when the second detection result matches the defect information of each second detection part including the first preset defect.

[0236] In some embodiments, the sending unit 330 is further configured to send operating parameters based on the first imaging unit 310 to the first monitoring device of the product quality inspection equipment.

[0237] In some embodiments, the sending unit 330 is further configured to send the first collected data and the first detection result to the production execution equipment;

[0238] The receiving unit is used to receive the third test result of the first product sent by the production execution equipment.

[0239] The sending unit 330 is further configured to send first control information to the production equipment when the third inspection result of the first product is that the first product is defect-free, so that the production equipment responds to the first control information and moves the first product to the second process node, wherein the second process node is the downstream process node of the first process node.

[0240] In some embodiments, the sending unit 330 is further configured to send first collected data and first detection results to the server, so that the server stores the first detection results of the first product at the first process node.

[0241] In some embodiments, the acquisition unit is further configured to acquire the first detection results corresponding to the multiple first products processed by the first process node within a preset time period;

[0242] The data processing unit 320 is also used to determine the product defect rate corresponding to the first process node within a preset time period based on multiple first detection results;

[0243] The data processing unit 320 is also used to stop acquiring image data of the first product when the product defect rate is greater than a preset defect threshold, and to send second control information to the production equipment so that the production equipment stops operating in response to the second control information.

[0244] In some embodiments, the sending unit 330 is further configured to provide the first product to the second monitoring device of the product quality inspection equipment, so that the second monitoring device generates a fourth inspection result for the first product;

[0245] The receiving unit is also configured to receive third control information sent by the second monitoring device when the fourth detection result of the first product is inconsistent with the first detection result, wherein the fourth detection result is detected by the second monitoring device;

[0246] The data processing unit 320 is also configured to control the first imaging unit 310 to stop acquiring image data in response to the third control information.

[0247] In some embodiments, the production equipment includes multiple process nodes, and the product quality inspection equipment includes an imaging unit corresponding to each process node.

[0248] The acquisition unit is also used to acquire the Measurement System Analysis (MSA) guidance document set, which includes the MSA guidance document corresponding to each process node in the production equipment;

[0249] The data processing unit 320 is also used to determine the processing product output channel corresponding to each process node, the detection information corresponding to each process node, and the data output type of the detection result corresponding to each process node according to the instruction information in the MSA guidance document corresponding to each process node, wherein the data output type is either measurement type or count type.

[0250] The acquisition unit is also used to acquire image data collected by multiple imaging units from the detection sample set, wherein the detection sample set includes multiple detection samples, each detection sample includes at least one third detection item, and the multiple detection samples include a first preset number of good products and a second preset number of defective products.

[0251] The data processing unit 320 is also used to generate the detection result of each third detection item in each test sample based on the image data collected by the imaging unit for each process node.

[0252] The data processing unit 320 is also used to determine the detection accuracy of the product quality testing equipment based on the detection results of each third detection item in each test sample and the reference results of each third detection item in each test sample.

[0253] It is understood that the testing device of the product quality testing equipment in this application embodiment can correspond to the execution subject of the testing method of the product quality testing equipment provided in this application embodiment. The specific details of the operation and / or function of each module / unit of the testing device of the product quality testing equipment can be found in the description of the corresponding part of the testing method of the product quality testing equipment provided in the above application embodiment. For the sake of brevity, it will not be repeated here.

[0254] Figure 4 A schematic diagram of the structure of an electronic device according to an embodiment of this application is shown. Figure 4 As shown, the device may include a processor 601 and a memory 602 storing computer program instructions.

[0255] Specifically, the processor 601 may include a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits that can be configured to implement the embodiments of this application.

[0256] Memory 602 may include mass storage for information or instructions. For example, and not limitingly, memory 602 may include a hard disk drive (HDD), a floppy disk drive, flash memory, optical disk, magneto-optical disk, magnetic tape, or a Universal Serial Bus (USB) drive, or a combination of two or more of these. In one instance, memory 602 may include removable or non-removable (or fixed) media, or memory 602 may be a non-volatile solid-state memory. Memory 602 may be internal or external to an electronic device.

[0257] Memory may include read-only memory (ROM), random access memory (RAM), disk storage media devices, optical storage media devices, flash memory devices, and electrical, optical, or other physical / tangible memory storage devices. Therefore, typically, memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the methods according to one aspect of this disclosure.

[0258] The processor 601 reads and executes computer program instructions stored in the memory 602 to implement the method described in the embodiments of this application and achieve the corresponding technical effects achieved by executing the method in the embodiments of this application. For the sake of brevity, it will not be described in detail here.

[0259] In one example, the electronic device may also include a communication interface 603 and a bus 604. Wherein, as... Figure 4 As shown, the processor 601, memory 602, and communication interface 603 are connected through bus 604 and complete communication with each other.

[0260] The communication interface 603 is mainly used to realize communication between various modules, devices, units and / or equipment in the embodiments of this application.

[0261] Bus 604 includes hardware, software, or both, that couples components of an online information flow metering device together. For example, and not limitingly, the bus may include an Accelerated Graphics Port (AGP) or other graphics bus, an Extended Industry Standard Architecture (EISA) bus, a Front Side Bus (FSB), a Hyper Transport (HT) interconnect, an Industry Standard Architecture (ISA) bus, an Infinite Bandwidth Interconnect, a Low Pin Count (LPC) bus, a memory bus, a Microchannel Architecture (MCA) bus, a Peripheral Component Interconnect (PCI) bus, a PCI-Express (PCI-X) bus, a Serial Advanced Technology Attachment (SATA) bus, a Video Electronics Standards Association Local (VLB) bus, or other suitable buses, or combinations of two or more of these. Where appropriate, bus 604 may include one or more buses. Although specific buses are described and illustrated in embodiments of this application, this application contemplates any suitable bus or interconnect.

[0262] The electronic device can execute the detection method of the product quality testing equipment in the embodiments of this application, thereby achieving the corresponding technical effects of the detection method of the product quality testing equipment described in the embodiments of this application.

[0263] Furthermore, in conjunction with the detection methods of the product quality inspection equipment in the above embodiments, this application embodiment can provide a readable storage medium for implementation. This readable storage medium stores computer program instructions; when these computer program instructions are executed by a processor, they implement the detection method of any of the product quality inspection equipment in the above embodiments. Examples of readable storage media can be non-transitory machine-readable media, such as electronic circuits, semiconductor memory devices, read-only memory (ROM), floppy disks, compact disc read-only memory (CD-ROM), optical discs, hard disks, etc.

[0264] It should be clarified that this application is not limited to the specific configurations and processes described above and shown in the figures. For the sake of brevity, detailed descriptions of known methods are omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the embodiments of this application is not limited to the specific steps described and shown. Those skilled in the art can make various changes, modifications, and additions, or change the order of steps, after understanding the spirit of this application.

[0265] The functional blocks shown in the above-described block diagram can be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, they can be, for example, electronic circuits, application-specific integrated circuits (ASICs), appropriate firmware, plug-ins, function cards, etc. When implemented in software, the elements of this application are programs or code segments used to perform the required tasks. Programs or code segments can be stored on a machine-readable medium or transmitted over a transmission medium or communication link via data signals carried on a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, read-only memory (ROM), flash memory, erasable read-only memory (EROM), floppy disks, compact disc read-only memory (CD-ROM), optical disks, hard disks, fiber optic media, radio frequency (RF) links, etc. Code segments can be downloaded via computer networks such as the Internet, intranets, etc.

[0266] It should also be noted that the exemplary embodiments mentioned in this application describe methods or systems based on a series of steps or apparatus. However, this application is not limited to the order of the above steps; that is, the steps can be performed in the order mentioned in the embodiments, or in a different order, or several steps can be performed simultaneously.

[0267] This application also provides a computer-readable storage medium storing computer program instructions; when executed by a processor, the computer program instructions implement the detection method of the product quality testing equipment provided in this application.

[0268] Furthermore, in conjunction with the detection method, apparatus, and readable storage medium of the product quality inspection equipment in the above embodiments, this application embodiment can provide a computer program product for implementation. When the instructions in the computer program product are executed by the processor of an electronic device, the electronic device causes the electronic device to perform any of the detection methods of the product quality inspection equipment in the above embodiments.

[0269] The aspects of this disclosure have been described above with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this disclosure. It should be understood that each block in the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that these instructions, executable via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor, or a field-programmable logic circuit. It is also understood that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can also be implemented by special-purpose hardware performing the specified functions or actions, or can be implemented by a combination of special-purpose hardware and computer instructions.

[0270] The above description is merely a specific implementation of this application. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the systems, modules, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here. It should be understood that the protection scope of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the protection scope of this application.

Claims

1. A detection method of a product quality detection apparatus, characterized by, The method is applied to a product quality detection device, and comprises the following steps: obtaining first image data of a first product by a first imaging unit, wherein the first product is processed by a first process node of a production device, and the first imaging unit corresponds to the first process node; generating a first detection result of the first product according to the first image data and first detection information corresponding to the first process node, wherein the first detection information comprises at least one first detection item and a preset parameter range corresponding to each first detection item; sending the first detection result to the production device, so that the production device discharges the first product from a production line if the first detection result indicates that the first product has defects; wherein the step of obtaining first image data of a first product by a first imaging unit comprises: obtaining a parameter information set corresponding to the production device, wherein the parameter information set comprises working parameters of the first imaging unit; obtaining the working parameters of the first imaging unit in the parameter information set according to a node identifier of the first process node, and configuring the first imaging unit according to the working parameters of the first imaging unit; capturing the first product by the configured first imaging unit to obtain the first image data; after the step of configuring the first imaging unit according to the working parameters of the first imaging unit, the method further comprises: sending the working parameters of the first imaging unit to a first monitoring device of the product quality detection device; the production device comprises a plurality of process nodes, and the product quality detection device comprises an imaging unit corresponding to each process node; before the step of obtaining first image data of a first product, the method further comprises: obtaining a measurement system analysis (MSA) guidance file set, wherein the MSA guidance file set comprises an MSA guidance file corresponding to each process node of the production device; determining a processing product output channel corresponding to each process node, detection information corresponding to each process node, and a data output type of a detection result corresponding to the process node according to indication information in the MSA guidance file corresponding to each process node, wherein the data output type is measurement or counting; obtaining image data collected by a plurality of imaging units on a detection sample set, wherein the detection sample set comprises a plurality of detection samples, and each detection sample comprises at least one third detection item, wherein the plurality of detection samples comprise a first preset number of good products and a second preset number of defective products; corresponding to each process node, generating a detection result of each third detection item in each detection sample according to the image data collected by the imaging unit; determining a detection accuracy of the product quality detection device according to the detection result of each third detection item in each detection sample and a reference result of each third detection item in each detection sample; if the detection accuracy is greater than a preset accuracy threshold, obtaining first image data of a first product.

2. The method of claim 1, wherein, The first detection item is used to indicate a first detection part in the first product, and the first detection result includes whether the first detection part indicated by each first detection item has a defect; The first detection result of the first product is generated according to the first detection information corresponding to the first process node, and includes: According to the first image data, first acquisition data of the first product is determined, wherein the first acquisition data includes acquisition values of at least one first product parameter of the first product, and the first product parameter corresponds to the first detection item one by one; According to the preset parameter range corresponding to each first detection item and the first acquisition data, it is determined whether the first detection part corresponding to each first detection item has a defect; In the case that the first detection part corresponding to the first detection item has a defect, the first detection item is associated with a defect identifier to obtain the first detection result of the first product, wherein the defect identifier is used to indicate that the first detection part has a defect.

3. The method of claim 2, wherein, In the case that the acquisition value of the first product parameter corresponding to the first detection item does not match the preset parameter range corresponding to the first detection item, it is determined that the first detection part corresponding to the first detection item has a defect.

4. The method of claim 1, wherein, Before the first image data of the first product is obtained by shooting the first product through the configured first imaging unit, the method further includes: Shooting a second product through the configured first imaging unit to obtain second image data, wherein the second product includes at least one second detection part, and the second detection part includes a first preset defect, wherein each first preset defect corresponds to a second detection item; According to the second image data, second acquisition data of the second product is determined, wherein the second acquisition data includes acquisition values of at least one second product parameter of the second product, and the second product parameter corresponds to the second detection item one by one; According to the preset parameter range corresponding to each second detection item and the second product parameter set, it is determined whether each second detection part has a defect, and a second detection result of the second product is obtained; In the case that the second detection result does not match the defect information that each second detection part includes a first preset defect, the first imaging unit is controlled to stop running.

5. The method of claim 4, wherein, The method further includes: In the case that the second detection result matches the defect information that each second detection part includes a first preset defect, the first image data of the first product is obtained by shooting the first product through the configured first imaging unit.

6. The method of claim 2, wherein, After the first detection result of the first product is obtained by associating the first detection item with a defect identifier in the case that the first detection part corresponding to the first detection item has a defect, the method further includes: The first acquisition data and the first detection result are sent to a production execution device; The third detection result of the first product sent by the production execution device is received; In a case where the third detection result of the first product is that the first product is defect-free, first control information is sent to the production device to make the production device move the first product to a second process node in response to the first control information, where the second process node is a downstream process node of the first process node.

7. The method of claim 2, wherein, After the first detection result of the first product is generated according to the first detection information corresponding to the first process node, the method further includes: The first acquisition data and the first detection result are sent to a server to make the server store the first detection result of the first product at the first process node.

8. The method of claim 1, wherein, After the first detection result of the first product is generated according to the first detection information corresponding to the first process node, the method further includes: First detection results corresponding to a plurality of first products processed by the first process node in a preset time period are acquired; According to a plurality of the first detection results, a product defect rate corresponding to the first process node in the preset time period is determined; In a case where the product defect rate is greater than a preset defect threshold, the image data of the first product is stopped from being acquired, and second control information is sent to the production device to make the production device stop running in response to the second control information.

9. The method of claim 1, wherein, After the first detection result of the first product is generated according to the first detection information corresponding to the first process node, the method further includes: The first product is provided to a second monitoring device of the product quality detection device to make the second monitoring device generate a fourth detection result of the first product; In a case where the fourth detection result of the first product is inconsistent with the first detection result, third control information sent by the second monitoring device is received, where the fourth detection result is detected by the second monitoring device; In response to the third control information, the first imaging unit is controlled to stop acquiring image data.

10. A detection device of a product quality detection apparatus, characterized by comprising: The device includes: A first imaging unit configured to acquire first image data of a first product, where the first product is processed by a first process node of a production device, and the first imaging unit corresponds to the first process node; A data processing unit configured to generate a first detection result of the first product according to the first image data and first detection information corresponding to the first process node, where the first detection information includes at least one first detection item and a preset parameter range corresponding to each first detection item; A sending unit configured to send the first detection result to the production device to make the production device discharge the first product from a production line in a case where the first detection result includes that the first product has defects. The device further includes: An acquisition module configured to acquire a parameter information set corresponding to the production device, where the parameter information set includes working parameters of the first imaging unit; The data processing unit is further configured to obtain the working parameters of the first imaging unit in the parameter information set according to the node identifier of the first process node, and configure the first imaging unit according to the working parameters of the first imaging unit; The data processing unit is further configured to capture the first product by the configured first imaging unit to obtain the first image data; The sending unit is further configured to send the working parameters of the first imaging unit to the first monitoring device of the product quality detection device; The production device comprises a plurality of process nodes, and the product quality detection device comprises an imaging unit corresponding to each process node; The obtaining module is further configured to obtain a measurement system analysis (MSA) guide file set, wherein the MSA guide file set comprises an MSA guide file corresponding to each process node in the production device; The data processing unit is further configured to determine a processing product output channel corresponding to each process node, detection information corresponding to each process node, and a data output type of the detection result corresponding to the process node according to the indication information in the MSA guide file corresponding to each process node, wherein the data output type is measurement type or count type; The obtaining module is further configured to obtain image data collected by a plurality of imaging units on a detection sample set, wherein the detection sample set comprises a plurality of detection samples, and each detection sample comprises at least one third detection item, and the plurality of detection samples comprise a first preset number of good products and a second preset number of defective products; The data processing unit is further configured to generate, for each process node, a detection result of each third detection item in each detection sample according to the image data collected by the imaging unit; The data processing unit is further configured to determine a detection accuracy of the product quality detection device according to the detection result of each third detection item in each detection sample and a reference result of each third detection item in each detection sample; The obtaining module is further configured to obtain first image data of a first product when the detection accuracy is greater than a preset accuracy threshold.

11. An electronic device, comprising: The device comprises a processor and a memory storing computer program instructions; The processor reads and executes the computer program instructions to implement the detection method of the product quality detection device according to any one of claims 1-9.

12. A readable storage medium, characterized by, The computer program instructions are stored on the readable storage medium and are executed by the processor to implement the detection method of the product quality detection device according to any one of claims 1-9.

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